Abstract: Systems and methods include receiving a request, in a cloud system from a first device, to access a second device; determining if the first device is permitted to access the second device; if the first device is not permitted to access the second device, notifying the first device the second device does not exist; and, if the first device is permitted to access the second device, stitching together connections between the cloud system, the first device, and the second device to provide access to the second device for the first device, wherein the connections are implemented through the cloud-based system.

Abstract: Apparatuses, systems, and methods for predetermined pattern program operations are described according to embodiments of the present disclosure. One example method can include determining a portion of a memory device is invalid and performing a predetermined pattern program operation on the portion of the memory device in response to determining the portion of the memory device is invalid.

Abstract: According to one embodiment, the controller periodically executes a first operation. The controller selects a first mode or a second mode in the first operation. In a case where the first mode is selected, the controller reads pieces of data that are stored in contiguous memory locations, respectively, that are included in a first physical page or a second physical page. The first physical page is included in a first physical block of a first die. The second physical page is included in a second physical block of a second die. In a case where the second mode is selected, the controller reads first data stored in one memory location of the first physical page and second data stored in one memory location of the second physical page.

Abstract: An apparatus and method for supporting communication during error handling in a computing system. A computing system includes a first partition and a second partition, each capable of performing error management based on a respective machine check architecture (MCA). When a host processor in the first partition detects an error that requires information from processor cores of the second partition, the host processor generates an access request with a target address pointing to a storage location in a memory of the second partition, not the first partition. When the host processor receives the requested error log information from the second partition, the host processor completes processing of the error. To support the host processor in generating the target address for the access request, during an earlier bootup operation, the second partition communicates the hardware topology of the second partition to the host processor.

Abstract: The exemplary embodiments of the present invention provides a scan cluster reordering method and apparatus which perform a scan correlation aware scan cluster reordering to reduce a power generated during the scan test and place scan cells having a high correlation to be adjacent to each other by analyzing the correlation between scan cells, and reduce a test power generated during the scan test.

Abstract: A system and method of automated downtime scheduling and control is disclosed. A failure of at least one component of at least one bare-metal server associated with a client is detected and a first notification is transmitted to a client system associated with the client. The notification includes a request to schedule downtime. A response including a selected downtime is received from the client system and the at least one bare-metal server is transitioned to an offline state at the selected downtime. A ticket is generated in a ticketing system for repair of the bare-metal server. The ticket identifies the at least one component.

Abstract: Aspects of the invention include systems and methods for to detecting security vulnerabilities using modeled attribute propagation. A non-limited example of a computer-implemented method includes generating a model of a device under test, the model comprising a data path similar to the device under test and an attribute network. The method further includes detecting protected data that is introduced into the model and marking the protected data with an attribute. An end point of the marked protected data is detected along the data path. In response to the end point being indicative of a vulnerability, an alert is issued.

Abstract: A memory component includes multiple fuses, a memory array having a multiple blocks, and control logic operatively coupled with the memory array and the plurality of fuses. The control logic is to perform operations including detecting a failure to completely erase a block of the plurality of blocks in response to an attempted erasure of the block; receiving a blow fuse command in response to the failure to completely erase the block; and blowing a fuse, of the plurality of fuses, coupled with the block, to make the block electrically inaccessible to the control logic in response to receipt of the blow fuse command.

Abstract: Embodiments can include a scan of data associated with programmed memory cells is performed. The scan of data results in a bit error count (BEC) histogram. A trigger margin is determined from the BEC histogram. The determined trigger margin and a target trigger margin are compared. In response to the determined trigger margin being different than the target trigger margin, one or more program step characteristics is adjusted to adjust the determined trigger margin toward the target trigger margin.

