Location Patents (Class 702/36)
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Publication number: 20100204929Abstract: An inspection system (9) includes an idler wheel (61) that is coupled to a fabrication system (8) and is in contact with a backing layer (65) of an applied material (64), A rotation sensor (63) monitors the idler wheel (61) and generates a rotational signal. A controller (24) is coupled to the rotation sensor (63) and determines a characteristic of one or more flaws and FOD (19) on a composite structure (12) in response to the rotation signal.Type: ApplicationFiled: March 22, 2010Publication date: August 12, 2010Applicant: THE BOEING COMPANYInventors: Roger W. Engelbart, Reed Hannebaum, Tim Pollock
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Patent number: 7751989Abstract: A system for inspecting a pipeline having at least two transducers divided into segments, the segments each containing a number of sensors, wherein a maximum number of segments is equal to a number of transducers, an arrangement configured to send, receive and store signals, wherein the arrangement has a number of pulser channels and a number of receiver channels, wherein the arrangement has at least one multiplexing arrangement for multiplexing signals from the arrangement; and a time delay arrangement connected to the arrangement configured to send, receive and store signals. The system may also provide for focal point skewing, near real time coating compensation for proper excitation mode, adjusted time delay capability and the ability to focus beyond changes in geometry.Type: GrantFiled: November 30, 2007Date of Patent: July 6, 2010Assignee: FBS, Inc.Inventors: Steven E. Owens, Joseph L. Rose, Jason K. Van Velsor, Li Zhang, Michael J. Avioli
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Publication number: 20100153024Abstract: The invention refers to an apparatus for mapping a surface profile of a surface of an object, by which the apparatus yields slope data. The slope data of the apparatus may comprise measurement errors, which according to the invention shall be detected and corrected for. It is suggested that a computational entity calculates for all measurement values the curl of the slope data for determining surface locations at which the measurement values exhibit measurement errors. In a second step the proposal is given with which the measurement values can be corrected.Type: ApplicationFiled: June 27, 2006Publication date: June 17, 2010Applicant: KONINKLIJKE PHILIPS ELECTRONICS, N.V.Inventors: Willem Potze, Willem Dirk Van Amstel
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Patent number: 7734429Abstract: A method for creating at least one input parameter for an algorithmic system to evaluate damage in a structure may include: (a) Determining a plurality of damage index factors using first signal information relating to a first signal transmitted through the structure before the damage is imposed, and second signal information relating to a second signal transmitted through the structure after the damage is imposed. (b) determining a plurality of condensed damage index factors using the plurality of damage index factors. (c) Correlating selected of the condensed damage index factors with selected measured dimensions relating to the damage to determine a correlation index for selected combinations of the condensed damage index factors and the dimensions. (d) Selecting the at least one input parameter from among the selected condensed damage index factors having a correlation index meeting at least one predetermined criterion.Type: GrantFiled: October 15, 2007Date of Patent: June 8, 2010Assignee: Boeing CompanyInventor: Lawrence E. Pado
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Patent number: 7715991Abstract: A method for estimating an amount of damages sustained by a component operating in an energy system by monitoring the component is provided. The method includes generating a transfer function that is dependent upon an input of at least one operating condition of the component and an output of a crack-initiation time and/or a crack propagation for at least one critical region. The method further includes receiving data from at least one sensor coupled to the component, wherein the data relates to the at least one operating condition of the component, and inputting the received data from the at least one sensor into the transfer function to calculate at least one of the crack-initiation time and the crack propagation for the at least one critical region. The method also includes recording at least one of the crack-initiation time and the crack propagation on a memory storage device.Type: GrantFiled: May 17, 2007Date of Patent: May 11, 2010Assignee: General Electric CompanyInventors: Yogesh Kesrinath Potdar, David Ernest Welch, David Wing Chau
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Patent number: 7698075Abstract: A system and method for detecting damage to a structure is provided. The system includes a voltage source and at least one capacitor formed as a layer within the structure and responsive to the voltage source. The system also includes at least one sensor responsive to the capacitor to sense a voltage of the capacitor. A controller responsive to the sensor determines if damage to the structure has occurred based on the variance of the voltage of the capacitor from a known reference value. A method for sensing damage to a structure involves providing a plurality of capacitors and a controller, and coupling the capacitors to at least one surface of the structure. A voltage of the capacitors is sensed using the controller, and the controller calculates a change in the voltage of the capacitors. The method can include signaling a display system if a change in the voltage occurs.Type: GrantFiled: February 14, 2006Date of Patent: April 13, 2010Assignee: The Boeing CompanyInventors: Mark A Curry, Simon D Senibi, David L Banks
