Dimensional Determination Patents (Class 702/155)
  • Publication number: 20120290259
    Abstract: An integrated automated 3D Optical Scanning and Computer Aided Inspection System for dimensional inspection of precision manufactured parts. The system is based within a portable cabinet having lockable caster wheels for portability and retractably support feet for enhanced stability. The cabinet further includes a part placement area having an optical metrology scanner positioned over a multi-axis robotic arm positioned in the part placement area. The robotic arm is constructed and arranged to grip and manipulate parts within a field of view of the optical metrology scanner. The robotic arm provides multi-axis to rotate and tilt a base to allow substantially every surface of the part to be scanned. Dimensional comparison and analysis software application provide geometric conformance/deviation plus extraction of the dimensions indicated in the part computer aided design (CAD) model.
    Type: Application
    Filed: May 9, 2012
    Publication date: November 15, 2012
    Inventors: Scott T. McAfee, William J. Greene
  • Publication number: 20120259581
    Abstract: A system, apparatus and method for providing garment fitting identification are provided. Data indicative of a consumer's body measurements is analyzed and a composite reference number that represents measurements and indicia of the consumer's garment size is generated based on a standard measurement system.
    Type: Application
    Filed: April 11, 2011
    Publication date: October 11, 2012
    Inventor: David Gwaltney
  • Patent number: 8285412
    Abstract: A semiconductor device production control method includes monitoring, after a production process of a semiconductor device, a process result at a predetermined position of a pattern to which the process is applied, to obtain a deviation with respect to a predetermined target result, quantitatively obtaining a degree of influence on an operation of a semiconductor device from the deviation of the process result, and comparing the degree of influence that is quantitatively obtained with a predetermined allowable margin for operation specifications of the semiconductor device.
    Type: Grant
    Filed: June 8, 2009
    Date of Patent: October 9, 2012
    Assignee: Kabushiki Kaisha Toshiba
    Inventor: Suigen Kyoh
  • Patent number: 8283630
    Abstract: In the dimension measurement of a circuit pattern using a scanning electron microscope (SEM), in order to make it possible to automatically image desired evaluation points (EPs) on a sample, and automatically measure the circuit pattern formed at the evaluation points, according to the present invention, in the dimension measurement of a circuit pattern using a scanning electron microscope (SEM), it is arranged that coordinate data of the EP and design data of the circuit pattern including the EP are used as an input, creation of a dimension measurement cursor for measuring the pattern existing in the EP and selection or setting of the dimension measurement method are automatically performed based on the EP coordinate data and the design data to automatically create a recipe, and automatic imaging/measurement is performed using the recipe.
    Type: Grant
    Filed: February 10, 2011
    Date of Patent: October 9, 2012
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Atsushi Miyamoto, Tomofumi Nishiura
  • Patent number: 8260569
    Abstract: A method for determining a dimension of a regular pattern of elements, wherein the elements in the regular pattern are arranged along an arrangement direction with a first spatial frequency includes providing a sensor for sampling the regular pattern; providing a plurality of data sample sets, wherein each data sample set includes data samples provided by the sensor while sampling over a portion of the regular pattern, and each data sample set consists of a different number of data samples; analyzing each data sample set to determine a corresponding spatial frequency; determining a plurality of quantified values, each quantified value being associated with a different one of the determined spatial frequencies; selecting a first quantified value from the plurality of quantified values; and determining the dimension based at least on the selected first quantified value.
    Type: Grant
    Filed: October 30, 2009
    Date of Patent: September 4, 2012
    Assignee: Eastman Kodak Company
    Inventor: Valentine A. Karassiouk
  • Publication number: 20120217983
    Abstract: A heat spreader includes a plurality of sensors that indicate that the heat spreader is flat against and in thermal contact with a plurality of chips when the heat spreader is loaded upon a chip stack. One or more nodes within the sensors are connected by electric conductors. The resistances of the conductors may be compared to determine if the nodes within the sensors are relatively flat. Sensor flatness may be indicated to a higher level electronic device such as a visual display. The display may ultimately be viewed by a user to determine whether the heat spreader is flat and in thermal contact with the plurality of chips when the heat spreader is loaded upon the chip stack.
    Type: Application
    Filed: February 24, 2011
    Publication date: August 30, 2012
    Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Arvind K. Sinha, Kory W. Weckman
  • Publication number: 20120203502
    Abstract: A two-dimension layout system identifies points and their coordinates, and transfers identified points on a solid surface to other surfaces in a vertical direction. Two leveling laser light transmitters are used with a remote unit to control certain functions. The laser transmitters rotate about the azimuth, and emit vertical (plumb) laser planes. After being set up using benchmark points, the projected lines of the laser planes will intersect on the floor of a jobsite at any point of interest in a virtual floor plan, under control of a user with the remote unit. An “active target” can be used to more automatically create benchmarks. A laser distance meter can be installed on base units to automatically scan a room or a wall to determine certain key features.
