Abstract: A substrate processing apparatus includes a device management controller including a parts management control part configured to monitor the state of parts constituting the apparatus, a device state monitoring control part configured to monitor integrity of device data obtained from an operation state of the parts constituting the apparatus, and a data matching control part configured to monitor facility data provided from a factory facility to the apparatus. The device management controller is configured to derive information evaluating the operation state of the apparatus based on a plurality of monitoring result data selected from a group consisting of maintenance timing monitoring result data acquired by the parts management control part, device state monitoring result data acquired by the device state monitoring control part, and utility monitoring result data acquired by the data matching control part.

Abstract: Various implementations described herein relate to systems and methods for determining abnormal leakage current of a capacitor by determining a number of recent leakage current values for the capacitor and determining a maximum upper limit, minimum upper limit, maximum lower limit, and minimum lower limit based on leakage current values different from the recent leakage current values. A present upper limit and a present lower limit are determined for the recent leakage current values. Abnormal leakage current is determined in response to determining that the present upper limit being greater than an upper threshold (determined based on the maximum upper limit and the minimum upper limit) or the present lower limit being less than a lower threshold (determined based on the maximum lower limit and the minimum lower limit).

Abstract: A pH photothermal spectrometer includes a container that receives an analyte medium and pH-sensitive chromophore. An excitation fiber and optical thermometer are disposed in the container. The optical thermometer include a light receiver disposed on a temperature detector fiber.

Abstract: A factor, other than an external factor, having an influence on a state change of a system can be correctly identified even when an external factor having a strong correlation with the state change of the system exists. In an analysis system 1, an external factor identification unit 310 identifies a first explanatory time series among a plurality of explanatory time series. A differential time series generation unit 340 generates a difference time series between a value of an objective time series and a prediction value of the objective time series calculated based on a value of the first explanatory time series. An effect degree calculation unit 420 calculates, based on second explanatory time series among the plurality of explanatory time series and the difference time series, an influence degree of each of the second explanatory time series on a value change of the difference time series.

Abstract: A method for point cloud decoding includes receiving a bitstream. The method also includes decoding the bitstream into multiple frames that include pixels. A portion of the pixels are organized into patches and correspond to respective clusters of points of a 3D point cloud. The method further includes decoding, from the bitstream, an occupancy map frame. The occupancy map frame indicates the portion of the pixels included in the multiple frames that represent the points of the 3D point cloud. In addition, the method includes reconstructing the 3D point cloud using the multiple frames and the occupancy map frame. The method also includes determining whether to perform smoothing to the 3D point cloud based at least in part on properties of the multiple frames. Based on determining to perform the smoothing, the method includes performing the smoothing to the 3D point cloud.

Abstract: A quality review management system may be used to analyze the operation of manufacturing processes within a plant based on data collected by various data sources in the plant, such as batch executive applications, to automatically detect, store, and display exceptions within those processes for use by a quality review engineer to determine if the process operation meets certain quality standards. The quality review management system includes a configuration application that enables a user to create one or more exception rules, an exception engine that analyses process data using the rules to detect one or more exceptions within the process, and a review application that enables quality review personnel to review each determined exception for resolution purposes.

Abstract: The invention relates to a method for checking the quality of a product (1) comprising at least two cardboard portions (2) connected to each other such that a slot (10) extends between the cardboard portions from one side of the product (1) to the opposite side, with the slot (10) being expected to extend perpendicularly with respect to an outer edge of the product (1), comprising the steps of: capturing a 2D image of the slot (10) at one side of the product (1) and of the slot at the opposite side of the product, analyzing the images so as to recognize the slot (10), comparing the positions of the slot of one product at the opposite sides, making a determination whether or not a difference between the positions is within a predefined range of tolerance.

Abstract: Techniques for corrugate and chipboard knocked-down case inspection and manufacturing are described. In an example, a piece of cardboard is cut according to a shape of a knocked-down case, and a first plurality of measurements are made. The piece of cut cardboard is scored to create a plurality of fold-lines, based at least in part on the first plurality of measurements, and a second plurality of measurements are made. A fold-line between a major panel and a minor panel is folded, based at least in part on the second plurality of measurements, and a third plurality of measurements are made. A fold-line of a tab of the piece of cut cardboard is folded, based at least in part on the third plurality of measured distances. The tab is glued to a panel of the piece of cardboard to form a knocked-down case.

