Abstract: The invention measures the X-parameters (or large-signal S and T scattering functions, sometimes called linearized scattering functions, which are the correct way to define “large-signal S-parameters”) with only two distinct phases for small-signals on a frequency grid established by intermodulation frequencies and harmonics of the large-tones, with guaranteed well-conditioned data from which the X-parameter functions can be solved explicitly, without the need for regression, and not limited by performance limits of the reference generator or phase-noise.

Abstract: The invention relates to an operating device (1) with an adjustable lever (2) and a sensor mechanism (8), comprising a transmitter coil (5), which may be energised with an alternating current by means of an alternating current supply (7) and a receiver coil arrangement (9). According to the invention, such an operating device may be designed such as to be reliably useful even with intense interference with a construction as technically simple as possible without complex screening measures, wherein the frequency of the alternating current energising the transmitter coil (5) and the pass frequency of a receiver filter (13) in the receiver coil arrangement (9) are synchronously changed according to a preset programme by means of a control unit (14), such that, by means of the operating device (1) and the method carried out therewith, a change to a frequency which is interference or interference signal free can be continuously carried out.

Abstract: In some embodiments, each interferometric modulator has a stiction threshold voltage. If a voltage above the stiction threshold voltage is applied to the interferometric modulator, the interferometric modulator enters a stiction state permanently, i.e., becomes “stuck,” and the interferometric modulator becomes inoperable. Disclosed are apparatuses, methods and computer-readable media for testing a panel of interferometric modulators. A ramped voltage waveform is applied to a plurality of interferometric modulators of the panel. In response to applying the ramped voltage, the stiction threshold voltage is identified. At or above this voltage, the number of stuck interferometric modulators in the panel reaches or exceeds a first threshold number, for example, 50% of the total number of the interferometric modulators constituting the panel. The embodiments can be used to establish stiction benchmark for panel manufacturing processes, to collect data for generating statistical distribution, etc.

Abstract: A method includes receiving information related to an operational status of at least one radiating component, and controlling an operation of a lightning detector at least partially in accordance with the information.

Abstract: The exemplary embodiments of this invention describe a method for determining context information using EMI patterns. The method includes determining emitter information of a measured interference signal. A context is determined based upon the emitter information. Determining the interference signal emitter may also include comparing the measured interference signal to known interference signals. At least one setting of a device may be changed based upon the determined context. Various embodiments of apparatus are also described.

Abstract: The disclosed embodiments relates to a method and an apparatus for determining the interfering field strength in an aircraft and the impairment of an electric system in the aircraft including cables between the outer shell and the interior paneling of the fuselage for transmitting signals within the aircraft. In order to enable direct and reliable determination of interfering field strength in an aircraft and assessment of the electromagnetic vulnerability of the communications system in the aircraft depending on the results of the determination, either a predetermined transmission signal is fed in at least one leaky line between outer shell and paneling of the fuselage and the reception signal that is irradiated by the leaky line is received with a receiver, or a predetermined transmission signal is transmitted with a transmitter and the reception signal is extracted from the leaky line. Subsequently the amplitudes of the transmission and the reception signals are compared with each other.

Abstract: One embodiment of the present invention provides a system that facilitates high-sensitivity detection of an anomaly in telemetry data from an electronic system using a telemetric impulsional response fingerprint of the telemetry data. During operation, the system applies a sudden impulse step change to one or more operational parameters of the electronic system during operation. Next, the system generates a three-dimensional (3D) telemetric impulsional response fingerprint (TIRF) surface from a dynamic response in the telemetry data to the sudden impulse step change. The system then determines from the 3D TIRF surface whether the telemetry data contains an anomaly.

Abstract: A portable test apparatus for conducting a plurality of tests on a communications device is provided. The unit 102 comprises a control panel 105 comprising at least one display 108 for displaying test information form the device under test. The apparatus includes a frequency mixing assembly 118, an amplifier module 119, a voltage regulator module 120 and a frequency module 120. The apparatus allows a user to measure a number of parameters including but not limited to power, return loss and passive intermodulation products.

Abstract: A method for verifying the integrity of the electrical connection between at least one signal path of a substrate and at least one respective contact of a component mounted on the substrate is disclosed. The method includes generating a step signal on one of the at least one signal path connected to a respective contact, and capturing a capacitively coupled signal due to the step signal at the contact. The method further includes determining the integrity of the electrical connection from a characteristic of the capacitively coupled signal or a response signal obtained from the capacitively coupled signal. A tester in which the method is implemented is also disclosed.