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Patent number: 7680631Abstract: A system for analyzing linear data is provided. The system comprises a datastore of linear data correlated by distance; a library of functions that may be performed on the linear data; computer executable code stored on a computer readable medium for performing an analysis of the sets of linear data based on the functions in the library.Type: GrantFiled: December 12, 2005Date of Patent: March 16, 2010Assignee: Bentley System, Inc.Inventors: Ernest Theodore Selig, IV, Gerald Cardillo
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Patent number: 7636649Abstract: An optical metrology model for the structure is obtained. The optical metrology model comprising one or more profile parameters, one or more process parameters, and a dispersion. A dispersion function that relates the dispersion to at least one of the one or more process parameters is obtained. A simulated diffraction signal is generated using the optical metrology model and a value for the at least one of the process parameters and a value for the dispersion. The value for the dispersion is calculated using the value for the at least one of the process parameter and the dispersion function. A measured diffraction signal of the structure is obtained using an optical metrology tool. The measured diffraction signal is compared to the simulated diffraction signal to determine one or more profile parameters of the structure. The fabrication tool is controlled based on the determined one or more profile parameters of the structure.Type: GrantFiled: September 21, 2007Date of Patent: December 22, 2009Assignee: Tokyo Electron LimitedInventors: Shifang Li, Hanyou Chu, Manuel Madriaga
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Publication number: 20090306909Abstract: The invention relates to a method for the evaluation of measured values for the recognition of defect conditions due to material fatigue on aircraft parts, in which strain sensors (6) are applied on the critical locations of an aircraft (1) or the parts thereof, wherein the measured values of the strain sensors at different loading conditions are detected, amplified and stored through several measuring circuits and from which an evaluating apparatus (9) derives, signals or indicates a material fatigue by comparison of current measured values with previous measured values.Type: ApplicationFiled: April 19, 2006Publication date: December 10, 2009Inventor: Johannes Mattes
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Patent number: 7627439Abstract: A device for use in detecting an event in a structure includes a sensor encapsulation, the encapsulation containing a sensor, an actuator positioned substantially in-plane to the sensor within the housing and a printed circuit board in communication with at least one of the sensor and the actuator. The printed circuit board includes a microprocessor constructed and arranged to collect data from at least one of the sensor and the actuator, a signal generator constructed and arranged to provide excitation to at least one of the sensor and the actuator, and an amplifier to condition the excitation.Type: GrantFiled: May 18, 2006Date of Patent: December 1, 2009Assignee: Metis Design CorporationInventors: Seth S. Kessler, Kristin A. Jugenheimer, Aaron B. Size
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Patent number: 7607351Abstract: A system is disclosed for detecting and locating harmful impacts to pipelines using sensors placed along the pipeline. The exact spacing of sensors is site specific and is set with the goal of maximizing sensor spacing without reducing system performance and reliability. At each sensor location, preferably there are four basic components, i.e., a hydrophone, solar power components, and data processing and communications equipment. Each hydrophone directly measures the acoustic noise fluctuation in a pipe section, which propagates at long distances in the pipeline at the specific speed of sound for the particular type of pipe. If specific signal parameters exceed a programmed threshold, a detection message is generated and transmitted via a communications link to a central monitoring and diagnostic center.Type: GrantFiled: June 26, 2007Date of Patent: October 27, 2009Assignee: General Electric CompanyInventors: Peter S. Allison, Charles E Chassaing, Bryan Lethcoe
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Publication number: 20090251816Abstract: A defect inspection method and device for a perpendicular magnetic recording medium that has discrete recording tracks and grooves between recording tracks, including DC demagnetizing the perpendicular magnetic recording medium, detecting a reproduced signal from the perpendicular magnetic recording medium after the DC demagnetizing, removing output fluctuation components caused by the grooves from the reproduced signal using a filter with a prescribed cutoff frequency and separating a peak output of the reproduced signal, comparing the peak output with a prescribed reference signal, and identifying a location where the peak output exceeds the reference signal as a defect location.Type: ApplicationFiled: March 24, 2009Publication date: October 8, 2009Applicant: Fuji Electric Device Technology Co., Ltd.Inventor: Hiroto Kikuchi
