Quality Evaluation Patents (Class 702/81)
  • Patent number: 11907915
    Abstract: The system enables one to securely recycle an electronic device in a publicly accessible location. In particular, the embodiment described may be used by a mobile phone owner to submit his/her mobile phone for recycling via an electronic kiosk and receive compensation in some form. The compensation might be dispersed via cash, voucher, credit or debit card, or other magnetic or electronic transaction methods.
    Type: Grant
    Filed: May 24, 2023
    Date of Patent: February 20, 2024
    Assignee: ecoATM, LLC
    Inventors: Mark Vincent Bowles, Michael Librizzi
  • Patent number: 11880193
    Abstract: A system for characterizing a specimen is disclosed. In one embodiment, the system includes a characterization sub-system configured to acquire one or more images a specimen, and a controller communicatively coupled to the characterization sub-system. The controller may be configured to: receive training images of one or more features of a specimen from the characterization sub-system; receive training three-dimensional (3D) design images corresponding to the one or more features of the specimen; generate a deep learning predictive model based on the training images and the training 3D design images; receive product 3D design images of one or more features of a specimen; generate simulated images of the one or more features of the specimen based on the product 3D design images with the deep learning predictive model; and determine one or more characteristics of the specimen based on the one or more simulated images.
    Type: Grant
    Filed: September 9, 2019
    Date of Patent: January 23, 2024
    Assignee: KLA Corporation
    Inventors: Arpit Yati, Chandrashekaran Gurumurthy
  • Patent number: 11880735
    Abstract: Systems and methods for determining radio frequency (RF) cabling configuration are provided. The systems include a central controller that includes two or more antenna ports that are coupled to corresponding antennas via respective RF cables. In embodiments, the central controller executes a calibration interrogation cycle to detect a misconfiguration of an RF cable that couples an antenna port of the central controller to an antenna port of a detector station that includes an antenna under test. While the central controller executes the calibration interrogation cycle, a RF sensor is disposed in a signal range of the antenna under test. The systems detect indications provided by the RF sensor to identify a misconfiguration of the RF cabling and provide guidance on how to re-configure the RF cabling.
    Type: Grant
    Filed: August 23, 2022
    Date of Patent: January 23, 2024
    Assignee: Zebra Technologies Corporation
    Inventor: Timothy B. Austin
  • Patent number: 11867630
    Abstract: An optical inspection system is provided with a fixture to support a glass sheet, with the fixture having an optical fiducial. An ultraviolet laser and associated optics form a planar laser sheet that intersects a surface of the glass sheet causing the surface to fluoresce and form a visible wavelength line thereon. A camera has an image sensor for detecting the optical fiducial and the visible wavelength line across at least a portion of a width of the sheet. A control system is configured to (i) image the optical fiducial on the fixture, (ii) define an optical fiducial coordinate system from the imaged optical fiducial, (ii) receive a mathematical model of the glass sheet in a model coordinate system, and (iii) relate the optical fiducial coordinate system to the model coordinate system via at least one transformation. A method of using a non-contact optical inspection system is also provided.
    Type: Grant
    Filed: August 9, 2022
    Date of Patent: January 9, 2024
    Assignee: Glasstech, Inc.
    Inventors: Benjamin L. Moran, Jason C. Addington, Michael J. Vild
  • Patent number: 11801534
    Abstract: Provided is a fruit quality inspecting and sorting appliance. The fruit quality inspecting and sorting appliance includes: a conveying module; a weighing module, which cooperates with the conveying module to convey weighed fruits through the conveying module; an internal quality inspection module, which cooperates with the conveying module and performs an internal quality inspection to the weighed fruits; an external quality inspection module, which cooperates with the conveying module and performs an external quality inspection to the fruits after the internal quality inspection; a sorting module, which cooperates with the conveying module, and sorts the fruits passing through the weighing module, the internal quality inspection module and the external quality inspection module; and a control module electrically connected with the conveying module, the weighing module, the internal quality inspection module, the external quality inspection module and the sorting module.
    Type: Grant
    Filed: September 3, 2020
    Date of Patent: October 31, 2023
    Assignee: EAST CHINA JIAO TONG UNIVERSITY
    Inventors: Yande Liu, Jun Hu, Junzheng Wang, Siyi Ouyang, Yunjuan Yan, Huizheng Cui, Xiaogang Jiang, Jian Wu, Xuan Hu, Aiguo Ouyang
  • Patent number: 11736208
    Abstract: Antenna monitoring systems and methods can include, among other things, a transmitter near each of the antennas in a distributed antenna system (DAS). The transmitter can transmit an antenna identifier corresponding to that antenna, so that the various transmitters in the DAS each transmit different antenna identifiers. These antenna identifiers can be detected by a receiver and can be processed to determine whether any antenna identifiers are missing. If any expected antenna identifier is missing, the receiver can infer that the antenna or a component associated with the antenna (such as cabling) may have failed. The receiver can then output an indication or notification that may be accessed by maintenance personnel and/or emergency personnel to enable them to identify and repair the non-functioning antenna or component. The transmitter can transmit other data, such as environmental data, RF data, or the like, to facilitate additional or alternative monitoring functionality.
