Abstract: A dynamic circuit with a conditional keeper for burn-in. In the described embodiments, a conditional keeper is provided which is active only during the burn-in test, where the conditional keeper is sized larger than the standard keepers so as to compensate for additional leakage currents in the dynamic circuit.

Abstract: A discrete-time analog filter, where a filter tap of the filter comprises a voltage-to-current converter, an active current mirror, and a current multiplier to provide a current signal indicative of a weighted sampled voltage signal. The current signals from the filter taps are summed by one or more active cascode differential latches to provide an output logic signal indicative of the filtered output. The discrete-time analog filter finds applications in channel equalization, and is suitable for high data rates and low voltage applications. The voltage and current signals may be differential. The voltage-to-current converter may include a common-mode high-pass filter to reject common-mode voltage variations.

Abstract: A single-ended, full-swing dynamic cache having memory cells grouped into memory groups, where for each memory group one or more foot transistors connect to various memory cells within the memory group. Using a foot transistor reduces sub-threshold leakage current when the memory cells connected to the foot transistor are not being read.

Abstract: A receiver for direct conversion of RF signals, a particular embodiment comprising a quadrature signal generation circuit having an oscillator with an oscillation frequency of ⅔ times that of the carrier frequency of the RF signal. For the particular embodiment, the quadrature generation circuit includes a divide-by-two division circuit to provide quadrature signals having a frequency of ⅓ that of the carrier frequency, and further including mixers and filters to mix the output of the oscillator and the output of the divide-by-two division circuit so as to provide quadrature signals at the carrier frequency.

Abstract: A word-based interface between a MAC and a PHY, allowing for variable pin counts, variable PHY and MAC data speeds, and variable numbers of connected PHYs. The word-based interface allows for the PHY to provide PHY-to-MAC words to the MAC, and for the MAC to provided MAC-to-PHY words to the PHY, where the PHY-to-MAC words are synchronized with the MAC-to-PHY words. Data and commands are provided in fields of the words, and may be time multiplexed over the interface. Circuits within the MAC and PHY allow for the MAC to detect if a PHY is present, the number of active pins, and the number of PHYs connected. The reset and synchronization signals are integrated into a single reset/sync signal. Identification data is exchanged between the MAC and PHY so that the proper device driver for the PHY may be loaded independently of the BIOS.

Abstract: A bus in which a transmission line is excited by a pMOSFET having a drain connected to the transmission line and having a source at a core voltage VCC, and in which the transmission line is terminated by a device connected to ground.

Abstract: A CMOS amplifier for optoelectronic receivers, the amplifier comprises two transimpedance amplifiers and two differential amplifier latches. One of the two transimpedance amplifiers has an input port to receive a current signal, such as, for example, a current signal from a photodetector, and provides a output voltage indicative of the received current signal. The other of the two transimpedance amplifiers may be viewed as having no input signal, so that it provides a reference voltage. The two transimpedance amplifiers are in close proximity to each other, so that power supply noise is a common mode signal in the output voltages of the two transimpedance amplifiers. The differential amplifier latches reject the common mode signal by comparing the reference voltage to the output voltage, and provide output logic voltages indicative of binary hard decisions.

Abstract: An imager with a four color mosaic pattern of red, green, blue, and infrared pass filters, where color component signals for a pixel are interpolated by averaging over nearest neighbor pixels.

Abstract: A sense amplifier for reading memory cells in a SRAM, the sense amplifier comprising two gate-biased pMOSFETs, each corresponding to a selected bitline. The gates of the two gate-biased pMOSFETs have their gates biased to a bias voltage, their sources coupled to the selected bitlines via column-select transistors, and their drains coupled via pass transistors to the two ports of two cross-coupled inverters, the cross-coupled inverters forming a latch. After a selected bitline pair has been pre-charged and the pre-charge phase ends, one of the two gate-biased pMOSFETs quickly goes into its subthreshold region as one of the bitlines discharges through its corresponding memory cell, thereby cutting off the bitline's capacitance from the sense amplifier. When the pass transistors are enabled, the other of the two pMOSFETs allows a significant bitline charge to transfer via its corresponding pass transistor to its corresponding port, whereas a relatively much smaller charge is transferred to the other port.

