Dimensional Determination Patents (Class 702/155)
  • Patent number: 10380728
    Abstract: Methods and systems for combining information present in measured images of semiconductor wafers with additional measurements of particular structures within the measured images are presented herein. In one aspect, an image-based signal response metrology (SRM) model is trained based on measured images and corresponding reference measurements of particular structures within each image. The trained, image-based SRM model is then used to calculate values of one or more parameters of interest directly from measured image data collected from other wafers. In another aspect, a measurement signal synthesis model is trained based on measured images and corresponding measurement signals generated by measurements of particular structures within each image by a non-imaging measurement technique.
    Type: Grant
    Filed: August 5, 2016
    Date of Patent: August 13, 2019
    Assignee: KLA-Tencor Corporation
    Inventor: Stilian Ivanov Pandev
  • Patent number: 10332810
    Abstract: Systems and methods for performing one or more processes on a specimen are provided. One system includes a deposition module incorporated into an existing tool configured to perform an inspection and/or metrology process. The deposition module is configured to deposit one or more materials on a specimen prior to the inspection and/or metrology process performed on the specimen. In some embodiments, the system also includes a stripping module incorporated into the existing tool, and the stripping module is configured to remove material(s) from the specimen subsequent to the inspection and/or metrology process performed on the specimen. The existing tool includes an illumination subsystem configured to direct light having one or more illumination wavelengths to the specimen; a detection subsystem configured to detect light from the specimen; and a computer subsystem configured to determine information for the specimen using output generated by the detection subsystem responsive to the detected light.
    Type: Grant
    Filed: October 24, 2017
    Date of Patent: June 25, 2019
    Assignee: KLA-Tencor Corp.
    Inventor: Bobby R. Bell
  • Patent number: 10313653
    Abstract: Interactive content is obtained, the interactive content including a stereoscopic equirectangular video frame. A UV coordinate screen space is generated. A first location of the UV coordinate screen space is computed. A second location of the UV coordinate screen space is computed. A point of the UV coordinate screen space to procedurally render is selected. Virtual spherical coordinates are computed using the point of the UV coordinate screen space to procedurally render. The virtual spherical coordinates are rotated using a rotation matrix. An equirectangular coordinate value within the video frame is determined using the rotated virtual spherical coordinates. The pixel values of the stereoscopic equirectangular video frame are identified using the equirectangular coordinate value. The pixel values are returned for the UV coordinate screen space, thereby causing a corresponding presentation on a physical screen of an interactive content player device.
    Type: Grant
    Filed: November 15, 2017
    Date of Patent: June 4, 2019
    Assignee: Secret Location Inc.
    Inventor: John Cumming
  • Patent number: 10310922
    Abstract: Methods, systems, and apparatus including medium-encoded computer program products for generating and visualizing 3D scenes include, in one aspect, a method including: obtaining data regarding (i) standard calibration parts with shapes comprising a cylinder and polyhedrons, and (ii) a limited number of scanning trials performed on the standard calibration parts using a three dimensional (3D) scanner; comparing the data to find shape deviations for the standard calibration parts in a coordinate system; generating a model of functional dependence of scanning error for the 3D scanner using the shape deviations; and providing the model of functional dependence of scanning error for the 3D scanner to quantify scanning inaccuracy of the 3D scanner, wherein the model is usable to predict a measurement error for the 3D scanner on a scanned product.
    Type: Grant
    Filed: April 13, 2016
    Date of Patent: June 4, 2019
    Assignee: University of Southern California
    Inventor: Qiang Huang
  • Patent number: 10271759
    Abstract: A body fat measurement device includes: a measurement unit for measuring a shape of a measurement subject's trunk area; a breathing estimation unit that detects a change over time in the measured trunk area shape and estimates the measurement subject's breathing based on the detected change; a breathing state determination unit that determines whether or not the estimated breathing of the measurement subject is in a state suited to measurement; a state output unit that outputs the estimated breathing state to the exterior in association with a result of the determination; and a fat mass calculation unit that calculates a trunk area fat mass using the body impedance measured by a body impedance measurement unit and a trunk area size based on the trunk area shape measured by the measurement unit.
    Type: Grant
    Filed: November 30, 2012
    Date of Patent: April 30, 2019
    Assignee: FUKUDA DENSHI CO., LTD.
    Inventors: Yasuaki Murakawa, Takehiro Hamaguchi, Kazuhisa Tanabe, Hiromichi Karo
  • Patent number: 10246888
    Abstract: A floor plan is fit to a foundation and points are defined at relevant locations on the floor plan. The points are defined based on the location of the point and the features associated with the point. Walls are laid out at full scale on a construction site based on the floor plan. The walls are located by locating the positions of the defined points, and the defined points are located with a point marker base, prism assembly, and electronic surveying equipment. The prism assembly is mounted to the point marker base, and the point marker base provides a reference point from which an offset distance to the defined point is determined. A rotatable measuring instrument is secured to the point marker base and measures the offset distance. Wall lines are located based on the location of the defined point.
