Abstract: A computer-implemented method of optimizing at least one of a design, production and testing process in a mass manufacturing process includes steps of: collecting error data relating to a product; classifying the error data into categories of symptoms; mapping the symptom to a revealing condition of the product; mapping the revealing condition to a test type; mapping a scope of a fix to phases of error injection mapping; and recommending modifications to an end user for at least one of the design, production, delivery, and testing process based on the scope of the fix.

Abstract: A chemical composition analyzer may be used to optically determine and report chemical compositions associated with gases within a gas collection and transmission infrastructure. This analyzer includes a number of optical sensors which may be used to perform spectroscopic spectrographic analysis in order to determine the chemical composition of the gas. Additionally other sensors may be used to measure other physical properties associated with the gas. These sensors are tied to a data collection system wherein the output of the optical sensors and sensors used to measure the physical properties of the gas may be combined and processed in order to determine in a nearly continuous fashion the chemical composition associated with the gas at various locations within the gas collection and transmission infrastructure. This real time compositional analysis may be used to determine valuations of the gas or to optimize other processes or equipment configurations.

Abstract: A method and system for a product line management is presented. The system is capable of performing steps of the method. The method includes a first step of obtaining a product line architecture (PLA). A second step of obtaining a Change Management Workflow (CMW), the CMW includes a plurality of change activities, and the CMW being capable of interacting with the PLA. A third step of obtaining value stream maps for both the PLA and the CMW. A fourth step of creating activity lines for each of the change activity according to the PLA and the CMW. A fifth step of computing risk indicatives for the PLA and the CMW. A sixth step of triggering changes in the PLA and the CMW according the change activity, activity line, risk indicatives, or any combination thereof. And another step of repeating the steps of obtaining value stream maps onwards while managing the product line.

Abstract: A method, controller, and system for controlling a manufacturing process (batch-type or continuous-type) with a multivariate model are described. Dependent variable data and manipulated variable data are received. Dependent variable data represents values of uncontrolled process parameters from a plurality of sensors. Manipulated variable data represents controlled or setpoint values of controllable process parameters of a plurality of process tools. A predicted operational value, multivariate statistic, or both are determined based on the received data, and operating parameters of the manufacturing process are determined based on the predicted score, multivariate statistic, or both.

Abstract: A pattern data creating method comprising: referring to a first correspondence relation between an amount of dimension variation between a first pattern formed on a substrate and a second pattern formed by processing the substrate using the first pattern and either one of a pattern total surface area and a pattern boundary length of the first pattern; and creating pattern data for forming the first pattern.

Abstract: In accordance with at least one embodiment of the present invention, a manufacturing system includes a factory system and a field system. The factory system includes a first mount configured to receive, support, and precisely locate a removable line replaceable unit (LRU) having one or more components at a first factory LRU station within the factory system. The received LRU components are capable of adjustment to configure proper operation of the received LRU within the factory system. The field system corresponds to the factory system and includes a second mount configured to receive, support, and precisely locate an LRU removed from the factory system at a first field LRU station corresponding to the first factory LRU station. The removed and received LRU is configured for proper operation within the field system without adjustment of the one or more LRU components.

Abstract: A photomask for integrated circuit production comprising a substrate, one or more layers and a detector for monitoring a process parameter of the integrated circuit production in combination with one or more of the following: communication circuitry for communicating with external equipment for the integrated circuit production, a computational processor for analyzing the monitored process parameter, and a data storage component. In addition, a method of integrated circuit production comprising the steps of providing a photomask in the integrated circuit production process and monitoring a process parameter of the integrated circuit production using the photomask, in combination with one or more following steps: analyzing the monitored process parameter using the photomask; communicating the monitored process parameter from the photomask to external equipment involved in the integrated circuit production; and storing the monitored process parameter in the photomask.

Abstract: A computing system, method, and computer program product facilitates data mining of information, for example image data, relating to a surface of a manufactured product when the manufactured product is processed using a tool relative to which the manufactured product may be randomly oriented. For each manufactured object, data pertaining to the surface is converted into a weight distribution. A rotational axis along which each surface would tend to rotate under the action of gravity with the surface supported at its geometric centroid is determined. The sets of data can then be properly oriented relative to one another for data mining by aligning the rotational axis of each set of data.