Abstract: An integrated CMOS image sensor comprising pixel rows integrated on a substrate, each pixel row having pixel circuits, each pixel circuit providing a voltage signal in response to absorbed photons; and an opaque layer deposited above the pixel rows to define a set of dark pixels for each pixel row. For each pixel row, dark voltage signals indicative of the voltage signals provided by the set of dark pixels are stored and used to dark correct the voltage signals from the other pixels. The image sensor also comprises voltage-to-current converters for converting the voltage signals to currents for all pixel columns for each frame and followers to reduce the voltage swings on the outputs of the voltage-to-current converters. The currents are multiplexed in serial fashion to a current-to-voltage converter. The output of the current-to-voltage converter provides the dark voltage signals.

Abstract: A transimpedance amplifier having a first input port to connect to a signal source having an output impedance, and a second input port loaded by an impedance matched to the output impedance of the signal source, the amplifier comprising three stage pairs. The first stage pair comprises two inverting amplifiers, each employing negative feedback. The second stage pair comprises two inverting amplifiers with cross-coupled negative feedback. The third stage pair is similar in structure to the first stage pair. The inverter amplifiers in the third stage pair provide the differential voltage.

Abstract: A method and apparatus for providing the header checksum of a data packet.

Abstract: In one embodiment to reduce unwanted acoustic fan noise, the control signal for a computer system cooling fan is modulated so that the acoustic noise power spectral density of the fan has a bandwidth greater than when the control signal is constant.

Abstract: A word-based interface between a MAC and a PHY, allowing for variable pin counts, variable PHY and MAC data speeds, and variable numbers of connected PHYs. The word-based interface allows for the PHY to provide PHY-to-MAC words to the MAC, and for the MAC to provided MAC-to-PHY words to the PHY, where the PHY-to-MAC words are synchronized with the MAC-to-PHY words. Data and commands are provided in fields of the words, and may be time multiplexed over the interface. Circuits within the MAC and PHY allow for the MAC to detect if a PRY is present, the number of active pins, and the number of PHYs connected. The reset and synchronization signals are integrated into a single reset/sync signal. Identification data is exchanged between the MAC and PHY so that the proper device driver for the PHY may be loaded independently of the BIOS.

Abstract: Analog circuits for providing one or more waveform parameters, e.g., the DC offset or average, of an analog input signal. Separate biasing is not necessarily required. Some embodiments comprise field-effect-transistors (FETs) configured in various diode-connected configurations that take advantage of leakage currents through the FETs so that long resistors or large capacitors are not necessarily required. One embodiment comprises two diode-connected FETs to provide an unbiased DC offset voltage of an analog input signal.

Abstract: An eight-cell for static random access memory, the memory cell comprising cross-coupled inverters to store the information bit, two access nMOSFETs connected to local bit lines to access the stored information bit, and two nMOSFETs each having a gate connected to ground and coupled to the local bit lines and the cross-coupled inverters so that sub-threshold leakage currents to and from the local bit lines for a memory cell not being read are balanced.

Abstract: An entry latch to provide a dynamic signal at an output port in response to input static signals at a pulldown network, the pulldown network to conditionally discharge an internal node depending upon the input static signals, the entry latch comprising a pass transistor having a first source/drain connected to the output port and a second source/drain connected to a gate of a pullup pMOSFET, where the pullup pMOSFET turns ON only if the pulldown network does not turn ON during the evaluation phase.

Abstract: A half latch for latching a voltage at a domino gate output with reduced crossbar current duty cycle, comprising a CMOS inverter with input connected to the domino gate output, a first pMOSFET having a gate and drain connected to ground and having a source coupled to the source of the nMOSFET of the CMOS inverter to prevent the source voltage of the nMOSFET from approaching ground, and a second pMOSFET having a gate connected to the output of the CMOS inverter and having a drain connected to the input of the CMOS inverter.

Abstract: A method for utilizing an XOR network for testing internal nodes of a die wherein the nodes are connected to the input ports of the XOR network. The nodes are chosen by an iterative algorithm whereby the toggled, but not observed nodes, are partitioned into subsets belonging to a test hierarchy whereby the largest subset in the hierarchy is chosen. Based upon this largest subset, a first and second node set is constructed. A functional test is performed wherein the first and second node set, respectively, are inputs and outputs. The second node set serves as inputs to the XOR network. Deeper levels of hierarchies are created if the functional test on the first an second node sets do not meet a fault coverage criterion, or if the hierarchy level is too large, where the deeper test hierarchy is constructed from the largest subset associated with a less deep hierarchy.

Abstract: An embodiment zipper circuit achieves reduced leakage current by utilizing four voltages so that FETs in the p-logic blocks and n-logic blocks are reversed biased during a pre-charge phase. The FETs in a logic block are also reversed biased during an evaluation phase if the input voltages to the logic block are such that the logic block is not driven ON during the evaluation phase.