Abstract: A method of validating a bitstream loaded into a circuit having a programmable circuit is disclosed. According to one embodiment, the method comprises steps of loading a configuration bitstream comprising an error detection command at an input of the circuit; decoding the bitstream; providing a signal indicating that an error detection should be performed to a state machine when an error detection command has been decoded; and restarting the loading of the configuration bitstream if the signal has not been received. A device having a programmable circuit is also disclosed.

Abstract: Various embodiments of the present invention relate to circuits for and methods of generating a bias current for a plurality of data transceivers on an integrated circuit. According to one embodiment, an integrated circuit having a plurality of data transceivers comprises a first data transceiver receiving a reference voltage. A plurality of data transceivers are preferably coupled to the first data transceiver, where each the data transceiver of the plurality of data transceivers receives a reference current based upon the reference voltage from the first data transceiver. According to alternate embodiment of the invention, an external resistor is coupled to a data transceiver to generate a fixed bias current in addition to a variable bias current. A method of generating a bias current for a plurality of data transceivers is also disclosed.

Abstract: Various embodiments of the present invention relate to a device for testing an integrated circuit. According to one embodiment, the device comprises a first connector coupled to receive a device under test and a second connector coupled to receive compressed test data by way of test equipment. The device also comprises a decompressor coupled to receive compressed test data, and provided decompressed test data to the device under test. Embodiments implementing two different clocks to improve the speed of testing integrated circuits are also disclosed. Various methods for coupling test signals to a device under test are also disclosed.

Abstract: A method of generating interleaver addresses in a circuit for decoding data is disclosed. The method comprises the steps of receiving a data stream having a plurality of data blocks, each block having N bits; dividing each data block of the plurality of data blocks into m windows, each window comprising N/m bits; and calculating an interleaver address for each window as a function of modulo N/m. A circuit for generating an interleaver address in a circuit for decoding data is also disclosed.

Abstract: According to one aspect of the invention, a method of interleaving data for enabling data coding in a communication network is disclosed, the method including storing parameters required to output address sequences for a matrix, receiving a block size associated with a block of data at a circuit for interleaving data, outputting parameters associated with the stored parameters based upon the block size, and producing an address sequence using the parameters. A circuit for interleaving data for data coding in a communication network is also disclosed. The circuit includes a lookup table storing parameters required to output address sequences for a matrix. A search coupled to the lookup table receives a clock size associated with a matrix and outputs parameters based upon the block size. A computation circuit coupled to receive the parameters outputs an address sequence using the parameters.

Abstract: A circuit for transmitting a block of data is disclosed. The circuit comprises a memory array having a plurality of memory locations coupled to receive data; a first data source coupled to the memory array, wherein data from the first data source is stored at sequential addressable memory locations of the plurality of memory locations on a first in, first out basis; a second data source coupled to the memory array, the second data source providing data to be stored in a predetermined memory location of the sequential addressable memory locations storing data from the second data source; and a selection circuit coupled to the first data source and the second data source for selecting data to be stored in the plurality of memory locations.

Abstract: A method of correcting errors stored in a memory array is disclosed. According to various embodiments of the invention, the method comprises the steps of storing data in the memory array; reading back the data stored in the memory array; performing a check for errors on each frame of data in a first direction; and performing a check for errors in a second direction. The step of performing a check for errors may include a parity check or a cyclical redundancy check. Depending upon the number of errors detected in intersecting rows and columns, the state of cells of the memory array are selectively changed.

Abstract: The various embodiments of the present invention relate to coupling clock signals between a plurality of data transceivers. According to one embodiment, a clock routing circuit having data transceivers comprises a clock bus interface and a first data transceiver coupled to the clock bus interface to receive a clock signal from the clock bus interface. A clock bus coupled to receive the clock signal enables the transfer of the clock signal to an adjacent data transceiver. According to other embodiments, various clock buses and interfaces enable routing clock signals between various circuits of the integrated circuit.

Abstract: A circuit for preventing an error in a flip-flop is disclosed. The circuit comprises an input circuit for receiving input data; a circuit for generating true and complement data associated with each of the input data and redundant data at predetermined nodes of the circuit; and a plurality of inverters each controlled by an associated node, wherein an inverter node of each inverter of the plurality of inverters is coupled to a separate node of the predetermined nodes. A method of preventing an error in a flip-flop is also disclosed.

Abstract: A circuit for frequency synthesis in an integrated circuit is described. The circuit comprises an oscillator circuit having a counter-controlled delay line. A delay register is coupled to the counter-controlled delay line. The delay register stores a delay value for the counter-controlled delay line. Finally, a phase synchronizer circuit, coupled to the oscillator circuit, controls the starting and stopping of the oscillator circuit. According to alternate embodiments, a control circuit is coupled to the oscillator circuit for changing the frequency synthesizer from a low frequency mode to a high frequency mode.