    Type: Grant
    Filed: January 19, 2023
    Date of Patent: August 22, 2023
    Assignee: Gugli Corporation
    Inventors: Frederick Daniel Leaf, Joshua Travis Helling
  • Patent number: 11728172
    Abstract: An apparatus includes a first metrology tool configured to measure an initial thickness of a wafer. The apparatus includes a controller connected to the first metrology tool and configured to calculate a polishing time based on a material removal rate, a predetermined thickness and the initial thickness of the wafer. The apparatus includes a polishing tool connected to the controller and configured to polish the wafer for a first duration equal to the polishing time. The apparatus includes a second metrology tool connected to the controller and configured to measure a polished thickness. The controller is configured for receiving the initial thickness from the first metrology tool and the polished thickness from the second metrology tool, updating the material removal rate based on the predetermined thickness, the polishing time and the polished thickness, and calculating an etching time for etching the polished wafer using the polished thickness.
    Type: Grant
    Filed: April 30, 2020
    Date of Patent: August 15, 2023
    Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
    Inventors: Yuan-Hsuan Chen, Kei-Wei Chen, Ying-Lang Wang, Kuo-Hsiu Wei
  • Patent number: 11703344
    Abstract: In accordance with an aspect of the present disclosure, there is provided a landmark position estimating method performed by a landmark position estimating apparatus. The method comprises, identifying a first type landmark and a second type landmark from an image, captured by an image capturing device of a vehicle, including various landmarks on a driving route, estimating a three-dimensional position of the identified first type landmark based on a plurality of the images on which the first type landmark is identified and a digital map including a driving area of the vehicle, and estimating a position of the identified second type landmark on a virtual plane including the three-dimensional position of the first type landmark.
    Type: Grant
    Filed: December 13, 2019
    Date of Patent: July 18, 2023
    Assignee: SK Telecom Co., Ltd.
    Inventor: Seongsoo Lee
  • Patent number: 11699623
    Abstract: Embodiments of the present technology may include semiconductor processing methods that include depositing a film of semiconductor material on a substrate in a substrate processing chamber. The deposited film may be sampled for defects at greater than or about two non-contiguous regions of the substrate with scanning electron microscopy. The defects that are detected and characterized may include those of a size less than or about 10 nm. The methods may further include calculating a total number of defects in the deposited film based on the sampling for defects in the greater than or about two non-contiguous regions of the substrate. At least one deposition parameter may be adjusted as a result of the calculation. The adjustment to the at least one deposition parameter may reduce the total number of defects in a deposition of the film of semiconductor material.
    Type: Grant
    Filed: October 14, 2020
    Date of Patent: July 11, 2023
    Assignee: Applied Materials, Inc.
    Inventors: Mandar B. Pandit, Man-Ping Cai, Wenhui Li, Michael Wenyoung Tsiang, Praket Prakash Jha, Jingmin Leng
  • Patent number: 11657490
    Abstract: A control device, which controls a machine tool capable of alarm stop based on abnormality in machining load, includes: a photographing unit which photographs chips produced as a result of machining of a workpiece; a reference model determination unit which determines in advance a reference model of chips for determining as abnormality in machining, based on images of chips photographed within a predetermined period before alarm stop, in response to an occurrence of alarm stop; and a judgment unit which judges as abnormality occurrence in machining, in a case of a degree of similarity in chips photographed at a predetermined timing in machining later, relative to a reference model of chips that was determined.
    Type: Grant
    Filed: October 26, 2020
    Date of Patent: May 23, 2023
    Assignee: FANUC CORPORATION
    Inventor: Gaku Isobe
  • Patent number: 11659100
    Abstract: A method of producing a printed product includes creating a project specification and storing the it on a server, the project specification including a palette of selected master colors, a printing substrate, a printing technique, and an ink base for a printed product; determining whether a quality assurance color is available for each master color, for master colors having an associated quality assurance color, automatically associating quality assurance color information with the master colors; generating a quality assurance package corresponding to the project specification, the quality assurance package including the quality assurance color information; providing a converter with access to the project specification and the quality assurance package; the converter producing the printed product according to the project specification and scoring the printed product against the quality assurance package; and receiving from the converter a score indicative of the printed product's appearance measured against t
    Type: Grant
    Filed: June 22, 2020
    Date of Patent: May 23, 2023
    Assignee: ESKO SOFTWARE BVBA
    Inventors: Baldewin Meireson, Cindy Cooperman
  • Patent number: 11615974
    Abstract: Systems and methods of optimizing wafer transport and metrology measurements in a fab are provided. Methods comprise deriving and updating dynamic sampling plans that provide wafer-specific measurement sites and conditions, deriving optimized wafer measurement paths for metrology measurements of the wafers that correspond to the dynamic sampling plan, managing FOUP (Front Opening Unified Pod) transport through the fab, transporting wafers to measurement tools while providing the dynamic sampling plans and the wafer measurement paths to the respective measurement tools before or as the FOUPs with the respective wafers are transported thereto, and carrying out metrology and/or inspection measurements of the respective wafers by the respective measurement tools according to the derived wafer measurement paths.
    Type: Grant
    Filed: July 5, 2019
    Date of Patent: March 28, 2023
    Assignee: KLA CORPORATION
    Inventors: Amnon Manassen, Tzahi Grunzweig, Einat Peled, Anna Golotsvan
  • Patent number: 11609111
    Abstract: A system monitors gas flow and pressure to a gas appliance in a fluid network comprising an analyzer. The analyzer has a housing defining an inlet, an outlet, and an interior in fluid communication with the inlet and the outlet. At least one sensor is coupled to the analyzer and configured to generate at least one signal related to gas being supplied to the gas appliance. A smart device communicates with the analyzer, wherein the smart device has a user interface and is configured to monitor, store and display data. The smart device can present any or all of a plurality of parameters such as the flow of gas, a capacity of the flow of gas, a temperature, a pressure of the gas and the like to a user based on signals from sensors.