Abstract: A control component and method for an energy management unit (EM) in an industrial automation arrangement which is configured to control one of a process, a subprocess and a system part of the industrial automation arrangement. Here, the control component is configured to detect the energy consumption of at least one part of the industrial automation arrangement, and the control component is configured to relate the detected energy consumption to at least one stored specification. The control component is also configured to generate a request for at least one automation component as the result of the relating operation. The control component is configured to transmit a message containing the request to the automation component and to receive an acknowledgement message from this automation component, where the request is directed to changing an operational state of one of the process, subprocess and system part that is controlled by the automation component.

Abstract: A method for addressing process variability in a build-to-order, mass customization production environment. The method includes receiving an order for a product having a particular configuration defined by the order, initiating a production order specifically assigned to the order, fabricating the product based upon the production order, determining if an unrelated product order contains an identical product item configuration and automatically swapping identical product items contained on unrelated production orders to optimize overall production process objectives.

Abstract: A device for managing inventory, such as tools and equipment, includes a user interface in operable communication with a processor and a storage medium; a transceiver in operable communication with an antenna and the processor, the transceiver operable for communicating with a tool or a piece of equipment; and a notification device in operable communication with the processor. The processor determines if the tool or the piece of equipment is within a specified range of the device for managing tool and equipment inventory.

Abstract: A method for modifying a component may comprise measuring the component using a modifying tool, and recording position data for the component based on the measuring. A path for the modifying tool may be provided using the position data, and the component may be modified by moving the same modifying tool based on the provided path.

Abstract: A method for conforming components may comprise measuring a first component using a conforming tool, and recording position data for the first component based on the measuring. A path for the conforming tool may be provided using the position data, and a second component may be modified by moving the same conforming tool based on the provided path.

Abstract: In a layout pattern generating method, a specific rework cell used for edition is specified among rework cells and fill cells which are arranged in a semiconductor chip area and a specific pattern of a predetermined shape is generated in a wiring layer for the specific rework cell. A dummy wiring pattern is arranged in at least a part of the wiring layer of and the fill cell and un-specific rework cells among the rework cell other than the specific rework cell. The specific pattern is deleted from the wiring layer for the specifying rework cell. A wiring pattern is arranged in the wiring layer for the specific rework cell by wiring the specific rework cell as a logic cell.

Abstract: This invention provides a production condition determining method by which a production schedule of boards can be determined in a short time. The production condition determining method is for determining production conditions, under which various types of boards are to be produced. This method includes: judging whether or not all of part feeders necessary to produce the various types of boards can be stored simultaneously in part supplying units in a mounter, by comparing the number of the necessary part feeders, with the number of part feeders which can be stored in the part supplying units; and outputting a guidance for modifying the production conditions so that the various types of boards can be produced, when the judgment is made that all of the necessary part feeders cannot be stored simultaneously in the part supplying units.

Abstract: A server device includes: a recipe storage unit for storing therein at least a recipe used in a manufacturing apparatus; a recipe receiving unit for receiving a modified recipe in case a content of the recipe in the manufacturing apparatus is modified; a recipe accumulation unit for accumulating the recipe received by the recipe receiving unit in the recipe storage unit; a modification information composition unit for composing modification information related to a modification of the content of the recipe; a transmission destination information storage unit for storing therein transmission destination information indicating a transmission destination of the modification information; a transmission destination information acquisition unit for acquiring the transmission destination information from the transmission destination information storage unit; and a modification information transmitting unit for transmitting the modification information to the transmission destination indicated by the transmission des

Abstract: A substrate reworking system (1) improves rework tact time and eliminates unnecessary reworking to perform efficient reworking. The system (1) includes: a defect information acquisition unit (2) for acquiring defect information for an entire region on the target substrate (9); a reworking unit (3) having at least one liquid drop discharge unit (6) for dispensing a liquid drop to a defective part on the target substrate (9) based on the defect information acquired by the defect information acquisition unit (2); and a rework determining unit (4) for determining, for each target substrate (9) and based on the defect information acquired by the defect information acquisition unit (2), whether the reworking unit (3) needs to perform reworking.

