Abstract: Identification and implementation of clock gating in the design of an integrated circuit (IC) is performed with automated assistance. Electrical power consumption is reduced by clock gating. The automated assistance identifies registers that are candidates for clock gating, and highlights, in the IC design, registers associated with a gated clock domain and the logic blocks driven by these registers.
Type:
Grant
Filed:
August 1, 2003
Date of Patent:
July 11, 2006
Assignee:
Atrenta Inc.
Inventors:
Bhanu Kapoor, Sanjay Churiwala, Joy Banerjee
Abstract: Unsynchronized clock-domain crossings in the design of integrated circuit are detected by searching for clock-crossing domains. For each clock-crossing that does not include an explicit synchronization cell, an analysis determines if the clock is stable crossing the domains.
Type:
Application
Filed:
March 15, 2006
Publication date:
July 6, 2006
Applicant:
Atrenta Inc.
Inventors:
Mohamed SARWARY, Mohammad MOVAHED EZAZI, Bernard MURPHY
Abstract: Unsynchronized clock-domain crossings in the design of integrated circuit are detected by searching for clock-crossing domains. For each clock-crossing that does not include an explicit synchronization cell, an analysis determines if the clock is stable crossing the domains.
Type:
Grant
Filed:
October 30, 2003
Date of Patent:
July 4, 2006
Assignee:
Atrenta Inc.
Inventors:
Mohamed Shaker Sarwary, Mohammad Movahed Ezazi, Bernard Murphy
Abstract: A method for evaluating the upper bound fault coverage of an integrated circuit (IC) or a portion thereof from register transfer level (RTL) description is provided. The method requires the analysis of a circuit described in RTL consisting of primary input and output pins as well as devices connected to each other and/or to the primary pins to determine the controllability and observability of each pin of the circuit to ‘stuck at zero’ and ‘stuck at one’ conditions. The upper bound fault coverage is then determined based on the ratio between the number of pins that are both controllable and observable and twice the number of pins in the circuit. The method does not require a dynamic simulation for its fault coverage assessment and hence is advantageous over other methods consuming significant time and resources.
Abstract: A method for evaluating the upper bound fault coverage of an integrated circuit (IC) or a portion thereof from register transfer level (RTL) description is provided. The method requires the analysis of a circuit described in RTL consisting of primary input and output pins as well as devices connected to each other and/or to the primary pins to determine the controllability and observability of each pin of the circuit to ‘stuck at zero’ and ‘stuck at one’ conditions. The upper bound fault coverage is then determined based on the ratio between the number of pins that are both controllable and observable and twice the number of pins in the circuit. The method does not require a dynamic simulation for its fault coverage assessment and hence is advantageous over other methods consuming significant time and resources.
Abstract: A method for efficiently detecting bus contention from a register transfer level (RTL) description is provided. A bus contention occurs if more than two components try to propagate data onto a bus at the same time. The provided method simulates possible input combinations and detects whether there is a possibility for a bus contention. In addition, the provided method is designed for testability, therefore using the method, the designer may identify contention that may exist in test mode at the RTL level of the design even when such conditions may not occur in system mode. The method provides the designer with the input combination as well as the RTL statement that caused the contention. The method detects the bus contention by simulating a small number of input combinations.