Length, Width, Or Height Patents (Class 73/1.81)
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Publication number: 20090100900Abstract: An optical method and system for generating calibration data are provided. The calibration data is for use in calibrating a part inspection system. The method includes supporting a calibration device having a central axis and a plurality of regions which are rotationally symmetric about the axis. The method further includes scanning the device with an array of spaced planes of radiation so that the device occludes each of the planes of radiation at spaced locations along the central axis to create a corresponding array of unobstructed planar portions of the planes of radiation. Each of the unobstructed planar portions contains an amount of radiation which is representative of a respective geometric dimension of the device. The method still further includes measuring the amount of radiation present in each of the unobstructed planar portions to obtain measurement signals. The method includes processing the measurement signals to obtain calibration data for calibrating the system.Type: ApplicationFiled: October 23, 2007Publication date: April 23, 2009Inventor: John D. Spalding
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Publication number: 20090100901Abstract: A calibration device for use in an optical, part measuring system is provided. The device has a central axis and a plurality of regions which are rotationally symmetric about the axis. The device includes a series of step-shaped portions defining a multi-step region having a plurality of step edges. A profile of the multi-step region contains information for calibrating the system. The device further includes a plurality of cylindrically-shaped portions spaced apart along the axis and defining constant diameter regions containing information for calibrating the system. The device still further includes a frustum-shaped portion defining a pair of spaced, slope edge regions and a sloped region having boundaries marked by the pair of slope edge regions. The frustum-shaped portion has first and second diameters at its boundaries which define a range of diameters of parts capable of being measured in the system.Type: ApplicationFiled: October 23, 2007Publication date: April 23, 2009Inventor: John D. Spalding
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Publication number: 20090056412Abstract: A method for the calibration of measuring equipment, and measuring equipment. The measuring equipment comprises at least one first sensor, at least one second sensor and at least one reference piece. When the measuring equipment is calibrated, a moving web is supported against the reference piece and the reference piece with the moving web supported thereto is moved to different distances from the first sensor and the second sensor. Further, a distance between the first sensor and the moving web and a distance between the second sensor and the reference piece is measured at least for two different distances, and the first sensor and the second sensor are calibrated to be uniform in relation to the movement of the reference piece.Type: ApplicationFiled: March 7, 2007Publication date: March 5, 2009Applicant: METSO AUTOMATION OYInventors: Jussi Graeffe, Markku Mantyla, Tomi Tynkkynen
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Patent number: 7474950Abstract: A method is proposed for determining a clutch application point in a transmission of a vehicle having a spring-actuated clutch system in which the clutch application point is adapted according to at least one adequate regulated quantity of the clutch system.Type: GrantFiled: December 17, 2002Date of Patent: January 6, 2009Assignee: ZF Friedrichshafen AGInventors: Andreas Schwenger, Otto Ebner, Klaus Schweiger, Matthias Winkel, Christoph Rüchardt, Marcus Gansohr, Thomas Knoblauch
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Patent number: 7464579Abstract: A calibration block for use in calibrating a thickness gauge having a diameter d, wherein the block has a measurement face and a recess extending inwardly of the block from a face opposite the measurement face, the recess having a maximum transverse dimension at the opposite face which is not less than 3d, and in that the bottom of the recess is inclined relative to the measurement face in all directions from a central region of the bottom of the recess, the measurement face comprising a reference feature, the location of which corresponds to a specific point on the bottom of the recess.Type: GrantFiled: April 25, 2007Date of Patent: December 16, 2008Assignee: Rolls-Royce plcInventor: Nicholas Barrington Orchard
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Patent number: 7448250Abstract: The invention relates to a calibration standard, especially for the calibration of devices for the non-destructive measurement of the thickness of thin layers, with a carrier layer (12) consisting of a basic material and a standard (17) applied on the carrier layer (12), said standard having the thickness of the layer to be measured at which the device is to be calibrated, with the carrier layer (12) comprising a plane-parallel measuring surface (16) to its bearing surface (14), that the standard (17) comprises a bearing surface (18) plane-parallel with its measuring surface (19) for bearing on the measuring surface (16) of the carrier layer (12), and that the standard (17) is permanently provided on the carrier layer (12) by means of plating by rubbing.Type: GrantFiled: June 16, 2006Date of Patent: November 11, 2008Assignee: Immobiliengesellschaft Helmut Fischer GmbH & Co. KGInventor: Helmut Fischer
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Publication number: 20080243415Abstract: Systems and methods are provided that comprise calibration techniques and associated systems that identify the two-dimensional position, or other alignment or positioning, of sample wells or other calibration objects located in a sample well plate, or other surface or area of interest. In some embodiments, calibration of the plate and/or positioning and/or alignment with respect to detection optics can be performed in multiple stages for two or more dimensions.Type: ApplicationFiled: January 28, 2008Publication date: October 2, 2008Applicant: Applera CorporationInventors: Alan R. Stanford, David C. Woo, John David Morgenthaler
