Abstract: Systems and methods for monitoring time-varying classification performance are disclosed.

Abstract: The invention comprises a method of forming a concrete structure or object. The method comprises detecting the temperature of a quantity of curing concrete and selectively adding heat to the curing concrete, so that the temperature of the curing concrete follows a predetermined temperature profile during at least a portion of the concrete curing process. Apparatus for performing the method is also disclosed.

Abstract: Various computer-implemented methods for classifying defects on a specimen are provided. One method includes assigning individual defects detected on the specimen to defect groups based on one or more characteristics of the individual defects. The method also includes displaying information about the defect groups to a user. In addition, the method includes allowing the user to assign a classification to each of the defect groups. Systems configured to classify defects on a specimen are also provided. One system includes program instructions executable on a processor for assigning individual defects detected on the specimen to defect groups based on one or more characteristics of the individual defects. The system also includes a user interface configured for displaying information about the defect groups to a user and allowing the user to assign a classification to each of the defect groups.

Abstract: In a clinical laboratory of a hospital, an enormous amount of effort has been required to maintain the quality of an analyzer, standard solution and control samples. An object of the present invention is to provide a control method for controlling a clinical laboratory with reduced cost, and a control apparatus using the same. In order to control data of an analyzer, standard solution, and a control sample, a support center is connected to each analyzer located in each hospital through a network line. Various kinds of analysis parameters and the result of measurements are exchanged so as to provide each clinical laboratory with a control situation in real time.

Abstract: A mechanical seal monitoring system and method that measure the wear of seal faces of a mechanical seal where the mechanical seal seals a rotating machine portion from another portion of the machine. The system preferably uses a wear probe movable relative to a rotating seal component so that the wear probe can contact the rotating component. The wear of the seal is preferably determined by the relative movement that is required for the wear probe to contact the rotating component. Preferably, stress waves induced by the rubbing between the probe and the rotating component are detected by a stress-wave sensor, processed by a signal processor, and either displayed to the user numerically or reported to a monitoring computer. A signal intensity comparison method is preferably used to make the detection process insensitive to background noise generated by sources other than the contact of the wear probe and the rotating component.

Abstract: Methods and apparatus for data analysis according to various aspects of the present invention are configured to identify statistical outliers in test data for components, including hybrid outliers representing outliers within subsets of larger data populations. A method and apparatus according to various aspects of the present invention may operate in conjunction with a test system having a tester, such as automatic test equipment (ATE) for testing semiconductors.

Abstract: A performance assessment system for deep geologic repository for radioactive waste disposal is introduced to integrate a number of independent sub-system to perform the repository assessments in a systematic way under computer-based environment. Basically, the sub-system includes the input data file preparation sub-system for near-field/far-field multiple running, the near-field/far-field multiple running sub-system and the uncertainty and sensitivity analysis sub-system. With the system, the assessment for the deep geologic repository for radioactive waste disposal in many aspects can be achieved more completely and precisely.

Abstract: The content of an operating instruction to each worker in a manufacturing process is controlled in the following way based on a manufacturing direction to the worker and on manufacturing achievement, work proficiency, and the like of the worker for the manufacturing direction. A deviation between a manufacturing direction and manufacturing achievement is calculated. Manufacturing direction parameters acting as factors of the calculated deviation are specified for each product to be manufactured. The above information is stored in a deviation factor database. For a new manufacturing direction, manufacturing direction parameters therein are checked against the deviation factor database to determine alarm information to be given to a worker on a manufacturing line, and the determined alarm information is outputted.

Abstract: Provided are techniques for numerically integrating an intensity distribution function over a numerical aperture in a manner dependent on a determination of whether the numerical aperture spans a Rayleigh singularity. Where a singularity exists, Gaussian quadrature (cubature) is performed using a set of weights and points (nodes) that account for the effect of the Wood anomaly present within the aperture space. The numerical aperture may be divided into subregions separated by curves where the Wood anomaly condition is satisfied. Each subregion is then numerically integrated and a weighted sum of the subregion contributions is the estimate of the integral. Alternatively, generalized Gaussian quadrature (cubature) is performed where an analytical polynomial function which accounts for the effect of the Wood anomaly present within the aperture space is integrated. Points and nodes generated from a fit of the analytical polynomial function are then used for integration of the intensity distribution function.

