Display Of Waveform Patents (Class 702/67)
  • Patent number: 7561978
    Abstract: A method for determining the state of a battery includes receiving measurements representative of at least one of a battery terminal voltage and a battery terminal current from a first unit and using a second unit to determine at least one characteristic variable for a battery state from at least one of the measured battery terminal voltage and the measured battery current. The method also includes using a microprocessor to statistically assess the at least one characteristic variable for the battery state by performing a statistical process check. The method further includes defining an observation window for the at least one characteristic variable within which the at least one characteristic variable is assumed to be steady-state and identifying an implausible value, which is not caused by the battery, for the at least one characteristic variable if the scatter of the at least one characteristic variable exceeds a defined scatter limit.
    Type: Grant
    Filed: September 17, 2007
    Date of Patent: July 14, 2009
    Assignee: VB Autobatterie GmbH & Co. KGaA
    Inventors: Ingo Koch, Eberhard Meissner
  • Patent number: 7558686
    Abstract: Disclosed is a signal analyzer that can receive a signal generated by an external system. The signal has a plurality of frequency components. The signal analyzer generates a suppressed phasor domain representation of the signal by selectively removing at least one component for use as a reference. The signal analyzer then displays the suppressed phasor domain representation of the signal. In one embodiment, the signal analyzer removes the component of greatest magnitude. The signal analyzer can also (or alternatively) remove a user selected component. In addition to the suppressed phasor domain, the signal analyzer can simultaneously display the frequency domain, the time domain, the numerical domain, and/or the modulation domain.
    Type: Grant
    Filed: December 2, 2005
    Date of Patent: July 7, 2009
    Assignee: Veritium Research LLC
    Inventor: Gino F. Morello
  • Patent number: 7555394
    Abstract: A single chip integrated circuit measuring circuit (1) for determining a characteristic of the impedance of an external complex impedance circuit (2) for facilitating characterization of the impedance of the complex impedance circuit (2) comprises a signal generating circuit (7) for generating a variable frequency stimulus signal for applying to the complex impedance circuit (2). A first receiving circuit (10) receives a response signal from the complex impedance circuit (2) in response to the stimulus signal and conditions the response signal. A first analog-to-digital converter (68) converts the conditioned response signal to a first digital output signal, which is read from the first analog-to-digital converter (68) through a first digital output port (14). The response signal from the complex impedance circuit (2) is a current signal, and a current to voltage converter circuit (64) converts the response signal to a voltage signal.
    Type: Grant
    Filed: July 24, 2006
    Date of Patent: June 30, 2009
    Assignee: Analog Devices, Inc.
    Inventors: James F. Caffrey, Colm F. Slattery, Albert C. O'Grady, Colin Gerard Lyden, Donal P. Geraghty, Sean Smith
  • Publication number: 20090105976
    Abstract: An automatic jitter measurement method for an oscilloscope is provided. The method includes: establishing a database in a data processing unit, in which the step of establishing the database includes establishing at least a horizontal delay parameter and a horizontal scale parameter; enabling the oscilloscope for fetching a test signal, according to the horizontal delay parameter and the horizontal scale parameter; enabling a signal accumulation function of the oscilloscope for obtaining a signal accumulation maximum position value and a signal accumulation minimum position value of the test signal; and adjusting a display position of the test signal on the oscilloscope to obtain a jitter value of the test signal according to the signal accumulation maximum position value and the signal accumulation minimum position value.
    Type: Application
    Filed: October 20, 2008
    Publication date: April 23, 2009
    Applicant: ASUSTEK COMPUTER INC.
    Inventor: Shang-Yi Wang
  • Publication number: 20090070054
    Abstract: A method and an apparatus are provided for performing waveform analysis on physiological parameters. In one embodiment, a method includes reading measurement values of a first physiological parameter relating to time, and displaying them as a trend display graph in a trend display area that includes first coordinates representing time and second coordinates representing the measurement values. The method also includes acquiring a time selected in the trend display graph, and displaying, in a waveform display area, waveform data of a second physiological parameter associated with formation of the first physiological parameter during periods before and after the selected time. The waveform display area includes time coordinates. The disclosed embodiments allow medical staff to view the curve of a patient's physiological parameters throughout a monitoring/therapy period.
    Type: Application
    Filed: December 27, 2007
    Publication date: March 12, 2009
    Applicant: SHENZHEN MINDRAY BIO-MEDICAL ELECTRONICS CO., LTD.
    Inventors: Lingbo Zeng, Dazhi Teng, Saixin Zhou, Lin Tan, Qi Wang
  • Patent number: 7493223
    Abstract: A method of pattern identification and bit level measurements for a high speed digital signal using an oscilloscope converts an input waveform into a bit stream sequence. From the bit stream sequence pre-defined patterns are identified and overlaid on each other to form a superimposed pattern. A center region for each bit of the superimposed pattern is identified, and appropriate voltage measurements within the respective center regions are taken for the bit levels.