    Type: Grant
    Filed: January 19, 2016
    Date of Patent: April 2, 2019
    Inventors: Gerald Dean Onchuck, Arnel William Onchuck
  • Patent number: 10228765
    Abstract: An electronic device: while displaying a user interface, detects an input sequence that includes detecting an increase in a characteristic intensity of a contact on a home button. In response, the device determines whether the increase is above a first intensity threshold and whether a change in the characteristic intensity proximate to a time when the characteristic intensity increases above the first intensity threshold has a first or a second value for an intensity-change metric. If the increase is above the threshold and the change has the first value, the device performs a first operation that changes the user interface displayed on the display; and generates a first discrete tactile output that corresponds to the increase. If the increase is above the threshold and the change has the second value, the device performs the first operation and generates a second discrete tactile output that corresponds to the increase.
    Type: Grant
    Filed: September 22, 2016
    Date of Patent: March 12, 2019
    Assignee: APPLE INC.
    Inventors: Imran A. Chaudhri, Sebastian J. Bauer, Camille Moussette, Jean-Pierre M. Mouilleseaux, Madeleine S. Cordier, Joshua B. Kopin
  • Patent number: 10168826
    Abstract: An electronic device displays a user interface in a first display state. The device detects a first portion of a gesture on a touch-sensitive surface, including detecting intensity of a respective contact of the gesture. In response to detecting the first portion of the gesture, the device displays an intermediate display state between the first display state and a second display state. In response to detecting the end of the gesture: if intensity of the respective contact had reached a predefined intensity threshold prior to the end of the gesture, the device displays the second display state; otherwise, the device redisplays the first display state. After displaying an animated transition between a first display state and a second state, the device, optionally, detects an increase of the contact intensity. In response, the device displays a continuation of the animation in accordance with the increasing intensity of the respective contact.
    Type: Grant
    Filed: April 7, 2017
    Date of Patent: January 1, 2019
    Assignee: APPLE INC.
    Inventors: Jeffrey Traer Bernstein, Julian Missig, Avi E. Cieplinski, Matthew I. Brown, May-Li Khoe, Nicholas Zambetti, Bianca C. Costanzo, David J. Hart, B. Michael Victor
  • Patent number: 10127704
    Abstract: An information processing device 10 includes a command recognition unit 203, a parameter extraction unit 28 and a command execution unit 253. The command recognition unit 203 specifies one of one or more pieces of object creation processing, which include at least one of processing for creating a text box, processing for creating a figure, and table creating processing for creating a table, from a combination of directions where one polygonal line is bent, the one polygonal line being inputted as a handwriting input command to a handwriting input device that enables handwriting input onto a display screen. The parameter extraction unit 208 extracts a parameter such as a position, size and the like of a designated object from a position and length of a segment that composes one polygonal line. Thus, the information processing device 10 allows a user to give a command on a screen by handwriting.
    Type: Grant
    Filed: November 14, 2016
    Date of Patent: November 13, 2018
    Assignee: UX Innovations LLC
    Inventor: Hiroshi Kubo
  • Patent number: 10079183
    Abstract: Methods and systems of process control and yield management for semiconductor device manufacturing based on predictions of final device performance are presented herein. Estimated device performance metric values are calculated based on one or more device performance models that link parameter values capable of measurement during process to final device performance metrics. In some examples, an estimated value of a device performance metric is based on at least one structural characteristic and at least one band structure characteristic of an unfinished, multi-layer wafer. In some examples, a prediction of whether a device under process will fail a final device performance test is based on the difference between an estimated value of a final device performance metric and a specified value. In some examples, an adjustment in one or more subsequent process steps is determined based at least in part on the difference.
    Type: Grant
    Filed: June 23, 2014
    Date of Patent: September 18, 2018
    Assignee: KLA-Tenor Corporation
    Inventors: Xiang Gao, Philip D. Flanner, III, Leonid Poslavsky, Ming Di, Qiang Zhao, Scott Penner
  • Patent number: 10035220
    Abstract: A method includes conducting a plurality of tests on process variables of a manufacturing process, with a test of the plurality of tests being associated with two combinations of process variables, the test having first values for a first combination of process variables at a first time and second values for a second combination of process variables at a second time, the test comprising: locally heating a region of a structure, wherein the local heating results in formation of a thermal field in the structure; assessing one or more thermal characteristics of the thermal field during a transition between the first combination of process variables and the second combination of process variables; and based on results of the plurality of tests, generating a process map of a transient response of the one or more thermal characteristics of the thermal field.
    Type: Grant
    Filed: March 14, 2014
    Date of Patent: July 31, 2018
    Assignee: Carnegie Mellon University
    Inventors: Jack Lee Beuth, Jr., Jason Cho Fox
  • Patent number: 9983001
    Abstract: A shape analysis method for analyzing shape data acquired by measuring a contour shape of a workpiece to be measured, includes: deciding a geometric element used in shape analysis; deciding one data point to be included in an evaluation range; applying the geometric element to an interval including the one data point; searching the widest interval for satisfying a threshold condition of a preset shape tolerance while changing a width of the interval; pinpointing two boundary points between which the interval found by the search is sandwiched; obtaining two edge points at which the two boundary points are respectively shifted by preset shift amounts; setting a range sandwiched between the edge points in the evaluation range; and targeting the shape data within the evaluation range for calculation of geometric properties.
