Abstract: A shading compensation method of an image capturing device, adapted to an image capturing device having a primary lens, a secondary lens, and a diffuser as well as pre-storing a primary-secondary lenses table and a secondary lens-diffuser table, includes the following steps. First, the secondary lens is covered by the diffuser. A scene is simultaneously captured by the primary lens and the secondary lens covered by the diffuser so as to generate a primary image and a diffused image. Next, according to the primary image and the diffused image, a shading compensation table corresponding to the scene is constructed by using the primary-secondary lenses table and the secondary lens-diffuser table. A shading compensation process is then performed on the primary image according to the shading compensation table so as to generate a compensated image.

Abstract: A method may include receiving a first set of parameters associated with a test environment, the test environment including a test system for testing a network, receiving a test objective, conducting a first test case based on the received first set of parameters and the test objective, automatically determining, by the test system, whether the test objective has been satisfied based on a first test result associated with the first test case, and automatically adapting, by the test system, a second test case based on the first test result when it is determined that the test objective has not been satisfied.

Abstract: Information relating to a change made to a concrete mixture in a concrete mixer truck is obtained. An expected value of a selected characteristic of the concrete mixture is determined based on the change. A representation of the expected value is displayed on a processing device located in a cab of the concrete mixer truck. In one embodiment, the mixture comprises a concrete mixture. The change may comprise an addition of water to the mixture.

Abstract: A method and system includes a first substrate and a second substrate, each substrate comprising a predetermined baseline transmittance value at a predetermine wavelength of light, processing regions on the first substrate by combinatorially varying at least one of materials, process conditions, unit processes, and process sequences associated with the graphene production, performing a first characterization test on the processed regions on the first substrate to generate first results, processing regions on a second substrate in a combinatorial manner by varying at least one of materials, process conditions, unit processes, and process sequences associated with the graphene production based on the first results of the first characterization test, performing a second characterization test on the processed regions on the second substrate to generate second results, and determining whether at least one of the first substrate and the second substrate meet a predetermined quality threshold based on the second res

Abstract: An apparatus for generating an application data structure includes a physical computing system comprising processor(s), input device(s), display(s), and memor(ies). The memory includes executable instructions that cause a processor to perform the acts of embedding a multiphysics model data structure for a physical system in an application data structure. Application features are determined to add to the application data structure. First data is added representing a form feature for the application features for the model of the physical system. Second data is added representing at an action feature for the application features. The second data is associated with at least one modeling operation to define a sequence of operations for modeling the physical system. The application data structure is updated including the added first and second data and the associating defining the sequence of operations. The updated application data structure is stored on the memory device(s).

Abstract: A web services-based communication system and technique uses an information server to facilitate the communication of process control data and analysis results between a plurality of web services coupled to a communication network. A graphical user interface coupled to the network enables users to store user profile information and configuration information in a database within the information server. The information server uses the configuration information and the profile information to control the operations of a scheduler and a router within the information server to enable users to selectively view process control information via the graphical user interface and to route process control information to appropriate ones of the web services.

Abstract: Embodiments for providing user transparent certificate verifications for web mashups and other composite applications are generally described herein. In some embodiments, a content buffer is provided for holding content until receiving verification results that allow the content to be presented in a browser user interface. A browser core receives an aggregation of content from a plurality of sources and performing local verification of digital certificates associated with the content received from the plurality of sources. A browser content interface intercepts content associated with verified digital certificates from the browser core to provide content associated with verified digital certificates to the content buffer for holding. An online certification module is arranged to receive untrusted certificates from the browser content interface and to perform verification of the received untrusted certificates using online certification services and/or local certificate store on the client device.

Abstract: Embodiments provide methods, apparatuses, and systems for identification of wood species based on one or more pitch characteristics. A workpiece may be exposed to a beam of radiation from a radiation source. The beam of radiation may cause pitch on or within the workpiece to emit visible light. The emitted light may be imaged and used to determine pitch content, pitch location, a pitch deposition pattern, pitch emission wavelength, and/or other characteristics of the workpiece. One or more of these characteristics may be used to identify a tree species or group of tree species from which the workpiece was cut or manufactured.

