Displacement, Motion, Distance, Or Position Patents (Class 73/1.79)
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Patent number: 7248474Abstract: A fool-proof device on the heatsink thermal module for the notebook computer is provided. With an interference member installed on one side of the case of the heatsink thermal module, when installing the heatsink thermal module, the interference member and a predetermined recognition area on the printed circuit board (PCB) can provide a fool-proof function to avoid assembling error of two modules with different standard but similar in appearance in the assembling process.Type: GrantFiled: May 27, 2005Date of Patent: July 24, 2007Assignee: Inventec CorporationInventors: Yi-Lun Cheng, Chih-Kai Yang
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Patent number: 7246513Abstract: A calibration device and method for lateral force calibration in small force measuring devices such as atomic force microscopes is disclosed. A platform has a substantially planar surface including a slot for accommodating at least part of the AFM cantilever tip, one or more supporting legs arranged to provide sprung resistance to the platform and a capacitive drive means for driving the platform laterally with respect to the AFM cantilever tip.Type: GrantFiled: October 25, 2005Date of Patent: July 24, 2007Assignee: The Secretary of State for Trade and Industry of Her Majesty's Britannic GovernmentInventor: Peter J. Cumpson
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Patent number: 7197834Abstract: The invention relates to a holder for test objects, which are composed of at least two targets and at least one connecting element, comprising at least one carrier, at least one guide, which is arranged on or/and in the at least one carrier, and seats for the targets of at least one test object, wherein at least one seat can be moved along the at least one guide such that an adaptation of the position of the at least one movable seat to the position of one target of the test object is possible. Furthermore, the invention relates to a test object for the holder previously mentioned, comprising at least two targets and at least one connecting element, wherein the targets and connecting elements can be selected from a given set of single targets and single connecting elements and combined to form a test object.Type: GrantFiled: November 26, 2004Date of Patent: April 3, 2007Assignee: Metronom AGInventor: Dietmar Heimer
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Patent number: 7188428Abstract: Test piece, comprising at least two shaped probe elements and at least one connecting element for connecting the at least two shaped probe elements. Each connecting element is provided with at least one fastening element at one end of the connecting element for fastening a shaped probe element. Length variations of the at least two shaped probe elements and/or of the at least one connecting element are compensated by the fastening elements in such a way that the distance between respective two sensing points under standard measuring conditions is essentially constant.Type: GrantFiled: February 14, 2003Date of Patent: March 13, 2007Assignee: Metronom AGInventor: Jean Blondeau
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Patent number: 7168290Abstract: A measuring system for calibrating a machine in which a base (10) is attachable to a surface of the machine and a housing (20) is mountable on the base, wherein at least one surface of the base and at least one surface of the housing are each provided with a complementary part of a mounting device, such that when the two parts of the mounting device are connected together, the housing may be aligned in any of a plurality of predetermined directions. The base includes a lifting mechanism (64) which when lowered allows the complementary parts of the mounting device (93, 95) of the housing (20) and the base (10) to be in contact and when raised causes them to at least partly break contact with one another. The level of the base (10) may be adjusted using a system of balls and tapered rollers.Type: GrantFiled: January 16, 2003Date of Patent: January 30, 2007Assignee: Renishaw PLCInventors: Stephen M. Angood, David R. McMurtry
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Patent number: 7168291Abstract: An apparatus and a method for determining wear of a feedscrew and barrel combination includes measuring wear of the barrel using a gage plug in a measuring aperture in the barrel or an ultrasonic thickness gauge and measuring feedscrew wear with an eddy current sensor or a dial indicator mounted in the measuring aperture. A system gathers wear data from various production installations, analyzes the data to predict remaining life of the barrel and the feedscrew and generates an order for replacement parts to be manufactured and shipped just prior to the end of the remaining life.Type: GrantFiled: January 12, 2006Date of Patent: January 30, 2007Assignee: Glycon CorporationInventors: Jeffrey A. Kuhman, Richard T. Harris, Christopher W. Barr
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Patent number: 7152456Abstract: An automated coordinate measuring system comprising a measuring arm used for acquisition of geometry data that incorporates an exoskeletal structure resilient to physical perturbations including thermal changes and vibrations which may affect coordinate data acquisition. The system may be adapted to a portable platform allowing for convenient positioning and alignment of the measuring arm in a wide variety of environments.Type: GrantFiled: January 14, 2004Date of Patent: December 26, 2006Assignee: Romer IncorporatedInventor: Homer Eaton