Abstract: A control apparatus for a vehicle includes a memory and a controller. The memory has a first storage area, which is a write restricted area storing one or more first control patterns out of a plurality of control patterns for the vehicle, and a second storage area, which is a write enabled area storing one or more second control patterns out of the plurality of control patterns for the vehicle. The controller determines whether a control condition for each of the plurality of control patterns is satisfied based on a state of the vehicle, to select one or more control patterns for each of which the control condition is satisfied, and to control the vehicle according to the selected one or more control patterns.

Abstract: A method, performed in a debug host, for observing software execution on a computer having one or more processor cores, a cache attached to the one or more processor cores via respective execution pipelines forming a cache arrangement, and a memory, comprises obtaining an instruction trace of the cache arrangement and a data trace for data being loaded from the memory into the cache. The instruction trace is synchronized with the data trace to generate a synchronized data trace and/or a synchronized instruction trace. A state of a memory model, representing a memory readable by the one or more processor cores via a respective instruction is updated using the synchronized data trace and the synchronized instruction trace.

Abstract: Aspects of the disclosed technology relate to techniques for modeling memories in emulation. An emulator is configured to implement an emulation model for a circuit design and a cache memory model for a memory accessible by the circuit design. A workstation coupled to the emulator is configured to implement a main memory model for the memory. The cache memory model is a hardware model while the main memory model is a software model. The cache memory model stores a subset of data that are stored in the main memory model and is synchronized with the main memory model.

Abstract: A system includes a memory controller, a buffer, a first channel to couple the memory controller to the buffer, and a second channel to couple the buffer to a memory. The first channel and second channel are to transmit a codeword including a plurality of symbols. A symbol is formed from a plurality of bursts based on data access of the memory. The memory controller is to identify a memory error based on a corrupted symbol pattern of the codeword. The memory controller is to discriminate between a chip failure, a first pin failure of the first channel, and a second pin failure of the second channel, as being a type of the memory error, according to the corrupted symbol pattern.

Abstract: The technology disclosed relates to implementing a novel architecture of a finite state machine (abbreviated FSM) that can be used for testing. In particular, it can be used for testing communications devices and communication protocol behaviors.

Abstract: A memory device includes a command decoder for generating a test selection code and a test setup data by decoding an external command and an external address, a non-volatile memory for storing an internal setup data, a counter for generating an internal selection code by counting a clock, a first selector for selecting the test selection code during a test mode operation, selecting the internal selection code during a boot-up operation, and transferring the selected selection code through a selection code transfer bus, a second selector for selecting the test setup data during the test mode operation, selecting the internal setup data that is outputted from the non-volatile memory during the boot-up operation, and transferring the selected selection code through a setup data transfer bus; and setup circuits for performing a setup operation based on the information transferred through the selection code transfer bus and the setup data transfer bus.

Abstract: A diagnostic system provides identification of symptoms in a distributed network and an engine for providing recommended rectification of error sources that correspond to the symptoms. The distributed network may be accessed for current statistics. Symptoms may be identified that correspond to the current statistics. A recommended course of action for the distributed network may be provided based on a predetermined list of courses of actions that correspond to rectifying the performance in the error sources.

Abstract: In a processing system comprising a plurality of data processors at an integrated circuit die, each data processor has a local debug module. In response to acquiring data trace information based upon a corresponding local filtering criteria, the local debug modules transmit their data trace information to a global resource from each of the local debug modules for further filtering by a common filtering criteria.

Abstract: A SRAM (Static Random Access Memory) macro test flop circuit includes a flip-flop circuit, a scan control circuit, and an output buffer circuit. The flip-flop circuit includes a master latch circuit and a slave latch circuit. The master latch circuit includes a master storage node and a multiplexer. The slave latch circuit includes a slave storage node driven by the master latch. The scan control circuit includes a scan slave feed-forward circuit, a scan latch circuit, and a scan driver circuit driven by the scan feed-back circuit. The scan latch circuit includes a scan feed-back circuit, a scan storage node, and a scan feed-forward circuit driven from the slave latch. The output buffer circuit includes a master driver driven from the master latch circuit and a slave driver driven from the slave latch circuit.

