Abstract: The present invention provides a method for comprehensive monitoring, analysis and maintenance of water and equipment in swimming pools, said method implemented by one or more processors operatively coupled to a non-transitory computer readable storage device, on which are stored modules of instruction code that when executed cause the one or more processors to perform: accumulating and monitoring data from elements including at least one of: sensors, actuators, and breakers in and around the vicinity of the swimming pools; accumulating non-sensory data from a plurality of sources at a local processing unit; propagating the data to an online remote server, applying machine learning or rule based algorithms at the online remote server configured to incorporate all the acquired data and obtain an optimal policy for pool maintenance by providing recommendations, control parameters, and providing an online interface to access said recommendation/control parameters for at least one of pool owners, pool servicemen,

Abstract: The DC/DC converter circuit includes: a primary-side circuit configured to convert DC power from a DC power source into a pulse voltage; an isolation transformer configured to transform the pulse voltage while isolating the pulse voltage; a secondary-side circuit connectable in a switching manner by a switching circuit to one of a rectifier circuit for a high-voltage low-current output mode or a current doubler circuit for a low-voltage high-current output mode; and a control circuit configured to perform connection switching control of the switching circuit so as to establish, depending on target supply power, connection to the rectifier circuit in the high-voltage low-current output mode, and connection to the current doubler circuit in the low-voltage high-current output mode.

Abstract: The system enables one to securely recycle an electronic device in a publicly accessible location. In particular, the embodiment described may be used by a mobile phone owner to submit his/her mobile phone for recycling via an electronic kiosk and receive compensation in some form. The compensation might be dispersed via cash, voucher, credit or debit card, or other magnetic or electronic transaction methods.

Abstract: A system for characterizing a specimen is disclosed. In one embodiment, the system includes a characterization sub-system configured to acquire one or more images a specimen, and a controller communicatively coupled to the characterization sub-system. The controller may be configured to: receive training images of one or more features of a specimen from the characterization sub-system; receive training three-dimensional (3D) design images corresponding to the one or more features of the specimen; generate a deep learning predictive model based on the training images and the training 3D design images; receive product 3D design images of one or more features of a specimen; generate simulated images of the one or more features of the specimen based on the product 3D design images with the deep learning predictive model; and determine one or more characteristics of the specimen based on the one or more simulated images.

Abstract: Systems and methods for determining radio frequency (RF) cabling configuration are provided. The systems include a central controller that includes two or more antenna ports that are coupled to corresponding antennas via respective RF cables. In embodiments, the central controller executes a calibration interrogation cycle to detect a misconfiguration of an RF cable that couples an antenna port of the central controller to an antenna port of a detector station that includes an antenna under test. While the central controller executes the calibration interrogation cycle, a RF sensor is disposed in a signal range of the antenna under test. The systems detect indications provided by the RF sensor to identify a misconfiguration of the RF cabling and provide guidance on how to re-configure the RF cabling.

Abstract: An optical inspection system is provided with a fixture to support a glass sheet, with the fixture having an optical fiducial. An ultraviolet laser and associated optics form a planar laser sheet that intersects a surface of the glass sheet causing the surface to fluoresce and form a visible wavelength line thereon. A camera has an image sensor for detecting the optical fiducial and the visible wavelength line across at least a portion of a width of the sheet. A control system is configured to (i) image the optical fiducial on the fixture, (ii) define an optical fiducial coordinate system from the imaged optical fiducial, (ii) receive a mathematical model of the glass sheet in a model coordinate system, and (iii) relate the optical fiducial coordinate system to the model coordinate system via at least one transformation. A method of using a non-contact optical inspection system is also provided.

Abstract: Provided is a fruit quality inspecting and sorting appliance. The fruit quality inspecting and sorting appliance includes: a conveying module; a weighing module, which cooperates with the conveying module to convey weighed fruits through the conveying module; an internal quality inspection module, which cooperates with the conveying module and performs an internal quality inspection to the weighed fruits; an external quality inspection module, which cooperates with the conveying module and performs an external quality inspection to the fruits after the internal quality inspection; a sorting module, which cooperates with the conveying module, and sorts the fruits passing through the weighing module, the internal quality inspection module and the external quality inspection module; and a control module electrically connected with the conveying module, the weighing module, the internal quality inspection module, the external quality inspection module and the sorting module.

