Frequency Spectrum Patents (Class 702/76)
  • Patent number: 7706993
    Abstract: The invention relates to a peak position correcting method that is a pre-process for testing whether properties of a product, a raw material, etc., are good or defective from a spectrum waveform pattern. The method involves setting a reference peak position in a single region including a spectrum waveform pattern, or setting reference peak positions in each of a plurality of regions; specifying a peak to be corrected as an object of correction in the single region or each of the plurality of regions; shifting the peak to be corrected to the reference peak position in the single region or in each of the plurality of regions; and substantially proportionally expanding or contracting the spectrum waveform pattern positioned at both sides of the peak to be corrected in the horizontal axis direction.
    Type: Grant
    Filed: October 25, 2006
    Date of Patent: April 27, 2010
    Assignee: Angletry Associates
    Inventor: Shoichi Teshima
  • Patent number: 7701195
    Abstract: The process distinguishes image rays and actual rays generated in a frequency converting device from frequency rays of an input signal. The frequency converting device comprises at least a mixer mixing the input signal and a signal provided by a local oscillator and a filter assembly filtering the mixed signals output by the mixer. At least one sweep is carried out wherein the frequency of the local oscillator is varied and wherein the signal level at the output of the frequency converting device is recorded for a set of converted frequencies. A further sweep is carried out so that the frequency of the actual ray generated in the further sweep by an input ray is the same as the frequency of the actual ray generated in said at least one sweep by said input ray and the frequency of the image ray generated in said further sweep by any input ray does not correspond to a frequency for which a ray was generated in each of said at least one sweep.
    Type: Grant
    Filed: November 10, 2005
    Date of Patent: April 20, 2010
    Assignee: Advantest Corporation
    Inventor: Jacky Griffault
  • Publication number: 20100094577
    Abstract: Spectrum measurement circuit (101) includes: N- (where N is integer equal or greater than 2) phase clock generation circuit (304) for supplying phase-modulated signals in which the phase of a clock signal is shifted by a phase modulation amount each time the settings of the phase modulation amount are switched; mixer circuit (303) for taking the product of a measured signal supplied from a transmitter and the phase-modulated signals supplied from N-phase clock generation circuit (304); average value output circuit (305) for supplying an average voltage value of the output signal of mixer circuit (303); memory (307) for storing the average voltage value supplied from average value output circuit (305) for each phase modulation amount of the N-phase clock generation circuit (304); and arithmetic unit (308) for using the average voltage value for each phase modulation amount of N-phase clock generation circuit (304) to calculate the signal strength of the measured signal.
    Type: Application
    Filed: December 18, 2007
    Publication date: April 15, 2010
    Inventors: Koichi Nose, Masayuki Mizuno
  • Patent number: 7698080
    Abstract: Methods for determining the most likely composition of sample are disclosed. The methods can include: obtaining data from a sample, where the data includes a representation of a measured spectrum; determining a precision state of the representation of the measured spectrum; providing a plurality of library candidates; for each library candidate, providing data representing each library candidate, where the data includes a representation of a library spectrum; determining a representation of the similarity of the sample to each library candidate; determining the most likely composition of the sample based upon the determined representations of similarity of the sample to each library candidate; and displaying the most likely composition of the sample to a user.
    Type: Grant
    Filed: August 7, 2007
    Date of Patent: April 13, 2010
    Assignee: Ahura Corporation
    Inventors: Christopher D. Brown, Gregory H. Vander Rhodes
  • Patent number: 7682311
    Abstract: Phase unwrapping is applied to velocity data to remove aliasing artifacts. Phase unwrapping is applied on multidimensional regions of velocity data. The unwrapped velocity image is displayed. The displayed image may have high sensitivity to slow motion but may also avoid aliasing of fast motion despite being undersampled.
    Type: Grant
    Filed: September 22, 2005
    Date of Patent: March 23, 2010
    Assignee: Siemens Medical Solutions USA, Inc.
    Inventors: Constantine Simopoulos, Kutay F. Ustuner
  • Publication number: 20100070227
    Abstract: Illustrative embodiments provide systems, applications, apparatuses, computer software program products, and methods related to identification of electrical appliances by electrical characteristics.
    Type: Application
    Filed: October 30, 2008
    Publication date: March 18, 2010
    Inventors: Roderick A. Hyde, Jordin T. Kare, Lowell L. Wood, JR.
  • Publication number: 20100070225
    Abstract: Illustrative embodiments provide systems, applications, apparatuses, computer software program products, and methods related to identification of electrical appliances by electrical characteristics.
    Type: Application
    Filed: October 30, 2008
    Publication date: March 18, 2010
    Inventors: Roderick A. Hyde, Jordin T. Kare, Lowell L. Wood, JR.
