Dimensional Determination Patents (Class 702/155)
  • Patent number: 11393118
    Abstract: Using data about the geometry of the wafer, the geometry of the wafer is measured along at least three diameters originating at different points along a circumference of the wafer. A characterization of the geometry of the wafer is determined using the three diameters. A probability of wafer clamping failure for the wafer can be determined based on the characterization.
    Type: Grant
    Filed: June 9, 2020
    Date of Patent: July 19, 2022
    Assignee: KLA CORPORATION
    Inventors: Shivam Agarwal, Priyank Jain, Yuan Zhong, Chiou Shoei Chee
  • Patent number: 11373417
    Abstract: A section line recognition device is realized which can determine a line type of a section line in a road surface with high accuracy. In step 301, a feature amount is extracted from an image captured by each camera. This step corresponds to a process of a feature point extraction unit. In the next step 302, the extracted feature amount is transformed into bird's-eye view coordinates which is common coordinates. This step corresponds to a process of a coordinates transformation unit. Next, in step 303, a camera to be selected is determined. This step is a process of a camera determination unit. Next, in step 304, the state transition at the appearance position of the feature point on the bird's-eye view coordinates is determined using feature point coordinates of the camera selected in step 303. This step is a process of a state transition determination unit. Finally, in step 305, the line type is determined. This step is a process of a line type determination unit.
    Type: Grant
    Filed: September 6, 2017
    Date of Patent: June 28, 2022
    Assignee: CLARION CO., LTD.
    Inventors: Kimiyoshi Machii, Takehito Ogata, Junya Nakamura, Naoki Shimizu, Ayano Enomoto
  • Patent number: 11358029
    Abstract: A system for carrying out a training or a competition of or between two athletes, wherein the system comprises: a first sports garment comprising a first signal element and a connection to a first mobile phone, wherein first control and/or calculating means are arranged for measuring of an actual distance covered by the first athlete; a second sports garment comprising a second signal element and a connection to a second mobile phone, wherein second control and/or calculating means are arranged for measuring of an actual distance covered by the second athlete, wherein first control means are provided for emitting a predetermined first signal by the first signal element in the case that the actual distance of the first athlete is bigger than the actual distance of the second athlete and wherein second control means are provided at or in the second sports garment for emitting a predetermined second signal by the second signal element in the case that the actual distance of the first athlete is bigger than the a
    Type: Grant
    Filed: February 8, 2017
    Date of Patent: June 14, 2022
    Assignee: PUMA SE
    Inventors: Jordi Beneyto-Ferre, Baljinder Kaur Miles, Charles Johnson
  • Patent number: 11300465
    Abstract: In various example embodiments, devices, systems, and methods for a waist measuring belt are provided. An example waist measuring belt is made up of a belt buckle frame with attachments for a belt strap. The belt further includes a position measuring module coupled to the belt buckle frame that measures an attachment position of a second end of the belt strap to the belt buckle frame. The belt also includes a tension measuring module coupled to the belt buckle frame that measures a tension through the belt buckle frame and the belt strap. A memory and a wireless communication module attached to the belt may be used to store measurements and communicate with a mobile device or server. In various embodiments, estimated user waist sizes over time using measured values and belt-specific data may be used to estimate a user's waist size and generate a waist size history.
    Type: Grant
    Filed: October 27, 2020
    Date of Patent: April 12, 2022
    Assignee: eBay Inc.
    Inventors: Jennifer T. Robertson, Bryant Genepang Luk, Robert He, Ananya Das, Christopher Diebold O'Toole, Yu Tang, Richard Chapman Bates, Jason Ziaja
  • Patent number: 11143586
    Abstract: Methods and apparatus for improving signal-to-noise ratio in a Fountain Flow cytometer by reducing the background light intensity. One approach includes constraining an interrogated volume of the sample (e.g., by adding a light absorbing reagent to the sample or introducing a bend into a flow cell through which the sample flows). Another approach includes minimizing Raman scattering from the sample by choosing an excitation filter and an emission filter configured to narrowly encompass light at wavelengths within system excitation and emission peaks.
    Type: Grant
    Filed: November 16, 2020
    Date of Patent: October 12, 2021
    Inventor: Paul E. Johnson
  • Patent number: 11041712
    Abstract: The present disclosure includes systems and methods for determining dimensions, shapes, and locations of rooms of a building using a mobile device for controlling heating, ventilation, and air conditioning (HVAC) provided to the rooms and building. A measuring device receives a shape of a room in the building and determines a dimension set of the room based on the shape of the room. The measuring device transmits the shape of the room and the dimension set to a mobile device that determines a layout of the building based on the shapes and the dimension sets corresponding to the rooms of the building. In this manner, the systems and methods provide the layout of the building more efficiently, resulting in an improved HVAC system installation and operation process.
