Location Patents (Class 702/36)
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Patent number: 8483977Abstract: A method for locating defects in a target includes subjecting the target to an ultrasonic vibration. A first laser beam is then transmitted to the target and a reflection is received. A vibration signal is produced from the reflection that gives the target's response to the ultrasonic vibration. A digital image is produced of the target that includes the region of the first laser beam reflection. The digital images are overlaid with the vibration signal to provide overlaid data. The overlaid data is tested to determine a probability of the overlaid data being non-random. The probability is compared against a threshold to indicate a potential area of concern that may include defects.Type: GrantFiled: June 4, 2010Date of Patent: July 9, 2013Assignee: The United States of America as represented by the Secretary of the NavyInventors: Nathan Johnnie, Lynn T. Antonelli, Francis J. O'Brien, Jr.
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Patent number: 8478548Abstract: A vibration data collection and rotating machinery fault diagnostic instrument includes a machine setup engine, a measurement engine, a diagnostic engine, a measurement user interface module, a machine setup user interface module, and a diagnostic user interface module. The machine setup engine requests and receives parameters about the machinery through the machine setup user interface module. The measurement engine requests and receives sensor placement locations through the measurement user interface module and keeps track of locations that have been measured and locations that still need to be measured. The diagnostic engine diagnoses machinery faults and presents the information to the user through the diagnostic user interface module using an intuitive graphical severity scale.Type: GrantFiled: January 15, 2010Date of Patent: July 2, 2013Assignee: Fluke CorporationInventors: Eric Hudson, Demet Namli, Rand Peterson, Joseph Ferrante
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Publication number: 20130151171Abstract: The invention is directed to an ultrasonic inspection method, an ultrasonic test method, and an ultrasonic inspection apparatus that enable sizing to be executed even for a minute defect using an ultrasonic wave. A holder holds a transmitting probe for executing an angle beam method and a receiving probe for executing a vertical beam method. A motor and a guide rail form a movement mechanism for the transmitting probe and the receiving probe. In an ultrasonic test mode, the transmitting probe executes the angle beam method and transmits and receives an ultrasonic wave. In a sizing mode, the transmitting probe transmits an ultrasonic wave and the receiving probe receives this wave. A tip echo of a wave diffracted from a tip of a defect on a sample and a corner echo reflected from a corner of the defect are measured from a waveform received by the receiving probe.Type: ApplicationFiled: October 16, 2012Publication date: June 13, 2013Inventor: Hitachi, Ltd.
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Patent number: 8457909Abstract: A method for analysing blade displacements detected by circumferentially-spaced stationary timing probes associated with a rotating blade assembly, the displacements corresponding to times at which the blades pass the probes.Type: GrantFiled: October 22, 2009Date of Patent: June 4, 2013Assignee: Rolls-Royce PLCInventor: Peter Russhard
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Patent number: 8447530Abstract: A method for monitoring and diagnosing the health of a structure. The method includes providing a plurality of damage monitoring units each having at least one actuator, at least one sensor and a data collection device. The sensors are arranged and disposed to measure vibration produced by the actuator and provide a signal corresponding to the measured vibration to the data collection device. The actuator is activated and the vibration is measured with the sensor. The signal is compared to a reference signal and a damage index value is determined in response to the comparison between the signal and reference signal. The damage index value is transmitted for each vibratory path to a central processing device and the damage index values are analyzed for the plurality of damage monitoring units to determine the location of damage to the structure.Type: GrantFiled: January 16, 2008Date of Patent: May 21, 2013Assignee: The Boeing CompanyInventors: Lawrence E. Pado, James P. Dunne, John H. Belk
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Publication number: 20130124110Abstract: An inspection system (9) includes an idler wheel (61) that is coupled to a fabrication system (8) and is in contact with a backing layer (65) of an applied material (64), A rotation sensor (63) monitors the idler wheel (61) and generates a rotational signal. A controller (24) is coupled to the rotation sensor (63) and determines a characteristic of one or more flaws and FOD (19) on a composite structure (12) in response to the rotation signal.Type: ApplicationFiled: March 22, 2010Publication date: May 16, 2013Applicant: THE BOEING COMPANYInventors: Roger W. Engelbart, Reed Hannebaum, Tim Pollock
