Waveform Extraction Patents (Class 702/70)
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Publication number: 20090030628Abstract: A method of processing a signal comprises receiving a signal, filtering the signal with a plurality of band pass filters, each band pass filter having a Q factor of at least 1/v2, and extracting data from the output of the filters. The primary data extraction comprises identifying local peaks in the output of the filters, each local peak being a local peak in both the time and frequency directions. The method advantageously further comprises executing a curve fitting procedure, the output of which procedure comprises curve data defining a curve that at least approximates to a portion of the extracted data. The method can further comprise varying the Q factor of at least one band pass filter as the signal is filtered.Type: ApplicationFiled: January 26, 2007Publication date: January 29, 2009Applicant: GAD Group LimitedInventor: Martin Paul Simpson
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Patent number: 7460967Abstract: Events discovered by an automatic measurement subsystem in the trace of a DSO are visited using a set of event navigation controls. In a TIME Mode the controls operate to display the first of those events, display the next event after the one currently displayed, display the previous event before the one currently displayed, and, display the last event. In a SEVERITY Mode the controls operate to display the best of those events, display the next best event relative to the one currently displayed, display the next worst event before the one currently displayed, and, display the worst event. The sets of navigation controls may be a mode control menu accompanied by four stylized arrow shaped buttons within a GUI that are clicked on by an operator using a mouse. One set of arrow shaped button can serve both modes, or different sets of buttons can serve each respective mode.Type: GrantFiled: June 28, 2006Date of Patent: December 2, 2008Assignee: Agilent Technologies, Inc.Inventor: Christopher P Duff
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Patent number: 7451048Abstract: A merging unit merges partial models into an entire model, and divides a grid of a parent hierarchy into grids of a child hierarchy based on hierarchical relationship of partial models, and an object selecting unit divides a grid of an object inclusion domain that includes an object selected from the entire model by a user to create a sub grid domain, and a domain selecting unit divides a grid of a domain selected from the entire model by the user to create the sub grid domain.Type: GrantFiled: January 26, 2005Date of Patent: November 11, 2008Assignee: Fujitsu LimitedInventors: Kenji Nagase, Sekiji Nishino, Takashi Yamagajou, Takefumi Namiki, Tetsuyuki Kubota
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Patent number: 7449690Abstract: To establish a technique that enables sorting of the elevation and azimuth angle in the direction of emitting secondary electrons and obtaining images with emphasized contrast, in order to perform the review and analysis of shallow asperities and microscopic foreign particles in a wafer inspection during the manufacture of semiconductor devices, an electromagnetic overlapping objective lens is used to achieve high resolution, an electron beam is narrowly focused using the objective lens, an electric field for accelerating secondary electrons in the vicinity of a wafer in order to suppress the dependence on secondary electron energy of the rotation of secondary electrons generated by irradiation of the electron beam, a ring-shaped detector plate is disposed between an electron source and the objective lens, and the low angle components of the elevation angle of the secondary electrons, as viewed from the place of generation, and the high angle components are separated and also the azimuth components are separaType: GrantFiled: February 9, 2006Date of Patent: November 11, 2008Assignee: Hitachi High-Technologies CorporationInventors: Hidetoshi Nishiyama, Muneyuki Fukuda, Noritsugu Takahashi, Mitsugu Sato, Atsuko Fukada, Naomasa Suzuki
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Publication number: 20080243410Abstract: Provided are an image forming apparatus and an image forming method which are capable of obtaining an image of a measured object using a relatively simple structure in a short time. In the image forming apparatus, an electromagnetic wave generated by an electromagnetic wave generator is emitted to the measured object through a spatial modulation unit for spatially modulating a signal intensity. An electromagnetic wave that has passed through the measured object is measured by an electromagnetic wave detecting unit. A measurement signal is processed by a signal processing section based on a reference signal synchronized with the signal intensity modulated by the spatial modulation unit. The image is formed by an image acquisition section.Type: ApplicationFiled: March 28, 2008Publication date: October 2, 2008Applicant: CANON KABUSHIKI KAISHAInventors: Michinori Shioda, Toshihiko Ouchi, Ryota Sekiguchi
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Publication number: 20080221814Abstract: An instrument for measuring the size and characteristics of a particle contained in a sample of particles. A particle sample is introduced into a sample chamber. The sample particles are subjected to centrifugal forces so that large particles travel in the sample chamber at velocities greater than small particles. Light is shown upon the particles as they travel in the sample chamber. The particles diffract the light. The diffracted light is then received by detectors that convert the diffracted light into corresponding electronic signals. The electronic signals are analyzed to determine the size and characteristics of the particles that caused the diffracted light.Type: ApplicationFiled: October 30, 2007Publication date: September 11, 2008Inventor: Michael Trainer