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Patent number: 7595488Abstract: Techniques for specifying an observing or working position of a sample are provided. Digitized data of a sample is obtained and stored in a 1st storage device. A 1st display area displays an image of a portion containing a desired observing or working position of the digitized data stored in the 1st storage device. A 1st position that is indicated by a pointing device on the 1st display area is stored in a 2nd storage device. The sample is moved to an observing or working position for observation, and an observation image of the sample is stored in the 3rd storage device. A 2nd display area displays the observation image of the sample stored in the 3rd storage device. A position indicated on the 2nd display area and corresponding to the 1st position stored in the 2nd storage device is stored in a 4th storage device.Type: GrantFiled: December 21, 2005Date of Patent: September 29, 2009Assignee: SII Nano Technology Inc.Inventors: Junichi Tashiro, Yutaka Ikku, Makoto Sato
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Publication number: 20090222220Abstract: The claimed method and system identifies faults and/or deterioration of components in a process control valve. The system may use different sensor combinations to provide the necessary data to compute irregular component integrity. Alerts may be generated to indicate potential component integrity problems. In particular, the system may detect potential deterioration and/or faults in actuator springs, pneumatic tubing and piping, and bellows seals. The claimed system may be communicatively coupled to a process control network to provide a more elaborate alarm system. Moreover, additional statistical methods may be used to refine the detection accuracy of the system.Type: ApplicationFiled: February 29, 2008Publication date: September 3, 2009Applicant: FISHER CONTROLS INTERNATIONAL LLCInventor: Galen D. Wilke
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Publication number: 20090198455Abstract: An automated crack detection system and method for determining a crack initiation potential of a vehicle closure includes a vehicle closure operatively mounted to a vehicle. One or more specific locations on the vehicle closure are identified for monitoring and one or more sensors are mounted on the vehicle closure at the one or more specific locations identified. A signal analyzer assembly is linked to the one or more sensors for receiving acoustic emission signals therefrom when the vehicle closure is repeatedly opened and closed. The signal analyzer assembly compares the signals received to a predetermined threshold to determine a crack initiation potential of said vehicle closure.Type: ApplicationFiled: February 4, 2008Publication date: August 6, 2009Applicant: Honda Motor Co., Ltd.Inventor: David W. Bricker
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Publication number: 20090192729Abstract: A method for determining the health of a structural element. The method includes providing a plurality of transducer elements arranged and disposed to permit measurement of vibration generated by at least one of the transducer elements at one or more of the other transducers elements. Vibration is induced with at least one transducer element. Vibration is measured at least one other transducer element, where the measured vibration corresponding to a vibratory path. At least one damage index value is calculated for each vibratory path in response to the measured vibration. At least one damage image is generated in response to the damage index value. The damage image assigns damage index values to each vibratory path. A damage location is determined from the damage image.Type: ApplicationFiled: January 24, 2008Publication date: July 30, 2009Applicant: THE BOEING COMPANYInventors: Lawrence E. PADO, James P. DUNNE, Jeong-Beom IHN
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Publication number: 20090182515Abstract: A method for monitoring and diagnosing the health of a structure. The method includes providing a plurality of damage monitoring units each having at least one actuator, at least one sensor and a data collection device. The sensors are arranged and disposed to measure vibration produced by the actuator and provide a signal corresponding to the measured vibration to the data collection device. The actuator is activated and the vibration is measured with the sensor. The signal is compared to a reference signal and a damage index value is determined in response to the comparison between the signal and reference signal. The damage index value is transmitted for each vibratory path to a central processing device and the damage index values are analyzed for the plurality of damage monitoring units to determine the location of damage to the structure.Type: ApplicationFiled: January 16, 2008Publication date: July 16, 2009Applicant: THE BOEING COMPANYInventors: Lawrence E. PADO, James P. DUNNE, John H. BELK
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Patent number: 7542821Abstract: A conversion control system is described that includes a database to store data defining a set of rules and an interface to receive local anomaly information from a plurality of different analysis machines associated with a plurality of manufacturing process lines that perform a plurality of operations on a web of material, and each of the manufacturing process lines includes position data for a set of regions on the web containing anomalies. The system also includes a computer that registers the position data of the local anomaly information for the plurality of manufacturing process lines to produce aggregate anomaly information. The system further includes a conversion control engine that applies the rules to the aggregate anomaly information to determine which anomalies represent actual defects in the web for a plurality of different products.Type: GrantFiled: July 26, 2007Date of Patent: June 2, 2009Assignee: 3M Innovative Properties CompanyInventors: Steven P. Floeder, Kenneth G. Brittain, James A. Masterman, Carl J. Skeps