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Patent number: 7142313Abstract: An interaxis-angle correction method comprising: a reference sphere measurement step of scanning, with the sensor, a reference sphere located on the table, in the measurement-axis direction at a translation-axis-direction position on the reference sphere to acquire measurement-axis-direction contour information, and performing the scanning at a plurality of different translation-axis-direction positions on the same reference sphere, with the table being linearly translated; a peak detection step of detecting a peak point in the measurement-axis-direction contour information, and performing the detection for each set of measurement-axis-direction contour information; an error information acquisition step of obtaining information related to the inclination of an actual straight line based on each peak point with respect to an ideal straight line; a correction information acquisition step of obtaining correction information for correcting a measurement error related to the position in the measurement-axis directType: GrantFiled: March 8, 2006Date of Patent: November 28, 2006Assignee: Mitutoyo CorporationInventors: Takao Ishitoya, Fumihiro Takemura
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Patent number: 7065892Abstract: A calibration method for calibrating a parts-handling device with respect to a computer vision camera includes the steps of moving a parts-handling device into contact with a touch-off block, and storing a value indicative of the position of the parts-handling device when it is in contact with the touch-off block. In addition, there may be two orthogonal surface on the touch-off block. By touching the parts-handling device against both surfaces, the parts-handling device can be calibrated for position offset in two orthogonal directions. For parts-handling devices that are rotatable, the parts-handling device may be rotated to a succession of predetermined angular positions and brought into contact with the touch-off block in each position. By combining the measured positions of the parts-handling device in each rotational position, the system can be calibrated to compensate for the offset from the camera to the parts-handling device as a function of rotational position as well.Type: GrantFiled: March 19, 2002Date of Patent: June 27, 2006Assignee: Veeco Instruments Inc.Inventors: Timothy J. Fleming, Jeffrey J. Hohn, Christopher R. Holloman, Steven E. Wheeler, Charles N. Miller
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Patent number: 7066005Abstract: A method for determining physical properties of micromachined cantilevers used in cantilever-based instruments, including atomic force microscopes, molecular force probe instruments and chemical or biological sensing probes. The properties that may be so determined include optical lever sensitivity, cantilever spring constant and cantilever-sample separation. Cantilevers characterized with the method may be used to determine fluid flow rates. The method is based on measurements of cantilever deflection resulting from drag force as the cantilever is moved through fluid. Unlike other methods for determining such physical properties of cantilevers, the method described does not depend on cantilever contact with a well-defined rigid surface. Consequently, the method may be employed in situations where such contact is undesirable or inconvenient.Type: GrantFiled: February 28, 2002Date of Patent: June 27, 2006Assignee: Asylum Research CorporationInventor: Roger Proksch
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Patent number: 7055367Abstract: A method of calibrating an analogue probe (10) having a stylus (12) with a workpiece-contacting tip (14) or a non-contact probe (26). A calibration artefact such as a calibration sphere (16) is mounted on a coordinate measuring machine (CMM) (18). The probe (10,26) is mounted on an arm (8) of the CMM and the probe is moved along a path whilst continually scanning the surface of the calibration artefact such that the probe is exercised throughout its working range. For an analogue probe (10) having a workpiece-contacting stylus (12), the path is such that the deflection of the stylus varies along the path. For a non-contact probe (26) the path is such that there is variation of the radial distance between the path and the calibration artefact. The probe path may comprise a path parallel to a chord of the calibration sphere or a curved, e.g. a sinusoidal, path.Type: GrantFiled: November 1, 2002Date of Patent: June 6, 2006Assignee: Renishaw PLCInventors: Peter Hajdukiewicz, Geoffrey McFarland, David Sven Wallace
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Patent number: 7043961Abstract: A standard medical or surgical tool's axis is located by attaching to the tool a plurality of a location indicating elements or markers having a known geometric or spatial relationship, and placing the tool in a tool calibrator that supports the tool in a manner that allows tools of different diameters to be rotated while maintaining the tool's axis in a fixed or stable orientation. As the tool is rotated, a marker locating system tracks the positions of the markers on the tool and then extrapolates or determines the axis of rotation with respect to the markers clamped to the tool. The tool calibrator has a second set of position indicating elements or markers with fixed geometric or spatial relationship with one another and with respect to a stop, against which the end or tip of the tool is placed.Type: GrantFiled: January 30, 2002Date of Patent: May 16, 2006Assignee: Z-Kat, Inc.Inventors: Rajesh Pandey, Louis Arata, Brandon Larocque