Abstract: Systems and methods for efficiently improving manufacturing conditions are presented herein. A data collection component can record one or more manufacturing parameters of a product during a manufacture of the product. A historical component can retrieve stored manufacturing information related to the product. In addition, a prediction component can predict, during the manufacture, an outcome associated with the manufacture. The prediction can be based on, at least in part, the recorded manufacturing parameter(s) and the retrieved information. A specification component can determine a desired characteristic state for at least one of the recorded manufacturing parameters, and a suggestion component can recommend, during the manufacture, an adjustment of at least one parameter based on, at least in part, the predicted outcome and the desired characteristic state for the at least one recorded manufacturing parameter(s).

Abstract: A Manufacturing Executing System (MES) implements a planned manufacturing process and controls the corresponding production at the plant floor in a method and in a system for managing and controlling manufacturing processes planned by an Enterprise Resource Planning (ERP) and produced by the plant floor. The method includes defining sequential process segments. Each sequential process segment includes a plurality of actions to be performed at a plant floor level. The method includes the execution of a software tool including the steps of activating a sequential process segment and sequentially executing the respective actions. The method further includes defining state machines including a plurality of states and state transitions corresponding to actions to be performed at plant floor. A state manager tool is executed to define the state machines. A software tool is activated by the state manager tool to execute the state transitions of the state machine.

Abstract: Method of calculating pattern-failure-occurrence-region comprising calculating a pattern failure occurrence region using relation information and a layout used for forming a convex section, the relation information being a relation between a distance from a formed pattern in a film to cover the convex section on a substrate to the convex section and a region in the film in which a shape of the formed pattern cannot satisfy a predetermined condition because of influence of the convex section.

Abstract: A method for planning machine control for a system includes determining one or more capabilities and one or more capability constraints for each component used to execute a plan for processing a job by the system. The plan is incrementally constructed based on the components, the one or more capabilities, and the one or more constraints. One or more sets of executable instructions are queried with incremental portions of the plan, wherein each set of executable instructions is associated with a different one of the components and represents the actions that are performed by its corresponding component, each incremental portion includes actions that are to be performed by its corresponding component, and each set of executable instructions executes the incremental portion it received.

Abstract: A method is provided for managing and validating product development. The method may include obtaining a product specification for a product and identifying prior products that have capabilities within a defined range of the product specifications. The method may also include developing a performance specification based on the product specification and the identified prior products. Further, the method may include obtaining approval for the performance specification, developing the product according to the performance specification, and validating that the product meets the performance specification.

Abstract: Manufacturing planning data for a production process that is managed by a manufacturing execution system is updated by way of a plurality of steps, which include: Gathering data from a PLC level relevant to the manufacturing planning data and the execution of the production process; mapping the gathered data with the current manufacturing planning data in order to determine suggested changes between the gathered data and the current manufacturing planning data; applying a predetermined update scenario for the manufacturing planning data depending on the suggested changes to update the manufacturing planning data; and adapting the current production process and optionally following production processes according to the updated manufacturing planning data. The reliability of the so-called standard data used in production planning processes is thus dramatically improved.

Abstract: It is determined whether or not a previously received wafer process condition can be changed to a newly received wafer process condition based on a wafer operation progress indicating which wafer is treated or untreated among a given number of wafers in a previously received lot process condition table when a new lot process condition table containing wafer process conditions corresponding to wafer identification information and having the wafer identification information all equal to wafer identification information in the previously received lot process condition table. When any wafer process condition is changeable, the wafer process condition is changed to the newly received wafer process condition. In this way, a semiconductor manufacturing apparatus can have increased yields in accordance with wafers.

Abstract: Real-time assembly and part validation (or “containment”) and auto-disposition in a manufacturing environment. Validation and auto-disposition are performed in a real-time, proactive manner where the validation and auto-disposition processing are not coupled to the installation process. Validation problems or issues may therefore be identified and resolved before an assembly or part is needed for installation.

