Quality Control Patents (Class 702/84)
  • Patent number: 10421247
    Abstract: A quality-control device (200) includes: an illumination system (202) for illuminating one peripheral face of each folding box, an image capture device (204) for forming a multiple image of the respective peripheral faces of a bundle of folding boxes, an image processing system (206) for: i) detecting within the multiple image each peripheral end of the slots of each box that separate its adjacent flaps, ii) generating a data set indicative of the geometry of each peripheral end, and iii) analyzing the data set to determine the width of each peripheral end.
    Type: Grant
    Filed: December 17, 2015
    Date of Patent: September 24, 2019
    Assignee: BOBST LYON
    Inventors: Robert Amoros, Benoît Rosset
  • Patent number: 10402193
    Abstract: A cognitive system, method and computer program product for maximizing a productivity of software development by a software development team. The system and method implement cognitive processes for determining what certain organizational factors and their optimal values which correspond to high performing software development teams. Based on the determinations correlating organization factors with productivity increases, the system prescribes what Key Performance Indicators (KPIs) to improve (e.g., increase and decrease), and determine what are the target improvement values. Use of the systems and methods described herein enable development managers and executives to build maximum performance teams (or transform existing teams, boosting their productivity), by leveraging customized quantitative recommendation provided as output.
    Type: Grant
    Filed: December 15, 2017
    Date of Patent: September 3, 2019
    Assignee: International Business Machines Corporation
    Inventors: Gregory J. Boss, Nikolay Kadochnikov, Peter P. Bradford
  • Patent number: 10331437
    Abstract: A cognitive system, method and computer program product for maximizing a productivity of software development by a software development team. The system and method implement cognitive processes for determining what certain organizational factors and their optimal values which correspond to high performing software development teams. Based on the determinations correlating organization factors with productivity increases, the system prescribes what Key Performance Indicators (KPIs) to improve (e.g., increase and decrease), and determine what are the target improvement values. Use of the systems and methods described herein enable development managers and executives to build maximum performance teams (or transform existing teams, boosting their productivity), by leveraging customized quantitative recommendation provided as output.
    Type: Grant
    Filed: July 5, 2017
    Date of Patent: June 25, 2019
    Assignee: International Business Machines Corporation
    Inventors: Gregory J. Boss, Nikolay Kadochnikov, Peter P. Bradford
  • Patent number: 9913281
    Abstract: A user equipment (UE) comprising a processor, a non-transitory memory, wherein the non-transitory memory comprises a default access point name (APN), a cellular radio transceiver, a first mobile application, stored in the non-transitory memory, and a dynamic customization application, stored in the non-transitory memory. When executed by the processor, the dynamic customization application receives an index that associates a plurality of mobile applications to APNs via the cellular radio transceiver, wherein the index associates the first mobile application to a first APN that is different from the default APN, stores the index in the non-transitory memory, receives a request to establish a data communication session from the first mobile application, looks up the first APN in the index based on a name of the first mobile application, and establishes a data communication session over a communication channel defined by the first APN via the cellular radio transceiver.
    Type: Grant
    Filed: February 18, 2016
    Date of Patent: March 6, 2018
    Assignee: Sprint Communications Company L.P.
    Inventors: Glen Gemeniano, Roberto Murillio, Simon Youngs
  • Patent number: 9756869
    Abstract: A ground roast coffee tablet which is capable of being brewed in a conventional automatic drip coffee maker, and which exhibits sufficient strength to withstand all aspects of manufacture, handling, packaging, transport without breakage but also readily disintegrates when contacted with hot water during brewing, is made by subjecting conventional ground, roasted coffee to a multi-step compaction process in which at least two compression steps are carried out in the same compaction die.
    Type: Grant
    Filed: April 25, 2014
    Date of Patent: September 12, 2017
    Assignee: THE FOLGER COFFEE COMPANY
    Inventor: Jerry Douglas Young
  • Patent number: 9603376
    Abstract: A ground roast coffee tablet which is capable of being brewed in a conventional automatic drip coffee maker, and which exhibits sufficient strength to withstand all aspects of manufacture, handling, packaging, transport without breakage but also readily disintegrates when contacted with hot water during brewing, is made by subjecting conventional ground, roasted coffee to a multi-step compaction process in which at least two compression steps are carried out in the same compaction die.
    Type: Grant
    Filed: April 24, 2014
    Date of Patent: March 28, 2017
    Assignee: THE FOLGER COFFEE COMPANY
    Inventor: Jerry Douglas Young
  • Patent number: 9474291
    Abstract: A ground roast coffee tablet which is capable of being brewed in a conventional automatic drip coffee maker, and which exhibits sufficient strength to withstand all aspects of manufacture, handling, packaging, transport without breakage but also readily disintegrates when contacted with hot water during brewing, is made by subjecting conventional ground, roasted coffee to a multi-step compaction process in which at least two compression steps are carried out in the same compaction die.