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Patent number: 7040137Abstract: The present invention features a method whereby the vacuum nozzle of each extendable vacuum spindle in a multi-head component placement machine may be calibrated during component pick/place cycles. Calibration of each vacuum nozzle ensures accurate location of the vacuum nozzle over a component at a component pick station. This is particularly important with extremely small components where a slight misalignment of a vacuum nozzle with a component to be picked could result in a missed pick. Because of the vacuum nozzle inspection and calibration on the fly during the placement cycle, there is no slowdown of the placement machine cycle rate.Type: GrantFiled: July 28, 2003Date of Patent: May 9, 2006Assignee: Universal Instruments CorporationInventor: Koenraad Gieskes
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Patent number: 7041963Abstract: A mechanism for calibrating a scanning probe microscope is presented. The calibration mechanism operates to apply an input signal to an actuator to cause acceleration of the actuator and to measure a value indicative of deflection of a cantilever attached to the actuator, as a result of the actuator acceleration. The measured deflection value is used to determine a corresponding value of actuator displacement.Type: GrantFiled: November 26, 2003Date of Patent: May 9, 2006Assignee: Massachusetts Institute of TechnologyInventors: Osamah M. El Rifai, Kamal Youcef-Toumi
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Patent number: 7036236Abstract: A method for certifying and calibrating a multi-axis coordinate measuring machine includes the steps of loading a check standard into a means for holding of the multi-axis coordinate measuring machine; measuring a virtual location of each of a plurality of apertures of the check standard within a virtual coordinate system using a touch probe of the multi-axis coordinate measuring machine; measuring an actual location of each of the apertures and simultaneously verifying the accuracy of the virtual coordinate system of the check standard using an optical probe of the multi-axis coordinate measuring machine; and calculating a deviation between the actual location of each of the apertures and a virtual location of each of the apertures of the virtual coordinate system.Type: GrantFiled: April 7, 2005Date of Patent: May 2, 2006Assignee: United Technologies CorporationInventors: Joseph D. Drescher, Jesse R. Boyer
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Patent number: 7029213Abstract: Device for coupling in a reproducible position two coupling elements, comprising a first coupling element (2) and a centering plate (4), the centering plate (4) being designed to be fastened to a second coupling element (3), the first coupling element (2) comprising at least one peg (21) comprising at least one spherical portion, the centering plate (4) comprising at least one hollow portion (41) working with the peg (21) during the coupling of said second coupling element (3) to said first coupling element (2) so as to determine the position of said centering plate (4) relative to said first coupling element (2), and equipment for pre-adjusting machine tools comprising this device.Type: GrantFiled: May 21, 2003Date of Patent: April 18, 2006Inventor: Michel Yerly
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Patent number: 7021118Abstract: Collimation device of the type intended to direct an energy beam in a given direction and at a given solid angle, the collimation device being capable of being installed on output of an energy beam generating arrangement and of being connected to a control unit. The collimation device includes the ability for testing operation of the assembly formed by the energy beam generating arrangement, the collimation device and the control unit.Type: GrantFiled: June 14, 2004Date of Patent: April 4, 2006Assignee: GE Medical Systems Global Technology Company LLCInventors: Dietmar Sundermann, Lionel Desponds, Jean-Luc Duflot
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Patent number: 7013704Abstract: A system for carrying out research on a drivable vehicle or a component thereof, includes: a test stand on which the vehicle or the component can be positioned, which vehicle or which component is provided with at least one sensor for receiving signals from the environment of the vehicle or of the component, at least one object which is situated in the vicinity of the test stand, elements for generating a relative movement between the test stand and the at least one object, and a control computer for coordinating the relative movement between the test stand and the object.Type: GrantFiled: June 22, 2001Date of Patent: March 21, 2006Assignee: Nederlandse Organisatie Voor Toegepast—Natuurwetenschappelijk Onderzoek TnoInventors: Leonardus Johannes J. Kusters, Ralph Jacques A. Kleuskens, Dirk Jan Verburg, Albertus Clemens M. van der Knaap
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Patent number: 7010955Abstract: A throttle position detecting apparatus has an interlocking member being rotatable in conjunction with a throttle grip attached to a tip of a handlebar of a vehicle; a detecting unit for detecting a rotation angle of the interlocking member; and a case integrally including a first accommodation and a second accommodation, the interlocking member being rotatably accommodated in the first accommodation and the detecting unit being accommodated in the second accommodation, wherein the throttle position detecting apparatus detects a throttle position on the basis of the rotation angle of the interlocking member detected by the detecting unit.Type: GrantFiled: February 26, 2004Date of Patent: March 14, 2006Assignee: Asahi Denso Co., LTD.Inventor: Michiyuki Suzuki