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Publication number: 20080218738Abstract: An instrument for measuring the size and characteristics of a particle contained in a sample of particles. A particle sample is introduced into a sample chamber. The sample particles are subjected to centrifugal forces so that large particles travel in the sample chamber at velocities greater than small particles. Light is shown upon the particles as they travel in the sample chamber. The particles diffract the light. The diffracted light is then received by detectors that convert the diffracted light into corresponding electronic signals. The electronic signals are analyzed to determine the size and characteristics of the particles that caused the diffracted light.Type: ApplicationFiled: October 31, 2007Publication date: September 11, 2008Inventor: Michael Trainer
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Publication number: 20080215270Abstract: This present specification provides, amongst other things, an electro-optical monitoring system for obtaining a once-per-revolution signal based on the surface reflection of a rotating device that mandates non-contacting sensor input in potentially hostile environments. The system can use optical and electronic sections to illuminate and detect surface reflections from the rotating surface using existing mounting locations on the periphery of the machine to be measured. The electronic portion is configured to determine a unique mark as the once-per-revolution marker or allow an attending operator to assign a specific marker based on the observed reflected pattern. The optical portion consists of a light source, receiver, and optics will allow for focused and directed light paths to properly position relevant to key reflective surfaces.Type: ApplicationFiled: August 15, 2007Publication date: September 4, 2008Applicant: Cognitive Vision Inc.Inventors: John Gordon Thomas, Peter James Neild, Raymond Joseph Schumacher
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Publication number: 20080204717Abstract: An instrument for measuring the size distribution of a particle sample by counting and classifying particles into selected size ranges. The particle concentration is reduced to the level where the probability of measuring scattering from multiple particles at one time is reduced to an acceptable level. A light beam is focused or collimated through a sample cell, through which the particles flow. As each particle passes through the beam, it scatters, absorbs, and transmits different amounts of the light, depending upon the particle size. So both the decrease in the beam intensity, due to light removal by the particle, and increase of light, scattered by the particle, may be used to determine the particle size, to classify the particle and count it in a certain size range.Type: ApplicationFiled: October 25, 2007Publication date: August 28, 2008Inventor: Michael Trainer
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Patent number: 7415370Abstract: A method of compressing values of a waveform of a monitored electrical power signal. The method includes acquiring data representative of periods of the waveform, decomposing the waveform of the power signal into a plurality of components over a plurality of periods of the waveform, compressing the values of at least some of the components over a plurality of periods, and storing these values and extents.Type: GrantFiled: April 18, 2004Date of Patent: August 19, 2008Assignee: ELSPEC Ltd.Inventors: Pol Nisenblat, Amir Mordehay Broshi, Ofir Efrati
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Patent number: 7409320Abstract: A system, method and program product for monitoring a complex signal for ultrasensitive detection of state changes, or for signature recognition and classification is provided. A complex signal is decomposed periodically for empirical modeling. Wavelet analysis, frequency band filtering or other methods may be used to decompose the complex signal into components. A library of signature data may be referenced for selection of a recognized signature in the decomposed complex signal. The recognized signature may indicate data being carried in the complex signal. Estimated signal data may be generated for determination of an operational state of a monitored process or machine using a statistical hypothesis test with reference to the decomposed input signal.Type: GrantFiled: May 11, 2005Date of Patent: August 5, 2008Assignee: Smartsignal CorporationInventor: Stephan W. Wegerich
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Publication number: 20080173820Abstract: A portable radiation detection apparatus is provided to transform detected radioactivity into an analog pulse signal and then convert the analog pulse signal into a digital pulse signal. Thereafter, a counting information with respect to the pulse width and pulse counting of the digital pulse signal is created for data processing executed in a portable device. A spectrometric analysis method is provided, which comprises the steps of generating a smooth and continuous curve with respect to the counting information, searching peak values and channel numbers corresponding to the peak values toward the smooth and continuous curve, calculating FWHM and region of interest of the peak values and then processing counting rate process. According to the foregoing characteristics, the present invention is not only provide lowing cost and wireless communication but also provide distance protection for radiation protection personnel to execute the inspection routinely under the extremely environment.Type: ApplicationFiled: August 30, 2007Publication date: July 24, 2008Applicant: Institute of Nuclear Energy Research Atomic Energy Council, Executive YuanInventors: Hsun-Hua Tseng, Chun-Shih Yang
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Patent number: 7401008Abstract: A method and system for intrinsic timescale decomposition, filtering, and automated analysis of signals of arbitrary origin or timescale including receiving an input signal, determining a baseline segment and a monotonic residual segment with strictly negative minimum and strictly positive maximum between two successive extrema of the input signal, and producing a baseline output signal and a residual output signal. The method and system also includes determining at least one instantaneous frequency estimate from a proper rotation signal, determining a zero-crossing and a local extremum of the proper rotation signal, and applying interpolation thereto to determine an instantaneous frequency estimate thereof.Type: GrantFiled: May 1, 2006Date of Patent: July 15, 2008Inventors: Mark G. Frei, Ivan Osorio