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Publication number: 20080156066Abstract: The calibrating gauge for calibrating a Vernier calliper has at least one calibrating face for calibrating a measuring surface for internal measurement, at least one calibrating face for calibrating a measuring surface for external measurement (3) and at least one calibrating face for calibrating a measuring surface for depth measurement (4), the calibrating gauge (1) being in the shape of an at least partly hollow cylinder, on the generated surface (6) of which is provided the calibrating face for calibrating the measuring surface for the external measurement and on the inner surface (10) of which is provided the calibrating face for calibrating the measuring surface for the internal measurement, and the calibrating face for calibrating the measuring surface for the depth measurement being provided on at least one of the end faces (5) of the cylinder.Type: ApplicationFiled: March 12, 2008Publication date: July 3, 2008Inventor: Johannes Jeromin
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Publication number: 20080105026Abstract: The present invention relates to a method for calibrating a grating of an encoder measurement system between two adjacent calibrated locations, the method includes moving one of a sensor object including an encoder-type sensor and a grating along the other one of the sensor object and the grating with a speed, wherein the speed is selected such that disturbances in the grating substantially extending over a distance smaller than a distance between the two calibrated locations can not or only partly be followed by the one of the sensor object and the grating, and measuring during the moving the position of the sensor object with respect to the grating at a plurality of locations between the two calibrated locations.Type: ApplicationFiled: November 8, 2006Publication date: May 8, 2008Applicant: ASML Netherlands B.V.Inventors: Erik Roelof Loopstra, Emiel Jozef Melanie Eussen, Engelbertus Antonius Fransiscus Van Der Pasch, Onno Bram Loopstra
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Patent number: 7359817Abstract: A re-calibration method and device for a three-dimensional visual sensor of a robot system, whereby the work load required for re-calibration is mitigated. While the visual sensor is normal, the visual sensor and a measurement target are arranged in one or more relative positional relations by a robot, and the target is measured to acquire position/orientation information of a dot pattern etc. by using calibration parameters then held. During re-calibration, each relative positional relation is approximately reproduced, and the target is again measured to acquire feature amount information or position/orientation of the dot pattern etc. on the image. Based on the feature amount data and the position information, the parameters relating to calibration of the visual sensor are updated. At least one of the visual sensor and the target, which are brought into the relative positional relation, is mounted on the robot arm.Type: GrantFiled: July 28, 2005Date of Patent: April 15, 2008Assignee: Fanuc LtdInventors: Kazunori Ban, Ichiro Kanno
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Publication number: 20080066332Abstract: Method of detecting a potentially void inhaler can valve (30), which valve (30) is attached to a can (10) by a ferrule crimp (80), comprising the steps: placing the can (10) in a can jig (220) that is arranged to retain the can (10) at a predetermined measurement height with respect to a diameter measuring means (230), measuring the diameter of the ferrule crimp (80) at the predetermined height, and comparing the measured crimp diameter with a predefined interval of acceptance, and if the measured diameter is outside a predefined interval classifying the inhaler can valve (30) as potentially void. There is also provided a crimp diameter measuring device (200) comprising: a base (210), a diameter measuring means (230) supported by the base (210), and a can jig (220) supported by the base (210), the can jig (220) being arranged to retain a can (10) placed therein at a predetermined measurement height with respect to a diameter measuring means (230).Type: ApplicationFiled: June 1, 2005Publication date: March 20, 2008Applicant: AstraZeneca ABInventors: Stephen Metcalf, Ian Fletcher
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Publication number: 20080016711Abstract: A stylus includes a stem with a first end and a second end, wherein the stem includes a contact element at the first end and can be arranged with the second end in a holder, and wherein the stylus includes an RFID chip. Also, a measurement device including the stylus and a method for taking account of data characterizing the stylus in a measurement device is provided.Type: ApplicationFiled: July 13, 2007Publication date: January 24, 2008Applicant: Saphirwerk Industrieprodukte AGInventor: Jean Baebler
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Publication number: 20070277600Abstract: Method and apparatus of easily controlling the Z-position of the probe used in a microprobe analyzer. The apparatus has: (A) a holder, (B) a reference body having a reference surface that is at the same height as a surface of a sample, the reference body being placed on or in the holder, (C) a probe-positioning device for bringing the probe into contact with the reference surface, (D) a controller for controlling motion of the probe-positioning device in the Z-direction, (E) position-measuring apparatus for measuring the Z-coordinate of the probe at which it is in contact with the reference surface, (F) a memory for storing a positional coordinate outputted by the position-measuring apparatus, and (G) probe contact detection apparatus for detecting that the probe is in contact with the reference surface.Type: ApplicationFiled: May 4, 2007Publication date: December 6, 2007Applicant: JEOL LTD.Inventors: Takeshi Nokuo, Jun Toyaba