Abstract: Antenna monitoring systems and methods can include, among other things, a transmitter near each of the antennas in a distributed antenna system (DAS). The transmitter can transmit an antenna identifier corresponding to that antenna, so that the various transmitters in the DAS each transmit different antenna identifiers. These antenna identifiers can be detected by a receiver and can be processed to determine whether any antenna identifiers are missing. If any expected antenna identifier is missing, the receiver can infer that the antenna or a component associated with the antenna (such as cabling) may have failed. The receiver can then output an indication or notification that may be accessed by maintenance personnel and/or emergency personnel to enable them to identify and repair the non-functioning antenna or component. The transmitter can transmit other data, such as environmental data, RF data, or the like, to facilitate additional or alternative monitoring functionality.

Abstract: An apparatus includes a first metrology tool configured to measure an initial thickness of a wafer. The apparatus includes a controller connected to the first metrology tool and configured to calculate a polishing time based on a material removal rate, a predetermined thickness and the initial thickness of the wafer. The apparatus includes a polishing tool connected to the controller and configured to polish the wafer for a first duration equal to the polishing time. The apparatus includes a second metrology tool connected to the controller and configured to measure a polished thickness. The controller is configured for receiving the initial thickness from the first metrology tool and the polished thickness from the second metrology tool, updating the material removal rate based on the predetermined thickness, the polishing time and the polished thickness, and calculating an etching time for etching the polished wafer using the polished thickness.

Abstract: In accordance with an aspect of the present disclosure, there is provided a landmark position estimating method performed by a landmark position estimating apparatus. The method comprises, identifying a first type landmark and a second type landmark from an image, captured by an image capturing device of a vehicle, including various landmarks on a driving route, estimating a three-dimensional position of the identified first type landmark based on a plurality of the images on which the first type landmark is identified and a digital map including a driving area of the vehicle, and estimating a position of the identified second type landmark on a virtual plane including the three-dimensional position of the first type landmark.

Abstract: Embodiments of the present technology may include semiconductor processing methods that include depositing a film of semiconductor material on a substrate in a substrate processing chamber. The deposited film may be sampled for defects at greater than or about two non-contiguous regions of the substrate with scanning electron microscopy. The defects that are detected and characterized may include those of a size less than or about 10 nm. The methods may further include calculating a total number of defects in the deposited film based on the sampling for defects in the greater than or about two non-contiguous regions of the substrate. At least one deposition parameter may be adjusted as a result of the calculation. The adjustment to the at least one deposition parameter may reduce the total number of defects in a deposition of the film of semiconductor material.

Abstract: A control device, which controls a machine tool capable of alarm stop based on abnormality in machining load, includes: a photographing unit which photographs chips produced as a result of machining of a workpiece; a reference model determination unit which determines in advance a reference model of chips for determining as abnormality in machining, based on images of chips photographed within a predetermined period before alarm stop, in response to an occurrence of alarm stop; and a judgment unit which judges as abnormality occurrence in machining, in a case of a degree of similarity in chips photographed at a predetermined timing in machining later, relative to a reference model of chips that was determined.

Abstract: A method of producing a printed product includes creating a project specification and storing the it on a server, the project specification including a palette of selected master colors, a printing substrate, a printing technique, and an ink base for a printed product; determining whether a quality assurance color is available for each master color, for master colors having an associated quality assurance color, automatically associating quality assurance color information with the master colors; generating a quality assurance package corresponding to the project specification, the quality assurance package including the quality assurance color information; providing a converter with access to the project specification and the quality assurance package; the converter producing the printed product according to the project specification and scoring the printed product against the quality assurance package; and receiving from the converter a score indicative of the printed product's appearance measured against t

Abstract: Systems and methods of optimizing wafer transport and metrology measurements in a fab are provided. Methods comprise deriving and updating dynamic sampling plans that provide wafer-specific measurement sites and conditions, deriving optimized wafer measurement paths for metrology measurements of the wafers that correspond to the dynamic sampling plan, managing FOUP (Front Opening Unified Pod) transport through the fab, transporting wafers to measurement tools while providing the dynamic sampling plans and the wafer measurement paths to the respective measurement tools before or as the FOUPs with the respective wafers are transported thereto, and carrying out metrology and/or inspection measurements of the respective wafers by the respective measurement tools according to the derived wafer measurement paths.