  • Publication number: 20100070226
    Abstract: Log chirp testing where a log chirp may be provided to a device under test and a first time domain response from the device under test may be received. The first time domain response may be in the time domain. The first time domain response may be converted to the angular domain to create an angular domain response. Converting to the angular domain response may include resampling the time domain response from the time domain to the angular domain. The angular domain response may be filtered and/or analyzed. The angular domain response may be converted to a second time domain response. Similar to above, the conversion may include resampling the angular domain response from the angular domain to the time domain. The first time domain response and the second time domain response may be analyzed. Testing results of the device under test may be generated and stored based on said analyzing.
    Type: Application
    Filed: January 13, 2009
    Publication date: March 18, 2010
    Inventors: Jack Harris Arnold, Douglas Scott Bendele, Xianglin Mo, Chen Zhang
  • Patent number: 7680614
    Abstract: The invention relates to a method for determining the humidity and/or density of a dielectric material in a resonator that is filled with said material and that contains a transmitter and a receiver. According to said method: the transmitter emits a signal; a resonance curve of the filled resonator is scanned in stages, whereby respective signal intensity values (Ui) are measured at different frequencies (fi); the resonant frequency (frm) and the bandwidth (BWm) are determined for the filled resonator from measured points (fi/Ui); and the humidity (?) and/or density (?) of the material are calculated by solving a second system of equations (G2), containing the resonant frequencies (fr0, frm) and bandwidths (BW0, BWm) of the empty and filled resonators and known calibration coefficients (ar1, ar2, br1, br2, cr1, cr2, abw1, abe2, bbw1, bbw2, cbw1, cbw2) of said resonator. The aim of the invention is to provide a method for determining the humidity independently of the density in a rapid, precise manner.
    Type: Grant
    Filed: October 27, 2004
    Date of Patent: March 16, 2010
    Assignee: Sartorius AG
    Inventors: Klaus Kupfer, Eberhard Trinks
  • Patent number: 7676336
    Abstract: According to an inventive scheme for introducing a watermark into an information signal, the information signal is at first transferred from a time representation to a spectral/modulation spectral representation). The information signal is then manipulated in the spectral/modulation spectral representation in dependence on the watermark to be introduced to obtain a modified spectral/modulation spectral representation, and subsequently an information signal provided with a watermark is formed based on the modified spectral/modulation spectral representation. An advantage is that, due to the fact that the watermark is embedded and/or derived in the spectral/modulation spectral representation or range, traditional correlation attacks as are used in watermark methods based on a spread-band modulation cannot succeed easily.
    Type: Grant
    Filed: October 30, 2006
    Date of Patent: March 9, 2010
    Assignee: Fraunhofer-Gesellschaft zur Foerderung der Angewandten Forschung E.V.
    Inventors: Juergen Herre, Ralph Kulessa, Sascha Disch, Karsten Linzmeier, Christian Neubauer, Frank Siebenhaar
  • Patent number: 7671343
    Abstract: Mass analysis method and mass spectrometer in which the S/N of mass spectra does not deteriorate due to accumulation if an ionization method, such as MALDI, producing spectral intensities that are not uniform in time is employed. Every given number of collected mass spectra are accumulated and stored to produce primary accumulation mass spectra. After the measurements, some of the stored primary accumulation spectra are selected according to a given rule based on a time trace of the intensities of the primary accumulation mass spectra. The selected spectra are accumulated to produce a secondary accumulation mass spectrum.
    Type: Grant
    Filed: September 12, 2007
    Date of Patent: March 2, 2010
    Assignee: JEOL Ltd.
    Inventor: Takaya Satoh
  • Patent number: 7657387
    Abstract: A data compression technique is disclosed for Fourier Transform Mass Spectrometry (FTMS). A statistical analysis is applied to the data in the frequency domain since most of this data is a result of randomly distributed electronic noise. A fit of the whole frequency dataset to the distribution is made to determine preliminary moments of the distribution. The data in the tail of that distribution (which is mainly the peak data) is then removed and the remaining data points are re-fitted to the distribution, to identify the moments of distribution of that remaining noise data. A noise threshold for the mass spectrum is then applied using the calculated moments. The data above the threshold is kept. The whole spectrum can be reconstituted by storing the moments of distribution along with the peak data and then regenerating the noise from those moments and adding it to the peak data.
    Type: Grant
    Filed: September 23, 2004
    Date of Patent: February 2, 2010
    Assignee: Thermo Finnigan LLC
    Inventors: Robert Malek, Oliver Lange
  • Patent number: 7653493
    Abstract: Analysis of a group of proteomic samples is facilitated. According to an example embodiment of the present invention, ion mass spectrometry data is collected for a group of samples. For each sample, at least one grouping of ions is identified and used to generate another estimated grouping of ions relating to the sample. Using these groupings, characteristics of the sample are detected.