Abstract: Embodiments of the invention relate to electrical impedance tomography testing systems and methods for non-destructively testing a polycrystalline diamond element (e.g., a polycrystalline diamond table of a polycrystalline diamond compact or a freestanding polycrystalline diamond table) using electrical impedance tomography to locate one or more high-electrical-conductivity regions (e.g., one or more regions of poorly sintered diamond crystals and/or high-metal-solvent catalyst content) and/or one or more low-electrical-conductivity regions (e.g., porosity and/or cracks) in the tested polycrystalline diamond element. Further embodiments relate to a rotary drill bit including at least one polycrystalline diamond compact that has been selectively positioned so that one or more high-electrical-conductivity regions of a polycrystalline diamond table thereof identified using the non-destructive testing systems and methods disclosed herein are not positioned to engage a subterranean formation during drilling.

Abstract: Devices and methods for remotely collecting data for the assessment of value and/or like, kind, and quality are provided, including a mobile device equipped with an application configured to enable collection of data; the data acquired using the device are received by a service provider; and following the assessment transmitting of the assessment analysis by the service provide to the display of the mobile device of the user.

Abstract: Embodiments of the present invention provide an improved method and system for assessing non-uniformity of features in the measurement area (within the beam spot) on a semiconductor structure, (e.g. wafer), such as a non-uniform film thickness. The scattering from non-uniform features is modeled. Post-processing the residual of theoretical and collected spectra is performed to assess a measure of non-uniformity from within an incident spot beam of a spectrum acquisition tool.

Abstract: Devices and methods for identifying an electrical device, and its state, in a network of electrical devices are disclosed. An energy monitoring device is programmed to identify an electrical device coupled to a power supply, and a state of the electrical device, from a change in successive measurements of the power supply. Algorithms for determining a load signature for an electrical device and its state are disclosed. A stored table of load signatures for states is used to identify devices, and states. Energy monitoring information is collected and presented to the user on a display, a remote display, or is transmitted over a network to a remote device such as a personal computer, personal digital assistant, an iPhone®, a cell phone, voice mail, email, or text message.

Abstract: Metrology may be implemented during semiconductor device fabrication by a) modeling a first measurement on a first test cell formed in a layer of a partially fabricated device; b) performing a second measurement on a second test cell in the layer; c) feeding information from the second measurement into the modeling of the first measurement; and after a lithography pattern has been formed on the layer including the first and second test cells, d) modeling a third and a fourth measurement on the first and second test cells respectively using information from a) and b) respectively.

Abstract: The invention relates to a test method for examining an inspection device, which is associated with a functional unit of a master unit, comprising at least the following steps: producing a specified number of faulty and/or correct containers or test containers by means of the functional unit itself in that a control signal for producing a distinctive element is fed to the functional unit; leading the faulty containers or test containers past the inspection device, which detects the faulty containers or test containers and produces a signal to discharge the faulty containers or test containers, or indicates a value regarding the expected and the measured faulty and/or correct containers. The test method is automatically started or performed and is suitable, for example, for examining a label position checking device, the filling amount checking unit, and the closure seating checking unit in order to be able to determine the fault-free functioning thereof or optionally the faulty functioning thereof.

Abstract: An apparatus for detecting periodic defects includes a sensor that obtains signals to evaluate properties of an area having a length longer than an expected defect period; a small area selector that separates small areas whose area length is shorter than that of the area so that all adjacent distance intervals are equal in a periodic defect arrangement direction, and selecting signals corresponding to the positions of the plurality of small areas from outputs from the sensor; an evaluation index calculator that calculates a similarity evaluation index between signal patterns among signals selected by the small area selector; a set value changer that changes the positions of the small areas and the distance interval, and repeating computational processings of the small area selector and the evaluation index calculator; and a period judgment device that judges the distance interval as a period when the evaluation index is higher than a value.