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Patent number: 7542856Abstract: A structure monitor system comprising a measuring unit 3 for measuring distortions of the structure S at respective points on a boundary by using an optical fiber sensor 2 laid on the boundary of the structure, numerical analysis unit 5 for calculating a distortion at a specified point on the structure S by a numerical analysis method with distortions measured by the measuring unit as a boundary condition, and a display unit 6 for displaying information on an analysis distortion by the numerical analysis unit 5 in a association with a position on the structure S.Type: GrantFiled: July 2, 2003Date of Patent: June 2, 2009Assignee: Neubrex Co., Ltd.Inventors: Kinzo Kishida, Motohiro Nakano, Yoshiaki Yamauchi
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Patent number: 7539596Abstract: A method and a device for diagnosis and state monitoring of a wear and functional state of a junction, a crossing, a crossroads, rail joints, and/or track nonuniformities of a rail traffic path made of several tracks measures and stores swing acceleration in at least one direction when overtaking a rail vehicle on a junction, crossings or crossroads, in addition to rail joints or track nonuniformities on at least one rail vehicle component, the swing acceleration being produced on the rail vehicle component when overtaking the rail vehicle at the junction, crossing or crossroads, rail joints, track nonuniformites. The method also measures and stores the rail vehicle speed and determines and stores the travel direction and the place of the junction, crossing or crossroads, rail joints, track nonuniformities, carries out a control as to whether characteristic, predetermined threshold values of the measured swing accelerations have been exceeded.Type: GrantFiled: May 4, 2005Date of Patent: May 26, 2009Assignee: Deutsche Bahn AGInventors: Andreas Zoll, Daniel Lüke
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Patent number: 7499772Abstract: A system for the nondestructive evaluation of aircraft comprising a plurality of positional transmitters forming a perimeter around a test airplane and an inspection station within the perimeter. The inspection station includes a moveable cart, a nondestructive testing device coupled the cart, and a computer coupled to the cart and nondestructive testing device. The computer configured to receive aircraft positional data from positional receivers mounted on an aircraft and overlay a model of the aircraft on the received aircraft positional data to determine a coordinate system for the aircraft. The computer is further operable to determine the location of the cart from data received from onboard positional receivers, the location of the cart referenced to the coordinate system for the aircraft.Type: GrantFiled: August 31, 2005Date of Patent: March 3, 2009Assignee: Honeywell International Inc.Inventors: David E. Wilcox, Paul Michael Jones, Timothy R. Duffy
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Publication number: 20080262751Abstract: Evaluating irregularities in surfaces of objects such as semiconductor wafers using a thickness profile of a surface section and analyzing the profile to obtain information of an irregularity start position, magnitude, and span along with surface slope and height information.Type: ApplicationFiled: April 23, 2007Publication date: October 23, 2008Inventors: Rabi Fettig, Jaydeep Kumar Sinha
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Publication number: 20080238642Abstract: A method for preparing an in-vehicle device includes monitoring a communication bus for one or more messages. The method also includes determining if at least one of the one or more messages corresponds with a message in a list of messages indicative of a change in vehicle state. Data is extracted from the at least one message that corresponds with the message in the list of messages. A signal is transmitted to the in-vehicle device based on the extracted data. A vehicle system that implements the method is also disclosed herein.Type: ApplicationFiled: March 29, 2007Publication date: October 2, 2008Inventor: Thomas K. Mauti
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Publication number: 20080221808Abstract: Monitoring pressurized fluid containers through use of a container site subsystem and a system hub. The container site subsystem including sensor(s) to sense a characteristic associated with a pressurized fluid container; and a container site hub to receive, from each sensor, raw data corresponding to the sensed characteristic. The system hub receives the aggregated raw data from the container site hub, and converts the raw data to process values.Type: ApplicationFiled: March 3, 2008Publication date: September 11, 2008Inventors: Kevin D. Dix, David Elston Brown, Christopher A. Lauff, Fang Huang Tu, M. Mushtaq Ahmed, Steven James Borkman
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Publication number: 20080221807Abstract: Monitoring pressurized fluid containers through use of a container site subsystem and a system hub. The container site subsystem including sensor(s) to sense a characteristic associated with a pressurized fluid container; and a container site hub to receive, from each sensor, raw data corresponding to the sensed characteristic. The system hub receives the aggregated raw data from the container site hub, and converts the raw data to process values.Type: ApplicationFiled: March 3, 2008Publication date: September 11, 2008Inventors: Kevin D. Dix, David Elston Brown, Christopher A. Lauff, Fang Huang Tu, M. Mushtaq Ahmed, Steven James Borkman