    Type: Grant
    Filed: August 2, 2005
    Date of Patent: February 17, 2009
    Assignee: Tektronix, Inc.
    Inventors: Saumitra Kayal, Manisha Ajgaonkar
  • Patent number: 7489963
    Abstract: A method and apparatus of correcting a data signal sampled at a first rate to a data signal displayed on a video monitor at a second rate is claimed. A data signal is received at a first rate. The data signal is separated into data windows. The minimum and maximum values and positions of data points in data windows are identified relative to a reference, and displayed on a video monitor.
    Type: Grant
    Filed: June 23, 2006
    Date of Patent: February 10, 2009
    Assignee: GE Medical Systems Information Technologies, Inc.
    Inventor: John H. Radeztsky
  • Patent number: 7483477
    Abstract: Eye diagrams are made for signals on each channel in a group. Outlying signals not exhibiting overlap for a sampling parameter common for all channels may be ignored and a warning given. Selected, normalized eye openings are used to discover optimum sampling parameters for each channel. Locations within each eye opening are ranked according to preference. Algorithms are used to select a single best value for a sampling parameter common to all the channels, and the corresponding best other sampling parameter is found for each channel. One algorithm disregards good choices for many channels to accommodate any remaining channel by using only a commonly agreed upon value (a jury system). Another algorithm gives weight to a choice according to the number of channels that agree on that choice (majority rule). A graphical user interface facilitates the selection, and emphasizes which sampling parameters are constrained to vary together.
    Type: Grant
    Filed: April 27, 2005
    Date of Patent: January 27, 2009
    Assignee: Agilent Technologies, Inc.
    Inventor: Richard A Nygaard, Jr.
  • Publication number: 20090024341
    Abstract: A system for analyzing non-monotonic of signals is provided. The system is configured for receiving a signal and displaying changes of the signal using a waveform curve. The system is configured for analyzing data of the signals and the waveform curve in order to locate peak points on the waveform curve. The system is also configured for storing the signal data and data generated during the analyzing process. A related method is also provided.
    Type: Application
    Filed: July 13, 2008
    Publication date: January 22, 2009
    Applicant: HON HAI PRECISION INDUSTRY CO., LTD.
    Inventors: SHEN-CHUN LI, SHOU-KUO HSU, WEI-YUAN CHEN, CHO-HAO WANG, KUAN-LIN WU, HUNG CHAO
  • Patent number: 7480839
    Abstract: A circuit and method of qualified anomaly detection provides detection and triggering on specific analog anomalies and/or digital data within a qualified area of a serial data stream. A start pattern within the serial data stream, such as a packet header, is detected to generate an enable signal. A stop event, such as a packet trailer, a specified digital event, a time interval or the like, is identified to generate a disable signal. The enable and disable signals are combined to produce a qualification signal that allows a trigger circuit to trigger on a specified anomaly within the portion of the serial data stream defined by the qualification signal.
    Type: Grant
    Filed: December 8, 2005
    Date of Patent: January 20, 2009
    Assignee: Tektronix, Inc.
    Inventors: Patrick A. Smith, Roland E. Wanzenried
  • Patent number: 7460967
    Abstract: Events discovered by an automatic measurement subsystem in the trace of a DSO are visited using a set of event navigation controls. In a TIME Mode the controls operate to display the first of those events, display the next event after the one currently displayed, display the previous event before the one currently displayed, and, display the last event. In a SEVERITY Mode the controls operate to display the best of those events, display the next best event relative to the one currently displayed, display the next worst event before the one currently displayed, and, display the worst event. The sets of navigation controls may be a mode control menu accompanied by four stylized arrow shaped buttons within a GUI that are clicked on by an operator using a mouse. One set of arrow shaped button can serve both modes, or different sets of buttons can serve each respective mode.
    Type: Grant
    Filed: June 28, 2006
    Date of Patent: December 2, 2008
    Assignee: Agilent Technologies, Inc.
    Inventor: Christopher P Duff
  • Patent number: 7451048
    Abstract: A merging unit merges partial models into an entire model, and divides a grid of a parent hierarchy into grids of a child hierarchy based on hierarchical relationship of partial models, and an object selecting unit divides a grid of an object inclusion domain that includes an object selected from the entire model by a user to create a sub grid domain, and a domain selecting unit divides a grid of a domain selected from the entire model by the user to create the sub grid domain.
