Abstract: A Delay Locked Loop (DLL) includes a replica delay unit configured to delay an output clock to generate a feedback clock; a phase detector configured to measure a phase difference between the feedback clock and an input clock; a quantization unit configured to quantize the phase difference measured by the phase detector; and a delay unit configured to delay the input clock based on a quantization result from the quantization unit to generate the output clock.

Abstract: A method of operating a nonvolatile memory device includes performing a reset operation for setting a level of a program voltage to a first level, performing a program operation and a verification operation on memory cells included in a first page of a first memory block while raising the program voltage from the first level, storing a level of the program voltage, supplied to the first page when memory cells programmed to have threshold voltages with at least a verification voltage are detected during the verification operation, as a second level, while raising the program voltage from the second level, performing the program operation and the verification operation on each of second to last pages of the first memory block, and after completing the program operation for the first memory block, performing the reset operation for setting the level of the program voltage to the first level.

Abstract: A semiconductor memory device includes a plurality of memory cells configured to store data having a polarity corresponding to a direction of current flowing through a source line and a bit line; and a precharge driving unit configured to precharge the bit line to a voltage corresponding to the data in response to a precharging signal before the data are stored in the memory cells.

Abstract: A semiconductor memory device includes: a modulation controller for generating a modulation control signal for controlling a frequency modulation operation; a delay locked loop (DLL) circuit for performing a delay locking operation to generate first and second DLL clocks and outputting a frequency-modulated DLL clock in response to the modulation control signal; and a data strobe signal generator for outputting the frequency-modulated DLL clock as a data strobe signal.

Abstract: A data receiving circuit includes a delay unit for outputting a delayed control signal by delaying a control signal based on a CAS latency, an output driver for time-dividing parallel data based on the control signal and the delayed control signal to generate divided parallel data, and for writing and transmitting the divided parallel data, and a latch for receiving the parallel data from the output driver and sorting, by combining or dividing, the received parallel data in response to the control signal and the delayed control signal.

Abstract: A level shifter circuit includes a pull-up unit configured to pull up an output node to a second voltage level being higher than a first voltage level in response to an input signal swinging with an amplitude of the first voltage level, a pull-down unit configured to pull down the output node in response to the input signal, and a protection unit connected between the output node and the pull-down unit to prevent a voltage of the output node from being applied to the pull-down unit.

Abstract: In a method of performing a read operation of a nonvolatile memory device, a selected bit line is precharged. A pass voltage is sequentially applied to all word lines. The pass voltage applied to a word line, selected from among all the word lines, is changed for a read voltage. The read voltage is applied to the selected word line. Data of a memory cell coupled to the selected word line is read.

Abstract: A method for fabricating a semiconductor device includes forming an inter-layer insulation layer on a substrate; forming openings in the inter-layer insulation layer; forming a metal barrier layer in the openings and on the inter-layer insulation layer; forming a first conductive layer on the metal barrier layer and filled in the openings; etching the first conductive layer to form interconnection layers in the openings and to expose portions of the metal barrier layer, the interconnection layers being inside the openings and at a depth from a top of the openings; etching the exposed portions of the metal barrier layer to obtain a sloped profile of the metal barrier layer at top lateral portions of the openings; forming a second conductive layer over the inter-layer insulation layer, the interconnection layers and the metal barrier layer with the sloped profile; and patterning the second conductive layer to form metal lines.

Abstract: A circuit for controlling the loading of write data in a semiconductor memory device includes a global bus; a data block configured to selectively load data of a predetermined first burst length or data of a second burst length, which is a half of the first burst length, for writing on the global bus in response to a control signal; and a memory bank configured to write the data of the first burst length or the data of the second burst length.

Abstract: A semiconductor device includes a latency signal generating circuit for generating a latency signal corresponding CAS latency by measuring a delay amount reflected at a delay locked loop and reflecting the measured delay amount at a read command signal, and a delay locked loop for controlling an internal clock signal applied to the latency signal generating circuit corresponding to the read command and the latency signal. The semiconductor device includes an internal clock signal generating block configured to generate an internal clock signal, a latency generating block configured to generate a latency signal by synchronizing a read command signal with the internal clock signal at a time corresponding to a CAS latency value and a measured delay value, and an input controlling block configured to activate the reference clock signal using an external clock signal in response to the read command signal and the latency signal.

