Abstract: A bandgap reference generation circuit in an integrated circuit (IC) and method for generating a bandgap reference voltage are disclosed. The bandgap reference generation circuit includes a first proportional to absolute temperature (PTAT) current generation section for generating a PTAT current component, a current circuit configured to generate a trimmed PTAT current component substantially invariant of sheet resistance of at least one resistor in the current circuit, and a complementary to absolute temperature (CTAT) current generation section including a diode on which the trimmed PTAT current component is fed to generate a CTAT current component. A combination of the PTAT and CTAT current components generate the bandgap reference voltage.

Abstract: Aspects of the invention include a circuit including a power circuit having an amplifier, a resistor, a current source, and a first node, one end of the resistor being configured to couple to a power supply, the first node being coupled to an opposite end of the resistor, a first input terminal of the amplifier, and the current source. A voltage sensitive circuit includes a logic gate coupled to both a second input terminal of the amplifier and an output terminal of the amplifier at a second node.

Abstract: Disclosed is a reference voltage circuit with low temperature drift, including a first voltage unit, a second voltage unit and a K times' amplification unit. The first voltage unit is configured to generate a first voltage, with a first end thereof being grounded. The K times' amplification unit is configured to amplify the first voltage by K times, with a first end thereof being connected to a second end of the first voltage unit, and with a second end thereof being connected to a first end of the second voltage unit, wherein K is a constant greater than zero. The second voltage unit is configured to generate a second voltage, with the first end thereof being connected to a current source circuit, and a second end thereof being connected to a third end of the first voltage unit to serve as an output end of a reference voltage (VREF).

Abstract: An apparatus and method for a voltage reference circuit with flexible and adjustable voltage settings. A voltage reference circuit, comprising a PTAT Current Generator configured to provide current through a first resistor, a CTAT Current Generator configured to provide a CTAT current through a second resistor, a PTAT-CTAT Adder circuit configured to sum the PTAT current, and the CTAT current, wherein said sum of the PTAT and CTAT current through a third resistor is configured to provide an output voltage greater than a silicon bandgap voltage.

Abstract: Various methods and circuital arrangements for biasing one or more gates of stacked transistors of an amplifier are possible where the amplifier is configured to operate in at least an active mode and a standby mode. Circuital arrangements can reduce bias circuit standby current during operation in the standby mode while allowing a quick recovery to normal operating conditions of the amplifier. Biasing an input transistor of the stacked transistors can be obtained by using a replica stack circuit.

Abstract: A current sense amplifier includes: first and second intermediate nodes coupled to first and second nodes of a sense resistor by a chopper, and to respective branches of a current mirror; a differential amplifier having inputs coupled to the first and second intermediate nodes and adapted to generate first and second voltage signals; and first and second transistors adapted to be controlled by the first and second voltage signals respectively and each having one of its main current conducting nodes coupled to a respective one of the first and second intermediate nodes.

Abstract: A bandgap voltage reference circuit includes an amplifier, a voltage buffer, a first transistor, a first resistor, a second transistor, a second resistor, and a leakage current. The input terminals of the amplifier are coupled to a first reference node and a second reference node respectively. The voltage buffer is coupled to the output terminal of the amplifier for outputting a bandgap reference voltage. The first transistor is coupled to the first reference node, the second first resistor, and can receive the bandgap reference voltage. The second resistor is coupled to the first resistor and a system voltage terminal. The second transistor is coupled to the second reference node, the first resistor, and can receive the bandgap reference voltage. The leakage current compensation element is coupled to the second transistor and the system voltage terminal. A size of the first transistor is greater than the second transistor.

Abstract: An apparatus, a method, and an integrated circuit for a providing a temperature-compensated Zener reference are disclosed. In accordance with at least one embodiment, the apparatus comprises a proportional-to-absolute-temperature (PTAT) current source; a complementary-to-absolute-temperature (CTAT) current source; and a Zener diode, with the PTAT current source coupled to a first Zener diode terminal of the Zener diode, the CTAT current source coupled to the first Zener diode terminal of the Zener diode, and the PTAT current source providing a PTAT current and the CTAT current source providing a CTAT current, wherein the PTAT current and the CTAT current are combined for provide a temperature-compensated bias current.