Abstract: A semiconductor fabrication facility (fab) configuration module is defined to virtually model physical systems and attributes of a fab. A data acquisition module is defined to interface with the physical systems of the fab and gather operational data from the physical systems. A visualizer module is defined to collect and aggregate the operational data gathered from the physical systems. The visualizer module is further defined to process the operational data into a format suitable for visual rendering. The processed operational data is displayed within a visual context of the fab in a graphical user interface controlled by the visualizer module. An analyzer module is defined to analyze data collected by the visualizer module and to resolve queries regarding fab performance. An optimizer module is defined to control systems within the fab in response to data collected by the visualizer module, data generated by the analyzer module, or a combination thereof.

Abstract: In a control device of a plasma processing system, a storage unit is configured to store a reference recipe indicating an order of the plasma processing. An operation unit calculates a state variation value of each of the plasma processing devices by a predetermined timing at a plurality of processing lot intervals. A table generation unit generates an adjusting table for adjusting the reference recipe from the calculated state variation value of each of the plasma processing devices. In addition, a process executing control unit adjusts the reference recipe by using one of the generated adjusting tables for the plasma processing devices by the table generation unit and performs the plasma processing on the target object in the corresponding plasma processing device according to an order of the adjusted reference recipe.

Abstract: Predicting a completion time for the manufacturing of an ordered configuration of a product based on actual completion times and self adjusting prediction completion times. An order is received to manufacture a particular configuration of a product. Multiple activities are identified that need to be finished in order to complete the manufacturing of the configuration. A completion time that the configuration will be manufactured is predicted based on actual completion times and self-adjusting predicted completion times for the activities.

Abstract: Material management systems and methods include material storage vessels with information (e.g., electronic information) storage. Information may be communicated from a storage device to a process tool controller and employed to set or adjust a process tool operating parameter. Material information may be determined by remote analysis and subsequently communicated to an electronic information storage device of a vessel containing such material. Location and movement of material storage vessels within a customer facility may be automatically tracked, with further transfer of material-specific information. Product information may be associatively stored with material-specific information utilized in product manufacture.

Abstract: The invention relates to a method and system for correcting programming and optimising treatment and/or subsequent treatment processes in technical installations, in particular in the paper industry, wherein the system comprises means for carrying an optimisation suitable for treatment processes and for corresponding subsequent treatment processes according to a production plan (18) defined by processing qualitative data (13) and/or information related to the quality of at least one starting product of an advanced production stage.

Abstract: A computer model of a physical structure (or object) can be generated using context-based hypothesis testing. For a set of point data, a user selects a context specifying a geometric category corresponding to the structure shape. The user specifies at least one seed point from the set that lies on a surface of the structure of interest. Using the context and point data, the system loads points in a region near the seed point(s), and determines the dimensions and orientation of an initial surface component in the context that corresponds to those points. If the selected component is supported by the points, that component can be added to a computer model of the surface. The system can repeatedly find points near a possible extension of the surface model, using the context and current surface component(s) to generate hypotheses for extending the surface model to these points.

Abstract: A method of tracking transports in a production process including processing a first transport in a first system, developing changes for the first transport, and updating the first system with the changes developed for the first transport. The method also includes processing a second transport in a second system, developing changes for the second transport, and updating the second system with the changes developed for the second transport. The method further includes moving the changes developed for the second transport to the first system, sequencing the changes developed for the first transport and the changes developed for the second transport in the first system, and processing a third transport in the first system. The third transport includes all of the changes developed for the first transport and all of the changes developed for the second transport.

Abstract: Provided is a method of controlling a fabrication cluster using a machine learning system, the machine learning system trained developed using an optical metrology model. A simulated approximation diffraction signal is generated based on an approximation diffraction model of the structure. A set of difference diffraction signal is obtained by subtracting the simulated approximation diffraction signal from each of simulated fine diffraction signals and paired with the corresponding profile parameters. A first machine learning system is trained using the pairs of difference diffraction signal and corresponding profile parameters. A library of simulated fine diffraction signals and profile parameters is generated using the trained first machine learning system and using ranges and corresponding resolutions of the profile parameters. A measured diffraction signal is input into the trained second machine learning system to determine at least one profile parameter.