    Type: Grant
    Filed: July 1, 2013
    Date of Patent: May 29, 2018
    Assignee: MITUTOYO CORPORATION
    Inventors: Masafumi Shimizu, Yoichi Saito
  • Patent number: 9927371
    Abstract: A line scan wafer inspection system includes a confocal slit aperture filter to remove sidelobes and enhance resolution in the scanning direction. A position detector associated with the slit aperture filter monitors and corrects illumination line image positions relative to the slit aperture to keep image position variations within tolerable limits. Each detector measures a line position and then uses the line position signal to adjust optical, mechanical, and electronic components in the collection path in a feedback loop. The feedback loop may be employed in a runtime calibration process or during inspection to enhance stability.
    Type: Grant
    Filed: April 21, 2015
    Date of Patent: March 27, 2018
    Assignee: KLA-Tencor Corporation
    Inventors: Mark S. Wang, Chris Kirk, Andrey Kharisov
  • Patent number: 9864367
    Abstract: A mounting pin straightness management system is provided. The system includes a sensor unit that is configured to measure 3-dimensional coordinates (a(Ta, La, Ha), b(Tb, Lb. Hb)) for a first and a second center point (a, b) of two approximate circles formed from intersections of an exterior surface of the at least one mounting pin and two parallel planes (PA and PB) perpendicular to a target length direction of the at least one mounting pin and spaced apart at a predetermined distance (H) from each other. A controller is configured to calculate a straightness index (S.I.) related to a maximum distance (Lmax) between the first and the second center point under a straightness management tolerance (r) and an actual distance (Lactual) between the first and the second center point by receiving the 3-dimensional coordinates of the first and the second center point from the sensor unit.
    Type: Grant
    Filed: September 17, 2014
    Date of Patent: January 9, 2018
    Assignee: Hyundai Motor Company
    Inventor: Soo Jeong Heo
  • Patent number: 9618927
    Abstract: A method of determining a radius of a cutting end of a tool for a turning machine using a touch probe is provided. One of the cutting end and the touch probe is movable relative to a reference frame having a first axis and a second axis and having a reference point trackable in the reference frame. The method comprises establishing a first contact point and recording a first coordinate of the reference point on the first axis; establishing a second contact point and recording a second coordinate of the reference point on the second axis; establishing a third contact point and recording a third coordinate of the reference point on the first axis and a fourth coordinate of the reference point on the second axis upon contact; and determining a radius of the cutting end based on the first, second, third and fourth coordinates.
    Type: Grant
    Filed: April 15, 2014
    Date of Patent: April 11, 2017
    Assignee: PRATT & WHITNEY CANADA CORP.
    Inventors: Lafleche Gagnon, Rachid Guiassa, Philippe St-Jacques
  • Patent number: 9619076
    Abstract: An electronic device displays a user interface in a first display state. The device detects a first portion of a gesture on a touch-sensitive surface, including detecting intensity of a respective contact of the gesture. In response to detecting the first portion of the gesture, the device displays an intermediate display state between the first display state and a second display state. In response to detecting the end of the gesture: if intensity of the respective contact had reached a predefined intensity threshold prior to the end of the gesture, the device displays the second display state; otherwise, the device redisplays the first display state. After displaying an animated transition between a first display state and a second state, the device, optionally, detects an increase of the contact intensity. In response, the device displays a continuation of the animation in accordance with the increasing intensity of the respective contact.
    Type: Grant
    Filed: November 7, 2014
    Date of Patent: April 11, 2017
    Assignee: APPLE INC.
    Inventors: Jeffrey Traer Bernstein, Julian Missig, Avi E. Cieplinski, Matthew I. Brown, May-Li Khoe, Nicholas Zambetti, Bianca C. Costanzo, David J. Hart, B. Michael Victor
  • Patent number: 9524374
    Abstract: An electronic 3D model of at least a portion of a maxillary arch of a patient is displayed. Inputs indicating a tip of a mesiobuccal cusp of a maxillary first molar are received for both the patient's right and left sides. In addition, an electronic 3D model of at least a portion of a mandibular arch of a patient is displayed. Inputs indicating relevant points on the mandibular first molar are received for both the patient's right and left sides. Side scores are generated for the patient's right and left sides based on the indicated points. A final occlusion score for the patient is displayed. The final occlusion score is based on the side score for the right side and the side score for the left side.
    Type: Grant
    Filed: April 9, 2015
    Date of Patent: December 20, 2016
    Inventor: Bruce W. Hultgren
  • Patent number: 9519973
    Abstract: The disclosed embodiments provide a system that facilitates use of an image. During operation, the system uses a set of images from a camera on a device to obtain a set of features in proximity to the device, wherein the set of images comprises the image. Next, the system uses the set of images and inertial data from one or more inertial sensors on the device to obtain a set of three-dimensional (3D) locations of the features. Finally, the system enables use of the set of 3D locations with the image.