Abstract: An event analyzing device includes an event data collector configured to collect event data which represents an event including an alarm which has occurred in a plurality of devices in a plant and an operation performed to the devices, a process data collector configured to collect process data of the devices in the plant, a trend change detector configured to detect a trend change of the process data collected by the process data collector, an event data converter configured to convert the trend change detected by the trend change detector into a process change event represented in the same format as the event, and a cause-effect relationship analyzer configured to integrate the event data collected by the event data collector and process change event data which represents the trend change in the process change event converted by the event data converter to analyze a cause-effect relationship between the event and the process change event.

Abstract: The production management device is applied to a production line for producing a board product. The production line includes a component mounter configured to mount a component on a circuit board under predetermined mounting conditions and an inspection device configured to inspect the mounting state of the component mounted on the circuit board, downstream from the component mounter. The production management device includes an information management section configured to store statistical information in which a mounting condition when a component, that is an inspection target, is mounted on a circuit board is linked to the results of multiple inspections by the inspection device.

Abstract: In order to realize stable quality control, provided is a quality control device (1) having an input device which receives data such as an operation condition of each device (21) to (26) in a production system (20) for producing a product; a calculation unit which assigns a value of the operation condition to a correlation formula calculated in advance and calculates a value derived from the correlation formula; and a determination unit which performs good or bad determination on a quality of a workpiece in each process, on the basis of a result calculated by the calculation unit. Further, when “bad” is determined as a result of the good or bad determination, the quality control device (1) calculates an appropriate value of the operation condition and sets the value to each device (21) to (26).

Abstract: A quality control apparatus includes: a test value acquisition unit that acquires test values of respective components that constitute a product; an assembling management information acquisition unit that acquires assembling management information that is information concerning assembling of the product and the components; a step-related information acquisition unit that acquires step-related information that is information related to a production step; and a display that displays a configuration diagram of the product that is hierarchically constituted by the components and shows a combination of elements that are assumed to be likely to have caused a quality defect of the product on the configuration diagram on a basis of the test values, the assembling management information, and the step-related information.

Abstract: An automated manufacturing defect detection system includes processing circuitry configured to receive historical parts statistics corresponding to a failure of parts used in a vehicle assembly, receive vehicle sensor statistics corresponding to a failure of parts of post manufactured vehicles, and receive historical assembly line statistics corresponding to a failure of assembly of parts during the vehicle assembly. Additionally, the processing circuitry is configured to generate a profile for one or more parts used in the vehicle assembly, receive an analysis of each of the one or more parts of the assembled vehicle, determine whether any of the one or more analyzed parts deviate from the profile generated for that part, and in response to a determination that any of the one or more analyzed parts deviate from the profile generated for that part by greater than an expected quality threshold, automatically communicate an alert corresponding to the deviation.

Abstract: The present invention relates to systems and methods of determining quality compliance for one or more biological sample testing instruments used with one or more type of single-use blood testing cartridge, at the point-of-care in a hospital, or other location that deliver medical care. In particular, the systems and methods ensure that only instruments that pass a quality assurance protocol are used for point-of-care testing.

Abstract: A medical image-based radiation shielding device and method thereof, which may form a targeted and highly accurate radiation shielding according to individual differences in patients, such as tumor location and size, thereby reduce or avoid radiation from a irradiation apparatus to normal tissues of patients. The shielding device includes a medical image scanning means for scanning an irradiated site of an irradiated subject and outputting medical image voxel data, a data processing and three-dimensional modeling means for establishing a three-dimensional phantom tissue model according to the medical image voxel data and establishing a three-dimensional shield model according to the three-dimensional phantom tissue model; a shield located between the irradiation apparatus and the irradiated site, wherein the shield is formed by printing the three-dimensional shield model data input to a 3D printer.