    Type: Grant
    Filed: December 23, 2019
    Date of Patent: March 21, 2023
    Assignee: Watts Regulator Co.
    Inventors: Michael T. Angus, Kevin Fisk, Richard Huber, R. Craig Campbell, George Davis, Matthew Meurer, Robert Parks
  • Patent number: 11599889
    Abstract: Techniques for qualifying a candidate supplier are presented. Such techniques may include obtaining a part produced by a candidate supplier and measuring a quantifiable property in each of a plurality of samples to obtain an empirical data set. Such techniques may also include selecting, based on the empirical data set, and fitting to the empirical data set, an appropriate linear mixed model for the quantifiable property. Such techniques may further include computing an acceptance parameter from a mean and standard deviation obtained from the appropriate linear mixed model. The acceptance parameter may include a process capability index or a tolerance interval bound. Such techniques may further include determining that the candidate supplier qualifies based on comparing the acceptance parameter to a threshold.
    Type: Grant
    Filed: November 4, 2019
    Date of Patent: March 7, 2023
    Assignee: THE BOEING COMPANY
    Inventors: Kelsea Cox, Lindsay L. W. Jones, Robert M. Lawton, Emily O'Connor
  • Patent number: 11598693
    Abstract: One embodiment of the present invention provides an apparatus and the like for improving the accuracy of deterioration estimation regarding a monitoring target. An information processing apparatus as one embodiment of the present invention includes a detector, a separator, a calculator, and an estimator. The detector detects a normal waveform pattern included in a waveform of time-series data of a target. The separator separates the waveform of the time-series data into components while removing the normal waveform pattern that is detected. The calculator calculates a feature of the time-series data based on at least one of the components. The estimator estimates deterioration of the target based on the feature.
    Type: Grant
    Filed: September 9, 2020
    Date of Patent: March 7, 2023
    Assignee: Kabushiki Kaisha Toshiba
    Inventor: Ken Ueno
  • Patent number: 11579272
    Abstract: A method and apparatus is provided to calibrate a LiDAR using a reflect array calibration target having a spatially varying spectral reflectance profile. A frequency modulated continuous wave LiDAR emits a beam that spans a range of wavelengths, and, therefore, spatially varying spectral features in the reflectance profile can be used as indicia of where the LiDAR beam hits the calibration target. For example, the center has one absorption wavelength and the periphery has another, such that alignment is achieved by changing the alignment direction to maximize the spectral feature at the one absorption wavelength while minimizing the spectral feature at the other absorption wavelength. Alternatively, at least one spectral feature can have a center wavelength that changes as a function of space. Thus, the LiDAR is aligned by changing the beam direction to shift the center wavelength to a value corresponding to the target center.
    Type: Grant
    Filed: December 23, 2019
    Date of Patent: February 14, 2023
    Assignee: TOYOTA MOTOR ENGINEERING & MANUFACTURING NORTH AMERICA, INC.
    Inventors: Paul D. Schmalenberg, Sean P. Rodrigues
  • Patent number: 11568340
    Abstract: Techniques are provided for generating target success group of hybrid seeds for target fields include a server receiving agricultural data records that represent crop seed data describing seed and yield properties of hybrid seeds and first field geo-location data for agricultural fields where the hybrid seeds were planted. The server receives second geo-locations data for target fields where hybrid seeds are to be planted. The server generates a dataset of hybrid seed properties that include yield values and environmental classifications for hybrid seeds and then a dataset of success probability scores that describe the probability of a successful yield on the target fields based on the dataset of hybrid seed properties and the second geo-location data. The server generates target success yield group of hybrid seeds and probability of success values based on success probability scores and a yield threshold. The server causes display of the target success yield group.
    Type: Grant
    Filed: November 9, 2017
    Date of Patent: January 31, 2023
    Assignee: CLIMATE LLC
    Inventors: Tonya S Ehlmann, Xiao Yang, Dongming Jiang, Jason Kendrick Bull, Samuel Alexander Wimbush, Yao Xie, Timothy Reich
  • Patent number: 11554481
    Abstract: A workpiece transport apparatus for transporting a workpiece includes: a hand device; a moving device that includes a movable part mounted with the hand device and that includes at least one drive axis configured to operate the movable part; a current measurement section configured to measure a current value of a motor that drives the drive axis; and a workpiece number detection section configured to detect that a number of workpieces held by the hand device is different from an expected number based on a comparison result between the current value measured by the current measurement section when the hand device holds the workpiece, and a predetermined threshold value.
    Type: Grant
    Filed: June 18, 2020
    Date of Patent: January 17, 2023
    Assignee: Fanuc Corporation
    Inventor: Yoshiaki Kato
  • Patent number: 11536040
    Abstract: The invention comprises a product. The product comprises a first removable concrete form having a concrete forming face and a first insulating panel insert having a first primary surface and an opposite second primary surface, wherein the second primary surface of the first insulating panel insert contacts the concrete forming face of the first removable concrete form. The product also comprises an elongate anchor member having an enlarged portion and an elongate portion, the elongate portion having a first end and an opposite second end, wherein the enlarged portion is disposed adjacent the first end and contacts the second primary surface of the first insulating panel insert and wherein the elongate portion extends through the first insulating panel insert and extends outwardly from the first primary surface of the first insulating panel insert. A method of using a removable insulated concrete form system is also disclosed.