    Type: Grant
    Filed: May 23, 2012
    Date of Patent: October 25, 2016
    Assignee: THE FOLGER COFFEE COMPANY
    Inventor: Jerry Douglas Young
  • Patent number: 9474290
    Abstract: A ground roast coffee tablet which is capable of being brewed in a conventional automatic drip coffee maker, and which exhibits sufficient strength to withstand all aspects of manufacture, handling, packaging, transport without breakage but also readily disintegrates when contacted with hot water during brewing, is made by subjecting conventional ground, roasted coffee to a multi-step compaction process in which at least two compression steps are carried out in the same compaction die.
    Type: Grant
    Filed: May 23, 2012
    Date of Patent: October 25, 2016
    Assignee: THE FOLGER COFFEE COMPANY
    Inventor: Jerry Douglas Young
  • Patent number: 9405291
    Abstract: Systems and methods to monitor an asset in an operating process unit are disclosed. An example method includes monitoring one or more equipment parameters associated with an asset in an operating process unit, monitoring one or more process parameters associated with the asset, and determining an asset health value corresponding to the asset based on the one or more monitored equipment parameters, process parameters, and baseline data associated with the one or more equipment parameters.
    Type: Grant
    Filed: July 31, 2012
    Date of Patent: August 2, 2016
    Assignee: FISHER-ROSEMOUNT SYSTEMS, INC.
    Inventors: Joseph Hiserodt Sharpe, Jr., Douglas Cecil White, Gary Thomas Hawkins, Timothy Jacob Olsen
  • Patent number: 9406116
    Abstract: Method of measuring a point cloud of an object includes obtaining the point cloud of the object from a storage device of the electronic device. Based on the point cloud, a triangular mesh surface is constructed and triangles of the triangular mesh surface are determined. According to the triangles, a reference plane is determined. According to the reference plane, a three dimensional (3D) object coordinate system is established. 3D object coordinates of points in the point cloud are calculated in the 3D object coordinate system. Measurement elements of a profile of the point cloud are determined and points in the point cloud corresponding to each of the measurement elements are determined. According to the 3D object coordinates of the determined points corresponding to each of the measurement elements, each of the measurement elements are fit. A distance and an angle of two fit measurement elements are calculated.
    Type: Grant
    Filed: July 23, 2014
    Date of Patent: August 2, 2016
    Assignee: Zijilai Innovative Services Co., Ltd.
    Inventors: Chih-Kuang Chang, Xin-Yuan Wu, Yi Liu
  • Patent number: 9395408
    Abstract: The present invention generally relates to the monitoring and controlling of a semiconductor manufacturing environment and, more particularly, to methods and systems for virtual meteorology (VM) applications based on data from multiple tools having heterogeneous relatedness. The methods and systems leverage the natural relationship of the multiple tools and take advantage of the relationship embedded in process variables to improve the prediction performance of the VM predictive wafer quality modeling. The prediction results of the methods and systems can be used as a substitute for or in conjunction with actual metrology samples in order to monitor and control a semiconductor manufacturing environment, and thus reduce delays and costs associated with obtaining actual physical measurements.
    Type: Grant
    Filed: November 15, 2012
    Date of Patent: July 19, 2016
    Assignee: GLOBALFOUNDRIES Inc.
    Inventors: Yada Zhu, Jingrui He, Robert Jeffrey Baseman
  • Patent number: 9396978
    Abstract: A substrate processing apparatus can efficiently perform a trial operation in conditions close to those of an actual operation. In the substrate processing apparatus 1 for taking substrates W out of a transfer chamber (FOUPs 1 to 4), processing the substrates W in each of processing modules 2 and returning the processed substrates W to the transfer chamber, a mode selection unit 31 selects an operation check mode for performing an operation check of wafer transfer devices 15 and 17 or the processing modules 2. Further, a job setting unit 32 sets control jobs for the operation check and a process job as a recipe executed on the substrate W. A controller 3 determines whether or not a first control job and a second control job to be executed subsequently after the first control job are allowed to be executed in parallel.
    Type: Grant
    Filed: April 19, 2012
    Date of Patent: July 19, 2016
    Assignee: TOKYO ELECTRON LIMITED
    Inventor: Takeshi Matsumoto
  • Patent number: 9336109
    Abstract: A method of testing a device is disclosed. Test data is obtained for a device testing program that tests the device. An adaptation command for testing the device is determined at an adaptive testing engine using obtained test data. The adaptation command is sent from the adaptive testing engine to a tool control application. The tool control application uses the adaptation command to control an operation related to the testing of the device.