    Type: Grant
    Filed: September 8, 2013
    Date of Patent: December 13, 2016
    Assignee: Intel Corporation
    Inventors: Eagle Sunrise Jones, Benjamin J. Hirashima, Jordan H. Miller
  • Patent number: 9348002
    Abstract: A method of measuring flux density and run out to accommodate rotors of different diameters, evaluate intrinsic properties of magnet material and the magnetization process. Circular run out measurement capability is also used to evaluate bearing journal “ovality.” The method includes the use of a scan tool, or a DLA Rotor Flux Density Scan Fixture, which evaluates the electromagnetic field strength (gauss), combined with surface run out and presents the data in a scalable pictorial format. The scan tool includes a probe which measures a magnetic field strength and circular run out of the perimeter of the magnet. Simultaneously, a non-contact measurement sensor is used to measure the rotor surface for subtle variations. The resulting sine wave gauss data and the surface dimension data are manipulated into a scalable “radar” plot. The radar plot correlates magnetic pole field strength and surface circular run out variation to the index position.
    Type: Grant
    Filed: February 13, 2015
    Date of Patent: May 24, 2016
    Assignee: Continental Automotive Systems, Inc.
    Inventors: Craig Andrew Weldon, Raymond Rasokas
  • Patent number: 9333763
    Abstract: An inkjet printer is provided with a conveyor, a carriage movable in a scanning direction, and mounting a printing head and a sensor configured to output a detection signal based on absence/presence of the sheet, and a controller. The controller is configured to obtain image data representing an image to be printed on the sheet, calculate, based on the image data, an estimate margin value which is used to determine a margin width at an end, in a scanning direction, of the sheet, and detect end positions, in the scanning direction, of the sheet based on the detection signal during movement of the carriage in the scanning direction when the margin width estimated based on the estimate margin value is less than a threshold width, while the detection process is not executed when the margin width is not less than a threshold width.
    Type: Grant
    Filed: December 5, 2014
    Date of Patent: May 10, 2016
    Assignee: Brother Kogyo Kabushiki Kaisha
    Inventor: Kenta Horade
  • Patent number: 9310693
    Abstract: A method for operating a projection exposure tool for microlithography is provided. The projection exposure tool includes an optical system which includes a number of optical elements which, during an imaging process, convey electromagnetic radiation. All of the surfaces of the optical elements interact with the electromagnetic radiation during the imaging process to form an overall optical surface of the optical system.
    Type: Grant
    Filed: March 1, 2013
    Date of Patent: April 12, 2016
    Assignee: Carl Zeiss SMT GmbH
    Inventors: Michael Gerhard, Bernd Doerband, Toralf Gruner
  • Patent number: 9267837
    Abstract: Provided is a method in which an excavation surface is scanned, the excavation surface shape is determined based on scanned excavation surface, an excavating path is identified from a mining excavation equipment, a volume of a material excavated by the mining excavation equipment is actively calculated based at least on the excavation surface shape and the excavating path of the mining excavating equipment, and a weight of the material excavated by the mining excavating equipment is actively calculated based on at least one density factor.
    Type: Grant
    Filed: March 31, 2014
    Date of Patent: February 23, 2016
    Assignee: SIEMENS INDUSTRY, INC.
    Inventor: Julian D. Jaeger
  • Patent number: 9262580
    Abstract: The disclosed method includes: first generating, from data of a plurality of parts that are string-shaped or band-shaped parts formed by end surfaces and side surfaces, first data including control point candidate data for control point candidates within the end surfaces, end surface data defining the end surfaces and path candidate data for path candidates between the control point candidates, for each of the plurality of parts; second generating second data of continuous shape paths representing continuous parts by searching the first data for parts having same control point candidate data and same end surface data; and third generating third data including data of control points determined on end surface portion of the parts and data of paths between the control points for the continuous shape paths and a group of the continuous shape paths from the first data and the second data.
    Type: Grant
    Filed: March 15, 2012
    Date of Patent: February 16, 2016
    Assignee: FUJITSU LIMITED
    Inventors: Kouji Demizu, Masayuki Kidera, Naoyuki Nozaki, Yukihiko Furumoto
  • Patent number: 9224661
    Abstract: Methods for determining a target thickness of a conformal film with reduced uncertainty, and an integrated circuit (IC) chip having a conformal film of the target thickness are provided. In an embodiment, a first critical dimension of a structure disposed on a wafer is measured. Said structure has at least one vertical surface. A first conformal film is deposited over the structure covering each of a horizontal and the vertical surface of the structure. A second critical dimension of the covered structure is then measured. The target thickness of the conformal film is determined based on difference between the first CD measured on the structure and the second CD measured on the covered structure.