Abstract: An inspection assistance device includes a damage drawing input part configured to input a damage drawing, i.e. a drawing illustrating damages of target parts, a display configured to display the damage drawing and target figures illustrating target parts to be overlaid with each other, and a storage configured to store the damage drawing separately from the target figures in connection with the target figures.

Abstract: An electronic label system is provided. The electronic label system includes a line replaceable unit. The electronic label system also includes an electronic label communicatively coupled to the line replaceable unit via a hardware link. The electronic label stores information respective to the line replaceable unit. The electronic label includes a chip or a radio frequency identification tag that provides the information to a reader.

Abstract: Provided is an information processing apparatus that can store necessary data in a data storage unit while effectively preventing information processing resources from being consumed. A data acquisition unit acquires facility data. A data transmission unit transmits the facility data acquired by the data acquisition unit to a data storage unit of a server. A transmission frequency decision unit decides a frequency at which the data transmission unit transmits the facility data to the data storage unit. The transmission frequency decision unit decides the frequency at which the facility data is transmitted to the data storage unit in such a way that the frequency at which the facility data is transmitted when a degradation state of a facility is progressing becomes higher than the frequency at which the operation state data is transmitted when the degradation state of the facility is not progressing.

Abstract: Methods and systems for determining a layer on which a defect detected on a wafer is located are provided. One method includes detecting defects on a wafer by directing light to the wafer at first and second angles of incidence and determining locations of the defects on the wafer based on the output corresponding to the defects. For one of the defects detected in the output generated for one spot illuminated on the wafer with the light directed to the wafer at the first and second angles, the method includes comparing the locations of the one of the defects determined based on the output generated with the light directed to the one spot on the wafer at the first and second angles. The method further includes determining a layer of the wafer on which the one of the defects is located based on results of the comparing.

Abstract: A quality-control device (200) includes: an illumination system (202) for illuminating one peripheral face of each folding box, an image capture device (204) for forming a multiple image of the respective peripheral faces of a bundle of folding boxes, an image processing system (206) for: i) detecting within the multiple image each peripheral end of the slots of each box that separate its adjacent flaps, ii) generating a data set indicative of the geometry of each peripheral end, and iii) analyzing the data set to determine the width of each peripheral end.

Abstract: A cognitive system, method and computer program product for maximizing a productivity of software development by a software development team. The system and method implement cognitive processes for determining what certain organizational factors and their optimal values which correspond to high performing software development teams. Based on the determinations correlating organization factors with productivity increases, the system prescribes what Key Performance Indicators (KPIs) to improve (e.g., increase and decrease), and determine what are the target improvement values. Use of the systems and methods described herein enable development managers and executives to build maximum performance teams (or transform existing teams, boosting their productivity), by leveraging customized quantitative recommendation provided as output.

Abstract: A cognitive system, method and computer program product for maximizing a productivity of software development by a software development team. The system and method implement cognitive processes for determining what certain organizational factors and their optimal values which correspond to high performing software development teams. Based on the determinations correlating organization factors with productivity increases, the system prescribes what Key Performance Indicators (KPIs) to improve (e.g., increase and decrease), and determine what are the target improvement values. Use of the systems and methods described herein enable development managers and executives to build maximum performance teams (or transform existing teams, boosting their productivity), by leveraging customized quantitative recommendation provided as output.

Abstract: A user equipment (UE) comprising a processor, a non-transitory memory, wherein the non-transitory memory comprises a default access point name (APN), a cellular radio transceiver, a first mobile application, stored in the non-transitory memory, and a dynamic customization application, stored in the non-transitory memory. When executed by the processor, the dynamic customization application receives an index that associates a plurality of mobile applications to APNs via the cellular radio transceiver, wherein the index associates the first mobile application to a first APN that is different from the default APN, stores the index in the non-transitory memory, receives a request to establish a data communication session from the first mobile application, looks up the first APN in the index based on a name of the first mobile application, and establishes a data communication session over a communication channel defined by the first APN via the cellular radio transceiver.

Abstract: A ground roast coffee tablet which is capable of being brewed in a conventional automatic drip coffee maker, and which exhibits sufficient strength to withstand all aspects of manufacture, handling, packaging, transport without breakage but also readily disintegrates when contacted with hot water during brewing, is made by subjecting conventional ground, roasted coffee to a multi-step compaction process in which at least two compression steps are carried out in the same compaction die.