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Patent number: 6978654Abstract: A method of calibrating an AFM scanner head of an AFM machine to determine the arc functions of the scanner head are provided. A method of measuring the actual orientation of an AFM tip in conjunction with the arc functions provides a way to know and control the actual AFM tip orientation for performing better AFM scans, obtaining more accurate depth measurements into a deep feature, and obtaining better portrayals of specific portions of a deep feature in AFM images. AFM images focusing on portraying specific portions of a deep feature structure may be combined to form a composite image of a representative deep feature for a sample.Type: GrantFiled: July 29, 2004Date of Patent: December 27, 2005Assignee: Infineon Technologies AGInventor: David James Shuman
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Patent number: 6969142Abstract: A method of detecting a fault condition in a micro-electromechanical device includes the step of applying at least one current pulse to an actuator of the device such that the actuator is cyclically displaced at least once. The extent of displacement of the actuator is determined. The device is calibrated by determining a relationship between an operational parameter and said displacement. The device is tested by applying said parameter to the device, such that an error is detectable where said relationship is not achieved.Type: GrantFiled: September 27, 2004Date of Patent: November 29, 2005Assignee: Silverbrook Research, PTY LTDInventor: Kia Silverbrook
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Patent number: 6968846Abstract: A method of localizing a device, medical or otherwise, within a three dimensional environment, the method comprising: (a) transmitting time varying magnetic fields from at least three transmitters, (b) receiving the transmitted electromagnetic radiation as induced voltage signals from at least one receiver mounted on or within said device, and (c) a processing scheme for processing said received voltage signals in order to extract position and orientation localization information for said device, said processing scheme including correction for conducting materials in the vicinity by the use of information gathered from at least three distinct transmission frequencies for each of said transmitters.Type: GrantFiled: March 7, 2002Date of Patent: November 29, 2005Assignee: Stereotaxis, Inc.Inventor: Raju R. Viswanathan
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Patent number: 6959103Abstract: Provided is a displacement sensor which allows at least part of the data used from the time of obtaining an image until the time of computing the displacement can be readily verified. In a displacement sensor for automatically extracting a coordinate of a measuring point from an image obtained by using an imaging device according to a prescribed measuring point extraction algorithm, and computing a desired displacement from the automatically extracted measuring point coordinate, the sensor is further provided with the function to edit data used from the time of obtaining the image until the time of computing the displacement for use as display data for an image monitor.Type: GrantFiled: January 29, 2001Date of Patent: October 25, 2005Assignee: Omron CorporationInventors: Tatsuya Matsunaga, Masahiro Kawachi
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Patent number: 6952944Abstract: A sensor assembly is coupled with a control linkage and detects displacement of the control linkage and produces an output signal indicative of that displacement. The zero-point of the sensor assembly is not necessarily aligned with the zero-point of the control linkage when the two systems are coupled together. Instead, the control linkage is placed in its zero position and the sensor assembly determines its current positional reading at that time. This reading is stored as a zero-offset value which is then used, during normal operation of the sensor, to adjust the output signal of the sensor assembly when subsequent control linkage displacements are sensed.Type: GrantFiled: October 9, 2002Date of Patent: October 11, 2005Assignee: Honeywell International Inc.Inventor: Charles E. Ward
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Patent number: 6948254Abstract: The present invention relates to a method for calibrating a metrology stage in at least two dimensions using an artefact plate having marks forming a pattern, comprising the steps of: placing the artefact plate on the metrology stage in at least three positions, assuming the geometrical properties of the metrology stage and the artefact plate, and the positions of the artefact plate for each measurement, forming a model predicting the measurements of the artefact plate, measuring the marks by the metrology stage, and inverting said model to improve the assumptions on metrology stage and artefact plate.Type: GrantFiled: October 27, 2003Date of Patent: September 27, 2005Assignee: Micronic Laser Systems ABInventors: Lars Stiblert, Peter Ekberg
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Patent number: 6946968Abstract: A hydraulic stroke measuring system for accurately determining the cylinder rod position within a hydraulic cylinder. The hydraulic stroke measuring system includes a measurement shaft slidably positioned within a housing unit, a shaft bracket attachable between the measurement shaft and a cylinder shaft of a hydraulic cylinder, a plurality of contact members within the housing unit, a main contact attached to the measurement shaft for selectively engaging one or more of the contact members, and a plurality of display lights electrically connected to the contact members. The display lights illuminate when the main contact engages the corresponding contact members.Type: GrantFiled: September 24, 2003Date of Patent: September 20, 2005Inventor: Clifford C. Johnson