Abstract: An improved quality assurance system and method for point-of-care testing are disclosed. The present invention provides quality assurance for laboratory quality tests performed by a blood analysis system or the like at the point of patient care without the need for running liquid-based quality control materials on the analysis system. Quality assurance of a quantitative physiological sample test system is performed without using a quality control sample by monitoring the thermal and temporal stress of a component used with the test system. Alert information is generated that indicates that the component has failed quality assurance when the thermal and temporal stress exceeds a predetermined thermal-temporal stress threshold. Alternatively, the present invention provides quality assurance for laboratory quality tests performed by a blood analysis system or the like at the point of patient care by minimizing the need for running liquid-based quality control materials on the analysis system.

Abstract: A printing inspection apparatus includes a measurement unit and a controller. The measurement unit is configured to measure solder that is printed on a substrate with a squeegee of a screen printing apparatus, the screen printing apparatus including a plurality of squeegees that slide on a screen in different slide directions to print solder on different substrates. The controller is configured to determine a slide direction of the squeegee that prints the solder based on measured data of the solder, the measured data being obtained by the measurement unit, and execute statistical processing of inspection data of the solder based on the measured data of the solder for each of the slide directions of the squeegees.

Abstract: A method is disclosed for localizing product yield variability to a process module. The method includes obtaining fail rate and critical area data for each process module layer in a number of test chips. A variance in a defect density (DD) probability density function (PDF) is determined based on the obtained fail rate and critical area data for each process module layer. A percent contribution from each process module layer to the variance in DD PDF is determined. Based on the determined percent contribution to the variance in DD PDF from each process module layer, one or more process module layers are identified as contributing to the determined variance in the DD PDF. Additionally, a method is provided to assess the impact on product yield due to reduction in the yield variability associated with a particular process module layer.

Abstract: The invention relates to a method for computer-assisted evaluation of the performance of progressive lenses, specifically while taking into account individual parameters of a given eyeglass wearer, the individual parameters including at least personal prescription data, in particular, additional spherical, astigmatic, and/or prismatic power, and/or personal wearer data for the eyeglass wearer, in particular, forward inclination, horizontal frame inclination, corneal vertex distance, and/or interpupillary distance. The method includes the following steps: determining the individual parameters; calculating a total performance factor P in each case for at least two quality classes of progressive lenses as a function of the individual parameters, the total performance factor P being correlated with the quality of the monocular visual acuity and/or binocular visual impression; and outputting the calculated total performance factor P for the quality classes.

Abstract: A method, system and computer program product for generating device fingerprints and authenticating devices uses initial states of internal storage cells after each of a number multiple power cycles for each of a number of device temperatures to generate a device fingerprint. The device fingerprint may include pairs of expected values for each of the internal storage cells and a corresponding probability that the storage cell will assume the expected value. Storage cells that have expected values varying over the multiple temperatures may be excluded from the fingerprint. A device is authenticated by a similarity algorithm that uses a match of the expected values from a known fingerprint with power-up values from an unknown device, weighting the comparisons by the probability for each cell to compute a similarity measure.

Abstract: Apparatuses and method capable of reliably tracking processes through which products have passed without calling for expensive setup are necessary in production and distribution processes of the products. A process management apparatus including a data transmission/reception unit to and from an RFID tag of an information recording medium and a data generation unit comprises a process data generation unit for representing a process, a process pass certificate data generation unit for generating process data pass certificate data and a transmission/reception unit for the process data with the information recording medium and the process pass certificate data can track the processes through which the object products have passed.

Abstract: According to one embodiment, an evaluating apparatus includes an operation data storage unit, a labeling unit, a learning unit, and an evaluating unit. The labeling unit applies a failure label, indicating that a product is broken down, to operation data of the product that is broken down within a designated period of time from the observation date of the operation data, while applies a non-failure label, indicating that the product is not broken down, to the operation data of the product that is not broken down within a designated period of time from the observation date of the operation data. The labeling unit applies neither the failure label nor the non-failure label to the operation data of the product, which is not certain that it is broken down or not within a designated period of time from the observation date of the operation data.

Abstract: The present application relates to a technique of calculating an environmental load amount of each product produced on a production line including types of processing apparatuses. Power consumption required for producing a product is obtained more accurately and in an earlier stage. Power consumption required for producing each product is obtained by using the power consumption for each product with respect to each apparatus.