    Type: Grant
    Filed: April 30, 2018
    Date of Patent: June 22, 2021
    Assignee: JOHNSON CONTROLS TECHNOLOGY COMPANY
    Inventors: Shaun B. Atchison, Jedidiah O. Bentz, John W. Uerkvitz, Aneek M. Noor, Drew H. Carlton, Andrew M. Boyd, Brian D. Rigg, Shawn A. Hern, Noel A. Grajeda-Trevizo, Cody J. Kaiser, Tom R. Tasker
  • Patent number: 11016397
    Abstract: A method and a computer program product that relates to lithographic apparatuses and, processes, and more particularly to a method and computer program to inspect substrates produced by the lithographic apparatuses and processes. The method and/or computer program product includes determining contributions from independent sources from results measured from a lithography process or a substrate processed by the lithography process, wherein the results are measured using a plurality of different substrate measurement recipes.
    Type: Grant
    Filed: November 22, 2016
    Date of Patent: May 25, 2021
    Assignee: ASML Netherlands B.V.
    Inventors: Scott Anderson Middlebrooks, Omer Abubaker Omer Adam, Adrianus Cornelis Matheus Koopman, Henricus Johannes Lambertus Megens, Arie Jeffrey Den Boef
  • Patent number: 11007042
    Abstract: Described herein are systems and methods for marking models for dental aligner fabrication. A method for producing a physical model of teeth including a three-dimensional marking includes receiving a first digital model of teeth in an alignment position and selecting a location for marking a physical model of the teeth in the alignment position with a three-dimensional marking, the physical model to be fabricated based on the first digital model. The method also includes generating a second digital model of the teeth in the alignment position based on the first digital model, the second digital model representing the physical model and including the three-dimensional marking at the marking location, and using a three-dimensional fabrication method to fabricate the physical model including the three-dimensional marking from the second digital model.
    Type: Grant
    Filed: February 6, 2019
    Date of Patent: May 18, 2021
    Assignee: SDC U.S. SmilePay SPV
    Inventors: Josh Long, Christopher Yancey, Tony Solarek, Daniel Pfeffer, Clete Culp
  • Patent number: 10974386
    Abstract: The robot simulation apparatus includes: a workpiece model setting unit 11 that sets a workpiece model obtained by forming a model of a three-dimensional shape of a workpiece; a bulk pile data generating unit 20 that generates virtual bulk pile data of a plurality of workpiece models piled up in a virtual work space as a virtually formed work space; a region estimating unit 22 that identifies an estimated region that is estimated to be three-dimensionally measurable by a sensor unit which is disposed above the work space, based on a position and a posture of each workpiece model in the bulk pile data; and a picking motion simulating unit 30 that executes a simulation for verifying the picking motion from the bulk pile of the workpiece models in the virtual work space, based on data of the estimated region identified by the region estimating unit 22.
    Type: Grant
    Filed: February 12, 2018
    Date of Patent: April 13, 2021
    Assignee: KEYENCE CORPORATION
    Inventors: Masato Shimodaira, Tomotaka Shimano, Naoki Takayama
  • Patent number: 10913157
    Abstract: The robot simulation apparatus includes: a workpiece model setting unit 11 that sets a workpiece model; a posture condition setting unit 16 that sets a condition related to a posture taken by the workpiece model, as a posture condition, when the workpiece model set by the workpiece model setting unit 11 is disposed in a virtual work space as a virtually formed work space; a bulk pile data generating unit 20 that generates bulk pile data of the plurality of workpiece models piled up in the virtual work space, in accordance with the posture condition set by the posture condition setting unit 16; and a picking motion simulating unit 30 that executes a picking motion simulation for verifying the picking motion of the workpiece models in the virtual work space, with respect to the bulk pile data generated by the bulk pile data generating unit 20.
    Type: Grant
    Filed: February 12, 2018
    Date of Patent: February 9, 2021
    Assignee: KEYENCE CORPORATION
    Inventors: Masato Shimodaira, Kazuhito Saeki
  • Patent number: 10916008
    Abstract: Methods for recognizing or identifying tooth types using digital 3D models of teeth. The methods include receiving a segmented digital 3D model of teeth and selecting a digital 3D model of a tooth from the segmented digital 3D model. An aggregation of the plurality of distinct features of the tooth is computed to generate a single feature describing the digital 3D model of the tooth. A type of the tooth is identified based upon the aggregation, which can include comparing the aggregation with features corresponding with known tooth types. The methods also include identifying a type of tooth, without segmenting it from an arch, based upon tooth widths and a location of the tooth within the arch.
    Type: Grant
    Filed: June 26, 2018
    Date of Patent: February 9, 2021
    Assignee: 3M INNOVATIVE PROPERTIES COMPANY
    Inventors: Guruprasad Somasundaram, Ravishankar Sivalingam, Evan J. Ribnick, Kevin S. Xu
  • Patent number: 10871439
    Abstract: Methods and apparatus for reducing the background light intensity measured by a Fountain Flow cytometer. One approach includes constraining an interrogated volume of the sample (e.g., by adding a light absorbing reagent to the sample or introducing a bend into a flow cell through which the sample flows). Another approach includes minimizing Raman scattering from the sample by choosing an excitation filter and an emission filter configured to narrowly encompass light at wavelengths within system excitation and emission peaks.
