Abstract: An image display device includes a black spot defect position determination circuit which determines a position of a black-spot defective pixel of a self-luminous display panel. A detection-use current source in the black spot defect position determination circuit is connected to pixels during a period separate from a display period of data signals thus determining a black spot defect. The position of the black spot defect is stored in a storing circuit and is transmitted to a display and detection control circuit. The display and detection control circuit corrects the data signals to the pixels around the defective pixel based on a black spot defect position, and drives a data line drive circuit based on the corrected data signals thus visually correcting the black spot defect.

Abstract: A residual current device (RCD) protects a circuit by tripping in response to an imbalance signal representative of residual current imbalance in the circuit. The RCD trips the circuit when the imbalance signal exceeds a predetermined threshold rating. The RCD includes a sense coil for generating the imbalance signal and a test coil for introducing a simulation residual current imbalance into the device so as to increase the imbalance signal. A processor monitors the imbalance signal and determines the simulation residual current imbalance required to increase the imbalance signal to a level that corresponds to the predetermined threshold rating so that the sense coil senses the sum of any residual current imbalance in the circuit being protected and the simulation residual current imbalance in order to test operation of the RCD against the predetermined threshold rating.

Abstract: A test device for detecting current leakage between deep trench capacitors in DRAM devices. The test device is disposed in a scribe line region of a wafer. In the test device, a first trench capacitor pair has a first deep trench capacitor and a second deep trench capacitor connected in parallel. A first transistor has a first terminal electrically coupled to the first deep trench capacitor and a control terminal electrically coupled to a first word line. A second transistor has a first terminal electrically coupled to the second deep trench capacitor and a control terminal electrically coupled to a second word line. First and second bit lines are electrically coupled to the first and second transistors respectively. The first and second bit lines are separated and the first and second word lines are perpendicular to the bit line regions.

Abstract: Power supplies are disclosed herein. One embodiment of a power supply comprises a first input and a second input, wherein the first input and the second input are connectable to a pulse width modulation controller and wherein a pulse width modulation signal is outputable from the pulse width modulation controller. A power stage connected to the first input and the second input. A first comparator having a first comparator first input is connected to the first input and a first comparator second input connected to the output of the power stage. A change of voltage at the output of the first comparator constitutes a difference in phase between the first input and the output of the power stage.

Abstract: A system (10) and method for monitoring the operational life and/or performance of one or more light-emitting diodes (LEDs) (20) based on sensed parameters are disclosed. The remaining life of each LED may be predicted by counting the clock cycles during which the LED-based light is activated. LED current and/or temperature measurements may be used to control the clock signal and, thus, to compensate the predicted life value. Furthermore, operational characteristics of the LED-based light may be monitored based on LED current and/or voltage measurements. Such characteristics may include performance (e.g., intensity) and failure conditions (e.g., open or short circuits).

Abstract: The present invention enables connections of electronic components of an electronic apparatus to be inspected easily and reliably. To accomplish this, an electronic apparatus including a plurality of electronic components, includes a control circuit which controls input and output of an electric signal to and from the plurality of electronic components and a plurality of inspection circuits which inspect connections of the plurality of electronic components. The plurality of inspection circuits are connected in series, the control circuit is connected to an end of the series, inspection signals output from the plurality of inspection circuits are superimposed on one another in sequence into an signal and the signal is input into the control circuit, and determination is made at the control circuit as to whether each of the plurality of electronic components is connected properly or not.

Abstract: An inspection apparatus comprises a fixed unit including a control device and a measurement device, and a moving unit including contact terminals, which are brought into contact with contacts formed on a printed board having electrode patterns subjected to electrical inspection (e.g., electrical conduction inspection). The contact terminals are connected to a connection switching device via a plurality of first wires, wherein the connection switching device is arranged in the moving unit for selectively switching over the first wires. A plurality of third wires are arranged for establishing connections between the fixed unit and the selectively-switched first wires, wherein the number of the third wires is smaller than that of the first wires.

Abstract: The present invention provides a storage device and a writing unit diagnosing method, which can determine a defect in a writing unit at an early stage. There is provided a storage device, which includes writing units that write data to a storage medium, current application units that apply a current to the writing units, electric property measurement units that measure the electric property of the writing units at the time of applying a current by the current application units, and obtain electric property measured values, a storage unit that stores the electric property measured values obtained by the electric property measurement units, and a judgment unit that judges whether or not the writing units are abnormal based on the electric property measured values stored in the storage unit.