    Type: Grant
    Filed: May 6, 2019
    Date of Patent: December 27, 2022
    Inventor: Romeo Ilarian Ciuperca
  • Patent number: 11531080
    Abstract: An example method for estimating the angle-of-arrival (AoA) and other parameters of radio frequency (RF) signals that are received by an antenna array comprises: receiving a plurality of radio frequency (RF) signal power measurements by a plurality of antenna elements at a plurality of RF channels; computing, by applying a machine learning model to the plurality of RF signal power measurements, an estimated RF signal parameter value; and outputting the RF signal parameter value.
    Type: Grant
    Filed: September 26, 2019
    Date of Patent: December 20, 2022
    Assignee: Cypress Semiconductor Corporation
    Inventors: Aidan Smyth, Victor Simileysky, Kiran Uln
  • Patent number: 11480531
    Abstract: An assessment system includes a storage device and a processing circuit. The processing circuit is coupled to the storage device and configured to execute the instructions stored in the storage device. The storage device is configured for storing instructions of extracting at least one feature parameter corresponding to at least one defect detected on an object respectively; determining at least one feature evaluation according to the at least one feature parameter respectively; weighting the at least one feature evaluation to calculate at least one weighted feature evaluation respectively; summing the at least one weighted feature evaluation to calculate at least one total score corresponding to at least one lesson-learnt case; and ranking the at least one total score corresponding to the at least one lesson-learnt case to find out a suspected root cause corresponding to one of the at least one lesson-learnt case with higher priority.
    Type: Grant
    Filed: December 24, 2019
    Date of Patent: October 25, 2022
    Assignee: Yangtze Memory Technologies Co., Ltd.
    Inventors: Ge Ge Zhao, Fei Wang, Zheng Yi Cai, Ling Ling Fu, Tao Huang, Xing Jin, Jing Yun Wu, Yadong Wang
  • Patent number: 11469122
    Abstract: A semiconductor process analysis device of an embodiment includes a memory and a processor connected to the memory. The processor performs factoring to inspection result groups resulting from inspections of a substrate group, the inspections including an inspection of a fabrication process of a semiconductor integrated circuit. The inspection result groups are first distribution groups resulting from a single inspection of each substrate of the substrate group. Each first distribution represents a distribution of inspection data on a substrate surface. The factoring includes calculating, from the first distribution groups, for each of one or more second distributions, appearance information containing a degree of appearance of one of the one or more second distributions in each substrate. The processor calculates a degree of association between two items of the appearance information, the two items respectively corresponding to different inspection result groups among the inspection result groups.
    Type: Grant
    Filed: September 9, 2020
    Date of Patent: October 11, 2022
    Assignee: Kioxia Corporation
    Inventors: Yukako Tanaka, Sho Saiki, Kaito Date, Yuka Shibata
  • Patent number: 11462316
    Abstract: The present disclosure relates to systems and methods for evaluating a medical image. The systems and methods may obtain the medical image. The systems and methods may extract a feature of the medical image. The feature may include a histogram of oriented gradients (HOG) feature of the medical image. The systems and methods may determine a degree to which an artifact in the medical image affects recognition of a tissue feature by inputting the feature of the medical image to a determination model.
    Type: Grant
    Filed: May 11, 2020
    Date of Patent: October 4, 2022
    Assignee: SHANGHAI UNITED IMAGING HEALTHCARE CO., LTD.
    Inventor: Yuhang Shi
  • Patent number: 11443092
    Abstract: A method, apparatus, and/or computer program product can perform an analog defect simulation on an electronic device. The method, apparatus, and/or computer program product can generate a defect catalog which identifies a defect class relating to a defect and a modeling parameter that is associated with the defect class. The method, apparatus, and/or computer program product can receive a weight formula that identifies a weight for the defect class in relation to the modeling parameter. The method, apparatus, and/or computer program product can call a defect weight function to return the weight from the defect weight formula. The method, apparatus, and/or computer program product can perform the analog defect simulation on the electronic device. The method, apparatus, and/or computer program product can determine a simulation statistic relating to the analog defect simulation utilizing the weight.
    Type: Grant
    Filed: May 11, 2020
    Date of Patent: September 13, 2022
    Assignee: Synopsys, Inc.
    Inventors: Mayukh Bhattacharya, Miroslava Tzakova, Chih-Ping Antony Fan
  • Patent number: 11428644
    Abstract: An electronic apparatus including a display and one or more processor is disclosed. The one or more processor is configured to: divide a first error value of each of a plurality of first components with respect to a mounting position acquired through inspection of a plurality of substrates of a first type, into a plurality of error values, generate a graph of a tree structure including a plurality of nodes corresponding to the plurality of first components, component types of each of the plurality of first components and a plurality of components included in a mounter, adjust attributes of each of the plurality of nodes using the plurality of error values divided from the first error value of each of the plurality of first components, and display the graph in which the attributes of each of the plurality of nodes are adjusted, on the display.