    Type: Grant
    Filed: February 26, 2007
    Date of Patent: January 26, 2010
    Assignee: The Board of Trustees of the Leland Stanford Junior University
    Inventors: Evelyn W. Wang, Matt Brown, Neil Chungfat, Sucharita Dutta, Sean Mathewson
  • Patent number: 7653514
    Abstract: A method for improving bandwidth of an oscilloscope involves, in preferred embodiments, the use of frequency up-conversion and down-conversion techniques. In an illustrative embodiment the technique involves separating an input signal into a high frequency content and a low frequency content, down-converting the high frequency content in the analog domain so that it may be processed by the oscilloscope's analog front end, digitizing the low frequency content and the down-converted high frequency content, and forming a digital representation of the received analog signal from the digitized low frequency content and high frequency content.
    Type: Grant
    Filed: April 15, 2008
    Date of Patent: January 26, 2010
    Assignee: LeCroy Corporation
    Inventors: Peter J. Pupalaikis, David C. Graef
  • Patent number: 7645984
    Abstract: Chromatograms and mass spectra produced by an LC/MS system are analyzed by creating a two-dimensional data matrix of the spectral and chromatographic data. The two-dimensional matrix can be created by placing the spectra generated by the mass spectrometer portion of the LC/MS system in successive columns of the data matrix. In this way, the rows of the data matrix correspond to chromatographic data and the columns of the data matrix correspond to the spectra. A two-dimensional filter is specified and applied to the data matrix to enhance the ability of the system to detect peaks associated with ions. The two-dimensional filter is specified according to desired criteria. Rank-1 and rank-2 filters can be specified to improve computational efficiency. One method of applying the two-dimensional filter is through convolution of the data matrix with the two-dimensional filter to produce an output data matrix. Peaks corresponding to detected ions are identified in the output data matrix.
    Type: Grant
    Filed: February 11, 2005
    Date of Patent: January 12, 2010
    Assignee: Waters Technologies Corporation
    Inventors: Marc V. Gorenstein, Robert S. Plumb, Chris L. Stumpf
  • Patent number: 7643952
    Abstract: A method processes an optical image. The method includes providing a measured magnitude of the Fourier transform of a two-dimensional complex transmission function. The method further includes providing an estimated phase term of the Fourier transform of the two-dimensional complex transmission function. The method further includes multiplying the measured magnitude and the estimated phase term to generate an estimated Fourier transform of the two-dimensional complex transmission function. The method further includes calculating an inverse Fourier transform of the estimated Fourier transform, wherein the inverse Fourier transform is a spatial function. The method further includes calculating an estimated two-dimensional complex transmission function by applying at least one constraint to the inverse Fourier transform.
    Type: Grant
    Filed: April 3, 2006
    Date of Patent: January 5, 2010
    Assignee: The Board of Trustees of the Leland Stanford Junior University
    Inventors: Aydogan Ozcan, Michel J. F. Digonnet, Gordon S. Kino
  • Publication number: 20090326845
    Abstract: There is provided a probability density function separating apparatus that separates a predetermined component in a given probability density function, including: a domain transforming section that is supplied with the probability density function and transforms the probability density function into a spectrum in a frequency domain; and a standard deviation computing section that computes standard deviation of a random component included in the probability density function based on the spectrum.
    Type: Application
    Filed: March 21, 2007
    Publication date: December 31, 2009
    Applicant: ADVANTEST CORPORATION
    Inventors: TAKAHIRO YAMAGUCHI, HARRY HOU, DAVE ARMSTRONG
  • Patent number: 7636638
    Abstract: A system for combining the spectral data from multiple ionizing radiation detectors of different types and having different photopeak energy resolutions. First, baseline estimation is performed on each spectral histogram separately, discerning peak regions from underlying continuum using respective peak response functions. All spectra are subsequently rebinned to the same energy calibration and the peak spectra are convolved to produce a single convolution spectrum. All peak counts are redistributed locally according to the convolution spectrum in energy regions proportional to respective local energy resolution. The summation of these redistributed peak spectra can then be analyzed as a single spectrum using a common photopeak response and energy calibration. This process can be embodied in software or firmware. A preferred hybrid system might include a combination of lower resolution, higher efficiency detectors and higher resolution, lower efficiency detectors.
    Type: Grant
    Filed: November 27, 2007
    Date of Patent: December 22, 2009
    Assignee: Canberra Industries, Inc.
    Inventors: William Robert Russ, Massimo Morichi
  • Publication number: 20090312971
    Abstract: An apparatus for locating inferior parts in distribution line equipment may include a wireless noise receiver for continually receiving multiple noise-free frequencies and converting the received multiple noise-free frequencies into an audio frequency signal, a signal processor for quantifying a power frequency and harmonic frequencies of the audio frequency signal, a signal analyzer for calculating variation of the power frequency and the harmonic frequencies, determining the number of changed frequencies based on the calculated variation, detecting a radio frequency noise signal generated from an inferior part based on the calculated variation and the number of changed frequencies, and a frequency calibrator for determining a noise-free band, selecting the multiple noise-free frequencies from the noise-free band, and managing a list of the selected multiple noise-free frequencies.