Abstract: A ground roast coffee tablet which is capable of being brewed in a conventional automatic drip coffee maker, and which exhibits sufficient strength to withstand all aspects of manufacture, handling, packaging, transport without breakage but also readily disintegrates when contacted with hot water during brewing, is made by subjecting conventional ground, roasted coffee to a multi-step compaction process in which at least two compression steps are carried out in the same compaction die.

Abstract: A ground roast coffee tablet which is capable of being brewed in a conventional automatic drip coffee maker, and which exhibits sufficient strength to withstand all aspects of manufacture, handling, packaging, transport without breakage but also readily disintegrates when contacted with hot water during brewing, is made by subjecting conventional ground, roasted coffee to a multi-step compaction process in which at least two compression steps are carried out in the same compaction die.

Abstract: A ground roast coffee tablet which is capable of being brewed in a conventional automatic drip coffee maker, and which exhibits sufficient strength to withstand all aspects of manufacture, handling, packaging, transport without breakage but also readily disintegrates when contacted with hot water during brewing, is made by subjecting conventional ground, roasted coffee to a multi-step compaction process in which at least two compression steps are carried out in the same compaction die.

Abstract: Systems and methods to monitor an asset in an operating process unit are disclosed. An example method includes monitoring one or more equipment parameters associated with an asset in an operating process unit, monitoring one or more process parameters associated with the asset, and determining an asset health value corresponding to the asset based on the one or more monitored equipment parameters, process parameters, and baseline data associated with the one or more equipment parameters.

Abstract: Method of measuring a point cloud of an object includes obtaining the point cloud of the object from a storage device of the electronic device. Based on the point cloud, a triangular mesh surface is constructed and triangles of the triangular mesh surface are determined. According to the triangles, a reference plane is determined. According to the reference plane, a three dimensional (3D) object coordinate system is established. 3D object coordinates of points in the point cloud are calculated in the 3D object coordinate system. Measurement elements of a profile of the point cloud are determined and points in the point cloud corresponding to each of the measurement elements are determined. According to the 3D object coordinates of the determined points corresponding to each of the measurement elements, each of the measurement elements are fit. A distance and an angle of two fit measurement elements are calculated.

Abstract: A substrate processing apparatus can efficiently perform a trial operation in conditions close to those of an actual operation. In the substrate processing apparatus 1 for taking substrates W out of a transfer chamber (FOUPs 1 to 4), processing the substrates W in each of processing modules 2 and returning the processed substrates W to the transfer chamber, a mode selection unit 31 selects an operation check mode for performing an operation check of wafer transfer devices 15 and 17 or the processing modules 2. Further, a job setting unit 32 sets control jobs for the operation check and a process job as a recipe executed on the substrate W. A controller 3 determines whether or not a first control job and a second control job to be executed subsequently after the first control job are allowed to be executed in parallel.

Abstract: The present invention generally relates to the monitoring and controlling of a semiconductor manufacturing environment and, more particularly, to methods and systems for virtual meteorology (VM) applications based on data from multiple tools having heterogeneous relatedness. The methods and systems leverage the natural relationship of the multiple tools and take advantage of the relationship embedded in process variables to improve the prediction performance of the VM predictive wafer quality modeling. The prediction results of the methods and systems can be used as a substitute for or in conjunction with actual metrology samples in order to monitor and control a semiconductor manufacturing environment, and thus reduce delays and costs associated with obtaining actual physical measurements.

Abstract: A method of testing a device is disclosed. Test data is obtained for a device testing program that tests the device. An adaptation command for testing the device is determined at an adaptive testing engine using obtained test data. The adaptation command is sent from the adaptive testing engine to a tool control application. The tool control application uses the adaptation command to control an operation related to the testing of the device.

Abstract: A method of testing a device is disclosed. Test data is obtained for a device testing program that tests the device. An adaptation command for testing the device is determined at an adaptive testing engine using obtained test data. The adaptation command is sent from the adaptive testing engine to a tool control application. The tool control application uses the adaptation command to control an operation related to the testing of the device.