    Type: Grant
    Filed: November 27, 2019
    Date of Patent: August 30, 2022
    Assignee: KOH YOUNG TECHNOLOGY INC.
    Inventors: Jong Myoung Lee, Duk Young Lee, Su Hyeong Choi, Hyeon Su Jeong
  • Patent number: 11417408
    Abstract: A semiconductor device includes a semiconductor die having a peripheral region surrounding, a defect detection circuit in the peripheral region, the defect detection circuit arranged in an open conduction loop, the defect detection circuit comprising a plurality of latch circuits and a plurality of defect detection conduction paths, each defect detection conduction path of the plurality of defect detection conduction paths connecting two adjacent latch circuits of the plurality of latch circuits, and a test control circuitry configured to perform (a) a test write operation by transferring bits of an input data pattern in a forward direction of the open conduction loop to cause the plurality of latch circuits to store the bits of the input data pattern in the plurality of latch circuits, and (b) a test read operation by transferring bits stored in the plurality of latch circuits in a backward direction of the open conduction loop.
    Type: Grant
    Filed: March 12, 2021
    Date of Patent: August 16, 2022
    Assignee: Samsung Electronics Co., Ltd.
    Inventor: Jongpil Son
  • Patent number: 11353502
    Abstract: An electronic component handling apparatus handles a device under test (DUT). The electronic component handling apparatus includes: a set plate that holds a DUT container including a plurality of pockets each of which accommodates the DUT; a sensor that acquires three-dimensional shape data of the DUT container; and a processor that corrects the shape data based on an inclination of the set plate, extracts a height and an inclination of a predetermined region corresponding to the DUT in a first pocket among the pockets, from the shape data corrected by the processor, and determines an accommodation state of the DUT in the first pocket based on an extraction result obtained by the processor.
    Type: Grant
    Filed: February 26, 2021
    Date of Patent: June 7, 2022
    Assignee: ADVANTEST Corporation
    Inventors: Masataka Onozawa, Mitsunori Aizawa, Aritomo Kikuchi
  • Patent number: 11276161
    Abstract: Methods and systems for generating a reference image for use in a process performed for a specimen are provided. One system includes a virtual system configured to receive output generated by actual systems for specimens, each of which has device areas of the same type formed thereon. The virtual system is configured for identifying defective portions of the device areas based on the output generated for the specimens by at least two of the actual systems and eliminating the defective portions of the device areas from the device areas in which the defective portions were identified to thereby generate remaining portions of the device areas. In addition, the virtual system is configured for generating a reference image from the output generated for the remaining portions of at least one device area on a first of the specimens and at least one device area on a second of the specimens.
    Type: Grant
    Filed: February 19, 2020
    Date of Patent: March 15, 2022
    Assignee: KLA Corp.
    Inventor: Fang Lei
  • Patent number: 11270178
    Abstract: Briefly, an intelligent label is associated with a good, and includes one or more permanent and irreversible electrochromic indicators that are used to report the condition of that good at selected points in the movement or usage of that good. These electrochromic indicators provide immediate visual information regarding the status of the good without need to interrogate or communicate with the electronics or processor on the intelligent label. In this way, anyone in the shipping or use chain for the good, including the end user consumer, can quickly understand whether the product is meeting shipping and quality standards. If a product fails to meet shipping or quality standards, the particular point where the product failed can be quickly and easily identified, and information can be used to assure the consumer remains safe, while providing essential information for improving the shipping process.
    Type: Grant
    Filed: January 26, 2018
    Date of Patent: March 8, 2022
    Inventors: Paul Atkinson, James Kruest, Anoop Agrawal, John P Cronin, Lori L Adams, Juan Carlos L Tonazzi
  • Patent number: 11243245
    Abstract: The present disclosure provides an analysis method of a semiconductor device, and the semiconductor device comprises a plurality of HKMG fin field effect transistors and a wafer on which the plurality of HKMG fin field effect transistors are located, and the analysis method comprises: performing acceptance testing on the wafer to be tested; constructing an N-type model based on the position of each N-type transistor at the surface of the wafer to be tested and the corresponding acceptance test result, constructing a P-type model based on the position of each P-type transistor at the surface of the wafer to be tested and the corresponding acceptance test result, and constructing an N/P ratio model corresponding to the surface of the wafer to be tested based on the N-type model and the P-type model; and identifying the N/P ratio model based on a preset standard wafer model to determine whether the wafer to be tested is compliant based on the N/P ratio model.
    Type: Grant
    Filed: March 25, 2020
    Date of Patent: February 8, 2022
    Assignee: Shanghai Huali Integrated Circuit Mfg. Co. Ltd.
    Inventor: Ping-Hsun Su
  • Patent number: 11243236
    Abstract: A device and method are provided for monitoring quality and performance parameters of an electricity distribution component in an electricity distribution network and detecting any deviation of operating parameters from the specified regulatory set and enforced limits. The critical and increasing problem is mitigated for the myriad of private domestic and commercial DEG devices being installed and connected to the distribution networks which were not initially designed for, or even not anticipated with, the recent DEG evolution, and the increasing complex electrical components with changing loads and power factors across the distribution network.