Abstract: A computer added design system enables layout of a dependent component based on master components having a set of geometric and functional properties. Based on the state of the dependent component imposed by the assembly, as well as user-entered parameters, modification to the set of properties can be calculated. Based on the calculated modification, the master component and dependent component are updated.

Abstract: A system for operating and controlling technical processes having at least one component fashioned as a measuring instrument and a control device, which is connected by electrical lines to sensor and actuators of processes, and having a control program, a measurement and control unit, an operating and observation component, optionally a database, optionally a process printer and further components of a process automation, as appropriate, which are connected to one another via data channels and a control program.

Abstract: The illustrative embodiments provide a computer implemented method, apparatus, and computer usable program code for processing orders. A request for delivery by a requested delivery date is received for an order having an original delivery date. The ordered product is broken down into one or more materials required for manufacturing the ordered product. For at least one material required for manufacturing the ordered product, a date when an engineering change becomes effective for the material is specified. An alternate bill of materials is created based on the specified date when the engineering change becomes effective for the material. An alternate manufacturing plan based on the alternate bill of materials is created. Manufacturing is initiated based on the alternate manufacturing plan. If manufacturing can be completed in time for delivery by the requested delivery date, the original delivery date of the order is replaced with the requested delivery date.

Abstract: A modified automatic transmission includes a simple and inexpensive accumulator orifice plate residing between a valve control body and a second gear accumulator. The accumulator is in parallel fluid communication with a second gear servo and moderates changes to pressure of transmission fluid flowing to the second gear servo to reduce or eliminate harsh shifting. The accumulator is also in fluid communication with an Electronic Pressure Control (EPC) accumulator valve which provides an opposing transmission fluid flow into the accumulator to provide faster or firmer shifting when desired. The accumulator orifice plate includes orifices aligned with passages carrying the transmission fluid flows into the accumulator thereby restricting the flows. The orifices have specific sizes to limit the transmission fluid flows into the accumulator and thereby customize the shifting characteristics to suit an individual driver's preferences and/or needs and stabilizing pressure changes due to the EPC accumulator valve.

Abstract: A computer comprising a recordable medium on which is stored instructions for at least one model-based, run-to-run controller routine is provided. The computer includes instructions to receive a first dataset regarding a first wafer after a first process, to determine a process parameter for the first process for a second wafer using the first dataset; and to determine a second process parameter for a second process for the first wafer using the first dataset. In an embodiment, the first process is an etch process. In an embodiment, the second process is a planarization process.

Abstract: Method and apparatus for designing an integrated circuit by adding a plurality of control points to an integrated circuit wafer design. Each control point has at least one attribute. Then, an integrated circuit wafer is manufactured using the integrated circuit wafer design. A defect on the integrated circuit wafer is then located. The control points are adjusted such that they correspond with the defect.

Abstract: A position control apparatus includes a detecting unit configured to detect a position of a control target, a subtracting unit configured to subtract an output of the detecting unit from a target value, an iterative learning control circuit including a filter into which a deviation between the output of the detecting unit and the target value is input, where the iterative learning control circuit feeds forward a control input to the control target, and a parameter computing unit configured to compute a variation in a parameter of the control target. A characteristic of the filter is computed in accordance with the variation in the parameter of the control target.

Abstract: A method and system for generating/regenerating a schedule of a set of events associated with at least one process in a manufacturing plant in real time. The schedule is generated/regenerated on the basis of the occurrence of one or more events associated with various processes in real time. The occurrence of each of the events is monitored continuously. Thereafter, the occurrence of the monitored events is predicted for one or more predefined instances of time. The schedule is optimized on the basis of the predicted occurrences of the monitored events to generate/regenerate the schedule. The optimized schedule may be used to control one or more automatons.

Abstract: A reworking system includes a reworking machine configured for reworking products belonging to a first type and a second type, a main conveyer belt configured to transport the products to be reworked, first and second branch conveyer belts connected to the main conveyer belt and configured to transport the first and second types of the products to be reworked, a primary scanner installed on the main conveyer belt and configured to scan bar codes of the products to be reworked, and a computer configured to receive and process scanned data from the primary scanner, and actuate the main conveyer belt, the first branch conveyer belt, and the second branch conveyer belt.