    Type: Grant
    Filed: February 26, 2013
    Date of Patent: May 10, 2016
    Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: David E. Atkinson, Matthew S. Grady, Donald L. LaCroix, David B. Lutton, II, Bradley D. Pepper, Randolph P. Steel
  • Patent number: 9311201
    Abstract: A method of testing a device is disclosed. Test data is obtained for a device testing program that tests the device. An adaptation command for testing the device is determined at an adaptive testing engine using obtained test data. The adaptation command is sent from the adaptive testing engine to a tool control application. The tool control application uses the adaptation command to control an operation related to the testing of the device.
    Type: Grant
    Filed: August 22, 2012
    Date of Patent: April 12, 2016
    Assignee: International Business Machines Corporation
    Inventors: David E. Atkinson, Matthew S. Grady, Donald L. LaCroix, David B. Lutton, II, Bradley D. Pepper, Randolph P. Steel
  • Patent number: 9298468
    Abstract: A pipelined processing device includes: a pipeline controller configured to receive at least one instruction associated with an operation from each of a plurality of subcontrollers, and input the at least one instruction into a pipeline; and a pipeline counter configured to receive an active time value from each of the plurality of subcontrollers, the active time value indicating at least a portion of a time taken to process the at least one instruction, the pipeline controller configured to route the active time value to a shared pipeline storage for performance analysis.
    Type: Grant
    Filed: December 3, 2013
    Date of Patent: March 29, 2016
    Assignee: International Business Machines Corporation
    Inventors: Ekaterina M. Ambroladze, Deanna Postles Dunn Berger, Michael Fee, Christine C. Jones, Arthur J. O'Neill, Diana Lynn Orf, Robert J. Sonnelitter
  • Patent number: 9292654
    Abstract: Apparatus for performing diagnostic imaging examinations with tutorial means for the user, both in the preparatory step and in the operative step, and method for using the apparatus.
    Type: Grant
    Filed: October 15, 2009
    Date of Patent: March 22, 2016
    Assignee: ESAOTE EUROPE N.V.
    Inventors: Joop Geijsen, Marco Lagustena
  • Patent number: 9176183
    Abstract: The present invention generally relates to the monitoring and controlling of a semiconductor manufacturing environment and, more particularly, to methods and systems for virtual meteorology (VM) applications based on data from multiple tools having heterogeneous relatedness. The methods and systems leverage the natural relationship of the multiple tools and take advantage of the relationship embedded in process variables to improve the prediction performance of the VM predictive wafer quality modeling. The prediction results of the methods and systems can be used as a substitute for or in conjunction with actual metrology samples in order to monitor and control a semiconductor manufacturing environment, and thus reduce delays and costs associated with obtaining actual physical measurements.
    Type: Grant
    Filed: October 15, 2012
    Date of Patent: November 3, 2015
    Assignee: GLOBALFOUNDRIES, INC.
    Inventors: Yada Zhu, Jingrui He, Robert Jeffrey Baseman
  • Patent number: 9043008
    Abstract: A method models a defect management routine. Both the modeling and a handling are executed within a manufacturing execution system. During an engineering phase: modeling the production process and creating a library of possible defect types which may occur; assigning the defect types to at least one defect group; creating a library of defect specifications; creating a library of defect type specification details; creating at least one runtime defect criteria that is used to link the defect type to a certain production volume; and creating a runtime defect measurement routine that monitors a corrective measure. During a runtime production phase evaluating the product produced; identifying the respective defect type out of the library of defect types; and using the identified defect type to determine a corrective measure, a runtime defect criteria identifying the resource causing the defect type, a production volume, and to run the respective runtime defect management routine.
    Type: Grant
    Filed: September 21, 2011
    Date of Patent: May 26, 2015
    Assignee: Siemens Aktiengesellschaft
    Inventors: Andrea Boero, Ignazio Selvaggio
  • Patent number: 9008975
    Abstract: An apparatus for detecting periodic defects includes a sensor that obtains signals to evaluate properties of an area having a length longer than an expected defect period; a small area selector that separates small areas whose area length is shorter than that of the area so that all adjacent distance intervals are equal in a periodic defect arrangement direction, and selecting signals corresponding to the positions of the plurality of small areas from outputs from the sensor; an evaluation index calculator that calculates a similarity evaluation index between signal patterns among signals selected by the small area selector; a set value changer that changes the positions of the small areas and the distance interval, and repeating computational processings of the small area selector and the evaluation index calculator; and a period judgment device that judges the distance interval as a period when the evaluation index is higher than a value.