    Type: Grant
    Filed: August 1, 2018
    Date of Patent: February 8, 2022
    Assignee: Edge Electrons Limited
    Inventors: Jian Carlo Decena Zapata, Efren Santos Cruzat, II, Leonard Ostil Torio, Gordon Currie, Neal George Stewart
  • Patent number: 11156593
    Abstract: Concrete can be one of the most durable building materials where consumption is projected to reach approximately 40 billion tons in 2017 alone. Despite this the testing of concrete at all stages of its life cycle is still in its infancy although testing for corrosion is well established. Further many of the tests today are time consuming, expensive, and provide results only after it has been poured and set. Accordingly, by exploiting self-contained wireless sensor devices, which are deployed with the wet concrete, the in-situ curing and maturity measurement data can be established and employed together with batch specific concrete data to provide rapid initial tests and evolving performance data regarding the concrete cure, performance, corrosion of concrete at different points in its life cycle. Such sensors remove subjectivity, allow for rapid assessment, are integrable to the construction process, and provided full life cycle assessment.
    Type: Grant
    Filed: April 16, 2019
    Date of Patent: October 26, 2021
    Assignee: Giatec Scientific Inc.
    Inventors: Pouria Ghods, Rouhollah Alizadeh, Mustafa Salehi, Sarah De Carufel
  • Patent number: 11029252
    Abstract: Aspects relating to gemstone profiling are described. A gemstone profiling system includes a holder that is rotatable by an actuator and can hold a gemstone, the gemstone having a reference mark. The system includes a non-contact measuring unit to determine a distance between a center of rotation of the gemstone and a surface of the gemstone. Further, the system includes a controller to rotate the gemstone through a plurality of orientations and receive the measured distance between a center of rotation of the gemstone and a surface of the gemstone in each of the plurality of orientations of the gemstone. The controller can generate a profile of the gemstone based on the received distance in the plurality of orientations.
    Type: Grant
    Filed: June 6, 2018
    Date of Patent: June 8, 2021
    Assignee: Sahajanand Technologies Private Limited
    Inventors: Chetan Fulchandbhai Patel, Munjalkumar Dhirajlal Gajjar, Rahul Mahendra kumar Gaywala
  • Patent number: 11012161
    Abstract: The transceiver for undersea communication includes both a receiver and a transmitter. The transmitter includes a transmitter digital signal processor for converting a transmitted communication signal into a modulated transmission signal. The transmitter digital signal processor applies a modulation scheme to the transmitted communication signal during its conversion into the modulated transmission signal. The transmitter converts the modulated transmission signal into modulated electrical pulses, which are applied to electrodes to produce a modulated electric field. The receiver includes a receiving antenna formed from samarium nickelate (SmNiO3). Samarium nickelate (SNO) is known to have measurable changes in resistance responsive to changes in applied sub-volt electric potentials when the samarium nickelate is immersed in salt water, such as in an undersea environment.
    Type: Grant
    Filed: June 24, 2020
    Date of Patent: May 18, 2021
    Inventors: Ahmad Fakher Jasem Baghlani, Wadhha S. M. S. Albaho
  • Patent number: 10997340
    Abstract: Pattern centric process control is disclosed. A layout of a semiconductor chip is decomposed into a plurality of intended circuit layout patterns. For the plurality of intended circuit layout patterns, a corresponding plurality of sets of fabrication risk assessments corresponding to respective ones of a plurality of sources is determined. Determining a set of fabrication risk assessments for an intended circuit layout pattern comprises determining fabrication risk assessments based at least in part on: simulation of the intended circuit layout pattern, statistical analysis of the intended circuit layout pattern, and evaluation of empirical data associated with a printed circuit layout pattern. A scoring formula is applied based at least in part on the sets of fabrication risk assessments to obtain a plurality of overall fabrication risk assessments for respective ones of the plurality of intended circuit layout patterns.
    Type: Grant
    Filed: November 26, 2019
    Date of Patent: May 4, 2021
    Assignee: Anchor Semiconductor Inc.
    Inventors: Chenmin Hu, Khurram Zafar, Ye Chen, Yue Ma, Rong Lv, Justin Chen, Abhishek Vikram, Yuan Xu, Ping Zhang
  • Patent number: 10983501
    Abstract: A tool-life prediction method, applicable to a machine tool having a machining end, includes steps of capturing a plurality of measurement data from a tool of the machining end, transforming each of the plurality of measurement data into a corresponding complex process capability index (Cpk), utilizing an artificial neural network being trained to generate a tool-life prediction scale with respect to the Cpk, and then based on the tool-life prediction scale to determine a remaining tool life of the tool. In addition, a tool life prediction system is also provided.
    Type: Grant
    Filed: April 11, 2019
    Date of Patent: April 20, 2021
    Assignee: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
    Inventors: Yi-Ming Chen, Chi-Cheng Lin, Shu-Chung Liao, Chen-Yu Kai, Ta-Jen Peng
  • Patent number: 10909184
    Abstract: A method for multiplying an object in a database may include receiving, from a client, an indication that an object is associated with a first variable attribute having a first variation and a second variation. A bucket may be created in response to the indication. The bucket may include the object, a first sub-object having a first reference to the first variation of the first variable attribute, and a second sub-object having a second reference to the second variation of the first variable attribute. The bucket may be created instead of a first object having the first variation of the first variable attribute and a second object having the second variation of the first variable attribute. The bucket stored in the database may be accessed in response to a query from the client accessing the object. Related systems and articles of manufacture including computer program products are also provided.
