Frequency Spectrum Patents (Class 702/76)
  • Publication number: 20110106472
    Abstract: A spectrometric measurement apparatus includes a light radiation unit for radiating light onto a medium; a hole array including openings arranged one-dimensionally for transmitting diffusion light from the medium; an imaging optical system configured to focus an image from the hole array; a diffraction element configured to diffract the light for focusing the image; and a light receiving unit including pixels arranged one-dimensionally configured to receive the light that has been dispersed by the diffraction element and spectrometric sensors each corresponding to a predetermined number of the pixels. The light transmitted through each of the openings of the hole array is dispersed by the diffraction element, and then the light enters the pixels so that spectral properties of the diffusion light are acquired. The structure of the diffraction element includes variations that are formed in accordance with the height of the image that is focused by the imaging optical system.
    Type: Application
    Filed: October 8, 2010
    Publication date: May 5, 2011
    Inventors: Manabu Seo, Naohiro Kamijo, Kohei Shimbo
  • Patent number: 7936162
    Abstract: In a method of detecting a repetition frequency of a measured signal, in order to detect the waveform repetition frequency of the measured signal with high accuracy even in the presence of a frequency fluctuation in the measured signal, the repetition frequency of the measured signal acquired by the conventional method is used as a provisional repetition frequency, and the frequency change amount of the specified signal obtained in the case where the measured signal is sampled sequentially with a sampling frequency greatly changed from the provisional sampling frequency to generate a frequency fold at the time of sampling is detected. Based on the detected frequency change amount of the specified signal and the change amount of the sample number indicating how many times the frequency fold has occurred in the process, the error contained in the sampling number with a frequency fluctuation contained in the measured signal is calculated.
    Type: Grant
    Filed: January 23, 2008
    Date of Patent: May 3, 2011
    Assignee: Anritsu Corporation
    Inventor: Yukio Tsuda
  • Patent number: 7933430
    Abstract: The spectral method for determining the concentrations of a substance in a mixture of any number of substances is defined by a chemical image having a plurality of pixels (520). The method includes steps of providing a spectrum for each of the n number of substances in the mixture (530), and obtaining the spectrum for one of the plurality of pixels, and calculating a plurality of estimated concentrations of each substance in the mixture as a function of the spectrum for each substance and the spectrum for the pixel, and calculating a deviation value for each of the plurality of estimated concentrations as a function of the spectrum of each of the number of substances in the mixture, and selecting the estimated concentration with the lowest deviation factor as a most likely concentration of each substance in the mixture (550).
    Type: Grant
    Filed: April 15, 2005
    Date of Patent: April 26, 2011
    Assignee: ChemImage Corporation
    Inventor: Robert Schweitzer
  • Patent number: 7930119
    Abstract: A method is disclosed for analyzing an AC voltage signal with a transformation which transforms the signal from a representation in the time-domain to a representation in the frequency-domain. This transformation can be a fast Fourier transform, a discrete Fourier transform or a Laplace transform. By selecting a second higher sampling frequency which is an integer multiple of a first sampling frequency, the zero crossings of the AC voltage signal can be accurately determined.
    Type: Grant
    Filed: January 8, 2008
    Date of Patent: April 19, 2011
    Assignee: Siemens Aktiengesellschaft
    Inventor: Robert Bösnecker
  • Patent number: 7920990
    Abstract: Apparatus and methods are provided to allow multiple, possibly overlapping, regions of interest within a frequency spectrum to be defined, and managed. Each of these regions of interest may be selected for further testing or identification. Unselected regions are allowed to collapse into narrow bars so as not to interfere with the selected region. Multiple rows are provided to allow for the definition and selection of overlapping regions of interest. Furthermore, in some embodiments aid is provided for identifying the signal type by providing a list of signal type candidates based upon such parameters as region of interest bandwidth, region of interest center frequency and geographic location.
    Type: Grant
    Filed: July 16, 2008
    Date of Patent: April 5, 2011
    Assignee: Tektronix, Inc.
    Inventors: Richard B. Nicholls, John F. Short, III, Walter R. Strand, Lynne A. Fitzsimmons, David W. Schmidt, Ronald J. Larrick
  • Publication number: 20110077886
    Abstract: Provided is a method of selecting a white Gaussian noise sub-band using singular value decomposition (SVD). The method includes selecting a first frequency band, verifying whether a signal is included in the selected first frequency band, determining the first frequency band as a target measurement frequency when the signal is not included in the selected first frequency band, and measuring a background radio noise in the determined target measurement frequency.
