Abstract: A core voltage generation circuit includes a comparator configured to perform a differential comparison of a reference voltage and a feedback core voltage. An amplifier is configured to amplify the external power supply voltage in response to an output signal of the comparator to generate the core voltage. A control switch is configured to form a current path of the comparator using different switch units according to a voltage level of an external power supply voltage input to the core voltage generation circuit.

Abstract: A method for fabricating a cylindrical capacitor. The method includes forming an isolation structure including an interlayer on a substrate, the substrate having a plurality of contact plugs formed therein, forming a plurality of opening regions by etching the isolation structure, thereby exposing selected portions of the contact plugs, forming storage nodes on a surface of the opening regions, etching selected portions of the isolation structure to form a patterned interlayer that encompasses selected portions of the storage nodes, thereby supporting the storage nodes, removing remaining portions of the isolation structure, and removing the patterned interlayer to expose inner and outer walls of the storage nodes.

Abstract: The present invention relates to a non-volatile memory device having conductive sidewall spacers and a method for fabricating the same. The non-volatile memory device includes: a substrate; a gate insulation layer formed on the substrate; a gate structure formed on the gate insulation layer; a pair of sidewall spacers formed on sidewalls of the gate structure; a pair of conductive sidewall spacers for trapping/detrapping charges formed on the pair of sidewall spacers; a pair of lightly doped drain regions formed in the substrate disposed beneath the sidewalls of the gate structure; and a pair of source/drain regions formed in the substrate disposed beneath edge portions of the pair of conductive sidewall spacers.

Abstract: The present invention provides a power voltage supplier for stably supplying a noise-free power voltage without increasing a size of a reservoir capacitor by employing a sharing scheme of the reservoir capacitor. The power voltage supplier of a semiconductor memory device includes: a first power voltage supply line for supplying a first power voltage; a second power voltage supply line for supplying a second power voltage; a first reservoir capacitor for supplying the first and the second power voltages stably; and a reservoir capacitor controller for selectively connecting the first reservoir capacitor to the first power voltage supply line or the second power voltage supply line.

Abstract: A delayed locked loop (DLL) circuit for reducing power consumption in updating a delay value of an external clock after locking. The DLL circuit includes a phase comparator for comparing a phase of a feedback clock and a phase of an external clock, and a delay unit for delaying an external clock in response to a comparison signal from the phase comparison. A replica unit receives the delayed external clock and outputs the feedback clock. A toggling controller disables toggling of the delayed external clock that is inputted to the replica unit for a predetermined time at a regular interval after locking.

Abstract: Data transmitter includes a first and second output nodes terminated to a first level, a controller configured to generate an off signal that is activated by logically combining first and second data during a low-power mode, a first driver configured to drive the first or second output node to a second level in response to the first data and a second driver configured to drive the first or second output node to the second level with a driving force different from that of the first driver in response to the second data, the second driver being turned off when the off signal is activated.

Abstract: A dual in-line memory module (DIMM) for use in test includes a memory array with a plurality of memories, a test signal input/output unit, and a normal data input/output unit. The test signal input/output unit is provided in the respective memories to perform an input/output operation of a test signal with an external test mode controller for a test mode operation. The normal data input/output unit is provided in the respective memories to perform an input/output operation of a normal data with an external memory controller for a normal mode operation.

Abstract: A semiconductor memory device has a data output device. The data output device is provided with a slew rate control unit for detecting the number of transitions of a plurality of output data to output slew rate control information; and an output driving unit for driving the plurality of output data with a pull-up drivability and a pull-down drivability adjusted based on the slew rate control information.

Abstract: A calibration circuit that can prevent a calibration operation from being delayed by a dummy capacitor when the calibration circuit starts to operate includes a switch unit configured to connect a calibration node to a precharge node in response to an enable signal. The calibration node is connected to an external resistor. The calibration circuit also includes a code generation unit configured to generate a calibration code in response to a voltage of the calibration node and a reference voltage, a calibration resistor unit configured to drive the calibration node in response to the calibration code and turn-off when the code generation unit is disabled, and a precharge unit configured to precharge the precharge node to a predetermined voltage level when the code generation unit is disabled.

Abstract: A semiconductor memory device includes a one-transistor (1-T) field effect transistor (FET) type memory cell connected between a pair of bit lines, and controlled by a word line, where a different channel resistance is induced to a channel region depending on a polarity state of a ferroelectric layer. The device includes a plurality of word lines arranged in a row direction, a plurality of bit lines arranged in a column direction, a pair of clamp dummy lines arranged in the column direction, a pair of reference dummy lines arranged in the column direction, a cell array including the memory cell and formed in a region where the word line and the bit line are crossed, a dummy cell array including the memory cell and formed where the word line, the pair of claim dummy lines and the pair of reference dummy lines are crossed, and a sense amplifier and a write driving unit connected to the bit line and configured to receive a clamp voltage and a reference voltage.