    Type: Grant
    Filed: September 11, 2018
    Date of Patent: February 2, 2021
    Assignee: SAP SE
    Inventors: Nithya Rajagopalan, Jeremiah Reeves, Gurudayal Khosla
  • Patent number: 10852019
    Abstract: A system controls and monitors a heating, ventilation, and air conditioning (HVAC) system. The system receives raw data from HVAC equipment, controller performance monitoring (CPM) indicators associated with the HVAC equipment, and a set of rules associated with the HVAC equipment. The system processes the CPM indicators and the raw data using the set of rules to generate fault relevancies, and processes the fault relevancies.
    Type: Grant
    Filed: June 22, 2017
    Date of Patent: December 1, 2020
    Assignee: Honeywell International Inc.
    Inventors: Petr Endel, Jiri Vass, Jiri Rojicek
  • Patent number: 10832358
    Abstract: A disposition manager configured to identify a damaged component of a damaged assembly by determining a measured first property value of a set of measured property values associated with the damaged component and obtained by a sensor is not within a range of acceptable first property values according to a specification of the damaged component. The disposition manager further configured to estimate a performance characteristic of the damaged component and a salvage value of the damaged component. The disposition manager further configured to present, to a user interface, the performance characteristic and the salvage value for the damaged component.
    Type: Grant
    Filed: January 19, 2017
    Date of Patent: November 10, 2020
    Assignee: International Business Machines Corporation
    Inventors: Michael E. Gildein, II, Vijai Kalathur, Rajaram B. Krishnamurthy, Christine D. Mikijanic, Moses J. Vaughan
  • Patent number: 10791661
    Abstract: A board inspecting apparatus include a measuring section, a processing section and a display section. The measuring section obtains measurement data for at least a portion of a board. The processing section compares the measurement data and reference data of the board, based on selection feature objects, by associated selection feature objects, to perform distortion compensation for the board, and inspects the board with distortion compensation. The display section distinguishably displays a first area with the distortion compensation successful and a second area with the distortion compensation failed. The processing section compares a number of recognizable effective feature objects with a reference number, and determine the distortion compensation as failed when the number of the recognizable effective feature objects is below the reference number.
    Type: Grant
    Filed: September 22, 2017
    Date of Patent: September 29, 2020
    Assignee: KOH YOUNG TECHNOLOGY INC.
    Inventors: Seung Won Jung, Jong Jin Choi
  • Patent number: 10786866
    Abstract: An inspecting and repairing device of additive manufacturing technology and a method thereof are provided. The inspecting and repairing device has a powder bed unit, a repairing unit, and an inspection unit. The powder bed unit has a powder platform, a powder spreading mechanism and a laser unit. The repairing unit has a processing mechanism. The inspection unit has a camera and a controller. According to an image of the powder platform captured by the camera, the controller can determine whether spreading powders, whether being overcome a powder spreading defect, or whether driving the processing mechanism to repair a surface of a workpiece.
    Type: Grant
    Filed: October 27, 2017
    Date of Patent: September 29, 2020
    Assignee: TONGTAI MACHINE & TOOL CO., LTD.
    Inventors: Yi-Hsien Chen, Hsin-Pao Chen, Jui-Hsiung Yen
  • Patent number: 10719796
    Abstract: Disclosed are methods and systems for detecting an abnormal stress condition in a subject or group of subjects. Included is a risk evaluation system monitoring people, wherein a control unit in a stress management system obtains mental health information and records same in a measurement information database. The control unit then specifies a pattern in a reference pattern database and obtains the measurement information relating to this pattern from the measurement information database. The control unit in the stress management system (20) then revises a standard pattern based on individual attributes or work attributes. Next, the control unit performs pattern matching and determines whether or not attention is required. If the determination is that attention is required, the control unit presents an alert and an advice. This enables work, organization, and member risks to be appropriately evaluated based on changes in mental health information.
    Type: Grant
    Filed: July 19, 2016
    Date of Patent: July 21, 2020
    Assignee: IMATEC INC.
    Inventor: Atsushi Tomoeda
  • Patent number: 10713836
    Abstract: Examples are disclosed that relate to computing devices and methods for simulating light passing through one or more lenses. In one example, a method comprises obtaining a point spread function of the one or more lenses, obtaining a first input raster image comprising a plurality of pixels, and ray tracing the first input raster image using the point spread function to generate a first output image. Based on ray tracing the first input raster image, a look up table is generated by computing a contribution to a pixel in the first output image, wherein the contribution is from a pixel at each location of a subset of locations in the first input raster image. A second input raster image is obtained, and the look up table is used to generate a second output image from the second input raster image.
    Type: Grant
    Filed: June 25, 2018
    Date of Patent: July 14, 2020
    Assignee: MICROSOFT TECHNOLOGY LICENSING, LLC
    Inventor: Trebor Lee Connell
  • Patent number: 10712145
    Abstract: Methods and systems for evaluating the geometric characteristics of patterned structures are presented. More specifically, geometric structures generated by one or multiple patterning processes are measured by two or more metrology systems in accordance with a hybrid metrology methodology. A measurement result from one metrology system is communicated to at least one other metrology systems to increase the measurement performance of the receiving system. Similarly, a measurement result from the receiving metrology system is communicated back to the sending metrology system to increase the measurement performance of the sending system. In this manner, measurement results obtained from each metrology system are improved based on measurement results received from other cooperating metrology systems. In some examples, metrology capability is expanded to measure parameters of interest that were previously unmeasurable by each metrology system operating independently.