    Type: Application
    Filed: March 30, 2010
    Publication date: March 31, 2011
    Applicants: Electronics and Telecommunications Research Institute, University-Industry Cooperation Group of Kyung Hee University
    Inventors: Mi-Kyung SUK, Sang-Tae KIM, Gwangmoon PARK, Seong Yun LEE, Haeng Sook RO, Heung Yong KANG, Yong-Seok CHOI, Young Soo KIM, Seung Min SHIN
  • Patent number: 7917331
    Abstract: A deterministic component identifying apparatus identifies a distribution shape of a deterministic component included in a probability density function supplied thereto. The apparatus includes a standard deviation calculating section that calculates a standard deviation of the probability density function, a spectrum calculating section that calculates a spectrum of the probability density function, a null frequency detecting section that detects a null frequency of the spectrum, and a ratio calculating section that calculates a ratio between a top portion and a bottom portion of a distribution of the deterministic component, based on the standard deviation of the probability density function and the null frequency of the spectrum.
    Type: Grant
    Filed: November 18, 2008
    Date of Patent: March 29, 2011
    Assignee: Advantest Corporation
    Inventors: Kiyotaka Ichiyama, Masahiro Ishida, Takahiro Yamaguchi
  • Patent number: 7912661
    Abstract: Circuitry and program code adapted for carrying out an associated technique for characterizing the response of one or more magnetoelastic sensor elements during exposure to an excitation field generated by an interrogation coil: including: (a) measuring a total sensor signal from the coil with the sensor element positioned within the excitation field within a spacing created by a winding of the coil; and (b) automatically determining: (i) a total measured impedance spectrum from said total sensor signal so measured, and (ii) a plurality of magnitude values representing the real part of a reconstructed impedance spectrum for the sensor element. The reconstructed impedance spectrum for the sensor element, having been calculated by subtracting an impedance generally attributable to the coil during the time an AC excitation signal is provided, from the total measured impedance.
    Type: Grant
    Filed: February 23, 2007
    Date of Patent: March 22, 2011
    Assignee: KMG2 Sensors Corporation
    Inventors: Kefeng Zeng, Keat Ghee Ong, Xiping Yang, Craig A. Grimes
  • Patent number: 7908103
    Abstract: A computer-implemented method of signal processing is provided. The method includes generating one or more masking signals based upon a computed Fourier transform of a received signal. The method further includes determining one or more intrinsic mode functions (IMFs) of the received signal by performing a masking-signal-based empirical mode decomposition (EMD) using the at least one masking signal.
    Type: Grant
    Filed: May 21, 2008
    Date of Patent: March 15, 2011
    Inventors: Nilanjan Senroy, Siddharth Suryanarayanan
  • Patent number: 7908104
    Abstract: The invention provides a method for detecting and managing the status of a plasma processing apparatus with high sensitivity so as to enable long-term stable processing. In a plasma processing apparatus comprising a vacuum processing chamber 10, a plasma generating high frequency power supply 16, and a measurement device unit 3 for estimating the status of the apparatus via reflected waves 54 of the incident waves 53 reflected from the processing apparatus including a waveform generator 32, a VCO 33, a directional coupler 34, a detector 35 and a measurement data processing unit 36, frequency-swept high frequency waves 53 for measurement are introduced to the processing chamber where no plasma discharge is performed, so as to monitor the change of absorption spectrum frequency of the reflected waves 54 to thereby monitor the change in status of the processing apparatus.
    Type: Grant
    Filed: February 4, 2008
    Date of Patent: March 15, 2011
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Tsutomu Tetsuka, Naoshi Itabashi, Atsushi Itou
  • Patent number: 7904263
    Abstract: The invention disclosed herein provides a computer implementable method for characterizing signals in a frequency domain spectrum where such signals may be a wideband signal while individually being of varied formats such as tones, analog modulation, digital modulation, etc. The invention employs statistical probability models where mean, standard deviation, histograms, and probability density functions are analogous to center frequency, bandwidth, frequency spectrum, and signal models, respectively. The invention reconstructs a frequency spectrum showing signals of interest.
    Type: Grant
    Filed: September 24, 2008
    Date of Patent: March 8, 2011
    Assignee: The United States of America as represented by the Secretary of the Air Force
    Inventor: Alfredo Vega Irizarry
  • Patent number: 7888633
    Abstract: The invention relates to mass spectrometers in which ion clouds are stored in two spatial directions by radial forces while oscillating largely harmonically at a mass-specific frequency in a third spatial direction perpendicular to the other two, in a potential minimum, the shape of which is as close to a parabola as possible. Analysis of the oscillation frequencies of these ion clouds, preferably by a Fourier analysis, leads via a frequency spectrum to a mass spectrum. The frequency spectrum is analyzed to identify false signals in the frequency spectrum as harmonics and eliminating them where necessary.