    Type: Grant
    Filed: March 27, 2009
    Date of Patent: April 14, 2015
    Assignee: JFE Steel Corporation
    Inventors: Takahiro Koshihara, Hiroharu Kato, Akio Nagamune
  • Patent number: 8996929
    Abstract: A management system includes a plurality of analyzers; and a computer system connected to the analyzers via a network, wherein each of the analyzers comprises: a data transmitter for transmitting data produced by the analyzer to the computer system via the network, and wherein the computer system includes a memory under control of a processor, the memory storing instructions enabling the processor to carry out operations, comprising: (a) receiving a plurality of data transmitted from the data transmitters of the plurality of analyzers; (b) generating an aggregate result used for determining a determination condition for making a determination as to whether or not a notification to a user of the analyzer is required based on the plurality of received data; and (c) outputting the aggregate result. A computer system and a method of providing information are also disclosed.
    Type: Grant
    Filed: January 30, 2009
    Date of Patent: March 31, 2015
    Assignee: Sysmex Corporation
    Inventors: Tadayuki Yamaguchi, Atsushi Shirakami, Takeshi Matsumoto
  • Publication number: 20150081241
    Abstract: According to one embodiment, a production support system includes: a production information storage unit; a manufacturing apparatus information storage unit; an inspection/measurement apparatus information storage unit; a planned lot number calculation unit; a first control mode calculation unit. The first control mode calculation unit is configured to calculate an appropriate control mode from the number of products to be subjected to the control of the final quality, a relationship between fluctuation of the final quality and a number of products when performing a predetermined feedback type/feedforward type combined APC, fluctuation of the final quality when performing a feedforward type APC, and fluctuation of the final quality when not performing the feedback type/feedforward type combined APC.
    Type: Application
    Filed: March 11, 2014
    Publication date: March 19, 2015
    Applicant: KABUSHIKI KAISHA TOSHIBA
    Inventors: Muneyoshi YAMADA, Akira SOGA, Atsushi ITOH, Yuuji FUJITA
  • Patent number: 8981910
    Abstract: According to one embodiment, an RFID tag issuing apparatus includes a communication instructing unit, a search unit, and a misalignment amount detecting unit. The communication instructing unit instructs a reader-writer unit to communicate with the RFID tag at a reference position that is reached when the label is carried by a predetermined amount in a predetermined direction after the specific position on the label is detected by a label position detecting unit. The search unit repeats a carrying of the label and a communication instruction to the reader-writer unit when communication cannot be established with the RFID tag, and thus searches for a communication-available range with the RFID tag. The misalignment amount detecting unit detects an amount of carrying of the label to reach the communication-available range from the reference position, as a misalignment amount of the RFID tag.
    Type: Grant
    Filed: July 2, 2012
    Date of Patent: March 17, 2015
    Assignee: Toshiba Tec Kabushiki Kaisha
    Inventor: Kouichi Sano
  • Patent number: 8961876
    Abstract: A sample analyzer for analyzing a sample with a liquid in a container is disclosed. The sample analyzer comprises: a reader that reads an information of a liquid in a container, the information of the liquid being stored in a storage medium; a display; and a controller including a processor and a memory under control of the processor, the memory storing instruction causing the processor to carry out operations comprising: determining whether the sample analyzer is ready to read the information of the liquid by the reader; and causing, when the sample analyzer is determined to be ready, the display to display an indication that indicates the sample analyzer is ready to read the information of the liquid by the reader.
    Type: Grant
    Filed: November 22, 2011
    Date of Patent: February 24, 2015
    Assignee: Sysmex Corporation
    Inventors: Eiji Tanoshima, Naohiko Matsuo, Eiji Hama
  • Patent number: 8958917
    Abstract: The present invention provides a remote monitoring system for monitoring the operation of a fluid treatment system and/or the qualities, characteristics, properties, etc., of the fluid being processed or treated by the fluid treatment system. The system includes a remote computer that may be associated with a database that accesses data transmitted from the fluid treatment system with the data collected, acquired, etc., from one or more sensors placed in the fluid treatment system for measuring fluid quality and/or equipment operation in a fluid treatment system. The remote computer may then analyze or manipulate the data to generate an analysis result or analysis report that may be sent or communicated along with the data and/or any historical or expected information or data to a remote viewing device for viewing by a user. A method is further provided for the operation of the remote monitoring system of the present invention.
