Abstract: A method of assigning input/output (I/O) objects of a circuit design to banks of a target device using integer linear programming can include assigning the I/O objects of the circuit design to I/O groups according to compatibility among the I/O objects, and establishing a plurality of relationships, comprising measures of bank capacity, regulating assignment of the I/O objects of I/O groups to banks of the target device. Each measure of bank capacity can indicate a maximum number of I/O objects from a selected I/O group that can be assigned to a selected bank of the target device. The method also can include determining whether a feasible solution exists for assignment of the I/O objects of the circuit design to banks of the target device by minimizing an object function while observing the plurality of relationships.

Abstract: A system, method and recording medium are provided for generating patterns of a paired set of a block mask and a phase shift mask from a data set defining a circuit layout to be provided on a substrate. A circuit layout is inputted and critical segments of the circuit layout are identified. Then, based on the identified critical segments, block mask patterns are generated and legalized for inclusion in a block mask. Thereafter, based on the identified critical segments and the block mask patterns, phase mask patterns are generated, legalized and colored to define a phase shift mask for use in a dual exposure method with the block mask for patterning the identified critical segments of the circuit layout.

Abstract: Various embodiments of methods and systems for providing virtual leaf driver nodes in a clock tree to drive a clock grid of an integrated circuit are disclosed. An integrated circuit may include a large number of clocked elements such as registers, flip-flops, etc. whose operation is synchronized by one or more clocks. For example, an operation performed by circuitry on one side of the die may need to occur at precisely the same time as another operation performed by circuitry on the other side of the die. In order to assure synchronicity of these events, a clock grid may be provided in the IC that is driven by virtual leaf driver nodes. The clock tree driving the clock grid may include a tier of leaf buffers. The output of a leaf buffer may be split, and the branches of the output connected to separate points on the clock grid.

Abstract: A method for developing a circuit is disclosed. The method generally comprises the steps of (A) generating a solution space having a dimension for each of a plurality of parameters for the circuit, (B) evaluating a plurality of instances of the circuit in the solution space through a software simulation, (C) evaluating the instances through a hardware simulation, and (D) updating the instances in response to the software simulation and the hardware simulation to approach an optimum instance of the instances for the circuit.

Abstract: The present invention disclosed herein is an asynchronous switch for an network on chip application making possible between IP (Intellectual Property) communication among various IPs in the network on chip.

Abstract: An LSI design support apparatus includes a data acquisition section and an equal processing section. The data acquisition section acquires first position data concerning positions of a plurality of first electrodes provided along a side of a first substrate, and second position data concerning positions of a plurality of second electrodes provided along a side of a second substrate. The equal processing section sets connection relations between the plurality of the first electrodes and the plurality of the second electrodes such that each of the plurality of the first electrodes is connected to one of the plurality of the second electrodes which has a second relative position nearest to a first relative position of the each of the plurality of the first electrodes.

Abstract: This invention is a toolset upgrading the basic WEBS system update that facilitates tracking design bugs. This invention provides an effective means for reporting, tracking, and eliminating design bugs in an environment of collaborating projects employing re-useable design hardware modules. This invention provides web-based bug reports and uses a tracking program with a SQL database to store all bugs. This invention allows bug reports sharing, alerting and tracking between many different projects.

Abstract: An apparatus for performing temporal checking is disclosed. A signal logger for performing temporal checking includes a group of edge detection modules and a group of counting modules. During testing, the signal logger is coupled to a device under testing (DUT). Each of the edge detection modules is capable of maintaining edge information after a state transition on a signal within the DUT has been detected. Each of the counting modules is associated with one of the edge detection modules. Each of the countering modules is capable of maintaining a clock cycle count information associated with a detected edge. After the testing has been completed, temporal checking information on a signal within the DUT can be obtained by reconstructing the edge information and the associated clock cycle count information of the signal collected during the test.

Abstract: Methods and structure for improved simulation of CDM ESD events and for remediation of circuit designs correcting for previously inexplicable damage to core circuits of an application circuit design caused by such events. Features and aspects hereof note that such previously inexplicable damage to core circuits of an application circuit design is caused by inductive coupling between the non-core circuits and the core circuits of an application circuit design. Improved simulation techniques in accordance with features and aspects hereof may predict where such inductive coupling may cause damage to core circuits. Other features and aspects hereof may alter an application circuit design to provide remediation by automated insertion of additional buffer circuitry to core traces of the core circuitry that may be impacted by such inductive coupling.

Abstract: Resettable memory implemented using memory without reset and methods and apparatuses to design the same. A resettable memory may include: a plurality of resettable memory cells; a plurality of memory units; and a reset information propagation logic coupled to the resettable memory cells and the memory units. The reset information propagation logic is to write reset information into a portion of the memory units when one of the resettable memory cells has a reset value and one of the memory units is written into. Alternatively, a resettable memory may include: a memory unit; a resettable finite state machine to change state in response to write request to the memory unit; and a selector coupled to the finite state machine and the memory unit to select one from a reset value and an output from the memory unit based on at least a state of the finite state machine.

Abstract: A method and system are provided for analyzing process window compliance of an integrated circuit design. Aspects of the present invention include identifying layout pattern configurations that have process windows that fail to meet respective local performance specifications; searching for any layout pattern configurations in a design that substantially match any of the identified layout pattern configurations; and modifying any matching layout pattern configurations found in the design to make the layout pattern configurations compliant with their respective process windows.