    Type: Grant
    Filed: February 26, 2008
    Date of Patent: February 15, 2011
    Assignee: Bruker Daltonik GmbH
    Inventors: Jochen Franzen, Karsten Michelmann
  • Patent number: 7885774
    Abstract: A system and method for measuring and analyzing power flow parameters in RF-based excitation systems for semi-conductor plasma generators. A measuring probe (8) is connected to an RF transmission line for receiving and measuring voltage (10) and current signals (12) from the transmission line (4). A high-speed sampling process converts the measured RF voltage and current signals into digital signals. The digital signals are then processed so as to reveal fundamental and harmonic amplitude and phase information corresponding to the original RF signals. Multiple measuring probes may be inserted in the power transmission path to measure two-port parameters, and the networked probes may be interrogated to determine input impedance, output impedance, insertion loss, internal dissipation, power flow efficiency, scattering, and the effect of plasma non-linearity on the RF signal.
    Type: Grant
    Filed: May 10, 2006
    Date of Patent: February 8, 2011
    Assignee: Bird Technologies Group Inc.
    Inventor: John D. Swank
  • Publication number: 20110025298
    Abstract: A method, device and computer program product for determining the change in insulating ability of the insulation provided between two objects of an inductively operating element, where at least one of the objects is a winding. The device includes an analyzing unit, which obtains a first frequency spectrum associated with a frequency response to a signal of varying frequency, where the signal of varying frequency can be applied to a first object of the inductively operating element and the frequency response is obtainable from a second object of the inductively operating element, compares the obtained first frequency spectrum with a second reference frequency spectrum, detects a peak in the obtained first frequency spectrum that does not appear in the second reference frequency spectrum, analyzes the shape of the detected peak, and determines the change in insulating ability based on the analyzed shape.
    Type: Application
    Filed: October 14, 2010
    Publication date: February 3, 2011
    Inventor: Uno Gafvert
  • Patent number: 7873486
    Abstract: A spectrogram mask trigger is generated in response to multiple or complex frequency events within a signal being monitored. A sequence of frequency masks over a period of time is generated according to a frequency trajectory, frequency hops or other complex frequency events expected in the signal to form a spectrogram mask. The spectrogram mask is then applied to multiple spectra or spectrogram of the signal to determine whether an anomalous frequency event has occurred within the time period or to identify a particular frequency pattern within the signal. Depending upon the results of the spectrogram mask application, the spectrogram mask trigger is generated for storing a block of data from the signal surrounding the triggering event for further analysis.
    Type: Grant
    Filed: July 29, 2004
    Date of Patent: January 18, 2011
    Assignee: Tektronix, Inc.
    Inventor: Jeffrey D. Earls
  • Publication number: 20110002536
    Abstract: A computerized method and sensor for real-time in-situ measurement of a quality of fibers within a sample containing extraneous material is described herein. The fibers can be cotton, jute, flax, ramie, sisal, hemp, silk, wool, catgut, angora, mohair, alpaca or other natural fiber. The fibers are differentiated from the extraneous material within the sample. One or more positions of the fibers are determined. A multi-spectral reflectance of the fibers at the one or more positions at two or more near infrared wavebands is measured wherein each waveband has a central wavelength and a bandwidth. The two or more central wavelengths are within a range of approximately 1100 nm to 2400 nm, and the bandwidth is within a range of approximately 10 nm to 100 nm. A micronaire level for the fibers is determined based on the measured multi-spectral reflectance.
    Type: Application
    Filed: July 1, 2010
    Publication date: January 6, 2011
    Applicant: THE TEXAS A&M UNIVERSITY SYSTEM
    Inventors: J. Alex Thomasson, Ruixiu Sui
  • Publication number: 20100332171
    Abstract: A tension/speed measuring device comprises a laser driver for driving the oscillation of a semiconductor laser, and a counter for counting interference waveforms included in the output of a photodiode for converting the output of the semiconductor laser into an electrical signal. The counter measures the periods of interference waveforms during a measuring interval, where a frequency distribution for the periods of the interference waveforms during the measuring interval is generated from the measuring results, where a class value wherein the product of the class value and the frequency is a maximum is used as a representative value D0 at the periods of the interference waveform, to calculate a total Ns of the frequencies of the classes that are less than 0.5 times the representative value T0 and to calculate a total Nwn of the frequencies of the classes that are equal to or greater than (n+0.5) times the representative value T0 and less than (n+1.
    Type: Application
    Filed: June 29, 2010
    Publication date: December 30, 2010
    Applicant: YAMATAKE CORPORATION
    Inventor: Tatsuya Ueno
  • Patent number: 7856329
    Abstract: A method of processing data acquired by under-sampling a chirped, sinusoidal waveform comprises complex-heterodyning the under-sampled data with a chirped signal having characteristics similar to the sinusoidal waveform to generate a demodulated signal and analyzing the demodulated signal to determine characteristics of the sinusoidal waveform.