    Type: Grant
    Filed: October 2, 2014
    Date of Patent: December 29, 2015
    Assignee: International Business Machines Corporation
    Inventor: Carlos Strocchia-Rivera
  • Patent number: 9182455
    Abstract: A method of measuring flux density and run out to accommodate rotors of different diameters, evaluate intrinsic properties of magnet material and the magnetization process. Circular run out measurement capability is also used to evaluate bearing journal “ovality.” The method includes the use of a scan tool, or a DLA Rotor Flux Density Scan Fixture, which evaluates the electromagnetic field strength (gauss), combined with surface run out and presents the data in a scalable pictorial format. The scan tool includes a probe which measures a magnetic field strength and circular run out of the perimeter of the magnet. Simultaneously, a non-contact measurement sensor is used to measure the rotor surface for subtle variations. The resulting sine wave gauss data and the surface dimension data are manipulated into a scalable “radar” plot. The radar plot correlates magnetic pole field strength and surface circular run out variation to the index position.
    Type: Grant
    Filed: December 11, 2012
    Date of Patent: November 10, 2015
    Assignee: Continental Automotive Systems, Inc.
    Inventors: Craig Andrew Weldon, Raymond Rasokas
  • Patent number: 9182208
    Abstract: In the present invention, by inputting an upper head size to a computer in addition to a front & back length-size and a right & left width-size of a head portion of a helmet wearer and by data-processing them, there is employed a configuration in which a kind of the helmet size and a shape of a pad such as a pad, in the region consisting of the head-top portion and the vicinity thereof, or the like, which fit the head portion of the helmet wearer, are to be selected. According to the present invention, it is possible to provide a selection method in which it is possible to easily select a kind of a preferable size of the helmet, and a preferable shape of the pad in the region consisting of the head-top portion and the vicinity thereof.
    Type: Grant
    Filed: December 10, 2012
    Date of Patent: November 10, 2015
    Assignee: SHOEI CO., LTD.
    Inventor: Takashi Ebisawa
  • Patent number: 9170793
    Abstract: A computing device is connected to a measurement machine. The measurement machine measures an object to obtain images of measured elements of the object by using a measurement program. The computing device divides the measurement program into two or more program segments. An icon for each program segment is generated according to a type of the program segment. The computing device generates a title state and an opened state for each program segment. If a program segment is in the title state, the icon, a name, and a first line of program codes of the program segment is displayed on an interface provided by the electronic device. If the program segment is in the opened state, the computing device displays all program codes of the program segment on the interface.
    Type: Grant
    Filed: October 11, 2012
    Date of Patent: October 27, 2015
    Assignees: HONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD., HON HAI PRECISION INDUSTRY CO., LTD.
    Inventors: Chih-Kuang Chang, Xin-Yuan Wu, Gen Yang
  • Patent number: 9157876
    Abstract: A method of characterizing an object includes determining a depth-wise composition of the object at a measurement site within the object. A property of the object within a region adjacent to the measurement site can, optionally, be estimated based on the determining. Another method of characterizing an object includes disposing at least a portion of an object within a measurement region of a metrology tool, aligning a feature of the object and a location of a designated measurement site within the measurement region relative to each other, and performing a performing a compositional analysis of a portion of the object occupying the measurement site. Various apparatus for performing these methods are also disclosed, as are methods of monitoring manufacturing processes based on these methods.
    Type: Grant
    Filed: July 25, 2012
    Date of Patent: October 13, 2015
    Assignee: ELECTRO SCIENTIFIC INDUSTRIES, INC.
    Inventors: Jonathan D. Halderman, Ciaran John Patrick O'Connor, Jay Wilkins
  • Patent number: 9141094
    Abstract: A personal air quality monitoring system worn or carried by a user. Such system can be used to monitor the local air quality and alert a user should air quality deteriorate below some acceptable desired or configurable threshold.
    Type: Grant
    Filed: March 15, 2014
    Date of Patent: September 22, 2015
    Assignee: Particles Plus, Inc.
    Inventors: David Pariseau, Adam Giandomenico
  • Patent number: 9110115
    Abstract: A flexible capacitance sensor having multiple layers for communicating signals to a data acquisition system for reconstructing an image of an area or object located in a subject being sensed, the flexible capacitance sensor having a flexible layer of capacitance plates; a flexible shielding ground layer next to the layer of capacitance plates; a flexible layer of signal traces next to the shielding ground layer, where the layer of signal traces has a plurality of trace lines; and where the capacitance sensor is flexible and adapted to be wrapped around the subject being sensed. The sensor is adapted to communicate signals via the plurality of trace lines to a data acquisition system for providing an image of the area or object between the capacitance plates.
    Type: Grant
    Filed: August 13, 2013
    Date of Patent: August 18, 2015
    Assignee: TECH4IMAGING LLC
    Inventors: Qussai Marashdeh, Yousef Alghothani
  • Patent number: 9073112
    Abstract: A method and system for controlling the draw die process is disclosed. The system includes a parameter database that stores a plurality of press parameter combinations and an associated probability of a successful draw die process given the press parameter combination and a set of mechanical properties. The system includes a parameter determination module that receives mechanical properties of a blank to be drawn, and selects a parameter combination based on the mechanical properties and the probability of success. The selected press parameter combination is used in the draw die process. A feedback module receives the results of the draw die process and updates the probability of success or failure of a draw die process associated with the selected press parameter combination based on the results.