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Patent number: 6941792Abstract: A surface inspection system, comprising a calibration wafer where particles of known specifications are spread, a wafer transport unit having a transport robot, a surface inspection unit, and a calibration wafer accommodation unit for accommodating the calibration wafer.Type: GrantFiled: August 6, 2002Date of Patent: September 13, 2005Assignee: Kabushiki Kaisha TOPCONInventors: Hisashi Isozaki, Masanori Matsuda
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Patent number: 6925860Abstract: The height profile of a sample that includes at least one film on a substrate is leveled based on the measured thickness of the overlying film. An apparatus that levels the height profile includes a metrology tool that generates the height profile of a sample and a metrology tool that measures the thickness of one or more layers of a film stack on top of a substrate at two or more locations. The measured thickness is then used to level the height profile to reduce any tilt error before a step height calculation is made. For example, the slope of the thickness between two or more measurement points may be used to adjust the height profile. Once the height profile is leveled, step heights may be calculated with reduced tilting error.Type: GrantFiled: February 21, 2003Date of Patent: August 9, 2005Assignee: Nanometrics IncorporatedInventors: Jaime Poris, Claudio L. Rampoldi
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Patent number: 6912888Abstract: The invention has disclosed a handheld device for contactless distance measurement, having a housing (11) with a housing front (15) pointing in the measuring direction (17) and a housing back (16) oriented away from it, having a linear first measuring stop (21) that is embodied on the housing back (16) oriented away from the measuring direction (17) and that lies in a reference plane for the distance measurement, and having means disposed on the housing back (16) for producing a flat second measuring stop (22) that is aligned at right angles to the measuring direction and points away from the measuring direction (17).Type: GrantFiled: June 8, 2002Date of Patent: July 5, 2005Assignee: Robert Bosch GmbHInventors: Joerg Stierle, Peter Wolf
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Patent number: 6886387Abstract: A novel apparatus and method for calibrating the gap distance between adjacent scrubber brushes with the frictional force of the brushes against a wafer, is disclosed. The apparatus includes a support frame, at least one pair of load cells carried by the support frame, at least one test plate operably engaging the load cells, and at least one electronic indicator operably connected to the load cells, respectively, for indicating a force exerted on the load cells by the test plate. The method includes placing at least one test plate between the adjacent scrubber brushes, rotating the scrubber brushes against the test plate, determining the frictional force of each brush against the plate, and adjusting the gap distance between the brushes to obtain a desired frictional force for the scrubber cleaning of production wafers.Type: GrantFiled: April 28, 2004Date of Patent: May 3, 2005Assignee: Taiwan Semiconductor Manufacturing Co., LtdInventors: Ching-Long Lin, Yung-Hsiang Hu, Fu-Tao Ho
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Patent number: 6886264Abstract: A reference fixture (20) for a roundness measuring instrument performs acquisition of origin information of a roundness measuring instrument (1) including a workpiece rotary mechanism (3) on which a workpiece is set and a probe (14) provided with a stylus (14a) and also performs calibration of the probe (14). The reference fixture (20) includes a mount (21), a calibration master (22) provided on a top face of the mount (21) for calibrating the sensitivity of the probe (14), an origin ball (23) disposed above the calibration master (22) for providing the origin information of the roundness measuring instrument (1) by the stylus (14a) of the probe (14), and a holder (25) that holds the origin ball (23).Type: GrantFiled: April 7, 2004Date of Patent: May 3, 2005Assignee: Mitutoyo CorporationInventors: Yukihiro Sakata, Yoshiyuki Oomori, Hideki Shindo, Kazushi Noguchi
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Patent number: 6879921Abstract: The invention relates to a device for measuring distances having a distance measurer (1) and a stop element (3; 3?; 3?) enabling precise and mechanically stabile fixed installation on any form of top surfaces. Interchangeable stop elements (3; 3?; 3?) are disposed on a distance measurer (1), and embodied on the side thereof which is orientated towards the object to be measured in such a way that exact installation can take place on the surface of the object. Another use of the stop element is that it can inc;lude a receiving element for securing a distance measurer (1), whereby the distance measurer is pivotally mounted about at least one horizontal rotational axis (12) whilst the distance measurer (1) is in use. The stop element (3?) is formed in such a way that it is possible to adjust the device and subsequently measure different measuring points (C,D) without having to take geometric changes into account as a result of said adjustment.Type: GrantFiled: December 17, 2001Date of Patent: April 12, 2005Assignee: Leica Geosystems, A.G.Inventors: Gerhard Bögel, Thomas Böach