    Type: Grant
    Filed: April 10, 2007
    Date of Patent: December 21, 2010
    Inventors: Tim Niebauer, Aaron Schiel, Derek Van Westrum
  • Patent number: 7848898
    Abstract: Methods for monitoring process drift using plasma characteristics are provided. In one embodiment, a method for monitoring process drift using plasma characteristics includes obtaining metrics of current and voltage information of a first waveform coupled to a plasma during a plasma process formed on a substrate, obtaining metrics of current and voltage information of a second waveform coupled to the plasma during the plasma process formed on the substrate, the first and second waveforms having different frequencies, determining at least one characteristic of the plasma using the metrics obtained from each different frequency waveform, and adjusting the plasma process in response to the determined at least one characteristic of the plasma.
    Type: Grant
    Filed: January 16, 2009
    Date of Patent: December 7, 2010
    Assignee: Applied Materials Inc.
    Inventors: Steven C. Shannon, Daniel J. Hoffman, Jeremiah T. P. Pender, Tarreg Mawari
  • Publication number: 20100305894
    Abstract: A method for determining the frequency distribution of the signal level of a measured signal measured respectively in overlapping observation intervals via a time or frequency raster. The method includes determining the incrementation of a memory cell in a first memory to be implemented for each measured signal level of the measured signal at a value of the time or frequency raster, and un-delayed summation of the incrementation determined for every memory cell of the first memory in every measurement cycle. The method also includes delayed summation of the incrementation determined for every memory cell of the first memory in every measurement cycle, and subtracting the result of the delayed summation of the incrementation determined for every memory cell of the first memory in every measurement cycle from the result of the un-delayed summation of the incrementation determined for every memory cell of the first memory in every measurement cycle.
    Type: Application
    Filed: September 6, 2007
    Publication date: December 2, 2010
    Applicant: ROHDE & SCHWARZ GMBH & CO. KG
    Inventor: Kurt Schmidt
  • Publication number: 20100299092
    Abstract: A fundamental wave beat component frequency detecting method includes steps of obtaining the frequency fb[i] of plural peak signals which appear in a band ½ of a frequency fs from a spectrum obtained from measuring target signals sampled with the sampling frequency fs in order to detect the repetition frequency (fundamental wave component) of the measuring target signal having plural harmonic components having a similar power, assuming that each of the plural peak signals is a beat component (fundamental wave beat component) originating from the fundamental wave of the measuring target signal before and after the sampling frequency is changed so as to successively calculate each theoretical frequency fc[i,j] of the beat component (harmonic beat component) originating from the harmonic component of the measuring target signal, successively comparing the each theoretical frequency fc[i,j] with the frequency fb[i] of the plural peak signals, and determining that the peak signal which gives the theoretical freque
    Type: Application
    Filed: April 4, 2008
    Publication date: November 25, 2010
    Inventor: Yukio Tsuda
  • Patent number: 7838825
    Abstract: The present invention provides a novel approach for reliably and accurately detecting and identifying airborne particles. This is done by providing a novel system which incorporates electrostatic concentrators and/or ion mobility separators with Raman, IR, UV, XRF, LIF and LIBS spectroscopy and/or other spectroscopic techniques.
    Type: Grant
    Filed: February 13, 2007
    Date of Patent: November 23, 2010
    Assignee: Ahura Scientific Inc.
    Inventors: Daryoosh Vakhshoori, Peili Chen
  • Publication number: 20100276578
    Abstract: A method of determining degree of aging of an incompletely cured polymer resin material collecting IR spectra on a series of standards with carefully controlled aging time and data collected at appropriate time intervals with the standard LC method for determining cure condition of the material, using said spectra and LC data to make a multivariate calibration model and using said model to predict the cure condition of uncured samples of interest.
    Type: Application
    Filed: September 22, 2008
    Publication date: November 4, 2010
    Inventors: Paul H. Shelley, Gregory J. Werner, Joe Baratto
  • Publication number: 20100274511
    Abstract: Provided is a signal analysis device that has a high frequency resolution not depending on an analysis window length and can analyze a frequency with considerably high accuracy. When the signal analysis device inputs therein an analysis object signal to be analyzed, the device obtains a frequency f?, amplitude A? and an initial phase ?? such that the sum of squares of a difference between the analysis object signal and a sinusoidal model signal expressed by a phase using the frequency f? and the initial phase ?? and by the amplitude A? is a minimum value.
    Type: Application
    Filed: September 17, 2008
    Publication date: October 28, 2010
    Applicant: National University Corporation University of Toyama
    Inventor: Shigeki Hirobayashi
  • Patent number: 7822565
    Abstract: A system and method for monitoring RF power is described. In one embodiment the system samples RF power that is generated by an RF generator to obtain RF signals that include information indicative of electrical characteristics at a plurality of particular frequencies that fall within a frequency range. The RF signals are digitized to obtain a stream of digital RF signals that include information indicative of electrical characteristics at the plurality of particular frequencies, and the information indicative of electrical characteristics is successively transformed, for each of the plurality of particular frequencies, from a time domain into a frequency domain.
