Abstract: A method for estimation of a probe shape, in a scanning electron microscope provided with an aberration corrector, and the method is designed so as to obtain a probe image, by inputting to a computer an image taken in a just-focused state and an image taken in a de-focused state, as an image data; preparing a correlation window by automatically determining a size of a correlation window image, based on an input data size and an output data size; executing cross-correlation calculation between the correlation window and a reference area; and repeating this calculation while shifting the reference area, so as to obtain a cross-correlation matrix, in order to stably obtain the probe image, without receiving effects of use conditions or noises.

Abstract: Techniques for fabricating carbon nanotubes aligned on a tip are provided. In one embodiment, a method for fabricating carbon nanotubes aligned on a tip includes forming nanostructures on the tip, and aligning the nanostructures on the tip using a fluid flowing on the tip.

Abstract: The present invention provides a mass spectrometer including an ion source for generating pre-cursor ions, ion fragmentation means for generating fragment ions from the pre-cursor ions, a reflectron for focusing the kinetic energy distribution of the ions, and an ion detector wherein the mass spectrometer also includes axial spatial distribution focusing means which in use acts on the ions after the ion fragmentation means and before the reflectron, the axial spatial distribution focusing means being operable to reduce the spatial distribution of the ions in the direction of the ion optical axis of the spectrometer. Suitably the axial spatial distribution focusing means comprising a cell with two electrodes 52, 54 which may be apertures or high transmission grids. A pulsed electrostatic field is generated by applying a high voltage pulse 60 to the first electrode 52 at the time when the pre-cursor ions of interest 56, 58 have just passed into the pulser 50.

Abstract: The present invention relates a use of the electrocapture-based separation technology combined with mass spectrometry (e.g. sequence of polypeptides by collision-induce dissociation mass spectrometry, for the identification and/or characterization molecules of interest). In addition, it relates physical interfaces between electrocapture-based separations and different types mass spectrometers for on-line analysis, as well as the coupling of electrocapture-based separations, liquid chromatography and different types of mass spectrometrometers. It also relates the combination of the electrocapture-base separation technology with other liquid separation methods, as e.g. liquid chromatography, in order to achieve multidimensional separations prior mass spectrometrical analysis. The invention also relates to a separation device comprising a capture device, a fluidic connector e.g. an electrospray source, an electrospray interface-source and a mass spectrometer.

Abstract: There is provided a scanning probe microscope apparatus which has a high sensitivity for the interaction between the cantilever and the sample and comprises a cantilever that can oscillate stably in dynamic mode even when a mechanical Q value is low. A driving signal having a frequency close to the resonant frequency of the cantilever (4) is supplied from the signal generator (9) to the oscillation exciting means (10) to separately (forcibly) oscillate the cantilever (4). And the frequency of the driving signal or the resonant frequency of the cantilever is controlled (by adjusting the distance between the cantilever (4) and the sample (1)), such that the phase difference between the oscillation of the cantilever (4) detected by the oscillation detecting means (5) and the driving signal becomes zero, i.e. the frequency of the driving signal and the resonant frequency of the cantilever (4) match.

Abstract: Embodiments of the present invention are directed to devices and methods for receiving NSC Fluids having at least one analyte from a chromatograph and directing analyte ions into the vacuum regions of a mass spectrometer. The device has a housing having at least one wall defining a chamber, sample inlet, an ionization media inlet and an outlet. The sample inlet has a position in communication with a chromatograph receiving a NSC Fluid. The sample inlet receives the NSC Fluid and directs the NSC Fluid into the chamber to form a sample jet of NSC Fluid. The ionization media inlet is placed in fluid communication with a source of ionization media and directs the ionization media into the chamber and the sample jet to create analyte ions. The analyte ions are received in the mass spectrometer vacuum region orifice.