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Publication number: 20070271995Abstract: A calibration block for use in calibrating a thickness gauge having a diameter d, wherein the block has a measurement face and a recess extending inwardly of the block from a face opposite the measurement face, the recess having a maximum transverse dimension at the opposite face which is not less than 3 d, and in that the bottom of the recess is inclined relative to the measurement face in all directions from a central region of the bottom of the recess, the measurement face comprising a reference feature, the location of which corresponds to a specific point on the bottom of the recess.Type: ApplicationFiled: April 25, 2007Publication date: November 29, 2007Applicant: ROLLS-ROYCE PLCInventor: Nicholas B. Orchard
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Patent number: 7302355Abstract: A method of calibrating a circular portion of an object, such as to determine the center point of the object, is provided. The method includes determining spatial coordinates of at least two points on a circumferential edge of the circular portion of the object, and calculating the center point of the circular portion using the spatial coordinates of the two points and a geometric parameter representative of the diameter of the circular portion. A calibration device and system are also provided for use with a computer tracking system in order to calibrate such an object having a circular portion.Type: GrantFiled: May 17, 2006Date of Patent: November 27, 2007Assignee: Orthosoft Inc.Inventors: Herbert André Jansen, Pierre Couture
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Patent number: 7124621Abstract: An acoustic flowmeter calibration method and sampling system address a variation in acoustic transducer delay time with increasing temperature. In one aspect, calibration of the path length between the sending and receiving transducers and calibration of the transducer delay time over a wide temperature range are optimized. In another aspect, the flowmeter output is temperature compensated based on the exhaust flowmeter gas temperature. These two aspects may be embodied in an ultrasonic flowmeter for exhaust gas measurement individually or in combination in accordance with the invention.Type: GrantFiled: July 21, 2004Date of Patent: October 24, 2006Assignee: Horiba Instruments, Inc.Inventor: Timothy A. Nevius
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Patent number: 7124625Abstract: A glide-height disk-tester operates with the test disk rotating at a predetermined constant rotational speed and uses a glide head with an electrically-resistive heater and a thermally-responsive protrusion pad located on its trailing end. The linear velocity of the disk relative to the slider maintains the slider at its nominal fly height, which is typically higher than any expected asperity. With no current applied to the heater, the protrusion pad is generally flush with the air-bearing surface of the slider. Increasing levels of current are applied to the heater, which causes movement of the protrusion pad toward the disk surface. When the pad contacts an asperity, the current level applied at the instant of asperity contact is recorded. The applied current level can be correlated to the glide height from a previous calibration process using a calibration disk with known calibration bump heights.Type: GrantFiled: May 17, 2005Date of Patent: October 24, 2006Assignee: Hitachi Global Storage Technologies Netherlands B.V.Inventors: Masayuki Kurita, Remmelt Pit, Shozo Saegusa, Toshiya Shiramatsu, Mike Suk, Hideaki Tanaka
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Patent number: 7102528Abstract: A device for establishing and/or monitoring a predetermined fill level in a container is provided, to indicate the fill level in a container and exhibiting a best possible, optimum fit for an application, which device includes: a mechanical oscillatory structure placed at the height of the predetermined fill level, which structure exhibits a membrane and two mutually separated oscillation bars formed thereon, an electromechanical transducer, which in operation excites the oscillatory structure to oscillate with oscillations, such that the oscillation bars execute oscillations perpendicular to their longitudinal axis, a receiver- and evaluation-unit, which uses the oscillations to establish and/or monitor whether the predetermined fill level has been reached, or not, in which the oscillation bars exhibit a shape in which a mass moment of inertia of a liquid quantity, which the oscillation bars move with them in the immersed state in the liquid, is as large as possible and greater than 0.Type: GrantFiled: March 27, 2002Date of Patent: September 5, 2006Assignee: Endress + Hauser GmbH + Co. KGInventor: Helmut Pfeiffer
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Patent number: 7055367Abstract: A method of calibrating an analogue probe (10) having a stylus (12) with a workpiece-contacting tip (14) or a non-contact probe (26). A calibration artefact such as a calibration sphere (16) is mounted on a coordinate measuring machine (CMM) (18). The probe (10,26) is mounted on an arm (8) of the CMM and the probe is moved along a path whilst continually scanning the surface of the calibration artefact such that the probe is exercised throughout its working range. For an analogue probe (10) having a workpiece-contacting stylus (12), the path is such that the deflection of the stylus varies along the path. For a non-contact probe (26) the path is such that there is variation of the radial distance between the path and the calibration artefact. The probe path may comprise a path parallel to a chord of the calibration sphere or a curved, e.g. a sinusoidal, path.Type: GrantFiled: November 1, 2002Date of Patent: June 6, 2006Assignee: Renishaw PLCInventors: Peter Hajdukiewicz, Geoffrey McFarland, David Sven Wallace