    Type: Grant
    Filed: March 1, 2012
    Date of Patent: July 7, 2015
    Assignee: FCA US LLC
    Inventors: Trevor M. Cole, Jason A. Ryska, Lance J. Schwartz
  • Patent number: 9068826
    Abstract: A method for checking a blade contour of a turbomachine, in particular a gas turbine, wherein an actual contour (1; 1?) of a blade is detected, wherein a target contour of the blade is scaled and the actual contour is compared with said scaled contour (2).
    Type: Grant
    Filed: May 9, 2012
    Date of Patent: June 30, 2015
    Assignee: MTU Aero Engines AG
    Inventor: Hans Zimmermann
  • Publication number: 20150142379
    Abstract: A system, method and device for forcing the measurement of a triangle. The method includes computing angles A B C, BAC and ACB for a triangle ABC, determining the measurement of at least one of angles ABC, BAC and ACB in degrees, nudging the angles to ensure that measurements are integers and add up to 180 degrees. The method may also include determining a closest integer to the measurement of the at least one of the angles ABC, BAC and ACB, rotating segment AC of the triangle ABC around A by a?-a degrees, where a is the measurement of the at least one of angles ABC, BAC and ACB and a? is the closest integer to the measurement of at least one of the angles ABC, BAC and ACB and wherein the new position of C is C? and angle BAC? is equal to a?, moving point C? along the fixed direction of line AC?, and ensuring that the other two the angles of the triangle ABC are integers.
    Type: Application
    Filed: November 20, 2014
    Publication date: May 21, 2015
    Inventor: Michel Georges Stella
  • Publication number: 20150142380
    Abstract: According to various embodiments, package evaluation systems and methods are provided for evaluating the sustainability of packaging used in the shipment of goods. In particular, the package evaluation systems and methods are configured for performing package evaluations and managing and providing access to data resulting from package evaluations. The package evaluations are designed to assess, among other things, the ability of sample packages to prevent damage to their contents, the volumetric efficiency of sample packages, and the sustainability of the materials used to construct sample packages. In addition, the systems and methods are further configured for assigning a certification to an entity associated with the evaluated packages based on the results of the evaluation.
    Type: Application
    Filed: January 22, 2015
    Publication date: May 21, 2015
    Inventors: ARNOLD BARLOW, DENNIS R. ESTEP, ANDREW J. GRUBER, PATRICK MCDAVID, QUINTO MARINI, NANCY PARMER
  • Patent number: 9037434
    Abstract: A method and apparatus for determining axial clearance data between a rotor and a stator are disclosed. At least one radial clearance sensor is positioned on the stator and is configured to gather radial clearance data, i.e., measurements of a radial distance between the rotor and the stator taken at discrete time intervals. A computing device is operably connected with the at least one radial clearance sensor and is configured to use the radial clearance data to determine axial clearance data, i.e., an axial distance between the stator and the rotor. In one embodiment, the computing device uses, among other data points, an indication of a loss of signal from at least one radial clearance sensor to extrapolate the axial clearance data.
    Type: Grant
    Filed: January 3, 2012
    Date of Patent: May 19, 2015
    Assignee: General Electric Company
    Inventors: Fred Thomas Willett, Jr., Emad Andarawis Andarawis
  • Patent number: 9031810
    Abstract: A system and method for enhanced and expanded localized geometry characterization. Objects of interest are enhanced, detected, and classified according to user-defined parameters, and this enables enhanced contrast and more accurate feature detection, as well as more accurately defined feature object regions for feature geometry measurement and characterization.
    Type: Grant
    Filed: June 27, 2011
    Date of Patent: May 12, 2015
    Inventors: Haiguang Chen, Jaydeep K. Sinha, Sergey Kamensky
  • Patent number: 9031813
    Abstract: Methods and apparatus (100,200) for estimating the gravity-free shape of a flexible object (140) such as a thin sheet of glass are provided. In certain embodiments, an estimate of the gravity-free shape is produced using a bed-of-nails (BON) gauge (100) and then the shape is measured at a higher spatial resolution using a second gauge (200), with the theoretical sag between the pins (110) of the BON gauge being subtracted from the shape measured by the second gauge. In other embodiments, shape measurements are performed on both sides of the object (140) and used to estimate the reliability of the gravity-free shape estimate. In further embodiments, the bed-of-nails gauge (100) uses a least squares minimization procedure in adjusting the heights of the pins (110).
    Type: Grant
    Filed: August 27, 2010
    Date of Patent: May 12, 2015
    Assignee: Corning Incorporated
    Inventors: John Steele Abbott, III, Daniel R Harvey, Correy Robert Ustanik
  • Publication number: 20150111312
    Abstract: Provided are a deposition data processing apparatus, an apparatus and a method for manufacturing an organic EL device, which make it possible to check deposition states of constituent layers of each of organic EL elements that are continuously formed on a substrate being conveyed. The deposition data processing apparatus includes a scanning section configured to scan at least two of a plurality of constituent layers that constitute each of the organic EL elements; and a processor configured to accumulate data of the constituent layers scanned by the scanning section at a specific position in a longitudinal direction of the substrate as data of a specific one of the organic EL elements.
