Abstract: Signal distribution of a regional signal is described. An integrated circuit includes a global signal distribution network, a regional signal distribution network and a regional buffer. The regional buffer has an output coupled at an end of the regional signal distribution network. The regional signal distribution network is coupled to a configurable logic block via an interconnect tile. The regional buffer is coupled to a regional clock capable input/output block. Additionally described is a source synchronous interface for regional signal distribution.

Abstract: A method of determining an amplifier performance is provided. One embodiment establishes a number of amplifier performance constraints. A search is then conducted for an input and an output disk that satisfy the amplifier performance constraints. A vector index is then generated that includes a load reflectance SL and a generator reflectance SG at a number of different radio frequencies. The amplifier performance constraints are then input into the vector index and the load reflectances SL and generator reflectances SG that meet the amplifier performance constraints are determined.

Abstract: Method and system for conducting design explorations of an integrated circuit are disclosed. In one embodiment, the method includes obtaining a design description of the integrated circuit that includes a virtual design block, creating a representative netlist for representing the virtual design block, where the representative netlist includes one or more soft design models, and each soft design model comprises one or more template cells for modeling a portion of the integrated circuit. The method further includes defining physical attributes for the one or more soft design models in accordance with area requirements of the virtual design block, where the one or more soft design models are described with flexible shape and pin locations, performing design explorations of the integrated circuit using the one or more soft design models and their corresponding template cells, and generating a representative implementation of the integrated circuit using results of the design explorations.

Abstract: An apparatus and method to accurately simulate negative bias and temperature instability (NBTI) and its effect. According to a first simulation method, a simulation netlist is automatically scanned for any P-type devices that are in a conductive state after application of an initial condition. Each conductive P-type device is automatically replaced with an NBTI device model and a first simulation cycle is executed. After the first cycle, each conductive P-type device is again replaced with an NBTI model and a second simulation cycle is executed. In a second simulation method, only those P-type devices transitioning from a non-conductive state to a conductive state are automatically replaced with an NBTI model prior to each half cycle of the second simulation method. The first simulation method provides robustness, while the second simulation method provides worst case verification in less time as compared to the first simulation method.

Abstract: Mechanisms for generating constraint preserving testcases in the presence of dead-end constraints are provided. A balance between precision and computational expense in generating the testcases is achieved by establishing a sliding window of constraint solving for a selected number of K time-steps in the future from a current time-step. The testcases solve for the constraints for the next K time-steps at every state of a netlist instead of just trying to solve the constraint for the present time-step. K is determined by determining, for each input, either a minimum length path depth or maximum length depth path from the input to the constraint. The largest depth value for the inputs to the netlist is then utilized as the depth for the netlist. This depth then is used to define the width of the sliding window of constraint solving.

Abstract: Systems and methods for designing integrated circuits and for creating and using androgynous interfaces between electronic components of integrated circuits are disclosed. One preferred method of designing an integrated circuit includes several steps. In one step, a foundation block for the integrated circuit is specified, including specifying the locations of multiple androgynous interfaces in the integrated circuit. In another step, one or more component blocks to comprise the integrated circuit are identified for use. In another step, the component blocks to form a layout of the integrated circuit are positioned in a manner that minimizes connection distances between functional blocks and between functional blocks and the androgynous interfaces. In another step, the androgynous interfaces are set to perform as targets (slaves) or initiators (masters) based on the layout.

Abstract: An apparatus includes a multi-cycle clock gater and a circuit design updater. The multi-cycle clock gater generates multi-cycle gating groups of data latching devices of a circuit design. The circuit design updater updates the circuit design with selected multi-cycle gating groups. Each gating group is associated with a single gating function. For each gating group, data latching devices of 0th level of the gating group are gated with the gating function and ith level data latching devices of the gating function are gated with ith latched versions of the gating function.

Abstract: Methods and systems are disclosed to inspect a manufactured lithographic mask, to extract physical mask data from mask inspection data, to determine systematic mask error data based on differences between the physical mask data and mask layout data, to generate systematic mask error parameters based on the systematic mask error data, to create an individual mask error model with systematic mask error parameters, to predict patterning performance of the lithographic process using a particular mask and/or a particular projection system, and to predict process corrections that optimize patterning performance and thus the final device yield.

Abstract: A set of candidate global optima is identified, one of which is a global solution for making a mask for printing a lithographic pattern. A solution space is formed from dominant joint eigenvectors that is constrained for bright and dark areas of the printed pattern. The solution space is mapped to identify regions each containing at most one local minimum intensity. For each selected region, stepped intensity contours are generated for intensity of the dark areas and stepped constraint surfaces are generated for a target exposure dose at an individual test point. An individual test point is stepped toward a lowest intensity contour along the stepped constraint surfaces of each selected region. Further lowering of the intensities of these points is also detailed, where possible in adjacent regions, to yield final test points. The set of candidate global optima is the final test points at their respective lowest intensity contour of the respective selected regions.