Abstract: Method and system for a test process. The method may include performing tests on one or more units under test (UUTs). At least one test on one or more UUTs may be performed. A signal may be acquired from the UUT. A reference signal may be retrieved. The reference signal may be derived from a transmitted signal characteristic of the UUT. The signal may be analyzed with respect to the reference signal. Results, useable to characterize the one or more UUTs, from performing the at least one test on the one or more UUTs may be stored. The reference signal may be derived from an initial test and may be stored for subsequent retrieval. A respective reference signal may be retrieved for all UUTs of the one or more UUTs for a respective test. The signal may be a radio frequency signal. The UUT may be a wireless mobile device.

Abstract: A method for improving address integrity in a memory system generates error correction data corresponding to a memory address. The error correction data is transmitted to a memory device over an address bus coincident with transmitting a no-operation instruction over a command bus.

Abstract: An error test routine is to test for a type of memory error by changing a content of a memory module. A memory handling procedure is to isolate the memory error in response to a positive outcome of the error test routine. The error test routine and memory handling procedure is to be performed at runtime transparent to an operating system. Information corresponding to isolating the memory error is stored.

Abstract: A semiconductor memory device is configured to internally perform a test operation utilizing a random data pattern. The semiconductor memory device includes a random data pattern test unit that operates under control of on-board control logic that also manages normal operation of the semiconductor memory device. The control logic controls test operation of the semiconductor memory device in response to simple commands received from an external device. Therefore, the test time may be reduced more than when a test is entirely controlled by an external device. Furthermore, since the external device does not need to manage the random data pattern, the test cost may be reduced more than when a test is performed under control of the external device.

Abstract: A new, robust non-volatile memory (NVM) reset sequence is provided in accordance with at least one embodiment, which, after reading a Test NVM portion and overwriting NVM configuration registers' default values with the values read from the Test NVM portion, does a read integrity check. If the read integrity check passes, a reset process will conclude. Otherwise, if the read integrity check fails, the reset process will re-try reading the Test NVM and overwriting the NVM configuration registers' default values. If the read integrity check still fails after a maximum number of re-tries, a fail flag will be set, and the predetermined “safe” default values will be reloaded to the NVM configuration registers, thereby assuring that the NVM device is operational.

Abstract: A display device is coupled to a computer, and the computer accommodates a motherboard. The display device includes an interface unit connected to the motherboard, a display panel, and a processor electrically coupled to the interface unit. The processor is used to: receive a power-on self test (POST) code from the motherboard via the interface unit, convert the POST code into a debug code, and control the display panel to display the debug code.

Abstract: Embodiments of the invention relate to the conversion and execution of functional tests. In one embodiment, a current test step of a manual functional test is executed. The test includes a set of test steps each including at least one action and one target of the action. The test is associated with an application that includes a plurality of objects to be tested. At least two of the objects are determined to be associated with the target of the test step. A user is prompted to provide a selection of one of the at least objects for association with the target of the test step. A new test step is generated. The new test step associates the object selected by the user with the target of the current test step. The new test step is designated for automatic execution in place of the current test step for subsequent executions thereof.

Abstract: Correlated failure distribution for memory arrays having different groupings of memory cells is estimated by constructing memory unit models for the groupings based on multiple parameters, establishing failure conditions of the memory unit model using fast statistical analysis, calculating a fail boundary of the parameters for each memory unit model based on its corresponding failure conditions, and constructing memory array models characterized by the fail boundaries. Operation of a memory array model is repeatedly simulated with random values of the parameters assigned to the memory cells and peripheral logic elements to identify memory unit failures for each simulated operation. A mean and a variance is calculated for each memory array model, and an optimal architecture can thereafter be identified by selecting the grouping exhibiting the best mean and variance, subject to any other circuit requirements such as power or area.

Abstract: A system and method for auditing memory cards. A memory card is received in a card reader in communication with a computing device. The memory card is scanned utilizing a computing device. A determination is made whether content in the memory card is acceptable or unacceptable. A first volume name of the memory card is rewritten to the second volume name in response to determining the content in the memory card is acceptable.

