Abstract: A method for forming a semiconductor structure includes the following operations. A substrate is provided and includes a stacked structure and a first isolation structure that are alternately arranged in a first direction. A grid-like etched groove extending in the first direction is formed in the stacked structure and the first isolation structure, and divides the substrate into a first region and a second region that are arranged sequentially in a second direction. The first direction and the second direction are any two directions in a plane where the substrate is located. A second isolation structure is formed in the grid-like etched groove. A transistor structure and a capacitor structure are respectively formed in the first region and the second region, and are isolated by the second isolation structure.

Abstract: A method for preparing a semiconductor structure, a semiconductor structure and a semiconductor memory are provided. The method includes: a substrate is provided; a stack structure is formed on the substrate; the stack structure is divided into multiple channel areas, first source-drain areas and second source-drain areas. Each channel area extends in a second direction, each first source-drain area and each second source-drain area extend in a first direction, and the first source-drain area and the second source-drain area are located on the same side of the channel area; a first source-drain structure extending in the first direction is formed in the first source-drain area and a second source-drain structure extending in the first direction is formed in the second source-drain area; and a channel structure extending in the second direction is formed in the channel area.

Abstract: A semiconductor structure and a method for manufacturing the same are provided. The semiconductor structure includes: a substrate, bit line structures, and an isolation structure. The substrate includes multiple active areas. The bit line structures are located above the active areas, and include multiple bit lines extending in a first direction parallel to the surface of the substrate and multiple contact plugs electrically connected to the bit lines and the active areas. The isolation structure includes a first insulating layer including a first part and a second part located below the first part, a second insulating layer covering the surface of the second part and a third insulating layer covering at least the surface of the first part. The first part covers at least side walls of the bit lines, and the second part covers at least side walls of the contact plugs.

Abstract: A semiconductor package includes a first base plate, first semiconductor structure, second base plate and filling layer. The first base plate has a first surface including first and second signal transmission regions. The first semiconductor structure located on the first surface is electrically connected to the first signal transmission region. The second base plate located on the first base plate includes a base and a first interconnection surface. The first interconnection surface is away from the first surface. The first interconnection surface has first and second interconnection regions communicated with each other. The first interconnection region is electrically connected to the second signal transmission region. The filling layer seals the first semiconductor structure, second base plate and first surface. The first interconnection region is not sealed, and the second interconnection region is. There is a preset height between a top surface of the filling layer and the first interconnection region.

Abstract: A package structure includes at least two semiconductor structures that are stacked onto one another. The first surface of one semiconductor structure of the at least two semiconductor structures that are stacked onto one another directly faces toward the second surface of another semiconductor structure of the at least two semiconductor structures which is adjacent to said one semiconductor structure; the first metal layer of said one semiconductor structure is in contact with and bonded to the third metal layer of said another semiconductor structure; and the second metal layer of said one semiconductor structure is in contact with and bonded to the fourth metal layer of said another semiconductor structure.

Abstract: A method for manufacturing a semiconductor device includes following operations. A substrate is provided, including memory array region. A plurality of bit lines are formed in memory array region. First insulating material is filled between the plurality of bit lines. A plurality of trenches intersecting with bit lines are provided in first insulating material. Memory array region includes inner region and boundary region outside same. Second insulating material is filled in trenches to form spacing lines. Second insulating material is also deposited above bit lines, spacing lines and first insulating material to form cap material layer. Etching process is performed to form node contact holes, including following operations. Cap material layer is etched to form cap layer covering bit lines, spacing lines and first insulating material in boundary region. First insulating material in inner region is removed by etching with cap layer as mask to from node contact holes.

Abstract: A refresh control method includes: generating a first random number; and preforming, in response to execution times of a regular refresh operation reaching the first random number after execution of a previous row hammer refresh operation, a new row hammer refresh operation.

Abstract: A semiconductor structure and a method for forming the same are provided. The semiconductor structure includes a substrate, a switching transistor and a storage transistor. The switching transistor includes a first gate electrode, a first channel layer coating a portion of the first gate electrode, and a first source-drain electrode and a second source-drain electrode both covering a surface of the first channel layer. The storage transistor includes a second gate electrode, a second channel layer coating a portion of the second gate electrode, and a third source-drain electrode and a fourth source-drain electrode both covering a surface of the second channel layer. A portion of the second gate electrode extending out of the second channel layer in a first direction is electrically connected to the second source-drain electrode. The storage transistor is configured to store charge.

Abstract: A semiconductor structure and a method for forming a semiconductor structure are provided. The semiconductor structure includes: a substrate; and a stack structure arranged on the substrate. The stack structure includes storage areas spaced apart from each other in a first direction, and isolation walls, each isolation wall being arranged between any two adjacent storage areas of the storage areas. Each storage area includes memory cells spaced apart from each other in a second direction, each memory cell including a transistor structure, and a capacitor structure, an outline of a projection of the capacitor structure on a top surface of the substrate being in a shape of a rectangle or a rounded rectangle. A width of the transistor structure is equal to a width of the capacitor structure in the first direction, and the transistor structure is aligned with the capacitor structure in the third direction.

Abstract: Embodiments provide a semiconductor structure and a method thereof. The method includes: providing a first substrate, and forming a drive pad on the first substrate; providing a second substrate, and forming active pillars and a bit line in sequence on a side of the second substrate, wherein a side of the bit line is connected to the active pillars, and a surface of the bit line facing away from the active pillars is exposed on a surface of the second substrate; bonding the bit line to the drive pad correspondingly; thinning the second substrate from a side of the second substrate facing away from the first substrate until the active pillars are exposed; and forming a storage capacitor on sides of the active pillars facing away from the drive pad, the storage capacitor being connected to the active pillars.