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Patent number: 8436298Abstract: LC/MS data generated by an LC/MS system is analyzed to determine groupings of ions associated with originating molecules. Ions are grouped initially according to retention time, for example, using retention time or chromatographic peaks in mass chromatograms. After initial groupings are determined based on retention time, ion peak shapes are compared to determine whether ions should be excluded. Ions having peak shapes not matching other ions, or alternatively a reference peak shape, are excluded from the group.Type: GrantFiled: August 24, 2010Date of Patent: May 7, 2013Assignee: Waters Technologies CorporationInventors: Scott J. Geromanos, Jeffrey Cruz Silva, Guo-Zhong Li, Marc Victor Gorenstein
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Patent number: 8401720Abstract: A route defect detection system for a powered system, the route defect detection system including a control system connected to the powered system for application of tractive effort, and a processor to determine an unplanned change in the application of tractive effort and/or otherwise associated with the tractive effort of the powered system. Based on the unplanned change, the processor determines a type of defect encountered along a mission route. A method and computer software code stored on a computer readable media and executable with a processor are also disclosed for a powered system to detect a defect along a mission route.Type: GrantFiled: June 15, 2009Date of Patent: March 19, 2013Assignee: General Electric CompanyInventors: Wolfgang Daum, Ajith Kuttannair Kumar, Glenn Robert Shaffer, Christopher McNally
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Patent number: 8381146Abstract: A computer-readable, non-transitory medium stores therein a design support program that causes a computer capable of accessing a storage device storing therein for each cell, an output voltage value of the cell, for each elapsed time period from a start of variation of an input voltage applied to the cell, to execute a process. The process includes extracting from the storage device, the output voltage value for each elapsed time period related to an cell under design selected from circuit information of a circuit under design; determining based on a specific voltage value, an extracted elapsed time period to be corrected; adding a time constant of an output from the cell under design to the elapsed time period determined to correction; and outputting the output voltage value for each corrected elapsed time period and the output voltage value for each elapsed time period that is not determined for correction.Type: GrantFiled: March 16, 2011Date of Patent: February 19, 2013Assignee: Fujitsu Semiconductor LimitedInventor: Mitsuru Onodera
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Patent number: 8374803Abstract: A damage detection apparatus and method which detect a damage occurring in a specimen include energizing an inspection area on a specimen into a predetermined energized condition, measuring a potential difference at predetermined intervals in the inspection area, and analyzing an existence or otherwise of a damage, and a shape thereof, based on a plurality of items of potential difference data. Parameters specifying a hypothetical damage are hypothesized in advance and, based on the potential difference data, calculation is executed using a maximum likelihood estimation method on a double body in which hypothetical specimens are doubled by bringing together their front surfaces, and furthermore on a quadruple body quadrupled by bringing rear surfaces of hypothetical specimens together, a maximum likelihood estimation value of the parameters is calculated.Type: GrantFiled: January 31, 2007Date of Patent: February 12, 2013Assignee: National University Corporation Okayama UniversityInventor: Naoya Tada
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Patent number: 8352201Abstract: A structural health monitoring system using ASICs for signal transmission, reception, and analysis. Incorporating structural health monitoring functionality into one or more ASICs provides a durable yet small, lightweight, low cost, and portable system that can be deployed and operated in field conditions. Such systems provide significant advantages, especially in applications such as armor structures.Type: GrantFiled: February 9, 2012Date of Patent: January 8, 2013Assignee: Acellent Technologies, Inc.Inventors: Xinlin Qing, Chang Zhang, Irene Li, Fu-kuo Chang, Hung Chi Chung
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Patent number: 8340801Abstract: Systems and computer-readable media having computer-executable components are disclosed for generating a representation of flatness defects on a wafer. Data is received describing the thickness of the wafer at a plurality of points on a wafer divided into a plurality of sites. A reference plane is defined for each of the plurality of sites. For each of the sites, an upper plane and a lower plane are defined relative to the reference plane. A determination is made as to which of the plurality of points on the wafer represents a flatness defect by identifying which points are not disposed between the upper plane and lower plane. A representation is then generated depicting a location of each of the flatness defects on the wafer. In some embodiments, a single representation is generated depicting the location of flatness defects on a plurality of wafers.Type: GrantFiled: December 29, 2009Date of Patent: December 25, 2012Assignee: MEMC Electronic Materials, Inc.Inventor: John A. Pitney