    Type: Application
    Filed: June 12, 2009
    Publication date: December 17, 2009
    Inventor: Hyun-Chang Lee
  • Publication number: 20090310730
    Abstract: A frequency detector includes an error measurement unit measuring a time interval between zero-crossing points of an input signal that is modulated. An error conversion unit quantizes the measured time interval using one of modulation time intervals. An error calculation unit calculates a frequency error based upon a difference between the measured time interval and the quantized time interval. An error generation control unit controls whether to output the frequency error based upon the quantized time interval, the calculated frequency error, and a predetermined critical value.
    Type: Application
    Filed: April 27, 2009
    Publication date: December 17, 2009
    Inventors: Sergey Zhidkov, Jun Ho Huh, Ki Seop Kwon
  • Patent number: 7634372
    Abstract: A method and a related apparatus for monitoring an external surface of stranded cables, such as submarine cables for optical telecommunications, and electrical energy cables, provide for telemetrically acquiring a profile of the cable external surface by means of a laser optical triangulation technique, obtaining a spectrum of the telemetrically-acquired profile and comparing the obtained spectrum to a previously measured reference spectrum corresponding to a cable free of defects, thereby deducing the presence of defects by differences in the spectra.
    Type: Grant
    Filed: September 2, 2002
    Date of Patent: December 15, 2009
    Assignee: Prysmian Cavi E Sistemi Energia S.R.L.
    Inventors: Valter Castiglioni, Feliciano Cecchi, Francesco Becchi
  • Patent number: 7630861
    Abstract: A field mountable dedicated process diagnostic device is used for diagnosing operation of an industrial control or monitoring system. An input is configured to receive at least one process signal related to operation of the industrial process. A memory contains diagnostic program instructions configured to implement a diagnostic algorithm using the process signal. The diagnostic algorithm is specific to the industrial process. A microprocessor performs the diagnostic program instructions and responsively diagnoses operation of the process based upon the process signal.
    Type: Grant
    Filed: May 25, 2006
    Date of Patent: December 8, 2009
    Assignee: Rosemount Inc.
    Inventors: Randy J. Longsdorf, Scott D. Nelson, Dale S. Davis, Richard L. Nelson, Amy K. Johnson, Gregory C. Brown
  • Publication number: 20090299665
    Abstract: The invention disclosed herein provides a computer implementable method for characterizing signals in a frequency domain spectrum where such signals may comprise a wideband signal while individually being of varied formats such as tones, analog modulation, digital modulation, etc. The invention employs statistical probability models where mean, standard deviation, histograms, and probability density functions are analogous to center frequency, bandwidth, frequency spectrum, and signal models, respectively. The invention reconstructs a frequency spectrum showing signals of interest.
    Type: Application
    Filed: September 24, 2008
    Publication date: December 3, 2009
    Inventor: Alfredo Vega Irizarry
  • Patent number: 7626693
    Abstract: Methods for generating a customized spectral profile, which can be used to generate a corresponding filter, lamp or other type of illuminant. A trial spectrum is generated. A reference spectrum is determined or otherwise obtained. A SOURCE spectrum is determined or otherwise obtained. One or more optical indices are calculated using the trial spectrum and one or more of the optical indices are optimized by varying the trial spectrum to generate the customized spectral profile. A radiation force parameter can be used to minimize unsafe build-up of light in spectral regions. Adaptations of color rendering parameters can be used in the optimization process. Smoothing parameters can be used to enable easier design of filter structures. A reflectance camera can be used to measure reflectance data at one or more pixels of a digital representation of an object to be illuminated.
    Type: Grant
    Filed: September 21, 2005
    Date of Patent: December 1, 2009
    Assignee: Board of Regents, The University of Texas System
    Inventor: Carl W. Dirk
  • Patent number: 7623974
    Abstract: A system for detecting the onset of structural failure in a structural element subject to a mechanical load comprises a metering array, a signal processor, and an output processor. The metering array measures physical quantities associated with the structural element. The signal processor transforms the measured physical quantities into a series of sample mode spectra, and the output processor generates output as a function of the series of sample mode spectra. Methods are also disclosed for detecting the onset of failure in a structural element subject to a mechanical load, for structural testing, and for structural health monitoring.
    Type: Grant
    Filed: January 30, 2007
    Date of Patent: November 24, 2009
    Assignee: Pratt & Whitney Rocketdyne, Inc.
    Inventor: Dale O. Cipra
  • Patent number: 7619731
    Abstract: A method of measuring a damaged structure formed on a semiconductor wafer using optical metrology includes directing an incident beam on the damaged structure. A diffracted beam is received from the damaged structure. The received diffracted beam is processed to determine a profile of an undamaged portion of the damaged structure and to measure an amount of dielectric damage of the damaged structure.