    Type: Application
    Filed: April 19, 2012
    Publication date: August 9, 2012
    Inventors: James N. Hayes, Chris W. Snyder, Kevin M. Morrissey, Ayman Hajmousa, Brandon Scott Bayer, Eric Keith Unger
  • Patent number: 8234092
    Abstract: A system and method for measuring a lead edge and/or a trail edge media curl utilizing a dual cross beam sensor. The dual cross beam sensor includes one or more pairs of emitters (e.g., a pair to two pairs of emitters) and one or more detectors positioned sequentially in a media path so that a media passes via dual cross beams. Timing data with respect to the media can be measured as the media crosses via the dual cross beam sensor from a leading edge and/or trailing edge. A true instantaneous media speed and a curl height (i.e., media tip height or media curvature) can be simultaneously calculated from the timing data associated with the lead edge/trail edge with respect to each single cross beams of the dual cross beam sensor. An average curl height can be then calculated to enhance the accuracy of the media curl measurement.
    Type: Grant
    Filed: February 5, 2010
    Date of Patent: July 31, 2012
    Assignee: Xerox Corporation
    Inventors: Ming Yang, Thomas Jay Wyble, Keith Andrew Buddendeck
  • Publication number: 20120182154
    Abstract: In a method for optimizing an order in which certain points on a circuit board can be tested and evaluated, a coordinate system is established in a circuit diagram of a circuit board, and at least one locating point is preset. When an operator selects a signal path routing within the circuit diagram, the method can display the testing points in the selected signal path routing on a display device. After calculating the distance between each of the testing points and each of the at least one locating point, a group of distances is obtained. By comparing the distances, the minimum distance can be determined from the group of distances. The method further optimizes the order of the testing points according to the distance between each of the testing points and the locating point that consists of the minimum distance.
    Type: Application
    Filed: August 30, 2011
    Publication date: July 19, 2012
    Applicant: HON HAI PRECISION INDUSTRY CO., LTD.
    Inventors: HSIEN-CHUAN LIANG, SHEN-CHUN LI, SHOU-KUO HSU
  • Publication number: 20120179419
    Abstract: Disclosed herein is a system and method for enhanced and expanded localized geometry characterization. Objects of interest are classified according to user-defined parameters, and this enables enhanced contrast and more accurate feature detection, as well as more accurately defined feature object regions.
    Type: Application
    Filed: June 27, 2011
    Publication date: July 12, 2012
    Inventors: Haiguang Chen, Jaydeep K. Sinha, Sergey Kamensky
  • Patent number: 8219351
    Abstract: One embodiment relates to a computer method for aligning wafers processed in a semiconductor fabrication facility. In the method, a first arrangement of dies having a common functionality level is identified on a first wafer. A first alignment signature is assigned to the first wafer based on the first arrangement. A second arrangement of dies having the common functionality level is identified on a second wafer. A second alignment signature is assigned to the second wafer based on the second arrangement. The first alignment signature is compared to the second alignment signature, and the first and second wafers are selectively aligned based on a result of the comparison. Other systems and methods are also disclosed.
    Type: Grant
    Filed: February 4, 2009
    Date of Patent: July 10, 2012
    Assignee: Texas Instruments Incorporated
    Inventors: Douglas Edmund Paradis, Karl Lynn Kenney
  • Patent number: 8209134
    Abstract: Methods are disclosed wherein the structural health of a civil structure, such as, but not limited to, a bridge or the like is measured by electronic distance measurement (EDM) from a plurality of stable locations to a plurality of cardinal points on the structure in a methodical manner. By measuring the coordinates of the cardinal points, the dynamic and long-term static behavior of the structure provide an indication of the health of the structure. Analysis includes: comparison to a Finite Element Model (FEM); comparison to historical data; and modeling based on linearity, hysteresis, symmetry, creep, damping coefficient, and harmonic analysis.
    Type: Grant
    Filed: December 20, 2010
    Date of Patent: June 26, 2012
    Assignees: Sophie Lin
    Inventors: David H. Parker, John M. Payne, Sophie Lin, legal representative
  • Patent number: 8204699
    Abstract: An analyzing method includes acquiring displacements with respect to loads applied of the test piece measured by the three-point bending test; calculating a first approximate expression of a relation of the displacements with respect to the loads applied in a first area where the relation is linear so as to determine an elasticity modulus of the test piece; extracting boundary value of a relation of strains caused by the displacements with respect to the loads so as to determine a yield stress value of the test piece; and calculating a second approximate expression of a relation of stress caused by the loads with respect to the strains caused by the displacements in a second area beyond the yield stress value on the basis of the yield stress value, the elasticity modulus, and the measurements in the second area.