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Publication number: 20080162061Abstract: The present invention has an object of realizing a defect inspection estimated at high accuracy by preparing a reference image that reflects the change of the blur with time from a sampled image and design data. The present invention comprises a point spread function estimating section 23 for estimating a point spread function from an observation image and design information, a convolution image generating section 31 for generating a convolution image by convoluting the point spread function relative to the design information and a reference image generating section 33 for generating a reference image from the convolution image obtained by the convolution image generating section.Type: ApplicationFiled: November 4, 2005Publication date: July 3, 2008Applicant: NEC CORPORATIONInventor: Hiroyoshi Miyano
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Publication number: 20080143315Abstract: A system and method to evaluate characteristics of transient events in an electrical power system to determine the location of a transient source type, the source type of a transient event, and suggested mitigation measures that might reduce or eliminate the effects of the transient. The electrical power system has a plurality of monitoring devices that each may detect the occurrence of a transient event incident upon the power system. A controller is coupled to the monitoring devices. The monitoring devices measure signal parameter values associated with the transient event, and the location of the transient event is automatically determined by evaluating transient characteristics from each of the recording monitoring devices. Other measurements of signal parameters may be made to determine transient characteristics.Type: ApplicationFiled: December 14, 2006Publication date: June 19, 2008Inventor: Jon A. Bickel
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Patent number: 7369604Abstract: Apparatus according to the subject invention includes two independent acquisition systems, wherein one of the two independent acquisition systems acquires the acquisition clock of the other acquisition system along with a signal from a known acquisition reference point. In general, the first independent acquisition system is a logic analyzer, and the second independent acquisition system can be an ILA, a second logic analyzer, an oscilloscope, or other sampling device.Type: GrantFiled: September 27, 2002Date of Patent: May 6, 2008Assignee: Tektronix, Inc.Inventor: Robert J. Heath
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Publication number: 20080103710Abstract: A compressor for waveforms having at least two waveform states separates the waveform samples into waveform state sample vectors for each waveform state. Waveform state encoders encode the waveform state sample vectors separately to provide compressed waveform data. The waveform state encoder selects waveform state pattern vector and associated codes to represent the waveform state sample vectors. The differences between samples of the waveform state sample vector and waveform state pattern vector are calculated and encoded. Encoding can be lossless or lossy. The waveform state pattern vectors and other parameters for compression are determined during a training period. The waveform state encoders detect features in the waveform state sample vectors and waveform state pattern vectors that are useful for common oscilloscope measurements. Typical waveform states include level states and edge states.Type: ApplicationFiled: October 26, 2006Publication date: May 1, 2008Applicant: SAMPLIFY SYSTEMS, INC.Inventor: Albert W. Wegener
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Patent number: 7359810Abstract: A method of characterizing a newly acquired waveform with respect to previously acquired waveforms during monitoring of a generally repetitive signal, where the previously acquired waveforms have been rasterized into a two-dimensional array of memory locations, reads history values for those memory locations associated with an active portion of the newly acquired waveform, compares the history values with history value ranges, increments a count for one of a plurality of recent pixel counters corresponding to the history value ranges, each counter having a different history value range, and modifies the history values in the memory locations. From the counts accumulated for each of the history value ranges the variability of the newly acquired waveform from the generally repetitive signal is determined.Type: GrantFiled: March 18, 2005Date of Patent: April 15, 2008Assignee: Tektronix, Inc.Inventors: Peter J. Letts, Kenneth P. Dobyns, Paul M. Gerlach, Kristie Veith
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Patent number: 7353410Abstract: A method and system and calibration technique for power measurement and management over multiple time frames provides responsive power control while meeting global system power consumption and power dissipation limits. Power output of one or more system power supplies is measured and processed to produce power values over multiple differing time frames. The measurements from the differing time frames are used to determine whether or not system power consumption should be adjusted and then one or more devices is power-managed in response to the determination. The determination may compare a set of maximum and/or minimum thresholds to each of the measurements from the differing time frames. A calibration technique uses a precision reference resistor and voltage reference controlled current source to introduce a voltage drop from the input side of a power supply sense resistor calibration is made at the common mode voltage of the power supply output.Type: GrantFiled: January 11, 2005Date of Patent: April 1, 2008Assignee: International Business Machines CorporationInventors: Dhruv Manmohandas Desai, Nickolas J. Gruendler, Carl A. Morrell, Gary R. Shippy, Michael Leo Scollard, Michael Joseph Steinmetz, Malcolm Scott Ware, Christopher L. Wood