    Type: Grant
    Filed: January 26, 2005
    Date of Patent: November 11, 2008
    Assignee: Fujitsu Limited
    Inventors: Kenji Nagase, Sekiji Nishino, Takashi Yamagajou, Takefumi Namiki, Tetsuyuki Kubota
  • Patent number: 7451049
    Abstract: In one embodiment, a system comprises a delay determining unit that may be operable to determine a relative delay between the first signal provided by the first source and the second signal provided by the second source, based upon a travel path of the first signal and a travel path of the second signal. In addition, a delay circuit, comprised within the waveform generator, may be configured to be programmed to delay output of the first signal to output the first signal at a predetermined position with respect to output of the second signal, based on the determined relative delay. More specifically, in one embodiment, the delay circuit may be configured to be automatically programmed to add the relative delay to the output of the first signal to automatically align the output of the first signal with respect to the output of the second signal.
    Type: Grant
    Filed: March 15, 2004
    Date of Patent: November 11, 2008
    Assignee: National Instruments Corporation
    Inventors: Neil S. Feiereisel, Craig M. Conway
  • Publication number: 20080270054
    Abstract: An approach is provided for digital triggering a recording of one or several signals sampled at individual sampling instants on a digital oscilloscope. The triggering is carried out when the interval between two recurrent triggering events is less or greater than a time threshold value.
    Type: Application
    Filed: June 30, 2006
    Publication date: October 30, 2008
    Applicant: Rohde & Schwarz GmbH & Co. KG
    Inventors: Markus Freidhof, Johann Huber
  • Patent number: 7443912
    Abstract: In order to display the amplitude distortions of a transmission channel, the amplitude distribution of a measurement signal of a known amplitude distribution is measured at the output of the transmission channel. Based on a given multitude of amplitude measured values that are measured and digitized in succession, the frequency of occurrence of the amplitude distribution is then determined and displayed in adjacently connected amplitude windows.
    Type: Grant
    Filed: January 16, 2001
    Date of Patent: October 28, 2008
    Assignee: Rohde & Schwarz GmbH & Co. KG
    Inventors: Christoph Balz, Wolfgang Feicht
  • Publication number: 20080262765
    Abstract: The method for a test and measurement instrument includes the steps of: providing a test and measurement instrument; attaching a Device Under Test (DUT) to a signal source to be measured with at least one channel of the signal source in electronic communication with at least one of the acquisition modules; collecting data from the DUT; storing the collected data from the DUT in the acquisition module(s); dividing the collected data from the DUT into a plurality of pieces; assigning the plurality of pieces to the plurality of system buses; transferring the plurality of pieces to the memory connected to the processors by moving the plurality of pieces in parallel over their assigned system buses; processing the plurality of pieces with the plurality of processors; and displaying the results obtained by processing the priority of pieces with the plurality of processors.
    Type: Application
    Filed: March 19, 2008
    Publication date: October 23, 2008
    Applicant: Tektronix, Inc.
    Inventor: Mehrab S. Sedeh
  • Publication number: 20080262767
    Abstract: Apparatuses for a test and measurement instrument provide a scalable test and measurement instrument capable of handling the acquisition, transfer, analysis, and display of large quantities of waveform data as well as complex waveforms. The apparatus for a test and measurement instrument consists of multiple processors with memory connected to the processors. There are multiple bridges with each processor being connected to its own bridge. There are multiple system buses with each bridge been connected to its own system bus. There are multiple acquisition modules having signal bus interfaces with each system bus being connected to its own acquisition module and having its own acquisition hardware. Each piece of acquisition hardware is a direct memory access machine that can transfer data to any portion of the memory. There are multiple signal sources with each signal source being connected to its own signal bus interface.
    Type: Application
    Filed: March 19, 2008
    Publication date: October 23, 2008
    Applicant: Tektronix, Inc.
    Inventor: Mehrab S. SEDEH
  • Publication number: 20080262766
    Abstract: Apparatuses for a test and measurement instrument provide an instrument capable of handling acquisition, transfer, analysis, and display of large quantities of waveform data and complex waveforms. The apparatus includes multiple processors with each processor being connected to its own memory controller, wherein each memory controller is connected to its own memory. Each processor is connected to its own respective bridge, and each respective bridge is connected to its own respective system bus. Each respective system bus is connected to its own respective acquisition module having its own acquisition hardware. Each piece of acquisition hardware is a direct memory access machine that can transfer data to any portion of the memory. Each of multiple signal sources is connected to its own signal bus interface.
    Type: Application
    Filed: March 19, 2008
    Publication date: October 23, 2008
    Applicant: Tektronix, Inc.