    Type: Grant
    Filed: January 29, 2010
    Date of Patent: June 19, 2012
    Assignee: Fujitsu Limited
    Inventor: Hidehisa Sakai
  • Patent number: 8204654
    Abstract: A boundary definer or data processor establishes an outer boundary of a work area and defines an offset between an inner boundary and the outer boundary. A reference path module or data processor defines a primary reference path with a target angular heading within the work area. The reference path module or data processor generates secondary reference paths spaced apart from and generally parallel to the primary reference path. An incident angle estimator estimates an incident angle of incidence of the vehicle with the outer boundary. The former or data processor establishes an inner boundary point spaced apart from the outer boundary by the offset and coextensive with a corresponding one of the reference paths. Further, the former or data processor interconnects the established inner boundary points to form the inner boundary.
    Type: Grant
    Filed: March 20, 2008
    Date of Patent: June 19, 2012
    Assignee: Deere & Company
    Inventors: James L. Sachs, Timothy J. Roszhart, Tyler Schleicher, Andy Dwayne Beck, Mikel A. Bezdek
  • Publication number: 20120150487
    Abstract: An apparatus for monitoring a door with a 3D sensor which is able to detect distances to an object in the monitoring area as the third dimension, the 3D sensor being arranged in a housing, and immovably arranged transmission means for transmitting a measurement beam and receiver means for receiving a reflected measurement beam being provided in the housing, characterized in that provision is made of a control unit which is designed to obtain an item of information relating to the position of the apparatus, and in that the control unit evaluates the measurement beam on the basis of an item of position information.
    Type: Application
    Filed: November 14, 2011
    Publication date: June 14, 2012
    Applicant: Cedes AG
    Inventor: Beat DE COI
  • Patent number: 8200042
    Abstract: An endoscope apparatus includes an electronic endoscope that picks up a measurement object and produces a picked-up-image signal; an image-processing unit that produces a image signal based on the picked-up-image signal; and an measurement processing unit that undertakes measurement processing to the measurement object based on the image signal. The measurement processing unit includes: a reference point-designating unit that designates two reference points on the measurement object; an approximate-outline—calculating unit that calculates an approximate outline by approximating the outline of the measurement object based on the reference points; and a loss-composing points-calculating unit that calculates loss-composing points that constitute a loss outline formed on the measurement object based on the reference points and the approximate outline. This enables loss size measurement upon designating two reference points, thereby reducing complex operations and improving operability.
    Type: Grant
    Filed: January 29, 2008
    Date of Patent: June 12, 2012
    Assignee: Olympus Corporation
    Inventors: Takahiro Doi, Fumio Hori
  • Patent number: 8195424
    Abstract: A method and a measuring system for characterizing a deviation of an actual dimension of a component from a nominal dimension of the component, is disclosed. In an embodiment, the method includes a) determining at least one measured value characterizing the actual dimension at a position of the component by a measuring device; b) making a nominal value available with which the nominal dimension is characterized as a function of the position of the measured value; c) determining a spatial distance between the measured value and the nominal value; d) making a limiting criterion available with which a permissible deviation from the nominal value is characterized as a function of the position of the measured value; and e) determining a tolerance utilization value characterizing the deviation for the measured value as a function of the spatial distance and of the limiting criterion.
    Type: Grant
    Filed: March 27, 2009
    Date of Patent: June 5, 2012
    Assignee: MTU Aero Engines GmbH
    Inventor: Josef Kriegmair
  • Publication number: 20120116739
    Abstract: Methods and a non-transient computer medium embodying computer readable code for extracting bulk spectroscopic properties of a particle. A forward model is built of an optical field focused on, and interacting with, the particle, where the forward model parameterized in terms of at least one geometrical characteristic of the particle. The particle, which may be a filamentary material, is illuminated with an incident optical field having a spectral range. Either a transmitted or scattered optical field is detected in a far-field zone as a function of wavenumber to obtain a measured spectrum. The measured spectrum is inverted to recover the imaginary part of the complex refractive index of the particle.
    Type: Application
    Filed: November 8, 2010
    Publication date: May 10, 2012
    Applicant: The Board of Trustees of the University of Illinois
    Inventors: Brynmor J. Davis, Paul Scott Carney, Rohit Bhargava
  • Patent number: 8173962
    Abstract: An evaluation method and apparatus is provided for evaluating a displacement between patterns of a pattern image by using design data representative of a plurality of patterns superimposed ideally. A first distance is measured for an upper layer pattern between a line segment of the design data and an edge of the charged particle radiation image, a second distance is measured for a lower layer pattern between a line segment of the design data and an edge of the charged particle radiation image; and an superimposition displacement is detected between the upper layer pattern and lower layer pattern in accordance with the first distance and second distance.