    Type: Application
    Filed: March 5, 2013
    Publication date: April 23, 2015
    Applicant: NITTO DENKO CORPORATION
    Inventors: Ryohei Kakiuchi, Satoru Yamamoto, Takayoshi Yamano
  • Publication number: 20150088454
    Abstract: When measuring the dimensions of a tool having a cutting portion at an edge of a planar portion, first a plurality of points are measured on the planar portion using a measuring probe, then a planar formula for a measurement plane containing the planar portion is determined from these measured values. Next, the measuring probe is moved along the measurement plane expressed by the planar formula from the exterior of the cutting portion toward the cutting portion until the measuring probe contacts the cutting portion. The position of the cutting portion is determined based on the position of the measuring probe when the measuring probe comes into contact with the cutting portion.
    Type: Application
    Filed: April 6, 2012
    Publication date: March 26, 2015
    Applicant: MAKINO MILLING MACHINE CO., LTD.
    Inventors: Kousuke Sugiyama, Tadashi Kimura, Tadahiro Nakamura
  • Publication number: 20150088455
    Abstract: A real acceleration computing unit 3 calculates the real acceleration Gw in the direction of travel of a vehicle by acquiring the velocity V a wheel speed sensor 12 installed in the vehicle detects. A road surface gradient computing unit 5 calculates the inclination of a road surface (road surface gradient ?1) from the real acceleration Gw and the accelerations Gx and Gz in the back and forth and up and down directions of the vehicle an acceleration sensor 11 installed in the vehicle detects. A pitching angle computing unit 6 calculates the inclination of the vehicle with respect to the road surface (pitching angle ?2) from the real acceleration Gw and the accelerations Gx and Gz.
    Type: Application
    Filed: August 1, 2012
    Publication date: March 26, 2015
    Applicant: Mitsubishi Electric Corporation
    Inventor: Toshiyuki Yamashita
  • Patent number: 8990044
    Abstract: A revolution counter including sensors, which generate position values that define an angular position of a shaft, and a determination unit that receives the position values and generates decision signals therefrom, wherein the decision signals determine counting sectors. The revolution counter includes a counting control unit that receives the counting sectors, and operates the revolution counter in a first mode or a second mode of operation. The counting control unit switches over to the second mode, if after a length of time no change in one of the counting sectors takes place, and switches over to the first mode if a change in one of the counting sectors does take place. The determination unit determines an uncertainty range between each pairing of the counting sectors. The counting control unit does not take the uncertainty ranges into account for the switchover from the second mode to the first mode.
    Type: Grant
    Filed: December 14, 2009
    Date of Patent: March 24, 2015
    Assignee: Dr. Johannes Heidenhain GmbH
    Inventor: Johann Oberhauser
  • Patent number: 8988033
    Abstract: A machine tool includes a main axis 30 to which a touch probe 17 is attached, a motor 15 that rotationally drives the main axis 30, a rotation angle position detector 16 that detects a rotation angle position of the motor 15, and a control device 20. The control device, when a measurement mode command for performing measurement of a workpiece by the touch probe 17 is input, multiplies a d-axis current command value Idc by a d-axis current correction coefficient K that is less than 1 to reduce the d-axis current command value Idc to a d-axis current command correction value Idc?, using a d-axis current command correction section 4. Thus, in the machine tool, small rotation vibrations of the main axis, generated when rotating the main axis to which the probe is attached and performing measurements of a workpiece, can be suppressed to thereby increase the measurement accuracy.
    Type: Grant
    Filed: October 18, 2012
    Date of Patent: March 24, 2015
    Assignee: OKUMA Corporation
    Inventors: Tomohiro Shibata, Tomohisa Kameyama
  • Patent number: 8983794
    Abstract: A non-destructive inspection system for a structure is described. The inspection system includes a local positioning system (LPS) configured for determining position and orientation of objects relative to a structure coordinate system, a six degree-of-freedom digitizer operable for at least one of temporary attachment to the structure and placement proximate the structure, a non-destructive sensor array, and a processing device.
    Type: Grant
    Filed: October 4, 2010
    Date of Patent: March 17, 2015
    Assignee: The Boeing Company
    Inventors: William P. Motzer, Gary E. Georgeson, Scott W. Lea, James J. Troy
  • Patent number: 8976172
    Abstract: The disclosed embodiments provide a method and system for operating a portable electronic device. The portable electronic device includes a camera that obtains a set of images and one or more inertial sensors that obtain inertial data associated with the portable electronic device. The portable electronic device also includes an analysis apparatus that uses the set of images to obtain a set of features in proximity to the portable electronic device. Next, the analysis apparatus updates a set of locations of the features based on the set of images and the inertial data. Finally, the analysis apparatus uses the set of features and the set of locations to provide a model of an environment around the portable electronic device without requiring the use of specialized hardware to track the features and the locations.
    Type: Grant
    Filed: December 15, 2012
    Date of Patent: March 10, 2015
    Assignee: RealityCap, Inc.