Abstract: A pipelined processing device includes: a pipeline controller configured to receive at least one instruction associated with an operation from each of a plurality of subcontrollers, and input the at least one instruction into a pipeline; and a pipeline counter configured to receive an active time value from each of the plurality of subcontrollers, the active time value indicating at least a portion of a time taken to process the at least one instruction, the pipeline controller configured to route the active time value to a shared pipeline storage for performance analysis.

Abstract: Apparatus for performing diagnostic imaging examinations with tutorial means for the user, both in the preparatory step and in the operative step, and method for using the apparatus.

Abstract: The present invention generally relates to the monitoring and controlling of a semiconductor manufacturing environment and, more particularly, to methods and systems for virtual meteorology (VM) applications based on data from multiple tools having heterogeneous relatedness. The methods and systems leverage the natural relationship of the multiple tools and take advantage of the relationship embedded in process variables to improve the prediction performance of the VM predictive wafer quality modeling. The prediction results of the methods and systems can be used as a substitute for or in conjunction with actual metrology samples in order to monitor and control a semiconductor manufacturing environment, and thus reduce delays and costs associated with obtaining actual physical measurements.

Abstract: A method models a defect management routine. Both the modeling and a handling are executed within a manufacturing execution system. During an engineering phase: modeling the production process and creating a library of possible defect types which may occur; assigning the defect types to at least one defect group; creating a library of defect specifications; creating a library of defect type specification details; creating at least one runtime defect criteria that is used to link the defect type to a certain production volume; and creating a runtime defect measurement routine that monitors a corrective measure. During a runtime production phase evaluating the product produced; identifying the respective defect type out of the library of defect types; and using the identified defect type to determine a corrective measure, a runtime defect criteria identifying the resource causing the defect type, a production volume, and to run the respective runtime defect management routine.

Abstract: An apparatus for detecting periodic defects includes a sensor that obtains signals to evaluate properties of an area having a length longer than an expected defect period; a small area selector that separates small areas whose area length is shorter than that of the area so that all adjacent distance intervals are equal in a periodic defect arrangement direction, and selecting signals corresponding to the positions of the plurality of small areas from outputs from the sensor; an evaluation index calculator that calculates a similarity evaluation index between signal patterns among signals selected by the small area selector; a set value changer that changes the positions of the small areas and the distance interval, and repeating computational processings of the small area selector and the evaluation index calculator; and a period judgment device that judges the distance interval as a period when the evaluation index is higher than a value.

Abstract: A management system includes a plurality of analyzers; and a computer system connected to the analyzers via a network, wherein each of the analyzers comprises: a data transmitter for transmitting data produced by the analyzer to the computer system via the network, and wherein the computer system includes a memory under control of a processor, the memory storing instructions enabling the processor to carry out operations, comprising: (a) receiving a plurality of data transmitted from the data transmitters of the plurality of analyzers; (b) generating an aggregate result used for determining a determination condition for making a determination as to whether or not a notification to a user of the analyzer is required based on the plurality of received data; and (c) outputting the aggregate result. A computer system and a method of providing information are also disclosed.

Abstract: According to one embodiment, a production support system includes: a production information storage unit; a manufacturing apparatus information storage unit; an inspection/measurement apparatus information storage unit; a planned lot number calculation unit; a first control mode calculation unit. The first control mode calculation unit is configured to calculate an appropriate control mode from the number of products to be subjected to the control of the final quality, a relationship between fluctuation of the final quality and a number of products when performing a predetermined feedback type/feedforward type combined APC, fluctuation of the final quality when performing a feedforward type APC, and fluctuation of the final quality when not performing the feedback type/feedforward type combined APC.

Abstract: According to one embodiment, an RFID tag issuing apparatus includes a communication instructing unit, a search unit, and a misalignment amount detecting unit. The communication instructing unit instructs a reader-writer unit to communicate with the RFID tag at a reference position that is reached when the label is carried by a predetermined amount in a predetermined direction after the specific position on the label is detected by a label position detecting unit. The search unit repeats a carrying of the label and a communication instruction to the reader-writer unit when communication cannot be established with the RFID tag, and thus searches for a communication-available range with the RFID tag. The misalignment amount detecting unit detects an amount of carrying of the label to reach the communication-available range from the reference position, as a misalignment amount of the RFID tag.