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Patent number: 7043961Abstract: A standard medical or surgical tool's axis is located by attaching to the tool a plurality of a location indicating elements or markers having a known geometric or spatial relationship, and placing the tool in a tool calibrator that supports the tool in a manner that allows tools of different diameters to be rotated while maintaining the tool's axis in a fixed or stable orientation. As the tool is rotated, a marker locating system tracks the positions of the markers on the tool and then extrapolates or determines the axis of rotation with respect to the markers clamped to the tool. The tool calibrator has a second set of position indicating elements or markers with fixed geometric or spatial relationship with one another and with respect to a stop, against which the end or tip of the tool is placed.Type: GrantFiled: January 30, 2002Date of Patent: May 16, 2006Assignee: Z-Kat, Inc.Inventors: Rajesh Pandey, Louis Arata, Brandon Larocque
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Patent number: 6955074Abstract: A method according to one embodiment of the invention may be performed using a calibration plate having at least one alignment marker and at least one height profile. First, the calibration plate is positioned using an alignment sensor. Then the height profile is measured by a height sensor. Then the calibration plate is rotated by substantially 180 degrees and the two operations are repeated. This procedure results in two measured height profiles, which are compared in order to find a best fit. The amount of shift performed to find the best fit is used to determine a distance between the alignment marker and the X,Y position of the measurement point of the height sensor.Type: GrantFiled: December 29, 2003Date of Patent: October 18, 2005Assignee: ASML Netherlands, B.V.Inventors: Leon Martin Levasier, Anastasius Jacobus Anicetus Bruinsma, Jacob Fredrik Friso Klinkhamer, Gerrit Johannes Nijmeijer, Petra Albertina Margaretha Dekkers-Rog
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Patent number: 6909983Abstract: A method of calibrating a probe mounted on a machine in which the probe has a probe calibration matrix which relates the probe outputs in three orthogonal axes to the machine's X, Y and Z coordinate system. A datum ball mounted on the machine is bi-directionally scanned by the probe in one or more planes. For each plane, the mean direction of two approximate probe vectors in the plane is rotated about an axis orthogonal to that plane until the apparent material condition from the scan in each direction is the same. This process may be iterative. The mean values of the directions of the probe vectors for each plane are rotated, thus forming a corrected probe calibration matrix. The datum ball is preferably bi-directionally scanned in three orthogonal planes.Type: GrantFiled: March 13, 2002Date of Patent: June 21, 2005Assignee: Renishaw PLCInventor: Alexander Tennant Sutherland
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Patent number: 6823713Abstract: A method of calibrating an AFM scanner head of an AFM machine to determine the arc functions of the scanner head are provided. A method of measuring the actual orientation of an AFM tip in conjunction with the arc functions provides a way to know and control the actual AFM tip orientation for performing better AFM scans, obtaining more accurate depth measurements into a deep feature, and obtaining better portrayals of specific portions of a deep feature in AFM images. AFM images focusing on portraying specific portions of a deep feature structure may be combined to form a composite image of a representative deep feature for a sample.Type: GrantFiled: April 11, 2003Date of Patent: November 30, 2004Assignee: Infineon Technologies AGInventor: David James Shuman
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Patent number: 6776023Abstract: The invention concerns a method for calibrating a tool, of the touch probe type, used on a contact type measuring machine, in order to take account of its dynamic geometrical features. Said method enables, in particular, the uncertainties associated with the bending deformation of said touch probe, to be precisely determined.Type: GrantFiled: March 29, 2002Date of Patent: August 17, 2004Assignee: Saphirwerk Industrieprodukte AGInventor: Daniel Dubois
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Patent number: 6772620Abstract: A metrology process, in accordance with the present invention, measures the dishing of a first feature made of a first material by determining the relative height of the first feature with respect to a second feature, where the first and second features have different dishing rates. The relative height of the first feature with respect to the second feature may be determined by measuring a first relative height of the first feature with respect to a reference location, measuring a second relative height of the second feature with respect to a reference location, and calculating the difference between the first and second relative heights. Alternatively, other methods may be used. The relative height is then correlated with calibration data to determine the amount of dishing of the first feature. The calibration data is generated by first providing a sample substrate with features approximately the same as the substrate to be measured, e.g.Type: GrantFiled: December 9, 2002Date of Patent: August 10, 2004Assignee: Nanometrics IncorporatedInventor: Jaime Poris
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Patent number: 6772078Abstract: A length measuring apparatus is provided that combines upper data with lower data and then outputs the composite data. The apparatus monitors taking down or up a digit of upper data or lower data and synchronization of lower data, thus preventing an occurrence of reading error. When an A/D area showing an area of lower data matches with an upper area quadrant showing an area of upper data (R2, R3), the upper count value outputting the upper data is output without any change. When the quadrant (0, 1, 2, 3) of the A/D area does not match with the quadrant (0, 1, 2, 3) of upper area because of an erroneous timing of a digit-taking-up of upper data (R1, R4), +1 or −1 is added to the upper count value. Thus, the continuity of a measured value can be obtained when the scale is being moved.Type: GrantFiled: October 9, 2002Date of Patent: August 3, 2004Assignee: Futaba CorporationInventor: Takahisa Uehira