Abstract: A device for the dimensional characterization of an object comprising a cylindrical surface which is symmetrical about a longitudinal axle. The device comprises at least six probes used to emit six pulsed waves, each probe being respectively oriented towards a separate measuring point of the cylindrical surface, and to collect the pulsed waves reflected at each measuring point. The device calculates a position of each measuring point, and calculates a characteristic curve of the cylindrical surface by interpolation from the corresponding position of each of the points.

Abstract: The present invention provides apparatus for scanning a product to detect metal in that product. The apparatus comprises a drive coil (4), for generating an electromagnetic field in the product, and a detection coil arranged to detect fluctuations in the magnetic field caused by the presence of a metallic particle in the product. A drive circuit (26) for the drive coil (4) comprises a plurality of switches (19 to 22) driven by a controller (16), which switch alternately connect the drive coil across a potential difference to cause the drive coil to be driven at an operating frequency determined by operation of the switches. Using a switching circuit to drive the drive coil (4) greatly increases the number of frequencies at which the drive coil may be operated. The invention has particular application to the food industry.

Abstract: Methods manage non-destructive evaluation (“NDE”) data. NDE data for an asset is received and at least one alignment algorithm to align the NDE data to a simulated model associated therewith is determined. The NDE data is automatically aligned to the simulated model, a display representation that visually represents the aligned NDE data on the simulated model is generated, and information about the aligned NDE data is exported. Additionally, second NDE data associated with the at least a portion of the asset may also be received, at least one alignment algorithm to align the data determined, and the second NDE data aligned. Respective indications associated with the first and second NDE data may be determined and visually represented on the simulated model. Moreover, a shot descriptor file may be analyzed to determine whether additional NDE data is required to complete an alignment of NDE data.

Abstract: A system for generating surface data defining a position and location of an object is described. The system includes a non-contact measuring device for measuring the location of one or more points on a surface of an object with respect to the measuring device, an optical imaging device for capturing image information, and a processor. The processor is programmed to use the captured image information to determine location and orientation data for both the measuring device and the optical imaging device with respect to a fixed point in space, receive location measurement data from the measuring device, and combine the location and orientation data with the location measurement data to generate surface data for the object.

Abstract: A method and apparatus for inspecting a surface of an object. Data from measuring the surface of the object is obtained to form surface data for the object. A range of frequencies for features on the object is selected based on a range of distances between adjacent peaks for the features. The features are formed by a tool moving along a number of paths. Desired surface data for the features is obtained from the surface data using the range of frequencies selected. A determination is made as to whether the desired surface data for the features meets a policy specifying a desired surface for the object. In response to an absence of a determination that the desired surface data for the features meets the policy, the object is reworked.

Abstract: A method for aligning a sphere to a desired orientation includes imaging a non-surface alignment feature of the sphere and calculating a current orientation of the sphere based on an image of the non-surface alignment feature. Using these calculations, a relationship between the current orientation of the sphere and the desired orientation of the sphere is calculated and communicated to a motion control device, and aligning the sphere into the desired orientation using the motion control device.

Abstract: Embodiments of a system that determines a condition associated with an integrated circuit disposed on a circuit board are described. During operation, the system receives electromagnetic-interference (EMI) signals from one or more antennas while the integrated circuit is operating, where the one or more antennas are disposed on the circuit board. Then, the system analyzes the received EMI signals to determine the condition.

Abstract: In conjunction with a photomask blank comprising a transparent substrate, a pattern-forming film, and an etch mask film, the etch mask film is evaluated by measuring a first etching clear time (C1) taken when the etch mask film is etched under the etching conditions to be applied to the pattern-forming film, measuring a second etching clear time (C2) taken when the etch mask film is etched under the etching conditions to be applied to the etch mask film, and computing a ratio (C1/C2) of the first to second etching clear time.

Abstract: A method of diagnosing manufacturing variances of an electrical, mechanical or electro-mechanical apparatus based on radiation emitted by the apparatus where the method includes establishing baseline profile for a number of apparatuses to form a set of baseline profiles for the multiple apparatuses and comparing the set of baseline profiles to determine a difference indicative of a variance in the manufacturing of the apparatuses.