Abstract: A system monitors gas flow and pressure to a gas appliance in a fluid network comprising an analyzer. The analyzer has a housing defining an inlet, an outlet, and an interior in fluid communication with the inlet and the outlet. At least one sensor is coupled to the analyzer and configured to generate at least one signal related to gas being supplied to the gas appliance. A smart device communicates with the analyzer, wherein the smart device has a user interface and is configured to monitor, store and display data. The smart device can present any or all of a plurality of parameters such as the flow of gas, a capacity of the flow of gas, a temperature, a pressure of the gas and the like to a user based on signals from sensors.

Abstract: One embodiment of the present invention provides an apparatus and the like for improving the accuracy of deterioration estimation regarding a monitoring target. An information processing apparatus as one embodiment of the present invention includes a detector, a separator, a calculator, and an estimator. The detector detects a normal waveform pattern included in a waveform of time-series data of a target. The separator separates the waveform of the time-series data into components while removing the normal waveform pattern that is detected. The calculator calculates a feature of the time-series data based on at least one of the components. The estimator estimates deterioration of the target based on the feature.

Abstract: Techniques for qualifying a candidate supplier are presented. Such techniques may include obtaining a part produced by a candidate supplier and measuring a quantifiable property in each of a plurality of samples to obtain an empirical data set. Such techniques may also include selecting, based on the empirical data set, and fitting to the empirical data set, an appropriate linear mixed model for the quantifiable property. Such techniques may further include computing an acceptance parameter from a mean and standard deviation obtained from the appropriate linear mixed model. The acceptance parameter may include a process capability index or a tolerance interval bound. Such techniques may further include determining that the candidate supplier qualifies based on comparing the acceptance parameter to a threshold.

Abstract: A method and apparatus is provided to calibrate a LiDAR using a reflect array calibration target having a spatially varying spectral reflectance profile. A frequency modulated continuous wave LiDAR emits a beam that spans a range of wavelengths, and, therefore, spatially varying spectral features in the reflectance profile can be used as indicia of where the LiDAR beam hits the calibration target. For example, the center has one absorption wavelength and the periphery has another, such that alignment is achieved by changing the alignment direction to maximize the spectral feature at the one absorption wavelength while minimizing the spectral feature at the other absorption wavelength. Alternatively, at least one spectral feature can have a center wavelength that changes as a function of space. Thus, the LiDAR is aligned by changing the beam direction to shift the center wavelength to a value corresponding to the target center.

Abstract: Techniques are provided for generating target success group of hybrid seeds for target fields include a server receiving agricultural data records that represent crop seed data describing seed and yield properties of hybrid seeds and first field geo-location data for agricultural fields where the hybrid seeds were planted. The server receives second geo-locations data for target fields where hybrid seeds are to be planted. The server generates a dataset of hybrid seed properties that include yield values and environmental classifications for hybrid seeds and then a dataset of success probability scores that describe the probability of a successful yield on the target fields based on the dataset of hybrid seed properties and the second geo-location data. The server generates target success yield group of hybrid seeds and probability of success values based on success probability scores and a yield threshold. The server causes display of the target success yield group.

Abstract: A workpiece transport apparatus for transporting a workpiece includes: a hand device; a moving device that includes a movable part mounted with the hand device and that includes at least one drive axis configured to operate the movable part; a current measurement section configured to measure a current value of a motor that drives the drive axis; and a workpiece number detection section configured to detect that a number of workpieces held by the hand device is different from an expected number based on a comparison result between the current value measured by the current measurement section when the hand device holds the workpiece, and a predetermined threshold value.

Abstract: The invention comprises a product. The product comprises a first removable concrete form having a concrete forming face and a first insulating panel insert having a first primary surface and an opposite second primary surface, wherein the second primary surface of the first insulating panel insert contacts the concrete forming face of the first removable concrete form. The product also comprises an elongate anchor member having an enlarged portion and an elongate portion, the elongate portion having a first end and an opposite second end, wherein the enlarged portion is disposed adjacent the first end and contacts the second primary surface of the first insulating panel insert and wherein the elongate portion extends through the first insulating panel insert and extends outwardly from the first primary surface of the first insulating panel insert. A method of using a removable insulated concrete form system is also disclosed.