    Type: Grant
    Filed: February 18, 2010
    Date of Patent: May 8, 2012
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Takumichi Sutani, Ryoichi Matsuoka, Hidetoshi Morokuma, Akiyuki Sugiyama, Hiroyuki Shindo
  • Patent number: 8172658
    Abstract: A method of participating in an athletic event with a remotely-located competitor using first and second wireless competition devices includes establishing a wireless communication connection with the second wireless competition device. The second wireless competition device is associated with the remotely-located competitor for the athletic event. Positioning data for the second wireless competition device is received via the wireless communication connection. The positioning data for the second wireless competition device characterizes a previous or real-time performance of the athletic event by the competitor. The received positioning data for the second wireless competition device is provided for display on the first wireless competition device relative to positioning data for the first wireless competition device, which characterizes a performance of the athletic event by a user thereof. Related methods and devices are also discussed.
    Type: Grant
    Filed: May 23, 2008
    Date of Patent: May 8, 2012
    Assignee: Sony Ericsson Mobile Communications AB
    Inventor: Jan Olof Svensson
  • Patent number: 8170827
    Abstract: A drop mass deviation measuring apparatus, a drop mass deviation measuring method, a pattern forming system, and a control method measure mass deviations of drops discharged from a plurality of drop discharge units in real time with high precision. The apparatus utilizes a plurality of drops discharged from a plurality of drop discharge units, a drop moving force providing part to provide moving forces, having directions different from discharge directions of each of the plurality of drops, to the plurality of drops, a discharged drop position detection member to acquire drop position images individually reflecting the a position of each of the plurality of drops, and a drop mass deviation measurement control part to calculate a drop discharge direction separation angle of each of the plurality of drops using the drop position images acquired by the discharged drop position detection member to measure mass deviation of each of the drops.
    Type: Grant
    Filed: August 12, 2008
    Date of Patent: May 1, 2012
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Chong Uck Kim, Hyuk Kim, Sano Jin Choi, Seong Wook Cheong, Eun Seon Lim, Byung Il Ahn, Joong He Lee
  • Patent number: 8170831
    Abstract: The invention provides an apparatus and a method for measuring a dimension of a circular object. First to third sensors arranged in a straight line are disposed above a track to respectively measure time instants when the circular object moves past the first to third sensors. The dimension of the circular object is calculated according to distances between the first and second sensors and between the second and third sensors.
    Type: Grant
    Filed: April 29, 2009
    Date of Patent: May 1, 2012
    Inventor: Maw-Yuan Liou
  • Patent number: 8170832
    Abstract: A method for Transmission Electron Microscopy (TEM) sample creation. The use of a Scanning Electron Microscope (SEM)—Scanning Transmission Electron Microscope (STEM) detector in the dual-beam focused ion beam (FIB)/SEM allows a sample to be thinned using the FIB, while the STEM signal is used to monitor sample thickness. A preferred embodiment of the present invention can measure the thickness of or create TEM samples by using a precise endpoint detection method. Preferred embodiments also enable automatic endpointing during TEM lamella creation and provide users with direct feedback on sample thickness during manual thinning. Preferred embodiments of the present invention thus provide methods for endpointing sample thinning and methods to partially or fully automate endpointing.
    Type: Grant
    Filed: November 2, 2009
    Date of Patent: May 1, 2012
    Assignee: FEI Company
    Inventors: Richard J. Young, Brennan Peterson, Rudolf Johannes Peter Gerardus Schampers, Michael Moriarty
  • Publication number: 20120101770
    Abstract: A fall detection device may be uniquely associated with a wearer. The fall detection device may predict whether a fall event is imminent based on kinematic information of the wearer's body. The device may also confirm whether the wearer actually experienced a fall event based on additional kinematic information.
    Type: Application
    Filed: April 27, 2010
    Publication date: April 26, 2012
    Applicants: The BOARD of TRUSTEES of the UNIVERSITY of ILLINOIS, MAYO FOUNDATION FOR MEDICAL EDUCATION AND RESEARCH
    Inventors: Mark D. Grabiner, Kenton R. Kaufman, Barry K. Gilbert
  • Publication number: 20120095725
    Abstract: In a programming method, a dimension system relating to a product can be embedded into a programming system. The dimension system includes measurement dimensions of measuring points of the product, and the serial numbers preset for the dimensions. The method arranges the serial numbers according to a predefined measuring path, and stores the serial numbers into a dimension list according to the order of the serial numbers presented in the measuring path. After importing the dimensions of the serial numbers into the programming system according to the presented order, the method converts each of the dimensions into a series of codes, and generates a measurement program for the dimensions according to the codes.