Abstract: There is provided a test apparatus for testing a device under test including a pre-emphasis circuit. The pre-emphasis circuit emphasizes a predetermined component of an output signal of the device under test and outputs the resulting output signal. Here, the test apparatus includes a filter that eliminates an emphasized component that is generated by the pre-emphasis circuit, from the output signal output from the device under test, and a testing section that measures the output signal output from the filter, and judges whether the device under test is acceptable based on a result of the measurement. The test apparatus can accurately test the pre-emphasis function of the device under test including the pre-emphasis circuit.

Abstract: A module to test electromagnetic compatibility of at least one high speed Ethernet interface onboard an aircraft. The module includes a cable less than 1 meter long, the ends of which are fitted with two aircraft contacts, two standard connectors compatible with standard test equipment, and a mechanism simulating attenuation of a test cable.

Abstract: A signal suppression filter (22) that inhibits high-frequency signals contained in power voltage and a signal separation filter (23) that prevents transmission of the high-frequency signals are provided in series on power lines (21A), (21B) connected to a power input terminal (T1), and a common-mode signal detection circuit (25) and a normal-mode signal detection circuit (26) are provided separately from each other. While bi-directionally blocking transmission of a high-frequency signal (noise) between the power supply and the device to be measured by the signal suppression filter (22) and the signal separation filter (23), the common mode signal and the normal mode signal generated in the device to be measured (3) and entering through a power output terminal (T2) are detecting separately. The analysis of the cause of occurrence of a high-frequency signal produced in the device to be measured (3) is facilitated, and proper noise countermeasure may be taken.

Abstract: Methods and systems are provided for determining efficacy of stress protection circuitry. The methods and systems employ a ring oscillator that models at least one parameter of a functional circuit to be protected by the stress protection circuit. A stress signal is applied to the ring oscillator and parametric degradation is measured to determine the effectiveness of the stress protection circuit in protecting the ring oscillator. A stress signal can be a voltage or current that stresses the normal operation of a functional circuit. The parametric degradation of the ring oscillator can be correlated to the parametric degradation that would be experienced by the functional circuit.

Abstract: A method (for example, machine-implemented, e.g., via a receiver), for determining whether a transmitted pulsed-signal is a linear or non-linear frequency modulated (FM) signal, includes: iteratively determining upper and lower bound slopes associated with frequency components of a pulse of a signal during a time period of the pulse; and comparing each determined upper bound slope to a previous or initial upper bound reference slope and comparing each determined lower bound slope to a previous or initial lower bound reference slope in order to determine the linearity, or non-linearity, of the signal.

Abstract: An improved method for determining whether a measurement point, measured using a differential absorption LIDAR (DIAL) system, represents a plume point or a non-plume point. Concentration path lengths (CPL's) for a plurality of measurement points are determined. An average non-plume CPL, CPL, is provided. For each measurement point, a standard deviation, CPLsd, is calculated based on first order error propagation and it is determined that the measurement point represents a non-plume point when the Hooshmand decision rule (HDR) is met. The HDR is given by, ( cpl - CPL _ CPL sd ) 2 > ( T ) 2 , where cpl is the corresponding CPL of the measurement point being tested and T is a threshold standard deviation level.

Abstract: An apparatus and method thereof to improve a response speed of an LCD includes a noise rejection unit and a comparator. The noise rejection unit rejects noise in current digital image data and previous digital image data at a same pixel position as in the current digital image data. The comparator compares the current digital image data and the previous digital image data of which noises are rejected within a reference value, changes the current digital image data based on a comparison result, and outputs a result indicative thereof.

Abstract: The resolution and contrast of impedance measurements and scans are improved by using a non-contact impedance probe comprising an inner conductor configured to bear a measurement signal and an outer conductor configured to bear a shielding signal. The measurement signal and shielding signal are selected to increase the directionality of the flux emitted from the impedance probe. In one embodiment, the measurement signal and the shielding signal are phase locked signals. A sample may be placed in a basin having a conductive surface that receives the flux emitted from the impedance probe. By filling the basin with a conductive solution, direct contact between the probe and the sample may be avoided along with the associated variability in contact resistance. The small highly-directional flux emitting area achievable with the present invention enables high resolution high contrast non-contact scanning of biological and non-biological materials.