Abstract: The present invention is directed to a device for process for predicting gloss of a coating resulting from a wet layer of a low gloss coating composition, such as automotive OEM or refinish paint. The device includes measuring reflectance of the layer of the coating composition applied over a test substrate and then allowing the layer to dry and/or cure into a coating. Thereafter, its gloss is measured with a gloss meter. The device is repeated with varying amounts of one or flatting agents added to the composition and the reflectance vs. gloss is plotted on a graph and by using a curve fitting equation a gloss prediction curve is obtained. By measuring the reflectance of a wet layer of a target low gloss coating composition the gloss of a coating that would result from such a layer is then predicted by using the gloss prediction curve. The device is most useful during the manufacture of coating compositions, such as automotive OEM and refinishes paints.

Abstract: According to one embodiment, an RFID tag issuing apparatus includes a communication instructing unit, a search unit, and a misalignment amount detecting unit. The communication instructing unit instructs a reader-writer unit to communicate with the RFID tag at a reference position that is reached when the label is carried by a predetermined amount in a predetermined direction after the specific position on the label is detected by a label position detecting unit. The search unit repeats a carrying of the label and a communication instruction to the reader-writer unit when communication cannot be established with the RFID tag, and thus searches for a communication-available range with the RFID tag. The misalignment amount detecting unit detects an amount of carrying of the label to reach the communication-available range from the reference position, as a misalignment amount of the RFID tag.

Abstract: A system includes a measured value storing device in which a product measured value acquired periodically and a manufacturing condition measured value are stored, a product threshold value setting device that sets a product threshold value for determining whether a product is normal or not, an abnormality accumulating device that acquires a product abnormality cumulative frequency where the product abnormality measured value exceeds the product threshold value, a product threshold value changing device that changes the product threshold value, a condition threshold value setting device that sets a condition threshold value to be compared with a manufacturing condition measured value, a condition abnormality accumulating device that acquires a condition cumulative frequency, a condition threshold value changing device that changes a condition threshold value, and a cause identifying device that identifies a cause of abnormality based on the distribution of the product abnormality cumulative frequency and a man

Abstract: Phase sensitive X-ray imaging methods provide substantially increased contrast over conventional absorption based imaging, and therefore new and otherwise inaccessible information. The use of gratings as optical elements in hard X-ray phase imaging overcomes some of the problems impairing the wider use of phase contrast in X-ray radiography and tomography. To separate the phase information from other contributions detected with a grating interferometer, a phase-stepping approach has been considered, which implies the acquisition of multiple radiographic projections. Here, an innovative, highly sensitive X-ray tomographic phase contrast imaging approach is presented based on grating interferometry, which extracts the phase contrast signal without the need of phase stepping. Compared to the existing phase step approach, the main advantage of this new method dubbed “reverse projection” is the significantly reduced delivered dose, without degradation of the image quality.

Abstract: The present invention relates to an analytic system of wafer bin map and a non-transitory computer readable media thereof. The analytic system of wafer bin map includes a wafer bin map input module, a wafer bin map database, a degeneration module, a standardization module, a coordinate transformation module, a defect density characterization module, a test of randomness module, a similarity comparison module, and a pattern evaluation module.

Abstract: A semiconductor memory device includes a plurality of detecting code generators configured to generate a plurality of detecting codes to detect errors in a plurality of data items, respectively, a plurality of first correcting code generators configured to generate a plurality of first correcting codes to correct errors in a plurality of first data blocks, respectively, each of the first data blocks containing one of the data items and a corresponding detecting code, a second correcting code generators configured to generate a second correcting code to correct errors in a second data block, the second data block containing the first data blocks, and a semiconductor memory configured to nonvolatilely store the second data block, the first correcting codes, and the second correcting code.