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Patent number: 7346464Abstract: A gait waveform feature extracting method and an individual identification system extract features of the gait waveform. A one-step waveform corresponding to one step of a walking movement is specified using, as an index, a peak amplitude corresponding to a state where substantially a whole bottom surface of one foot is in contact with the ground and a toe of the other foot is just after leaving the ground among the electric field displacement formed on the human body in accordance with the human body's walking movements. Based on the specified one-step waveform, the features of the one-step waveform are extracted, so that the peak amplitude appears without influence from electric-charge interference between the right and left legs. Accordingly, the one-step waveform reflects the actual one step of the walking movement, and therefore, the features of the one-step waveform can be precisely extracted.Type: GrantFiled: October 28, 2003Date of Patent: March 18, 2008Assignee: Sony CorporationInventor: Kiyoaki Takiguchi
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Publication number: 20080027665Abstract: A semiconductor wafer, which is an inspection object, is stuck by vacuum on a chuck and this chuck is mounted on an inspection object movement stage consisting of a rotational stage and a translational stage, located on a Z-stage. The rotational stage provides a rotational movement and the translational stage provides a translational movement. And when a foreign particle or a defect on an inspection object surface is detected, the parameter of digital filtering is dynamically changed during inspection, and the foreign particle or the defect is differentiated using the result after removing a low frequency fluctuation component to be a noise component.Type: ApplicationFiled: July 23, 2007Publication date: January 31, 2008Inventors: Kazuo Takahashi, Takahiro Jingu
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Patent number: 7317309Abstract: A wideband signal analyzing apparatus for analyzing an input signal includes frequency-shifting means for generating a plurality of intermediate frequency signals by shifting a frequency of the input signal as much as respectively different frequency-shifting amounts, so that if a frequency band of the input signal is divided into a plurality of frequency bands, each of the frequency bands can be shifted to a predetermined intermediate band, spectrum measuring means for outputting a complex spectrum of each of the intermediate frequency signals, and spectrum reconstructing means for merging the complex spectra.Type: GrantFiled: June 7, 2004Date of Patent: January 8, 2008Assignee: Advantest CorporationInventors: Takahiro Yamaguchi, Masahiro Ishida, Mani Soma
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Patent number: 7275004Abstract: An integrated circuit is provided that includes a first port to receive a first signal from a first channel and a first device coupled to the first port to modify a channel response of the first signal received from the first channel. A waveform capture device may be coupled to the first device to capture a waveform of a signal modified by the first device.Type: GrantFiled: December 23, 2003Date of Patent: September 25, 2007Assignee: Intel CorporationInventors: Bryan K. Casper, Aaron K. Martin, James E. Jaussi, Stephen R. Mooney, Ganesh Balamurugan
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Patent number: 7260485Abstract: Various computer-implemented methods and systems are provided. One computer-implemented method includes determining a ratio between output signals generated by detecting spectra for a single event in two or more detection windows. The spectra are characteristic of different materials. At least a portion of the spectra overlap in at least one of the two or more detection windows. The method also includes determining which of the different materials are associated with the ratio. One embodiment of a system includes one or more detectors configured to detect spectra for a single event in two or more detection windows. The spectra may include spectra as described above. The one or more detectors are also configured to generate output signals in response to the detected spectra. The system also includes a processor configured to determine a ratio between the output signals and to determine which of the different materials are associated with the ratio.Type: GrantFiled: July 6, 2004Date of Patent: August 21, 2007Assignee: Luminex CorporationInventor: Don J. Chandler
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Patent number: 7254500Abstract: A method of displaying signals containing a spatial and a temporal aspect, where multiple signals are received by multiple sensors. The received signals are decomposed into separate signal components within one or more distinct frequency bands. Signal components are isolated within each frequency band based on differences between the signal components within the same frequency band, and the signal components are displayed. The signal components may be analyzed to determine a time course of activity and a location of the associated source. Representations of the source may also be generated and displayed to aid in monitoring the signals.Type: GrantFiled: March 31, 2004Date of Patent: August 7, 2007Assignee: The Salk Institute for Biological StudiesInventors: Scott Makeig, Jörn Anemüller
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Patent number: 7248987Abstract: A signal processing system for a sensor for judging whether an event to be detected has occurred on the basis of a frequency of a sensor output includes a converting device for converting the sensor output into a square wave, a presuming device for presuming whether the frequency of the sensor output is lower than a predetermined frequency referred for judging whether the event to be detected has occurred on the basis of an output from the converting device, and a judging device for judging whether the event to be detected has occurred on the basis of an output from the presuming device.Type: GrantFiled: September 20, 2005Date of Patent: July 24, 2007Assignee: Aisin Seiki Kabushiki KaishaInventor: Takehiko Sugiura