Abstract: A digitizing ohmmeter system for providing a digital resistance ratio measurement includes a high impedance current source providing a DC excitation current to an impedance-varying input sensor and a reference resistor and an ADC circuit including a charge-balancing modulator and a digital post processing circuit. The same DC excitation current passes through both the input sensor and the reference resistor. The system utilizes a switched capacitor input stage to sample the voltage across the input sensor and the voltage across the reference resistor to generate an input voltage step and a reference voltage step which are coupled to the modulator of the ADC circuit. The digitizing ohmmeter system thereby realizes fully ratiometric operation such that neither a precise current source nor a precise voltage source is required for accurate resistance ratio measurements and only a stable known reference resistor is necessary for accurate absolute resistance measurements.

Abstract: A multi-layered circuit board a built-in component including multiple terminals, at least one signal pad formed on a top surface of the multi-layered circuit board for signal transmission, each of the at least one signal pad corresponding to one of the multiple terminals, and at least one test pad formed on the top surface of the multi-layered circuit board, each of the at least one test pad corresponding to one of the at least one signal pad for testing an electric path extending from the one signal pad through the one terminal to the each of the at least one test pad.

Abstract: According to one embodiment, a phase-locked loop (PLL) device includes test circuitry for entering/exiting a test mode upon receiving a particular pulse train at a reference clock input of the PLL. In addition, exemplary methods are provided herein for entering a test mode and detecting loop filter leakage within the PLL. The methods described herein are performed without the use of a dedicated test pin.

Abstract: The present invention is related to a method for testing a micro-electronic device, by applying a plurality of test vectors to said device, and measuring for each test vector, the quiescent supply current IDDQ, to said device, wherein each IDDQ measured value is divided by another IDDQ value, and wherein the result of said division is compared to a predefined reference, resulting in a pass or fail decision for said device.

Abstract: The test circuit according to the present invention includes: a plurality of light-receiving elements; a plurality of amplifiers, each of which converts, into a voltage, a photoelectric current supplied from one of the light-receiving elements; and an electric current supplying unit which supplies an electric current to each of the light-receiving elements and each of the amplifiers.

Abstract: Methods and apparatuses to repair defects in a circuit, such as during or subsequent to the manufacture of the circuit. Defects may be detected through, for example, optical processing of an acquired image of the circuit or by measuring the strength of a signal emitted across a pair of conductor plates. If defects are detected, conductive particles may be applied to the circuit to correct the detected defects.

Abstract: The present invention is directed to a circuit and method for self-testing a protection device for use in an AC power distribution system. The device is configured to be coupled between an AC power distribution system and at least one load. The method includes the step of introducing a simulated ground neutral fault during a first predetermined half cycle half cycle of the AC power. An attempt is made to detect the introduced simulated grounded neutral fault during the first predetermined half cycle half cycle. A fault condition is signaled if the introduced simulated grounded neutral fault is not detected within a predetermined period of time.

Abstract: A test device for at least one LED strip contains: a voltage source, by way of which a cold test voltage or a warm test voltage can be applied to a parallel circuit formed of a test resistor and the LED strip, and an evaluation unit which records the cold test current flowing when a cold test voltage is present and diagnoses an error if the cold test current deviates from a required value by an above-the-threshold amount. A test device contains a switching element connected in series with the test resistor and an error circuit connected to the at least one LED strip, which during the warm testing records an over-the-threshold deviation of a current flowing through the at least one LED strip from a pre-specified value and for an over-the-threshold deviation opens the switching element.

Abstract: A QAM receiver is disclosed. According to one aspect, a QAM receiver includes a signal input for receiving an analog input signal. Further, the QAM receiver includes an anti-aliasing filter and a series connected analog/digital converter for converting the received analog input signal into a digital signal. A carrier freguency loon detects a carrier freguency of the received analog input signal. A clock phase loon detects a clock phase of the received analog input signal. A control circuit is switchable between a receive mode of operation and a test mode of operation. In the test mode, the control circuit applies a center freauency adiusting signal to the carrier freauency loon for adiustment of a center freguency and applies a freguency band adjusting signal to the clock phase loon for adiustment of a freguency bandwidth to measure power level values for the entire freauency band of the received analog input signal.