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Patent number: 8326551Abstract: A method and system for incorporating electronic signature analysis in a low voltage power supply to centrally monitor current consumption is disclosed. The electrical loads powered by the low voltage power supply can be tested individually via an automatic test routine by measuring and scaling of current through a differential amplifier. The current consumption of each electrical load can be measured by analyzing a “delta” in the current draw of each electrical load's ON and OFF condition. This value can be compared against a stored table of high and low limits for each electrical load. If a load's current is outside the limits, it will be logged for repairs. A current sensing device can be inserted in series with the output(s) of the low voltage power supply, while in test mode, to allow the automatic test routine to run, and then be shorted out for normal operation.Type: GrantFiled: April 22, 2008Date of Patent: December 4, 2012Assignee: Xerox CorporationInventor: Randall Brian Wirt
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Patent number: 8296082Abstract: A performance inspection system for an array ultrasound transducer includes: a driver for selectively applying an electric signal to all or some parts of constituent channels of the array ultrasound transducer; an acoustic power measurement unit for measuring an ultrasound acoustic power emitted from individual channels receiving the same voltage from the driver; a radiation conductance conversion unit for measuring a voltage signal applied to each channel although the driver applies different voltages to the individual channels, and converting the measured voltage into an ultrasound acoustic power acquired when the same voltage is applied to the channels; and a channel uniformity estimation unit for estimating uniformity of the acoustic power value acquired by the radiation conductance conversion unit or uniformity of acoustic power values of the individual channels measured under the same voltage.Type: GrantFiled: March 9, 2007Date of Patent: October 23, 2012Assignee: Korea Research Institute of Standards and ScienceInventors: Yong-tae Kim, Moon-jae Jho, Sung-soo Jung, Ho-chul Kim, Yong-hyeon Yun
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Patent number: 8290719Abstract: A method is present for processing a signal. A response signal is received from a structure. The response signal is decomposed into a plurality of signals based on a number of characteristics. A mode in the plurality of signals is identified based on a number of known characteristics for the mode, wherein the mode has a velocity.Type: GrantFiled: September 26, 2008Date of Patent: October 16, 2012Assignee: The Boeing CompanyInventors: Jeong-Beom Ihn, Christopher J. Martens
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Patent number: 8265889Abstract: A structural health monitoring system using ASICs for signal transmission, reception, and analysis. Incorporating structural health monitoring functionality into one or more ASICs provides a durable yet small, lightweight, low cost, and portable system that can be deployed and operated in field conditions. Such systems provide significant advantages, especially in applications such as armor structures.Type: GrantFiled: August 5, 2009Date of Patent: September 11, 2012Assignee: Acellent Technologies, Inc.Inventors: Xinlin Qing, Chang Zhang, Irene Li, Fu-kuo Chang, Hung Chi Chung
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Publication number: 20120191374Abstract: A damage detection and remediation system includes a sensing device for detecting damage events related to a structure of interest. Such damage events may include impact from a ballistic object, a tamper event, a physical impact, or other events that may affect structural integrity or cause failure. Illustratively, the sensing device is in communication with a measurement system to determine damage criteria, and a processing system which is configured to use the damage criteria to determine, for example, a direction of the initiation point of a ballistic causing the damage event.Type: ApplicationFiled: June 16, 2011Publication date: July 26, 2012Inventors: Alexander M. Soles, Matthew R. Walsh, Eric B. Scott
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EVENT DETECTION SYSTEM HAVING MULTIPLE SENSOR SYSTEMS IN COOPERATION WITH AN IMPACT DETECTION SYSTEM
Publication number: 20120191373Abstract: A damage detection and remediation system includes a sensing device for detecting damage events related to a structure of interest. Such damage events may include impact from a ballistic object, a tamper event, a physical impact, or other events that may affect structural integrity or cause failure. Illustratively, the sensing device is in communication with a measurement system to determine damage criteria, and a processing system which is configured to use the damage criteria to determine, for example, a direction of the initiation point of a ballistic causing the damage event.Type: ApplicationFiled: June 16, 2011Publication date: July 26, 2012Inventors: Alexander M. Soles, Matthew R. Walsh, Eric B. Scott -
Patent number: 8209135Abstract: A defect detected by a wafer inspection tool is reliably captured by a defect review tool. A defect review condition in the defect review tool is varied depending on defect attributes provided by the wafer inspection tool so as to optimize the review process. For example, review magnification is varied depending on the size of the defect, or the frame addition number is varied depending on the maximum gray level difference.Type: GrantFiled: March 4, 2011Date of Patent: June 26, 2012Assignee: Hitachi High-Technologies CorporationInventors: Tomohiro Funakoshi, Junko Konishi, Yuko Kariya, Noritsugu Takahashi, Fumiaki Endo