Abstract: A system and method for verifying memory cards. A memory card is received in a card reader in communication with a computing device. The memory card is scanned utilizing a computing device. A visual indicator is displayed on the computing device indicating whether the card is functioning correctly and whether the memory card passed or failed the scanning. An identifier associated with the memory card is stored in response to determining the memory card passed the scanning. A first volume name of the memory card is rewritten to the second volume name in response to storing the identifier.

Abstract: A re-characterization process is provided that adjusts one or more operating parameters of a processor to improve the health (e.g., reduce errors) of the processor. The parameters include voltage and/or clock frequency, as examples. The processor can be an inactive or active processor for which the re-characterization process is performed. It is performed, in one instance, by a hardware controller in real-time.

Abstract: A system and method for early detection and reporting of an impending NAND Flash device plane failure. Each time that a data unit is retrieved from a NAND Flash array the number of bits in error and the memory location associated with the errors is observed. if the number of bits in error or the error rate for a memory location exceeds a threshold of the number of bits in error per data, retrieval, or number of bits in error per data unit per unit time, a NAND Flash plane failure Patrol Read operation is performed at the memory location, regardless of where in the cycle the Patrol Read function is in a scrub of the overall NAND Flash device. The NAND Flash plane failure Patrol Read is repeated for a number of cycles on the NAND Flash plane in question.

Abstract: A method and an apparatus for testing a network. A source port unit may generate a packet including a payload, the payload comprising a content identifier and content data in accordance with the content identifier, and transmit the packet via the network. A destination port unit may receive the packet and extract the content identifier and received content data from the received packet. The destination port unit may obtain expected content data in accordance with the extracted content identifier and compare the expected content data and the received content data.

Abstract: A non-volatile memory device and an operating method thereof are provided. The non-volatile memory device includes a memory unit including a plurality of memory blocks and a cam block, a peripheral circuit unit configured to program memory cells included in the plurality of memory blocks and the cam block or read programmed data, and a processor configured to control the peripheral circuit unit to measure an offset voltage by memory cell group in the plurality of memory blocks to set a read voltage during a test read operation and control the peripheral circuit unit to perform a read operation by memory cell group by using a new read voltage during a read operation.

Abstract: An information processing apparatus includes a plurality of controller modules capable of performing communications with each other, and a memory included in each controller module to be stored with status information reflecting a status of an error occurring during the communications with other controller modules with respect to the controller module of a communication partner apparatus and/or the controller module of the self-apparatus, wherein, when determining whether or not a fault occurs in a certain controller module in the plurality of controller modules, the controller module different from a determination target controller module determines, based on status information of the determination target controller module that is stored on the memories of two or more controller modules different from the determination target controller module, whether the fault occurs in the determination target controller module.

Abstract: During starting of a field device for pressure measurement, flow measurement and/or fill level measurement, which field device including a memory that includes a boot memory region in which a boot function is stored, and an operating memory region in which an operating function is stored, the following steps are carried out: carrying out the boot function; determining whether a memory check of the operating memory region is to be carried out; carrying out a memory check of the operating memory region when it has been determined that a memory check is to be carried out; and carrying out the operating function.

Abstract: A method is provided for performing a self-test on a memory device in a test mode, where the memory device includes a universal flash storage (UFS) link layer and a UFS physical layer having a transmitting unit and a receiving unit. The method includes generating a first signal; sending the first signal from a test unit through the UFS link layer to the transmitting unit in the UFS physical layer to be transmitted to the receiving unit; receiving a second signal at the test unit from the receiving unit in the UFS physical layer through the UFS link layer, the second signal being the first signal received by the receiving unit; and testing an operation performed by at least one of the UFS physical layer and the UFS link layer based on the first signal and the second signal.