Abstract: A system and method for improving FIB milling endpointing operations. The methods involve generating real-time images of the area being milled and real-time graphical plots of pixel intensities with an increased sensitivity over native FIB system generated images and plots. The images and plots are generated with raw signal data obtained from the native FIB system. More specifically, the raw signal data is processed according to specific algorithms for generating images and corresponding intensity graphs which can be reliably used for accurate endpointing. In particular, the displayed images will display more visual information regarding changes in milled material, while the intensity graphs will plot aggregate pixel intensity data on a dynamically adjusting scale to dramatically highlight relative changes in milled material.

Abstract: There is disclosed a method of performing laser desorption/ionization mass spectrometry based on ions generated by exposing a sample supported on a substrate to laser light, the sample being to be subjected to spectrum analysis. The method includes the steps of (a) causing a part of the ions to be generated through one of an interaction between the laser light and a surface of the substrate and an interaction between the laser light and an interface between the substrate and the sample; and (b) determining the generated part of the ions to be index ions and identifying a signal to become noise in the laser desorption/ionization mass spectrometry using a signal of the index ions, thereby performing the spectrum analysis without an effect of the noise.

Abstract: An ion funnel trap is described that includes a inlet portion, a trapping portion, and a outlet portion that couples, in normal operation, with an ion funnel. The ion trap operates efficiently at a pressure of ˜1 Torr and provides for: 1) removal of low mass-to-charge (m/z) ion species, 2) ion accumulation efficiency of up to 80%, 3) charge capacity of ˜10,000,000 elementary charges, 4) ion ejection time of 40 to 200 ?s, and 5) optimized variable ion accumulation times. Ion accumulation with low concentration peptide mixtures has shown an increase in analyte signal-to-noise ratios (SNR) of a factor of 30, and a greater than 10-fold improvement in SNR for multiply charged analytes.

Abstract: A portable, battery-powered UV sanitizer kills germs and bacteria on the mouthpieces of tethered mouthguards of a wide variety of tether sizes and configurations and on the mouthpieces of untethered mouthguards. It doubles as a protective case when not in antimicrobial use. It includes a dishwasher safe detachable tray. It may be used with other dental appliances.

Abstract: Disclosed herein are an automatic landing method for a scanning probe microscope and an automatic landing apparatus using the same. The method comprises irradiating light to a cantilever using a light source; collecting interference fringes generated by the light being diffracted from the edge of the cantilever and then being incident to a surface of the sample; driving the tip in the sample direction until the pattern of the interference fringes reaches a predetermined pattern region (first driving); and driving the tip in the sample direction after the interference fringe pattern reached the predetermined pattern region (second driving). The method in accordance with the present invention is very effective particularly for samples having a large surface area, because it enables automatic landing of a tip according to recognition and selection of an optimal time point for individual landing steps, irrespective of adverse changes in landing conditions, such as surface irregularities of samples.

Abstract: An object of the present invention is to provide a medium; a specimen; a method for preparing the specimen; a method for observing the specimen; a sample cell; and an electron microscope capable of easily solving the problem of charge-up and further capable of observing a real shape or the like of a sample with a SEM, a TEM or the like. For the purpose of achieving the above-described object, the present invention uses an electrical conductivity-imparting liquid medium, for use in a microscope, which includes an ionic liquid as an essential component thereof and is impregnated into the entirety of a SEM or TEM sample or applied to the observation surface of a SEM or TEM sample to impart electrical conductivity at least to the observation surface of the sample. According to the present invention, the charge built up on the sample surface can be released simply by impregnating or coating the sample with the ionic liquid, and hence the problem of charge-up can be easily solved.

Abstract: A plurality of primary beams are formed from a single electron source, the surface charge of a sample is controlled by at least one primary beam, and at the same time, the inspection of the sample is conducted using a primary beam other than this. Also, for an exposure area of the primary beam for surface charge control and an exposure area of the primary beam for the inspection, the surface electric field strength is set individually. Also, the current of the primary beam for surface charge control and the interval between the primary beam for surface charge control and the primary beam for inspection are controlled.