    Inventor: Mehrab S. Sedeh
  • Publication number: 20080262764
    Abstract: Apparatuses for a test and measurement instrument provide an instrument capable of handling acquisition, transfer, analysis, and display of large quantities of waveform data and complex waveforms. The apparatus for a test and measurement instrument consists of multiple processors with each processor being connected to its own memory controller. Each memory controller is connected to its own memory. The processors are connected in a circular arrangement by multiple high-speed interconnects. A bridge is connected to at least the first and last processors. A system bus connects the bridge to an acquisition module. The acquisition module has a signal bus interface with the system bus being connected to the acquisition module and having its own acquisition hardware. The acquisition hardware is a direct memory access machine that can transfer data to any portion of the memory. There is a signal source connected to the signal bus interface.
    Type: Application
    Filed: March 19, 2008
    Publication date: October 23, 2008
    Applicant: TEKTRONIX, INC.
    Inventor: Mehrab S. SEDEH
  • Publication number: 20080255784
    Abstract: A method and apparatus for capturing an analog waveform on a serial bus. The method comprises the steps of designating a predetermined digital data sequence, decoding a serial data signal carried on a serial data bus, and comparing the decoded serial data signal to the predetermined digital data sequence. When it is determined that a portion of the decoded serial data matches the predetermined digital data sequence, the portion of the serial data signal corresponding to the matching portion of the decoded serial data signal is marked.
    Type: Application
    Filed: June 20, 2008
    Publication date: October 16, 2008
    Inventors: Roland Gamper, Kenneth William Johnson, Gilles Ritter, Lawrence Steven Salant
  • Publication number: 20080243409
    Abstract: The invention discloses a circuit testing apparatus for testing a device under test. The circuit testing apparatus includes a precision measurement unit, a signal transformation module, and a microprocessor. The precision measurement unit is coupled to the device under test for providing a testing signal and receiving a measurement signal generated according to the testing signal. The signal transformation module is coupled to the precision measurement unit for receiving the measurement signal and transforming the measurement signal to a signal measurement result according to a predetermined manner. The microprocessor is coupled to the precision measurement unit and the signal transformation module for examining the signal measurement result to determine a test result for the device under test.
    Type: Application
    Filed: May 31, 2007
    Publication date: October 2, 2008
    Inventors: Cheng-Yung Teng, Li-Jieu Hsu, Jie-Wei Huang, Huei-Huang Chen
  • Publication number: 20080215269
    Abstract: Systems and methods for signal analysis are described. The method can include digitizing a signal modulated by a pseudo noise (PN) sequence, dividing the digitized signal into a plurality of sample blocks, and estimating a PN phase embedded in a sample block of the plurality of sample blocks using an iterative message passing algorithm (iMPA) executed on a redundant graphical model.
    Type: Application
    Filed: April 20, 2007
    Publication date: September 4, 2008
    Applicant: UNIVERSITY OF SOUTHERN CALIFORNIA
    Inventors: Keith M. Chugg, On Wa Yeung
  • Publication number: 20080201092
    Abstract: A method and apparatus for displaying an audio signal as an improved waveform includes a processor for determining samples of the audio signal which represent a waveform based on positions of pixels in the waveform and a time scale of the waveform, calculating minimum and maximum amplitudes of the samples for each pixel on a time axis and calculating intensities of frequency components of the samples which cannot be represented at the time scale of the waveform. The apparatus includes a display coupled to be in communication with the processor for displaying the samples as an improved waveform of amplitude versus time wherein the intensities of the frequency components are represented in the new waveform by shades of a single colour.
    Type: Application
    Filed: August 22, 2006
    Publication date: August 21, 2008
    Inventor: Matthew Sean Connolly
  • Publication number: 20080189063
    Abstract: A signal generator device for generating at least one periodic signal for use in a data eye scan system. The signal generator comprises a clock input, at least one output and at least one signal generator coupled with the clock input and with the output. The signal generator is at least one token ring with a predetermined number of positions and is operable to propagate at least one token in the ring by moving the token from its current position to a following position dependent on a clock signal from the clock input. The signal generator further comprises a predetermined number of signal value units that each represent a respective predetermined signal value of a predetermined signal waveform and are operable to provide the signal value at an output of the signal generator dependent on a current position of the at least one token in the token ring.
    Type: Application
    Filed: October 13, 2007
    Publication date: August 7, 2008
    Applicant: Interantional Business Machines Corporation
    Inventors: Marcel A. Kossel, Martin Leo Schmatz
  • Patent number: 7405723
    Abstract: An apparatus for testing a display device includes a display device to display test patterns, a graphic process unit to supply analog mode signals and digital mode signals to the display device, and a control unit to allow test patterns of an analog testing mode and test patterns of a digital testing mode to be sequentially displayed on the display device upon receiving a control signal from the graphic process unit, and to output a control signal to the display device to sequentially change display characteristics of an image according to an on-screen-display mode testing menus.
    Type: Grant
    Filed: May 28, 2004
    Date of Patent: July 29, 2008
    Assignee: LG Display Co., Ltd.