    Type: Grant
    Filed: March 30, 2006
    Date of Patent: November 17, 2009
    Assignee: Tokyo Electron Limited
    Inventors: Kevin Lally, Merritt Funk, Radha Sundararajan
  • Patent number: 7620509
    Abstract: A frequency hopping pattern of a frequency hopping signal is detected by use of spectrogram-generating software in a digital storage oscilloscope. By using a spectrogram, a hopping pattern can be determined without having to demodulate the signal, recover the phase or frequency of the carrier, determine optimal sample timing, or determine system timing. A block of data that contains at least one repetition of the hopping pattern in analyzed with respect to known hopping patterns as well as with respect to the duration in time of the relevant symbols of that data.
    Type: Grant
    Filed: October 23, 2006
    Date of Patent: November 17, 2009
    Assignee: Tektronix, Inc.
    Inventor: Richard A. Cameron
  • Patent number: 7620511
    Abstract: Methods for determining characteristics of a plasma are provided. In one embodiment, a method for determining characteristics of a plasma includes obtaining metrics of current and voltage information for first and second waveforms coupled to a plasma at different frequencies, determining at least one characteristic of the plasma using the metrics obtained from each different frequency waveform. In another embodiment, the method includes providing a plasma impedance model of a plasma as a function of frequency, and determining at least one characteristic of a plasma using model. In yet another embodiment, the method includes providing a plasma impedance model of a plasma as a function of frequency, measuring current and voltage for waveforms coupled to the plasma and having at least two different frequencies, and determining ion mass of a plasma from model and the measured current and voltage of the waveforms.
    Type: Grant
    Filed: June 5, 2007
    Date of Patent: November 17, 2009
    Assignee: Applied Materials, Inc.
    Inventors: Steven C. Shannon, Daniel J. Hoffman, Jeremiah T. P. Pender, Tarreg Mawari
  • Patent number: 7620508
    Abstract: A technique for generating and detecting an EM signal in the THz range involves generating EM energy having multiple modes, selecting at least two of the modes of the EM energy to provide a multi-mode EM signal, subjecting the multi-mode EM signal to mixing, and isolating a beat signal component that results from the mixing. The spacing between adjacent ones of the selected modes, i.e., the frequency difference between the modes, is in the radio frequency (RF) or microwave frequency ranges. Signals in these ranges are commonly processed using electronic circuits at room temperature.
    Type: Grant
    Filed: January 27, 2005
    Date of Patent: November 17, 2009
    Assignee: Agilent Technologies, Inc.
    Inventors: Danielle R. Chamberlin, Peter R. Robrish
  • Patent number: 7616721
    Abstract: In an apparatus and method for checking a network synchronization clock signal in a communication system, the apparatus generates a divided clock signal which is the same as an externally inputted network synchronization clock signal, compares the value of one period of the network synchronization clock signal to the value of one period of the divided clock signal, and determines whether the network synchronization clock signal is normal or not. Thus, the reliability of an operation of checking the network synchronization clock signal is enhanced.
    Type: Grant
    Filed: December 8, 2006
    Date of Patent: November 10, 2009
    Assignee: Samsung Electronics Co., Ltd.
    Inventor: Tae-Young Lee
  • Publication number: 20090254292
    Abstract: In a frequency analysis system, such as a signal detection system or a spectrum analyzer, the frequency domain resolution is enhanced by compression and decompression of the signal samples. The limited capacity of the data storage and/or data transfer resources limit the number of samples that can be stored or transferred. A compressor forms a compressed signal prior to data transfer or storage. A decompressor decompresses the compressed signal prior to transformation to the frequency domain, by a fast Fourier transform or other frequency domain transform. The frequency domain resolution is enhanced because more decompressed samples are available for the frequency domain transform. The compressor and decompressor apply computationally efficient algorithms that can be implemented to operate in real time.
    Type: Application
    Filed: May 28, 2009
    Publication date: October 8, 2009
    Applicant: Samplify Systems, Inc.
    Inventor: Albert W. Wegener
  • Publication number: 20090240452
    Abstract: Disclosed are embodiments of a system and a method that allow for wireless and dynamic intra-process (i.e., during and/or between process steps) measurements of integrated circuit parameters. The embodiments incorporate the use of a passive circuit, such as an inductor-capacitor-resistor (LCR) circuit resonator, that has a predetermined sensitivity to process variations in one or more physical or electrical integrated circuit parameters. The passive circuit can be wirelessly interrogated between and/or process steps. Then, the actual behavior exhibited by the passive circuit in response to the interrogation is compared to the expected behavior of an optimal circuit in the absence of process variations in order to determine the one or more parameters. Also disclosed is an embodiment of an exemplary passive circuit that can be used to implement the disclosed system and method embodiments.
    Type: Application
    Filed: March 24, 2008
    Publication date: September 24, 2009
    Inventors: Theodoros E. Anemikos, Phillip L. Corson, Mete Erturk, Ezra D.B. Hall, Anthony J. Perri, Sebastian T. Ventrone
  • Patent number: 7587015
    Abstract: The present invention provides asynchronous digital capture by first, capturing the digital output of the device under test (DUT) clock on an automated test equipment (ATE) digital channel. Next, the NRZ output data of the DUT is captured while the clock signal is captured on adjacent ATE channels. Next, the digital clock data is analyzed such that a frequency spectrum is generated. From the spectrum, the frequency and phase of the clock is calculated. From the clock frequency, the number of device cycles captured is determined. From the phase of the clock, the captured data is aligned with the clock data to determine which device cycles have been oversampled.