Abstract: A system and method for providing tool operators in a manufacturing environment with clear and accurate tooling information increases tool operators' efficiency and reduces possibilities of errors. An output device and an input device are coupled to a processor. A tool operator enters a product option and a line number in the input device. The processor automatically selects a previously-defined build plan based on the entered information. The processor outputs the selected build plan to the output device. The outputted build plan includes tool information based on the entered product option and line number. The system communicates with a manufacturing system and a tool design system over a network. Build plans with product option and line number information are created at the manufacturing system, and the tool design system associates tools with the product option and line number information.

Abstract: The invention provides a method of designing shaping tools for metal containers (such as metal bottles) to minimize the formation of visible transition lines or ripples conventionally produced in such procedures as die necking and outward flaring. The method involves carefully measuring differences between an actual shape produced and a design shape resulting from an original set of shaping tools. The tools are then refined in design to take into account metal spring back and the effect of one shaping stage on the results of previous stages. The redesign goes through several iterations to ensure that each change produces an improvement of the formed container. In this way, the formation of transition lines can be minimized because the actual shape of the container more closely resembles the smooth design shape. Dies designed in this way are then used for commercial shaping operations.

Abstract: To provide a production system creating system that can create a production system of an article by freely combining a plurality of production factors of various types from a superordinate concept toward a subordinate concept thereof. In a production system creating system 10, a plurality of two-term relationships of various types required for creating the production system are extracted from a relational database 18 and a plurality of production factors of various types corresponding to first and second production factors for forming the extracted two-term relationships are also extracted from a factor-type database 17, and while integrating these two-term relationships extracted from the relational database 18, these production factors extracted from the factor-type database 17 are connected in series from the superordinate concept toward the subordinate concept according to the two-term relationships thus integrated to thereby create the production system corresponding to the article.

Abstract: A semiconductor manufacturing method and apparatus is provided that can improve uniformity of processing time of oxidation thickness. When starting a heat oxidation process, a time for optimum oxidation processing in the process management system is calculated based on atmospheric pressure data, a target thickness of that process, oxidization time, thickness data and atmospheric pressure data in the immediately preceding process under the same oxidization processing job. The optimum system comprises a process management system such as a host computer, a device having a barometer, a heat oxidation-processing device and a thickness-measuring device. The host computer, the barometer, the heat oxidation processing device and the thickness-measuring device are connected via a network so as to transmit data to and from each device.

Abstract: The operation of a test plant comprising a series of test rooms with a respective number of test beds requires management of a multiplicity of data, resources, people, processes, etc. Optimum operation of a test plant with as little unproductivity as possible is possible only when all of this information is networked together and optimum structures for the separation and management of a test plant are created. To this end, the invention now proposes splitting a test order into an order specimen and a process specimen, the two specimens being used to store different information. By linking an order specimen to a process specimen and the associated data and processes, it is a simple matter to generate a test process plan, and the handling of the test job can be controlled and monitored on the basis of the test process plan.

Abstract: An example method of reverse engineering component modifications includes recording identification information for components and distributing a portion of the components for modification. The method receives the components after modification and reviews the components using the identification information.

Abstract: A method of establishing a lot grading system for lots in a semiconductor manufacturing process includes defining a new lot grade for at least one lot in the semiconductor manufacturing process. The at least one lot is has a current lot grade and the new lot grade is dependent upon the current lot grade. The new lot grade is saved in a grading referenced database and the at least one lot in the semiconductor manufacturing process is updated with the new lot grade.

Abstract: The invention relates to a method for optimizing the machining process in a machine (1), wherein a control program (10) having a machining block (11a,11b,11c) controls the machining process, wherein an item of process information which arises during execution of the machining block (11a,11b,11c) is stored in a manner related to the machining block. Furthermore, the invention relates to a control device (2) for controlling a machine (1), wherein the control device (2) is designed in such a manner that it uses a control program (10) having a machining block (11a,11b,11c) to control the machining process, wherein an item of process information which arises during execution of the machining block (11a,11b,11c) is stored in a manner related to the machining block. The invention thus provides a simple possible way of optimizing the machining process in a machine.