Abstract: Methods for analyzing circuit distortion based on contributions from separate circuit elements are presented. Local approximations that do not require high-order derivatives of device models are developed near an operating point for calculating distortion summaries including compression summaries and second-order intermodulation (IM2) distortion summaries.

Abstract: A design application improves design checking by utilizing a template. During the checking process, the design application divides the design layout into regions. To further improve processing speed, the design application utilizes the template. The template maps the location of the regions of a design layout during a checking process. The template comprises information such as the dimensions and location of the regions in human-readable form. Because the human-readable template is computationally simple to process, the design application may locate, divide, manage, and merge the regions of the design layout more quickly.

Abstract: A computer implemented method and system for automatically generating a net list for a printed circuit board are described. Selection of one or more pins on a first and second component to be connected is based on one or more of a logical definition, an electrical definition, a distance property, and a programmable constraint. Once pins of the first and second connections are selected and connected, a net list is automatically generated. The net list includes information associated with the first component, information associated with the second component and at least one pin of the second component.

Abstract: Some embodiments provide a method of simulating an electrical circuit that receives a circuit description that has a set of sub-circuits. The method defines several partitions for several sub-circuits. The method then simulates the circuit using the partitioned sub-circuits. In some embodiments, the method ranks the sub-circuits prior to partitioning based on a parent-child relationship that shows how a sub-circuit is instantiated by other sub-circuits. These embodiments partition child sub-circuits first. Some embodiments provide a method of partitioning an electrical circuit that has a set of sub-circuits. For a particular sub-circuit that is instantiated from other sub-circuits, the method duplicates the particular sub-circuit into a first copy and a second copy when one port of the particular sub-circuit is connected to a voltage source in at least one instance and the same port is not connected to a voltage source in at least another instance.

Abstract: In an LSI analysis apparatus, a logic element pair extracting unit extracts an unselected logic element pair when an input unit receives circuit description input. A searching unit searches for an input pattern causing the extracted pair to perform concurrent transition. When an input pattern causing concurrent transition is found, the searching unit determines the extracted pair to be a pair capable of concurrent transition (concurrent transition pair), and holds the input pattern causing concurrent transition. When an input pattern causing concurrent transition is not found, the searching unit determines the extracted pair to be a non-concurrent transition pair. An input pattern operation ratio calculating unit calculates an input pattern operation ratio for each input pattern causing concurrent transition. A detecting unit detects an input pattern yielding the highest input pattern operation ratio. An output unit puts out the detected input pattern, non-concurrent transition pairs, etc.

Abstract: A novel iterative latch placement scheme wherein the latches are gradually pulled by increasing attraction force until they are eventually placed next to a clock distribution structure such as a local clock buffer (LCB). During the iterations, timing optimizations such as gate sizing and re-buffering are invoked in order to keep the timing estimation accurate. By applying the iterative clock net weighting adjustment, the present invention allows tighter interaction between logic placement and clock placement which leads to higher quality timing and significant power savings.

Abstract: A method implemented as a computer program product for comparing two designs of electronic circuits, wherein the design representations comprise several hierarchically related sheets. The method comprises the steps of (a) identifying corresponding top-sheets of the first hierarchy level in the design versions; (b) generating a list of all sub-sheets for each top-sheet and comparing the lists to identify added, removed and common sheets of the corresponding top-sheets; (c) defining the common sheets as corresponding top-sheets of a next hierarchy level; and (d) repeating steps (a)-(c) until at least one of the top-sheets does not comprise any sub-sheet.

Abstract: In one embodiment of the invention, a physical integrated circuit (IC) design tool is provided including a design uncertainties file, a user interface (UI) software module, and a design analysis software module coupled to the UI software module, and the design uncertainties file. The design uncertainties file includes a plurality of predetermined IC design uncertainties. The UI software module communicates the plurality of predetermined IC design uncertainties to a user for selection and receives the selected IC design uncertainties from the user. The design analysis software module analyzes a circuit in response to the selected IC design uncertainties.

Abstract: A system, method and computer program product are provided for simultaneous cell identification/technology mapping. In use, a plurality of data operators is received. Further, at least two cells are identified for each data operator, simultaneously with technology mapping. By this design, at least one of the cells may thus be selected for design optimization purposes.

Abstract: Method, apparatus, and computer readable medium for circuit design is described. In one example, a model having at least one processor, at least one logic, and at least one shared memory is specified. The at least one shared memory is associated with the at least one processor. A memory map associated with the at least one shared memory and a bus adapter for coupling the memory map to the at least one processor are automatically generated.

Abstract: A mechanism is provided for the user to define a circuit design intent or strategy in the form of data that is stored with the design database. An autorouter then uses this guidance from the user to create a plan for routing the design. The user can then modify their guidance to the router until the results for the plan are acceptable. Using the planned flow, the autorouter can complete the design, creating detailed paths including etch segments and vias. Allowing such interaction with an autorouter significantly reduces the routing time and hence time-to-market.