Abstract: Determining the RF shielding effectiveness of a shielding structure including measuring RF isolation between a first and a second element of a directional coupler and providing a first measurement result, placing a shielding structure so that a part of the shielding structure is substantially between the first element and the second element of the directional coupler, measuring RF isolation between the first element and the second element of the directional coupler RF and providing a second measurement result, and determining the shielding effectiveness of the shielding structure based at least in part on the first and the second measurement result.

Abstract: A measuring device is provided for measuring intermodulation distortion of a measuring object. The measuring device includes a first signal generator which produces a first signal that is supplied to an input of a measuring object, a signal combining device having a first input which is connected to the output of the measuring object, and a signal analyzing device which is connected to the output of the signal combining device. According to the disclosure, a second signal generator which is synchronized with the first signal generator is provided, and second signal generator producing a second signal that is supplied to a second input of the signal combining device.

Abstract: A method of measuring a DUT provides a vector network analyzer with at least two measurement ports and measures characteristics of thru, reflect, and line calibration standards at the measurement ports. Error coefficients are calculated as well as a shifted electrical length attributable to the measured calibration standards. S-parameters of the DUT are measured and corrected based upon the error coefficients. A reference plane is shifted for each element of the corrected S-parameter matrix to a measurement reference plane, and ? SA_portn ? LA_portm = S 21 ? _thru ? _nm ? S 12 ? _thru ? _nm wherein S21—thru—nm is equal to S12—thru—mn and an argument of both solutions for S21—thru—nm is fit to a straight line, the solution having a y-intercept closest to zero being a correct solution and a resulting argument of the correct solution being the electrical delay.

Abstract: A noise measuring unit 24 measures a noise power based on an output from a digitizer 16 and the amplification factor of a limiter amplifier 12 when an output from a device under test 10 is supplied for the digitizer 16 through the limiter amplifier 12. Since the output from the device under test 10 is supplied through the limiter amplifier 12, the noise component is sufficiently amplified, the carrier component saturates, and thus, the noise measuring unit 24 easily measures the noise power. At this time, the output frequency of the device under test 10 is not multiplied, and thus, it is not necessary to use a down converter or a spectrum analyzer, the C/N ratio can be measured at a high speed or with a simple constitution.

Abstract: A system and method can be utilized to determine S-parameters of a network. In one embodiment a system includes an S-parameter calculator that computes the S-parameters of the network based on waveform parameters determined from single port measurements. At least one of the single port measurements corresponds to measurements at one of the plural ports while a matched load is applied to at least another of the plural ports.

Abstract: In contrast with a known dynamic gate-level simulation method, a method of analyzing electromagnetic interference (an EMI analysis method) according to the present invention enables estimation of EMI noise, by means of calculating signal propagation of each node through use of the signal propagation probability technique, and calculating variation time of each node through use of “the Static timing analysis technique”. In short, the present invention is characterized in calculating a frequency characteristic from the relationship between toggle probability of each node and delay in each node.

Abstract: A method, apparatus and article of manufacture to aid in the characterization of a device establishes a device S-parameter matrix (SD) to represent electrical behavior of the device, an adapter T-parameter matrix (Ta) to represent all possible electrical paths through circuits to all device ports of the device, and a cascaded S-parameter matrix (Sc) to represent the circuits cascaded with the device. Values for the adapter T-parameter matrix are obtained either through measurement or modeling. The device cascaded with the circuits is measured to obtain values for the cascaded S-parameter matrix, permitting use of a general solution for the device S-parameter matrix as a function of the adapter T-parameter matrix and the cascaded S-parameter matrix.

Abstract: According to one embodiment, a method for isolating degradation mechanisms in transistors includes providing a ring oscillator having a plurality of delay elements. Each delay element operates as a delay element through the use of one or more transistors of only a first type and no transistors of the opposite type. The method further includes operating the ring oscillator and measuring the frequency resulting from the ring oscillator over time. The magnitude of an isolated degradation mechanism is determined based on a comparison of the measured frequency and an expected frequency for the ring oscillator absent degradation.

Abstract: A method and a circuit for detecting variations of at least one environmental parameter of an integrated circuit, including evaluating a propagation delay of an edge in delay elements sensitive to variations of the environmental parameter, and comparing the present or measured delay with at least one reference value.

Abstract: A signal under measurement x(t) is transformed into a complex analytic signal zc(t), and an instantaneous phase of the xc(t) is estimated using the zc(t). A linear phase is removed from the instantaneous phase to obtain a phase noise waveform ??(t) of the x(t), and the ??(t) is sampled at a timing close to a zero-crossing timing of the x(t) to obtain a timing jitter sequence. Then a difference sequence of the timing jitter sequence is calculated to obtain a period jitter sequence. The period jitter sequence is multiplied by a ratio T0/Tk,k+1 of the fundamental period T0 of the x(t) and the sampling time interval Tk,k+1 to make a correction of the period jitter sequence. A period jitter value of the x(t) is obtained from the corrected period jitter sequence.