    Inventors: Pil-Sung Kang, Hyun-Taek Nam
  • Publication number: 20080177489
    Abstract: A system and circuit for constructing a synchronous signal diagram from asynchronous sampled data provides a low cost and production-integrable technique for providing a signal diagram. The data signal is edge-detected and asynchronously sampled (or alternatively a clock signal is latched). The data signal or a second signal is compared to a settable threshold voltage and sampled. The edge and comparison data are folded according to a swept timebase to find a minimum jitter period. The crossing of the signal diagram edges is determined from a peak of a histogram of the folded edge data. A histogram of ratios of the sample values versus displacement from the position of the crossing location is generated for each threshold voltage. The technique is repeated over a range of settable threshold voltages. Then, the ratio counts are differentiated across the histograms with respect to threshold voltage, from which a signal diagram is populated.
    Type: Application
    Filed: March 26, 2008
    Publication date: July 24, 2008
    Inventors: Hayden C. Cranford, Fadi H. Gebara, Jeremy D. Schaub
  • Patent number: 7401007
    Abstract: A method for rapidly extracting data file samples with an a signal monitor and an automatically adjusted decimation ratio is provided to solve the long-standing problems caused by large data files and small buffers by reducing a large data segment to a smaller, more manageable size automatically so that a lower resolution version of the data segment will be loaded into a fixed-size small buffer in the computer's working space buffer for further data editing. In accordance with the methods of this invention, the segment size will vary during the operation of a means for zooming-in and the decimation ratio is updated and adjusted automatically based on the variation of segment size. The present invention insures that the best resolution of the data segment will be achieved when fitting the varying large size data segment into the fixed small size buffer.
    Type: Grant
    Filed: February 28, 2007
    Date of Patent: July 15, 2008
    Assignee: The United States of America as represented by the Secretary of the Army
    Inventor: Wei Su
  • Patent number: 7386406
    Abstract: An original composite eye diagram is reformulated by deliberately re-aligning its component eye diagrams according to some appropriate standard. This ‘forced-alignment’ shifts the components in one or both of the time and voltage axes. Notice is taken of the shift(s) for each channel, and that shift data is appended to the data structures for the original components. The content of the data structure can be read in its original form, or, read and force-aligned. A force-aligned composite eye diagram created from the re-aligned components can then be displayed, investigated and evaluated with any of the existing tools that used to analyze eye diagrams, simply by instructing the process that read a component eye diagram structure to reform that component as it is being read.
    Type: Grant
    Filed: October 31, 2003
    Date of Patent: June 10, 2008
    Assignee: Agilent Technologies, Inc.
    Inventor: Richard A. Nygaard, Jr.
  • Patent number: 7379830
    Abstract: A method and apparatus for determining the period Tp of a signal representing a digitally modulated waveform using NRZ coding with a discrete/integer number of a clock periods between signal transitions, where a periodic sequence of logic “1s” and logic “0s” is transmitted. The method samples an input periodic signal, constructs an estimate of the autocorrelation sequence rk of the sequence of samples, constructs a sequence of peaks pk, and computes the period Tp to be the time between the first pk sample (k=0), and the time location of the maximum value of pk based on the known Ts spacing of the pk sequence samples.
    Type: Grant
    Filed: May 24, 2005
    Date of Patent: May 27, 2008
    Assignee: Tektronix, Inc.
    Inventor: Dan Onu
  • Publication number: 20080120051
    Abstract: A method of analyzing patterns. The method comprises: receiving a first diffraction pattern; receiving a second diffraction pattern; receiving a third diffraction pattern; determining a similarity between the first and second diffraction patterns; determining a similarity between the first and third diffraction pattern; determining a similarity between the second and third diffraction pattern; and performing hierarchical cluster analysis on the first and second diffraction pattern based on the determined similarity.
    Type: Application
    Filed: November 6, 2007
    Publication date: May 22, 2008
    Inventors: Igor IVANISEVIC, Simon Bates, David E. Bugay, Barbara C. Stahly, Donald R. Hallenbeck
  • Patent number: 7373263
    Abstract: A logic analyzer that performs analog-type measurements on digital data includes circuitry in its acquisition system that is programmable to search through acquired data to detect analog-type signal characteristics. In a first embodiment, the logic analyzer includes a graphical user interface employing a drag-and-drop operation to apply one or more selected analog-type measurements to selected portions of the digital data record. In a second embodiment, a user may designate a particular waveform or data listing by means of a mouse-click. Each of the choices of analog-type measurements can be represented by an icon, or text, or both icon and text.
    Type: Grant
    Filed: May 16, 2006
    Date of Patent: May 13, 2008
    Assignee: Tektronix, Inx.