Abstract: A non-contact signal propagation property evaluation system for ropes can be deployed for a number of different applications including, but not limited to, moving lines, e.g., crane or winch and static lines, e.g., mooring lines, stays, etc., to evaluate physical properties of the ropes and, in some cases, to help evaluate structural health of the ropes. The system includes a first transducer for generating ultrasonic waves, a second transducer for receiving ultrasonic waves propagated transversely through and around the rope, and a processor executing computer readable code to determine acoustic propagation properties of the rope.

Abstract: The present invention provides a remote monitoring system for monitoring the operation of a fluid treatment system and/or the qualities, characteristics, properties, etc., of the fluid being processed or treated by the fluid treatment system. The system includes a remote computer that may be associated with a database that accesses data transmitted from the fluid treatment system with the data collected, acquired, etc., from one or more sensors placed in the fluid treatment system for measuring fluid quality and/or equipment operation in a fluid treatment system. The remote computer may then analyze or manipulate the data to generate an analysis result or analysis report that may be sent or communicated along with the data and/or any historical or expected information or data to a remote viewing device for viewing by a user. A method is further provided for the operation of the remote monitoring system of the present invention.

Abstract: The present invention relates to a computer-implemented quality assurance system, which includes the steps of retrieving quality assurance and supporting information from a database; receiving information on technical variables from monitoring of the patient, and on radiographic equipment in the performance of an imaging study; generating a quality assurance score after said imaging study based on said technical variables and said quality assurance and supporting information; and performing a quality assurance analysis of the imaging study based on the quality assurance score.

Abstract: Structural parameters of a specimen are determined by fitting models of the response of the specimen to measurements collected by different measurement techniques in a combined analysis. X-ray measurement data of a specimen is analyzed to determine at least one specimen parameter value that is treated as a constant in a combined analysis of both optical measurements and x-ray measurements of the specimen. For example, a particular structural property or a particular material property, such as an elemental composition of the specimen, is determined based on x-ray measurement data. The parameter(s) determined from the x-ray measurement data are treated as constants in a subsequent, combined analysis of both optical measurements and x-ray measurements of the specimen. In a further aspect, the structure of the response models is altered based on the quality of the fit between the models and the corresponding measurement data.

Abstract: The invention discloses a real-time detection system for detecting the real-time machining by a rotating machine or rotating quality thereof. The real-time detection system comprises a signal capture module, a preprocessor, a processor and a comparison module. The signal capture module is used to capture a time-sequence signal of the rotating machine. The preprocessor is coupled to the signal capture module for receiving the time-sequence signal and generating a stationary time-sequence signal. The processor is coupled to the preprocessor for receiving the stationary time-sequence signal and calculating a plurality of entropies of the stationary time-sequence signal. The comparison module with an entropy table or a feature judgment mechanism of the entropy variation is coupled to the processor for receiving the plurality of entropy and comparing the plurality of entropy according to the entropy table or the feature judgment of the entropy variation and generating a quality signal.

Abstract: Techniques are described for inspecting a web and controlling subsequent conversion of the web into one or more products. A system, for example, comprises an imaging device, an analysis computer and a conversion control system. The imaging device images the web to provide digital information. The analysis computer processes the digital information to identify regions on the web containing anomalies. The conversion control system subsequently analyzes the digital information to determine which anomalies represent actual defects for a plurality of different products. The web inspection system may preferentially apply different application-specific defect detection recipes depending on whether a given anomaly is a repeating or random anomaly.

Abstract: Metrology may be implemented during semiconductor device fabrication by a) modeling a first measurement on a first test cell formed in a layer of a partially fabricated device; b) performing a second measurement on a second test cell in the layer; c) feeding information from the second measurement into the modeling of the first measurement; and after a lithography pattern has been formed on the layer including the first and second test cells, d) modeling a third and a fourth measurement on the first and second test cells respectively using information from a) and b) respectively.