    Type: Grant
    Filed: December 31, 2007
    Date of Patent: October 26, 2010
    Assignee: Advanced Energy Industries, Inc.
    Inventors: Victor Brouk, Jeff Roberg
  • Publication number: 20100268497
    Abstract: A portable system having a function of measurement includes a conductive structure and a mobile communication device. The conductive structure is plugged into a earphone socket of the mobile communication device for measuring a electric signal of an object. Next, the result of the measurement can be shown on a display or broadcasted on a speaker of the mobile communication device.
    Type: Application
    Filed: April 21, 2010
    Publication date: October 21, 2010
    Inventor: Ke-Ren PENG
  • Publication number: 20100268499
    Abstract: In an interferometer system and a method for its operation, the interferometer system includes an interferometer having an interferometer light source whose emitted radiation is able to be split into a measuring arm and a reference arm, an object to be measured being disposed in the measuring arm, and the interferometer delivering interferometer signals as a function of the position of the object to be measured. In addition, a detecting device is provided for detecting fluctuations in the refractive index of the air in the measuring arm and/or reference arm. The detecting device includes a spectrometer unit; the spectrometer unit has at least one spectrometer light source, as well as at least one spectrometer detector unit.
    Type: Application
    Filed: October 1, 2008
    Publication date: October 21, 2010
    Inventor: Wolfgang Holzapfel
  • Publication number: 20100256938
    Abstract: The invention relates according to a first aspect to an interferometric inversion method for measuring a characteristic variable of a radiation source and/or of a medium through which the radiation passes between the source and an interferometer, the interferometer being capable of generating an interferogram of the radiation by creating a finite number of optical step differences between two rays that have followed the same path between the source and the interferometer, characterized by the implementation of the steps whereby a quantity characterizing an improvement in the inversion is determined, step differences that contribute mainly to optimizing the quantity characterizing an improvement in the inversion are selected without sampling regularity constraints, and a free interferogram is generated using only the selected step differences. According to a second aspect, the invention provides an interferometer for implementing the method according to the first aspect of the invention.
    Type: Application
    Filed: November 5, 2008
    Publication date: October 7, 2010
    Applicant: CENTRE NATIONAL D'ETUDES SPATIALES
    Inventors: Alain Rosak, Clémence Pierangelo
  • Patent number: 7808395
    Abstract: A method of and a system for detecting a person occupying a vehicle seat or a corresponding underlay whereby the underlay is provided with a single dynamic sensor and whereby the measurement signal is compared with a reference signal in comparing means, wherein the system comprises first measuring means for measuring a first measurement signal in a first frequency band representing a signal for human presence, and second measuring means for measuring the reference signal as a second measurement signal in a second frequency band representing a signal for background noise, comparing means for indicating an occupancy, wherein the signal strength in the first measurement signal in the first frequency band of human presence signal domination is compared to the signal strength in the reference signal in the second frequency band where essentially only background noise exists.
    Type: Grant
    Filed: November 9, 2007
    Date of Patent: October 5, 2010
    Assignee: Emfit Oy
    Inventors: Heikki Raisanen, Tomi Virtanen
  • Publication number: 20100243916
    Abstract: A modular system for optical diagnosis of a sample includes a portable optical probe, a light source, a filter, and a gain detector. A first optical element releasably, optically couples the optical probe to the light source. A second optical element releasably, optically couples the optical probe to the filter and a third optical element releasably, optically couples the filter to the gain detector. The optical probe receives an optical signal from the light source via the first optical element and directs the optical signal onto the sample, thereby inducing fluorescence emission from the sample. The optical probe receives the fluorescence emission from the sample and transmits to the filter via the second optical element. The filter transmits the fluorescence emission to the gain detector via the third optical element. The optical head includes a beam splitter which reflects the fluorescence emission from the sample to the filter.
    Type: Application
    Filed: March 23, 2010
    Publication date: September 30, 2010
    Applicant: Lockheed Martin Corporation
    Inventors: Scott Maurer, Stephanie Groves, Kee Koo
  • Publication number: 20100250170
    Abstract: A method of wirelessly interrogating a sensing device comprising a plurality of passive sensors, to determine a measurement parameter, comprises the steps of repeatedly interrogating the sensing device using a predetermined transmission signal and detecting the response; estimating the measurement parameter for each sensor by means of an analysis of the data accumulated as a result of the interrogation step, and determining the average of the parameters derived from the estimating step for each sensor, using a weighted average, in which the weightings depend on the amplitude of the sensor response. The measurement parameter may be a resonant frequency where the passive sensors are resonant devices, and the sensors may be SAW devices.