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Patent number: 8209145Abstract: A method to increase the accuracy of the interpolation of railroad mileposts is disclosed. Based upon image data and data provided in customer track charts, reference points are selected along the track, and their location is verified using GPS data. Once verified, the locations of various points between the reference points are determined using mathematical interpolation.Type: GrantFiled: June 30, 2009Date of Patent: June 26, 2012Assignee: Georgetown Rail Equipment CompanyInventors: David Pagliuco, Christopher M. Villar, John Anthony Nagle, II, Steven C. Orrell
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Patent number: 8204699Abstract: An analyzing method includes acquiring displacements with respect to loads applied of the test piece measured by the three-point bending test; calculating a first approximate expression of a relation of the displacements with respect to the loads applied in a first area where the relation is linear so as to determine an elasticity modulus of the test piece; extracting boundary value of a relation of strains caused by the displacements with respect to the loads so as to determine a yield stress value of the test piece; and calculating a second approximate expression of a relation of stress caused by the loads with respect to the strains caused by the displacements in a second area beyond the yield stress value on the basis of the yield stress value, the elasticity modulus, and the measurements in the second area.Type: GrantFiled: January 29, 2010Date of Patent: June 19, 2012Assignee: Fujitsu LimitedInventor: Hidehisa Sakai
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Patent number: 8185326Abstract: A method and apparatus comprises a number of sensors and a computer. The number of sensors is capable of being associated with a location of an object having quantum dots. The number of sensors is capable of sending energy into the location, and the energy is capable of causing a response from the quantum dots. The number of sensors is capable of detecting the response. The computer is coupled to the number of sensors and capable of determining whether corrosion is present in the location using the response detected by the number of sensors.Type: GrantFiled: February 23, 2009Date of Patent: May 22, 2012Assignee: The Boeing CompanyInventors: Morteza Safai, Gary E. Georgeson
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Patent number: 8175820Abstract: An object of the present invention is to quantitatively evaluate a distribution of defects which are generated within an inspection material.Type: GrantFiled: March 24, 2006Date of Patent: May 8, 2012Assignee: IHI CorporationInventors: Hiroaki Hatanaka, Nobukazu Ido, Minoru Tagami
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Patent number: 8173449Abstract: An evaluation area of an evaluation object wafer is concentrically divided in a radial direction, an upper limit value to the number of COPs is set in each divided evaluation segment, and an acceptance determination of the single-crystal silicon wafer is made using the upper limit value as a criterion. Thereby, a quantitative and objective COP evaluation can be made, and a proper determination is made based on a clear criterion. The evaluation method of the present invention can sufficiently deal with automation of the COP evaluation (inspection) and the higher-quality wafer in the near future, and the evaluation method can be widely applied to production of the single-crystal silicon wafer and production of a semiconductor device.Type: GrantFiled: May 22, 2007Date of Patent: May 8, 2012Assignee: Sumco CorporationInventor: Shuichi Inami
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Patent number: 8165706Abstract: Methods are disclosed for generating a representation of flatness defects on a wafer. Data is received describing the thickness of the wafer at a plurality of points on a wafer divided into a plurality of sites. A reference plane is defined for each of the plurality of sites. For each of the sites, an upper plane and a lower plane are defined relative to the reference plane. A determination is made as to which of the plurality of points on the wafer represents a flatness defect by identifying which points are not disposed between the upper plane and lower plane. A representation is then generated depicting a location of each of the flatness defects on the wafer. In some embodiments, a single representation is generated depicting the location of flatness defects on a plurality of wafers.Type: GrantFiled: December 29, 2009Date of Patent: April 24, 2012Assignee: MEMC Electronic Materials, Inc.Inventor: John A. Pitney
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Patent number: 8142368Abstract: A novel method for soft tissue characterization includes obtaining a sequence of surface stress patterns as a function of an increasing compression force when a probe is pressed against the tissue over the location of the lesion of interest. A number of elasticity features are then calculated to characterize the tissue and the lesion located therein including strain hardening, loading curve average slope, lesion peak signal under a predetermined load, tissue heterogeneity, lesion shape and lesion mobility. At least three elasticity features are provided as an input to a statistical Bayesian classifier trained on a clinical database to calculate the probability of the lesion being benign or malignant. Additional patient-related parameters may be further provided as inputs to the classifier to increase the accuracy of differentiation between benign and malignant lesions.Type: GrantFiled: October 2, 2008Date of Patent: March 27, 2012Assignee: Artann Laboratories Inc.Inventors: Vladimir Egorov, Armen P. Sarvazyan