    Type: Grant
    Filed: October 29, 2018
    Date of Patent: December 22, 2020
    Assignee: University of Wyoming
    Inventor: Paul E. Johnson
  • Patent number: 10818481
    Abstract: Embodiments involve smart device fabrication for semiconductor processing tools via precision patterning. In one embodiment, a method of manufacturing a semiconductor processing tool component includes providing a substrate of the semiconductor processing tool component, patterning the substrate to form a sensor directly on the substrate, and depositing a top layer over the sensor. The sensor may include, for example, a temperature or strain sensor. The method can also include patterning the substrate to form one or more of: heaters, thermistors, and electrodes on the substrate. In one embodiment, the method involves patterning a surface of the component oriented towards a plasma region inside of the semiconductor processing tool.
    Type: Grant
    Filed: July 20, 2016
    Date of Patent: October 27, 2020
    Assignee: Applied Materials, Inc.
    Inventors: Jennifer Sun, Yikai Chen, Biraja Kanungo, Vahid Firouzdor
  • Patent number: 10725447
    Abstract: An automated method for straightening/correcting deformations made to panels when welded to metallic structural components is disclosed. In the train industry, when an aluminum component, such as a vehicle's exterior shell, is welded to hidden structural parts, deformations thereon may occur. Such deformations need to be subsequently corrected, and the present method uses robots and optical measuring of the deformed surfaces to conduct a straightening thereof. The method includes four main steps. First, the deformed surface is scanned with an optical sensor to make physical measures/characterizations thereof. Second, the gathered data are compared with the desired resultant by a software. Third, once the comparison is done, the software performs an analysis to select the proper parameters to be used in the straightening method that will be applied at each area requiring straightening. Finally, a robot executes the operations specified by the software to perform the straightening process.
    Type: Grant
    Filed: October 24, 2018
    Date of Patent: July 28, 2020
    Assignee: Bombardier Transportation GmbH
    Inventors: Gaston Morneau, Gabriel Caron-Guillemette, Frédéric Allard
  • Patent number: 10659631
    Abstract: An information processing apparatus includes an acquisition unit that acquires, from a terminal apparatus, control information including model identification information for identifying a model of the terminal apparatus and setting information concerning display setting of a screen of the terminal apparatus; and a controller that causes a screen on which fewer display items than an ordinary screen are displayed to be displayed on a display in a case where the model identification information included in the control information indicates a specific model or in a case where the setting information included in the control information indicates specific setting.
    Type: Grant
    Filed: December 12, 2017
    Date of Patent: May 19, 2020
    Assignee: FUJI XEROX CO., LTD.
    Inventor: Koichi Sato
  • Patent number: 10648477
    Abstract: A state observation device (30) uses an ADC (37) to digitize a detection signal from a gap sensor (21) at a low-speed sampling period and uses a separation unit (38) to separate the digitized detection signal into vane detection signals considered to be for the detection of a vane of a compressor impeller and non-vane detection signals considered not to be for the detection of a vane. Further, the determination unit (39) extracts a vane peak detection signal considered to be for a vane peak by comparing a vane detection signal with vane detection signals corresponding to other vanes and non-vane detection signals, and a shaft vibration and tip clearance are determined as states of the compressor impeller on the basis of the extracted vane peak detection signal. Thus, the state observation device (30) is capable of observing the state of a rotary machine without carrying out high-speed sampling.
    Type: Grant
    Filed: October 6, 2015
    Date of Patent: May 12, 2020
    Assignee: Mitsubishi Heavy Industries, Ltd.
    Inventors: Tadashi Yoshida, Shinji Ogawa, Koichi Sakamoto, Yukihiro Iwasa
  • Patent number: 10648793
    Abstract: A library expansion system, method, and computer program product for metrology are provided. In use, processing within a first multi-dimensional library is performed by a metrology system. During the processing within the first multi-dimensional library, a second multi-dimensional library is identified. The processing is then transitioned to the second multi-dimensional library. Further, processing within the second multi-dimensional library is performed by the metrology system.
    Type: Grant
    Filed: May 12, 2015
    Date of Patent: May 12, 2020
    Assignee: KLA-TENCOR CORPORATION
    Inventors: Leonid Poslavsky, Liequan Lee
  • Patent number: 10634532
    Abstract: Provided are a system and a method for optimizing driving of an ultrasonic sensor. The system for optimizing driving of an ultrasonic sensor includes: an ultrasonic sensor unit provided on an inner bottom surface of a fuel tank for a vehicle and obtaining a time of flight (TOF) for calculating a distance from the inner bottom surface of the fuel tank to a fuel surface; and a central processing unit calculating liquid level information of the fuel tank using the TOF transferred from the ultrasonic sensor unit and controlling a driving voltage of the ultrasonic sensor unit using the liquid level information.
    Type: Grant
    Filed: November 13, 2017
    Date of Patent: April 28, 2020
    Assignee: COAVIS
    Inventors: Se Jin Kim, In Gon Kim, Jong Hyuk Yoon
  • Patent number: 10589545
    Abstract: Provided herein are methods of obtaining good photocured-ink adhesion to low surface energy materials. The methods have greatly improved adhesion of photocured ink on low surface energy materials, including those that are subjected to high humidity or wet environments. The methods take into account the glass transition temperature (Tg) of the materials and the onset for the glass transition temperature, including ink applied to an exposed surface of the material at an elevated temperature that is close to the Tg of the material. The ink is allowed to sit briefly or soak, such as for more than 1 second, before the ink is cured. The ink may be photocured. Furthermore, the methods do not require solvents or surface treatment, including plasma or corona treatments, to obtain good ink adhesion.