Abstract: An example method for estimating the angle-of-arrival (AoA) and other parameters of radio frequency (RF) signals that are received by an antenna array comprises: receiving a plurality of radio frequency (RF) signal power measurements by a plurality of antenna elements at a plurality of RF channels; computing, by applying a machine learning model to the plurality of RF signal power measurements, an estimated RF signal parameter value; and outputting the RF signal parameter value.

Abstract: An assessment system includes a storage device and a processing circuit. The processing circuit is coupled to the storage device and configured to execute the instructions stored in the storage device. The storage device is configured for storing instructions of extracting at least one feature parameter corresponding to at least one defect detected on an object respectively; determining at least one feature evaluation according to the at least one feature parameter respectively; weighting the at least one feature evaluation to calculate at least one weighted feature evaluation respectively; summing the at least one weighted feature evaluation to calculate at least one total score corresponding to at least one lesson-learnt case; and ranking the at least one total score corresponding to the at least one lesson-learnt case to find out a suspected root cause corresponding to one of the at least one lesson-learnt case with higher priority.

Abstract: A semiconductor process analysis device of an embodiment includes a memory and a processor connected to the memory. The processor performs factoring to inspection result groups resulting from inspections of a substrate group, the inspections including an inspection of a fabrication process of a semiconductor integrated circuit. The inspection result groups are first distribution groups resulting from a single inspection of each substrate of the substrate group. Each first distribution represents a distribution of inspection data on a substrate surface. The factoring includes calculating, from the first distribution groups, for each of one or more second distributions, appearance information containing a degree of appearance of one of the one or more second distributions in each substrate. The processor calculates a degree of association between two items of the appearance information, the two items respectively corresponding to different inspection result groups among the inspection result groups.

Abstract: The present disclosure relates to systems and methods for evaluating a medical image. The systems and methods may obtain the medical image. The systems and methods may extract a feature of the medical image. The feature may include a histogram of oriented gradients (HOG) feature of the medical image. The systems and methods may determine a degree to which an artifact in the medical image affects recognition of a tissue feature by inputting the feature of the medical image to a determination model.

Abstract: A method, apparatus, and/or computer program product can perform an analog defect simulation on an electronic device. The method, apparatus, and/or computer program product can generate a defect catalog which identifies a defect class relating to a defect and a modeling parameter that is associated with the defect class. The method, apparatus, and/or computer program product can receive a weight formula that identifies a weight for the defect class in relation to the modeling parameter. The method, apparatus, and/or computer program product can call a defect weight function to return the weight from the defect weight formula. The method, apparatus, and/or computer program product can perform the analog defect simulation on the electronic device. The method, apparatus, and/or computer program product can determine a simulation statistic relating to the analog defect simulation utilizing the weight.

Abstract: An electronic apparatus including a display and one or more processor is disclosed. The one or more processor is configured to: divide a first error value of each of a plurality of first components with respect to a mounting position acquired through inspection of a plurality of substrates of a first type, into a plurality of error values, generate a graph of a tree structure including a plurality of nodes corresponding to the plurality of first components, component types of each of the plurality of first components and a plurality of components included in a mounter, adjust attributes of each of the plurality of nodes using the plurality of error values divided from the first error value of each of the plurality of first components, and display the graph in which the attributes of each of the plurality of nodes are adjusted, on the display.

Abstract: A semiconductor device includes a semiconductor die having a peripheral region surrounding, a defect detection circuit in the peripheral region, the defect detection circuit arranged in an open conduction loop, the defect detection circuit comprising a plurality of latch circuits and a plurality of defect detection conduction paths, each defect detection conduction path of the plurality of defect detection conduction paths connecting two adjacent latch circuits of the plurality of latch circuits, and a test control circuitry configured to perform (a) a test write operation by transferring bits of an input data pattern in a forward direction of the open conduction loop to cause the plurality of latch circuits to store the bits of the input data pattern in the plurality of latch circuits, and (b) a test read operation by transferring bits stored in the plurality of latch circuits in a backward direction of the open conduction loop.