Abstract: The invention relates to a trajectory correction method for a charged particle beam, and provides a low-cost, high accuracy and high-resolution converging optical system for use with a charged particle beam to solve problems with conventional aberration correction systems. To this end, the present invention uses a configuration which forms electromagnetic field which is concentrated towards a center of a beam trajectory axis, causes oblique of the beam to make use of lens effects and bend the trajectory, and consequently, cancels out large external side non-linear effects such a spherical aberration of the electron lens. Specifically, the configuration generates an electric field concentration in a simple manner by providing electrodes above the axis and applying voltages to the electrodes. Further, the above configuration can be realized trough operations using lenses and deflectors with incident axes and image formation positions that are normal.

Abstract: To realize to adapt to a shape of a surface, shorten a measurement time period and promote a measurement accuracy by setting a sampling interval in accordance with a slope of the shape of the surface and controlling a stylus in accordance with the interval, there is provided a scanning probe microscope, in which in scanning the stylus, an observation data immediately therebefore is stored as a history, the sampling interval in X or Y direction is set at each time based on a shape of the observation data, and the stylus is scanned to a successive sampling position.

Abstract: An ion guide with two or more ion focusing elements and a gas channeling sleeve is described. An ion transport space within the gas channeling sleeve is in fluid communication with a pumping port. A suction device is used to suction gas out of the ion transport space through the pumping port establishing a gas flow. Ions in the ion transport space are transported from an ion entry end to an ion exit end of the ion guide by the gas flow. Several examples include a multipole ion guide in which rods are used as ion focusing elements. The gas channeling sleeve is fitted about the rods. In another example, toroidal or ring shaped ion focusing elements are used as ion focusing elements. In another example, a set of ion focusing rings are mounted between insulators to form a cylinder with a gas impermeable side wall. The cylinder is itself used as the gas channeling sleeve.

Abstract: An electron beam inspection apparatus images reflected electrons and cancels negative charging derived from electron-beam irradiation. Ultraviolet rays are irradiated and an irradiated area of ultraviolet rays is displayed as a photoelectron image. The photoelectron image and a reflected-electron image are displayed on a monitor while being superposed on each other, to easily grasp the positional relationship between the images and the difference in size between them. Specifically, the shape of the irradiated area of an electron beam includes the shape of the irradiated area of ultraviolet rays on a display screen. The intensity of the ultraviolet rays in the irradiated area of the electron beam is adjusted while the reflected-electron imaging conditions for the reflected-electron image are sustained.

Abstract: The invention relates to an apparatus and a method of producing molding materials and coatings on substrates by curing radiation-curable materials under an inert gas atmosphere by exposure to high-energy radiation.

Abstract: A method and an apparatus for examining a sample by means of mass spectrometry. According to the method, the solution comprising the sample to be examined is vaporized in a vaporizer, the vaporized sample solution is sprayed, using a gas flow, into a corona discharge zone, where the examined sample is ionised according to the APCI method, using a corona discharge, to generate gas phase ions, and the ions are separated and directed to a detector. According to the present invention, a vaporizer is used, which is fabricated as a micromechanical structure which comprises the flow channels for the solution and for the carrier gas possibly used for feeding the solution, as well as the heater of the vaporizer, and which are all included in a monolithic structure. The solution is especially suitable for cases in which a very sensitive analysing technique is needed, or in which the available sample quantity is very small (less than 1 ?L).

Abstract: An EDL includes a case surface and at least one electrode surface. The EDL is configured to receive through the EDL a plurality of ion beams, to generate an electrostatic field between the one electrode surface and either the case surface or another electrode surface, and to increase the separation between the beams using the field. Other than an optional mid-plane intended to contain trajectories of the beams, the electrode surface or surfaces do not exhibit a plane of symmetry through which any beam received through the EDL must pass. In addition or in the alternative, the one electrode surface and either the case surface or the other electrode surface have geometries configured to shape the field to exhibit a less abrupt entrance and/or exit field transition in comparison to another electrostatic field shaped by two nested, one-quarter section, right cylindrical electrode surfaces with a constant gap width.