    Type: Application
    Filed: March 22, 2010
    Publication date: September 30, 2010
    Inventors: Victor Alexandrovich Kalinin, John Peter Beckley, Bryn James Dixon
  • Publication number: 20100235124
    Abstract: A method is disclosed for triggering upon signal events occurring in frequency domain signals. The method includes repeatedly sampling a time-varying signal and generating a plurality of digital frequency domain spectrums based on the samples of the time-varying signal. A frequency domain bitmap for the time-varying signal is repeatedly updated via application of the digital frequency domain spectrums. The method further includes selecting a portion of the frequency domain bitmap, determining a signal occupancy in the selected portion, and triggering a capture of the time-varying signal based on and in response to the occupancy determination for the selected portion of the bitmap.
    Type: Application
    Filed: October 2, 2009
    Publication date: September 16, 2010
    Applicant: TEKTRONIX, INC.
    Inventors: ROBERT E. TRACY, KATHRYN A. ENGHOLM, ALFRED K. HILLMAN, JR.
  • Patent number: 7792644
    Abstract: A frequency selective surface (FSS) and associated methods for modeling, analyzing and designing the FSS are disclosed. The FSS includes a pattern of conductive material formed on a substrate to form an array of resonance elements. At least one aspect of the frequency selective surface is determined by defining a frequency range including multiple frequency values, determining a frequency dependent permittivity across the frequency range for the substrate, determining a frequency dependent conductivity across the frequency range for the conductive material, and analyzing the frequency selective surface using a method of moments analysis at each of the multiple frequency values for an incident electromagnetic energy impinging on the frequency selective surface. The frequency dependent permittivity and the frequency dependent conductivity are included in the method of moments analysis.
    Type: Grant
    Filed: November 13, 2007
    Date of Patent: September 7, 2010
    Assignee: Battelle Energy Alliance, LLC
    Inventors: Dale K. Kotter, David T. Rohrbaugh
  • Patent number: 7781729
    Abstract: A method for analyzing data from a mass spectrometer comprising obtaining calibrated continuum spectral data by processing raw spectral data; obtaining library spectral data which has been processed to form calibrated library data; and performing a least squares fit, preferably using matrix operations (equation 1), between the calibrated continuum spectral data and the calibrated library data to determine concentrations of components in a sample which generated the raw spectral data. A mass spectrometer system (FIG. 1) that operates in accordance with the method, a data library of transformed mass spectra, and a method for producing the data library.
    Type: Grant
    Filed: May 27, 2007
    Date of Patent: August 24, 2010
    Assignee: Cerno Bioscience LLC
    Inventors: Yongdong Wang, Ming Gu
  • Patent number: 7778785
    Abstract: There is provided a measuring apparatus for measuring a signal-to-noise ratio of a discrete waveform which is output from an AD converter in response to an input signal, where the signal-to-noise ratio indicates a ratio of a signal component of the input signal to noise generated by the AD converter. The measuring apparatus includes a spectrum compensating section that receives a spectrum of the discrete waveform output from the AD converter, and compensates the received spectrum in accordance with a non-symmetric sideband between an upper sideband and a lower sideband of the received spectrum, where the upper and lower sidebands are defined with respect to a fundamental frequency of the input signal, and a phase noise waveform calculating section that calculates a phase noise waveform of the discrete waveform based on the spectrum which has been compensated by the spectrum compensating section.
    Type: Grant
    Filed: February 14, 2008
    Date of Patent: August 17, 2010
    Assignee: Advantest Corporation
    Inventors: Takahiro Yamaguchi, Masayuki Kawabata, Mani Soma, Masahiro Ishida
  • Publication number: 20100204938
    Abstract: A frequency mask trigger having frequency selective amplitude discrimination capability is provided for triggering when selected frequency components of an input signal fail to reach a desired power level. A frame of digital data representing an input signal is transformed into a frequency spectrum having at least one frequency bin, each frequency bin having a power amplitude value. Each power amplitude value is compared to an upper lower reference power levels and a lower reference power level. A trigger signal is generated when the power amplitude value in any frequency bin is above the lower reference power level and below the upper reference power level for a specified time duration.
    Type: Application
    Filed: February 11, 2009
    Publication date: August 12, 2010
    Applicant: TEKTRONIX, INC.
    Inventors: Alfred K. HILLMAN, JR., Thomas C. Hill, III
  • Publication number: 20100204939
    Abstract: A time qualified frequency mask trigger triggers on signals that violate a frequency mask for at least a specified time duration. A frame of digital data representing an input signal is transformed into a frequency spectrum having at least one frequency bin, with each frequency bin having a power amplitude value. A trigger signal is generated when any of the power amplitude values violates an associated reference power level for at least a specified time duration.
    Type: Application
    Filed: February 11, 2009
    Publication date: August 12, 2010
    Applicant: TEKTRONIX, INC.