    Type: Grant
    Filed: May 1, 2019
    Date of Patent: March 17, 2020
    Assignee: Align Technology, Inc.
    Inventor: Michael Christopher Cole
  • Patent number: 10532465
    Abstract: A handheld tool includes a handle for holding by a user, an attachment arm extending from the handle that is configured to connect to a user-assistive device, a first inertial measurement unit (“IMU”) mounted to the attachment arm to acquire measurements of one or more of a motion or an orientation of the user-assistive device and to generate feedback data indicative of the measurements, an actuator assembly coupled to manipulate the user-assistive device via the attachment arm in at least two orthogonal dimensions, and a motion control system coupled to receive the feedback data from the first IMU and coupled to provide commands to the actuator assembly to provide auto-leveling of the user-assistive device to a frame of reference while the user manipulates the handheld tool.
    Type: Grant
    Filed: February 16, 2017
    Date of Patent: January 14, 2020
    Assignee: Verily Life Sciences LLC
    Inventors: Anupam J. Pathak, Michael M. Allen
  • Patent number: 10524544
    Abstract: Systems and methods are provided for collecting three-dimensional surface data of a lasted shoe upper that is mated with a sole that is configured for the lasted upper. The mated three-dimensional data is used with three-dimensional data of the lasted shoe upper in an unmated configuration with the sole to determine a location of an edge defined by the intersection of the lasted upper and the sole when mated. The bite line identifies an edge where the upper and a sole assembly will intersect on a finished shoe, which may represent a bounding line for application of adhesive to the lasted upper for boding the sole thereto.
    Type: Grant
    Filed: January 22, 2014
    Date of Patent: January 7, 2020
    Assignee: Nike, Inc.
    Inventors: Dragan Jurkovic, Ming-Feng Jean, Chih-Chi Chang, Chin-Yi Lin
  • Patent number: 10380728
    Abstract: Methods and systems for combining information present in measured images of semiconductor wafers with additional measurements of particular structures within the measured images are presented herein. In one aspect, an image-based signal response metrology (SRM) model is trained based on measured images and corresponding reference measurements of particular structures within each image. The trained, image-based SRM model is then used to calculate values of one or more parameters of interest directly from measured image data collected from other wafers. In another aspect, a measurement signal synthesis model is trained based on measured images and corresponding measurement signals generated by measurements of particular structures within each image by a non-imaging measurement technique.
    Type: Grant
    Filed: August 5, 2016
    Date of Patent: August 13, 2019
    Assignee: KLA-Tencor Corporation
    Inventor: Stilian Ivanov Pandev
  • Patent number: 10332810
    Abstract: Systems and methods for performing one or more processes on a specimen are provided. One system includes a deposition module incorporated into an existing tool configured to perform an inspection and/or metrology process. The deposition module is configured to deposit one or more materials on a specimen prior to the inspection and/or metrology process performed on the specimen. In some embodiments, the system also includes a stripping module incorporated into the existing tool, and the stripping module is configured to remove material(s) from the specimen subsequent to the inspection and/or metrology process performed on the specimen. The existing tool includes an illumination subsystem configured to direct light having one or more illumination wavelengths to the specimen; a detection subsystem configured to detect light from the specimen; and a computer subsystem configured to determine information for the specimen using output generated by the detection subsystem responsive to the detected light.
    Type: Grant
    Filed: October 24, 2017
    Date of Patent: June 25, 2019
    Assignee: KLA-Tencor Corp.
    Inventor: Bobby R. Bell
  • Patent number: 10310922
    Abstract: Methods, systems, and apparatus including medium-encoded computer program products for generating and visualizing 3D scenes include, in one aspect, a method including: obtaining data regarding (i) standard calibration parts with shapes comprising a cylinder and polyhedrons, and (ii) a limited number of scanning trials performed on the standard calibration parts using a three dimensional (3D) scanner; comparing the data to find shape deviations for the standard calibration parts in a coordinate system; generating a model of functional dependence of scanning error for the 3D scanner using the shape deviations; and providing the model of functional dependence of scanning error for the 3D scanner to quantify scanning inaccuracy of the 3D scanner, wherein the model is usable to predict a measurement error for the 3D scanner on a scanned product.
    Type: Grant
    Filed: April 13, 2016
    Date of Patent: June 4, 2019
    Assignee: University of Southern California
    Inventor: Qiang Huang
  • Patent number: 10313653
    Abstract: Interactive content is obtained, the interactive content including a stereoscopic equirectangular video frame. A UV coordinate screen space is generated. A first location of the UV coordinate screen space is computed. A second location of the UV coordinate screen space is computed. A point of the UV coordinate screen space to procedurally render is selected. Virtual spherical coordinates are computed using the point of the UV coordinate screen space to procedurally render. The virtual spherical coordinates are rotated using a rotation matrix. An equirectangular coordinate value within the video frame is determined using the rotated virtual spherical coordinates. The pixel values of the stereoscopic equirectangular video frame are identified using the equirectangular coordinate value. The pixel values are returned for the UV coordinate screen space, thereby causing a corresponding presentation on a physical screen of an interactive content player device.