Abstract: The invention pertains in general to the testing of the operation of radio and other data transmission apparatus. In particular the invention pertains to the testing of the operation of a digital radio apparatus on the basis of error statistics. In order to test functions relating to data transmission, a simulation system produces a pseudorandom bit sequence or some other test sequence which is packed into downlink frames and sent to the data transmission apparatus tested. In accordance with the invention, a known number of errors are generated in the test sequence. As the data transmission apparatus tested compares the received test sequence to the sequence it has produced, it detects the errors in the received sequence and compiles various error statistics, e.g., in the form of bit error ratio (BER) or frame erasure ratio (FER).

Abstract: An antenna is provided with an electronic component or circuit that has a value corresponding to properties of the antenna. A read mechanism reads the value and sets an operational status of a transceiver based on the value. In one embodiment, electronic component is a resistor having a value that identifies the antenna properties. A table may be used to correlate resistor values to different types of antennas or sets of antenna properties. Alternatively, the circuit can be embodied in a microchip that provides a response to a challenge sent by the read mechanism. The response encodes the properties of the antenna. The encoding scheme includes values from the challenge. Alternatively, the response is a code that is indexed into a table of antenna properties. In one embodiment, the antenna is connectorized.

Abstract: A test apparatus for testing an electronic device includes a pattern generating unit for generating a test pattern to test the electronic device, a reference clock generating unit for generating a reference clock, a timing generator for generating a timing signal, an output signal sampling circuit for sampling the output signal outputted by the electronic device in response to the test pattern at the timing based on the timing signal generated by the timing generator, wherein the timing generator includes a variable delay circuit unit for receiving, delaying and outputting the reference clock, and a delay control unit for controlling the delay amount of the variable delay circuit unit, and the delay control unit controls the delay amount based on the basic timing data and the variable delay amount which is smaller than the basic timing data.

Abstract: Method and apparatus for discovery of operational boundaries for shmoo tests. Specifically, a method of testing operational boundaries is described in one embodiment of the present invention. The method discloses the discovery of an operational range for a hardware device over a plurality of varying operating parameters. The operational range is discovered by testing points, as defined by the plurality of varying operating parameters, to discover an operational boundary of the device. The operational boundary comprises a plurality of boundary points that lie just outside of the operational range of the device. The operational boundary is discovered automatically and without testing all of a plurality of interior operational points within the operational boundary.

Abstract: A method, apparatus and article of manufacture to aid in the characterization of a device establishes a device S-parameter matrix (SD) to represent electrical behavior of the device, an adapter T-parameter matrix (Ta) to represent all possible electrical paths through circuits to all device ports of the device, and a cascaded S-parameter matrix (Sc) to represent the circuits cascaded with the device. Values for the adapter T-parameter matrix are obtained either through measurement or modeling. The device cascaded with the circuits is measured to obtain values for the cascaded S-parameter matrix, permitting use of a general solution for the device S-parameter matrix as a function of the adapter T-parameter matrix and the cascaded S-parameter matrix.

Abstract: An exemplary system for measuring noise in a device comprises a CPU, a memory coupled to the CPU, an interface coupled to the CPU for providing instructions processed by the CPU, a control unit coupled to the interface for receiving the instructions, a preamplifier circuit coupled to the control unit for implementing the instructions, a power supply unit controlled by the control unit for providing power to the preamplifier circuit, and a device holder selectively attached to the preamplifier circuit. In an exemplary embodiment, the preamplifier circuit further comprises a plurality of filters, an amplifier circuit, a plurality of switches for switching the amplifier circuit between a voltage amplifier mode and a current amplifier mode, and a variable loading resistor.

Abstract: The likelihood of a system complying with EMC regulations is determined for a system comprised equipment units which individually radiate electromagnetic emissions. The intensity contribution of the electric field from each of the equipment units is calculated and a phase difference is randomly assigned to each of the components repeatedly in order to generate distribution of electric field values between a minium possible electric field value and a maximum possible electric field value. This distribution is then statistically analysed to determine a compliance probability.

