Patents Assigned to IMEC
  • Patent number: 6303522
    Abstract: The present invention is related to an efficient thermal oxidation process that allows the controlled growth of in-situ cleaned high quality thin oxides on a silicon-containing substrate. Said oxidation is performed in an ambient comprising at least the reaction products of a chloro-carbon precursor and ozone. This thermal oxidation is preferably executed at low temperatures, being preferably below 500° C., in order to limit the in-diffusion of metal surface contaminants is limited. The present invention is further related to the decomposition of organic chloro-carbon precursors at low temperatures by the introduction of ozone prior to the actual oxidation step.
    Type: Grant
    Filed: November 18, 1998
    Date of Patent: October 16, 2001
    Assignee: IMEC VZW
    Inventors: Paul Mertens, Marc Heyns
  • Patent number: 6300144
    Abstract: A method is disclosed for the formation of ferro-electric films using a multi coating process based on a sol-gel technique. In particular a method is disclosed to fabricate high-quality thickness scaled PZT films of an alkoxide-type liquid chemical PZT precursor solution, preferably a Pb(ZrxTi1−x)O3 precursor solution, using a sol-gel technique. At least two coated layers are deposited, but the precise number of coated layers depends on the desired thickness of the ferro-electric film. According to the method of the invention, the electrical characteristics of the film as formed are not dependent on the number of coated layers. There are a number of properties, characteristic for the method of the present invention, and resulting in said excellent electrical characteristics. In fact said method can comprise a multi coating process wherein a reduced number of coated layers is used but where intermediate crystallization steps are performed.
    Type: Grant
    Filed: February 23, 1999
    Date of Patent: October 9, 2001
    Assignees: Interuniversitair Micro Elecktronica Centrum (IMEC yzw), Limburgs Universitair Centrum
    Inventors: Dirk Wouters, Gerd Norga, Herman Maes, Ria Nouwen, Jules Mullens, Dirk Franco, Jan Yperman, Lucien C. Van Poucke
  • Patent number: 6297072
    Abstract: A method of fabricating a microstructure having an inside cavity. The method includes depositing a first layer or a first stack of layers in a substantially closed geometric configuration on a first substrate. Then, performing an indent on the first layer or on the top layer of said first stack of layers. Then, depositing a second layer or a second stack of layers substantially with said substantially closed geometric configuration on a second substrate. Then, aligning and bonding said first substrate on said second substrate such that a microstructure having a cavity is formed according to said closed geometry configuration.
    Type: Grant
    Filed: April 16, 1999
    Date of Patent: October 2, 2001
    Assignee: Interuniversitair Micro-Elktronica Centrum (IMEC VZW)
    Inventors: Hendrikus A. C. Tilmans, Eric Beyne, Myriam Van de Peer
  • Publication number: 20010022186
    Abstract: The present invention is related to a method of removing particles and a liquid from a surface of a substrate using at least one rotating cleaning pad. The approach, according to the present invention, is a technique wherein a sharp liquid-vapor boundary is created on the surface of the substrate adjacent to the last wetted rotating cleaning pad of a plurality of rotating cleaning pads and particularly between this last wetted rotating cleaning pad and a first edge of the substrate.
    Type: Application
    Filed: May 21, 2001
    Publication date: September 20, 2001
    Applicant: Interuniversitair Micro-Elektronica Centrum (IMEC, vzw)
    Inventors: Paul Mertens, Mark Meuris, Marc Heyns
  • Patent number: 6282124
    Abstract: The present invention is a method for programming SSI cells or an array of said cells. The method achieves very fast programming while consuming only a very small amount of power, which paves the way for new applications such as battery-operated systems, page-mode programming for very high data throughput. The method also allows for the bitline voltage to be increased internally on the chip in order to circumvent the efficiency decrease associated with supply voltage scaling. By exploring the SSI mechanism in the subthreshold regime, an optimum value for the CG voltage is found for which the gate current is no longer maximized, but the energy consumed from the power supply is minimized and the injection efficiency during programming is maximized. The programming of a memory cell in this regime, where the gate current is a very steep function of the CG voltage, is, however, still achieved in a few microseconds while consuming only a very small cell current in the range of nanoamperes.