    Type: Grant
    Filed: November 15, 2017
    Date of Patent: June 4, 2019
    Assignee: Secret Location Inc.
    Inventor: John Cumming
  • Patent number: 10271759
    Abstract: A body fat measurement device includes: a measurement unit for measuring a shape of a measurement subject's trunk area; a breathing estimation unit that detects a change over time in the measured trunk area shape and estimates the measurement subject's breathing based on the detected change; a breathing state determination unit that determines whether or not the estimated breathing of the measurement subject is in a state suited to measurement; a state output unit that outputs the estimated breathing state to the exterior in association with a result of the determination; and a fat mass calculation unit that calculates a trunk area fat mass using the body impedance measured by a body impedance measurement unit and a trunk area size based on the trunk area shape measured by the measurement unit.
    Type: Grant
    Filed: November 30, 2012
    Date of Patent: April 30, 2019
    Assignee: FUKUDA DENSHI CO., LTD.
    Inventors: Yasuaki Murakawa, Takehiro Hamaguchi, Kazuhisa Tanabe, Hiromichi Karo
  • Patent number: 10246888
    Abstract: A floor plan is fit to a foundation and points are defined at relevant locations on the floor plan. The points are defined based on the location of the point and the features associated with the point. Walls are laid out at full scale on a construction site based on the floor plan. The walls are located by locating the positions of the defined points, and the defined points are located with a point marker base, prism assembly, and electronic surveying equipment. The prism assembly is mounted to the point marker base, and the point marker base provides a reference point from which an offset distance to the defined point is determined. A rotatable measuring instrument is secured to the point marker base and measures the offset distance. Wall lines are located based on the location of the defined point.
    Type: Grant
    Filed: January 19, 2016
    Date of Patent: April 2, 2019
    Inventors: Gerald Dean Onchuck, Arnel William Onchuck
  • Patent number: 10228765
    Abstract: An electronic device: while displaying a user interface, detects an input sequence that includes detecting an increase in a characteristic intensity of a contact on a home button. In response, the device determines whether the increase is above a first intensity threshold and whether a change in the characteristic intensity proximate to a time when the characteristic intensity increases above the first intensity threshold has a first or a second value for an intensity-change metric. If the increase is above the threshold and the change has the first value, the device performs a first operation that changes the user interface displayed on the display; and generates a first discrete tactile output that corresponds to the increase. If the increase is above the threshold and the change has the second value, the device performs the first operation and generates a second discrete tactile output that corresponds to the increase.
    Type: Grant
    Filed: September 22, 2016
    Date of Patent: March 12, 2019
    Assignee: APPLE INC.
    Inventors: Imran A. Chaudhri, Sebastian J. Bauer, Camille Moussette, Jean-Pierre M. Mouilleseaux, Madeleine S. Cordier, Joshua B. Kopin
  • Patent number: 10168826
    Abstract: An electronic device displays a user interface in a first display state. The device detects a first portion of a gesture on a touch-sensitive surface, including detecting intensity of a respective contact of the gesture. In response to detecting the first portion of the gesture, the device displays an intermediate display state between the first display state and a second display state. In response to detecting the end of the gesture: if intensity of the respective contact had reached a predefined intensity threshold prior to the end of the gesture, the device displays the second display state; otherwise, the device redisplays the first display state. After displaying an animated transition between a first display state and a second state, the device, optionally, detects an increase of the contact intensity. In response, the device displays a continuation of the animation in accordance with the increasing intensity of the respective contact.
    Type: Grant
    Filed: April 7, 2017
    Date of Patent: January 1, 2019
    Assignee: APPLE INC.
    Inventors: Jeffrey Traer Bernstein, Julian Missig, Avi E. Cieplinski, Matthew I. Brown, May-Li Khoe, Nicholas Zambetti, Bianca C. Costanzo, David J. Hart, B. Michael Victor
  • Patent number: 10127704
    Abstract: An information processing device 10 includes a command recognition unit 203, a parameter extraction unit 28 and a command execution unit 253. The command recognition unit 203 specifies one of one or more pieces of object creation processing, which include at least one of processing for creating a text box, processing for creating a figure, and table creating processing for creating a table, from a combination of directions where one polygonal line is bent, the one polygonal line being inputted as a handwriting input command to a handwriting input device that enables handwriting input onto a display screen. The parameter extraction unit 208 extracts a parameter such as a position, size and the like of a designated object from a position and length of a segment that composes one polygonal line. Thus, the information processing device 10 allows a user to give a command on a screen by handwriting.
    Type: Grant
    Filed: November 14, 2016
    Date of Patent: November 13, 2018
    Assignee: UX Innovations LLC
    Inventor: Hiroshi Kubo
  • Patent number: 10079183
    Abstract: Methods and systems of process control and yield management for semiconductor device manufacturing based on predictions of final device performance are presented herein. Estimated device performance metric values are calculated based on one or more device performance models that link parameter values capable of measurement during process to final device performance metrics. In some examples, an estimated value of a device performance metric is based on at least one structural characteristic and at least one band structure characteristic of an unfinished, multi-layer wafer. In some examples, a prediction of whether a device under process will fail a final device performance test is based on the difference between an estimated value of a final device performance metric and a specified value. In some examples, an adjustment in one or more subsequent process steps is determined based at least in part on the difference.