    Inventors: Alfred K. HILLMAN, JR., Steven L. HARWOOD
  • Patent number: 7773457
    Abstract: Systems and methods are provided for acquiring seismic data using a wireless network and a number of individual data acquisition modules that are configured to collect seismic data and forward data to a central recording and control system. In one implementation, a number of remote modules (301) are arranged in lines. Base station modules (302) receive information from the lines and relay the information to a central control and recording system (303). Radio links operating on multiple frequencies (F1-F12) are used by the modules (301). For improved data transfer rate, radio links from a remote module (301) leap past the nearest remote module to the next module closer to the base station.
    Type: Grant
    Filed: October 4, 2006
    Date of Patent: August 10, 2010
    Assignee: Wireless Seismic
    Inventors: Douglas Crice, Mihai Beffa
  • Publication number: 20100191493
    Abstract: Methods and systems for determining information about a sample are disclosed. The methods can include measuring spectral information for the sample and determining a quantity related to a signal-to-noise ratio for the spectral information, repeating the measuring and determining until a value of the quantity is beyond a threshold value, and comparing the spectral information to reference information to determine the information about the sample.
    Type: Application
    Filed: February 12, 2010
    Publication date: July 29, 2010
    Inventors: Christopher D. Brown, Gregory H. Vander Rhodes
  • Patent number: 7751470
    Abstract: Time correlation of signal to distortion characteristics is achieved by acquiring time domain data for a frequency band representing a communication signal, the communication signal having multiple channels. The time domain data is simultaneously converted to frequency and demodulation domain data in sequential time blocks. The frequency and demodulation domain data are processed to obtain respectively frequency and demodulation domain measurements. The resulting measurements are displayed simultaneously as a function of time for all the time blocks and/or for a selected one of the time blocks. An ACLRogram display provides a display having a time axis and a frequency axis in the form of bars spanning the frequency band for each time block with each bar being divided into frequency sub-bands representing a main channel and adjacent side channels, the shading of each segment of the bar representing a measurement value for that segment.
    Type: Grant
    Filed: February 7, 2005
    Date of Patent: July 6, 2010
    Assignee: Tektronix, Inc.
    Inventors: Steven W. Stanton, John F. Turpin, Christopher D. Larson
  • Patent number: 7741848
    Abstract: A man-portable locator system for locating buried or otherwise inaccessible pipes, conduits, cables, wires and inserted transmitters using detector arrays and stochastic signal processing and similar techniques to analyze and display multiple target objects at differing frequencies in a layered user interface (UI). For example, the locator UI may be adapted to present a target plurality sorted by proximity of target conductor to the locator operator together with other useful information specifying the multiple objects, frequencies and changes in the subterranean landscape by means of a useful combination of graphical, numeric and acoustic representations.
    Type: Grant
    Filed: September 13, 2007
    Date of Patent: June 22, 2010
    Assignee: SeekTech, Inc.
    Inventors: Mark S. Olsson, Michael J. Martin, Ray Merewether, Paul G. Stuart
  • Publication number: 20100153044
    Abstract: To produce data of an initial analysis range and a range zooming a part of it while updating them in parallel. [Means for resolution] A first frequency analysis range and a second frequency analysis range that is narrower than the first one are set with an operation panel 34, etc. A first signal path 171 produces first time domain data of a frequency converted signal under test according to a first data production rate that is set depending on the first frequency analysis range. A second signal path 172 produces second time domain data of frequency converted signal under test according to a second data production rate that is set depending on the second frequency analysis range and is slower than the first data production rate.
    Type: Application
    Filed: November 11, 2007
    Publication date: June 17, 2010
    Applicant: TEKTRONIX INTERNATIONAL SALES GMBH
    Inventor: Akira Nara
  • Publication number: 20100153045
    Abstract: In a method for measuring a radiation power, an elliptical mirror is prepared so as to have a elliptical spherical space enclosed by a metal wall surface, the space having a rotating axis passing through two focal points. A device under test is placed in a position of one of the two focal points such that a center of radiation of a radio wave substantially coincides with the focal point, and a receiving antenna is placed in an position of an other one of the two focal points. The device under test is caused to radiate a radio wave and the radiated radio wave is reflected at the wall surface to allow the receiving antenna to receive the radio wave. Then, total radiation power of the radio wave is measured at a measurement end of the receiving antenna in accordance with an output signal from the receiving antenna.
    Type: Application
    Filed: March 3, 2010
    Publication date: June 17, 2010
    Applicant: ANRITSU CORPORATION
    Inventors: Tasuku Teshirogi, Aya Hinotani, Takashi Kawamura, Toru Sakuma
  • Patent number: 7738598
    Abstract: An instantaneous frequency measurement (IFM) receiver includes a receiver module for determining a frequency fe of a received signal. Also included is a discrete Fourier transform (DFT) module configured to sum values of digital samples of data in a block of data, wherein the values of the digital samples of data are based on the frequency fe. A confirmation module confirms the frequency fe, if the sum has a value greater than a predetermined threshold. The DFT module is configured to obtain the sum of N-sample points of data which are disposed in the block of data by using a DFT kernel function.