    Inventors: Robert C. Cohn, Susan C. Adam, Mark A. Briscoe, Andrew Loofburrow, Eric E. Thums
  • Publication number: 20080103712
    Abstract: A diagnosis apparatus for a switchgear comprises a sensing unit which detects a partial discharge signal of the switchgear, an amplifying unit which amplifies the partial discharge signal detected from the sensing unit, a frequency spectrum generation unit which converts the amplified partial discharge signal into a frequency spectrum; and an analysis-diagnosis unit which analyzes and diagnoses the frequency spectrum.
    Type: Application
    Filed: October 31, 2007
    Publication date: May 1, 2008
    Applicants: Korea Electric Power Corporation, LS Industrial Systems Co., Ltd.
    Inventors: Dong-Myung KIM, Tae-Ho Kwon, Sun-kyu Choi, Young-Geun Kim, Do-Hoon Lee
  • Patent number: 7359810
    Abstract: A method of characterizing a newly acquired waveform with respect to previously acquired waveforms during monitoring of a generally repetitive signal, where the previously acquired waveforms have been rasterized into a two-dimensional array of memory locations, reads history values for those memory locations associated with an active portion of the newly acquired waveform, compares the history values with history value ranges, increments a count for one of a plurality of recent pixel counters corresponding to the history value ranges, each counter having a different history value range, and modifies the history values in the memory locations. From the counts accumulated for each of the history value ranges the variability of the newly acquired waveform from the generally repetitive signal is determined.
    Type: Grant
    Filed: March 18, 2005
    Date of Patent: April 15, 2008
    Assignee: Tektronix, Inc.
    Inventors: Peter J. Letts, Kenneth P. Dobyns, Paul M. Gerlach, Kristie Veith
  • Publication number: 20080080854
    Abstract: Monitoring a demodulator includes repeating the following for each demodulating module of one or more demodulating modules of a demodulator: receiving a first signal and a second signal from a demodulating module; introducing a relative delay between the first signal and the second signal; and asynchronously sampling the first signal and the second signal to yield samples. Image data representing the samples associated with the demodulating modules is generated. The image data indicates one or more mismatches of the demodulator.
    Type: Application
    Filed: October 3, 2006
    Publication date: April 3, 2008
    Inventors: Cechan Tian, Takao Naito
  • Patent number: 7353137
    Abstract: A shoe-based weight measuring system, comprising: a shoe; one or more weight sensitive detectors constructed and arranged with the shoe to sense weight of a person wearing the shoe and walking or standing; a processor for processing signals from the detectors to determine a weight of the person; a remote receiver; and a communications port for wirelessly communicating the weight to the remote receiver. An on demand weight system, comprising a weight detector coupled with a shoe for sensing weight of a person on the detector, a processor processing information from the detector for determining applied weight, a personal data display, and a communications port for wirelessly relaying the applied weight to the data display.
    Type: Grant
    Filed: December 28, 2006
    Date of Patent: April 1, 2008
    Assignee: PhatRat Technology, LLC
    Inventors: Curtis A. Vock, Burl W. Amsbury, Eric R. Edstrom, Robert Muir Holme, Paul Jonjak, Adrian F. Larkin, Perry Youngs
  • Publication number: 20080077341
    Abstract: Disclosed is a system for transmitting dynamic data over a network to a computer resource, the system including at least one receiver configured to receive dynamic data and convert dynamic data into a digitized sinusoidal signal, and a computing resource configured for communication with the network and configured to receive the digitized sinusoidal signal from the at least one receiver, the computing resource configured to employ a Fast Fourier Transform to convert the digitized sinusoidal signal into output data that includes phase data, amplitude data, and frequency data of the digitized sinusoidal signal, the output data being transmittable over the network in at least one packet.
    Type: Application
    Filed: September 27, 2006
    Publication date: March 27, 2008
    Applicant: GENERAL ELECTRIC COMPANY
    Inventors: Ralph Eugene Bush, Nurettin Tevfik Cankurt, Nishchey Chhabra, David Anthony Gottler, Jerry Anthony Muolo
  • Patent number: 7346464
    Abstract: A gait waveform feature extracting method and an individual identification system extract features of the gait waveform. A one-step waveform corresponding to one step of a walking movement is specified using, as an index, a peak amplitude corresponding to a state where substantially a whole bottom surface of one foot is in contact with the ground and a toe of the other foot is just after leaving the ground among the electric field displacement formed on the human body in accordance with the human body's walking movements. Based on the specified one-step waveform, the features of the one-step waveform are extracted, so that the peak amplitude appears without influence from electric-charge interference between the right and left legs. Accordingly, the one-step waveform reflects the actual one step of the walking movement, and therefore, the features of the one-step waveform can be precisely extracted.