    Type: Grant
    Filed: June 23, 2014
    Date of Patent: September 18, 2018
    Assignee: KLA-Tenor Corporation
    Inventors: Xiang Gao, Philip D. Flanner, III, Leonid Poslavsky, Ming Di, Qiang Zhao, Scott Penner
  • Patent number: 10035220
    Abstract: A method includes conducting a plurality of tests on process variables of a manufacturing process, with a test of the plurality of tests being associated with two combinations of process variables, the test having first values for a first combination of process variables at a first time and second values for a second combination of process variables at a second time, the test comprising: locally heating a region of a structure, wherein the local heating results in formation of a thermal field in the structure; assessing one or more thermal characteristics of the thermal field during a transition between the first combination of process variables and the second combination of process variables; and based on results of the plurality of tests, generating a process map of a transient response of the one or more thermal characteristics of the thermal field.
    Type: Grant
    Filed: March 14, 2014
    Date of Patent: July 31, 2018
    Assignee: Carnegie Mellon University
    Inventors: Jack Lee Beuth, Jr., Jason Cho Fox
  • Patent number: 9983001
    Abstract: A shape analysis method for analyzing shape data acquired by measuring a contour shape of a workpiece to be measured, includes: deciding a geometric element used in shape analysis; deciding one data point to be included in an evaluation range; applying the geometric element to an interval including the one data point; searching the widest interval for satisfying a threshold condition of a preset shape tolerance while changing a width of the interval; pinpointing two boundary points between which the interval found by the search is sandwiched; obtaining two edge points at which the two boundary points are respectively shifted by preset shift amounts; setting a range sandwiched between the edge points in the evaluation range; and targeting the shape data within the evaluation range for calculation of geometric properties.
    Type: Grant
    Filed: July 1, 2013
    Date of Patent: May 29, 2018
    Assignee: MITUTOYO CORPORATION
    Inventors: Masafumi Shimizu, Yoichi Saito
  • Patent number: 9927371
    Abstract: A line scan wafer inspection system includes a confocal slit aperture filter to remove sidelobes and enhance resolution in the scanning direction. A position detector associated with the slit aperture filter monitors and corrects illumination line image positions relative to the slit aperture to keep image position variations within tolerable limits. Each detector measures a line position and then uses the line position signal to adjust optical, mechanical, and electronic components in the collection path in a feedback loop. The feedback loop may be employed in a runtime calibration process or during inspection to enhance stability.
    Type: Grant
    Filed: April 21, 2015
    Date of Patent: March 27, 2018
    Assignee: KLA-Tencor Corporation
    Inventors: Mark S. Wang, Chris Kirk, Andrey Kharisov
  • Patent number: 9864367
    Abstract: A mounting pin straightness management system is provided. The system includes a sensor unit that is configured to measure 3-dimensional coordinates (a(Ta, La, Ha), b(Tb, Lb. Hb)) for a first and a second center point (a, b) of two approximate circles formed from intersections of an exterior surface of the at least one mounting pin and two parallel planes (PA and PB) perpendicular to a target length direction of the at least one mounting pin and spaced apart at a predetermined distance (H) from each other. A controller is configured to calculate a straightness index (S.I.) related to a maximum distance (Lmax) between the first and the second center point under a straightness management tolerance (r) and an actual distance (Lactual) between the first and the second center point by receiving the 3-dimensional coordinates of the first and the second center point from the sensor unit.
    Type: Grant
    Filed: September 17, 2014
    Date of Patent: January 9, 2018
    Assignee: Hyundai Motor Company
    Inventor: Soo Jeong Heo
  • Patent number: 9618927
    Abstract: A method of determining a radius of a cutting end of a tool for a turning machine using a touch probe is provided. One of the cutting end and the touch probe is movable relative to a reference frame having a first axis and a second axis and having a reference point trackable in the reference frame. The method comprises establishing a first contact point and recording a first coordinate of the reference point on the first axis; establishing a second contact point and recording a second coordinate of the reference point on the second axis; establishing a third contact point and recording a third coordinate of the reference point on the first axis and a fourth coordinate of the reference point on the second axis upon contact; and determining a radius of the cutting end based on the first, second, third and fourth coordinates.
    Type: Grant
    Filed: April 15, 2014
    Date of Patent: April 11, 2017
    Assignee: PRATT & WHITNEY CANADA CORP.
    Inventors: Lafleche Gagnon, Rachid Guiassa, Philippe St-Jacques
  • Patent number: 9619076
    Abstract: An electronic device displays a user interface in a first display state. The device detects a first portion of a gesture on a touch-sensitive surface, including detecting intensity of a respective contact of the gesture. In response to detecting the first portion of the gesture, the device displays an intermediate display state between the first display state and a second display state. In response to detecting the end of the gesture: if intensity of the respective contact had reached a predefined intensity threshold prior to the end of the gesture, the device displays the second display state; otherwise, the device redisplays the first display state. After displaying an animated transition between a first display state and a second state, the device, optionally, detects an increase of the contact intensity. In response, the device displays a continuation of the animation in accordance with the increasing intensity of the respective contact.