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Patent number: 6844720Abstract: A calibration apparatus for calibrating a linear variable differential transformer (LVDT) having an armature positioned in au LVDT armature orifice, and the armature able to move along an axis of movement. The calibration apparatus includes a heating mechanism with an internal chamber, a temperature measuring mechanism for measuring the temperature of the LVDT, a fixture mechanism with an internal chamber for at least partially accepting the LVDT and for securing the LVDT within the heating mechanism internal chamber, a moving mechanism for moving the armature, a position measurement mechanism for measuring the position of the armature, and an output voltage measurement mechanism. A method for calibrating an LVDT, including the steps of: powering the LVDT; heating the LVDT to a desired temperature; measuring the position of the armature with respect to the armature orifice; and measuring the output voltage of the LVDT.Type: GrantFiled: August 12, 2002Date of Patent: January 18, 2005Assignee: The United States of America as represented by the United States Department of EnergyInventor: Robert J. Pokrywka
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Patent number: 6836323Abstract: The present invention overcomes the disadvantages of the related art by providing a spatial reference system that includes at least one artifact assembly. The artifact assembly has a measuring bar assembly including an inner member with a proximate end and a distal end, an outer member with a proximate end and a distal end, and a compensating member with a proximate end and a distal end operatively disposed between said inner and said outer members. The distal end of the outer member is fixedly mounted to the distal end of the compensating member. The proximate end of the compensating member is fixedly mounted to the proximate end of the inner member.Type: GrantFiled: September 30, 2003Date of Patent: December 28, 2004Assignee: Metronom U.S., Inc.Inventor: Ingobert Schmadel
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Patent number: 6834528Abstract: The present invention describes a method to calibrate an angular measurement device using acceleration measurement device. The angular rate measurement device includes at least one angular measurement sensor, wherein the acceleration measurement device is able to distinguish the direction and strength of gravity. By performing the calibration method the scale factor(s) of the angular measurement device and the strength and direction of gravity can be obtained and/or corrected. An embodiment according to the method of the present invention describes optional use of a communication network to perform necessary evaluation and calculation steps at a remote device.Type: GrantFiled: November 12, 2002Date of Patent: December 28, 2004Assignee: Nokia CorporationInventors: Jani Kappi, Jussi Collin
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Publication number: 20040244464Abstract: A method of calibrating an analogue probe (10) having a stylus (12) with a workpiece-contacting tip (14) or a non-contact probe (26). A calibration artefact such as a calibration sphere (16) is mounted on a coordinate measuring machine (CMM) (18). The probe (10,26) is mounted on an arm (8) of the CMM and the probe is moved along a path whilst continually scanning the surface of the calibration artefact such that the probe is exercised throughout its working range. For an analogue probe (10) having a workpiece-contacting stylus (12), the path is such that the deflection of the stylus varies along the path For a non-contact probe (26) the path is such that there is variation of the radial distance between the path and the calibration artefact. The probe path may comprise a path parallel to a chord of the calibration sphere or a curved, e.g. a sinusoidal, path.Type: ApplicationFiled: April 20, 2004Publication date: December 9, 2004Inventors: Peter Hajdukiewicz, Geoffrey McFarland, David Sven Wallace
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Patent number: 6823754Abstract: A method of calibrating an equilibrium position of an actuator driven by an electric motor with the assistance of a compensating spring, wherein the actuator moves a mechanism and the mechanism opposes the movement with an elastic force, and wherein in the equilibrium position the compensating spring counterbalances the elastic force, includes the following steps: applying a large-amplitude, high-frequency alternating position signal to energize the electric motor, wherein the position signal is biased so that alternating extremes of the position signal straddle the equilibrium position, measuring an actual dynamically variable position of the actuator by means of a position sensor, and determining the equilibrium position as that position where the actuator settles.Type: GrantFiled: October 9, 2003Date of Patent: November 30, 2004Assignee: LuK Lamellen und Kupplungsbau Beteiligungs KGInventors: Bernhard Boll, Sarah Ann Barker
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Patent number: 6821432Abstract: A measuring apparatus for the determination of parameters of medical fluids with a measured region which including a measuring chamber device for receiving a disposable cassette with at least one measuring chamber through which the fluid to be measured is guided, and at least one measuring element for measuring a measured value whose value depends on the extent of the measuring chamber in a measuring direction and allows the determination of the parameter, or of a value being in a fixed relationship thereto, with a known extent of the measuring chamber. A distance sensor unit is provided which is arranged relative to the measuring chamber such that the measured distance changes relative to the extent of the measuring chamber. A method is also provided for the determination of parameters of medical fluids which can be carried out with the measuring apparatus, and for the calibration of the measuring apparatus.Type: GrantFiled: August 29, 2002Date of Patent: November 23, 2004Assignee: Fresenius Medical Care Deutschland GmbHInventor: Klaus Metzner