Abstract: An electronic component handling apparatus handles a device under test (DUT). The electronic component handling apparatus includes: a set plate that holds a DUT container including a plurality of pockets each of which accommodates the DUT; a sensor that acquires three-dimensional shape data of the DUT container; and a processor that corrects the shape data based on an inclination of the set plate, extracts a height and an inclination of a predetermined region corresponding to the DUT in a first pocket among the pockets, from the shape data corrected by the processor, and determines an accommodation state of the DUT in the first pocket based on an extraction result obtained by the processor.

Abstract: Methods and systems for generating a reference image for use in a process performed for a specimen are provided. One system includes a virtual system configured to receive output generated by actual systems for specimens, each of which has device areas of the same type formed thereon. The virtual system is configured for identifying defective portions of the device areas based on the output generated for the specimens by at least two of the actual systems and eliminating the defective portions of the device areas from the device areas in which the defective portions were identified to thereby generate remaining portions of the device areas. In addition, the virtual system is configured for generating a reference image from the output generated for the remaining portions of at least one device area on a first of the specimens and at least one device area on a second of the specimens.

Abstract: Briefly, an intelligent label is associated with a good, and includes one or more permanent and irreversible electrochromic indicators that are used to report the condition of that good at selected points in the movement or usage of that good. These electrochromic indicators provide immediate visual information regarding the status of the good without need to interrogate or communicate with the electronics or processor on the intelligent label. In this way, anyone in the shipping or use chain for the good, including the end user consumer, can quickly understand whether the product is meeting shipping and quality standards. If a product fails to meet shipping or quality standards, the particular point where the product failed can be quickly and easily identified, and information can be used to assure the consumer remains safe, while providing essential information for improving the shipping process.

Abstract: The present disclosure provides an analysis method of a semiconductor device, and the semiconductor device comprises a plurality of HKMG fin field effect transistors and a wafer on which the plurality of HKMG fin field effect transistors are located, and the analysis method comprises: performing acceptance testing on the wafer to be tested; constructing an N-type model based on the position of each N-type transistor at the surface of the wafer to be tested and the corresponding acceptance test result, constructing a P-type model based on the position of each P-type transistor at the surface of the wafer to be tested and the corresponding acceptance test result, and constructing an N/P ratio model corresponding to the surface of the wafer to be tested based on the N-type model and the P-type model; and identifying the N/P ratio model based on a preset standard wafer model to determine whether the wafer to be tested is compliant based on the N/P ratio model.

Abstract: A device and method are provided for monitoring quality and performance parameters of an electricity distribution component in an electricity distribution network and detecting any deviation of operating parameters from the specified regulatory set and enforced limits. The critical and increasing problem is mitigated for the myriad of private domestic and commercial DEG devices being installed and connected to the distribution networks which were not initially designed for, or even not anticipated with, the recent DEG evolution, and the increasing complex electrical components with changing loads and power factors across the distribution network.

Abstract: Concrete can be one of the most durable building materials where consumption is projected to reach approximately 40 billion tons in 2017 alone. Despite this the testing of concrete at all stages of its life cycle is still in its infancy although testing for corrosion is well established. Further many of the tests today are time consuming, expensive, and provide results only after it has been poured and set. Accordingly, by exploiting self-contained wireless sensor devices, which are deployed with the wet concrete, the in-situ curing and maturity measurement data can be established and employed together with batch specific concrete data to provide rapid initial tests and evolving performance data regarding the concrete cure, performance, corrosion of concrete at different points in its life cycle. Such sensors remove subjectivity, allow for rapid assessment, are integrable to the construction process, and provided full life cycle assessment.

Abstract: Aspects relating to gemstone profiling are described. A gemstone profiling system includes a holder that is rotatable by an actuator and can hold a gemstone, the gemstone having a reference mark. The system includes a non-contact measuring unit to determine a distance between a center of rotation of the gemstone and a surface of the gemstone. Further, the system includes a controller to rotate the gemstone through a plurality of orientations and receive the measured distance between a center of rotation of the gemstone and a surface of the gemstone in each of the plurality of orientations of the gemstone. The controller can generate a profile of the gemstone based on the received distance in the plurality of orientations.