Abstract: Methods and systems of process control and yield management for semiconductor device manufacturing based on predictions of final device performance are presented herein. Estimated device performance metric values are calculated based on one or more device performance models that link parameter values capable of measurement during process to final device performance metrics. In some examples, an estimated value of a device performance metric is based on at least one structural characteristic and at least one band structure characteristic of an unfinished, multi-layer wafer. In some examples, a prediction of whether a device under process will fail a final device performance test is based on the difference between an estimated value of a final device performance metric and a specified value. In some examples, an adjustment in one or more subsequent process steps is determined based at least in part on the difference.

Abstract: A system and method for analyzing a product fabrication process are disclosed. A product yield analysis system according to an exemplary embodiment of the present disclosure includes a data extraction unit that extracts sensor data from a plurality of sensors arranged in equipment for fabricating a product, a reference signal generation unit that generates a reference signal for each of the plurality of sensors from the sensor data, and a sensor detection unit that detects one or more sensors having a correlation with a yield of the product using the sensor data and the reference signal.

Abstract: A device to inspect a non-pattern wafer includes a light source to emit light that reflected from a wafer. A judgment unit converts the detected light into a quantitative measured value to determine whether the wafer is faulty. The wafer comprises a first region and a second region. The detection unit sequentially detects lights reflected from the first and second regions of the wafer, and a judgment unit converts the lights reflected from the first and second regions of the wafer into first and second quantitative measured values, respectively. The second region of the wafer is determined to be faulty by comparing the second measured value with a first reference value, wherein the first reference value is calculated using an average value between the first and second measured values, and a characteristic value that indicates distribution of the first and second measured values.

Abstract: A method for 3-dimensional vision inspection of objects, such as microelectronic components, which have protrusions as features to be inspected, such as input/output contact balls, is disclosed. The method comprises the steps of determining interior and exterior parameters of a stereo camera system, forming a rectified stereo camera system with a rectified camera coordinate system from the parameters of the stereo cameras determined above. A pair of images of the object having a plurality of co-planar protrusions on one surface is captured by the stereo cameras system and is transformed into the rectified coordinate system to form a pair of rectified images. Conjugate points of each protrusion are then determined in the rectified images for the measurement of its location, co-planarity and height. Various configurations of the apparatus for capturing the images and processing the image data are also disclosed.

Abstract: A molecular weight is determined from an actually measured mass spectrum of a target substance, and a database search is performed to extract candidates of a chemical structural formula corresponding to the molecular weight (S2, S3). By using an algorithm for predicting a dissociation pattern, product ions to be produced by a dissociating operation are predicted for each candidate of the chemical structural formula (S4). The predicted pattern of the product ions is compared with an actually measured MS2 spectrum, and a degree of similarity representing the degree of matching of the pattern is calculated (S5). When there are a plurality of candidates of the chemical structural formula, the candidates are displayed in order of their degrees of similarity (S6).

Abstract: To effectively utilize the polarization property of an inspection subject for obtaining higher inspection sensitivity, for the polarization of lighting, it is necessary to observe differences in the reflection, diffraction, and scattered light from the inspection subject because of polarization by applying light having the same elevation angle and wavelength in the same direction but different polarization. According to conventional techniques, a plurality of measurements by changing polarizations is required to cause a prolonged inspection time period that is an important specification of inspection apparatuses.

Abstract: Quality control (QC) sensor methods, systems and devices are for use with biological/environmental rapid diagnostic test (RDT) devices and provide for automatic timers, reminders and RDT cassette images. Sensors are calibrated and optimized, and provide for quality control of the RDT devices. Image analysis identifies cassette and patient information, and evaluates the processing and conditions of the RDT devices, cassettes and RDTs. Results may be accessed and analyzed remotely from the RDT devices. RDT chain of custody and workflow, incubation and reading sequences are tracked. A QC score for each unique patient RDT is determined based on QC criteria.