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Publication number: 20080221809Abstract: Monitoring pressurized fluid containers through use of a container site subsystem and a system hub. The container site subsystem including sensor(s) to sense a characteristic associated with a pressurized fluid container; and a container site hub to receive, from each sensor, raw data corresponding to the sensed characteristic. The system hub receives the aggregated raw data from the container site hub, and converts the raw data to process values.Type: ApplicationFiled: March 3, 2008Publication date: September 11, 2008Inventors: Kevin D. Dix, David Elston Brown, Christopher A. Lauff, Fang Huang Tu, M. Mushtaq Ahmed, Steven James Borkman
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Publication number: 20080215256Abstract: A process of mapping piping systems associated with a refinery and petrochemical facilities is disclosed, which maps piping systems, which interconnect facility operating units with other operating units, utilities, distribution facilities and storage units. A system for aiding in the isolation of piping systems, operating units and other facility components is also disclosed. The system includes a search database having representations of the piping systems and its related components. A method of isolating an event within a facility is also disclosed. The method includes identifying the location of an event in the facility, performing a search to identify the impacted piping systems and related components, and identifying measures to isolate the event.Type: ApplicationFiled: September 11, 2007Publication date: September 4, 2008Inventors: Susan C. Hill, Elvis L. Calhoun, William M. Castro
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Patent number: 7398698Abstract: A system and method for identifying defects in a repair patch applied to a structure are provided. The system includes a sheet of material configured to be attached to the structure, and a mechanism operable to generate stress waves within and along the sheet of material. The system also includes a plurality of non-destructive sensors carried by the sheet of material. Each sensor is capable of detecting the stress waves. The system further includes a data acquisition system capable of communicating with the sensors such that the data acquisition system is also capable of generating information indicative of at least a portion of the sheet of material based on the data detected by the sensors.Type: GrantFiled: November 3, 2005Date of Patent: July 15, 2008Assignee: The Boeing CompanyInventors: Kenneth H. Griess, Gary E. Georgeson
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Publication number: 20080167825Abstract: Methods for facilitating pipeline management, systems, and software, are provided. A method can include forming digitized map segments to provide for display of a geographical relationship between terrain featured in the map segments and a pipeline network, forming pipeline equipment records to provide for detailed engineering analysis on associated pipeline equipment, functionally linking each digitized map segment and each pipeline equipment record to at least one pipeline operational area geographically associated therewith, at least one pipeline geographically associated therewith, or both, and spatially displaying a pipeline equipment work location in relation to one of the map segments.Type: ApplicationFiled: March 24, 2008Publication date: July 10, 2008Applicant: Saudi Arabian Oil CompanyInventors: Thamer K. Tarabzouni, Abdulaziz K. Al-Mejna, Howard Wood
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Patent number: 7376519Abstract: A method for determining damage in a structural health monitoring system comprising a plurality of sensors distributed across a structure is disclosed. The method includes decomposing the plurality of sensors into a plurality of sub-arrays. Each sub-array is associated with a current sensor. For each sub-array, data is collected, the data corresponding to electrical signals produced by waves initiated by the current sensor and detected by a receiving sensor. The data is used to calculate a damage measurement for the sub-array. Then, the damage measurement determined for each sub-array is combined to determining an overall damage assessment from the combined damage measurements.Type: GrantFiled: October 29, 2004Date of Patent: May 20, 2008Assignee: Honeywell International Inc.Inventors: Brent A. Morin, Grant A. Gordon, Joseph J. Nutaro, Steven R. Thompson
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Patent number: 7356444Abstract: An apparatus providing a means for assessment of the integrity of insulated conduits, harnesses, cables, pipelines and other interconnection systems constructed with integral sensitized media, discrete sensors, and electronics providing a means for transforming sensed data into information and a means for communicating information for the purpose of understanding the location, degree and risk of damage and deterioration, and the probable causes thereof.Type: GrantFiled: June 26, 2006Date of Patent: April 8, 2008Inventor: Kenneth Gerald Blemel