Abstract: A circuit and method for judging a latent short-circuit defect, also known as a short-circuit defect with time passing, in the case of a high voltage system. A detection-dedicated wiring for detecting a short-circuit defect is provided between a first high voltage system wiring and a second high voltage wiring. A power supply and an ammeter is connected in series and one end of it is connected to the high voltage system wiring and the other end of it is connected to the detection-dedicated wiring. If a current value us higher than a predetermined value when the power supply is turned on, one can judge that the circuit has a high possibility of the latent short-circuit defect.

Abstract: A RF and pulse bias tee for use with a source measure unit (SMU) includes a SMU source terminal; a SMU measure terminal; an output terminal; a SMU measure terminal pulse/RF block between the SMU measure terminal and the output terminal; a SMU source terminal high frequency block having two end nodes and an intermediate node, the end nodes being connected between the SMU source terminal and the output terminal; a RF input; a pulse/DC block between the RF input and the output terminal; a pulse input; and a DC block between the pulse input and the intermediate node.

Abstract: Various component parts of a driver circuit for drive sources such as electric motors and clutches, such as relays and FETs as well as the drive sources can be tested by selectively energizing the relays and evaluating the voltage levels of the selected points by using the first and second test voltage detection circuits. This testing process is typically executed before the power up of the drive circuit. The test current is so small that the drive sources would not be inadvertently activated and various components would not be damaged even when there is any faulty component in the driver circuit. When any faulty component is detected in the testing process, the driver circuit may be prevented from being powered up so that any undesired operation of the drive sources or permanent damage to various components owing to such a faulty component may be avoided.

Abstract: For the purpose of readily specifying a portion of the circuit which has a high possibility of error occurring due to a variation in the supply voltage so that the specified vulnerable portion is countermeasured in a mask layout process, a simulation section simulates the operation of a semiconductor integrated circuit to obtain a transition timing of an input signal that is input to each circuit element. A simultaneous-operation circuit element number detecting section detects, based on a result of the simulation, the number of circuit elements which are supplied with the supply voltage through a common power supply line and in which transition timings of input signals occur within a predetermined time interval (e.g., 0.3 ns or shorter). A supply voltage variation level estimating section estimates the variation level of the supply voltage according to the number of circuit elements which is detected by the simultaneous-operation circuit element number detecting section.

Abstract: The present invention provides novel methods and devices for testing/verifying the configuration of one or more microfluidic elements in a microfluidic device. In particular the methods and devices of the invention are useful in testing for blockages or the presence of air bubbles in microfluidic elements.

Abstract: The transmitter of the circuit breaker locator draws large amplitude, short duration, phase locked unipolar pulses of current from the power source at a frequency lower than that of the AC line frequency. The audible and visual indicators of the transmitter are triggered at the rate of the current pulses drawn from the AC line. The receiver of the circuit breaker locator has a pick-up coil that responds to magnetic field surrounding the circuit breaker, an amplifier for boosting the signal from the pick-up coil, and a single shot pulse stretcher triggered by the amplifier. The pulse stretcher drives both audible and visual signals, and at the same time charges a memory capacitor in a staircase generator fashion. The magnitude of the memory capacitor voltage in turn controls the gain of the amplifier. A switch controls the voltage applied to the amplifier, which increases by a predetermined amount when released.

Abstract: A filter capacitor within a phase-locked loop (PLL) can be tested using a built-in test circuit. The PLL's charge pump is deactivated while a test-current source is activated to supply a test current to the PLL filter capacitor. When the test current is larger than any leakage currents through the capacitor, the capacitor's voltage rises above a reference voltage. A test comparator compares the capacitor's voltage to the reference voltage and signals a good test result when the capacitor's voltage rises above the reference voltage. When leakage current is larger than the test current, the capacitor's voltage cannot rise above the reference voltage and the test comparator signal a leakage failure. The test current source can share a bias voltage with the charge pump and can drive the capacitor to a voltage higher than the charge pump does to increase leakage and stress during testing.

Abstract: A sampling voltage is periodically applied between contacts of a switch of a device to determine a status of the switch. When a CPU is in a sleep state and the status of the switch is determined closed, the CPU is activated. The sampling voltage when the CPU is in the sleep state is adjusted lower than the one when the CPU is in the wakeup state. This reduces power consumption for the switch status determination. The sampling voltage adjusted at the lower level periodically adjusted to a higher level to reduce errors in the determination due to insulation films on the contacts.