    Type: Grant
    Filed: October 19, 2017
    Date of Patent: July 14, 2020
    Assignee: KLA-Tencor Corporation
    Inventors: Boxue Chen, Andrei Veldman, Alexander Kuznetsov, Andrei V. Shchegrov
  • Patent number: 10657197
    Abstract: Methods manage non-destructive evaluation (“NDE”) data. NDE data for an asset is received and at least one alignment algorithm to align the NDE data to a simulated model associated therewith is determined. The NDE data is automatically aligned to the simulated model, a display representation that visually represents the aligned NDE data on the simulated model is generated, and information about the aligned NDE data is exported. Additionally, second NDE data associated with the at least a portion of the asset may also be received, at least one alignment algorithm to align the data determined, and the second NDE data aligned. Respective indications associated with the first and second NDE data may be determined and visually represented on the simulated model. Moreover, a shot descriptor file may be analyzed to determine whether additional NDE data is required to complete an alignment of NDE data.
    Type: Grant
    Filed: October 31, 2017
    Date of Patent: May 19, 2020
    Assignee: Etegent Technologies. Ltd.
    Inventors: Thomas D. Sharp, Richard Allan Roth, II, Uriah M. Ligget, Joe Kesler
  • Patent number: 10648794
    Abstract: A method of inspecting the wear of a turbine engine part includes, by means of a calculator: a reference plane is defined; by measuring said part to be inspected, a modelling of at least a portion of said part is acquired in the form of a three-dimensional inspection grid; the three-dimensional inspection grid is inspected with the reference plane, using a dedicated algorithm using a projection of points (10; 10.1, 10.2, . . . , 10.n); if the result of the comparison is included in a predetermined tolerance range, the part is defined as compliant; otherwise, the part is non-compliant.
    Type: Grant
    Filed: January 27, 2017
    Date of Patent: May 12, 2020
    Assignee: Safran Aircraft Engines
    Inventor: Fabien Jean-Guillaume Arquie
  • Patent number: 10643306
    Abstract: Techniques and systems are provided for processing image data using one or more neural networks. For example, a patch of raw image data can be obtained. The patch can include a subset of pixels of a frame of raw image data, and the frame can be captured using one or more image sensors. The patch of raw image data includes a single color component for each pixel of the subset of pixels. At least one neural network can be applied to the patch of raw image data to determine a plurality of color component values for one or more pixels of the subset of pixels. A patch of output image data can then be generated based on application of the at least one neural network to the patch of raw image data. The patch of output image data includes a subset of pixels of a frame of output image data, and also includes the plurality of color component values for one or more pixels of the subset of pixels of the frame of output image data.
    Type: Grant
    Filed: May 30, 2018
    Date of Patent: May 5, 2020
    Assignee: QUALCOMM Incoporated
    Inventors: Hau Hwang, Tushar Sinha Pankaj, Vishal Gupta, Jisoo Lee
  • Patent number: 10641708
    Abstract: Provided is a method of evaluating a semiconductor substrate, which evaluates quality of the semiconductor substrate by a photoluminescence measurement, wherein the evaluation by the photoluminescence measurement includes, after subjecting a surface of an evaluation-target semiconductor substrate to a pretreatment, irradiating the surface with excitation light, and then detecting emission obtained from the surface having been irradiated with the excitation light, and the pretreatment includes subjecting the surface of the evaluation-target semiconductor substrate to be irradiated with the excitation light to an oxide film formation treatment and charging the surface of the formed oxide film by corona discharge.
    Type: Grant
    Filed: December 16, 2015
    Date of Patent: May 5, 2020
    Assignee: SUMCO CORPORATION
    Inventors: Kazutaka Eriguchi, Tsuyoshi Kubota
  • Patent number: 10621719
    Abstract: The present disclosure relates to systems and processes for inspecting and evaluating qualities of printed regions on substrates, wherein the systems and methods may be configured to eliminate subjective aspects relating to human involvement in performing visual checks when evaluating print quality. The systems may include one or more communication networks connecting one or more sensors with an analyzer. In operation, ink is applied to a substrate to create at least one printed region, and the sensors are configured to inspect the printed region. The sensors may be configured to communicate measurements and/or images to the analyzer. And the analyzer may then calculate one or more quality subscores based on respective measurements and/or images. In turn, a full print quality score may be calculated based on one or more of the quality subscores. The analyzer may then execute a control action based on the full print quality score.
    Type: Grant
    Filed: May 2, 2019
    Date of Patent: April 14, 2020
    Assignee: The Procter & Gamble Company
    Inventors: Wenbin Li, Juergen Dornheim, Karen Marie Singer
  • Patent number: 10557881
    Abstract: Aspects of this disclosure relate to detecting and recording information associated with electrical overstress (EOS) events, such as electrostatic discharge (ESD) events. For example, in one embodiment, an apparatus includes an electrical overstress protection device, a detection circuit configured to detect an occurrence of the EOS event, and a memory configured to store information indicative of the EOS event.
    Type: Grant
    Filed: November 1, 2017
    Date of Patent: February 11, 2020
    Assignee: Analog Devices Global
    Inventors: Alan J. O'Donnell, David Aherne, Javier Alejandro Salcedo, David J. Clarke, John A. Cleary, Patrick Martin McGuinness, Albert C. O'Grady