    Type: Grant
    Filed: October 28, 2003
    Date of Patent: March 18, 2008
    Assignee: Sony Corporation
    Inventor: Kiyoaki Takiguchi
  • Patent number: 7340358
    Abstract: A measurement equipment has a polygonal line processing section and a computational processing section. The polygonal line processing section produces a polygonal line pattern signal based on a predetermined polygonal line pattern having a polygonal line value that varies according to a polygonal line time and a timer processing for the polygonal line time. The computational processing section executes a computational processing with using an external input signal and the polygonal line pattern signal.
    Type: Grant
    Filed: December 7, 2005
    Date of Patent: March 4, 2008
    Assignee: Yokogawa Electric Corporation
    Inventor: Toshiaki Yoneyama
  • Patent number: 7324903
    Abstract: A signal quality measuring method and apparatus in which a quality of a signal detected from an RF signal read out from a disk or a communications channel is measured by using eye pattern signals of the detected RF signals. Eye pattern signals representing time change of a waveform of the detected signal are generated and a signal quality value is generated based on an eye depth and/or an eye width measured from the eye pattern signals. A histogram of the eye pattern signals is used to identify a plurality of main level values which are used as a reference value in measuring the signal quality. Accordingly, signal characteristics in a high-density storage medium system or communication system may be accurately represented.
    Type: Grant
    Filed: August 17, 2004
    Date of Patent: January 29, 2008
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Eing-seob Cho, Jae-song Shim, Hyun-soo Park, Jae-wook Lee, Jung-hyun Lee, Eun-jin Ryu
  • Patent number: 7301484
    Abstract: A method, apparatus and computer program for decoding a data stream. The method comprises the steps of acquiring an analog data signal, determining an initial polarity of the analog data signal, determining a threshold transition level, determining a plurality of transition edges where the analog data signal crosses the threshold transition level, and determining the number of unit intervals between each pair of transition edges. A binary value is assigned to each of the unit intervals, and the binary values are displayed to a user.
    Type: Grant
    Filed: November 1, 2005
    Date of Patent: November 27, 2007
    Assignee: Lecroy Corporation
    Inventor: Michael G Hertz
  • Patent number: 7299146
    Abstract: A method is disclosed to calibrate a system receiving an input signal and generating an output signal. The method provides an input signal, and generates an output signal. The method establishes a sampling rate comprising a reference frequency, samples the input signal at said sampling rate, and samples the output signal at the sampling rate. The method then forms a measured input signal waveform, forms a measured output signal waveform, determines at (P) harmonics of the reference frequency the real components and the imaginary components of the measured input signal waveform, forms a filtered input signal waveform, determines at (P) harmonics of the reference frequency the real components and imaginary components of the measured output signal waveform, and forms a filtered output signal waveform.
    Type: Grant
    Filed: January 4, 2005
    Date of Patent: November 20, 2007
    Assignee: International Business Machines Corporation
    Inventor: Alex Chliwnyj
  • Patent number: 7295938
    Abstract: In a voltage drop analysis step S101, the process calculates a temporal variation of a power source voltage supplied to each cell along a transmission path of a clock signal. In a delay variation rate ratio calculation step S102, the process calculates a delay time variation of each cell according to the power source voltage variation. In a clock delay variation amount calculation step S103, the process obtains the magnitude of jitter of the clock signal based on the delay time variation.
    Type: Grant
    Filed: March 30, 2006
    Date of Patent: November 13, 2007
    Assignee: Matsushita Electric Industrial Co., Ltd.
    Inventors: Takafumi Nakashiba, Takahiro Ochi, Mitsuko Takada
  • Patent number: 7268783
    Abstract: Image alias rejection when converting a high resolution rasterized waveform to a lower resolution rasterized waveform for display uses a statistical filter. The statistical filter provides a shaped probability density function either by combining the outputs of multiple random number generators, such as linear feedback shift registers, or by using a corresponding look-up table to produce a dither signal. The statistical filter may be applied to one or both of the dimensional values for each data point of the high resolution rasterized waveform by combining the dimensional values with the dither signal. The resulting filtered dimensional values may then be subsampled, such as by truncation, to produce values for a lower resolution rasterized waveform display.
    Type: Grant
    Filed: November 21, 2001
    Date of Patent: September 11, 2007
    Assignee: Tektronix, Inc.
    Inventors: Robert W. Parish, Scott E. Zink, Evan Albright
  • Patent number: 7260489
    Abstract: A method of displaying multi-channel waveforms including the steps of: dividing at least one waveform screen in a video memory which is mapped to a display terminal into a plurality of waveform windows, wherein boundaries of each of the windows are defined by a plurality of values set in at least a set of boundary registers; establishing a waveform parameter table in a system memory; writing waveform data into a logical space in the waveform screen corresponding to a waveform by writing operations from CPU to the video memory; and based on parameters of the waveform windows in the waveform parameter table, performing a display mode defined by the parameter by means of changing the mapping relationship between the video memory and the display terminal, before transmitting the data of each of the waveform windows read out from the video memory to the display terminal.
