Patents Examined by Nicole Ippolito Rausch
  • Patent number: 8026475
    Abstract: An ion gate apparatus for controlling the transmission of ion pulses between an origin and a destination in a mass spectrometer is disclosed, comprising: a first split gate having a length L1, comprising a first electrode portion; and a second electrode portion electrically insulated from the first electrode portion and separated from the first electrode portion so as to form a first aperture therebetween; a second split gate disposed adjacent to the first split gate at a distance d from the first split gate and having a length L2, comprising a third electrode portion; and a fourth electrode portion electrically insulated from the third electrode portion and separated from the third electrode portion so as to form a second aperture therebetween; a first voltage source electrically connected to said first electrode portion and to said second electrode portion; a second voltage source electrically connected to said third electrode portion and to said fourth electrode portion; and a controller electrically conne
    Type: Grant
    Filed: August 19, 2008
    Date of Patent: September 27, 2011
    Assignee: Thermo Finnigan LLC
    Inventor: Michael W. Senko
  • Patent number: 8017923
    Abstract: There is provided an infrared light source that has a simple structure and radiates infrared rays polarized in a specific direction and having a specific wavelength. The infrared light source (100) comprises a heat generator (107) and a latticework (101) in which a dielectric part (105) and a metal part (103) are alternately formed at a constant pitch in a constant direction. The infrared rays are radiated in a direction perpendicular to the surface of the latticework and are polarized in the direction indicated by an arrow A. If the constant pitch is denoted by P, the width of the dielectric part in the constant direction by T, and the specific wavelength by ?, for arbitrary P and T that meet the inequalities 0<P?2.0? and T?0.5P, the depth D of the latticework is so selected that the intensity spectrum of the infrared rays radiated from the infrared light source has the peak at ?.
    Type: Grant
    Filed: May 25, 2007
    Date of Patent: September 13, 2011
    Assignee: Nalux Co., Ltd
    Inventors: Yasuaki Inoue, Katsumoto Ikeda, Hideki Miyazaki
  • Patent number: 8017918
    Abstract: A charged-particle beam instrument (such as a transmission electron microscope) which facilitates modifying the diameters of aperture stops installed above and below (on the beam entrance and exit sides) the specimen chamber and exchanging the aperture stops. The instrument has bottom polepieces forming the specimen chamber, aperture stops each having plural holes, pushing mechanisms for pushing the aperture stops against the polepieces and supporting the stops, and stop drive mechanisms for sliding the aperture stops in a direction perpendicular to the path of the beam in response to a manipulation performed outside the electron optical column. The aperture stops are made of a metal foil or sheet and provide a cover over the opening of at least one beam passage hole in the polepieces that faces into the specimen chamber.
    Type: Grant
    Filed: August 13, 2008
    Date of Patent: September 13, 2011
    Assignee: JEOL Ltd.
    Inventor: Atsushi Kimura
  • Patent number: 8008618
    Abstract: A mass spectrometer having an elongated rod set, the rod set having a first end, a second end, a plurality of rods and a central longitudinal axis is described as is a method operating same.
    Type: Grant
    Filed: June 9, 2009
    Date of Patent: August 30, 2011
    Inventor: Frank Londry
  • Patent number: 7994472
    Abstract: Systems, methods, devices and apparatus are implemented for producing controllable charged particle beams. In one implementation, an apparatus provides a deflection force to a charged particle beam. A source produces an electromagnetic wave. A structure, that is substantially transparent to the electromagnetic wave, includes a physical structure having a repeating pattern with a period L and a tilted angle ?, relative to a direction of travel of the charged particle beam, the pattern affects the force of the electromagnetic wave upon the charged particle beam. A direction device introduces the electromagnetic wave to the structure to provide a phase-synchronous deflection force to the charged particle beam.
    Type: Grant
    Filed: June 16, 2009
    Date of Patent: August 9, 2011
    Assignee: The Board of Trustees of the Leland Stanford Junior University
    Inventors: Tomas Plettner, Robert L. Byer
  • Patent number: 7989760
    Abstract: An apparatus, system and method for the continuous flow extraction, collection and analysis of small amounts of energetic substance/s and their reacted/unreacted residue/s in real time are provided. The apparatus includes an agitator that generates a particulate material from a surface. A vacuum gathers particulate material which is provided to a mixing module. The mixing module creates a supercritical matrix containing the particulate matter. A separator separates and removes waste in the supercritical matrix from the supercritical matrix. Concentrated particulate material from the supercritical matrix is provided to a mass spectrometer for analysis and detection of a target material in proximate real-time. In one embodiment, the separator provides the supercritical matrix to a tube arm. The tube arm is heated to reduce solvent in the supercritical matrix. A collector in the tube arm concentrates particulate material, which is volatilized by a laser.