    Type: Grant
    Filed: February 15, 2006
    Date of Patent: September 8, 2009
    Assignee: Verigy (Singapore) Pte. Ltd.
    Inventor: Kevin Slaboda
  • Patent number: 7576851
    Abstract: A method of creating a library for measuring a plurality of damaged structures formed on a semiconductor wafer using optical metrology includes directing an incident beam on a first damaged structure. The first damaged structure was formed by modifying at least one process parameter in a dual damascene procedure. A diffracted beam is received from the first damaged structure. A measured diffraction signal is obtained based on the received diffracted beam. A first simulated diffraction signal is calculated. The first simulated diffraction signal corresponds to a hypothetical profile of the first damaged structure. The hypothetical profile includes an undamaged dielectric portion and a damaged dielectric portion. The measured diffraction signal is compared to the first simulated diffraction signal.
    Type: Grant
    Filed: March 30, 2006
    Date of Patent: August 18, 2009
    Assignee: Tokyo Electron Limited
    Inventors: Kevin Lally, Merritt Funk, Radha Sundararajan
  • Patent number: 7574313
    Abstract: Processing of information signals separated according to modulation and carrier components in a more controlled way is made possible by a device for processing an information signal including a unit for converting the information signal to a time/spectral representation by block-wise transforming of the information signal and a unit for converting the information signal from the time/spectral representation to a spectral/modulation spectral representation, wherein the unit for converting is designed such that the spectral/modulation spectral representation depends on both a magnitude component and a phase component of the time/spectral representation of the information signal. A unit then performs a manipulation and/or modification of the information signal in the spectral/modulation spectral representation to obtain a modified spectral/modulation spectral representation.
    Type: Grant
    Filed: October 26, 2006
    Date of Patent: August 11, 2009
    Assignee: Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V.
    Inventors: Sascha Disch, Karsten Linzmeier, Juergen Herre
  • Patent number: 7574253
    Abstract: A method for processing signals, such as a tomography signal, in the time domain provides both high spatial resolution and high frequency resolution but at low cost. The method uses non-linear regression with a sinusoidal model to fit a sine wave to a portion of the signal that is less than a full cycle of a wave of the signal.
    Type: Grant
    Filed: September 26, 2003
    Date of Patent: August 11, 2009
    Assignee: Northwestern University
    Inventors: Paul A. Edney, Joseph T. Walsh, Jr.
  • Publication number: 20090192742
    Abstract: The method patented enables increase in reliability of periodicity estimates, and consequently of the natural band (of an object; of a body; of a system; etc.) definition too. The patented method is based on the least squares spectral analysis (LSSA) method. The LSSA has been proven over the past thirty years to be fully able of replacing the Fourier and Fourier-based spectral analysis methods (as the most used methods of spectral analysis in all sciences). The here patented method then uses this known feature of the LSSA as a reliable periodicity estimator, and expands its application by claiming that periodicity estimates generally (in all sciences and in all situations) could be improved by removing a number of measurements from the original dataset. Thus, by removing the least reliable (where ‘least’ is according to some, e.g.
    Type: Application
    Filed: January 30, 2008
    Publication date: July 30, 2009
    Inventor: Mensur Omerbashich
  • Publication number: 20090192741
    Abstract: The method patented enables robust and reliable relative measurements of the dynamics of a physical field (or: of a conceptual system). The patented method extends least squares spectral analysis (LSSA) technique's unique features. The LSSA has been proven over the past thirty years as being able of fully replacing the Fourier and Fourier-based spectral analysis methods (as the most used methods of spectral analysis in all sciences). The patented method uses the known feature of the LSSA as a reliable periodicity estimator, and expands its application by claiming its variance-spectral magnitudes are also most useful in terms of their epochal averages (meaning: averages from variance-spectra of data belonging to successive and equal time-intervals) being directly correlated to the energy levels exciting (i.e., supplied into) the field/system.
    Type: Application
    Filed: January 30, 2008
    Publication date: July 30, 2009
    Inventor: Mensur Omerbashich
  • Publication number: 20090187363
    Abstract: A method for optimization of a frequency spectrum includes the following steps: sampling a time domain signal to obtain an initial sampling signal based upon a first subset of sample points; transforming the initial sampling signal to a frequency domain signal; determining a frequency parameter and an amplitude parameter for each of harmonic components of the frequency domain signal; establishing a leakage energy equation and a graduation shifting quantity; determining an optimum number of sample points that will result in minimum leakage energy; obtaining an adjusted sampling signal based on a second subset of the sample points, wherein the number of the sample points in the second subset is equal to the optimum number; and transforming the adjusted sampling signal to an optimized frequency domain signal having harmonic components associated with graduations of an optimized frequency spectrum, wherein the graduations are calculated based upon the graduation shifting quantity.