    Type: Grant
    Filed: June 7, 1999
    Date of Patent: August 28, 2001
    Assignee: Interuniversitair Microelektronica Centrum (IMEC, vzw)
    Inventors: Jan F. Van Houdt, Luc Haspeslagh, Ludo Deferm, Guido Groeseneken, Herman Maes
  • Patent number: 6274462
    Abstract: A method of fabricating an infrared detector, a method of controlling the stress in a polycrystalline SiGE layer and an infrared detector device is disclosed. The method of fabricating includes the steps of forming a sacrificial layer on a substrate; patterning said sacrificial layer; establishing a layer consisting essentially of polycrystalline SiGe on said sacrificial layer; depositing an infrared absorber on said polycrystalline SiGe layer; and thereafter removing the sacrificial layer. The method of controlling the stress in a polycrystalline SiGe layer deposited on a substrate is based on varying the deposition pressure. The infrared detector device comprises an active area and an infrared absorber, wherein the active area comprises a polycrystalline SiGe layer, and is suspended above a substrate.
    Type: Grant
    Filed: October 31, 2000
    Date of Patent: August 14, 2001
    Assignee: Interuniversitair Micro-Elektronica Centrum (IMEC, vzw)
    Inventors: Paolo Fiorini, Sherif Sedky, Matty Caymax, Christiaan Baert
  • Patent number: 6271135
    Abstract: The method of the present invention is related to the fabrication of a copper-based multilevel interconnect structure. This copper-based multilevel interconnect structure is based on the formation of vertical metal connections through copper-containing metal stud growth on an underlying horizontal metal pattern, followed by a stud encapsulation step against copper diffusion into the surrounding dielectric, i.e. the insulating layers. This method is of particular interest when the insulating layers used to obtain this interconnect structure are polymer layers with a low dielectric constant and preferably with a high degree of planarization.
    Type: Grant
    Filed: July 7, 1999
    Date of Patent: August 7, 2001
    Assignee: IMEC vzx
    Inventors: Roger Palmans, Joost Waeterloos, Gibert Declerck
  • Patent number: 6261377
    Abstract: The present invention is related to a method of removing particles and a liquid from a surface of a substrate using at least one rotating cleaning pad. The approach, according to the present invention, is a technique wherein a sharp liquid-vapor boundary is created on the surface of the substrate adjacent to the last wetted rotating cleaning pad of a plurality of rotating cleaning pads and particularly between this last wetted rotating cleaning pad and a first edge of the substrate.
    Type: Grant
    Filed: September 24, 1998
    Date of Patent: July 17, 2001
    Assignee: Interuniversitair Microelektronica Centrum (IMEC)
    Inventors: Paul Mertens, Mark Meuris, Marc Heyns
  • Patent number: 6251756
    Abstract: An open apparatus is described for the processing of planar thin semiconductor substrates, particularly for the processing of solar cells. The apparatus includes a first zone for the drying and burn-out of organic components from solid or liquid based dopant sources pre-applied to the substrates. The zone is isolated from the remaining zones of the apparatus by an isolating section to prevent cross-contamination between burn-out zone and the remaining processing zones. All the zones of the apparatus may be formed from a quartz tube around which heaters are placed for raising the temperature inside the quartz tube. Each zone may be purged with a suitable mixture of gases, e.g. inert gases such as argon, as well as oxygen and nitrogen. The zones may also be provided with gaseous dopants such as POCl3 and the present invention includes the sequential diffusion of more than one dopant into the substrates. Some of the zones may be used for driving-in the dopants alternatively, for other processes, e.g. oxidation.