    Type: Grant
    Filed: May 24, 2007
    Date of Patent: August 2, 2011
    Assignee: SWCE Inc.
    Inventor: Terrence K. Schroeder
  • Patent number: 7989768
    Abstract: A scanning electron microscope having a charged particle beam that when in a state being irradiated toward a sample, a voltage is applied to the sample so that the charged particle beam does not reach the sample. The scanning electron microscope also detects information on a potential of a sample using a signal obtained, and a device for automatically adjusting conditions based on the result of measuring.
    Type: Grant
    Filed: August 8, 2008
    Date of Patent: August 2, 2011
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Akira Ikegami, Minoru Yamazaki, Hideyuki Kazumi, Koichiro Takeuchi, Hisaya Murakoshi
  • Patent number: 7977629
    Abstract: An ion source able to ionize both liquid and gaseous vapors from interfaced liquid separation techniques and a solids/liquid atmospheric pressure (AP) probe. The liquid effluents are ionized by electrospray ionization, photoionization or atmospheric pressure chemical ionization and the vapors released from a probe device placed in a heated gas stream in the AP source are ionized by a corona or Townsend electrical discharge or photoionization. The source has the ability to ionize compounds from both liquid and solid sources, which facilitates ionization of volatile and semivolatile compounds by applying heat from a gas stream as well as highly non-volatile compounds infused by electrospray or separated by liquid chromatography or capillary electrophoresis.
    Type: Grant
    Filed: September 3, 2008
    Date of Patent: July 12, 2011
    Assignee: M&M Mass Spec Consulting, LLC
    Inventors: Charles Nehemiah McEwen, Richard Garrett McKay
  • Patent number: 7973278
    Abstract: This invention provides a method of aligning a capillary needle, a set of electrodes, and an input to a mass spectrometer. The electrode system is formed as an assembly of two separate chips and forms an ionization device. Each chip is formed on an insulating plastic substrate. The first chip carries mechanical alignment features for the capillary electrospray needle together with a set of partial electrodes. The second chip carries a set of partial electrodes. The complete electrode system is formed when the chips are assembled in a stacked configuration.
    Type: Grant
    Filed: December 12, 2007
    Date of Patent: July 5, 2011
    Assignee: Microsaic Systems Limited
    Inventor: Richard Syms
  • Patent number: 7973290
    Abstract: The present invention involves a beam energy identification system, comprising an accelerated ion beam, wherein the accelerated ion beam is scanned in a fast scan axis within a beam scanner, wherein the beam scanner is utilized to deflect the accelerated ion beam into narrow faraday cups downstream of the scanner, wherein a difference in scanner voltage or current to position the beam into the Faraday cups is utilized to calculated the energy of ion beam.
    Type: Grant
    Filed: August 13, 2008
    Date of Patent: July 5, 2011
    Assignee: Axcelis Technologies, Inc.
    Inventor: Shu Satoh
  • Patent number: 7968843
    Abstract: Method and apparatus capable of observing a liquid sample. An optical image of the sample and an image using a primary beam, such as an electron beam or charged-particle beam, can be obtained at the same time. The apparatus has a film including a first surface on which the liquid sample is held. The primary beam irradiation column and optical image acquisition viewer are located on opposite sides of the film that acts to block light.
    Type: Grant
    Filed: January 6, 2009
    Date of Patent: June 28, 2011
    Assignee: JEOL Ltd.
    Inventor: Hidetoshi Nishiyama
  • Patent number: 7960708
    Abstract: Various embodiments disclose devices and methods for fabricating microporous particulate filters with regularly space pores wherein sheet membrane substrates are exposed to energetic particle radiation through a mask and the damaged regions removed in a suitable developer. The required depth of field is achieved by using energetic particles to minimize diffraction and an energetic particle source with suitably small diameter.
    Type: Grant
    Filed: September 17, 2007
    Date of Patent: June 14, 2011
    Assignee: University of Houston
    Inventors: John C. Wolfe, Paul Ruchhoeft
  • Patent number: 7960692
    Abstract: A miniature linear ion trap (MLIT) with a length of less than 30 mm is provided for ion focusing in the axial plane. The MLIT has multipoles for applying an AC voltage to ions and tubular entrance and exit lenses for applying a DC voltage to the ions. In another aspect, MLIT includes electrodes within the tubular entrance and exit lenses for detection of image current. A method is also provided for applying voltage to the entrance and exit lenses for ion focusing.
    Type: Grant
    Filed: May 24, 2007
    Date of Patent: June 14, 2011
    Assignee: STC.UNM
    Inventors: Gareth S. Dobson, Christie G. Enke
  • Patent number: 7956324
    Abstract: The invention provides a charged particle beam apparatus capable of preventing image errors in a display image and capturing a clear display image. A display image displayed on a display unit has a rectangular shape having sides that are substantially parallel to coordinate axes of a rectangular coordinate system determined by wafer alignment. A charged particle beam is radiated onto an area including a display image in a direction that is not parallel to the coordinate axes of the reference rectangular coordinate system to scan the area. Then, among image information obtained by scanning, only information of a position within the display image is displayed on the image display unit. In this way, a clear display image without brightness variation is obtained.