    Type: Grant
    Filed: November 7, 2014
    Date of Patent: April 11, 2017
    Assignee: APPLE INC.
    Inventors: Jeffrey Traer Bernstein, Julian Missig, Avi E. Cieplinski, Matthew I. Brown, May-Li Khoe, Nicholas Zambetti, Bianca C. Costanzo, David J. Hart, B. Michael Victor
  • Patent number: 9524374
    Abstract: An electronic 3D model of at least a portion of a maxillary arch of a patient is displayed. Inputs indicating a tip of a mesiobuccal cusp of a maxillary first molar are received for both the patient's right and left sides. In addition, an electronic 3D model of at least a portion of a mandibular arch of a patient is displayed. Inputs indicating relevant points on the mandibular first molar are received for both the patient's right and left sides. Side scores are generated for the patient's right and left sides based on the indicated points. A final occlusion score for the patient is displayed. The final occlusion score is based on the side score for the right side and the side score for the left side.
    Type: Grant
    Filed: April 9, 2015
    Date of Patent: December 20, 2016
    Inventor: Bruce W. Hultgren
  • Patent number: 9519973
    Abstract: The disclosed embodiments provide a system that facilitates use of an image. During operation, the system uses a set of images from a camera on a device to obtain a set of features in proximity to the device, wherein the set of images comprises the image. Next, the system uses the set of images and inertial data from one or more inertial sensors on the device to obtain a set of three-dimensional (3D) locations of the features. Finally, the system enables use of the set of 3D locations with the image.
    Type: Grant
    Filed: September 8, 2013
    Date of Patent: December 13, 2016
    Assignee: Intel Corporation
    Inventors: Eagle Sunrise Jones, Benjamin J. Hirashima, Jordan H. Miller
  • Patent number: 9348002
    Abstract: A method of measuring flux density and run out to accommodate rotors of different diameters, evaluate intrinsic properties of magnet material and the magnetization process. Circular run out measurement capability is also used to evaluate bearing journal “ovality.” The method includes the use of a scan tool, or a DLA Rotor Flux Density Scan Fixture, which evaluates the electromagnetic field strength (gauss), combined with surface run out and presents the data in a scalable pictorial format. The scan tool includes a probe which measures a magnetic field strength and circular run out of the perimeter of the magnet. Simultaneously, a non-contact measurement sensor is used to measure the rotor surface for subtle variations. The resulting sine wave gauss data and the surface dimension data are manipulated into a scalable “radar” plot. The radar plot correlates magnetic pole field strength and surface circular run out variation to the index position.
    Type: Grant
    Filed: February 13, 2015
    Date of Patent: May 24, 2016
    Assignee: Continental Automotive Systems, Inc.
    Inventors: Craig Andrew Weldon, Raymond Rasokas
  • Patent number: 9333763
    Abstract: An inkjet printer is provided with a conveyor, a carriage movable in a scanning direction, and mounting a printing head and a sensor configured to output a detection signal based on absence/presence of the sheet, and a controller. The controller is configured to obtain image data representing an image to be printed on the sheet, calculate, based on the image data, an estimate margin value which is used to determine a margin width at an end, in a scanning direction, of the sheet, and detect end positions, in the scanning direction, of the sheet based on the detection signal during movement of the carriage in the scanning direction when the margin width estimated based on the estimate margin value is less than a threshold width, while the detection process is not executed when the margin width is not less than a threshold width.
    Type: Grant
    Filed: December 5, 2014
    Date of Patent: May 10, 2016
    Assignee: Brother Kogyo Kabushiki Kaisha
    Inventor: Kenta Horade
  • Patent number: 9310693
    Abstract: A method for operating a projection exposure tool for microlithography is provided. The projection exposure tool includes an optical system which includes a number of optical elements which, during an imaging process, convey electromagnetic radiation. All of the surfaces of the optical elements interact with the electromagnetic radiation during the imaging process to form an overall optical surface of the optical system.
    Type: Grant
    Filed: March 1, 2013
    Date of Patent: April 12, 2016
    Assignee: Carl Zeiss SMT GmbH
    Inventors: Michael Gerhard, Bernd Doerband, Toralf Gruner
  • Patent number: 9267837
    Abstract: Provided is a method in which an excavation surface is scanned, the excavation surface shape is determined based on scanned excavation surface, an excavating path is identified from a mining excavation equipment, a volume of a material excavated by the mining excavation equipment is actively calculated based at least on the excavation surface shape and the excavating path of the mining excavating equipment, and a weight of the material excavated by the mining excavating equipment is actively calculated based on at least one density factor.
    Type: Grant
    Filed: March 31, 2014
    Date of Patent: February 23, 2016
    Assignee: SIEMENS INDUSTRY, INC.