    Type: Grant
    Filed: July 12, 2000
    Date of Patent: June 26, 2001
    Assignee: Interuniversitair Micro-Elektronica Centrum (IMEC vzw)
    Inventors: Jörg Horzel, Jozef Szlufcik, Johan Nijs
  • Patent number: 6247481
    Abstract: An apparatus for wet cleaning or etching of flat substrates comprising a tank with an inlet opening and outlet opening for said substrates. Said tank contains a cleaning liquid and is installed in a gaseous environment. At least one of the openings is a slice in a sidewall of the tank and is present below the liquid-surface. In the tank there may be a portion above the liquid filled with a gas with a pressure being lower than the pressure within said environment. The method comprises the step of transferring a substrate through the cleaning or etching liquid at a level underneath the surface of said liquid making use of said apparatus.
    Type: Grant
    Filed: June 24, 1997
    Date of Patent: June 19, 2001
    Assignee: Interuniversitair Microelektronica Centrum (IMEC)
    Inventors: Marc Meuris, Paul Mertens, Marc Heyns
  • Patent number: 6245489
    Abstract: The present invention discloses the formation of a hard mask layer in an organic polymer layer by modifying at least locally the chemical composition of a part of said exposed organic low-k polymer. This modification starts from an exposed surface of the polymer and extends into the polymer thereby increasing the chemical resistance of the modified part of the polymer. As a result, this modified part can be used as a hard mask or an etch stop layer for plasma etching.
    Type: Grant
    Filed: May 27, 1998
    Date of Patent: June 12, 2001
    Assignee: Imec VZW
    Inventors: Mikhail Rodionovich Baklanov, Serge Vanhaelemeersch, Karen Maex, Joost Waeterloos, Gilbert Declerck
  • Patent number: 6246612
    Abstract: A method of erasing and a method of programming a nonvolatile memory cell in a chip is disclosed. Said cell comprises a semiconductor substrate including a source and a drain region and a channel therebetween, a floating gate extending over a portion of said channel, a control gate extending over another portion of the channel region, and a program gate capacitively coupled through a dielectric layer to said floating gate. The methods or schemes are using substantially the lowest possible voltage to erase a nonvolatile memory cell of the floating-gate type without having the SILC problem. Therefore, these schemes are expected to allow a further scaling of the minimum feature size of Flash memory products which is necessary for cost reduction and density increase. The present invention also aims to further decrease the voltages necessary to erase/program the memory device without degrading the corresponding performance.
    Type: Grant
    Filed: September 14, 2000
    Date of Patent: June 12, 2001
    Assignee: Interuniversitair Micro-Elektronica Centrum, vzw (IMEC vzw)
    Inventors: Jan Van Houdt, Dirk Wellekens
  • Patent number: 6226774
    Abstract: A flip-flop-based circuit architecture generates a hazard-free asynchronous signal given the SET and RESET sum-of-product (SOP) solutions to an asynchronous process. The flip-flop SET and RESET SOP solutions can be hazardous. Thus, general purpose synchronous optimization tools (which are indifferent to hazards) can be used to derive the optimal SOP solutions. A fixed layer built around the SOP cores eliminates all hazards in the circuit. In one embodiment, the architecture is optimized by eliminating an RS latch and delay lines in the SOP cores. The architecture of the present invention is guaranteed to admit any semi-modular race-free state graph representation of an asynchronous process that satisfies the n-shot requirement. The state graph representations can be examined to determine if alternate, solution-specific, simplified architectures can be employed that further decrease the final area by the elimination of flip-flops or the elimination of a timing delay.
    Type: Grant
    Filed: December 23, 1997
    Date of Patent: May 1, 2001
    Assignee: IMEC
    Inventors: Milton Hiroki Sawasaki, Chantal Ykman-Couvreur, Bill Lin, Hugo De Man
  • Patent number: 6225670
    Abstract: The present invention discloses a semiconductor based detector for radiation with a small but effective barrier between the radiation sensitive volume in the semiconductor and the regions and junctions with readout circuitry, and with no or a lower barrier between the semiconductor substrate and the regions and junctions adapted and meant for collecting the charge carriers generated by the radiation in the semiconductor substrate.