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Patent number: 7246017Abstract: A waveform measuring apparatus can sequentially and continuously read measurement data from an acquisition memory, where the measurement data has been written by multiple acquisitions, after acquisition stops. The waveform measuring apparatus writes measurement data to the acquisition memory based on a trigger signal, and includes a pseudo trigger signal generation unit that continuously reads measurement data that is written in the acquisition memory.Type: GrantFiled: April 13, 2005Date of Patent: July 17, 2007Assignee: Yokogawa Electric CorporationInventor: Shin'ichi Nakano
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Patent number: 7228262Abstract: An aspect of the present invention provides a semiconductor integrated circuit verification system that includes a compiler configured to receive circuit descriptions of a semiconductor integrated circuit to be verified and create a circuit database, a circuit analysis unit configured to receive the circuit database to analyze the circuitry inside the semiconductor integrated circuit based on the circuit database, the circuit analysis unit configured to determine the timing at which the abstraction level of the circuit is switched and generate a simulation object, and a simulation execution unit configured to receive the simulation object and conduct a simulation of the semiconductor integrated circuit based on the simulation object.Type: GrantFiled: July 1, 2004Date of Patent: June 5, 2007Assignee: Kabushiki Kaisha ToshibaInventors: Kenichi Anzou, Chikako Tokunaga, Takashi Matsumoto
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Patent number: 7216046Abstract: A variable persistence waveform database is generated by defining a First-In-First-Out (FIFO) time-ordered queue buffer for maintaining a selected number of waveform records. Digital data samples of a measurement signal are acquired and stored in a plurality of waveform records in the FIFO time-ordered queue buffer. Counts of the digital data samples for the plurality of waveform records are accumulated in a waveform database. Upon filling FIFO time-ordered queue buffer with waveform records, the digital data samples of the oldest acquired waveform record are subtracted from the accumulated counts of the waveform database and deleted from the FIFO time-ordered queue buffer and the digital data samples of the newest acquired waveform record are stored in the FIFO time-ordered queue buffer and added to the accumulated counts in the waveform database.Type: GrantFiled: March 19, 2003Date of Patent: May 8, 2007Assignee: Tektronix, Inc.Inventors: Maria Agoston, William Bruce Harrington, Scott L. Halsted
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Patent number: 7191079Abstract: An advanced trigger circuit includes two trigger decoders, each triggering on one of respective pluralities of continuous-time trigger events. In one embodiment, a programmable timer begins timing in response to an output signal of the first trigger decoder and generates an end-of-time signal at the expiration of its time period. A reset circuit resets the first trigger decoder if the second selected continuous-time trigger event failed to occur before the end-of-time signal was generated. In another embodiment, a reset decoder generates a reset signal in response to an occurrence of a selected continuous-time trigger event. The reset circuit is responsive to the reset signal for resetting the first trigger decoder if the second selected continuous-time trigger event failed to occur before the reset signal was generated. In other embodiments, the advanced trigger circuit triggers on a serial lane skew violation or on a beacon width violation.Type: GrantFiled: March 23, 2005Date of Patent: March 13, 2007Assignee: Tektronix, Inc.Inventors: Patrick A. Smith, Que Thuy Tran, John C. Delacy, Daniel G. Knierim, David L. Kelly, John C. Calvin
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Patent number: 7191113Abstract: A method and system for short-circuit current modeling in CMOS circuit provides improved accuracy for logic gate power dissipation models in computer-based verification and design tools. The model determines the short circuit current for each complementary pair within a CMOS circuit. Input and output voltage waveforms provided from results of a timing analysis are used to model the behavior one device of the complementary pair. The device is selected as the limiting device (the device transitioning to an “off state) from the direction of the logic transition being modeled, which is also the device that is not charging or discharging the output load. Therefore, the current through the selected device can be determined from the input and output waveforms and is equal to the short-circuit current prior to the saturation of the selected device.Type: GrantFiled: December 17, 2002Date of Patent: March 13, 2007Assignee: International Business Machines CorporationInventors: Emrah Acar, Ravishankar Arunachalam, Sani Richard Nassif
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Patent number: 7187730Abstract: An apparatus and a method for symbol decoding of baseband data in a wireless communications network is disclosed, and specifically CCK subsymbol prediction and symbol demodulation that occurs at 5.5 Mbps or 11 Mbps. The apparatus is configured to demodulate or predict the data differently, depending on the modulation rate. If the data was modulated at 11 Mbps, the ?3 rotator is rotated through each of its possible phase values and symbol correlation takes four clock cycles to complete. If the data was modulated at 5.5 Mbps, ?3 is not rotated with a set value of 0 within the correlator architecture, thereby saving power and reducing symbol correlation and subsymbol prediction to a single cycle while in such transmission mode.Type: GrantFiled: September 19, 2002Date of Patent: March 6, 2007Assignee: Marvell International Ltd.Inventors: Guorong Hu, Yungping Hsu