Abstract: In a reproduction apparatus having a logic and control unit, and a fuser assembly including a heated fuser roller and a sensor for sensing the temperature of such fuser roller by utilizing heat to change sensor resistance to provide an electrical signal corresponding to the fuser temperature, for the logic and control unit, a method for detecting erratic resistance in the temperature sensor. The method includes the steps of, at preselected time intervals, comparing a current temperature reading to a previous temperature reading, and determining if the temperature sensing system indicates that the temperature has changed by more than a predetermined amount based upon reproduction apparatus operating characteristics. If the temperature sensing system indicates, from the determining step, that the temperature has changed by more than a predetermined amount, an indication that an error has occurred is made.

Abstract: A parameter extraction technique for an electrical structure is based on a definition of network parameters that isolates pure mode responses of the electrical structure, and that makes mode conversion responses of the electrical structure negligible. A set of network parameters is obtained that represents pure mode responses for the electrical structure (410). These network parameters are processed to obtain model parameters that characterize each pure mode response (422, 424, 426, 428, 432, 434, 436, 438). Preferably, the mode specific parameters to combined to obtain mode independent parameters, such as coupling factor, propagation constant, and characteristic impedance values (440, 450).

Abstract: A radio frequency (RF) multi-testing apparatus and method for rapid (e.g. production line) testing of a wireless communications device for operational adherence of the device to a pre-determined reference specification defining specific absorption rate (SAR) parameters correlated to the device and for simultaneous testing of the body loss of the device. The device is positioned within an RF shielded enclosure and operated at a test transmit power. A linear array of E-field isotropic probes (e.g. five) are positioned at a predetermined location in the container within human tissue simulation matter and measure the electric-field therein. A plurality of RF isotropic probes are spatially distributed within the container and measure the RF power received thereby, with the container providing reflective surfaces therein. Computer processing apparatus compares the electric-field measurements to the SAR reference specification and determines therefrom whether the device adheres to the specification.

Abstract: In a semiconductor integrated circuit, a selector 1 selects a signal FB at the input thereof by giving a proper level to a signal EN. By setting two-phase scan clocks SC1, SC2 of F/F 2,4 so that F/F 2,4 are set to the through state, a signal can be passed from F/F 2 to F/F 4 under a through state in the above circuit. Further, there can be fabricated a critical path-ring oscillator which is self-oscillated in the critical path by negatively feeding back the output of F/F 4 to F/F 2 through the signal FB. The logic in the ring is required to be an inverted logic. In a test other than a speed screening test or at the normal operation time, a proper level is given to the signal EN so that the selector 1 is switched to select the input side, thereby cutting a negative feedback path through which the output of F/F 4 is negatively fed back to F/F2.

Abstract: An S-parameter measurement technique allows measurement of devices under test (DUTs), such as power amplifiers, which require a modulated power tone drive signal for proper biasing, in combination with a probe tone test signal, wherein both the modulated and probe tone signals operate in the same frequency range. The technique uses a stochastic drive signal, such as a CDMA or WCDMA modulated signal in combination with a low power probe tone signal. A receiver in a VNA having a significantly narrower bandwidth than the modulated signal bandwidth enables separation of the modulated and probe tone signals. VNA calibration further improves the measurement accuracy. For modulated signals with a significant power level in the frequency range of the probe tone signal, ensemble averaging of the composite probe tone and power tone signals is used to enable separation of the probe tone signal for measurement.

Abstract: An apparatus and method is disclosed for measuring and tuning circularly polarized antennas to simultaneously optimize axial ratio, resonant frequency, and impedance match. The antenna under test is mounted within the test apparatus. Located in the zenith and far field of the antenna are two rigidly mounted, orthogonal, and planar probes. The amplitude and phase developed by the antenna is measured at each probe. The computer calculates the zenith axial ratio from the measured amplitude and phase difference between the probes. The method further includes the steps to determine sense-of-rotation of the circular polarized wave, impedance match, and resonant frequency. This apparatus and method is an elegant, simple, and cost effective design that is applicable to any isolated circular polarized radiating element.

Abstract: A method for storing status information prior to shutdown of a video monitor due to a failure. An indication of an operational parameter is obtained. Based on the indication, it is determined if the failure occurs warranting shutdown. If the failure occurs, status information is stored in a non-volatile memory for later retrieval during repair. A shutdown sequence is generated to disable the video monitor.

Abstract: A single ended, frequency domain reflectometry signal processing based scheme measures loop loss of a telecommunications wireline. A distortion-corrected, normalized data array is differentially combined with an associated set of wireline noise spectrum values. The resulting noise margin data is processed by a Shannon Theorem operator, to produce a set of N frequency bins, each containing the number of bits which the link will support for a respective tone. The bit contents of the bins represent a composite bit rate that is available for use for ADSL signalling.