Abstract: A method and system for determining the overall performance of a power plant are provided. The system includes a plurality of components including a processor configured to generate a first reference model of the power plant and generate a first measured model of the power plant. The processor is further configured to determine the performance impact of the at least one of the plurality of components of the power plant on the overall thermal performance of the power plant, normalize the performance impact to design conditions, and output at least one of the normalized performance impact on overall plant performance.

Abstract: A method of determining whether a part satisfies tolerance criteria includes making a multiplicity of measurements of the part, reducing the number of measured points to a number of boundary points that define a boundary within which all measured points are encompassed and comparing the boundary to a tolerance limit of a normal surface to determine whether the part conforms to the tolerance.

Abstract: An inspection apparatus includes a detector, a transmitter, and a receiver. The detector is configured to detect whether or not an object processed by a processing apparatus has a defect. The transmitter is configured to send defect information regarding the defect detected by the detector to the processing apparatus. The receiver is configured to receive, when the processing apparatus performs solving processing based on solving measure information corresponding to the defect information and sends content information regarding contents of the solving processing, the sent content information.

Abstract: An apparatus for estimating and evaluating characteristics of large-area series-connected solar battery cells from a measured current-voltage characteristic of a small-area single cell, includes an analysis model construction unit, an analysis operation unit and an evaluation unit. The construction unit reads shape parameters and material physical properties of the cells and automatically constructs a finite element method model. The operation unit obtains a current at a voltage based on the measured characteristic, sets the current as a current load, calculates potential distributions of transparent electrode and rear electrode of the cells, corrects the current load based on a difference between the distributions and the measured characteristic, recalculates the distributions based on the corrected current load, and repeats the recalculation until the distributions converge.

Abstract: An alarm apparatus for sensing occurrence of abnormality in a plant that manufactures products by processing substrates, the alarm apparatus includes: means responsive to an inspection result of a surface of the substrates during manufacturing the products for aggregating degree of occurrence of defects for each monitoring unit region to produce an aggregation result, the monitoring unit region having a prescribed size configured for each type of the abnormality; means for comparing the degree of occurrence of defects in each of the monitoring unit regions with a reference; and means responsive to detection of the monitoring unit region with the degree of occurrence of defects being higher than the reference for transmitting an alarm and outputting the aggregation result.

Abstract: Method of product evaluation comprising the steps of applying at least one substance to a surface of an artificial substrate to form a substance-coated surface, wherein the substrate surface demonstrates at least one physical property selected from the group consisting of a total surface energy of from about 15 mJ/m2 to about 50 mJ/m2, a polar component of the total surface energy of from about 0 mJ/m2 to about 15 mJ/m2, a zeta-potential at a pH of about 5.0 of from about ?30 mV to about 30 mV, and combinations thereof, and performing at least one analysis of the substance-coated surface.

Abstract: A method for determining the nodosity of a wooden plank comprises the operating steps of observing the lateral surface (4) of the wooden plank (1) to identify its zones (7) corresponding to knots (6), assessing the overall extent of the knots (6) inside the plank (1) and the relative volume, and determining the nodosity as a ratio of the volume occupied by the knots (6) to the overall volume of the plank (1) or the remaining volume of the plank (1).

Abstract: A method that acquires data on a processing module of a substrate processing apparatus using a sensor substrate efficiently and highly precisely is provided. The method includes: holding a sensor substrate by a first holding member, the sensor substrate having a sensor section for acquiring data on the processing modules and a first power supply section with a rechargeable electricity storage section for supplying electric power to the sensor section; advancing the first holding member to transfer the sensor substrate to a processing module; acquiring data on the processing module by the sensor section of the sensor substrate; and causing the first holding member to receive the sensor substrate, whose electric charge is consumed, from the processing module and retract, and with that state, charging the first power supply section of the sensor substrate in a non-contact manner by a second power supply section that moves together with the base.

Abstract: An arc detection system for a plasma generation system includes a radio frequency (RF) sensor that generates first and second signals based on a respective electrical properties of (RF) power that is in communication with a plasma chamber. A correlation module generates an arc detect signal based on the first and second signals. The arc detect signal indicates whether an arc is occurring in the plasma chamber and is employed to vary an aspect of the RF power to extinguish the arc.