Abstract: Provided is a circuit for generating a bias current, which includes a current generation unit including a plurality of current mirrors that generate a plurality of currents having different levels. The circuit also includes a current generation control unit that controls the generating the plurality of current having different levels in the current generation unit based on an externally input current. The circuit further includes a current supplying unit that supplies a current selected from the plurality of currents having different levels to an external device.

Abstract: In one example, a power-on reset (POR) circuit comprises a first transistor coupled to a voltage source, a control terminal of the first transistor coupled to a non-control terminal of the first transistor via a resistor; a second transistor coupled to the resistor, a control terminal of the second transistor is coupled to a non-control terminal of the second transistor; and a comparator having first and second terminals, the first terminal coupled to the non-control terminal of the first transistor and the second terminal coupled to the voltage source via an offset circuit.

Abstract: A jitter compensation circuit operates in a first conduction state responsive to a high-to low transition of data and a low-to-high transition of data. The circuit operates in a second conduction state when there is no transition of data. The circuit compensates charge to a voltage supply in the first conduction state, thereby reducing voltage drop caused by transition of data.

Abstract: A reference voltage generation circuit for generating an output voltage is provided. The reference voltage generation circuit includes a bandgap reference circuit and a voltage adjustment circuit. The bandgap reference circuit generates the output voltage at an output node and a reference voltage. The voltage adjustment circuit is coupled to the bandgap reference circuit. The voltage adjustment circuit receives the output voltage and the reference voltage, compares the output voltage with the reference voltage to generate a comparison result, and adjusts the output voltage according to the comparison result.

Abstract: A method of arranging components in an integrated circuit includes providing two or more circuit cells of a first type and providing two or more circuit cells of a second type. The circuit cells of the first type are configured to operate in conjunction with the circuit cells of the second type. The method further includes arranging the circuit cells of the first and second types in an alternating pattern such that each circuit cell of the first type is adjacent to at least one circuit cell of the second type. The alternating pattern may be an array of rows and columns and may include a repeating pattern of one first type cell and one second type cell in each of the columns. The alternating pattern may include a repeating pattern of one cell of the first type and two cells of the second type in each of the columns.

Abstract: Aspects of the subject technology relate to a circuit for reducing random-telegraph noise in bandgap circuits. The circuit includes a number of diodes coupled in parallel at their respective first nodes to a ground potential. A number of switches are coupled to respective second nodes of the diodes. The circuit further includes a first resistor and a resistor voltage divider. The first node of the first resistor is coupled to a first node of a current source, and the first node of the resistor voltage divider is coupled to the first node of the current source. The switches are used to implement cyclic switching of the diodes in response to a train of pulses. An output voltage of the circuit is derived between a mid-node of the resistor voltage divider and a second node of the first resistor.

Abstract: A band-gap reference circuit including a charge pump circuit and a reference circuit is disclosed. The charge pump circuit is powered by a supply voltage and thereby outputs a regulating voltage which is higher than the supply voltage and powers the reference circuit such that the reference circuit outputs a band-gap reference voltage. Powering the reference circuit with the regulating voltage that is made higher than the supply voltage by the charge pump circuit enables 1) normal operation of the band-gap reference circuit at the supply voltage that is lower than a lowest voltage required by the band-gap reference circuit; and 2) minimization (almost elimination) of fluctuations in the regulating voltage output from the charge pump circuit and hence a stable and more accurate band-gap reference voltage output from the band-gap reference circuit.