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Patent number: 7177783Abstract: The invention allows the inclusion of cross-talk coupling and other noise in circuit simulation by considering a resultant glitch in more detail than just its peak value. A set of parameters represents the noise, with an exemplary embodiment using a triangle approximation to a glitch based on a set of three parameters: the peak voltage value, the leading edge slope and the trailing edge slope. These values are then used as the input stimulus to a given cell instance in the network in which the resulting propagated noise values, also in a triangle approximation, are determined by a simulation. The results can be stored as a library so that, given the parameters of the input noise and the particular cell, a simulation can determine the propagated noise through a look-up process. To reduce the space requirements of the library, the dimensionality of the look-up tables can be reduced through the introduction of a set of auxiliary functions to offset error from this reduction.Type: GrantFiled: January 10, 2003Date of Patent: February 13, 2007Assignee: Cadence Design Systems, Inc.Inventors: Lifeng Wu, Jianlin Wei, I-Hsien Chen
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Patent number: 7177772Abstract: A method for measuring noise parameters includes generating a noise signal at a noise source. The noise signal includes a first input signal at a first frequency and a second input signal at a second frequency. The first input signal and the second input signal are modulated onto a carrier to generate a modulated signal. The modulated signal is attenuated to a desired power level and applied to a device under test to obtain a noise measurement.Type: GrantFiled: May 25, 2004Date of Patent: February 13, 2007Assignee: Texas Instruments IncorporatedInventors: Henry P. Largey, Dale A. Heaton, Lianrui Zang
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Patent number: 7123845Abstract: A receiving apparatus comprises a first waveform degradation compensating unit, a second waveform degradation compensating unit, a received waveform measuring unit for measuring waveform data on a received signal, a control unit for controlling compensation characteristics of the first and second waveform degradation compensating units to minimize a difference between frequency data obtained by converting the obtained received waveform data into a frequency domain and frequency data on a reference waveform free from waveform degradation, and time-constant generating units for making a difference in compensation characteristic control speed between the first and second waveform degradation compensating units. This realizes high-accuracy compensation for waveform degradation of a received signal stemming from chromatic dispersion, polarization mode dispersion or the like without employing a dispersion compensation fiber or a polarization maintaining fiber.Type: GrantFiled: February 6, 2003Date of Patent: October 17, 2006Assignee: Fujitsu LimitedInventor: Toru Matsuyama
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Patent number: 7092849Abstract: Embodiments of the present invention provide a method, a system, and a computer code for analyzing the state of a first system (e.g., the autonomic system) from a time-varying signal representing a chaotic series of time intervals between quasi-periodical events produced by a second system (e.g., the cardiac system) governed by the first system. In one embodiment, the method includes extracting envelope information from the time-varying signal, constructing a phase space for the time-varying signal, extracting information on the relative positions of points corresponding to the time-varying signal in the phase space, combining the envelope and the position information and, based on this combination, providing information on the state of the first system.Type: GrantFiled: October 7, 2004Date of Patent: August 15, 2006Assignee: Dyansys, Inc.Inventors: Melvyn Jérémie Lafitte, Orin Sauvageot, Marion Fèvre-Genoulaz, Srini Nageshwar
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Patent number: 7079143Abstract: A waveform drawing routine is disclosed that includes receiving an array of predecessor image data points, wherein the predecessor image data points form a predecessor line that has a predecessor high end point and a predecessor low end point, receiving an array of successor image data points, wherein the successor image data points form a successor line having a successor high end point and a successor low end point, comparing the successor line to the predecessor line, and maintaining any portions of the predecessor line on a display that intersect with the successor line. The method described above for drawing each line segment that forms the waveform is repeated until a complete waveform is drawn on the display that consists of the concatenation of these individual lines.Type: GrantFiled: October 25, 2002Date of Patent: July 18, 2006Assignee: SPX CorporationInventor: Harry M. Gilbert
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Patent number: 7072804Abstract: A real time DSO is equipped with a Digital Trigger Filter that performs high frequency rejection, low frequency rejection, AC and DC triggering. The Digital Trigger Filter includes first and second digitally implemented IIR (Infinite Input Response) Filters. A digitized Conditioned Input Signal is applied to the first IIR Filter. It has taps that provide the Trigger Signal outputs needed for high and low frequency rejection. The high frequency rejection output of the first ER Filter is essentially a low pass output (3 dB down at 50 KHz) and is also used as the digital input to the second IIR Filter, whose output is a much more aggressive suppression of high frequencies (3 dB down at 50 Hz). The AC Trigger Signal output is produced by subtracting the output of the second IIR filter from the original input to the entire Digital Trigger Filter, and the DC Trigger Signal output is simply the same as that original input. A MUX selects which Trigger Signal is applied to a Digital Trigger Comparator.Type: GrantFiled: September 28, 2004Date of Patent: July 4, 2006Assignee: Agilent Technologies, Inc.Inventor: Dennis J. Weller