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Publication number: 20040118180Abstract: The invention provides a system and network for determining the average engraved volume of an area such as the average volume of engraved cells on a gravure cylinder or plate for a printing press. In one embodiment the method comprises steps of: positioning a surface volume determining means (10) in the form of an eddy current sensor (12) in the proximity of an engraved surface (18); and inducing eddy currents in the engraved surface; and, measuring the impedance (14) of the inductor of the eddy current sensor to determine a value indicative of the average engraved volume of the engraved cells.Type: ApplicationFiled: November 14, 2003Publication date: June 24, 2004Inventor: Michael Keating
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Patent number: 6742380Abstract: A method and apparatus for measuring the distance between first and second proximately disposed electrically conductive surfaces is provided in which the force exerted between the first and second surfaces is measured to obtain an exerted force value. A separation distance between the first and second surfaces is determined as a function of the exerted force value.Type: GrantFiled: July 27, 2001Date of Patent: June 1, 2004Assignee: Seagate Technology LLCInventor: Matthew M. Johnston
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Patent number: 6739591Abstract: An ultrasonic wave receiver receives an ultrasonic wave outputted by an ultrasonic wave oscillator, and outputs a receiving signal. A level determining unit makes a determination as to the presence or absence of a sheet of paper based upon a level of the receiving signal. A CPU is informed of this determining signal through a processing unit. An oscillation peak detector detects a peak value of a transmission signal used for controlling an ultrasonic wave transmitter, which is transmitted from an oscillation amplifier. A receiving peak detector detects a peak value of the receiving signal received by the ultrasonic transmitter. The phase difference of the two signals is detected based upon the difference in count values of a loop counter between the timing in which the peak value of the transmission signal is detected and the timing in which the peak value of the receiving signal is detected.Type: GrantFiled: June 17, 2002Date of Patent: May 25, 2004Assignee: Omron CorporationInventors: Hideki Chujo, Keitaro Taniguchi, Tomohiro Inoue
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Patent number: 6715342Abstract: The present invention relates to an apparatus for pneumatic length measurement comprising a pre-nozzle and a measurement nozzle through which the medium used for the measurement is directed onto an impact plate, a first pressure sensor arranged in front of the pre-nozzle, a second pressure sensor arranged between pre-nozzle and measurement nozzle, means for the determination of the distance of the impact plate from the measurement nozzle from the change of the pressure between pre-nozzle and measurement nozzle taking account of the pressure measured by the first pressure sensor and means for the calibration of the apparatus in a given measurement range, wherein, in order to ease the calibration, the calibration means operate with a calibration function which is constructed on the assumption of constancy of the outflow number of the pre-nozzle and of the outflow number of the measurement nozzle.Type: GrantFiled: November 30, 1999Date of Patent: April 6, 2004Assignee: Stotz Feinmesstechnik GmbHInventor: Milan Stamenkovic
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Patent number: 6698753Abstract: An unintentionally overlapped condition in a paper sheet being transported is detected by making ultrasonic waves incident on its path and detecting a phase difference between the received ultrasonic waves and a predetermined standard phase. For detecting an overlap on the basis of this phase difference, a specified data item on the detected overlap such as a cumulative number of times an overlap has been detected is generated and one of a plurality of preliminarily defined levels corresponding to this specified data item is selected. The selected level is outputted. If the overlap is detected over an entire detection range of the paper sheet from its front edge to the back edge, however, it is concluded that there is no possibility of an unintentional overlap.Type: GrantFiled: November 7, 2002Date of Patent: March 2, 2004Assignee: Omron CorporationInventors: Hideki Chujo, Tomohiro Inoue
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Patent number: 6694797Abstract: Calibration and resolution-determining apparatus for dial indicators is disclosed. In this apparatus, a dial indicator to be tested is rigidly mounted in an upper frame member, with a plunger of the dial indicator bearing against a movable gage block having upper and lower parallel surfaces. A reference indicator of a higher accuracy than the dial indicator under test is mounted to the frame below the gage block, with a plunger thereof bearing against the lower surface thereof. The gage block is mounted to a distortable structure connected to the frame by living hinges so that distortion of the structure causes the gage block to move, causing corresponding movement of the respective plungers of the dial indicator and reference indicator. A readout of the reference indicator may then be compared to a reading on the dial indicator, allowing determination of accuracy and resolution of the instrument under test.Type: GrantFiled: May 10, 2001Date of Patent: February 24, 2004Inventor: Ilmar Luik