Abstract: A semiconductor package assembly and a manufacturing method are provided. The semiconductor package assembly includes: a base plate having a first surface; a first chip structure located on the base plate and electrically connected to the first surface of the base plate; an intermediary layer having a first interconnection surface; and a molding compound. The first interconnection surface has a first and second interconnection regions. A first solder ball is formed on the first interconnection region. A first pad is formed on the second interconnection region. The intermediary layer is electrically connected to the first surface by means of the first pad. The molding compound seals the first chip structure, the intermediary layer and the first surface. The first solder ball has a surface exposed from the molding compound. There is a preset height between the exposed surface of the first solder ball and the first interconnection surface.

Abstract: Embodiments of the present disclosure relate to the semiconductor field, and provide a semiconductor structure and a manufacturing method thereof. The semiconductor structure includes: a substrate, first gates and second gates, and a first conductive channel; where the substrate includes first active regions and two second active regions located between adjacent first active regions, the first active region defines a pull-down transistor, the second active region defines a pull-up transistor; the first active region has a first source region, a first channel region, and a first drain region arranged along a second direction.

Abstract: A capacitor structure includes a substrate and a first electrode, a first dielectric layer and a second electrode arranged on the substrate, in which the first electrode includes at least two sub-electrodes continuously arranged in a direction perpendicular to the substrate and connected in sequence, of the at least two sub-electrodes, an orthographic projection of at least one of the sub-electrodes on the substrate covers an orthographic projection of another of the sub-electrodes on the substrate; the first dielectric layer is arranged on at least part of an outer surface of the first electrode; the second electrode is arranged on at least part of an outer surface of the first dielectric layer, and the second electrode is insulated from the first electrode.

Abstract: Disclosed in the embodiments of the disclosure are a semiconductor structure and a manufacturing method therefor. The semiconductor structure includes: a substrate; a plurality of grooves, located in the substrate and extending in a first direction; a plurality of word line structures, located in the grooves; and a plurality of semiconductor layers, each at least partially located between a word line structure and an inner wall of a groove. The semiconductor layer includes oxide semiconductor material.

Abstract: A semiconductor structure and a memory are provided. The semiconductor structure includes multiple active regions, a column selector and multiple bit lines. The column selector includes a first gate, a second gate, a third gate, a fourth gate and a connection line. The first gate and the second gate intersect at a first node, the third gate and the fourth gate intersect at the second node, and the connection line connects the first node and the second node. Each of the multiple bit lines includes a first portion, a second portion and a connection portion. Each of the multiple bit lines is connected to a respective one of the multiple active regions, the active regions connected to different bit lines among the multiple bit lines are different.

Abstract: A semiconductor structure includes: a logic device including a first power line and a second power line located on a same wiring layer, extending along a first direction and arranged in parallel along a second direction, the first direction and the second direction intersecting with each other and being parallel to a plane where the wiring layer is located; and a switch driving device, the switch driving device and the logic device being arranged in parallel along the first direction, the switch driving device including a first input line and a first output line located on the same wiring layer as the first power line, extending along the first direction and arranged in parallel along the second direction, the first output line being connected with the first power line or the second power line.

Abstract: A method of forming a semiconductor structure and a semiconductor structure are provided. The method of forming the semiconductor structure includes: providing a base, where the base includes a first dielectric layer and pads arranged at intervals in the first dielectric layer; forming a dielectric structure, where the dielectric structure exposes the pad and part of the first dielectric layer; forming an insulating structure, where the insulating structure is formed on a sidewall of the dielectric structure, the insulating structure covers a first partial sidewall of the dielectric structure, and an air gap is formed between a second partial sidewall of the dielectric structure and the insulating structure; and forming a conductive structure, where the conductive structure covers an exposed pad and an outer sidewall surface of the insulating structure.

Abstract: A semiconductor structure is provided. The semiconductor structure includes: a substrate; a plurality of capacitors arranged in the substrate; and a plurality of active pillars arranged above the substrate. Each of the plurality of active pillars is arranged above a respective one of the plurality of capacitors, and a bottom portion of each of the plurality of active pillars is electrically connected to a top portion of the respective one of the plurality of capacitors therebelow.

Abstract: A test structure includes a plurality of word lines and a plurality of bit lines. A vertical gate-all-around (VGAA) transistor is formed at the intersection of each word line and each bit line. The test structure includes a first area and a second area. The second area is arranged outside the first area, the word lines in the first area and the word lines in the second area are disconnected, and the bit lines in the first area and the bit lines in the second area are disconnected. The plurality of VGAA transistors located in the first area form a test array, and a VGAA transistor located in the middle of the test array is a device to be tested.

Abstract: Embodiments are a method for fabricating a semiconductor structure. The method includes: providing a substrate; etching the substrate to form bit line grooves extending along a first direction; sequentially forming a first isolation layer, a bit line metal line layer, a bit line conductive connection layer and a first insulating layer to obtain a bit line structure; etching to form a substrate of the bit line structure, and to obtain a plurality of active area structures arranged at intervals and a first groove, the bit line structure intersecting with the active area structures; filling the first groove with a second isolation layer to obtain a first structure; etching the first structure to form word line grooves extending along a direction perpendicular to the first direction; and sequentially forming a third isolation layer, a word line conductive connection layer and a second insulating layer in the word line groove.