    Type: Grant
    Filed: September 23, 2009
    Date of Patent: February 17, 2015
    Assignee: Hach Company
    Inventors: Thomas D. Wolfe, Charles Scholpp
  • Publication number: 20150006098
    Abstract: Disclosed are a method and an apparatus for manufacturing a radiation intensity bolus.
    Type: Application
    Filed: February 1, 2013
    Publication date: January 1, 2015
    Applicant: Samsung Life Public Welfare Foundation
    Inventor: Sang Gyu Ju
  • Patent number: 8898028
    Abstract: A device to inspect a non-pattern wafer includes a light source to emit light that reflected from a wafer. A judgment unit converts the detected light into a quantitative measured value to determine whether the wafer is faulty. The wafer comprises a first region and a second region. The detection unit sequentially detects lights reflected from the first and second regions of the wafer, and a judgment unit converts the lights reflected from the first and second regions of the wafer into first and second quantitative measured values, respectively. The second region of the wafer is determined to be faulty by comparing the second measured value with a first reference value, wherein the first reference value is calculated using an average value between the first and second measured values, and a characteristic value that indicates distribution of the first and second measured values.
    Type: Grant
    Filed: December 23, 2010
    Date of Patent: November 25, 2014
    Assignee: SAMSUNG Electronics Co., Ltd.
    Inventors: Byeong-Cheol Kim, Ho-Hyung Jung, Dong-Keun Shin
  • Publication number: 20140336966
    Abstract: A method and apparatus for automatically providing a virtual sensor have been described. In one embodiment, a method for automatically providing a virtual sensor includes receiving a plurality of virtual sensor templates from a server. The method further includes selecting a virtual sensor template from the plurality of virtual sensor templates. The selected virtual sensor template has an algorithm to provide a desired functionality. The method further includes selecting at least one parameter to configure the selected virtual sensor template. The method further includes automatically creating a virtual sensor associated with the selected virtual sensor template.
    Type: Application
    Filed: July 22, 2014
    Publication date: November 13, 2014
    Inventors: Natalia Kroupnova, Aleksey Yanovich, Thorsten Kril, Mikhail B. Kozine
  • Patent number: 8886481
    Abstract: A method of reducing variation in multi-die integrated circuits can include, for each of a plurality of dies, determining at least one performance metric and selecting at least two dies for inclusion within a multi-die integrated circuit according to the at least one performance metric. Systems and devices for executing the steps of the method are also described.
    Type: Grant
    Filed: July 13, 2010
    Date of Patent: November 11, 2014
    Assignee: Xilinx, Inc.
    Inventors: Arifur Rahman, Michael J. Hart, Venkatesan Murali
  • Patent number: 8886482
    Abstract: Described is a system for remotely monitoring water quality at one or more locations via a web-enabled application. Embodiments of the present invention provide remote water sampler control with integrated predictive sampling. In some embodiments, the present invention provides a web-hosted application that allows for remote user control of one or more water samplers in combination with predictive sampling.
    Type: Grant
    Filed: June 7, 2011
    Date of Patent: November 11, 2014
    Assignee: Hach Company
    Inventors: Timothy Alan Higgins, Ajit Kumar Ananthapadmanabhan
  • Patent number: 8880374
    Abstract: Provided is a charged particle beam device wherein a secondary signal generated from an alignment pattern having known coordinate values in a sample coordinate system is detected, and a positional deviation quantity between the coordinate system of a sample (10) and the coordinate system of a stage (21) is calculated so as to generate coordinate correction data. At the time of observing a sample image, the secondary signal generated from the alignment pattern is detected at least once so as to perform realignment, and the coordinate correction data is updated. Thus, the charged particle beam device performs long-time inspection at a high observation magnification by accurately correcting the sample coordinate information obtained by temperature change, while suppressing device cost increase and throughput deterioration.
    Type: Grant
    Filed: June 18, 2009
    Date of Patent: November 4, 2014
    Assignee: Hitachi High-Technologies Corporation
    Inventor: Masaki Mizuochi
  • Publication number: 20140316732
    Abstract: A quality control (QC) system collects data associated with biological/environmental diagnostic test devices, users and consumables, and identifies corresponding parameters. The system determines when the data are outside the parameters, and then generates corresponding QC improvement data. A database receives and stores the QC improvement data for use in improved QC procedures. A related method and computer readable medium are also disclosed.
    Type: Application
    Filed: November 19, 2012
    Publication date: October 23, 2014
    Applicant: FIO CORPORATION
    Inventor: François Dupoteau
  • Patent number: 8855968
    Abstract: A method for evaluating the operation of a continuous process plant uses operational data. The operational data includes data points representing the quantity of a substance processed by the continuous process plant during a plurality of time periods. The quantity of substance processed during these time periods is compared to a goal value. A reliability score is calculated. A banked opportunity score is calculated. An equivalent lost stream days score is calculated. The average quantity processed during periods that equaled or exceeded the goal is calculated. The average quantity processed during periods that were below the goal is calculated. The components of the equipment or machinery of the continuous process plant are classified and correlated to the quantity of lost opportunity. The scores are reported. The scores are also compared to historical data.