Abstract: Methods, systems, and apparatus to correct gate bias for a diode-connected transistor are disclosed. An example apparatus includes a first resistor including a first resistor terminal and a second resistor terminal; a second resistor including a first resistor terminal and a second resistor terminal; a first transistor including a current terminal and a gate terminal, the current terminal of the first transistor coupled to the first resistor terminal of the first resistor and the gate terminal of the first transistor is coupled to the second resistor terminal of the first resistor; and a second transistor including a first current terminal and a second current terminal, the first current terminal of the second transistor coupled to the gate terminal of the first transistor, and the second current terminal of the second transistor coupled the first current terminal of the second resistor.

Abstract: An internal voltage generation circuit includes a counting operation control signal generation circuit and a drive control signal generation circuit. The counting operation control signal generation circuit compares a test internal voltage with a test reference voltage to generate a counting operation control signal in a test mode. The drive control signal generation circuit generates a drive adjustment signal whose logic level combination is adjusted according to the counting operation control signal in the test mode. In addition, the drive control signal generation circuit compares the test internal voltage with the test reference voltage in the test mode to generate a drive control signal for driving the test internal voltage.

Abstract: The present application relates to a sub-bandgap reference source circuit, which comprises a current mirror source, a first branch comprising a first BJT and a second branch comprising a second BJT, the first BJT having an emitter current density lower than an emitter current density of the second BJT, the first branch and the second branch being connected at a first node coupled to ground; a first voltage divider comprising first and second resistances coupled in series, the first resistance being coupled between a base terminal of the first BJT and a second node, the second resistor being coupled to ground; a second voltage divider comprising first and second resistances coupled in series, the first resistance being coupled between the second node and a base terminal of the second BJT, the second resistance being coupled to the first node; and an output terminal coupled to the second node.

Abstract: Described is an apparatus of a thermal sensor and/or bandgap reference circuit which is independent of an operational amplifier. The apparatus comprises: a forward biased diode circuit having one or more diodes; a first switch-capacitor sampler coupled to the forward biased diode circuit, the first switch-capacitor sampler to provide a reference voltage which is proportional to absolute temperature; and a second switch-capacitor sampler coupled to the forward biased diode circuit.

Abstract: A constant current circuit includes a first current mirror circuit connected to a first power supply and having a first input transistor and a first output transistor of a first conductivity type, a second current mirror circuit having a second output transistor of a second conductivity type provided between the first input transistor and a second power supply, and a second input transistor of the second conductivity type provided between the first output transistor and the second power supply, a resistor interposed between the second output transistor and the second power supply, and a capacitor having one end connected to the first power supply and the other end connected to a connecting point of the second output transistor and the resistor.

Abstract: An object of the present invention is to reduce a chip area of the high-side driver circuit. A high-side driver circuit of the present invention is a high-side driver circuit in which a first potential is set as a power supply potential, which includes a constant voltage circuit configured to operate with a second potential as a reference potential, and generate, from the first potential, a third potential which is lower than the first potential and higher than the second potential, a logic circuit configured to operate with the third potential as a reference potential, a level shift circuit configured to shift the reference potential of the output signal of the logic circuit from the third potential to the second potential, and a driver circuit in which the second potential is set as a reference potential, and configured to drive a switching element by the output signal.

Abstract: The present disclosure relates to a compensation method and a compensation apparatus for an OLED pixel and a display apparatus, which relates to the field of display technology. The compensation method for an OLED pixel includes: acquiring a threshold voltage of a driving transistor; acquiring a mobility of the driving transistor according to the threshold voltage of the driving transistor; and compensating the OLED pixel according to the mobility of the driving transistor.

Abstract: Briefly, embodiments of claimed subject matter relate to determination of a high-impedance state or a low-impedance state of a resistive memory element over a wide range of temperature, such as temperatures approaching ?40.0° C. to temperatures approaching +125.0° C. Such determination may be brought about by implementing a circuit which, according to various embodiments described herein, emulates a reference impedance having a negative temperature coefficient.