Abstract: A method for transparent debug of a hardware queue and recreation of an operational scenario comprising: use of a computer device to: monitor a plurality of inputs and outputs from a plurality of hardware queues associated as parts of a design; receive a request to save from an external source; pause one or more hardware queues upon command; receive hardware queue information from at least one of the paused hardware queues; dump said hardware queue information from at least one paused hardware queue; store the hardware queue information in a data storage connected to the computing device; compare the received information to stored data representative of a functional hardware queue; identify errors and failures in each monitored hardware queue from the comparing and; restore the hardware queue to a previous state.

Abstract: Various exemplary embodiments relate to a method and related network node including one or more of the following: determining that a diagnostic test should be performed on a hardware component of a plurality of hardware components, wherein the plurality of hardware components support a plurality of agent devices and at least one agent device of the plurality of agent devices is assigned to at least one of the plurality of hardware components; ensuring that no agent device of the plurality of agent devices is assigned to the hardware component; and after ensuring that no agent device of the plurality of agent devices is assigned to the hardware component, performing the diagnostic test on the hardware component, wherein at least one other hardware component of the plurality of hardware components continues operation during performance of the diagnostic test.

Abstract: A system, method, and product are disclosed for testing multiple threads simultaneously. The threads share a real memory space. A first portion of the real memory space is designated as exclusive memory such that the first portion appears to be reserved for use by only one of the threads. The threads are simultaneously executed. The threads access the first portion during execution. Apparent exclusive use of the first portion of the real memory space is permitted by a first one of the threads. Simultaneously with permitting apparent exclusive use of the first portion by the first one of the threads, apparent exclusive use of the first portion of the real memory space is also permitted by a second one of the threads. The threads simultaneously appear to have exclusive use of the first portion and may simultaneously access the first portion.

Abstract: Performing wear-leveling and bad block management of limited lifetime memory devices. A method for performing wear-leveling in a memory includes receiving logical memory addresses and applying a randomizing function to the logical memory addresses to generate intermediate addresses within a range of intermediate addresses. The intermediate addresses are mapped into physical addresses of a memory using an algebraic mapping. The physical addresses are within a range of physical addresses that include at least one more location than the range of intermediate addresses. The physical addresses are output for use in accessing the memory. The mapping between the intermediate addresses and the physical addresses is periodically shifted. In addition, contents of bad blocks are replaced with redundantly encoded redirection addresses.

Abstract: A method includes instantiating a cloned network that includes a second set of virtual service nodes. The second set of virtual service nodes includes at least one cloned virtual service node that is a clone of a corresponding virtual service node in a first set of virtual service nodes. The at least one cloned virtual service node has access to a history of events that occurred at the corresponding virtual service node in the first set of virtual service nodes. The method includes initiating an interactive debugging session that includes processing of the events of the history of events.

Abstract: A method of coordinating trace information in a multiprocessor system includes receiving processor trace information from a set of processors. The processor trace information from each processor includes a processor identity and a coherence indicator that demarks selective shared memory transactions. Coherence manager trace information is generated for each of the processors. The coherence manager trace information for each processor includes trace metrics and a coherence indicator.

Abstract: A central processing unit (CPU) test system includes a CPU socket, a CPU core controller, and a CPU test device. The CPU core controller stores a start voltage message. The CPU test device includes a voltage detection pin, an analog to digital (A/D) converter, and a microcontroller. The voltage detection pin detects a voltage of an electronic device connected to the CPU socket. The A/D converter converts the detected voltage into a digital signal. The microcontroller controls the CPU core controller to output the start voltage to the CPU socket according to the digital signal. The microcontroller stores a predetermined start voltage message. The microcontroller reads the start voltage message after controlling the CPU core controller to output the start voltage, and determines whether the CPU core controller supplies the start voltage to the CPU socket by comparing the read start voltage message with the predetermined start voltage message.