Abstract: In a measuring device, the measured data of a data recording component (10) are transmitted to an evaluating component via an output device (12). Parameters of the measuring device are stored in a memory (18). For the purpose of parameterization, parameters from the evaluating component can be stored in the memory (18) over a data cable for transmitting the measured data. To this end, the output device (12) for this data cable (Z) is operated at high impedance.

Abstract: Methods and systems for performing semiconductor metrology directly on device structures are presented. A measurement model is created based on measured training data collected from at least one device structure. The trained measurement model is used to calculate process parameter values, structure parameter values, or both, directly from measurement data collected from device structures of other wafers. In some examples, measurement data from multiple targets is collected for model building, training, and measurement. In some examples, the use of measurement data associated with multiple targets eliminates, or significantly reduces, the effect of under layers in the measurement result, and enables more accurate measurements. Measurement data collected for model building, training, and measurement may be derived from measurements performed by a combination of multiple, different measurement techniques.

Abstract: Systems and methods for determining adjustable wafer acceptance criteria based on chip characteristics. The method includes measuring a density of at least one chip. The method further includes computing a difference in density between the density of the at least one chip and a density of at least one kerf structure. The method further includes calculating an offset value to modify a Wafer Acceptance Criteria (WAC) to match the density difference between the at least one chip and the at least one kerf structure. The method further includes applying the offset value to the WAC for a wafer level measurement in order to increase chip yield performance.

Abstract: A photoinduced carrier lifetime measurement device includes light sources that respectively apply light that differs in wavelength and generates photoinduced carriers to a semiconductor substrate, a microwave generation section that generates microwaves that are applied to the semiconductor substrate, a detection section that detects the intensity of the microwaves that have passed through the semiconductor substrate, and a calculation section that calculates the effective carrier lifetime corresponding to the wavelength of each light based on the intensity of the microwaves detected when applying each light, and calculates the bulk carrier lifetime and a surface recombination velocity of the semiconductor substrate based on the effective carrier lifetime calculated corresponding to the wavelength of each light.

Abstract: The invention comprises a method of forming a concrete structure or object. The method comprises detecting the temperature of a quantity of curing concrete and selectively adding heat to the curing concrete, so that the temperature of the curing concrete follows a predetermined temperature profile during at least a portion of the concrete curing process. Apparatus for performing the method is also disclosed.

Abstract: A method for evaluating the operation of a continuous process plant uses operational data. The operational data includes data points representing the quantity of a substance processed by the continuous process plant during a plurality of time periods. The quantity of substance processed during these time periods is compared to a goal value. A reliability score is calculated. A banked opportunity score is calculated. An equivalent lost stream days score is calculated. The average quantity processed during periods that equaled or exceeded the goal is calculated. The average quantity processed during periods that were below the goal is calculated. The components of the equipment or machinery of the continuous process plant are classified and correlated to the quantity of lost opportunity. The scores are reported. The scores are also compared to historical data.

Abstract: Methods and systems for creating a measurement model based on measured training data are presented. The trained measurement model is used to calculate process parameter values, structure parameter values, or both, directly from measured data collected from other wafers. The measurement models receive measurement data directly as input and provide process parameter values, structure parameter values, or both, as output. The measurement model enables the direct measurement of process parameters. Measurement data from multiple targets is collected for model building, training, and measurement. In some examples, the use of measurement data associated with multiple targets eliminates, or significantly reduces, the effect of under layers in the measurement result, and enables more accurate measurements. Measurement data collected for model building, training, and measurement, may be derived from measurements performed by a combination of multiple, different measurement techniques.

Abstract: According to some aspects, a system and method for processing messages in a plurality of successive cycles is provided. One such system comprises a plurality of first circuits, each first circuit configured to output a message, the plurality of first circuits configured to operate synchronously, a first plurality of buffers, each buffer associated with a respective first circuit and configured to store a message output by the respective first circuit, a communication path configured to receive the plurality of messages from the buffers and to perform aggregation of the messages, thereby generating an aggregated indication, and one or more second circuits. The one or more second circuits are configured to operate synchronously and to receive the aggregated indication, wherein buffers of the first plurality of buffers are configured to store messages from respective first circuits for different times.