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Publication number: 20120016600Abstract: A defect detection system and method enable a fastened crystalline silicon product to generate micro-vibration by a micro-vibration excitation device, so as to enable the crystalline silicon product to generate an excitation signal, then to acquire the excitation signal by a acquisition device, so as to analyze the excitation signal acquired by the acquisition device in the time and frequency domain by an analysis detection device with a specific analysis, and to obtain an analysis result, at last, determine a defect state of the crystalline silicon product according to the analysis result.Type: ApplicationFiled: September 10, 2010Publication date: January 19, 2012Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTEInventors: Jui-Yiao SU, Yu-Liang Chung, Chun-Chieh Wang, Chien-Feng Wu, Yan-Chen Liu
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Patent number: 8065571Abstract: A tester that generates various data patterns to assure that link receivers and transmitters are functioning properly (i.e., are functioning according to a relevant network specification) across the entire storage area network. In various embodiments, this tester may be used in Fibre Channel type SANs or in fiber connectivity (FICON) type SANs.Type: GrantFiled: October 14, 2008Date of Patent: November 22, 2011Assignee: International Business Machines CorporationInventors: Louie A. Dickens, Olive P. Faries, Michael E. Starling, David L. Binning
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Publication number: 20110282591Abstract: A pipeline inspection device, for example a pipeline inspection gauge or pig, is configured for inspecting a pipeline. The pipeline includes a plurality of pipes of varying orientations and a radio frequency identification device (RFID) provided on each pipe. Each RFID contains information indicative of the identity of each respective pipe. The inspection device includes a RF transceiver configured to receive the identity information from each RFID; an inertial navigation unit configured to generate three-space position information indicative of the position of the inspection device in the pipeline; and a processor configured to synchronize the identity information of each RFID with the position information to determine a three-space location of each pipe in the pipeline.Type: ApplicationFiled: July 26, 2011Publication date: November 17, 2011Applicant: WTF INDUSTRIESInventors: William COGEN, Michael Burz
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Patent number: 8046178Abstract: A defect detection system identifies defects in weld seams. An exemplary system includes a scanner device, mounted on a displacement device of a processing unit and which can be displaced by the unit over at least one weld seam that is to be examined. The scanner unit scans the weld seam using a predefinable frequency, each scanning sweep being correlated with a time signal. The time signal is used to record the point in time when at least one location containing defects is scanned. An analysis module determines the co-ordinates of the defects from the signals that are obtained by the scanning sweeps and stores the co-ordinates of the defects and transmits them to a localisation module. The localisation module determines the spatial arrangement of the defects of the weld seam by evaluating a speed profile of the displacement device during the scanning sweeps, the time signal and the co-ordinates.Type: GrantFiled: June 12, 2006Date of Patent: October 25, 2011Assignee: ABB Research LtdInventors: Fan Dai, Björn Matthias, Sönke Kock
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Patent number: 7974815Abstract: An apparatus providing a means for assessment of the integrity of insulated conduits, harnesses, cables, pipelines and other interconnection systems constructed with integral sensitized media, discrete sensors, and electronics providing a means for transforming sensed data into information and a means for communicating information for the purpose of understanding the location, degree and risk of damage and deterioration, and the probable causes thereof.Type: GrantFiled: August 28, 2006Date of Patent: July 5, 2011Inventor: Kenneth Gerald Blemel
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Publication number: 20110160890Abstract: Methods are disclosed for generating a representation of flatness defects on a wafer. Data is received describing the thickness of the wafer at a plurality of points on a wafer divided into a plurality of sites. A reference plane is defined for each of the plurality of sites. For each of the sites, an upper plane and a lower plane are defined relative to the reference plane. A determination is made as to which of the plurality of points on the wafer represents a flatness defect by identifying which points are not disposed between the upper plane and lower plane. A representation is then generated depicting a location of each of the flatness defects on the wafer. In some embodiments, a single representation is generated depicting the location of flatness defects on a plurality of wafers.Type: ApplicationFiled: December 29, 2009Publication date: June 30, 2011Applicant: MEMC ELECTRONIC MATERIALS, INC.Inventor: John A. Pitney