    Type: Grant
    Filed: September 15, 2006
    Date of Patent: June 15, 2010
    Assignee: ITT Manufacturing Enterprises, Inc.
    Inventors: Stuart M. Lopata, James B. Y. Tsui, Maan J. Broadstock, Charles R. Ward
  • Patent number: 7720646
    Abstract: A signal processor and a tracking method of a signal search range are provided which can read out precisely a specific spectrum having frequency varied. A signal processor includes an FFT computation portion to compute spectrum data by fast-Fourier-transforming an input signal, a spectrum selection portion to select a specific spectrum, a spectrum search portion to search sequentially the specific spectrum selected by the spectrum selection portion from the spectrum data computed by the FFT computation portion, and a search range computation portion to compute the search range of the spectrum searched by the spectrum search portion based on the frequency of the specific spectrum, in which the search range computation portion computes the search range based on the varied frequency of the specific spectrum and makes it track the varied specific spectrum, when the frequency of the specific spectrum varies.
    Type: Grant
    Filed: February 6, 2008
    Date of Patent: May 18, 2010
    Assignee: Ono Sokki Co., Ltd.
    Inventor: Tomio Miyano
  • Patent number: 7715996
    Abstract: The present invention is a novel method of performing spectral analysis on a digital signal. The received signal is segmented into a number of data blocks, which may be disjoint or overlapping. For each data block, the signal is differentiated, and the Gram-Schmidt process is used to obtain orthogonality between a signal and its derivative. The complex extension leads to computation of phase using either the inverse tangent function or the complex logarithm. Finally, frequency estimation follows through differentiation of the unwrapped phase.
    Type: Grant
    Filed: September 27, 2007
    Date of Patent: May 11, 2010
    Assignee: The United States of America as represented by the Director of the National Security Agency
    Inventor: Adolf Cusmariu
  • Patent number: 7711452
    Abstract: One embodiment of the present invention provides a system that efficiently conducts vibrational characterizations for a computer system having variable component configurations. During operation, the system receives a given component configuration associated with the computer system. Next, the system looks up the given component configuration in a resonant spectra library, which contains structural resonant frequencies for a number of possible component configurations for the computer system. If the given component configuration is found in the resonant spectra library, the system retrieves a set of structural resonant frequencies associated with the given component configuration. The system subsequently controls one or more vibration sources within the computer system to avoid the set of structural resonant frequencies.
    Type: Grant
    Filed: October 22, 2007
    Date of Patent: May 4, 2010
    Assignee: Oracle America, Inc.
    Inventors: Georgios K. Konstadinidis, Kenny C. Gross, Keith A. Whisnant
  • Patent number: 7711510
    Abstract: A signal processing system compensates for the relative phase difference between multiple frequency bands so that the combination of the bands is constructive throughout a substantial portion of the band overlap or crossover region. In one embodiment, a signal combining system may include a comparator for determining a relative phase difference between the two signals within a predefined crossover region, a phase adjusting element for adjusting a phase of one of the two signals; and a combiner for combining the phase-adjusted signal and the other of the two signals.
    Type: Grant
    Filed: December 19, 2007
    Date of Patent: May 4, 2010
    Assignee: LeCroy Corporation
    Inventor: Peter J. Pupalaikis
  • Patent number: 7706992
    Abstract: The present invention provides a system and method for representing quasi-periodic (“qp”) waveforms comprising, representing a plurality of limited decompositions of the qp waveform, wherein each decomposition includes a first and second amplitude value and at least one time value. In some embodiments, each of the decompositions is phase adjusted such that the arithmetic sum of the plurality of limited decompositions reconstructs the qp waveform. These decompositions are stored into a data structure having a plurality of attributes. Optionally, these attributes are used to reconstruct the qp waveform, or patterns or features of the qp wave can be determined by using various pattern-recognition techniques. Some embodiments provide a system that uses software, embedded hardware or firmware to carry out the above-described method. Some embodiments use a computer-readable medium to store the data structure and/or instructions to execute the method.
    Type: Grant
    Filed: February 23, 2006
    Date of Patent: April 27, 2010
    Assignee: Digital Intelligence, L.L.C.
    Inventors: Carlos A. Ricci, Vladimir V. Kovtun
  • Patent number: RE41618
    Abstract: A method for measuring a bandwidth of a signal path between a data source and a data recipient involves sending a block of test data from the data source along the signal path to the data recipient, using that test data to obtain a measured bandwidth of the signal path, and transferring information from the data source along the signal path to the data recipient in accordance with the measured bandwidth. The measured bandwidth value can be calculated each time the data recipient accesses a website or the measured bandwidth value can be retained for future use.
    Type: Grant
    Filed: November 2, 2006
    Date of Patent: August 31, 2010
    Assignee: Yahoo! Inc.
    Inventor: Alan S. Florschuetz