Abstract: The transceiver for undersea communication includes both a receiver and a transmitter. The transmitter includes a transmitter digital signal processor for converting a transmitted communication signal into a modulated transmission signal. The transmitter digital signal processor applies a modulation scheme to the transmitted communication signal during its conversion into the modulated transmission signal. The transmitter converts the modulated transmission signal into modulated electrical pulses, which are applied to electrodes to produce a modulated electric field. The receiver includes a receiving antenna formed from samarium nickelate (SmNiO3). Samarium nickelate (SNO) is known to have measurable changes in resistance responsive to changes in applied sub-volt electric potentials when the samarium nickelate is immersed in salt water, such as in an undersea environment.

Abstract: Pattern centric process control is disclosed. A layout of a semiconductor chip is decomposed into a plurality of intended circuit layout patterns. For the plurality of intended circuit layout patterns, a corresponding plurality of sets of fabrication risk assessments corresponding to respective ones of a plurality of sources is determined. Determining a set of fabrication risk assessments for an intended circuit layout pattern comprises determining fabrication risk assessments based at least in part on: simulation of the intended circuit layout pattern, statistical analysis of the intended circuit layout pattern, and evaluation of empirical data associated with a printed circuit layout pattern. A scoring formula is applied based at least in part on the sets of fabrication risk assessments to obtain a plurality of overall fabrication risk assessments for respective ones of the plurality of intended circuit layout patterns.

Abstract: A tool-life prediction method, applicable to a machine tool having a machining end, includes steps of capturing a plurality of measurement data from a tool of the machining end, transforming each of the plurality of measurement data into a corresponding complex process capability index (Cpk), utilizing an artificial neural network being trained to generate a tool-life prediction scale with respect to the Cpk, and then based on the tool-life prediction scale to determine a remaining tool life of the tool. In addition, a tool life prediction system is also provided.

Abstract: A method for multiplying an object in a database may include receiving, from a client, an indication that an object is associated with a first variable attribute having a first variation and a second variation. A bucket may be created in response to the indication. The bucket may include the object, a first sub-object having a first reference to the first variation of the first variable attribute, and a second sub-object having a second reference to the second variation of the first variable attribute. The bucket may be created instead of a first object having the first variation of the first variable attribute and a second object having the second variation of the first variable attribute. The bucket stored in the database may be accessed in response to a query from the client accessing the object. Related systems and articles of manufacture including computer program products are also provided.

Abstract: A system controls and monitors a heating, ventilation, and air conditioning (HVAC) system. The system receives raw data from HVAC equipment, controller performance monitoring (CPM) indicators associated with the HVAC equipment, and a set of rules associated with the HVAC equipment. The system processes the CPM indicators and the raw data using the set of rules to generate fault relevancies, and processes the fault relevancies.

Abstract: A disposition manager configured to identify a damaged component of a damaged assembly by determining a measured first property value of a set of measured property values associated with the damaged component and obtained by a sensor is not within a range of acceptable first property values according to a specification of the damaged component. The disposition manager further configured to estimate a performance characteristic of the damaged component and a salvage value of the damaged component. The disposition manager further configured to present, to a user interface, the performance characteristic and the salvage value for the damaged component.

Abstract: A board inspecting apparatus include a measuring section, a processing section and a display section. The measuring section obtains measurement data for at least a portion of a board. The processing section compares the measurement data and reference data of the board, based on selection feature objects, by associated selection feature objects, to perform distortion compensation for the board, and inspects the board with distortion compensation. The display section distinguishably displays a first area with the distortion compensation successful and a second area with the distortion compensation failed. The processing section compares a number of recognizable effective feature objects with a reference number, and determine the distortion compensation as failed when the number of the recognizable effective feature objects is below the reference number.

Abstract: An inspecting and repairing device of additive manufacturing technology and a method thereof are provided. The inspecting and repairing device has a powder bed unit, a repairing unit, and an inspection unit. The powder bed unit has a powder platform, a powder spreading mechanism and a laser unit. The repairing unit has a processing mechanism. The inspection unit has a camera and a controller. According to an image of the powder platform captured by the camera, the controller can determine whether spreading powders, whether being overcome a powder spreading defect, or whether driving the processing mechanism to repair a surface of a workpiece.