Abstract: An automatic trace determination apparatus comprises: first means that performs a first process sequentially for all intersections formed between tentative traces connecting between pads and corresponding vias, wherein the first process determines distances from an intersection formed between two tentative traces to the corresponding vias, respectively, and allows one of the two tentative traces associated with the longer distance to bypass the via, with which the other of the two tentative traces associated with the shorter distance is connected; and second means that performs a second process sequentially for all intersections formed between the interim traces themselves or between the interim and tentative traces, wherein the second process determines distances from an intersection to the vias corresponding to the interim or tentative traces, respectively, and allows one of the two tentative or interim traces associated with the longer distance to bypass the via, with which the other of the two tentative o

Abstract: During verification of a description of a circuit containing a pre-determined assertion, in order to detect incorrect behavior of the circuit that may be caused by metastability occurring in signals that cross clock domains (“CDC” signals) in the circuit, the description of the circuit is automatically transformed by addition of circuitry to inject the effects of metastability into the CDC signals. The transformed description containing the circuitry to inject metastability is verified in the normal manner. Certain embodiments analyze the transformed description using a model checking method to determine a stimulus sequence that will cause the pre-determined assertion to be violated. The transformed circuit is then simulated in some embodiments, using the stimulus sequence from model checking, and an incorrect behavior of the circuit due to metastability is displayed, for diagnosis by the circuit designer. The circuit designer may revise the circuit description and iterate as noted above.

Abstract: A method and system is provided to use the same design manipulation processes for both chip design and kerf design. Concurrent generation of kerf designs and chip designs provides a consistent, accurate, and repeatable process. Improved quality of wafer testing results because the data in the kerf matches data in the chip. The total cycle time for mask manufacturing is reduced because kerf build is accomplished prior to start of the mask manufacturing process. Also provided is the use of load balancing across multiple servers during kerf and chip design to optimize computing resources.

Abstract: In lower hierarchy design in which a plurality of circuit blocks are independently designed, a reset adjustment circuit propagating deactivation transition of a reset signal to flip-flops in synchronization with a clock signal is inserted immediately after a reset input pin in each circuit block, and timing adjustment using the clock signal as a reference is implemented for signal paths of the reset signal from the reset adjustment circuit to the flip-flops. In upper hierarchy design in which an entire semiconductor integrated circuit is designed, timing adjustment using the clock signal as a reference is implemented for signal paths of the reset signal, according to setup times and hold times of the reset signal that are prescribed respectively for the reset input pins of the circuit blocks.

Abstract: This invention provides a graphical tool by which a person may quickly and efficiently check the relational information between elements of a computer model. The invention may be used to quickly validate the design rules, like minimum spacing requirements between the connections (or nets) in a schematic that exists in a computer aided design package. Since a designer must enter such design rules for each net, the invention first imports these design rules from the computer model and then imports a standard set of design rules. After comparing both the sets of design rules, the invention presents a graphical display (a matrix) to a user indicating where the model rules matched the standard set and, correspondingly, where they did not match.

Abstract: A lithography simulation method includes: taking in design data of a pattern to be formed on a substrate and mask data to prepare a mask pattern used in forming a latent image of the pattern on the substrate by transmission of an energy ray; obtaining the latent image of the pattern by calculation of an intensity of the energy ray; locally changing, at least in a portion corresponding to a pattern of interest, a relative position in a direction of the intensity of the energy ray between a latent image curve and a reference intensity line in accordance with a distance between the pattern of interest and a pattern of a neighboring region , the latent image curve being an intensity distribution curve of the energy ray constituting the latent image, the reference intensity line being defined to specify a position of an edge of the pattern of interest; and calculating a distance between intersections of a portion of the latent image curve corresponding to the pattern of interest and the reference intensity line in

Abstract: A method for manufacturing a semiconductor integrated circuit uses layout data designed by a sequence of processes. The sequence of processes includes disposing a lower-layer wiring pattern on an imaginary lower-layer wiring layer and an upper-layer wiring pattern perpendicular to the lower-layer wiring pattern on an imaginary upper-layer wiring layer implemented in the graphics image space, providing a detour pattern including a first detour pattern connected to the upper-layer wiring pattern, providing a plurality of via patterns connecting the lower-layer and upper-layer wiring patterns, and forming a via cell pattern.

Abstract: A dual mesh interconnect network in a heterogeneous configurable circuit may be allocated between data communication and control communication.

Abstract: Systems, methodologies and technologies for the analysis and transformation of integrated circuit layouts using situations are disclosed. A method for transforming an integrated circuit (IC) layout includes recognizing shapes within the IC layout, identifying features for each of the shapes and extracting situations for the respective features. Extracted situations can be used to improve optical proximity correction (OPC) of the IC layout. This improved OPC includes extracting the situations, simulating the situations to determine a set of the situations identified for modification based on failing to satisfy a desired OPC tolerance level, modifying the set of situations to improve satisfaction of the desired OPC tolerance level, and reintegrating the modified set of situations into the IC layout. Extracted situations can also be used to improve aerial image simulation of the IC layout.