Abstract: The present application discloses an on-chip code breakpoint debugging method, an on-chip processor, and a chip breakpoint debugging system. The on-chip processor starts and executes an on-chip code, and an output function is set at a breakpoint position of the on-chip code. The on-chip processor obtains output information output by the output function, and stores the output information into an off-chip memory. In one embodiment, according to the output information, output by the output function and stored in the off-chip memory, the on-chip processor can obtain execution conditions of the breakpoints of the on-chip code in real time, achieve the purpose of debugging multiple breakpoints in the on-chip code concurrently, and improve debugging efficiency.

Abstract: An integrated circuit. The integrated circuit includes: (i) a clocked circuit operable in response to a clock; (ii) a clock providing circuit, coupled to clock the clocked circuit at a selectable frequency; (iii) a test circuit coupled to the clock providing circuit and the clocked circuit; and (iv) a pad configured to receive an external signal, wherein the selectable frequency is selected in response to the external signal.

Abstract: The present disclosure provides a processing device including: a coarse-grained pruning unit configured to perform coarse-grained pruning on a weight of a neural network to obtain a pruned weight, an operation unit configured to train the neural network according to the pruned weight. The coarse-grained pruning unit is specifically configured to select M weights from the weights of the neural network through a sliding window, and when the M weights meet a preset condition, all or part of the M weights may be set to 0. The processing device can reduce the memory access while reducing the amount of computation, thereby obtaining an acceleration ratio and reducing energy consumption.

Abstract: A diagnostic test instrument for testing power system equipment may include a chassis having a number of bays capable of receiving test circuitry modules, which may be field inserted by a user desiring to perform a particular test. The instrument may include controller circuitry that may sense in each of the bays whether a respective test circuitry module is inserted therein, and then interrogate respective test circuitry modules in each respective bay to identify a type of the respective test circuitry module. Available testing capabilities may be identified according to the type of each of the respective test circuitry modules identified in respective bays. The controller circuitry may output configuration instructions to test circuitry modules, and respective test ports included in each of the respective test circuitry modules may be selectively illuminated as a configuration instruction to visually identify an assigned functionality of the respective test ports.

Abstract: A device test architecture and interface is provided to enable efficient testing embedded cores within devices. The test architecture interfaces to standard IEEE 1500 core test wrappers and provides high test data bandwidth to the wrappers from an external tester. The test architecture includes compare circuits that allow for comparison of test response data to be performed within the device. The test architecture further includes a memory for storing the results of the test response comparisons. The test architecture includes a programmable test controller to allow for various test control operations by simply inputting an instruction to the programmable test controller from the external tester. The test architecture includes a selector circuit for selecting a core for testing. Additional features and embodiments of the device test architectures are also disclosed.

Abstract: Examples described herein provide a method for evaluating a programmable logic device (PLD) for compatibility with user designs. The method includes using a processor-based system: obtaining an indication of one or more failure bits of configuration memory of a programmable logic device (PLD); determining whether each of the one or more failure bits corresponds to a configuration memory bit to be used by a first PLD user design; if any of the one or more failure bits corresponds to a configuration memory bit to be used by the first PLD user design, classifying the PLD as unusable for the first PLD user design; and if none of the one or more failure bits corresponds to a configuration memory bit to be used by the first PLD user design, classifying the PLD as usable for the first PLD user design.

Abstract: An example device includes a data port to provide a data channel to a host and a processor coupled to the data port. The processor includes an operational mode and a low-power mode in which the processor is to perform fewer operations than in the operational mode. The processor is to execute instructions in the operational mode and to update the instructions with updated instructions received via the data channel in the operational mode. The device further includes a side channel to receive a signal from the host to trigger the processor to switch from the low-power mode to the operational mode and to initiate update of the instructions with the updated instructions.

Abstract: A CPU voltage testing system and method uses a parameter storing unit to store a number of VID codes and a plurality of allowable voltage ranges. A number of VID code control signals corresponding to the number of the VID codes are sent to a VID code coding unit to control a voltage converting module to output corresponding voltage signals to a CPU. A voltage collecting unit collects CPU core voltages of the CPU and outputs the collected CPU core voltages to a data processing unit. The data processing unit can determine whether the collected CPU core voltages are within the plurality of allowable voltage ranges via comparing with a number of testing parameters stored in the parameter storing unit.

Abstract: A device test architecture and interface is provided to enable efficient testing embedded cores within devices. The test architecture interfaces to standard IEEE 1500 core test wrappers and provides high test data bandwidth to the wrappers from an external tester. The test architecture includes compare circuits that allow for comparison of test response data to be performed within the device. The test architecture further includes a memory for storing the results of the test response comparisons. The test architecture includes a programmable test controller to allow for various test control operations by simply inputting an instruction to the programmable test controller from the external tester. The test architecture includes a selector circuit for selecting a core for testing. Additional features and embodiments of the device test architectures are also disclosed.