Abstract: a reference voltage generating circuit that includes a bandgap reference voltage generating circuit main body (10) configured to generate a substantially constant reference voltage at room temperature, a high temperature correction circuit (30) configured to increase a reference voltage generated by the reference voltage generating circuit main body at a high temperature by supplying a high temperature correction current that increases as the temperature increases to the resistor, a low temperature correction circuit (40) configured to increase a reference voltage generated by the reference voltage generating circuit main body at a low temperature by supplying a low temperature correction current that increases as the temperature decreases to the resistor, and a bias circuit (20) configured to generate a bias voltage according to the temperature, so as to control the high temperature correction current and the low temperature correction current at the same time.

Abstract: A reconfigurable voltage regulator for use in a system having a multiple power domains includes a power detecting circuit and a charge pump. The power detecting circuit is coupled to a power supply and configured to partition a power range of the power supply into multiple voltages zones corresponding to the multiple power domains of the system and provide a pump enable signal associated with a specific power domain among the multiple power domains. The charge pump includes multiple pump stages arranged in a matrix, wherein each pump stage is activated or deactivated according to a corresponding bit of the pump enable signal.

Abstract: Apparatuses and methods for providing a current independent of temperature are described. An example apparatus includes a current generator that includes two components that are configured to respond equally and opposite to changes in temperature. The responses of the two components may allow a current provided by the current generator to remain independent of temperature. One of the two components in the current generator may mirror a component included in a voltage source that is configured to provide a voltage to the current generator.

Abstract: Signal-generation circuitry comprises: a differential amplifier comprising first and second input transistors, connected along respective current paths and having control terminals serving as corresponding first and second input terminals of the differential amplifier, and an output terminal at which an amplified signal is output dependent on input signals received at the input terminals; bandgap voltage reference circuitry comprising the first input transistor and a third input transistor whose control terminals are connected together to form a reference terminal at which a bandgap voltage reference signal is generated as a first input signal; and a regulation stage connected to receive the amplified signal output from the differential amplifier and configured to generate a voltage-regulated signal based thereon, and connected to the second input terminal of the differential amplifier so that the second input signal is a feedback signal dependent on the voltage-regulated signal.

Abstract: A bandgap reference circuit and method of using the same are provided. The bandgap reference circuit includes a startup component; an output component; and a bandgap core component coupled there-between. The bandgap core component includes a reference point having a voltage associated with an output signal of the output component. A controller is configured for controlling the bandgap core component and the output component to switch between a low power consumption mode and a normal operation mode based on the voltage at the reference point. When the bandgap core component and the output component operate in the normal operation mode, the bandgap reference circuit outputs a stable voltage and has a first power consumption. When the bandgap core component and the output component operate in the low power consumption mode, the bandgap reference circuit has a second power consumption less than the first power consumption.

Abstract: Disclosed is a temperature sensor including a first current generator configured to generate a proportional to absolute temperature (PTAT) current, a second current generator configured to generate an inverse PTAT (IPTAT) current, the PTAT current and IPTAT current being combined to form a reference current having a sensitivity relative to temperature, a plurality of current mirrors to adjust the sensitivity and gain of the reference current, and a variable resistor to set an output calibration voltage based on the generated current.

Abstract: Described herein is an apparatus and system of a low-impedance reference voltage generator. The apparatus comprises: a voltage-control loop including a first transistor to provide an output voltage; and a current-control loop to sense current through the first transistor, relative to a reference current. The node having the output voltage is a low-impedance node.

Abstract: A negative voltage circuit includes a first charge pump circuit and a second charge pump circuit. The first charge pump circuit is configured to operate in a start-up mode and perform a first charge pumping operation based on a first current to generate a negative voltage. The second charge pump circuit is configured to operate in a normal operating mode subsequent to the start-up mode and perform a second charge pumping operation based on a second current to generate a negative voltage, The first current is higher than the second current, and a speed of the first charge pumping operation is higher than a speed of the second charge pumping operation.