    Type: Application
    Filed: January 13, 2009
    Publication date: July 23, 2009
    Applicant: I SHOU UNIVERSITY
    Inventors: Rong-Ching Wu, Ching-Tai Chiang, Yung-Chun Wu
  • Publication number: 20090177423
    Abstract: Disclosed is a method of signal detection. A received input signal is divided into a frame unit and each input signal present in a first frame and a second frame is transformed into a frequency signal. Then, first power spectrum information and second power spectrum information are computed utilizing the transformed frequency signal and a delta spectrum entropy value corresponding to a difference of the two computed power spectrum information is obtained. A predetermined input signal is included in a predetermined frame among the input signal after judging through comparing the delta spectrum entropy value with a critical value. Desired signal can be detected in a noisy environment including a noise signal by using the delta spectrum entropy value.
    Type: Application
    Filed: February 29, 2008
    Publication date: July 9, 2009
    Applicant: SUNGKYUNKWAN UNIVERSITY FOUNDATION FOR CORPORATE COLLABORATION
    Inventors: Kwang-Seok HONG, Yong-Wan Roh, Kue-Bum Lee
  • Publication number: 20090144004
    Abstract: A method for spectral analysis of a signal (s1(t)) in several frequency bands with different frequency resolution adapts the two spectra of the signal (s1(t)) from adjacent frequency bands relative to one another in the transitional range of the two frequency bands. The associated device contains a unit for discrete convolution (3), which implements a smoothing of the discrete power spectra (|S1(k)|2) of the discrete signal (s1(k)) from adjacent frequency bands in the transitional range of the two frequency bands.
    Type: Application
    Filed: September 16, 2005
    Publication date: June 4, 2009
    Inventors: Gregor Feldhaus, Hagen Eckert
  • Patent number: 7539582
    Abstract: An apparatus for detecting spectral components in a predetermined frequency band within a signal includes first and second processing devices and first, second, and third connectors tuned to the frequency band. The first processing device includes first, second, and third elements. The second processing device includes fourth, fifth, and sixth elements. The first connector is coupled to the first and fourth elements, the second connector to the second and fifth elements, and the third connector to the third and sixth elements. An apparatus for analyzing spectral components in predetermined frequency bands within a signal includes an input for receiving the signal, a device for isolating a portion of the signal, and frequency detectors coupled in parallel to the device. Each frequency detector corresponds to a frequency band and generates an output signal component corresponding to a proportion of energy of the spectral components detected by the frequency detector.
    Type: Grant
    Filed: April 3, 2007
    Date of Patent: May 26, 2009
    Assignee: Variance Dynamical, Inc
    Inventor: Paul A. Goodwin
  • Publication number: 20090132189
    Abstract: Methods for determining characteristics of a plasma are provided. In one embodiment, a method for determining characteristics of a plasma includes obtaining metrics of current and voltage information for first and second waveforms coupled to a plasma at different frequencies, determining at least one characteristic of the plasma using the metrics obtained from each different frequency waveform. In another embodiment, the method includes providing a plasma impedance model of a plasma as a function of frequency, and determining at least one characteristic of a plasma using model. In yet another embodiment, the method includes providing a plasma impedance model of a plasma as a function of frequency, measuring current and voltage for waveforms coupled to the plasma and having at least two different frequencies, and determining ion mass of a plasma from model and the measured current and voltage of the waveforms.
    Type: Application
    Filed: January 16, 2009
    Publication date: May 21, 2009
    Inventors: Steven C. Shannon, Daniel J. Hoffman, Jeremiah T.P. Pender, Tarreg Mawari
  • Publication number: 20090125259
    Abstract: Apparatus and methods are provided to allow multiple, possibly overlapping, regions of interest within a frequency spectrum to be defined, and managed. Each of these regions of interest may be selected for further testing or identification. Unselected regions are allowed to collapse into narrow bars so as not to interfere with the selected region. Multiple rows are provided to allow for the definition and selection of overlapping regions of interest. Furthermore, in some embodiments aid is provided for identifying the signal type by providing a list of signal type candidates based upon such parameters as region of interest bandwidth, region of interest center frequency and geographic location.
    Type: Application
    Filed: July 16, 2008
    Publication date: May 14, 2009
    Applicant: TEKTRONIX, INC.