Abstract: A sample analyzer for analyzing a sample with a liquid in a container is disclosed. The sample analyzer comprises: a reader that reads an information of a liquid in a container, the information of the liquid being stored in a storage medium; a display; and a controller including a processor and a memory under control of the processor, the memory storing instruction causing the processor to carry out operations comprising: determining whether the sample analyzer is ready to read the information of the liquid by the reader; and causing, when the sample analyzer is determined to be ready, the display to display an indication that indicates the sample analyzer is ready to read the information of the liquid by the reader.

Abstract: The present invention provides a remote monitoring system for monitoring the operation of a fluid treatment system and/or the qualities, characteristics, properties, etc., of the fluid being processed or treated by the fluid treatment system. The system includes a remote computer that may be associated with a database that accesses data transmitted from the fluid treatment system with the data collected, acquired, etc., from one or more sensors placed in the fluid treatment system for measuring fluid quality and/or equipment operation in a fluid treatment system. The remote computer may then analyze or manipulate the data to generate an analysis result or analysis report that may be sent or communicated along with the data and/or any historical or expected information or data to a remote viewing device for viewing by a user. A method is further provided for the operation of the remote monitoring system of the present invention.

Abstract: Disclosed are a method and an apparatus for manufacturing a radiation intensity bolus.

Abstract: A device to inspect a non-pattern wafer includes a light source to emit light that reflected from a wafer. A judgment unit converts the detected light into a quantitative measured value to determine whether the wafer is faulty. The wafer comprises a first region and a second region. The detection unit sequentially detects lights reflected from the first and second regions of the wafer, and a judgment unit converts the lights reflected from the first and second regions of the wafer into first and second quantitative measured values, respectively. The second region of the wafer is determined to be faulty by comparing the second measured value with a first reference value, wherein the first reference value is calculated using an average value between the first and second measured values, and a characteristic value that indicates distribution of the first and second measured values.

Abstract: A method and apparatus for automatically providing a virtual sensor have been described. In one embodiment, a method for automatically providing a virtual sensor includes receiving a plurality of virtual sensor templates from a server. The method further includes selecting a virtual sensor template from the plurality of virtual sensor templates. The selected virtual sensor template has an algorithm to provide a desired functionality. The method further includes selecting at least one parameter to configure the selected virtual sensor template. The method further includes automatically creating a virtual sensor associated with the selected virtual sensor template.

Abstract: A method of reducing variation in multi-die integrated circuits can include, for each of a plurality of dies, determining at least one performance metric and selecting at least two dies for inclusion within a multi-die integrated circuit according to the at least one performance metric. Systems and devices for executing the steps of the method are also described.

Abstract: Described is a system for remotely monitoring water quality at one or more locations via a web-enabled application. Embodiments of the present invention provide remote water sampler control with integrated predictive sampling. In some embodiments, the present invention provides a web-hosted application that allows for remote user control of one or more water samplers in combination with predictive sampling.

Abstract: Provided is a charged particle beam device wherein a secondary signal generated from an alignment pattern having known coordinate values in a sample coordinate system is detected, and a positional deviation quantity between the coordinate system of a sample (10) and the coordinate system of a stage (21) is calculated so as to generate coordinate correction data. At the time of observing a sample image, the secondary signal generated from the alignment pattern is detected at least once so as to perform realignment, and the coordinate correction data is updated. Thus, the charged particle beam device performs long-time inspection at a high observation magnification by accurately correcting the sample coordinate information obtained by temperature change, while suppressing device cost increase and throughput deterioration.

Abstract: A quality control (QC) system collects data associated with biological/environmental diagnostic test devices, users and consumables, and identifies corresponding parameters. The system determines when the data are outside the parameters, and then generates corresponding QC improvement data. A database receives and stores the QC improvement data for use in improved QC procedures. A related method and computer readable medium are also disclosed.