    Inventor: Julian D. Jaeger
  • Patent number: 9262580
    Abstract: The disclosed method includes: first generating, from data of a plurality of parts that are string-shaped or band-shaped parts formed by end surfaces and side surfaces, first data including control point candidate data for control point candidates within the end surfaces, end surface data defining the end surfaces and path candidate data for path candidates between the control point candidates, for each of the plurality of parts; second generating second data of continuous shape paths representing continuous parts by searching the first data for parts having same control point candidate data and same end surface data; and third generating third data including data of control points determined on end surface portion of the parts and data of paths between the control points for the continuous shape paths and a group of the continuous shape paths from the first data and the second data.
    Type: Grant
    Filed: March 15, 2012
    Date of Patent: February 16, 2016
    Assignee: FUJITSU LIMITED
    Inventors: Kouji Demizu, Masayuki Kidera, Naoyuki Nozaki, Yukihiko Furumoto
  • Patent number: 9224661
    Abstract: Methods for determining a target thickness of a conformal film with reduced uncertainty, and an integrated circuit (IC) chip having a conformal film of the target thickness are provided. In an embodiment, a first critical dimension of a structure disposed on a wafer is measured. Said structure has at least one vertical surface. A first conformal film is deposited over the structure covering each of a horizontal and the vertical surface of the structure. A second critical dimension of the covered structure is then measured. The target thickness of the conformal film is determined based on difference between the first CD measured on the structure and the second CD measured on the covered structure.
    Type: Grant
    Filed: October 2, 2014
    Date of Patent: December 29, 2015
    Assignee: International Business Machines Corporation
    Inventor: Carlos Strocchia-Rivera
  • Patent number: 9182455
    Abstract: A method of measuring flux density and run out to accommodate rotors of different diameters, evaluate intrinsic properties of magnet material and the magnetization process. Circular run out measurement capability is also used to evaluate bearing journal “ovality.” The method includes the use of a scan tool, or a DLA Rotor Flux Density Scan Fixture, which evaluates the electromagnetic field strength (gauss), combined with surface run out and presents the data in a scalable pictorial format. The scan tool includes a probe which measures a magnetic field strength and circular run out of the perimeter of the magnet. Simultaneously, a non-contact measurement sensor is used to measure the rotor surface for subtle variations. The resulting sine wave gauss data and the surface dimension data are manipulated into a scalable “radar” plot. The radar plot correlates magnetic pole field strength and surface circular run out variation to the index position.
    Type: Grant
    Filed: December 11, 2012
    Date of Patent: November 10, 2015
    Assignee: Continental Automotive Systems, Inc.
    Inventors: Craig Andrew Weldon, Raymond Rasokas
  • Patent number: 9182208
    Abstract: In the present invention, by inputting an upper head size to a computer in addition to a front & back length-size and a right & left width-size of a head portion of a helmet wearer and by data-processing them, there is employed a configuration in which a kind of the helmet size and a shape of a pad such as a pad, in the region consisting of the head-top portion and the vicinity thereof, or the like, which fit the head portion of the helmet wearer, are to be selected. According to the present invention, it is possible to provide a selection method in which it is possible to easily select a kind of a preferable size of the helmet, and a preferable shape of the pad in the region consisting of the head-top portion and the vicinity thereof.
    Type: Grant
    Filed: December 10, 2012
    Date of Patent: November 10, 2015
    Assignee: SHOEI CO., LTD.
    Inventor: Takashi Ebisawa
  • Patent number: 9170793
    Abstract: A computing device is connected to a measurement machine. The measurement machine measures an object to obtain images of measured elements of the object by using a measurement program. The computing device divides the measurement program into two or more program segments. An icon for each program segment is generated according to a type of the program segment. The computing device generates a title state and an opened state for each program segment. If a program segment is in the title state, the icon, a name, and a first line of program codes of the program segment is displayed on an interface provided by the electronic device. If the program segment is in the opened state, the computing device displays all program codes of the program segment on the interface.
    Type: Grant
    Filed: October 11, 2012
    Date of Patent: October 27, 2015
    Assignees: HONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD., HON HAI PRECISION INDUSTRY CO., LTD.
    Inventors: Chih-Kuang Chang, Xin-Yuan Wu, Gen Yang
  • Patent number: 9157876
    Abstract: A method of characterizing an object includes determining a depth-wise composition of the object at a measurement site within the object. A property of the object within a region adjacent to the measurement site can, optionally, be estimated based on the determining. Another method of characterizing an object includes disposing at least a portion of an object within a measurement region of a metrology tool, aligning a feature of the object and a location of a designated measurement site within the measurement region relative to each other, and performing a performing a compositional analysis of a portion of the object occupying the measurement site. Various apparatus for performing these methods are also disclosed, as are methods of monitoring manufacturing processes based on these methods.
    Type: Grant
    Filed: July 25, 2012
    Date of Patent: October 13, 2015
    Assignee: ELECTRO SCIENTIFIC INDUSTRIES, INC.
    Inventors: Jonathan D. Halderman, Ciaran John Patrick O'Connor, Jay Wilkins
  • Patent number: 9141094
    Abstract: A personal air quality monitoring system worn or carried by a user. Such system can be used to monitor the local air quality and alert a user should air quality deteriorate below some acceptable desired or configurable threshold.
    Type: Grant
    Filed: March 15, 2014
    Date of Patent: September 22, 2015
    Assignee: Particles Plus, Inc.
    Inventors: David Pariseau, Adam Giandomenico