    Type: Grant
    Filed: December 10, 2013
    Date of Patent: October 7, 2014
    Inventor: Timothy Lynn Gillis
  • Patent number: 8849438
    Abstract: A factory control server stores module configuration data for modules. The modules include processes for producing a final product and have corresponding module requirements. The factory control server analyzes in real-time actual product output data that is generated by a final product tester after a factory produces at least one final product to determine whether the actual product output data meets an expected product output. The factory control server analyzes actual module data in real-time to determine a new module requirement to cause new actual product output data for a subsequent final product to meet the expected product output in response to a determination that the actual product output data does not meet the expected product output. The factory control server notifies a module controller in real-time of the new module requirement. The module controller changes parameters in real-time to manufacture the subsequent final product.
    Type: Grant
    Filed: November 17, 2011
    Date of Patent: September 30, 2014
    Assignee: Applied Materials, Inc.
    Inventors: Suketu Arun Parikh, Alexander T. Schwarm, Sanjiv Mittal, Charles Gay
  • Publication number: 20140288864
    Abstract: A non-transitory computer readable storage medium storing a program that causes a computer to execute a process, the process includes: acquiring animation data for displaying steps of assembling a product on a display with an animation; detecting change in a viewpoint of an animation from the acquired animation data; and calculating an estimate of an assembly time of the product based on the detected change in the viewpoint of the animation.
    Type: Application
    Filed: January 29, 2014
    Publication date: September 25, 2014
    Applicant: FUJITSU LIMITED
    Inventor: Ryusuke YOSHIMURA
  • Publication number: 20140236515
    Abstract: Cloud-based integrated yield/equipment data processing system for collecting and analyzing integrated tool-related data (cause data) and material-related data (effect data) pertaining to at least one material processing tool and at least one material is disclosed. In an embodiment, the tool-related data is correlated with the material-related data and the correlated tool-related data and material-related data is employed by logic to perform, using a cloud computing approach, at least one of root-cause analysis, prediction model building and tool control/optimization.
    Type: Application
    Filed: December 18, 2013
    Publication date: August 21, 2014
    Inventors: Tom Thuy Ho, Weidong Wang
  • Publication number: 20140236516
    Abstract: The invention relates to a method for determining a critical dimension variation of a photolithographic mask which comprises (a) using layout data of the photolithographic mask to determine at least two sub-areas of the photolithographic mask, each sub-area comprising a group of features, (b) measuring a distribution of a transmission of each sub-area, (c) determining a deviation of the transmission from a mean transmission value for each sub-area, (d) determining a constant specific for each sub-area, and (e) determining the critical dimension variation of the photolithographic mask by combining for each sub-area the deviation of the transmission and the sub-area specific constant.
    Type: Application
    Filed: July 20, 2012
    Publication date: August 21, 2014
    Applicant: CARL ZEISS SMS LTD.
    Inventor: Rainer Pforr
  • Patent number: 8805630
    Abstract: A method for use in semiconductor fabrication is provided that includes providing manufacturing data of a semiconductor process, providing a plurality of functional transformations, optimizing each of the functional transformations based on the manufacturing data, selecting one of the functional transformations that has a least deviation with respect to the manufacturing data, predicting performance of the semiconductor process using the selected transformation function, and controlling a fabrication tool based on the predicted performance.
    Type: Grant
    Filed: August 25, 2009
    Date of Patent: August 12, 2014
    Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventor: Chun-Hsien Lin
  • Patent number: 8805566
    Abstract: A method testing the quality of products applied to a system is provided. Each product includes a unique identification number. The system includes a data storage device and test devices. The data storage device includes a first table recording identification numbers, test types, and test results, each test device stores a second table records the identification numbers and the test types. The method includes: obtaining the identification number; obtaining the test type; determining whether a test type previous to the test type exists; and generating first information to prompt the operator to return the to-be-tested product to the workstation of previous test type when the test result corresponding to the existed previous test type does not exist or the test result corresponding to the existed previous test type is a first value.
    Type: Grant
    Filed: March 3, 2011
    Date of Patent: August 12, 2014
    Assignees: Fu Tai Hua Industry (Shenzhen) Co., Ltd., Hon Hai Precision Industry Co., Ltd.