Abstract: Certain implementations of the disclosed technology may include systems, methods, and apparatus for assigning a distinct identifier (ID) to a pressure transducer based on resistor values. Embodiments include electrically identifying the distinct ID, and compensating the pressure transducer based on the distinct ID. According to an example implementation, a method is provided that can include coupling a transducer ID measurement assembly with a transducer assembly; measuring, by the transducer ID measurement assembly, a plurality of divided voltages between a plurality of configurable ID switches and a reference resistor; determining, with a processor, a distinct ID associated with the transducer assembly based on the plurality of measured divided voltages; retrieving one or more compensation parameters based on the distinct ID; and compensating, with the one or more compensation parameters, a measurement signal of the transducer assembly.

Abstract: A bandgap circuit generates a process and temperature independent voltage. The bandgap circuit includes a bandgap core that generates a temperature independent voltage. The bandgap circuit also includes a resistor ladder that is coupled in parallel to the bandgap core and scales the temperature independent voltage into voltage levels proportional to the temperature independent voltage. An output switch of the bandgap circuit connects the output of the bandgap circuit to one of the voltage level that is substantially equal to a desired voltage level. The bandgap circuit may also include a current mirror that outputs a proportional to absolute temperature current.

Abstract: A voltage generator and a method for generating an output voltage is presented. The generator has a current mirror circuit with a first transistor having a gate and a first terminal, and a second transistor having a gate coupled to the gate of the first transistor, and with a first terminal coupled to a feedback node. A third transistor has a gate, a first terminal and a second terminal. The first terminal is coupled to the feedback node and the second terminal is coupled to an output node. A fourth transistor has a gate coupled to the third transistor. There is a current source coupled to the output node, and a feedback circuit to detect a terminal voltage at the feedback node and to control the terminal voltage by adjusting a gate voltage at the gate of the second transistor.

Abstract: The present disclosure discloses an electrical switchgear configured to control an electro-magnet by using the electro-magnet, a critical temperature device, and an electro-magnet control unit without using a bimetal and a mechanical contact. The electro-magnet switches power applied through a power line in response to a flow of control current to a power device connected to a load side. In a critical temperature device, an output current value varies when a temperature of a heating wire, which is connected to the power line, exceeds a critical temperature by supply current flowing to the power device. An electro-magnet control unit, which is realizable with an SCR, allows a flow of control current of the electro-magnet to be generated or cut off in response to the output current value of the critical temperature device.

Abstract: An ambient heat engine that is thermally coupled to its environment is provided. The ambient heat engine includes two complementary electrochemical cells. One cell has a positive voltage temperature coefficient and the other cell has a negative voltage temperature coefficient. The ambient heat engine further includes a controller and an electrical energy storage device. When the ambient temperature increases or decreases, the temperature variation creates a voltage differential between the two cells, and the controller discharges the higher voltage cell and uses a portion of the discharged energy to charge the lower voltage cell. The difference in energy is extracted by the controller and supplied to the electrical energy storage device. The controller includes circuitry for coupling energy from the energy storage device to the cells in order to compensate for self-discharge of the cells which may occur due to electronic leakage and diffusion phenomenon over extended periods of time.

Abstract: A bandgap voltage reference circuit configured to generate a bandgap reference voltage is provided. The bandgap voltage reference circuit includes a bandgap current generating circuit, a differential pair circuit and a flipped voltage follower. The bandgap current generating circuit converts the bandgap reference voltage into a bandgap current and generates a first voltage and a second voltage according to the bandgap current. The differential pair circuit is coupled to the bandgap current generating circuit to receive the first voltage and the second voltage and configured to reduce a voltage difference between the first voltage and the second voltage and generate a third voltage. The flipped voltage follower is coupled to the differential pair circuit to receive the third voltage and generates the bandgap reference voltage accordingly.