    Type: Grant
    Filed: May 29, 2008
    Date of Patent: June 7, 2011
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Noritsugu Takahashi, Muneyuki Fukuda, Hideo Todokoro, Mitsugu Sato
  • Patent number: 7952081
    Abstract: A subject is imaged for treatment of the subject such as an eye to be inspected, while irradiating a charged particle beam on the eye, so that an aim position of a charged particle beam for treatment can be determined.
    Type: Grant
    Filed: January 12, 2007
    Date of Patent: May 31, 2011
    Assignees: National University Corporation Gunma University, Japan Atomic Energy Agency
    Inventors: Hirofumi Shimada, Takashi Nakano, Takuro Sakai, Kazuo Arakawa, Mitsuhiro Fukuda, Masakazu Oikawa, Takahiro Satoh, Takashi Agematsu, Ken Yusa, Hiroyuki Katoh, Shoji Kishi, Taku Sato, Yasushi Horiuchi
  • Patent number: 7945966
    Abstract: The invention relates to a nanoprobe comprising a silica fiber (2) with an end opening having a diameter of less than 100 nm, and a metallic sheath (11). The total diameter of the silica part and the metallic sheath (11) is less than 300 nm. The invention also relates to a method for producing one such nanoprobe.
    Type: Grant
    Filed: June 6, 2006
    Date of Patent: May 17, 2011
    Inventors: Tiberiu Minea, Guy Louarn, Guirec Ollivier, Marc Chaigneau
  • Patent number: 7943902
    Abstract: A method of introducing ions into an ion trap and an ion storage apparatus are described. Introduction means are used to introduce first ions into an ion trap through an entrance aperture to the ion trap. An operating condition of the introduction means is adjusted to cause second ions, of different polarity to the first ions to be introduced into the ion trap through the same entrance aperture.
    Type: Grant
    Filed: May 26, 2006
    Date of Patent: May 17, 2011
    Assignee: Shimadzu Research Laboratory (Europe) Limited
    Inventors: Li Ding, Alan Joseph Smith, Evgenij Nikolaevich Nikolaev
  • Patent number: 7939798
    Abstract: An ion source a first ionizer comprising: an electrospray needle comprising a tip; and a conduit disposed annularly about the needle and configured to pass an inert gas in proximity of the tip to nebulize a fluid emerging from the tip, the nebulized fluid comprising analytes and a mobile phase. The ion source comprises a capillary in tandem with the first ionizer and configured to receive the droplets; a heater configured to heat the capillary to a temperature at which mobile phase vaporizes; and a second ionizer in tandem with the capillary and configured to receive the vaporized mobile phase and the analytes. A method is also described.
    Type: Grant
    Filed: January 30, 2009
    Date of Patent: May 10, 2011
    Assignee: Agilent Technologies, Inc.
    Inventors: Gangqiang Li, Hongfeng Yin
  • Patent number: 7928370
    Abstract: An open probe method for sample introduction into a mass spectrometer is disclosed, comprising the steps of: loading a sample holder with sample compounds to be analyzed; heating a probe oven; introducing said sample compounds in said sample holder into said heated probe oven; flowing inert gas into said heated probe oven; vaporizing said sample in said heated probe oven by the combined effect of oven temperature and inert gas flow; entraining said vaporized sample in said inert gas; and, transferring said vaporized sample in inert gas into an ion source of a mass spectrometer; wherein said heated probe oven remains open to the ambient atmosphere during sample introduction and analysis; said inert gas is flowing in said heated probe oven in two directions of a transfer line to a mass spectrometer ion source and to the oven opening; said vaporized sample in inert gas is transferred through a heated transfer line directly into the ionization chamber of an ion source of a mass spectrometer.
    Type: Grant
    Filed: May 21, 2009
    Date of Patent: April 19, 2011
    Assignee: Aviv Amirav
    Inventors: Aviv Amirav, Alexander Gordin
  • Patent number: 7928371
    Abstract: A method of mass spectroscopy according to example embodiments may include injecting ions into a Penning trap and exciting the ions into cyclotron and/or magnetron motions. The cyclotron motions and magnetron motions may be converted to one another with external radio frequency signals. The ions may be ejected from the Penning trap onto a position sensitive charged particle detector to determine the phases and amplitudes of the motions. Ion cyclotron resonance frequencies may be determined based on the phases and amplitudes of the motions of the ejected ions.
    Type: Grant
    Filed: May 5, 2008
    Date of Patent: April 19, 2011
    Inventor: Vladimir Ryjkov