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Publication number: 20110160891Abstract: Systems and computer-readable media having computer-executable components are disclosed for generating a representation of flatness defects on a wafer. Data is received describing the thickness of the wafer at a plurality of points on a wafer divided into a plurality of sites. A reference plane is defined for each of the plurality of sites. For each of the sites, an upper plane and a lower plane are defined relative to the reference plane. A determination is made as to which of the plurality of points on the wafer represents a flatness defect by identifying which points are not disposed between the upper plane and lower plane. A representation is then generated depicting a location of each of the flatness defects on the wafer. In some embodiments, a single representation is generated depicting the location of flatness defects on a plurality of wafers.Type: ApplicationFiled: December 29, 2009Publication date: June 30, 2011Applicant: MEMC ELECTRONIC MATERIALS, INC.Inventor: John A. Pitney
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Patent number: 7937234Abstract: Classification of spatial patterns on wafer maps is generally described. In one example, a method includes applying K-means type clustering to wafer maps comprising one or more spatial patterns to group one or more clusters comprising wafer maps having similar spatial patterns and producing a dendrogram using a clustering process to display the one or more clusters.Type: GrantFiled: August 29, 2008Date of Patent: May 3, 2011Assignee: Intel CorporationInventors: Eric R. St. Pierre, Eugene Tuv, Alexander Borisov
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Patent number: 7937248Abstract: A method, apparatus, and computer program product for monitoring structures using virtual time reversal signal processing. In one embodiment, a signal having a frequency range is sent into a structure in a vehicle from a fixed transmitter to form an original transmitted signal. A response to the original transmitted signal is received at a fixed sensor associated with the structure to form a received response. The received response is reversed. The reversed response is processed using a transfer function to simulate propagation of the reversed response from the fixed sensor to the fixed transmitter to form a simulated time reversed response. The simulated time reversed response is a simulation of a response of the fixed transmitter to receiving the reversed response from the fixed sensor. The simulated time reversed response is analyzed to monitor for anomalies associated with the structure.Type: GrantFiled: September 25, 2007Date of Patent: May 3, 2011Assignee: The Boeing CompanyInventors: Jeong-Beom Ihn, James Patrick Dunne
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Patent number: 7930111Abstract: A system for detecting differential bearing damages includes a synthesized tachometer that generates a tachometer signal corresponding to the race speed difference of a bearing assembly such that the bearing damage speed difference dependency can be eliminated and the damage features can be enhanced. The system also includes acceleration enveloping in the cycle domain to further enhance the damage signatures.Type: GrantFiled: September 22, 2008Date of Patent: April 19, 2011Assignee: General Electric CompanyInventors: Huageng Luo, George Hanna Ghanime, Hai Qiu
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Patent number: 7930112Abstract: In a method of evaluating measured values for recognizing defect conditions due to material fatigue on aircraft parts, strain sensors (6) are applied on the critical locations of an aircraft (1) and measured values of outputs of the strain sensors are detected at different loading conditions, amplified and stored through several measuring circuits. An evaluating apparatus (9) derives, signals or indicates a material fatigue by comparison of current measured values with previous measured values. The critical aircraft parts (1) are impinged on with prescribed loading conditions by loading elements (3). The strain effect caused thereby is detected by measuring circuits. The evaluating apparatus (9) forms, for at least each loading condition and each measuring circuit, an allocated reference value and a permissible limit value range. If current measured values exceed the limit value range, this represents a material fatigue manifestation.Type: GrantFiled: April 19, 2006Date of Patent: April 19, 2011Assignee: Hottinger Baldwin Messtechnik GmbHInventor: Johannes Mattes
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Patent number: 7930259Abstract: A nondestructive inspection apparatus includes a sensor unit for detecting vibrations transmitted through a test object from a vibration generator and a signal input unit for extracting a target signal from an electric signal outputted from the sensor unit. An amount of characteristics extracting unit is also included for extracting multiple frequency components from the test signal as an amount of characteristics. Further, a decision unit has a competitive learning neural network for determining whether the amount of the characteristics belongs to a category, wherein the competitive learning neural network has been trained by using training samples belong to the category representing an internal state of the test object, wherein distributions of membership degrees of the training samples are set in the decision unit.Type: GrantFiled: December 14, 2007Date of Patent: April 19, 2011Assignee: Panasonic Electric Works Co., Ltd.Inventors: Yoshihito Hashimoto, Hidekazu Himezawa