Abstract: Disclosed are methods and systems for detecting an abnormal stress condition in a subject or group of subjects. Included is a risk evaluation system monitoring people, wherein a control unit in a stress management system obtains mental health information and records same in a measurement information database. The control unit then specifies a pattern in a reference pattern database and obtains the measurement information relating to this pattern from the measurement information database. The control unit in the stress management system (20) then revises a standard pattern based on individual attributes or work attributes. Next, the control unit performs pattern matching and determines whether or not attention is required. If the determination is that attention is required, the control unit presents an alert and an advice. This enables work, organization, and member risks to be appropriately evaluated based on changes in mental health information.

Abstract: Examples are disclosed that relate to computing devices and methods for simulating light passing through one or more lenses. In one example, a method comprises obtaining a point spread function of the one or more lenses, obtaining a first input raster image comprising a plurality of pixels, and ray tracing the first input raster image using the point spread function to generate a first output image. Based on ray tracing the first input raster image, a look up table is generated by computing a contribution to a pixel in the first output image, wherein the contribution is from a pixel at each location of a subset of locations in the first input raster image. A second input raster image is obtained, and the look up table is used to generate a second output image from the second input raster image.

Abstract: Methods and systems for evaluating the geometric characteristics of patterned structures are presented. More specifically, geometric structures generated by one or multiple patterning processes are measured by two or more metrology systems in accordance with a hybrid metrology methodology. A measurement result from one metrology system is communicated to at least one other metrology systems to increase the measurement performance of the receiving system. Similarly, a measurement result from the receiving metrology system is communicated back to the sending metrology system to increase the measurement performance of the sending system. In this manner, measurement results obtained from each metrology system are improved based on measurement results received from other cooperating metrology systems. In some examples, metrology capability is expanded to measure parameters of interest that were previously unmeasurable by each metrology system operating independently.

Abstract: Methods manage non-destructive evaluation (“NDE”) data. NDE data for an asset is received and at least one alignment algorithm to align the NDE data to a simulated model associated therewith is determined. The NDE data is automatically aligned to the simulated model, a display representation that visually represents the aligned NDE data on the simulated model is generated, and information about the aligned NDE data is exported. Additionally, second NDE data associated with the at least a portion of the asset may also be received, at least one alignment algorithm to align the data determined, and the second NDE data aligned. Respective indications associated with the first and second NDE data may be determined and visually represented on the simulated model. Moreover, a shot descriptor file may be analyzed to determine whether additional NDE data is required to complete an alignment of NDE data.

Abstract: A method of inspecting the wear of a turbine engine part includes, by means of a calculator: a reference plane is defined; by measuring said part to be inspected, a modelling of at least a portion of said part is acquired in the form of a three-dimensional inspection grid; the three-dimensional inspection grid is inspected with the reference plane, using a dedicated algorithm using a projection of points (10; 10.1, 10.2, . . . , 10.n); if the result of the comparison is included in a predetermined tolerance range, the part is defined as compliant; otherwise, the part is non-compliant.

Abstract: Techniques and systems are provided for processing image data using one or more neural networks. For example, a patch of raw image data can be obtained. The patch can include a subset of pixels of a frame of raw image data, and the frame can be captured using one or more image sensors. The patch of raw image data includes a single color component for each pixel of the subset of pixels. At least one neural network can be applied to the patch of raw image data to determine a plurality of color component values for one or more pixels of the subset of pixels. A patch of output image data can then be generated based on application of the at least one neural network to the patch of raw image data. The patch of output image data includes a subset of pixels of a frame of output image data, and also includes the plurality of color component values for one or more pixels of the subset of pixels of the frame of output image data.

Abstract: Provided is a method of evaluating a semiconductor substrate, which evaluates quality of the semiconductor substrate by a photoluminescence measurement, wherein the evaluation by the photoluminescence measurement includes, after subjecting a surface of an evaluation-target semiconductor substrate to a pretreatment, irradiating the surface with excitation light, and then detecting emission obtained from the surface having been irradiated with the excitation light, and the pretreatment includes subjecting the surface of the evaluation-target semiconductor substrate to be irradiated with the excitation light to an oxide film formation treatment and charging the surface of the formed oxide film by corona discharge.