    Type: Application
    Filed: August 30, 2011
    Publication date: April 19, 2012
    Applicants: HON HAI PRECISION INDUSTRY CO., LTD, HONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD
    Inventors: CHIH-KUANG CHANG, XIN-YUAN WU, MIN WANG
  • Publication number: 20120086940
    Abstract: Methods of determining asymmetric properties of structures are described. A method includes measuring, for a grating structure, a first signal and a second, different, signal obtained by optical scatterometry. A difference between the first signal and the second signal is then determined. An asymmetric structural parameter of the grating structure is determined based on a calculation using the first signal, the second signal, and the difference.
    Type: Application
    Filed: October 8, 2010
    Publication date: April 12, 2012
    Inventors: Meng-Fu Shih, In-Kyo Kim, Xiafang Zhang, Leonid Poslavsky
  • Publication number: 20120072171
    Abstract: A dynamic data acquisition system is disclosed for continuously recording, measuring and analyzing test cycle data of dimensional changes of a work piece before, during and after climatic changes. An optional climate chamber with an environmentally encapsulated camera system may be used to control the climate during the test cycle. A method of operating the dynamic data acquisition system is disclosed, as well as a business method for the new business model created by utilizing the system.
    Type: Application
    Filed: September 21, 2011
    Publication date: March 22, 2012
    Inventors: James L. Arnone, Atilio R. Steuer, Lawrence G. Arnone
  • Patent number: 8126726
    Abstract: In one embodiment, acquiring a digital model of a patient's teeth, automatically detecting reference data or features based on the digital model, and automatically computing dental measurements based on said reference data or features, where the dental measurements are associated with an occlusal characteristic of the patient are disclosed.
    Type: Grant
    Filed: October 13, 2006
    Date of Patent: February 28, 2012
    Assignee: Align Technology, Inc.
    Inventors: Vadim Matov, Fuming Wu, Eric Kuo, Jenghuei Gene Luong
  • Patent number: 8122333
    Abstract: Provided are a method of detecting and isolating fault in sensors and a method of accommodating fault in sensors using the same. In the method of detecting and isolating fault in sensors, a one reduced-order parity vector is obtained by excluding the output of one sensor selected from n sensors, a two reduced-order parity vector is obtained by excluding output of two sensors selected from the n sensors, and when there are a plurality of parity vectors obtained at plural points of time, one reduced-order parity vectors are averaged to obtain an averaged one reduced-order parity vector and likewise, two reduced-order parity vectors are averaged to obtain an averaged two reduced-order parity vector. Therefore, a decrease in fault detection and isolation (FDI) performance can be hindered, and even when double faults occur, sensors to be excluded can be selected. Thus, a system including sensors has high reliability and high accuracy.
    Type: Grant
    Filed: May 5, 2008
    Date of Patent: February 21, 2012
    Assignee: Chung-An University Industry Academic Cooperation Foundation
    Inventors: Duk-Sun Shim, Cheol-kwan Yang
  • Patent number: 8121813
    Abstract: A processing system for clearance estimation in a rotating machine includes one or more sensors and one or more digital signal processors for calculating the estimated clearance. The processing system may include techniques for obtaining real-time clearance estimates and techniques for obtaining averaged clearance estimates. Aspects of the processing system may also include a method of switching between real-time clearance estimates and averaged clearance estimates depending on the operating conditions of the rotating machine. Other aspects of the processing system include the use of two digital signal processors: a first digital signal processor configured to receive signals from a clearance sensor and perform a first set of high speed processing tasks, and a second digital signal processor configured to receive signals from the first digital signal processor and perform a second set of lower speed processing tasks.
    Type: Grant
    Filed: January 28, 2009
    Date of Patent: February 21, 2012
    Assignee: General Electric Company
    Inventors: Zhiyuan Ren, Wayne Charles Hasz, Emad Andarawis Andarawis, David So Keung Chan, David Mulford Shaddock, John Harry Down, Samhita Dasgupta, William Lee Herron, Cheryl Lynn Herron, legal representative, David Walter Parry, David Richard Esler, Mahadevan Balasubramaniam
  • Publication number: 20120029869
    Abstract: A method for assessing a ground area for suitability as a landing zone or taxi area for aircraft is provided. Three-dimensional data for the ground area in a plurality of measurement cycles in a 3D sensor is produced. The measured-value density of the three-dimensional data and also of at least one further statistical property of the three-dimensional data is determined. A measure of the local roughness of the ground area is produced based on the measured-value density and the at least one further statistical property. The individual area elements of the ground area are classified on the basis of the roughness values produced according to the degree of suitability of said area elements as a landing area or taxi area.
    Type: Application
    Filed: July 28, 2011
    Publication date: February 2, 2012
    Applicant: EADS Deutschland GmbH
    Inventors: Thomas MUENSTERER, Matthias Wegner
  • Publication number: 20120029870
    Abstract: A method of employing a system comprising a Master station, a processor and one or more targets that allows a user of said system to automatically generate a 3-dimensional graphical representation of a construction site and also overlay a drawing onto the graphical representation to guide the user within a virtual space being displayed by the processor.