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Patent number: 7930128Abstract: A method of improving damage detection in a structural health monitoring system includes obtaining a baseline set of signals corresponding to a range of values of an environmental effect variable for a plurality of first selected paths between pairs of a plurality of transducers configured in an array attached to a structure. Threshold levels are established for each of the selected paths for determining detection of damage in the structure based on differences in the baseline set of signals for the selected path. A current signal is acquired for each of the selected paths. The plurality of current signals are analyzed based on the threshold levels to detect damage in the structure.Type: GrantFiled: December 7, 2007Date of Patent: April 19, 2011Assignee: Acellent Technologies, Inc.Inventor: Shawn J. Beard
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Patent number: 7925455Abstract: A method for determining the health of a structural element. The method includes providing a plurality of transducer elements arranged and disposed to permit measurement of vibration generated by at least one of the transducer elements at one or more of the other transducers elements. Vibration is induced with at least one transducer element. Vibration is measured at least one other transducer element, where the measured vibration corresponding to a vibratory path. At least one damage index value is calculated for each vibratory path in response to the measured vibration. At least one damage image is generated in response to the damage index value. The damage image assigns damage index values to each vibratory path. A damage location is determined from the damage image.Type: GrantFiled: January 24, 2008Date of Patent: April 12, 2011Assignee: The Boeing CompanyInventors: Lawrence E. Pado, James P. Dunne, Jeong-Beom Ihn
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Patent number: 7877216Abstract: A brake, system, and method are presented. The brake includes friction material, a backing pad, sensor-wear material embedded within the friction material, and an electronics assembly. The electronics assembly is configured to measure a characteristic of the sensor-wear material, such as the electrical resistance or the temperature of the sensor-wear material. The sensor-wear material may be applied to the brake using a variety of approaches. A condition of the brake, such as a brake-wear value or an estimated-mileage value is determined, based on the measured characteristic of the sensor-wear material. A brake-wear state may be determined by comparing the brake-wear value to one or more thresholds. The brake-wear value, estimated-mileage value, and/or the brake wear state may be indicated on a brake-wear indicator.Type: GrantFiled: July 30, 2008Date of Patent: January 25, 2011Assignee: Honeywell International Inc.Inventors: Mark A Wright, George L Wright
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Patent number: 7853345Abstract: Dynamic offset determination for each of a plurality of measurement systems for matching the systems is disclosed. One embodiment uses an artifact which is periodically run across the measurement system to be matched. Inputs for each run include the current offsets and historical data for the entire fleet and the new test measurement for the current measurement system under test. Evaluation based on exponentially weighted moving average and median calculation techniques may result in a new, reset offset for one or more measurement systems. The reset offset(s) is then applied to product measurements to nullify any tool matching issues.Type: GrantFiled: September 27, 2007Date of Patent: December 14, 2010Assignee: International Business Machines CorporationInventors: Andrew C. Brendler, Danielle R. Chianese, Susan M. Jankovsky, Roger M. Young
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Patent number: 7822562Abstract: Method for removing air wave noise from shallow water controlled source electromagnetic survey data, using only the measured data and conductivity values for sea water (140) and air. The method is a calculation performed numerically on CSEM data and resulting in an estimate of those data that would have been acquired had the water layer extended infinitely upward from the seafloor. No properties of the sub-sea sediments are used. Synthetic electromagnetic field data are generated for (a) an all water model (141) and (b) an air-water model (146-147) of the survey region. These simulated results are then used to calculate (148-150) electromagnetic field values corresponding to a water-sediment model with water replacing the air half space, which represent measured data adjusted to remove air wave noise.Type: GrantFiled: May 18, 2007Date of Patent: October 26, 2010Assignee: ExxonMobil Upstream Research Co.Inventor: Willen E. Dennis