    Inventors: Shih-Fang Wong, Xin Lu, Fei Wang, Peng Tang, Jia-Hong Yang, Hui-Feng Liu
  • Patent number: 8781775
    Abstract: A lithographic apparatus includes a stage to hold an object, the stage being moveable relative to a reference structure in a motion range; a magnet structure to provide a spatially varying magnetic field in at least a part of the motion range, the magnet structure being moveable relative to the reference structure and the stage; a first position measurement system to provide a first measurement signal corresponding to a position of the stage and/or the object in a measurement direction relative to the reference structure; a second position measurement system to provide a second measurement signal corresponding to a position of the stage relative to the magnet structure; and a data processor to correct the first measurement signal with a value dependent on the second measurement signal to provide a corrected first measurement signal representative of the position of the stage and/or the object relative to the reference structure in the measurement direction.
    Type: Grant
    Filed: January 31, 2011
    Date of Patent: July 15, 2014
    Assignee: ASML Netherlands B.V.
    Inventors: Hans Butler, Emiel Jozef Melanie Eussen, Willem Herman Gertruda Anna Koenen, Engelbertus Antonius Fransiscus Van Der Pasch, Harmen Klaas Van Der Schoot, Marc Wilhelmus Maria Van Der Wijst, Marcus Martinus Petrus Adrianus Vermeulen, Cornelius Adrianus Lambertus De Hoon
  • Patent number: 8762089
    Abstract: Disclosed is a test method an apparatus in which an area for test and an area for analysis are specified based on the design information of the display device having a non-rectangular display area. To carry out testing, parasitic capacitances are found using the design information, and operations for weighting are performed on test data or threshold values based on which a decision on pass/fail is to be made.
    Type: Grant
    Filed: May 8, 2009
    Date of Patent: June 24, 2014
    Assignee: NLT Technologies, Ltd.
    Inventor: Kenichi Takatori
  • Publication number: 20140172340
    Abstract: The application discloses a debugging method for pre-alignment applicable to an electronic device and the method includes: obtaining a preset voltage value which is an average voltage value of a first voltage value corresponding to a thin wafer placed on a table of the electronic device and a second voltage value corresponding to a thick wafer placed on the table of the electronic device; detecting and acquiring a first operation, and correcting a third voltage value of the electronic device according to the preset voltage value in response to the first operation so that a voltage difference between the third voltage value and the preset voltage value lies in a preset voltage range; detecting location of a flatten edge of the thick wafer on the table of the electronic device to obtain first location information, and detecting location of a flatten edge of the thin wafer on the table of the electronic device to obtain second location information; and detecting and acquiring a second operation, and correcting t
    Type: Application
    Filed: November 27, 2013
    Publication date: June 19, 2014
    Applicant: PEKING UNIVERSITY FOUNDER GROUP CO., LTD.
    Inventor: Ruiteng YIN
  • Publication number: 20140142881
    Abstract: A system and method to test and certify equipment for regulatory compliance. The system and method are particularly directed to testing, certification and approval of gaming equipment, including electronic gaming machines such as slot and video games as well as gaming systems such as player tracking, slot accounting, and progressive systems. The method and system are implemented between a gaming laboratory and a manufacturer and provide efficiencies to increase the speed and reduce the costs of approving tested equipment.
    Type: Application
    Filed: November 18, 2013
    Publication date: May 22, 2014
    Applicant: BMM INTERNATIONAL, INC.
    Inventor: Martin Storm
  • Patent number: 8731325
    Abstract: An apparatus, method and an image quality guide document are disclosed. The method includes, for at least one image in a set of images undergoing image enhancement, identifying image quality-related features for the image based on enhancements being applied to the image, identifying image content-related features based on content of the image, determining a content-based degradation of the image based on the identified image quality-related features and image content-related features, and generating a thumbnail of the image. The method further includes generating an image quality guide document for the set of images in which at least one of the thumbnails is associated with a respective text description that is based on the determined content-based degradation.
    Type: Grant
    Filed: November 19, 2012
    Date of Patent: May 20, 2014
    Assignee: Xerox Corporation
    Inventor: Luca Marchesotti
  • Patent number: 8725446
    Abstract: Method for measuring the shape of a workpiece includes a measuring sensor used to find measured values that represent the shape of a workpiece. The shape of the workpiece is determined by an iterative method using the measured values. The shape of the workpiece is determined during machining. The determining of the shape during machining is particularly suited for determining the shape during grinding. The shape determined may be the shape of a pin, especially a crankpin for a crankshaft.