Abstract: In a direct current motor drive bridge circuit structured such that a pair of forward rotation switching elements and a pair of reverse rotation switching elements are alternately connected annularly, a direct-current motor is interposed between diagonal node points on one side, and a power source voltage is applied to a portion between diagonal node points on another side via an existing resistance. A fault detection apparatus of the direct-current motor drive bridge circuit is provided with a fault detection circuit for detecting an electric potential of the one node point r to which the power source voltage is applied via the existing resistance and for detecting a closed-circuit fault of the switching elements and on the basis of a fluctuation of the electric potential.

Abstract: In an open-circuit detecting circuit, a current detecting circuit converts current flowing from a driving circuit to a load to a voltage. A comparator circuit compares the voltage with a reference voltage and outputs a signal according to a result of the comparison to a D flip-flop. An open-circuit is determined based on an output of the flip-flop, which is outputted when a clock signal indicating a falling edge of a PWM signal outputted from a PWM signal generating circuit is inputted.

Abstract: The present invention provides an apparatus and method for improving the accuracy of circuits. The apparatus includes a replicate circuit and a trim determination circuit. The trim determination circuit includes a measurable circuit element and determines the state of the measurable element. The replicate circuit includes a replicate circuit element which has similar electrical characteristics as the measurable element, and is configured to aid in determining an adjustable test current. The trim determination circuit generates a test current which is proportional to the adjustable test current. The test current is passed through the measurable element such that a first voltage drop occurs across the measurable element. A measured current is generated at a current level dictated by the voltage drop across the measurable element, such that the state of the measurable element is determined by the difference between the measured current and a scaled reference current.

Abstract: A method and apparatus for testing filter/protector units positioned along a fiber optic cable are disclosed. The fiber optic cable includes a metallic sheath surrounding the cable and several filter/protector units positioned along the cable. A cable locating unit generates an electric signal. The metallic sheath conducts the electrical signal. The electric signal creates a voltage within the metallic sheath. The voltage level is below a specified flashover point or threshold of a normally operating filter/protector unit. As a result, any filter/protector units that are triggered by the electric signal are considered faulty.

Abstract: A fuse detection circuit has; a fuse (102) under detection to produce a first voltage in the first arm in response to a read signal; a reference fuse (108) to produce a second voltage in response to the read signal; a sensing circuit (124) to sense the first voltage and the second voltage as status value data of the fuse under detection; a latch circuit (136) to keep the data in the sensing circuit; and a timing control circuit (138) to turn off the fuse bridge circuit independently of the read signal.

Abstract: An apparatus for determining the performances of at least one micromachined or microelectromechanical device (MEMS device) intended to carry a high frequency signal having an intended working frequency is disclosed. The MEMS device comprises a capacitive structure with at least one movable part, able to move with a frequency. The apparatus comprises a voltage signal source, at least one voltage divider circuit arranged between the capacitive structure and the voltage signal source, and a detection unit for detecting and measuring the voltage at the outlet of the voltage divider. The detection unit provides a combined voltage signal of an actuation voltage able to act on the moveable part of the capacitive structure with an actuation frequency and of a measurement voltage having a measurement frequency lower than the intended working frequency.

Abstract: A method and apparatus are provided for implementing direct attenuation loss measurement in an electronic package. A sinusoidal voltage source signal of a selected frequency is coupled to an embedded transmission line test structure in the electronic package. Receive circuitry is coupled to the transmission line test structure for detecting amplitude of a received sinusoidal voltage source signal to identify attenuation loss through the transmission line test structure. An identified attenuation loss of the transmission line test structure is compared with a threshold value for verifying acceptable attenuation of the electronic package transmission line test structure.

Abstract: A digitizing ohmmeter system for providing a digital resistance ratio measurement includes a high impedance current source providing a DC excitation current to an impedance-varying input sensor and a reference resistor and an ADC circuit including a charge-balancing modulator and a digital post processing circuit. The same DC excitation current passes through both the input sensor and the reference resistor. The system utilizes a switched capacitor input stage to sample the voltage across the input sensor and the voltage across the reference resistor to generate an input voltage step and a reference voltage step which are coupled to the modulator of the ADC circuit. The digitizing ohmmeter system thereby realizes fully ratiometric operation such that neither a precise current source nor a precise voltage source is required for accurate resistance ratio measurements and only a stable known reference resistor is necessary for accurate absolute resistance measurements.