    Type: Application
    Filed: October 6, 2011
    Publication date: February 2, 2012
    Inventor: Sam Stathis
  • Patent number: 8099256
    Abstract: A method of determining the dimensions of a mailpiece by means of a portable measuring device having a housing provided with an opening having a side reference surface along which the mailpiece is guided under a position sensor in a first pass along a first dimension of the mailpiece, after which pass a value for the first dimension of the mailpiece is determined by a processing unit and is communicated to a franking system to which the portable measuring device is connected, and in a second pass along a second dimension of the mailpiece, after which pass a value for the second dimension of the mailpiece is determined by the processing unit and is communicated to the franking system.
    Type: Grant
    Filed: December 9, 2008
    Date of Patent: January 17, 2012
    Assignee: Neopost Technologies
    Inventor: Marek Krasuski
  • Publication number: 20120004888
    Abstract: A coherence scanning interferometer carries out: a coherence scanning measurement operation on a surface area using a low numeric aperture objective so that the pitch of the surface structure elements is less that the spread of the point spread function at the surface to obtain structure surface intensity data; and a coherence scanning measurement operation on a non-structure surface area to obtain non-structure surface intensity data. A frequency transform ratio determiner determines a frequency transform ratio related to the ratio between the structure surface intensity data and the non-structure surface intensity data. A structure provider sets that frequency transform ratio equal to an expression representing the electric field at the image plane of the interferometer in terms of surface structure element size (height or depth) and width-to-pitch ratio and derives the surface structure element size and width-to-pitch ratio using the frequency transform ratio.
    Type: Application
    Filed: May 26, 2011
    Publication date: January 5, 2012
    Applicant: Taylor Hobson Limited
    Inventor: Daniel Ian Mansfield
  • Publication number: 20110313720
    Abstract: A method for improving finite element analysis of threaded connections includes selecting at least one thread parameter for a female connection and a corresponding male connection. In two dimensions a thread form is calculated for the female connection and the male connection based on the at least one parameter. In two dimensions a geometry is calculated of the female connection and the male connection based on the thread form. In two dimensions the female connection and the male connection are segmented into predefined areas. A finite element analysis mesh is calculated based on a predetermined number of nodes for each of the predefined areas and a selected number of mesh layers for each predefined area. The two dimensional female connection and male connection are assembled. The two dimensional mesh on the assembled connections is used as input to a finite element analysis of the threaded connection in three dimensions.
    Type: Application
    Filed: September 3, 2009
    Publication date: December 22, 2011
    Inventors: Ke Li, Srinand Karuppoor, Sepand Ossia
  • Patent number: 8082122
    Abstract: A system and method for detecting motion by a mobile device is provided. The mobile device determines whether motion is detected by a motion detector. The motion detection is sampled at a first sampling rate when no motion is detected for a specified time. The motion detection is sampled at a second sampling rate when motion is detected, wherein the second sampling rate is more frequent than the first sampling rate.
    Type: Grant
    Filed: May 16, 2007
    Date of Patent: December 20, 2011
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Hyung Moon No, Zhikai Tang
  • Patent number: 8082120
    Abstract: A method and hand-held scanning apparatus for three-dimensional scanning of an object is described. The hand-held self-referenced scanning apparatus has a light source for illuminating retro-reflective markers, the retro-reflective markers being provided at fixed positions on or around the object, a photogrammetric high-resolution camera, a pattern projector for providing a projected pattern on a surface of the object; at least a pair of basic cameras, the basic camera cooperating with light sources, the projected pattern and at least a portion of the retro-reflective markers being apparent on the 2D images, a frame for holding all components in position within the hand-held apparatus, the frame having a handle, the frame allowing support and free movement of the scanning apparatus by a user.
    Type: Grant
    Filed: December 2, 2009
    Date of Patent: December 20, 2011
    Assignee: Creaform Inc.
    Inventors: Éric St-Pierre, Pierre-Luc Gagné, Antoine Thomas Caron, Nicolas Beaupré, Dragan Tubic, Patrick Hébert
  • Publication number: 20110307214
    Abstract: Provided are a bending sensor that is less dependent on an input speed of a strain and in which a response delay is unlikely to occur, and a deformed shape measurement method using the bending sensor. The bending sensor is configured to include a base material; a sensor body arranged on a surface of the base material and containing a matrix resin and conductive filler particles filled in the matrix resin at a filling rate of 30% by volume or more, and in which three-dimensional conductive paths are formed by contact among the conductive filler particles, and electrical resistance increases as an deformation amount increases; an elastically deformable cover film arranged so as to cover the sensor body; and a plurality of electrodes connected to the sensor body and capable of outputting electrical resistances. In the sensor body, cracks are formed in advance in such a direction that the conductive paths are cut off during a bending deformation.