    Type: Grant
    Filed: July 8, 2010
    Date of Patent: May 13, 2014
    Assignee: HOMMEL-ETAMIC GmbH
    Inventor: Heinz Wegmann
  • Publication number: 20140127836
    Abstract: A system and method of compensating for local focus errors in a semiconductor process. The method includes providing a reticle and applying, at a first portion of the reticle, a step height based on an estimated local focus error for a first portion of a wafer corresponding to the first portion of the reticle. A multilayer coating is formed over the reticle and an absorber layer is formed over the multilayer coating. A photoresist is formed over the absorber layer. The photoresist is patterned, an etch is performed of the absorber layer and residual photoresist is removed.
    Type: Application
    Filed: November 8, 2012
    Publication date: May 8, 2014
    Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
    Inventors: Chia-Hao HSU, Pei-Cheng Hsu, Chia-Ching Huang, Chih-Ming Chen, Chia-Chen Chen
  • Patent number: 8712712
    Abstract: A method of establishing statistically valid assay means and ranges for quality control materials, used to qualify medical testing machines, utilizes tests on a new lot of quality control material to establish an assay mean, and uses data from a database of historical test results to establish an assay range. The system may estimate the variability of test results from prior lot data, and then compute the limits of the assay range such that a new test on a new lot of the quality control material will be expected to fall within the range with a specified probability. Because historical data is used to estimate the test variability, the number of new tests required to specify a statistically valid mean and range may be dramatically reduced, as compared with establishing the mean and range based only on tests of the new lot of material.
    Type: Grant
    Filed: March 29, 2011
    Date of Patent: April 29, 2014
    Assignee: Bio-Rad Laboratories, Inc.
    Inventors: Lakshmi Samyukta Kuchipudi, Curtis Alan Parvin, John Christopher Yundt-Pacheco
  • Patent number: 8713490
    Abstract: A mechanism is provided for mitigating aging of a set of components in the data processing system. A modeled age of a component in the set of components is identified. A desired aging requirement for the component is identified and a determination is made as to whether the modeled age of the component is greater than the desired age of the component. Responsive to the modeled age of the component being greater than the desired age of the component, a policy is implemented to mitigate the aging of the component.
    Type: Grant
    Filed: February 25, 2013
    Date of Patent: April 29, 2014
    Assignee: International Business Machines Corporation
    Inventors: Malcolm S. Allen-Ware, Ronald J. Bolam, Alan J. Drake, Charles R. Lefurgy, Barry P. Linder, Steven W. Mittl, Karthick Rajamani
  • Patent number: 8707573
    Abstract: A device, system, and method for generating low clearance slidably mated parts. In an exemplary embodiment, the system includes a measurement device having a non-contact micrometer capable of coincidentally indicating opposing edge data, rotational and linear air bearing slides, and a holding device. The non-contact micrometer allows for measurement of a plurality of parameters of a first part including the diameter and the difference between an edge of the first part and a reference point. The coincidental measurements are used to determine the size and geometric errors associated with the first part after suitable error elimination. In an exemplary system, a processing machine may be instructed by the measurement device to remove material from a second part so that the first part and the second part when mated together have a very low clearance tolerance level, e.g., as little as 0.00005 inches or less.
    Type: Grant
    Filed: October 17, 2012
    Date of Patent: April 29, 2014
    Assignee: Sonnax Industries, Inc.
    Inventors: William M. DeRoche, Garry J. Emge
  • Publication number: 20140114597
    Abstract: Systems and methods for improving results of wafer higher order shape (HOS) characterization and wafer classification are disclosed. The systems and methods in accordance with the present disclosure are based on localized shapes. A wafer map is partitioned into a plurality of measurement sites to improve the completeness of wafer shape representation. Various site based HOS metric values may be calculated for wafer characterization and/or classification purposes, and may also be utilized as control input for a downstream application. In addition, polar grid partitioning schemes are provided. Such polar grid partitioning schemes may be utilized to partition a wafer surface into measurement sites having uniform site areas while providing good wafer edge region coverage.
    Type: Application
    Filed: October 19, 2012
    Publication date: April 24, 2014
    Applicant: KLA-TENCOR CORPORATION
    Inventor: KLA-Tencor Corporation
  • Patent number: 8682466
    Abstract: A method to enable wafer result prediction includes collecting manufacturing data from various semiconductor manufacturing tools and metrology tools; choosing key parameters using an autokey method based on the manufacturing data; building a virtual metrology based on the key parameters; and predicting wafer results using the virtual metrology.
    Type: Grant
    Filed: February 5, 2008
    Date of Patent: March 25, 2014
    Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Francis Ko, Chih-Wei Lai, Kewei Zuo, Henry Lo, Jean Wang, Ping-Hsu Chen, Chun-Hsien Lim, Chen-Hua Yu