Abstract: A voltage regulation circuit (2) comprises first (4) and second (6) voltage regulators each arranged to receive an input voltage (Vin) and a respective reference voltage; and first (18) and second (30) reference voltage sources arranged to provide the first and second reference voltages respectively. In a first mode of operation, the first regulator varies the regulated output voltage in response to a difference between the regulated output voltage (Vout) and the first reference voltage. In a second mode of operation, the second regulator varies the regulated output voltage in response to a difference between the regulated output voltage and the second reference voltage. The second voltage regulator is arranged to provide a greater maximum output current than the first voltage regulator. The circuit further comprises a switch portion (8) arranged to provide a third mode of operation in which the first regulator provides the regulated output voltage and the second regulator provides additional output current.

Abstract: A reference voltage circuit 2 comprises: a bandgap circuit portion comprising first and second reference transistors (Q1, Q2) and a current source arranged to drive the first and second reference transistor at different current densities, wherein the first and second reference transistors are connected to first and second nodes (N1, N2) respectively; an operational transconductance amplifier (M4, M5, M10, M11, M12) arranged to produce an output current that is proportional to a difference between a voltage at the first node and a voltage at the second node; an output current mirror circuit portion (M3) arranged to generate a mirror current that is a scaled version of the output current and drive said mirror current through a load (R3) so as to produce a reference voltage (Vref); and a reference monitoring circuit portion (6) arranged to monitor the operational transconductance amplifier and generate a flag (Vready) if a current flowing through the operational transconductance amplifier exceeds a threshold.

Abstract: An ESD circuit is connected with a pad. The ESD circuit includes a voltage divider, a RC circuit and a path control circuit. The voltage divider is connected between the pad and a first node and provides plural divided voltages. The RC circuit is connected between the pad and the first node. The RC circuit receives the plural divided voltages and provides a control circuit. The path control circuit is connected with the pad and the first node. The path control circuit receives the plural divided voltages and the control voltage. When the pad receives a first ESD zap, the RC circuit controls the path control circuit to turn on a first ESD current path. Consequently, an ESD current flows from the pad to the first node through the first ESD current path.

Abstract: A pseudo resistor with tunable resistance including a first transistor and a second transistor is provided. The first transistor has a first terminal, a second terminal and a control terminal. The first terminal of the first transistor serves as a first terminal of the pseudo resistor. The control terminal of the first transistor receives a control voltage. The first transistor is controlled by the control voltage, such that the first transistor operates in a weak inversion region. The second transistor has a first terminal, a second terminal and a control terminal. The first terminal of the second transistor is coupled to the second terminal of the first transistor. The second terminal of the second transistor and the control terminal of the second transistor are coupled to each other to serve as a second terminal of the pseudo resistor with tunable resistance. The second transistor operates in the weak inversion region.

Abstract: A low-noise, low-power reference voltage circuit can include an operational transconductance amplifier (OTA) with inputs coupled to a temperature-compensated voltage, such as can be provided by source-coupled first and second field-effect transistors (FETs) having different threshold voltages. A capacitive voltage divider can feed back a portion of a reference voltage output by the OTA to the inputs of the OTA to help establish or maintain the temperature-compensated voltage across the inputs of the OTA. A switching network can be used, such as initialize the capacitive voltage divider or other capacitive feedback circuit, such as during power-down cycles, or when resuming powered-on cycles. A switch can interrupt current to the OTA during the power-down cycles to save power. The cycled voltage reference circuit can provide a reference voltage to an ADC reservoir capacitor. Powering down can occur during analog input signal sampling, during successive approximation routine (SAR) conversion, or both.

Abstract: Regulating voltages at inputs of an electronic device by performing at least the following: receiving, at a voltage monitoring circuit, a monitoring voltage corresponding to a power system, determining, at the voltage monitoring circuit, whether the monitoring voltage is equal to or exceeds a monitoring threshold voltage, receiving, at the voltage monitoring circuit, an output indicating whether an inputted reference voltage and an inputted feedback voltage at a comparator circuit differs, regulating, at the voltage monitoring circuit, a feedback voltage to match the inputted reference voltage based on the output and a determination that the monitoring voltage is equal to or exceeds the monitoring threshold voltage, and providing, from the voltage monitoring circuit, the feedback voltage as an updated inputted feedback voltage for the comparator circuit.