    Type: Application
    Filed: September 16, 2010
    Publication date: December 15, 2011
    Applicant: TOKAI RUBBER INDUSTRIES, LTD.
    Inventors: Yuuki Saitou, Masaru Murayama, Tomonori Hayakawa, Koichi Hasegawa, Tetsuyoshi Shibata
  • Patent number: 8072450
    Abstract: A system for measuring a three-dimensional object is provided. The system measures differences between a 3D model of an object and a point cloud of the object, and highlights the differences on the 3D model using different colors according to difference ranges that the differences fall.
    Type: Grant
    Filed: September 18, 2008
    Date of Patent: December 6, 2011
    Assignees: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Hon Hai Precision Industry Co., Ltd.
    Inventors: Chih-Kuang Chang, Xin-Yuan Wu, Min Wang, Hua Huang, Xiao-Chao Sun, Shao-Qin Xie, Jin-Bo Hu
  • Publication number: 20110288818
    Abstract: An non-contacting measurement apparatus for measuring distances, angles and related geometric quantities, and for computing other quantities based on the measurements, is provided. A visible light beam or ultrasonic beam allows a user to point the device at one or more points to which the distance is measured, and angular rotation between the various points of interest can be measured and recorded. Then, geometric and trigonometric relationships are used to compute and display lengths, areas, volumes or other facts derived from the measurements. Various input and output features are provided in the present embodiments.
    Type: Application
    Filed: August 19, 2010
    Publication date: November 24, 2011
    Inventors: Jonathan S. THIERMAN, Ibrahim M. HALLAJ
  • Patent number: 8060339
    Abstract: Concealed object detection using electromagnetic and acoustic multistatic imaging systems and methods. A method of simultaneously screening plural subjects for concealed objects includes transmitting a signal into a screening area where there is at least one subject to be screened having an associated object, receiving a reflected signal from the object when the object is located within the screening area, processing the reflected signal using multistatic Fourier space sampling and tomographic reconstruction to generate a three-dimensional image of the object and displaying the three-dimensional image. The transmitting and receiving are performed using a multi-directional array including at least three sensors. An object detection system includes a screening area, a multi-directional array including at least three sensors, a processor configured to execute multistatic Fourier space sampling and tomographic reconstruction and a display.
    Type: Grant
    Filed: September 18, 2008
    Date of Patent: November 15, 2011
    Assignee: Stalix LLC
    Inventor: Danny F. Ammar
  • Patent number: 8055053
    Abstract: The present invention relates to a method of automated process control operation wherein a physical object is directed into a read zone, information stored on an ID Container attached to the physical object is retrieved, physimetric property of the physical object is captured, the retrieved information is processed to provide recorded physimetric property specific to the physical object, the recorded physimetric property and captured physimetric property are passed to an analysis algorithm for comparison, and the results of the comparison are delivered to a controlling device. The results of the comparison will determine whether the physical property will continue to pass through the read zone or require to be rotated by the operator.
    Type: Grant
    Filed: December 14, 2006
    Date of Patent: November 8, 2011
    Assignee: The Hong Kong Polytechnic University
    Inventors: Siu Keung Kwok, Chi Fai Cheung, Hing Choi Tsang, Wing Bun Lee, Burly K. Tan, Pui Him Ng
  • Publication number: 20110264406
    Abstract: An optical measurement apparatus, comprising a reference support on which are mounted a fixed headstock and a movable tailstock opposed to the fixed headstock and movable in order to maintain a piece to be measured between headstock and tailstock, and a mobile carriage movable along the linear axis, the carriage carrying a light source for directing a beam of collimated light across the x axis to be interrupted by the piece under measurement, the carriage further carrying an optical detector aligned with the light source and arranged to receive the residual light of the beam of collimated light that has not been interrupted by the piece under measurement. The measuring apparatus has a automatic measure mode triggered by a button on the apparatus, that is arranged to automatically guess the features of a workpiece and/or recognize workpieces for which a measurement program is available.
    Type: Application
    Filed: March 28, 2011
    Publication date: October 27, 2011
    Applicant: TESA SA
    Inventor: Fabrice Calame
  • Patent number: 8031201
    Abstract: A method for obtaining and analyzing information objects including generating, collecting or discovering information objects. The information objects are signified at least in part using deliberately ambiguated signifier prompts, for example, linear scale opposing negatives or positives, and/or multi-dimensional signifier prompts. The information objects may comprise text or non-text fragments, and may be generated or selected. The responses to the signifier prompts are stored with the fragments to provide a dataset of signified fragments. The signified fragments may be analyzed based on the signifiers and can be utilized as part of an explorable knowledge repository, or objective measures can be created to aid in mass opinion capture or human attitude auditing. The fragments may be represented on a graphical template.