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Patent number: 7353609Abstract: The invention discloses differing embodiments of methods for checking the location or potential location of one or holes in structure relative to edges, fillets, and thickness changes. The area in the vicinity of the hole may be checked in order to determine whether the location or potential location of the hole meets a pre-determined threshold. If the location or potential location of the hole does not meet the pre-determined threshold, the hole may be flagged as being a potential problem. In such manner, the suitability of the hole for insertion of a fastener device may be determined. In other embodiments, apparatus are disclosed having one or more fastener devices extending through one or more holes in a structure. The location of the one or more holes may have been approved for insertion of the one or more fastener devices utilizing a pre-determined threshold standard.Type: GrantFiled: May 19, 2006Date of Patent: April 8, 2008Assignee: Boeing CompanyInventors: Paul Charles Hollingshead, Brandon Heath Wegge
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Patent number: 7334485Abstract: A method, system and computer product for detecting the location of a deformation of a structure includes baselining a defined energy transmitting characteristic for each of the plurality of laterally adjacent conductors attached to the structure. Each of the plurality of conductors includes a plurality of segments coupled in series and having an associated unit value representative of the defined energy transmitting characteristic. The plurality of laterally adjacent conductors includes a plurality of identity groups with each identity group including at least one of the plurality of segments from each of the plurality of conductors. Each of the plurality of conductors are monitored for a difference in the defined energy transmitting characteristic when compared with a baseline energy transmitting characteristic for each of the plurality of conductors. When the difference exceeds a threshold value, a location of the deformation along the structure is calculated.Type: GrantFiled: May 26, 2005Date of Patent: February 26, 2008Assignee: Battelle Energy Alliance, LLCInventors: Matthew T. Weseman, David T. Rohrbaugh, John G. Richardson
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Patent number: 7308367Abstract: A method and system for identifying a defect or contamination on a surface of a material. The method and system involves providing a material, such as a semiconductor wafer, using a non-vibrating contact potential difference sensor to scan the wafer, generate contact potential difference data and processing that data to identify a pattern characteristic of the defect or contamination.Type: GrantFiled: February 3, 2004Date of Patent: December 11, 2007Assignee: Qcept Technologies, Inc.Inventors: M. Brandon Steele, Jeffrey Alan Hawthorne, Chunho Kim, David C. Sowell
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Publication number: 20070260406Abstract: An automated location system that includes providing the number of rows and columns of a receptacle to the automated location system; scanning the receptacle to determine changes in reflectivity; creating an X values list and a Y values list from the scan; and determining a location for each of a cavity from the X values list and from the Y values list.Type: ApplicationFiled: May 2, 2007Publication date: November 8, 2007Applicant: DATA I/O CORPORATIONInventors: Simon B. Johnson, Lev M. Bolotin, Bradley Morris Johnson
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Patent number: 7289913Abstract: Local features such as cracks in materials are nondestructively characterized by measuring a response with an electromagnetic sensor and converting this response into a selected property using a database. The database is generated prior to data acquisition by using a model to generate a baseline response or field distribution for the sensor and combining these results with another model, which may be simpler than the first model or provide a local representation of the field perturbations around a feature, which is evaluated multiple times over a range of values of the selected property. In addition, the presence of a feature may be detected by converting the sensor response into a reference parameter, such as a lift-off factor that reflects the sensor position relative to a material edge, and using this parameter to determine a reference response that can be compared to the measured response.Type: GrantFiled: October 11, 2005Date of Patent: October 30, 2007Assignee: JENTEK Sensors, Inc.Inventors: Darrell E. Schlicker, Neil J. Goldfine, Andrew P. Washabaugh, Yanko K. Sheiretov, Mark D. Windoloski
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Patent number: 7277822Abstract: An apparatus providing a means for assessment of the integrity of insulated conduits, harnesses, cables, pipelines and other interconnection systems constructed with integral sensitized media, discrete sensors, and electronics providing a means for transforming sensed data into information and a means for communicating information for the purpose of understanding the location, degree and risk of damage and deterioration, and the probable causes thereof.Type: GrantFiled: September 28, 2001Date of Patent: October 2, 2007Inventor: Kenneth G. Blemel