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Patent number: 7058530Abstract: An improved method and system for detecting covert surveillance devices uses frequency spectrum traces produced by a spectrum analyzer. The electromagnetic spectrum is scanned in a reference area to produce a reference frequency spectrum trace. The electromagnetic spectrum is then continuously scanned in a nearby target area to produce a peak hold frequency spectrum trace. The reference frequency spectrum trace is then subtracted from the peak hold spectrum trace to produce a comparative frequency spectrum trace. Peaks in the comparative frequency spectrum correspond to signals that are unique to either the reference area or the target area or transitory in nature. Statistical analysis is performed on subsequently obtained frequency traces to identify any changes in the frequency traces.Type: GrantFiled: August 13, 2004Date of Patent: June 6, 2006Assignee: Research Electronics International, LLCInventors: Michael Miller, Bruce R. Barsumian, Thomas H. Jones
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Patent number: 7039536Abstract: The invention provides a method of analyzing a source current at a higher speed and an enhanced accuracy in a semiconductor integrated circuit including a digital circuit. The method to analyze a waveform of the source current, with consideration of re-distribution of charges throughout the digital circuit in the semiconductor integrated circuit, expressing the digital circuit with series of parasitic capacitors ?Cch, ? (nT) and ?Cch, ? (nT) to be charged and connected between the source and the ground lines. The capacitor series are calculated in time series based on the distribution of switching operations of the logic gates included in the digital circuit. An analysis model for determining the waveform of the source current in the digital circuit is obtained by connecting the parasitic capacitor series with a couple of respective parasitic impedances Zd and Zg of the source line and the ground line.Type: GrantFiled: October 17, 2001Date of Patent: May 2, 2006Assignee: Semiconductor Technology Academic Research CenterInventors: Makoto Nagata, Atsushi Iwata
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Patent number: 7024322Abstract: A dynamic waveform manager and an application policy are provided to an electronic device that executes an application requiring the use of waveforms accessed from a waveform table characterized by a limited number of entries. The application policy contains waveform sequencing information specific to the application. The application may utilize any number of waveforms that are typically stored in a memory separate from the waveform table. The dynamic waveform manager monitors the execution of the application, and manages loading and unloading of waveforms required by the application into and out of the waveform table such that each waveform required by the application is loaded in the waveform prior to and at least by the time it is needed by the application. The dynamic waveform manager accesses the application policy to reference the waveform sequencing information specific to the application for use in determining when and which waveforms to load and unload to and from the waveform table.Type: GrantFiled: February 20, 2004Date of Patent: April 4, 2006Assignee: Agilent Technologies, Inc.Inventors: Robert S. Kolman, Reid Hayhow, Daven Walt Septon
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Patent number: 7016796Abstract: A small microcontroller or a DSP may be used to process digital signals representative of a measurement. Furthermore, special RMS AC measurement or DC noise rejection algorithms may have to be run on the microcontroller or the DSP. Other implementations may use custom digital logic, such as FPGAs, to process the digital signals. The DSP may not have enough capacity to store and process all data at the same time. Certain physical limitations are inherent to the DSP architectures, such as the trade-off of on-board memory size vs. speed, power consumption, and physical chip size. As a result, the RMS AC Measurement and the DC Noise rejection algorithms enable computational devices such as DSP's to perform sophisticated and accurate RMS measurements for waveforms ranging from DC to high frequency. The RMS AC Measurement and the DC Noise rejection algorithms uses on the on-the-fly computation of interpolated window values.Type: GrantFiled: June 2, 2003Date of Patent: March 21, 2006Assignee: National Instruments CorporationInventors: Bakul Damle, Christopher G. Regier, Scott Borisch
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Patent number: 7010283Abstract: A signal waveform detection circuit includes an amplifier circuit and a comparing circuit. The amplifier circuit has differential amplifiers connected in series. Each of the differential amplifiers has a common connection point. The comparing circuit is connected to the common connection points of the amplifier circuit. The comparing circuit includes comparing units connected to one of the differential amplifiers. Each of the comparing units has a threshold voltage generating circuit for generating signals. Each signal has a threshold voltage that is set between a maximum threshold voltage of a signal output from the corresponding differential amplifier during a maximum amplitude output and a minimum threshold voltage of a signal output from the corresponding differential amplifier during a minimum amplitude output. The comparing unit further has a comparator comparing a voltage at the common connection point with the threshold voltage.Type: GrantFiled: January 14, 2003Date of Patent: March 7, 2006Assignee: Oki Electric Industry Co., Ltd.Inventors: Shuichi Matsumoto, Akira Yoshida