    Type: Grant
    Filed: December 22, 2005
    Date of Patent: August 21, 2007
    Assignee: Shenzhen Mindray Bio-Medical Electronics Co., Ltd.
    Inventors: Li Yao, Wei Chen
  • Patent number: 7257499
    Abstract: In a method and an apparatus for determining a frequency for the sampling of an analog signal, which is provided to a digital screen for representing an image on the same, at least two areas succeeding in line direction will be established in the image to be displayed. In each of the established areas, a sample phase will be determined, for which a contrast in the established area is maximum or a minimum. Subsequently, a local course of the sample phase will be determined in the line direction based on the determined sample phases. The sampling frequency will be determined based on a base value and a modification value, which is derived from the local course of the sample phase.
    Type: Grant
    Filed: April 4, 2005
    Date of Patent: August 14, 2007
    Assignee: Koninklijke Philips Electronics N.V.
    Inventor: Martin Maier
  • Patent number: 7254500
    Abstract: A method of displaying signals containing a spatial and a temporal aspect, where multiple signals are received by multiple sensors. The received signals are decomposed into separate signal components within one or more distinct frequency bands. Signal components are isolated within each frequency band based on differences between the signal components within the same frequency band, and the signal components are displayed. The signal components may be analyzed to determine a time course of activity and a location of the associated source. Representations of the source may also be generated and displayed to aid in monitoring the signals.
    Type: Grant
    Filed: March 31, 2004
    Date of Patent: August 7, 2007
    Assignee: The Salk Institute for Biological Studies
    Inventors: Scott Makeig, Jörn Anemüller
  • Patent number: 7254498
    Abstract: A method and apparatus for selectively providing bandwidth extension and channel matching for acquired signals under test (SUT). The method and apparatus includes a signal acquisition device for acquiring a signal under test (SUT) and generating therefrom a stream of acquired samples, where the signal acquisition device having associated with it a first bandwidth defining a nominal pass band. At least one digital filter imparts a gain equalization function to the acquired SUT samples within a spectral region including and extending beyond the nominal passband. A controller generates a display signal suitable for use by a display device, where the display signal representing waveform imagery associated with the gain equalized SUT.
    Type: Grant
    Filed: October 14, 2003
    Date of Patent: August 7, 2007
    Assignee: Tektronix, Inc.
    Inventors: John J. Pickerd, Marvin E. La Voie, Rolf Anderson
  • Patent number: 7248987
    Abstract: A signal processing system for a sensor for judging whether an event to be detected has occurred on the basis of a frequency of a sensor output includes a converting device for converting the sensor output into a square wave, a presuming device for presuming whether the frequency of the sensor output is lower than a predetermined frequency referred for judging whether the event to be detected has occurred on the basis of an output from the converting device, and a judging device for judging whether the event to be detected has occurred on the basis of an output from the presuming device.
    Type: Grant
    Filed: September 20, 2005
    Date of Patent: July 24, 2007
    Assignee: Aisin Seiki Kabushiki Kaisha
    Inventor: Takehiko Sugiura
  • Patent number: 7246017
    Abstract: A waveform measuring apparatus can sequentially and continuously read measurement data from an acquisition memory, where the measurement data has been written by multiple acquisitions, after acquisition stops. The waveform measuring apparatus writes measurement data to the acquisition memory based on a trigger signal, and includes a pseudo trigger signal generation unit that continuously reads measurement data that is written in the acquisition memory.
    Type: Grant
    Filed: April 13, 2005
    Date of Patent: July 17, 2007
    Assignee: Yokogawa Electric Corporation
    Inventor: Shin'ichi Nakano
  • Patent number: 7243033
    Abstract: An inspection apparatus inspects an inspected object based on a waveform quality of a signal that the inspected object outputs. The inspection apparatus has a power supply section which outputs a control signal that controls an output of the inspected object, a waveform measuring section which measures the signal that the inspected object outputs to generate a waveform image, an analyzing section which derives a value indicating a waveform quality from the waveform image that the waveform measuring section measures, a deciding section which decides whether or not the value derived by the analyzing section satisfies a target value, and an optimizing section which changes a set value of the control signal that the power supply section outputs, based on a decision result of the deciding section.
    Type: Grant
    Filed: July 14, 2005
    Date of Patent: July 10, 2007
    Assignee: Yokogawa Electric Corporation
    Inventors: Chie Sato, Yusuke Kishine, Tetsuya Ohtani, Minoru Akutsu, Hiroshi Sugawara, Akira Toyama, Hirotoshi Kodaka, Katsuya Ikezawa, Shinji Kobayashi, Akira Miura