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Patent number: 6646736Abstract: Equipment for detecting impurities in transparent material comprising a light source to illuminate the material, a camera to detect light transmitted through the material and signal-processing apparatus for processing and analysing signals from the camera representing the light transmission through the material. This type of equipment is calibrated by dark areas being displayed on a film of transparent material (22, 24, 26) and the actual sizes (30) of the areas being determined. The sizes of the dark areas are then determined using the detecting equipment (34) and in this way determined sizes are compared with actual sizes (36) for calibration of the detecting equipment (38).Type: GrantFiled: October 12, 2001Date of Patent: November 11, 2003Assignee: Semyre Photonic Systems ABInventor: Göran Åsemyr
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Patent number: 6640607Abstract: A reference measuring machine previously calibrated and an object measuring machine to be calibrated are positioned in such a manner that a measurement space by the reference measuring machine is superimposed on a measurement space by the object measuring machine. First measurement values by the reference measuring machine and second measurement values by the object measuring machine are acquired each on plural points in the measurement spaces respectively by the reference measuring machine and the object measuring machine. The object measuring machine can be calibrated based on the first- and second measurement values.Type: GrantFiled: February 27, 2002Date of Patent: November 4, 2003Assignee: Mitutoyo CorporationInventor: Makoto Abbe
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Patent number: 6618505Abstract: A method and apparatus for determining a shape of a shim that can be inserted between a first body, such as a strut torque box, and a second body, such as a torque box skin, is disclosed. The strut torque box is marked with a plurality of retro-reflective markers at the desired locations needing to be shimmed. The positions of the markers are measured using digital photogrammetry equipment yielding a plurality of measured points. The measured points define a surface of the first body. The locations of the measured points are transformed relative to a surface of the second body to yield a profile of the shape of the shim. The present method and apparatus have the advantage of considerably reducing the labor required for manual shim measurement using gauges by allowing multiple shim points to be measured simultaneously and without the pre-assembly of the strut torque box and torque box skin.Type: GrantFiled: March 6, 2001Date of Patent: September 9, 2003Assignee: The Boeing CompanyInventors: Glen P. Cork, Ronald G. Lane
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Patent number: 6588106Abstract: The invention concerns a method for the installation of pretensioned roller bearings (2), in particular angular ball bearings, for example, in wheel carriers of automobiles, airplanes, and the like. The invention is characterized in that the installation apparatus, with a measurement probe (5), lies against a stop, a shoulder, or the like, in the axial area of the bearing race of one roller bearing, on the shaft side, and that upon tightening the shaft nut (3) against the bearing race of the other roller bearing, on the shaft side, its axial shift with respect to the stop is determined, wherein when the shaft nut is tightened, a torque wrench is used to determine the applied torque, which permits it to differentiate between the actual tensioning process of the roller bearing (2) and the previous process to bring the shaft nut (3) to the stop. The invention also concerns an installation apparatus to implement the method.Type: GrantFiled: June 26, 2001Date of Patent: July 8, 2003Assignee: Pankl R&D GmbHInventors: Gerold Pankl, Jochen Domschitz
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Publication number: 20030110831Abstract: The present invention relates to an apparatus for pneumatic length measurement comprising a pre-nozzle and a measurement nozzle through which the medium used for the measurement is directed onto an impact plate, a first pressure sensor arranged in front of the pre-nozzle, a second pressure sensor arranged between pre-nozzle and measurement nozzle, means for the determination of the distance of the impact plate from the measurement nozzle from the change of the pressure between pre-nozzle and measurement nozzle taking account of the pressure measured by the first pressure sensor and means for the calibration of the apparatus in a given measurement range, wherein, in order to ease the calibration, the calibration means operate with a calibration function which is constructed on the assumption of constancy of the outflow number of the pre-nozzle and of the outflow number of the measurement nozzle.Type: ApplicationFiled: November 30, 1999Publication date: June 19, 2003Inventor: STAMENKOVIC MILAN
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Patent number: 6568290Abstract: A metrology process, in accordance with the present invention, measures the dishing of a first feature made of a first material by determining the relative height of the first feature with respect to a second feature, where the first and second features have different dishing rates. The relative height of the first feature with respect to the second feature may be determined by measuring a first relative height of the first feature with respect to a reference location, measuring a second relative height of the second feature with respect to a reference location, and calculating the difference between the first and second relative heights. Alternatively, other methods may be used. The relative height is then correlated with calibration data to determine the amount of dishing of the first feature. The calibration data is generated by first providing a sample substrate with features approximately the same as the substrate to be measured, e.g.Type: GrantFiled: August 10, 2000Date of Patent: May 27, 2003Assignee: Nanometrics IncorporatedInventor: Jaime Poris