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Patent number: 7822573Abstract: A computer implemented method, apparatus, and computer usable program code for testing a material. A signal is sent into the material using the transmitter. The signal has a frequency range that falls within a selected frequency range to form a transmitted signal. An actual response to the transmitted signal is received at a sensor. A simulated response of the material to the transmitted signal is generated using a functional model capable of modeling responses of the material to different frequency ranges falling within the selected frequency range. The simulated response is compared to the actual response to determine if a change has occurred in the material.Type: GrantFiled: August 17, 2007Date of Patent: October 26, 2010Assignee: The Boeing CompanyInventor: Jeong-Beom Ihn
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Patent number: 7822561Abstract: A defect analysis method includes storing, in a database, data indicative of defects and analog characteristics of corresponding defective bits in a database. A first defective area in a first wafer is found, and analog characteristics of defective bits in the first defective area are measured. The measured analog characteristics and the analog characteristics stored in the database are compared to locate a defect causing the first defective area.Type: GrantFiled: January 15, 2008Date of Patent: October 26, 2010Assignee: Samsung Electronics Co., Ltd.Inventor: Jong-hyun Lee
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Patent number: 7801700Abstract: Some embodiments of the present invention provide a system that generates a simulated vibration pattern in a computer subsystem. During operation, a vibration pattern is monitored at a location in the computer subsystem, wherein the vibration pattern is monitored while the computer subsystem is incorporated into the computer system and the computer system is operating. Then, the vibrations of the computer subsystem are mimicked by generating the simulated vibration pattern at the same location in the computer subsystem based on the monitored vibration pattern.Type: GrantFiled: August 5, 2008Date of Patent: September 21, 2010Assignee: Oracle America, Inc.Inventors: Kenny C. Gross, Anton A. Bougaev, Aleksey M. Urmanov
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Patent number: 7800055Abstract: LC/MS data generated by an LC/MS system is analyzed to determine groupings of ions associated with originating molecules. Ions are grouped initially according to retention time, for example, using retention time or chromatographic peaks in mass chromatograms. After initial groupings are determined based on retention time, ion peak shapes are compared to determine whether ions should be excluded. Ions having peak shapes not matching other ions, or alternatively a reference peak shape, are excluded from the group.Type: GrantFiled: May 20, 2005Date of Patent: September 21, 2010Assignee: Waters Technologies CorporationInventors: Scott J. Geromanos, Jeffrey Cruz Silva, Guo-Zhong Li, Marc Victor Gorenstein
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Publication number: 20100234977Abstract: An apparatus may comprise a nondestructive evaluation system and a cutting system. The nondestructive evaluation system may be configured to inspect a processed portion of a structure. The nondestructive evaluation system may be configured to determine whether an inconsistency is present in the processed portion. The nondestructive evaluation system may also be configured to generate information about a location of the inconsistency. The cutting system may be configured to cut a number of parts out of the processed portion of the structure in which the inconsistency may be at least substantially excluded from the number of parts.Type: ApplicationFiled: March 16, 2009Publication date: September 16, 2010Applicant: THE BOEING COMPANYInventors: Roger W. Engelbart, Steven J. Burpo, Michael P. Renieri
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Publication number: 20100228500Abstract: An apparatus for identifying the position of defects (100) in bodies (2), comprises feed means (3) for moving the body (3) along a feed direction (A), an emitter (5) designed to direct towards the body (2) a plurality of beams (6?, 6?, 6??) of electromagnetic radiation lying in lying planes (P1, P2, P3) set at different angles to each other, and transversal to the feed direction (A), and a plurality of sensors (8?, 8?, 8??) each facing the emitter (5) for receiving a respective beam (6?, 6?, 6??) after the beam (6?, 6?, 6??) has passed through the body (2). The lying planes (P1, P2, P3) are positioned one after another along the feed direction (A), allowing each portion of the body (2) to be struck by successive beams (6?, 6?, 6??) as the body (2) is fed forward. A corresponding method is also claimed.Type: ApplicationFiled: September 2, 2009Publication date: September 9, 2010Applicant: MICROTEC S.R.L.Inventor: Federico GIUDICEANDREA
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Publication number: 20100204929Abstract: An inspection system (9) includes an idler wheel (61) that is coupled to a fabrication system (8) and is in contact with a backing layer (65) of an applied material (64), A rotation sensor (63) monitors the idler wheel (61) and generates a rotational signal. A controller (24) is coupled to the rotation sensor (63) and determines a characteristic of one or more flaws and FOD (19) on a composite structure (12) in response to the rotation signal.Type: ApplicationFiled: March 22, 2010Publication date: August 12, 2010Applicant: THE BOEING COMPANYInventors: Roger W. Engelbart, Reed Hannebaum, Tim Pollock