Abstract: The present invention provides an inspection apparatus and an inspection method capable of inspecting at a high speed by using a sensor having flexibility and excellent productivity. When a circuit board 100 as a subject of inspection is selected, CAD data of the circuit wiring 101 on this circuit board 100 is analyzed to detect the position of the end of each wiring. Then, two or more sensor elements adjacent to the end (from which the voltage variation can be detected) are specified. The switching circuit 16 is controlled to connect the selected sensor elements to an output terminal 12 and to connect the remaining sensor elements to the GND terminal 15. In this state, when an voltage is applied to one of the selected circuit wirings and then an inspection signal (voltage variation) is output from the output terminal 12, it will be determined that no disconnection exists in the circuit wiring.

Abstract: The current mirror configuration includes four branches, a biasing branch, a first comparator branch, a second comparator branch and a measurement branch. The measurement branch is connected to a pad of the IC device and a measurement current is charged on to the pad. The measurement current is mirrored from the current of the biasing branch and the measurement current is mirrored to the second comparator branch. The biasing branch is mirrored to the first comparator branch using a scale that the current of the first comparator branch is smaller than the current of the biasing branch. In case of a short-circuit, the current of the measurement branch is larger than the current of the first comparator branch.

Abstract: A method of actuating electrical components of a vehicle, such as a heavy duty truck, for performing diagnostic analysis on the electrical components on the truck without the assistance of a technician is disclosed. The method includes relaying a signal from a remote transmitter to a receiver aboard a vehicle and actuating electrical components on the vehicle in response to the signal from the transmitter.

Abstract: In a signal supply apparatus such as might find use in an electro-optical device, signals that are supplied from multiple digital-to-analog converters are subject to impedance conversion by respective voltage followers, and provided as outputs to control the operation of the device. In the signal supply apparatus in a diagnostic examination mode, switching elements are operated so that output lines of the voltage followers are short-circuited by an output examination line. A current value measured as a result of the short circuit is compared with a specified current value to make a good-or-bad determination for the signal supply apparatus.

Abstract: The invention relates to a method and an installation for fast location of a fault in an integrated circuit. A sequence of NRZ location vectors is created, the abnormal location vectors are determined, for which the value of the electrical consumption current at rest IDDQ of the circuit is abnormal, at least one set of images is produced with an abnormal location vector, and at least one abnormal vector image is compared with a reference image.

Abstract: An oxygen sensor abnormality detecting device has first and second offset circuits for applying first and second offset voltages to a ground line and an output line of an oxygen sensor. The device compares the voltage of the output line with a high voltage-side shorting determination value, a low voltage-side shorting determination value and a break determination value to detect a high voltage-side shorting, a low voltage-side shorting and a line break.

Abstract: A measured value detecting apparatus includes a measuring unit possessing a winding coil capable of generating an output signal corresponding to a measured value and independent of a direct-current component, a detecting unit possessing a receiving unit for receiving the output signal and determining the measured value based upon the output signal received by the receiving unit, an output transmitting line for transmitting the output signal from the measuring unit to the detecting unit, a potential offsetting means for changing the direct-current component of the output signal on the output transmitting line, and a malfunction detecting means for detecting malfunction of the output transmitting line based upon the direct-current component of the output signal.

Abstract: Filter/protection units positioned along a fiber optic cable are tested. The fiber optic cable includes a metallic sheath surrounding the cable. A cable locating unit generates an electric signal. The metallic sheath conducts the electrical signal. The electric signal creates a voltage within the metallic sheath. The voltage level is below a specified flashover point or threshold of a normally operating filter/protector unit. As a result, any filter/protector units that are triggered by the electric signal are considered faulty.

Abstract: A method for isolating a fault in an aircraft circuit having a lead conductor and a plurality of branch conductors coupled to the lead conductor is disclosed. The method includes coupling a reference line of a device to a ground of the lead conductor, coupling a supply/return line of the device to the lead conductor, supplying an impulse signal to the supply/return line, and receiving a reflected signal that is produced from the impulse signal. The method also includes determining whether a fault exists in the plurality of branch conductors using the reflected signal, coupling the reference line of the device to a ground of the plurality of branch conductors, coupling the supply/return line of the device to one of the plurality of branch conductors, and supplying a signal to the supply/return line.