Abstract: A circuit for enabling partial reconfiguration of memory elements of a device having programmable logic is described. The circuit comprises a block of memory cells comprising a look-up table of a configurable logic block; and a reset signal coupled to the block of memory elements, the reset signal enabling partial reconfiguration of the memory cells of the configurable logic block. Each the memory cell may be coupled to receive the reset signal enabling the partial reconfiguration of the block of memory cells of the configurable logic block. The reset signal may comprise a plurality of signals, wherein each signal of the plurality of signals is coupled to a memory cell of the block of memory cells. Each memory cell may also receive a signal for setting an initial state. A method of enabling partial reconfiguration of memory cells of a look-up table of a programmable logic device is also described.

Abstract: A method of employing memory cells of an integrated circuit is disclosed. The method comprises steps of storing configuration data in a plurality of memory cells of a memory of the integrated circuit; selecting unused memory cells of the memory of the integrated circuit for use as a scratchpad memory; providing access to the unused memory cells of the integrated circuit; and enabling use of the unused memory cell of the integrated circuit in a user mode as scratchpad memory. According to one embodiment of the invention, a plurality of input/output ports of the integrated circuit is coupled to a plurality of JTAG inputs coupled to the plurality of unused memory cells. A programmable logic device having memory cells for storing data, and a circuit employing a programmable logic device, are also disclosed.

Abstract: The present invention relates to a lid for an integrated circuit. According to one embodiment, an integrated circuit having a lid comprises a substrate having a flat surface and extending a first length and a lid having a recess and a foot portion. The lid generally has a second length shorter than the first length, and is positioned on the flat surface of the substrate. Finally, a bonding agent is positioned on the flat surface adjacent the foot portion of the lid. According to an alternate embodiment, a second component is positioned on the substrate outside the foot portion, and an adhesive seal is positioned on the substrate adjacent the foot and covering the component. A method of securing a lid to an integrated circuit is also disclosed.

Abstract: A circuit for generating a delayed output in an input/output port of a device adapted to implement circuits operating on a range of voltages is disclosed. The circuit comprises a first terminal of a delay stage of said input/output port coupled to receive a signal to be output by the circuit; a first pass gate coupled to the first terminal; a capacitor having a first terminal coupled to the output of the first pass gate and a second terminal coupled to ground; a second pass gate coupled to the first terminal of the capacitor; and a second terminal of said delay stage of said input/output port coupled to the second pass gate and outputting a delayed signal based upon the second pass gate. A method of generating a delayed output in an input/output stage of a device adapted to implement circuits operating on a range of voltages is also disclosed.

Abstract: The embodiments of the present invention relate to an improved printed circuit board having additional rows of ground vias to reduce crosstalk in the board. A printed circuit board according to one embodiment of the present invention comprises a first row of vias and a second row of vias, each having a plurality of signal vias. The circuit board also comprises a plurality of rows of vias being coupled to a ground plane between the first row of signal vias and the second row of signal vias. According to one embodiment, the plurality of rows of vias being coupled to a ground plane comprise rows of vias having different sizes. Some of the vias are designed to receive a component, while others are generally smaller and designed to provide a return current path for the signal vias.

Abstract: A method of verifying a layout of an integrated circuit device is disclosed. The method comprises steps of receiving a physical layout for a schematic of a circuit implemented in the integrated circuit device; generating an implant table file having data showing a relationship between layers and device types of the integrated circuit device; and generating a layout-versus-schematic rules file using the implant table file.

Abstract: A method of monitoring the functionality of a wafer probe is disclosed. The method comprises applying a multi-site probe to a plurality of semiconductor dies; comparing the failure rate of a first probe site of the multi-site probe with the failure rate of a second probe site of the multi-site probe for a test of the plurality of semiconductor dies; and determining that a probe site of the multi-site probe is defective based upon comparing the failure rate of the first probe site of the multi-site probe with the failure rate of the second probe site of the multi-site probe. A system for monitoring the functionality of a wafer probe site is disclosed.

Abstract: A method of implementing a comparator in a device having programmable logic is described. The method comprises implementing a first comparison function in a first lookup table; implementing a second comparison function in a second lookup table; and using an output associated with the first comparison function to select an output of the comparator. A device having programmable logic comprising a comparator is also described.

Abstract: The methods and circuits of the various embodiments of the present invention relate to deskewing a generated clock signal. According to one embodiment, a method of deskewing a clock signal in a circuit having a delay line comprises steps of measuring an intrinsic delay in a delay line; aligning the frequency of a generated clock signal with the frequency of a reference clock signal; and aligning the phase of the generated clock signal and the reference clock signal using the measured intrinsic delay. According to another embodiment, a circuit for deskewing a clock signal in a circuit having a delay line is also described.

Abstract: The methods and circuits of the various embodiments of the present invention relate to phase shifting of a generated clock signal. According to one embodiment, a method of phase shifting a clock signal using a delay line is described. The method comprises the steps of coupling a first delay line and a second delay line in series; generating a transition edge using the first delay line; generating an opposite transition edge using the second delay line; and outputting a first phase shifted clock signal based upon the transition edge and the opposite transition edge of the clock signal. A circuit for shifting a clock signal is also disclosed.