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Patent number: 7003413Abstract: Signal processing techniques and systems and, in particular, an apparatus, system, algorithm and method of extraction of sinusoidal signals of time-varying nature is described. The apparatus, system, algorithm and method provide for extraction of a specified single sinusoidal component of an input signal, potentially containing other components and noise, and tracking variations of the amplitude, phase and frequency of such a sinusoid component over time. A “tool” or “core unit,” embodying the apparatus, system, algorithm or method may be used in isolation or as the fundamental building block of single-core or multi-core systems.Type: GrantFiled: October 31, 2003Date of Patent: February 21, 2006Assignee: Bio-Logic Systems Corp.Inventor: Alireza K. Ziarani
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Patent number: 6993440Abstract: A receiver exploits unique higher order statistics of temporally dependent waveforms to classify, characterize, identify (fingerprint) and intercept a waveform within the field of view of the receiver. The method uses 4th-order non zero lag auto cumulants of the received waveform and 4th-order non zero lag auto cumulants of known waveforms to classify and characterize the signal. The receiver includes a multi-element array and does not need a priori knowledge of the transmitted signal source obtain a fingerprint.Type: GrantFiled: December 19, 2003Date of Patent: January 31, 2006Assignee: Harris CorporationInventors: Richard H. Anderson, Edward R. Beadle, Paul D. Anderson, John F. Dishman
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Patent number: 6980212Abstract: Apparatus in accordance with the subject invention maintains an exponentially decayed histogram of the counts of new pixels for each active channel, together with a running count of time and number of acquisitions. At regular intervals determined by a maximum time or by a minimum number of acquisitions it computes a new threshold for each active channel. This threshold will theoretically produce “N” nominally unusual waveforms per second where N is defined by a user “sensitivity” control. The raw histogram is smoothed to provide a stable “tail” of small probabilities. Once a threshold has been determined, subsequent waveforms with more than this number of new pixels are re-examined to determine the number of “really new” pixels. “Really new” pixels are defined as those that are not adjacent to pixels remaining from earlier acquisitions. Only those waveforms that have more “really new” pixels than a specified fraction of the basic threshold are reported as anomalies.Type: GrantFiled: April 17, 2002Date of Patent: December 27, 2005Assignee: Tektronix, Inc.Inventor: Peter J. Letts
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Patent number: 6975951Abstract: A method compensates for phase differences between sampled values of first and second AC waveforms. The method employs a phase angle compensation factor and sequentially samples a plurality of values of each of the waveforms. For a positive compensation factor, second sampled values are adjusted to correspond with first sampled values by employing, for a corresponding second sampled value, a preceding second sampled value plus the product of: (i) the compensation factor and (ii) the difference between the corresponding second sampled value and the preceding second sampled value. Alternatively, for a negative compensation factor, the second sampled values are adjusted by employing, for the corresponding second sampled value, the preceding second sampled value minus the product of: (i) the sum of one plus the compensation factor and (ii) the difference between the preceding second sampled value and the second sampled value preceding the preceding second sampled value.Type: GrantFiled: June 10, 2004Date of Patent: December 13, 2005Assignee: Raton CorporationInventors: Praveen K. Sutrave, Roger W. Cox
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Patent number: 6959266Abstract: A method and system for physiological gating for radiation therapy is disclosed. A method and system for detecting and predictably estimating regular cycles of physiological activity or movements is disclosed. Another disclosed aspect of the invention is directed to predictive actuation of gating system components. Yet another disclosed aspect of the invention is directed to physiological gating of radiation treatment based upon the phase of the physiological activity.Type: GrantFiled: September 16, 2003Date of Patent: October 25, 2005Assignee: Varian Medical SystemsInventor: Hassan Mostafavi
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Patent number: 6957172Abstract: A system, method and program product for monitoring a complex signal for ultrasensitive detection of state changes, or for signature recognition and classification is provided. A complex signal is decomposed periodically for empirical modeling. Wavelet analysis, frequency band filtering or other methods may be used to decompose the complex signal into components. A library of signature data may be referenced for selection of a recognized signature in the decomposed complex signal. The recognized signature may indicate data being carried in the complex signal. Estimated signal data may be generated for determination of an operational state of a monitored process or machine using a statistical hypothesis test with reference to the decomposed input signal.Type: GrantFiled: March 8, 2001Date of Patent: October 18, 2005Assignee: Smartsignal CorporationInventor: Stephan W. Wegerich
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Patent number: 6944559Abstract: A signal acquisition instrument, such as an oscilloscope, having an input stage that is referenced to a user's ground is disclosed. Information gathered by the input stage is stored in a storage element powered by a floating power supply that is referenced to the user's ground. After storage, the storage element is disconnected from the floating power and from the user's ground and switched to a power supply referenced to the remainder of the system. FET switching is beneficial, and information can be stored either in an analog format or in a digital format.Type: GrantFiled: September 12, 2003Date of Patent: September 13, 2005Assignee: Tektronix, Inc.Inventor: David F. Hiltner