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Patent number: 6542839Abstract: An apparatus and a method for calibrating the position of a cassette indexer in a semiconductor process machine are described. The apparatus is constructed by a base plate, a top plate and at least two support members rigidly attaching the top plate to the base plate in a parallel relationship. On the bottom side of the top plate, is mounted at least two spaced-apart rows of distance sensors each having at least five sensors capable of sensing a distance in the cavity of the calibration apparatus. After a wafer blade is extended into the cavity of the apparatus, a sensor in the front row and a sensor in the back row can be used to sense a front-to-back tilt of the wafer blade, while two adjacent sensors in the same row can be used to sense a side-to-side tilt of the wafer blade.Type: GrantFiled: September 29, 2000Date of Patent: April 1, 2003Assignee: Taiwan Semiconductor Manufacturing Co., LtdInventors: Hsueh-Chin Lu, Jeng-Ding Tseng, Chi-Wei Chang
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Patent number: 6535834Abstract: A horizontal reference marker and method of using the horizontal reference marker to determine the exact position on the ground of a ground slot for a standard freight container. At least two horizontal reference markers are fixed to the ground or any substantially horizontal stacking surface and arranged in a known position relative to a ground slot on the ground. The horizontal reference markers are shaped suitable for detection by laser means mounted on container cranes. The advantage is precise and parallel positioning of a container placed on the ground, which ensures that container stacks have sufficient clearance between them and simplifies container handling.Type: GrantFiled: July 10, 2001Date of Patent: March 18, 2003Assignee: Abb ABInventors: Uno Bryfors, Christer Johansson
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Publication number: 20030015018Abstract: A bump disk for accurate glide calibration has a new type of glass laser melt bumps that give the same signal amplitudes as conventional AlMg laser melt bumps for the same bump height. The present invention provides a solution to switch the calibration bumps from AlMg to glass, and can be used in disk manufacturing lines to save 30% on the cost of hard disks from inaccurate glide certification processes. The solution is to trim or burnish away loose and/or high particles on production disks before the glide tests. This additional processing step causes the responses from the glass bumps to become very similar to those of the AlMg bumps, thereby enabling glass and AlMg disks to become materially compatible.Type: ApplicationFiled: July 23, 2001Publication date: January 23, 2003Applicant: International Business Machines CorporationInventors: James Hammond Brannon, Shanlin Duan, Yu Lo
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Patent number: 6497134Abstract: A system for calibrating an error between the location of a feature of an object as determined by indirect calculation compared to as determined by physical measurement in order to be able to use this determined error to correct the location of the feature as determined by calculation in actual use in the field. This error is found by calculating the position and orientation of the object, having energy emitters disposed thereon, in a plurality of orientations and positions relative to a reference frame, but with the feature in a substantially constant position relative to the reference frame; calculating the locations of the feature of the object from these calculated positions and orientations; averaging these calculated locations; determining the location of the feature by physical measurement thereof in relation to the physical locations of the emitters; and comparing the calculated average location with the physically measured loacation to arrive at the error.Type: GrantFiled: March 15, 2000Date of Patent: December 24, 2002Assignee: Image Guided Technologies, Inc.Inventors: Ivan Faul, Jesse Dean Paylor
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Publication number: 20020174707Abstract: A cylindrically formed master work is inserted into a work socket hole, and the master work is held at the center of the work socket hole by injecting compressed air from the inner circumferential face of the work socket hole toward the center of the work socket hole. In this state, the master work is rotated, and the end face of the master work is imaged three times with a CCD camera at different rotational angles. By computing the positions of bore centers from the three sets of obtained image data and the center of a circle passing those bore centers, the external shape center of the master work projected on the CCD is determined. Thus, the position of the external shape center of the work is easily and accurately determined.Type: ApplicationFiled: May 28, 2002Publication date: November 28, 2002Inventors: Susumu Sawafuji, Shozo Katamachi, Kazuo Nakajima
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Patent number: 6434847Abstract: Apparatus and methods for measuring the amount by which the centerline of a shaft disposed in a vessel is offset from the central vertical axis of the vessel, and for measuring the height of such shaft above the inside bottom of the vessel. Apparatus includes a shaft centerline offset measurement device, a shaft height measurement device, and a control/display console. Each measurement device includes a transducer or optical encoder for sensing a displaced position of a biased plunger to which a code strip is mounted. The devices may be combined into a single shaft offset and height measurement device. Improved methods include calculating shaft offset based on a plurality of readings from the transducer, and applying trigonometric relationships. The apparatus and methods are particularly useful in the verification of paddle or basket shafts utilized in dissolution testing stations, so that the dissolution testing protocol complies with government agency guidelines.Type: GrantFiled: November 2, 1999Date of Patent: August 20, 2002Assignee: Varian, Inc.Inventors: Gregory S. Duckett, C. J. Anthony Fernando, Michael F. Haw