    Inventors: RICHARD B. NICHOLLS, JOHN F. SHORT, III, WALTER R. STRAND, LYNNE A. FITZSIMMONS, DAVID W. SCHMIDT, RONALD J. LARRICK
  • Publication number: 20090105980
    Abstract: The invention provides a method for detecting and managing the status of a plasma processing apparatus with high sensitivity so as to enable long-term stable processing. In a plasma processing apparatus comprising a vacuum processing chamber 10, a plasma generating high frequency power supply 16, and a measurement device unit 3 for estimating the status of the apparatus via reflected waves 54 of the incident waves 53 reflected from the processing apparatus including a waveform generator 32, a VCO 33, a directional coupler 34, a detector 35 and a measurement data processing unit 36, frequency-swept high frequency waves 53 for measurement are introduced to the processing chamber where no plasma discharge is performed, so as to monitor the change of absorption spectrum frequency of the reflected waves 54 to thereby monitor the change in status of the processing apparatus.
    Type: Application
    Filed: February 4, 2008
    Publication date: April 23, 2009
    Inventors: Tsutomu TETSUKA, Naoshi Itabashi, Atsushi Itou
  • Patent number: 7518353
    Abstract: A vector network analysis system and a method of measuring use offset stimulus signals to stimulate a balanced device under test (DUT) to determine performance parameters. The system includes an offset stimulus source that provides a plurality of stimulus signals and a vector network analyzer. At least one stimulus signal is offset from another stimulus signal of the plurality in one or both of frequency and time-varying phase. The offset stimulus source includes a first signal source and a second signal source that respectively provides the offset stimulus signals. The method of measuring includes generating the offset stimulus signals and applying the offset stimulus signals to a balanced port of the DUT to stimulate the DUT. The performance parameters are determined from measurements of the offset stimulus signals and one or more response signals from the stimulated DUT.
    Type: Grant
    Filed: April 7, 2006
    Date of Patent: April 14, 2009
    Assignee: Agilent Technologies, Inc.
    Inventors: Hassan Tanbakuchi, Wing J. Mar
  • Patent number: 7519513
    Abstract: A method and apparatus for digitizing a data signal, the method comprising the steps of receiving an input analog data signal, splitting the received input analog data signal into a plurality of split signals, and mixing at least one of the split signals with a predetermined periodic function with a predetermined frequency. The split signals are then digitized and combined mathematically to form a single output data stream that is a substantially correct representation of the original input signal.
    Type: Grant
    Filed: September 22, 2006
    Date of Patent: April 14, 2009
    Assignee: Lecroy Corporation
    Inventors: Peter J. Pupalaikis, David C. Graef
  • Patent number: 7505858
    Abstract: According to evaluation of tone quality of exhaust sound adapted to human audition, a characteristic of the tone quality of exhaust sound is objectively analyzed. There are provided a measuring process (M1) for sampling exhaust sound to be analyzed, by means of a microphone disposed in an exhaust system EX and converting the exhaust sound into an electric signal, an analyzing process (M2) for amplifying a high frequency component of the electric signal and performing a frequency analysis of the electric signal at an arbitrary time interval, a detecting process (M3) for detecting a first formant of the first peak from the low frequency side and a second formant of the second peak from the low frequency side, and a displaying process (M4) for displaying a relationship (brightness and sharpness) between the first formant and second formant in a predetermined time range.
    Type: Grant
    Filed: June 28, 2005
    Date of Patent: March 17, 2009
    Assignee: Sango Co., Ltd.
    Inventor: Osamu Kuroda
  • Patent number: 7496480
    Abstract: System and method for specifying a signal analysis function. First user input is received, e.g., to a graphical user interface (GUI), indicating a parameter for a first operation implementing at least a portion of the function. The first operation is programmatically included in a sweep loop. Second user input is received specifying a sweep configuration for a sweep on the parameter. The signal includes signal data, e.g., signal plot data or tabular data. The sweep configuration includes: a range of values for the indicated parameter, a number of iterations for the sweep, an interpolation type, step size for the sweep on the indicated parameter, specific values in the range of values for the parameter, source for at least some of the sweep configuration, and/or resultant data. The sweep is performed on the parameter per the sweep configuration, generating resultant data which is stored, and optionally displayed, e.g., in the GUI.
    Type: Grant
    Filed: March 25, 2004
    Date of Patent: February 24, 2009
    Assignee: National Instruments Corporation
    Inventors: Philippe G. Joffrain, Christopher G. Cifra, Alain G. Moriat, Christohpe A. Restat, John A. Pasquarette, J. Clinton Fletcher
  • Patent number: 7493220
    Abstract: The present invention relates to a vibration signal processing method and system that can be used to account for situations where impact or impulse events are hidden in a normal vibration reading by low frequency vibrations and high frequency noise. In one preferred form, the method of the present invention comprises the steps of obtaining electrical vibration signals that represent mechanical vibrations of a machine (102-106), converting the electrical vibration signals into digital vibration samples (108), dividing the digital vibration samples into equal time intervals and determining the average absolute amplitude of the digital vibration samples for each time interval (110), generating a time waveform comprising the determined average amplitudes (112, 114), and processing the time waveform as if it were an independently-detected signal (116-120).
    Type: Grant
    Filed: March 22, 2007
    Date of Patent: February 17, 2009
    Assignee: Commtest Instruments Limited
    Inventors: Nigel Leigh, Carl Omundsen