Abstract: The invention relates to a circuit arrangement and to a method for testing same. A circuit arrangement is provided that includes a plurality of functional units which are coupled by at least one streaming data bus. Each of the functional units includes a plurality of hardware modules and a switch matrix. At least one of the streaming data busses is provided with a data width of at least that of the widest hardware module of any of the functional units of the circuit arrangement. The switch matrices are configurable to establish a streaming data path between and through the plurality of functional units which is used as a test link for any of the hardware modules of the circuit arrangement. The invention provides for non-intrusive real-time tracing in SoCs with a minimum of additional hardware resources and at low cost in terms of die size and power consumption.

Abstract: A computer implemented method of embedded dynamic random access memory (EDRAM) macro disablement. The method includes isolating an EDRAM macro of a cache memory bank, the cache memory bank being divided into at least three rows of a plurality of EDRAM macros, the EDRAM macro being associated with one of the at least three rows. Each line of the EDRAM macro is iteratively tested, the testing including attempting at least one write operation at each line of the EDRAM macro. It is determined that an error occurred during the testing. Write perations for an entire row of EDRAM macros associated with the EDRAM macro are disabled based on the determining.

Abstract: Memory devices that, in a particular embodiment, receive and transmit analog data signals representative of bit patterns of two or more bits such as to facilitate increases in data transfer rates relative to devices communicating data signals indicative of individual bits. Programming error correction code (ECC) and metadata into such memory devices includes storing the ECC and metadata at different bit levels per cell based on an actual error rate of the cells. The ECC and metadata can be stored with the data block at a different bit level than the data block. If the area of memory in which the block of data is stored does not support the desired reliability for the ECC and metadata at a particular bit level, the ECC and metadata can be stored in other areas of the memory array at different bit levels.

Abstract: The disclosure describes a novel method and apparatuses for allowing a controller to select and access different types of access ports in a device. The selecting and accessing of the access ports is achieved using only the dedicated TDI, TMS, TCK, and TDO signal terminals of the device. The selecting and accessing of device access ports can be achieved when a single device is connected to the controller, when multiple devices are placed in a daisy-chain arrangement and connected to the controller, or when multiple devices are placed in a addressable parallel arrangement and connected to the controller. Additional embodiments are also provided and described in the disclosure.

Abstract: A method according to one embodiment includes gathering information about monitor data from a plurality of memory devices having finite endurance and/or retention, the monitor data being (i) data of known content stored in dedicated memory cells of known write cycle count, and (ii) write protected for preventing the monitor data from being overwritten with user data; analyzing the monitor data information; and taking an action relating to at least one of the devices based on the analyzing. Additional systems, methods, and computer program products are also disclosed.

Abstract: At least one standard size data block of a storage device is scanned for a logically bad pattern. If the logically pad pattern is detected, a block address that is associated with the standard size data block is added to a bad block table. If the logically pad pattern is not detected, it may be determined if the block address associated with the standard size data block is in the bad block table. If the logically pad pattern is not detected and if the block address associated with the standard size data block is in the bad block table, the block address may be removed from the bad block table. The logically bad pattern may have a first predefined data portion and a second predefined data portion and may be repeated the requisite number of instances to fill the standard size data block.

Abstract: In a memory testing method for testing a memory module of a computing device, an operating voltage of the memory module is adjusted to a first voltage or a second voltage. A predetermined data set is written into the memory module after the operating voltage of the memory module is adjusted, and the written data set is read out from the memory module, to accomplish a data writing and reading process of the memory module. A register value that presents how many memory errors have occurred during the data writing and reading process is acquired from an ECC register of the memory module, to determine whether the memory module is stable during the adjusting of the operating voltage according to the register value.

Abstract: A computing device and method tests a redundant array of independent disks (RAID) device. The computing device controls a power supply device to cut off power of the RAID device, and controls the power supply device to provide the power to the RAID device after a predetermined time. The computing device reads an original test file from the RAID device and determines if the read file is identical to the original test file stored in the computing device. The computing device displays a test result of the RAID device on a display device of the computing device.