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Patent number: 7266470Abstract: A method, that arbitrates when each of a plurality of sensors can perform an object detection procedure, assigns a different binary address to each sensor. Each bit in the binary address is sequentially selected. While a bit is selected, every sensor applies a signal to a communication link, which signal has a first or a second logic level as denoted by the value of the selected bit of that sensor's address. Those sensors applying the first logic level to the communication link determine if another sensor is applying the second logic level, in which case those proximity sensors suspend participation in the arbitration method. After all the bits have been selected, only one sensor remains active and that sensor is allowed to perform the object detection procedure. Thereafter, each proximity sensor resumes participation in the arbitration method with a different address and the process is repeated.Type: GrantFiled: January 17, 2007Date of Patent: September 4, 2007Assignee: Eaton CorporationInventor: John E. Fulmer
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Patent number: 7263446Abstract: A structural health management system is disclosed. The structural health management system comprises a zone of sensors. A first sensor data collector is coupled to a first subset of the sensors in the zone; and a second sensor data collector coupled to a second subset of the sensors in the zone. In the present invention, loss of a sensor data collector does not result in the loss of ability to perform nondestructive testing in an entire zone.Type: GrantFiled: October 29, 2004Date of Patent: August 28, 2007Assignee: Honeywell International, Inc.Inventors: Brent A. Morin, Joseph J. Nutaro, Nicholas J. Wilt, Steven R. Thompson
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Patent number: 7181356Abstract: The invention relates to a device that is used to analyse the structure of a material. The inventive device comprises: probe elements (5) which are used to (i) emit a wave, in the material, with emission delay laws that correspond to several simultaneous deviations and (ii) receive, on the different probe elements (5), signals from the refraction of said wave by the material; detection channels, each detection channel being connected to a probe element (5), in order to collect the refraction signals and to transmit same to data processing means (4); and delay circuits that apply a delay on each detection channel according to the reception delay laws which are predetermined and which correspond to the different deviations of the wave emitted. The invention also relates to an analysis method which can be used, in particular, on said device.Type: GrantFiled: September 26, 2002Date of Patent: February 20, 2007Assignee: Socomate InternationalInventor: Philippe Coperet
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Patent number: 7136714Abstract: Procedure for determining modifications made to an electronic card and methods of fabricating an electronic card and an item of equipment provided with an electronic card. According to the invention, a first diagram (S1) illustrating the electronic card, which includes the electronic components (CE1, CE2, CE3), ports (P1, P2), supply elements (A1) and connection means (L1 to L7) at a first moment is determined, a second diagram illustrating the electronic card at a second moment is determined, a class relating to a change is assigned to each entity in said diagrams, a visual identification attribute is associated with each entity, which is representative of its class, two images corresponding to the first and second diagrams are constructed with the visual identification attributes being displayed, and said images are compared in order to deduce therefrom the modifications made to the electronic card between the first and second moments.Type: GrantFiled: October 29, 2004Date of Patent: November 14, 2006Assignee: Airbus FranceInventors: Philippe Alaux, Philippe Pons
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Patent number: 7127359Abstract: According to various embodiments, there is a method of inspecting semiconductor wafers comprising comparing a value for each wafer in a lot of wafers to a mathematical model, where the values include data about at least one feature on the wafers, and where the mathematical model comprises a threshold value corresponding to the at least one feature, and further where values greater than the threshold value comprise an indication of a spin defect. The method can also comprise determining whether any of the values of the wafers in the lot are not greater than the threshold value, grouping into a group (P) those wafers whose values are not greater than the threshold value, and flagging for further inspection those wafers having values greater than the threshold value.Type: GrantFiled: March 1, 2005Date of Patent: October 24, 2006Assignee: Texas Instruments IncorporatedInventors: Aditya Chityala, Errol Philip Akomer, Jason Charles Tervooren
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Patent number: 7120524Abstract: A carriage moves back and forth under a vehicle and three cameras or laser fixed along one axis pivot in a common plane, utilizing two cameras at time to locate a target fixed to a reference point on the undercarriage of the vehicle. Triangulation calculations, combined with the location of the cameras provide the location of the reference point in space in a three-dimensional coordinate system and compare that location with a stored designed location of the reference point prior to the crash, allowing the vehicle structure to be returned to its designed shape by other equipment.Type: GrantFiled: October 27, 2004Date of Patent: October 10, 2006Assignee: Matrix Electronic Measuring, L.P.Inventors: Robert W. Srack, Dwight Day