    Inventor: Eagle Sunrise Jones
  • Publication number: 20150066428
    Abstract: A method and apparatus for designing and fabricating a pantomesh. The pantomesh includes a plurality of pantomesh elements each including a pairs of links connected to one another by a revolute joint at points between their ends. Each of a plurality of the pantomesh elements is connected using spherical joints to a plurality of neighboring pantomesh elements, wherein a first line that extends along one side of a first pantomesh element forms a first variable angle with a second line that extends along an opposite side of the first pantomesh element. In some embodiments, at least some of the pantomesh elements of the pantomesh are not isosceles trapezoidal elements. In some embodiments, the pantomesh is used to compress breast tissue during an MRI procedure. In some embodiments, the pantomesh is connected to one or more actuators that facilitate remote control of the amount of compression provided.
    Type: Application
    Filed: November 11, 2014
    Publication date: March 5, 2015
    Inventors: Blake Timothy Larson, Arthur Guy Erdman
  • Patent number: 8969203
    Abstract: There is described a method for creating a thermally-isolated microstructure on a slab of mono-crystalline silicon which uses a hybrid dry-then-wet etch technique that when controlled, can produce microstructures without any silicon adhering underneath, microstructures having small masses of silicon adhering underneath, and microstructures that are still attached to the slab of mono-crystalline silicon via a waisted silicon body. When creating the microstructures with a waisted silicon body, the thermal isolation of the microstructure can be designed by controlling the depth of the etching and the size of the waist.
    Type: Grant
    Filed: April 21, 2011
    Date of Patent: March 3, 2015
    Assignee: Sensortechnics GmbH
    Inventors: Leslie M. Landsberger, Oleg Grudin, Jens Urban, Uwe Schwarz
  • Publication number: 20150046118
    Abstract: Disclosed are apparatus and methods for determining process or structure parameters for semiconductor structures. A plurality of optical signals is acquired from one or more targets located in a plurality of fields on a semiconductor wafer. The fields are associated with different process parameters for fabricating the one or more targets, and the acquired optical signals contain information regarding a parameter of interest (POI) for a top structure and information regarding one or more underlayer parameters for one or more underlayers formed below such top structure. A feature extraction model is generated to extract a plurality of feature signals from such acquired optical signals so that the feature signals contain information for the POI and exclude information for the underlayer parameters. A POI value for each top structure of each field is determined based on the feature signals extracted by the feature extraction model.
    Type: Application
    Filed: August 6, 2014
    Publication date: February 12, 2015
    Applicant: KLA-Tencor Corporation
    Inventors: Stilian Ivanov Pandev, Andrei V. Shchegrov
  • Patent number: 8949070
    Abstract: A method or apparatus for monitoring human activity using an inertial sensor is described. The method includes monitoring accelerations, and identifying a current user activity from a plurality of user activities based on the accelerations. In one embodiment, each of the plurality of user activities is associated with one of a plurality of types of periodic human motions that are detectable by the portable electronic device, and wherein the identification of the current user activity is made based on detecting two or more instances of the periodic human motion associated with the user activity. The method further includes counting periodic human motions appropriate to the current user activity.
    Type: Grant
    Filed: February 8, 2008
    Date of Patent: February 3, 2015
    Assignee: DP Technologies, Inc.
    Inventors: Philippe Richard Kahn, Arthur Kinsolving, Mark Andrew Christensen, Brian Y. Lee, David Vogel
  • Patent number: 8938368
    Abstract: Systems and methods for segmenting a period of time into identification of locations of a user who performs activities are described. One of the methods includes detecting activity of a monitoring device worn by the user. The activity includes an amount of movement of the monitoring device. The activity is performed for a period of time. The method further includes obtaining geo-location data for the monitoring device and storing, during the period of time, the detected activity and corresponding geo-location data. The method also includes analyzing the detected activity and the corresponding geo-location data to identify one or more events. Each event is associated with a group of activity data and one or more of the groups of activity data is associated with an identifier, which is obtained using the geo-location data.
    Type: Grant
    Filed: May 15, 2014
    Date of Patent: January 20, 2015
    Assignee: Fitbit, Inc.
    Inventors: Shelten Gee Jao Yuen, James Park, Hans Christiansen Lee
  • Publication number: 20150012243
    Abstract: The present invention provides a semiconductor evaluation device for fabricating a suitable reference pattern utilized in comparison tests. The semiconductor evaluation device and computer program extract a process window in a more accurate range based on a two-dimensional evaluation of the pattern. In order to achieve the above described objects, the present invention includes a semiconductor evaluation device that measures the dimensions of the pattern formed over the sample based on a signal obtained by way of a charged particle beam device, selects a pattern whose dimensional measurement results satisfy specified conditions or exposure conditions when the pattern is formed, and forms synthesized contour data, by synthesizing contour data obtained from images of an identically shaped pattern in design data, and also a pattern formed under the selected exposure conditions or a pattern having a positional relation that is already known relative to the selected pattern.
    Type: Application
    Filed: February 8, 2013
    Publication date: January 8, 2015
    Applicant: Hitachi High-Technologies Corporation
    Inventors: Asuka Honda, Hiroyuki Shindo