Abstract: A memory device includes a refresh generator and a refresh command generation circuit. The refresh generator generates a refresh signal for a refresh operation enable. The refresh command generation circuit logically combines the refresh signal and a reset signal to produce a refresh command. The refresh command generation circuit produces the refresh command only when either the refresh signal or the reset signal is enabled.

Abstract: An output driver for use in a semiconductor memory device includes a pull-up metal oxide semiconductor (MOS) transistor for pulling-up a voltage loaded on an output node in response to a pull-up control signal; a pull-up linear element connected between the pull-up MOS transistor and the output node for increasing a linearity of an output current; a pull-down MOS transistor for pulling-down the voltage loaded on the output node in response to a pull-down control signal; and a pull-down linear element connected between the pull-down MOS transistor and the output node for increasing the linearity of the output current, wherein the pull-up MOS transistor and the pull-up linear element are different typed MOS transistors and the pull-down MOS transistor and the pull-down linear element are different typed MOS transistors.

Abstract: A semiconductor memory device includes a low voltage supplier for supplying a low voltage lower than a ground voltage; a voltage selector for selecting one of the low voltage and the ground voltage; and a word line driving circuit for driving a word line in response to an output of the voltage selector. The voltage selector operates when a self refresh signal is inputted, and supplies the low voltage as a voltage of logic low level used in the word line driving circuit in a self refresh mode and supplies the ground voltage as a voltage of logic low level used in the word line driving circuit in modes other than the self refresh mode.

Abstract: A semiconductor memory device includes a write driver, a first precharging unit, and a second precharging unit. The write driver loads data applied to a first data line onto a second data line. The first precharging unit precharges the second data line to a precharging voltage in response to a precharging signal. The second precharging unit overdrives the second data line to a voltage higher than the precharging voltage in response to an overdriving signal enabled for a predetermined time period during an initial precharging interval of the second data line.

Abstract: A semiconductor memory device includes data transmission devices for transmit data in synchronization with each other. The semiconductor memory device includes a plurality of data transferring unit, a first control unit, a multiplexing unit, and a second control unit. The plurality of data transferring unit transfers data to a plurality of global lines. The first control unit controls the plurality of data transferring unit in response to a column select signal to select a column of a memory cell. The multiplexing unit multiplexes the data transferred to the plurality of global lines. The second control unit controls the multiplexing unit, wherein the second control unit synchronizes the column select signal with a column address signal having a column address information of the memory cell.

Abstract: A semiconductor memory device of the claimed invention, having an active state for performing a read or write operation and an inactive state except for the active state includes a data input/output (I/O) line; a pull-up latch unit for pulling-up the data I/O line when the semiconductor memory device is in the inactive state; a pull-down latch unit for pulling-down the data I/O line when the semiconductor memory device is in the inactive state; and a selection unit for selectively driving one of the pull-up latch unit and the pull-down latch unit.

Abstract: A method for forming a transistor of a semiconductor device, includes forming a trench by etching a semiconductor substrate on which a pad oxide film and a pad nitride film are sequentially formed; forming a isolation oxide film by filling the trench with oxide; removing an upper portion of the isolation oxide film until an upper lateral portion of the semiconductor substrate is exposed; forming a barrier nitride film over the isolation oxide film, the semiconductor substrate, and the pad nitride film; forming a sacrificial oxide film over the barrier nitride film; performing a planarization process until the pad nitride film is exposed; performing a wet etching process until the active region is exposed; forming a photoresist pattern over the active region and the barrier nitride film; and performing a dry etching process by using the photoresist pattern as an etching mask, thereby forming a recessed gate trench.

Abstract: A semiconductor memory device includes a pulse signal generator configured to combine a plurality of external command signals to generate a normal register control signal and an extended register control signal in response to a clock signal; a reset signal generator configured to receive operating information of a delay locked loop (DLL) circuit from an outside to generate a reset signal for a reset operation of the DLL circuit in response to the normal register control signal or the extended register control signal; and the DLL circuit configured to perform a reset operation in response to the reset signal.

Abstract: A method for fabricating a semiconductor device includes forming an inter-layer insulation layer on a substrate; forming openings in the inter-layer insulation layer; forming a metal barrier layer in the openings and on the inter-layer insulation layer; forming a first conductive layer on the metal barrier layer and filled in the openings; etching the first conductive layer to form interconnection layers in the openings and to expose portions of the metal barrier layer, the interconnection layers being inside the openings and at a depth from a top of the openings; etching the exposed portions of the metal barrier layer to obtain a sloped profile of the metal barrier layer at top lateral portions of the openings; forming a second conductive layer over the inter-layer insulation layer, the interconnection layers and the metal barrier layer with the sloped profile; and patterning the second conductive layer to form metal lines.

Abstract: There is an internal voltage generating circuit for providing a stable high voltage by making a response time short. The internal voltage generating circuit includes a charge pump unit for generate a high voltage being higher than an external voltage in response to pumping control signals and a supply driving control signal; a pumping control signal generating unit for outputting the pumping control signals to the charge pump unit based on a driving signal; and a supply driving control unit for receiving the driving signal to generate the supply driving control signal to the charge pump unit.