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Patent number: 7107158Abstract: A method and system for identifying a defect or contamination on a surface of a sample. The system operates by detecting changes in work function across a surface via both vCPD and nvCPD. It utilizes a non-vibrating contact potential difference (nvCPD) sensor for imaging work function variations over an entire sample. The data is differential in that it represents changes in the work function (or geometry or surface voltage) across the surface of a sample. A vCPD probe is used to determine absolute CPD data for specific points on the surface of the sample. The combination of vibrating and non-vibrating CPD measurement modes allows the rapid imaging of whole-sample uniformity, and the ability to detect the absolute work function at one or more points.Type: GrantFiled: March 11, 2005Date of Patent: September 12, 2006Assignee: Qcept Technologies, Inc.Inventors: M. Brandon Steele, Jeffrey Alan Hawthorne
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Patent number: 7103482Abstract: A method and system for identifying a defect or contamination on a surface of a material. The method and system involves providing a material, such as a semiconductor wafer, using a non-vibrating contact potential difference sensor to scan the wafer, generate contact potential difference data and processing that data to identify a pattern characteristic of the defect or contamination.Type: GrantFiled: August 5, 2004Date of Patent: September 5, 2006Assignee: Qcept Technologies, Inc.Inventors: M. Brandon Steele, Jeffrey Alan Hawthorne, Chunho Kim, David C. Sowell
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Patent number: 7092826Abstract: A method and system for identifying a defect or contamination on a surface of a material. The method and system involves providing a material, such as a semiconductor wafer, using a non-vibrating contact potential difference sensor to scan the wafer, generate contact potential difference data and processing that data to identify a pattern characteristic of the defect or contamination.Type: GrantFiled: June 17, 2005Date of Patent: August 15, 2006Assignee: Qcept Technologies, Inc.Inventors: M. Brandon Steele, Jeffrey Alan Hawthorne
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Patent number: 7082370Abstract: Automated localization of a point source of a visualized gas leak, by searching in a corner response function crƒ(x*,y*,?), calculated based on a number of frames of the gas leak, for maximum values in the (x*,y*) variables that are stable over the time variable ?. Considering a point (x*,y*) as the point source if the corner response function crƒ(x*,y*,?) has a maximum value in the point (x*,y*) and the point (x*,y*) is temporally stable.Type: GrantFiled: July 8, 2004Date of Patent: July 25, 2006Assignee: Gasoptics Sweden ABInventors: Björn Ardö, Tomas Christiansson, Jonas Sandsten
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Patent number: 7080555Abstract: A distributed real time health monitoring system is described for monitoring of acoustic emission signals from different regions of a structure such as aircraft or spacecraft structures. The health monitoring system has its analysis and prognosis intelligence distributed out to the local regions being monitored and therefore does not require extensive cabling systems to carry the high bandwidth information characteristic of acoustic emission.Type: GrantFiled: June 4, 2004Date of Patent: July 25, 2006Assignee: Texas Research International, Inc.Inventors: Russell K. Austin, Chris Coughlin
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Patent number: 7069155Abstract: The present invention generally relates to semiconductor processing, and in particular to methods and systems for analyzing photolithographic reticle defects that include detecting soft defects on a reticle and analyzing the material composition of the defects for a particular chemical signature. Specifically, the present invention scans and images a soft defect via an optical inspection scan of a reticle, mills the defect using a Focused Ion Beam, and analyzes the defect for signatures using Electron Spectroscopy for Chemical Analysis and/or Fourier Transform Infrared Spectroscopy. The present invention thus provides for real-time analysis of the chemical composition of a soft defect on a reticle without the need for a defect identification navigation system. According to an aspect of the present invention, reticle defects can be monitored without removal of a pellicle, thus facilitating increased throughput and decreased cost in reticle repair and/or cleaning.Type: GrantFiled: October 1, 2003Date of Patent: June 27, 2006Assignee: Advanced Micro Devices, Inc.Inventors: Khoi Phan, Bhanwar Singh, Bharath Rangarajan
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Patent number: 7047151Abstract: A system and method for detecting defects of objects based on a CAD (Computer-Aided Design) platform includes a measurement apparatus (10), an application server (12), and a database server (14). The application server includes a data acquiring module (120) for acquiring point cloud data of an object and acquiring a three-dimensional digital model of the object; a point cloud cutting (121) module for cleaning and editing the point cloud data; a point cloud filtering module (122) for filtering the point cloud data; a data aligning module (123) for aligning the point cloud data with the three-dimensional digital model of the object; a data comparing module (124) for comparing the point cloud data with the three-dimensional digital model of the object; and a report management module (125) for generating a color comparison report. A related method is also disclosed.Type: GrantFiled: May 28, 2004Date of Patent: May 16, 2006Assignee: Hon Hai Precision Ind. Co., LTDInventor: Chih-Kuang Chang