Abstract: Method and arrangement for determining the remaining lifetime of a component of a power electronics appliance, such as a frequency converter, in which the lifetime data that is dependent on the ambient conditions and operation as specified by the manufacturer of the component is used, in which method at least one magnitude connected to ambient conditions, such as temperature, is determined, at least one loading magnitude of the component, such as speed of rotation, is determined and the calculation of the remaining lifetime is performed on the basis of at least one magnitude connected to ambient conditions, such as temperature, and of at least one loading magnitude of the component, such as speed of rotation, as well as of the lifetime data that is dependent on these ambient conditions and loading as specified by the manufacturer of the component.

Abstract: A defect detecting method of a display device includes a defect counting process that measuring a feature amount for each partial region of a display device (P32), and counting regions which is determined as a defective portion based on the measured feature amount of the region (P36), a process that stopping a manufacturing line of the display device when a number of defects counted at the defect counting process is greater than a first threshold value (P38, P42), a defect density calculating process that calculating a defect density in a predetermined area when the number of defects counted at the defect counting process is smaller than the first threshold value (P38), and a process that stopping the manufacturing line of the display device when the defect density calculated at the defect density calculating process is higher than a second threshold value (P40, P42).

Abstract: Algorithm for reconstructing grating profile in a metrology application is disclosed to numerically solve a volume integral equation for a current density. It employs implicit construction of a vector field that is related to electric field and a current density by a selection of continuous components of vector field being continuous at one or more material boundaries, so as to determine an approximate solution of a current density. The vector field is represented by a finite Fourier series with respect to at least one direction, x, y. Numerically solving volume integral equation comprises determining a component of a current density by convolution of the vector field with a convolution operator, which comprises material and geometric properties of structure in the x, y directions. The current density is represented by a finite Fourier series with respect to x, y directions. Continuous components are extracted using convolution operators acting on electric field and current density.

Abstract: A method, device and computer program product for determining at least one property of a current (Ip) running through the primary winding of a transformer operating in saturation using an unreliable detected current (Is) running through the secondary winding of the transformer. According to the invention a first reliable extreme point (EP1) of a cycle of the current in the secondary winding is detected and compared with an absolute time reference. Based on the comparison a first property of the current running through the primary winding in the form of the phase angle is then determined.

Abstract: A method for analyzing performance of a sorting system is provided. The method includes recording downtime experienced by the sorting system, recording runtime experienced by the sorting system, and recording an optimal characterization of a product stream to be sorted by the sorting system. The optimal characterization includes at least an optimal weight of a first commodity of the product stream. An actual characterization of the product stream as sorted by the sorting system is recorded. The actual characterization includes at least an actual weight of the first commodity sorted from the product stream. The method further includes determining the performance of the sorting system based on at least two of the downtime, the runtime, the optimal characterization, and the actual characterization.

Abstract: The present invention may include acquiring a plurality of overlay metrology measurement signals from a plurality of metrology targets distributed across one or more fields of a wafer of a lot of wafers, determining a plurality of overlay estimates for each of the plurality of overlay metrology measurement signals using a plurality of overlay algorithms, generating a plurality of overlay estimate distributions, and generating a first plurality of quality metrics utilizing the generated plurality of overlay estimate distributions, wherein each quality metric corresponds with one overlay estimate distribution of the generated plurality of overlay estimate distributions, each quality metric a function of a width of a corresponding generated overlay estimate distribution, each quality metric further being a function of asymmetry present in an overlay metrology measurement signal from an associated metrology target.

Abstract: A method and system includes a first substrate and a second substrate, each substrate comprising a predetermined baseline transmittance value at a predetermine wavelength of light, processing regions on the first substrate by combinatorially varying at least one of materials, process conditions, unit processes, and process sequences associated with the graphene production, performing a first characterization test on the processed regions on the first substrate to generate first results, processing regions on a second substrate in a combinatorial manner by varying at least one of materials, process conditions, unit processes, and process sequences associated with the graphene production based on the first results of the first characterization test, performing a second characterization test on the processed regions on the second substrate to generate second results, and determining whether at least one of the first substrate and the second substrate meet a predetermined quality threshold based on the second res

Abstract: A monitoring system for a packaging system comprising a plurality of machine units comprises an output sensor for measuring packages output from the packaging system, a number of pairs of machine unit sensors, each pair of sensors comprising an input sensor and an output sensor, wherein the number of pairs of machine unit sensors is arranged at a number of machine units, respectively, a processing apparatus configured to receive information from the sensors, and a communications network configured to send information from the sensors to the processing apparatus. Based on the information from the number of pairs of machine unit sensors a number of wasted packages may be determined, which in turn imply that a reliable efficiency measure may be determined.