Abstract: A circuit includes a regulation control circuit. The regulation control circuit includes an error amplifier to generate a control output signal based on an error signal input and a reference input. The regulation control circuit includes a level shifter to receive a negative voltage supplied to a load and to provide a positive error signal to the error signal input of the error amplifier. A driver circuit receives the control output signal from the error amplifier and generates a drive output signal in response to the control output signal. A regulation output circuit regulates the negative voltage supplied to the load in response to the drive output signal from the driver circuit.

Abstract: A bandgap reference (BGR) circuit is provided. The BGR circuit includes a first node, a second node, and a third node. A first resistive element is connected between the second node and the third node. The BGR circuit is operative to provide a reference voltage as an output. The BGR circuit further includes a current shunt path connected between the first node and the third node, the current shunt path being operable to regulate a voltage drop across the first resistive element.

Abstract: The embodiments of the present disclosure disclose a reference circuit, comprising a current control sub-circuit, a voltage control sub-circuit and a voltage adjustment sub-circuit, wherein the current control sub-circuit outputs current to a first terminal and a second terminal of the voltage control sub-circuit and a first terminal of the voltage adjustment sub-circuit at a ratio of 1:1:n respectively, and the first terminal and the second terminal of the voltage control sub-circuit may cause a voltage at a second terminal of the voltage adjustment sub-circuit to be equal to a voltage at a third terminal of the voltage adjustment sub-circuit upon receiving equal current output by the current control sub-circuit, and the voltage adjustment sub-circuit may adjust a voltage output at an output terminal of the reference circuit to be independent of a temperature when the voltage at the second terminal is equal to the voltage at the third terminal.

Abstract: A current generation circuit includes: a current source circuit including a first transistor and a first resistor, and configured to output a first current based on a source voltage or a drain voltage of the first transistor and a resistance of the first resistor; a current control circuit including a voltage input terminal, a second transistor and a third transistor, and configured to output a second current based on a source voltage of the second transistor and a resistance of the third transistor; and an impedance circuit including a second resistor formed of a same resistive body as the first resistor and a fourth transistor diode-connected to the second resistor, and configured to generate a control voltage at the voltage input terminal by the first current and the second current, wherein the current generation circuit is configured to output a current based on the second current.

Abstract: A current mirror circuit includes: a first transistor and a second transistor connected in series, a third transistor and a fourth transistor connected in series; and further includes: a reference voltage source, a fifth transistor, and a control module connected between the reference voltage source and the fifth transistor. A current mirror is formed by the third transistor and the fourth transistor together with the first transistor and the second transistor, to produce a mirror current at a drain of the third transistor according to a current source coupled to a drain of the first transistor; the control module is configured to control the fifth transistor to operate in the linear region.

Abstract: An integrated circuit includes an output driver circuit configured to provide a first voltage at an output terminal. The output driver circuit includes a transistor having a first current electrode coupled at a voltage supply terminal and a second current electrode coupled at the output terminal, and a resistor having a first terminal coupled at the output terminal and a second terminal coupled at a first node. An amplifier circuit is coupled to the output driver circuit and is configured to generate a proportional to absolute temperature (PTAT) current in a first circuit branch of the output driver circuit coupled at the first node. A complementary to absolute temperature (CTAT) circuit is configured to generate a CTAT current in a second circuit branch coupled at the first node.

Abstract: A bandgap reference circuit including a clamp circuit is provided. The bandgap reference circuit performs the calibration only for one time in a normal mode to store a control code of a reference generator of the clamp circuit. In a suspend mode, the control code is used for controlling the reference generator to cause the clamp circuit to provide a desired source voltage, and a bandgap reference voltage source is shut down to reduce the power consumption.