Abstract: Electrical filter circuits are tested by connecting to the filter inputs without the need to connect to the filter outputs or to disconnect the outputs from a load. A signal generator of known source resistance applies a.c. signals successively over a range of frequencies to the filter inputs, and a voltmeter monitors the voltage across the filter inputs. Different types of filters have different characteristic shapes for the voltage/frequency curve, and processing is applied to the measured results in a computer to determine the location of inflections in the curve and other characteristics of the curve. Methods are disclosed for determining the values of the individual sub-components of the filter. Where the filter is an L-section filter, an interactive process is applied to successively improve the accuracy of the component value determinations. Using the techniques described enables the insertion loss of the filter also to be readily calculated by the computer.

Abstract: Electrical filter circuits are tested by connecting to the filter inputs without the need to connect to the filter outputs or to disconnect the outputs from a load. A signal generator of known source resistance applies a.c. signals successively over a range of frequencies to the filter inputs, and a voltmeter monitors the voltage across the filter inputs. Different types of filter have different characteristic shapes for the voltage/frequency curve, and processing is applied to the measured results in a compute to determine the location of inflections in the curve and other characteristics of the curve. Methods are disclosed for determining the values of the individual sub-components of the filter. Where the filter is an T-section low pass filter, an interactive process is applied to successively improve the accuracy of the component value determinations. Using the techniques described enables the insertion loss of the filter also to be readily calculated by the computer.

Abstract: A dual-directional coupler for measuring true RF power apparent at a radiating element. Incident and reflected power are detected by a pair of detectors. The difference between the two detected voltages is amplified by a differential amplifier to generate a voltage proportional to the true transmitted power.

Abstract: Electrical filter circuits are tested by connecting to the filter inputs without the need to connect to the filter outputs or to disconnect the outputs from a load. A signal generator of known source resistance applies a.c. signals successively over a range of frequencies to the filter inputs, and a voltmeter monitors the voltage across the filter inputs. Different types of filter have different characteristic shapes for the voltage/frequency curve, and processing is applied to the measured results in a compute to determine the location of inflections in the curve and other characteristics of the curve. Methods are disclosed for determining the values of the individual sub-components of the filter. Where the filter is an L-C filter, an interactive process is applied to successively improve the accuracy of the component value determinations. Using the techniques described enables the insertion loss of the filter also to be readily calculated by the computer.

Abstract: A timing adjustment circuit is used for a semiconductor test system having a plurality of test stations for testing a plurality of semiconductor devices in parallel at the same time.

Abstract: Electrical filter circuits are tested by connecting to the filter inputs without the need to connect to the filter outputs or to disconnect the outputs from a load. A signal generator of known source resistance applies a.c. signals successively over a range of frequencies to the filter inputs, and a voltmeter monitors the voltage across the filter inputs. Different types of filter have different characteristic shapes for the voltage/frequency curve, and processing is applied to the measured results in a compute to determine the location of inflections in the curve and other characteristics of the curve. Methods are disclosed for determining the values of the individual sub-components of the filter. Where the filter is C-section low pass filter, an interactive process is applied to successively improve the accuracy of the component value determinations. Using the techniques described enables the insertion loss of the filter also to be readily calculated by the computer.

Abstract: A telemetry optical fiber has a first end optically coupled to a signal source/detection module. A conversion module is optically coupled to a second end of the telemetry optical fiber. The conversion module includes an interferometer having a pair of optical paths with an optical waveguide arranged to be included in each one of the optical paths. The interferometer is arranged to produce an interference pattern to indicate the phase relationship of optical signals input to the pair of optical paths from the signal source/detection module. A phase modulator is arranged to phase modulate optical signals guided by the optical waveguide. A sensor head that produces a voltage proportional to a quantity being measured is connected to the phase modulating apparatus and arranged to provide a modulating signal to the phase modulating apparatus such that the interference pattern indicates the magnitude of the measured quantity.

Abstract: A method for measuring a common mode current (Icm) in an outer conductor of a shielded electrical connector comprising also at least one inner conductor which includes the steps of interconnecting the one inner conductor and the outer conductor at a junction point to a power source and supplying a current (Icm) to the junction point draining substantially all common mode current (Icm) from the outer conductor at the opposite side of the connector by means of a low impedance drain; and sensing the drained common mode current (Icm) with a current sensing device.