Abstract: A semiconductor wafer fabrication metrology method in which process steps are characterized by a change in wafer mass, whereby during fabrication mass is used as a measurable parameter to implement statistical process control on the one or more of process steps. In one aspect, the shape of a measured mass distribution is compared with the shape of a predetermined characteristic mass distribution to monitor the process. An determined empirical relationship between a control variable of the process and the characteristic mass change may enable differences between the measured mass distribution and characteristic mass distribution to provide information about the control variable. In another aspect, the relative position of an individual measured wafer mass change in a current distribution provides information about individual wafer problems independently from general process problems.

Abstract: Solutions for integrating manufacturing feedback into an integrated circuit design are disclosed. In one embodiment, a computer-implemented method is disclosed including: defining an acceptable yield requirement for a first integrated circuit product; obtaining manufacturing data about the first integrated circuit product; performing a regression analysis on data representing paths in the first integrated circuit product to define a plurality of parameter settings based upon the acceptable yield requirement and the manufacturing data; determining a projection corner associated with the parameter settings for satisfying the acceptable yield requirement; and modifying a design of a second integrated circuit product based upon the projection corner and the plurality of parameter settings.

Abstract: A packet loss frequency calculation unit (102) which counts, from an extracted packet loss pattern, packet losses generated in a predetermined interval representing the interval of a plurality of continuous IP packets as a packet loss of one time, thereby calculating the value as a packet loss frequency. The packet loss frequency calculation unit (102) also calculates a burst packet loss length representing the number of continuously lost packets from the packet loss pattern. An average burst packet loss length within a quality estimation interval is calculated from the burst packet loss length. A packet loss variation index calculation unit (106) derives a packet loss variation index from the average burst packet loss length. On the other hand, an encoding quality calculation unit (103) calculates an encoded video quality value based on the extracted encoding bit rate and frame rate.

Abstract: A system is provided for improved quality assurance (QA) in remote-access elections by a QA unit that evaluates an election service provider (ESP) that tallies votes, each of which includes a vote-identification number (VIN) and a vote content. The QA unit assures a likelihood that no votes have been deleted, inserted or changed by the ESP. The QA unit does this by allocating QA VINs and voting QA votes and then checking the ESP's report of all VINs included in the tally and the content of all QA votes. The ESP, if unaware of which votes are QA votes and which are voter voters, is prevented from deleting, inserting, or changing votes without risk of detection by the check of the QA votes. The system includes capability of ensuring defined confidence levels for a given quantity of voters and an expected voter turnout by incorporation of a suitable number of QA VINs.

Abstract: Methods of monitoring an acceptance criteria of vaccine manufacturing processes are disclosed herein. Consequently, the methods and systems provide a means to perform high-quality manufacturing on an integrated level whereby vaccine manufacturers can achieve data and product integrity and ultimately minimize cost.

Abstract: A system is disclosed for providing backward and forward traceability by a methodology which identifies discrete components (die, substrate and/or passives) that are included in a semiconductor device. The present technology further includes a system for generating a unique identifier and marking a semiconductor device with the unique identifier enabling the semiconductor device, and the discrete components within that device, to be tracked and traced through each process and test in the production of the semiconductor device.

Abstract: A fault detection method of semiconductor manufacturing processes is disclosed. The method includes the steps of providing a storage device, collecting a fault detection and classification(FDC) parameter by the storage device, setting up a measurement site for measuring an online measurement parameter, collecting a wafer acceptance test(WAT) in correspondence to the FDC parameter, establishing a first relationship equation between the FDC parameter and the online measurement parameter, establishing a second relationship equation of the online measurement parameter and the WAT by using the first relationship equation, establishing a third relationship equation between the FDC parameter and the WAT, establishing a waning region of the manufacturing processes by using the first, second, and third relationship equations, and determining the situation of generating wafer defects according to the warning region. The present invention discloses a system architecture for the method.