Abstract: An enclosure for displaying artwork, historical documents, and artifacts that require controlled atmospheric conditions is provided that is low cost and less cumbersome compared to existing microclimate enclosures. The enclosure has a frame construction that is easy to set up, maintain, and monitor with a hypoxic/anoxic microclimate that protects against, oxidation of its contents, pests, and bacterial growth. The enclosure is suitable for: paintings, works on paper, ephemera, textiles, mineral specimens, archeological metallic artifacts, animal skins and other organic items, rubber and polymers, and items susceptible to insect damage. A method of testing and servicing one or more enclosures is also provided.

Abstract: Disclosed are methods and techniques for providing favorable fabrication characteristics for optical elements. One method includes providing a desired integrated computational element (ICE) design comprising a plurality of layers, each layer having a design thickness, randomizing the design thickness of each layer of the desired ICE design to simulate a fabrication error in each layer, thereby generating a plurality of randomized ICE designs, calculating a standard error of calibration between each randomized ICE design and the desired ICE design, correlating the standard error of calibration between a given layer of the desired ICE design and the fabrication error of each corresponding layer of each randomized ICE design, and ranking the plurality of layers of the desired ICE design based on the sensitivity to changes in the standard error of calibration.

Abstract: A processing method includes processing a wafer based on initial data, measuring errors for each of the plurality of areas, calculating an error similarity of at least some of the plurality of areas as a function of a separation distance between each pair of some of the areas, selecting a first area and a plurality of second areas adjacent to the first area, calculating weight values for the second areas based on the error similarities between each pair of second areas and the error similarities between the first area and each second area, calculating an estimated error of the first area based on the measured errors of the second areas and the weight values for the second areas, and generating estimated data based on the estimated errors for each of the plurality of areas.

Abstract: A method testing the quality of products applied to a system is provided. Each product includes a unique identification number. The system includes a data storage device and test devices. The data storage device includes a first table recording identification numbers, test types, and test results, each test device stores a second table records the identification numbers and the test types. The method includes: obtaining the identification number; obtaining the test type; determining whether a test type previous to the test type exists; and generating first information to prompt the operator to return the to-be-tested product to the workstation of previous test type when the test result corresponding to the existed previous test type does not exist or the test result corresponding to the existed previous test type is a first value.

Abstract: A method and apparatus for of storing data comprising monitoring a plurality of storage units within a mass storage area and detecting when a storage unit within the mass storage area is overloaded. The method further comprising randomly distributing the data on the overloaded storage unit to the other storage units within the mass storage area.

Abstract: A method and system of classifying predicted performance of HID lamps or light sources. A characteristic of each lamp or light source is measured after a relatively short time of operation of the lamp or light source. The measurement is placed into one of a plurality of classifications based on its relative value to other similar measurements. Each class is correlated to long term predicted performance of the lamp or light source.

Abstract: The present invention provides a quality inspection method of a glass plate, which can predict the shape of the glass based on three types of design shape data C1, C2 and C3 of a glass plate in a state that it is placed on a three-point supporting type actual measurement inspection stand and an actual measurement shape data Y1 of the glass plate. The virtual errors ?C2=C2?C1, ?C3=C3?C1 and ?Y1=Y1?C1 at four supporting points of the glass plate are calculated, the correction amount R=r(C3?C1) or the correction amount R=r(C2?C1) is subtracted from Y1?C1 to calculate a value corresponding to a difference Y2?A between a shape data Y2 of the glass on a desired actual measurement inspection stand and a design data A on the desired actual measurement inspection stand, and from the value corresponding to a difference Y2?A and a quality standard, the quality of the glass plate is judged.