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Publication number: 20040217899Abstract: A moving body transmitter and receiver axis adjusting system includes a radar system mounted on a moving body and having a scanning area of 10° and a detection area of 8° in each of the left and right directions, and carrying out auto aiming to adjust the detection area in left and right directions inside the scanning area so that an object detection axis that is the center of the detection area coincides with a reference reflecting body placed on a vehicle center line. When a deviation between the object detection axis and the reference reflecting body exceeds 2°, adjustment cannot be completed only by auto aiming. In this case, the angle at which the radar system is mounted on the vehicle body is manually adjusted in the left and right directions so that the object detection axis overlaps the vehicle center line.Type: ApplicationFiled: December 10, 2003Publication date: November 4, 2004Inventor: Hayato Kikuchi
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Publication number: 20040200261Abstract: A method of calibrating an AFM scanner head of an AFM machine to determine the arc functions of the scanner head are provided. A method of measuring the actual orientation of an AFM tip in conjunction with the arc functions provides a way to know and control the actual AFM tip orientation for performing better AFM scans, obtaining more accurate depth measurements into a deep feature, and obtaining better portrayals of specific portions of a deep feature in AFM images. AFM images focusing on portraying specific portions of a deep feature structure may be combined to form a composite image of a representative deep feature for a sample.Type: ApplicationFiled: April 11, 2003Publication date: October 14, 2004Inventor: David James Shuman
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Patent number: 6802202Abstract: An accelerator pedal is positioned at a kickdown position. Then, an output value of a measurement device of an accelerator pedal position sensor is measured. Thereafter, the measured output value of the measurement device is stored in a correction output value storage of the accelerator pedal position sensor along with a corresponding correction value, which is used to correct the measured output value of the measurement device. A couple of fully opened position stop members is provided and is engaged with the accelerator pedal when the accelerator pedal is rotated to a fully opened position. Furthermore, a couple of fully closed position stop members is provided and is engaged with the accelerator pedal when the accelerator pedal is rotated to a fully closed position.Type: GrantFiled: July 22, 2002Date of Patent: October 12, 2004Assignee: Denso CorporationInventors: Yasunari Kato, Masahiro Makino
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Patent number: 6782730Abstract: A plurality of fixing holes are made in the upper and side faces of a hollow rectangular prism block body at least the top and four side faces of which are quartz glass or monocrystalline quartz rectangular plates. A plurality of reference members, each having a reference measuring face with which the fore end of a probe of a measuring apparatus is brought into contact, are inserted into the fixing holes, respectively, and secured in place. An inspection master block ensuring a high inspection accuracy by minimizing the effect of ambient temperature variation and a method for producing the same are thereby provided.Type: GrantFiled: January 28, 2002Date of Patent: August 31, 2004Assignee: Asanuma Giken Co., Ltd.Inventor: Susumu Asanuma
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Publication number: 20040163443Abstract: A method for determining rotational offset between first and second gravity measurement devices deployed on a downhole tool is disclosed. The method includes positioning the tool in a previously surveyed section of a borehole that provides a historical survey including at least three previously surveyed azimuthal reference points and utilizing the gravity measurement devices to determine local azimuths at three or more sites in the previously surveyed section of the borehole. The method further includes comparing local azimuths with the historical survey and determining a rotational offset between the measurement devices that gives a best fit between local azimuths and the historical survey. A system adapted to execute the disclosed method and a computer system including computer-readable logic configured to instruct a processor to execute the disclosed method are also provided.Type: ApplicationFiled: February 18, 2003Publication date: August 26, 2004Applicant: PathFinder Energy Services, Inc.Inventor: Graham McElhinney
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Patent number: 6772619Abstract: To provide a measuring apparatus of positions and postures of a machine for correcting positions and postures of an end effecter by means of an actuator, and an error correcting method for correcting errors thereof. At least three universal joint fixing members 2 are attached onto a base 1 that comprises a measuring reference; steel balls 3 are fixed to the respective universal joint fixing members 2 as universal joints; a steel ball 5 is fixed to a universal joint fixing member 9 as a universal joint; a universal joint fixing member 4 is attached to an object to be measured 7 that is supported by means of another member; and a measuring device 6 is attached to between the steel balls B3 and the steel ball 5. By using such a measuring apparatus, geometrical errors of a mechanism in a machine are estimated and corrected based on measured values on positions and postures of the end effecter.Type: GrantFiled: June 25, 2003Date of Patent: August 10, 2004Assignee: Okuma CorporationInventors: Masayuki Nashiki, Tetsuya Matsushita, Shigeharu Watanabe, Masao Nakagawa