    Type: Grant
    Filed: February 13, 2009
    Date of Patent: October 4, 2011
    Assignee: Cognitive Edge Pte Ltd
    Inventors: David John Snowden, Steven Anthony Bealing, Michael Alexander Cheveldave, Peter Richard Stanbridge, Kenneth John-Paul McHugh
  • Patent number: 8027741
    Abstract: Embodiments include systems and methods of estimating at least one state of a modeled dynamic system. In particular, in one embodiment, an observer such as an extended Kalman filter is used to estimate the state of a modeled dynamic system. A covariance matrix associated with state variables of the observer is periodically checked for compliance with a specified condition, e.g., positive definiteness. If the matrix deviates from the specified condition, the matrix is set to a specified value.
    Type: Grant
    Filed: April 30, 2009
    Date of Patent: September 27, 2011
    Assignee: The United States of America as represented by the Secretary of the Navy
    Inventor: Aaron D. Kahn
  • Publication number: 20110208476
    Abstract: Method and apparatus for determining geometrical dimensions of a wheel, especially a vehicle wheel, or of at least a part of the wheel, comprising the steps of pivoting at least one sensing device for scanning the wheel surface or a part of the wheel surface about a pivot axis in plane perpendicular to the wheel axis and determining the geometrical dimensions of the scanned wheel surface in dependence from the angular position of the at least one sensing device, wherein the angular position is determined from measured accelerations of the sensing device in two predetermined directions during the pivotal movement of the sensing device.
    Type: Application
    Filed: February 24, 2011
    Publication date: August 25, 2011
    Inventor: Francesco BRAGHIROLI
  • Publication number: 20110202309
    Abstract: A distance measure between a beginning and an end of a material strip wound onto a body in a tangential direction can be determined by creating a height profile of a surface of the material strip, which covers the beginning and the end of the wound material strip in the tangential direction. If a position value of the beginning of the material strip is determined in the created height profile, the distance measure can be determined using this position value and the height profile covering the end of the material strip.
    Type: Application
    Filed: February 16, 2011
    Publication date: August 18, 2011
    Inventors: Guenther Kostka, Peter Schmitt, Oliver Scholz, Ulf Hassler
  • Patent number: 8000922
    Abstract: Methods and systems for generating information to be used for selecting values for parameter(s) of a detection algorithm are provided. One method includes without user intervention performing a scan of an area of a wafer using an inspection system and default values for parameter(s) of a detection algorithm to detect defects on the wafer. The method also includes selecting a portion of the defects from results of the scan based on a predetermined maximum number of total defects to be used for selecting values for the parameter(s) of the detection algorithm. The method further includes storing information, which includes values for the parameter(s) of the detection algorithm determined for the defects in the portion. The information can be used to select the values for the parameter(s) of the detection algorithm to be used for the inspection recipe without performing an additional scan of the wafer subsequent to the scan.
    Type: Grant
    Filed: May 29, 2008
    Date of Patent: August 16, 2011
    Assignee: KLA-Tencor Corp.
    Inventors: Hong Chen, Michael J. Van Riet, Chien-Huei (Adam) Chen, Jason Z. Lin, Chris Maher, Michal Kowalski, Barry Becker, Stephanie Chen, Subramanian Balakrishnan, Suryanarayana Tummala
  • Publication number: 20110196649
    Abstract: The present invention relates to method for measuring a storage frame having at least one tray defining an at least one approximately horizontal storing plane and being used for storing rod-like elements, the rod-like elements serving for storing products, each having a sausage-shaped body and a loop for a pendulously storage of the products on a rod-like element. The method comprising the steps of moving the storage frame into the operating range of a measuring apparatus, scanning the storage frame by the measuring apparatus for detecting and recording data regarding geometrical dimensions of the storage frame including at least the height of the tray. The method further comprises the steps of referring the height of the tray to a reference height, creating a dataset including at least said height, storing the dataset in a data memory device, and creating a link between the dataset and the respective storage frame.
    Type: Application
    Filed: February 4, 2011
    Publication date: August 11, 2011
    Applicant: POLY-CLIP SYSTEM GMBH & CO. KG
    Inventors: Joachim Meyrahn, Frank Niedecker
  • Patent number: 7996180
    Abstract: Determining geometric data of a conical measurement object comprises determining spatial coordinates at a plurality of measurement points of the measurement object. At least six spatial coordinates are determined on at least six different measurement points. Element parameters of a tangential conical substitute element are determined by means of a system of equations which describes difference values between the spatial coordinates and the tangential conical substitute element. The difference values are modeled by means of at least two difference parameters whose sum represents a perpendicular spacing between the tangential conical substitute element and a spatial coordinate. Geometric data of the conical measurement object is determined using the substitute element.
    Type: Grant
    Filed: August 25, 2009
    Date of Patent: August 9, 2011
    Assignee: Carl Zeiss Industrielle Messtechnik GmbH
    Inventor: Ulrich Staaden