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Patent number: 6401554Abstract: An inspection apparatus for inspecting the soundness of a substrate transfer robot of a type horizontally transferring a substrate such as a semiconductor wafer mounted on a blade. The inspection apparatus is efficiently used in a multi-chamber type semiconductor manufacturing apparatus and has a noncontact type distance sensor capable of measuring a vertical distance. When the upper face of a cassette stage disposed within a load-lock chamber is assumed to be a reference surface, the distance sensor in the inspection apparatus measures the vertical distance between the horizontal reference surface and the blade of robot moving above the reference surface. From thus measured value, the warp of blade and its shaking upon movement can be detected.Type: GrantFiled: June 29, 2001Date of Patent: June 11, 2002Assignee: Applied Materials, Inc.Inventors: Kunihiko Mori, Taizo Ishikura
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Patent number: 6398886Abstract: A process of finishing outer joint parts formed in a non-cutting way and intended for constant velocity joints, said outer joint parts having a longitudinal axis and an inner recess which extends in the direction of the longitudinal axis and which, in the direction of the longitudinal axis, is substantially undercut-free, with the inner recess being provided with tracks which comprise contact zones for the rolling contact of rolling contact members, characterized by the following sequence of process stages: non-cutting forming of the outer joint part, surface-layer-hardening of the inner recess at least along the length of the contact zones, for the purpose of producing a hardened surface layer, at least in the region of the contact zones above an unhardened matrix, calibrating the contact zones in respect of their radial positions and axial linearity by displacing the hardened surface layer in the region of the contact zones within the unhardened matrix.Type: GrantFiled: June 22, 2001Date of Patent: June 4, 2002Assignee: GKN Automotive AGInventors: Peter Fuhrmann, Hans-Willi Kinzel
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Patent number: 6370938Abstract: A quantity describing the wheel rpm is determined for at least one wheel in this method of determining a quantity describing the height of the center of gravity of a vehicle. A quantity describing wheel performance is determined for at least one wheel at least as a function of the quantity describing the wheel rpm of the corresponding wheel. A quantity describing the height of the center of gravity of the vehicle is determined at least as a function of the quantity that is determined for at least one wheel and describes wheel performance of this wheel. This method of determining the quantity describing the height of the center of gravity of a vehicle is used as part of a method of stabilizing the vehicle.Type: GrantFiled: November 13, 1998Date of Patent: April 16, 2002Assignee: Robert Bosch GmbHInventors: Klaus-Dieter Leimbach, Gabriel Wetzel
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Patent number: 6275029Abstract: A spacing between a transducer head and disk surface in a disk drive's head-disk interface is monitored. The transducer head includes a magneto resistive element. The surface of the disk includes a region containing at least one asperity extending from the surface to have a height. The transducer head is placed over the region containing the at least one asperity, and the disk is rotated. A determination is then made as to whether the transducer head contacts the at least one asperity.Type: GrantFiled: February 10, 1998Date of Patent: August 14, 2001Assignee: Seagate Technology LLCInventor: Michael D. Schaff
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Patent number: 6257225Abstract: An apparatus and a method for producing accurate straight cuts in a slab of stone, concrete, or the like. A carriage conveys the cutter along two parallel rails that lie directly upon the upper surface of the slab to be cut. In a preferred embodiment of the invention, neither rail is connected to anything else, and a sheet of resilient material is bonded to the underside of each rail. A calibration instrument is disclosed, which is used to facilitate spacing the rails specific distances on either side of the desired cut line. Because the rails can be moved one at a time in the preferred embodiment, the apparatus is highly portable. In an alternative embodiment in which portability is not an important consideration, the rails may be permanently connected by rigid lateral members.Type: GrantFiled: October 1, 1999Date of Patent: July 10, 2001Inventor: K. Michael Harris
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Patent number: 6242260Abstract: A measuring method for determining the specific surface area available for reaction of a noble metal catalyst of an electrode for use in a polymer electrolyte membrane fuel cell. The method includes measuring the total specific surface area of the noble metal catalyst and the specific surface area of the noble metal catalyst mixed with a polymer electrolyte by detecting the adsorption amounts of carbon monoxide upon exposure to carbon monoxide after reduction in hydrogen, and subtracting the latter from the former. Also provided is an electrode material for use in a polymer electrolyte membrane fuel cell having excellent polarization characteristics by controlling the utilization of a noble metal catalyst determined from the total specific surface area and specific surface area available for reaction of the noble metal catalyst.Type: GrantFiled: October 28, 1998Date of Patent: June 5, 2001Assignee: Matsushita Electric Industrial Co., Ltd.Inventors: Yasushi Sugawara, Makoto Uchida, Yuko Fukuoka, Nobuo Eda