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Patent number: 6772078Abstract: A length measuring apparatus is provided that combines upper data with lower data and then outputs the composite data. The apparatus monitors taking down or up a digit of upper data or lower data and synchronization of lower data, thus preventing an occurrence of reading error. When an A/D area showing an area of lower data matches with an upper area quadrant showing an area of upper data (R2, R3), the upper count value outputting the upper data is output without any change. When the quadrant (0, 1, 2, 3) of the A/D area does not match with the quadrant (0, 1, 2, 3) of upper area because of an erroneous timing of a digit-taking-up of upper data (R1, R4), +1 or −1 is added to the upper count value. Thus, the continuity of a measured value can be obtained when the scale is being moved.Type: GrantFiled: October 9, 2002Date of Patent: August 3, 2004Assignee: Futaba CorporationInventor: Takahisa Uehira
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Publication number: 20040135588Abstract: A non intrusive method and system for the dynamic measurement of a distance, or the variations over time thereof, constituting the thickness, or the variations thereof, of a thin compressible dielectric material located between one or several other closely spaced solid dielectric layers of constant thickness and a conductive or semi-conductive surface. This is achieved by positioning a capacitive sensor on the external layer of the dielectric material, the sensor being composed of two parallel plates electrically insulated from one another, feeding the first plate with a high frequency signal, measuring the voltage and current value over time generated by the high frequency signal between the plate of the sensor which is closest to the surface of the outer layer of dielectric material, and deducting the above distance or variations thereof.Type: ApplicationFiled: February 11, 2004Publication date: July 15, 2004Inventors: Marc Bissonnette, Jean Pronovost, Marius Cloutier
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Publication number: 20040129055Abstract: A measuring apparatus 2 comprises: a base 10 fixed onto the rotary table 83; a rotational angular position detector 35 having first and second members 36 and 37 mounted in relatively rotatable fashion about a preset rotational center axis, one member being provided with a scale and the other with a reading device, wherein the first member 36 is mounted fixedly on the base 10; a restraining mechanism 55 which engages with the second member 37 of the rotational angular position detector 35 and thereby restrains rotation of the second member 37, while allowing the base 10 and the rotational angular position detector 35 to move in vertical direction; and a ring-shaped detection member 49 mounted perpendicularly on the base 10 by orienting center axis at right angles to the upper surface of the rotary table 83 and accommodating therein the rotational angular position detector 35.Type: ApplicationFiled: December 19, 2003Publication date: July 8, 2004Applicants: MORI SEIKI CO., LTD, INTELLIGENT MANUFACTURING SYSTEMS INTERNATIONALInventor: Toru Yagami
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Patent number: 6748790Abstract: A reference device having a sphere positioned within a measurement space by an object three-dimensional measuring machine having a spherical probe contacting the spherical probe with six or more measurement points uniformly distributed on the spherical surface of the sphere to measure central coordinates of the sphere of the reference device by the object three-dimensional measuring machine and calibrating the object three-dimensional measuring machine based on the central coordinates obtained.Type: GrantFiled: July 29, 2002Date of Patent: June 15, 2004Assignee: Mitutoyo CorporationInventor: Makoto Abbe
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Publication number: 20040055360Abstract: A slider assembly for use in a linear or rotary position sensor having a board that includes at least one ink strip. The slider assembly includes a housing for attachment to an object whose position is being detected. The housing includes standoffs for contacting portions of the board which are adjacent the ink strip. An arm extends the housing, wherein the arm includes finger elements which contact the ink strip. The assembly further includes a spring for biasing the standoffs against the board to then bias the finger elements against the ink strip so as to provide a predetermined contact pressure.Type: ApplicationFiled: September 20, 2002Publication date: March 25, 2004Inventors: Russell Miles Modien, Kenneth Peter Nydam
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Publication number: 20040050139Abstract: A present invention is for a device and method for measuring and calibrating the rotary motion of a rotatable machine member, such as a pivotable swivel member (2b) of a spindle (2) of a five-axis machine tool (1). The device includes an arm (110) mounted to the spindle, a housing (120) mounted to the arm, an optical encoder mounted internal to the arm and positioned therein to measure rotation about an axis extending lengthwise along the housing, which such axis is parallel to the axis about which the swivel member rotates. The device also includes a rotary table (170) mounted to the housing opposite the arm, the rotary table comprising a stator (171) fixedly mounted to the housing and a rotor (172) clampedly affixed to a shaft passing through the housing. The shaft is coupled to an input shaft of the encoder such that rotary movement of the rotor can be measured by the encoder. An electronic level (190) fixedly secured to the rotor, such as by a bracket (180).Type: ApplicationFiled: November 3, 2003Publication date: March 18, 2004Inventors: Paul Comer, David Purtell, Satish Shivaswamy