Abstract: Methods, computer program segment and apparatus for analyzing high voltage circuit breakers are provided. The method includes electrically coupling each circuit breaker contact to ground, applying a test voltage across a circuit breaker contact, measuring an output voltage signal that is proportional to a capacitance of the circuit breaker contact, changing a state of the circuit breaker contact pair from at least one of an open position to a closed position and the closed position to the open position, and detecting a step change of the output voltage that corresponds to the change of state of the circuit breaker. A circuit breaker test device is provided. The device includes a test voltage source, a filter circuit, and an output circuit for measuring the circuit breaker contact pair capacitance, wherein the test voltage source and filter circuit are configured to be coupled to the circuit breaker contact pair during testing.

Abstract: A process for automatically assigning detector addresses in a danger detection system, comprising a master station and at least one two-wire detection line linked thereto to which a multiplicity of detectors are connected wherein each detector has a capacitor for power accumulation, a measuring resistor in one wire, an evaluation device evaluating the voltage drop on the measuring resistor to which an address latch is connected, and a switch controllable by the evaluation device between the wires.

Abstract: The present invention relates to a method for testing a conductor element (20) applicable to locating a continuity defect of the conductor element, the conductor element having, relative to a reference conductor, an insulation resistance and a leak capacitance. According to the present invention, the method comprises a step of injecting into the conductor element at least two currents (i1, i2) of different frequencies by means of a current or voltage generator (23), one terminal of which is connected to the reference conductor, at least one step of measuring the amplitudes of currents at one measuring point (Pi) chosen along the conductor element, and a step of calculating the imaginary part of currents and/or calculating the leak capacitance of the conductor element downstream from the measuring point (P1).

Abstract: A defect detection of light-emitting diodes (LEDs) is electrically performed on a large-scale display, comprising a plurality of light-emitting diodes arranged by a predetermined arrangement on an image display face, voltage detection portions for applying a constant current to a plurality of light-emitting diodes in an off region at a forward voltage or less in accordance with an input of a signal indicating a defect detection mode and detecting voltages between terminals of light-emitting diodes arising when the constant current flows there through, and a defect detection portion for electrically detecting a defect from the plurality of light-emitting diodes based on detection results of the voltage detection portion; and drive circuit devices (driver ICs) having the above configuration are serially connected and an electric signal indicating a result of defect detection is output from its final stage.

Abstract: In a direct-current motor drive bridge circuit structured such that a pair of forward rotation switching elements and a pair of reverse rotation switching elements are alternately connected annularly, a direct-current motor is interposed between diagonal node points in one side, and a power source voltage is applied to a portion between diagonal node points in another side via an existing resistance. A fault detection apparatus of the direct-current motor drive bridge circuit is provided with a fault detection means for detecting an electric potential of the one node point r to which the power source voltage is applied via the existing resistance and for detecting a closed-circuit fault of the switching elements and on the basis of a fluctuation of the electric potential.

Abstract: A method for analyzing an electrical contact pair is provided. At least one of the contacts is coupled to a line-side of the contact pair, and at least one of the contacts is coupled to a load-side of the contact pair. The method includes electrically coupling the load-side contact and the line-side contact to electrical ground, applying a test voltage across the contact pair while the line-side contact and load-side contact remain electrically coupled to electrical ground, triggering a contact pair operation timer at a start of a test, detecting at least one of a first closure of the contact pair and a first opening of the contact pair using the test voltage, and determining the timing of the contact pair based upon the operation of the contact pair operation timer.

Abstract: Methods and apparatus to detect terminal open circuits and short circuits to ground in inductive head write drivers are presented. A exemplary method is provided for detecting a short-circuit condition at at least one of a pair of write head terminals of a write driver, the write driver producing a write current that, when passed through a inductive head assembly coupled to the pair of write head terminals, polarizes the inductive head according to a direction of the write current. The method includes the step of generating a first current that is proportional to at least a portion of the write current that flows in a first direction into a first write head terminal of the write driver. A second current is generated that is proportional to at least a portion of the write current that flows in a second direction, opposite the first direction, into a second write head terminal of the write driver.

Abstract: A method and system for determining the resistance of a winding insulation. The method includes applying a pulsed voltage having a maximum value and a minimum value to the winding insulation. The maximum and minimum values of the pulsed voltage are both negative values in certain exemplary implementations. The values of the maximum and minimum current flowing through the winding insulation are determined, and the winding insulation resistance is calculated based on the difference between the maximum and minimum current. A ground fault may be detected based on the calculated winding insulation resistance. The winding insulation monitoring system includes a sense resistor connected to the winding insulation and a pulsed voltage source is coupled to the sense resistor to apply the pulsed voltage to the winding insulation via the sense resistor.