Abstract: A command processing circuit for generating internal command signals corresponding to a plurality of unit internal command signals sequentially applied during a plurality of command cycles, the command processing circuit includes a first command latching unit configured to latch a first unit internal command signal applied in a first command cycle and a second command latching unit configured to latch a second unit internal command signal in response to the first unit internal command signal latched in the first command latching unit in a second command cycle after the first command cycle, and output an internal command signal corresponding to the first unit internal command signal and the second unit internal command signal.

Abstract: A semiconductor memory device includes a strobe signal generator for receiving a write command and generating a write strobe signal that defines an activation period variably according to an operation frequency, and a data transfer unit for transferring data from an external device to an internal data line in response to the write strobe signal.

Abstract: A voltage regulator with an adaptive bandwidth, including a first buffer chain, a voltage generating unit, a trimming capacitor unit, a second buffer chain, and a control unit. The first buffer chain delays a clock signal using an external voltage as a supply voltage. The voltage generating unit generates a regulated voltage on the basis a reference voltage. The trimming capacitor unit controls a load capacitance of the voltage generating unit. The second buffer chain delays the clock signal using the regulated voltage as a supply voltage. The control unit adjusts the load capacitance by detecting a delay difference of clocks output from the first and second buffer chains.

Abstract: A nonvolatile memory device includes a plurality of programming current driving units configured to supply memory cells with a programming current corresponding to a write data, a common programming current controlling unit configured to generate a common control voltage for controlling the programming current and a switching unit configured to transfer the common control voltage to the programming current driving unit selected among the plurality of programming current driving units by a plurality of driving selection signals.

Abstract: The present invention relates to a semiconductor device and a method for isolating the same. The semiconductor device includes: a silicon substrate provided with a trench including at least one silicon pillar at a bottom portion of the trench, wherein the silicon pillar become sidewalls of micro trenches; and a device isolation layer selectively and partially filled into the plurality of micro trenches.

Abstract: A semiconductor memory device including a plurality of banks, each including a plurality of memory cells, a pattern signal generator configured to generate pattern signals having combinations in response to an input signal applied through an arbitrary pad in a compression test mode. Input paths are configured to transfer the plurality of pattern signals to the corresponding banks.

Abstract: Disclosed herein is a semiconductor memory device including floating body cells. The semiconductor memory device includes memory cell active regions formed on a Silicon-On Isolator (SOI) semiconductor substrate, a plurality of floating body cell transistors formed in the memory cell active regions, and “inactive transistors” for providing cell isolation that are formed between the plurality of floating body cell transistors. Here, the inactive transistors for providing cell isolation are controlled so that they always are in an OFF state while the semiconductor memory device is operating.

Abstract: A nonvolatile memory device having a memory cell array configured to include a number of memory cells coupled to a bit line, a control circuit configured to output a code signal in response to a verification operation command signal during a verification operation being performed, a page buffer operation voltage generator configured to generate a precharge signal and a sense signal in response to the code signal, and a page buffer configured to precharge the bit line in response to the precharge signal and to sense data programmed into the memory cell in response to the sense signal. A sense signal having a sequentially lowered voltage level is outputted in response to the verification operation being repeatedly performed.

Abstract: A semiconductor memory device uses a magnetic tunnel junction device (MTJ) and includes a memory cell connected between a first driving line and a second driving line and configured to store data having a data state that is determined based on a direction of a current flowing through the first and the second driving lines, and a current controlling block configured to control a supply current provided to the first and second driving lines in response to temperature information in a writing operation.

Abstract: Disclosed are a coating agent for drug releasing stents, a method for preparing the same and a drug releasing stent coated therewith. The coating agent comprises a biologically active material and a coating material selected from among pullulan acetate, represented by the following Chemical Formula 1, and a polyurethane-surfactant mixture.