    Type: Grant
    Filed: February 9, 1998
    Date of Patent: May 1, 2001
    Assignee: IMEC
    Inventor: Bart Dierickx
  • Patent number: 6223274
    Abstract: A programmable processing engine and a method of operating the same is described, the processing engine including a customized processor, a flexible processor and a data store commonly sharable between the two processors. The customized processor normally executes a sequence of a plurality of pre-customized routines, usually for which it has been optimized. To provide some flexibility for design changes and optimizations, a controller for monitoring the customized processor during execution of routines is provided to select one of a set of pre-customized processing interruption points and for switching context from the customized processor to the flexible processor at the interruption point. The customized processor can then be switched off and the flexible processor carries out a modified routine. By using sharable a data store, the context switch can be chosen at a time when all relevant data is in the sharable data store. This means that the flexible processor can pick up the modified processing cleanly.
    Type: Grant
    Filed: November 19, 1998
    Date of Patent: April 24, 2001
    Assignee: Interuniversitair Micro-Elecktronica Centrum (IMEC)
    Inventors: Francky Catthoor, Miguel Miranda, Stefan Janssens, Hugo De Man
  • Patent number: 6212566
    Abstract: The interprocess communication protocol system provides a generic communication system for communication between specified processes in a complex digital system. In accordance with the interprocess communication protocol, a group of pre-defined communication signals are defined, to which all communications between the processes conform. Interface hardware is disclosed to provide communication between processes. In addition, the communication protocol can be designed into the process as and integral portion of the processes.
    Type: Grant
    Filed: January 26, 1996
    Date of Patent: April 3, 2001
    Assignee: IMEC
    Inventors: Jan Vanhoof, Maryse Wouters, Serge Vernalde, Karl Van Rompaey
  • Patent number: 6201401
    Abstract: Measuring an electrical potential in a semiconductor element by applying one or more voltages over the semiconductor element, placing at least one conductor in contact with the semi-conductor element using a scanning proximity microscope while injecting a substantially zero current in the semiconductor element with the conductor, measuring an electrical potential in the conductor while injecting a substantially zero current in the semiconductor element with the conductor, changing the position of the conductor, and repeating the measuring and changing steps.
    Type: Grant
    Filed: November 23, 1998
    Date of Patent: March 13, 2001
    Assignee: IMEC
    Inventors: Louis C. Hellemans, Thomas Trenkler, Peter De Wolf, Wilfried Vandervorst
  • Patent number: 6194722
    Abstract: A method of fabricating an infrared detector, a method of controlling the stress in a polycrystalline SiGE layer and an infrared detector device is disclosed. The method of fabricating includes the steps of forming a sacrificial layer on a substrate; patterning said sacrificial layer; establishing a layer consisting essentially of polycrystalline SiGe on said sacrificial layer; depositing an infrared absorber on said polycrystalline SiGe layer; and thereafter removing the sacrificial layer. The method of controlling the stress in a polycrystalline SiGe layer deposited on a substrate is based on varying the deposition pressure. The infrared detector device comprises an active area and an infrared absorber, wherein the active area comprises a polycrystalline SiGe layer, and is suspended above a substrate.
    Type: Grant
    Filed: March 27, 1998
    Date of Patent: February 27, 2001
    Assignee: Interuniversitair Micro-Elektronica Centrum, IMEC, vzw
    Inventors: Paolo Fiorini, Sherif Sedky, Matty Caymax, Christiaan Baert
  • Patent number: 6191431
    Abstract: A device for emitting radiation it a predetermined wavelength is disclosed. The device has a cavity comprising a first bulk region and a second bulk region of opposite conductivity type wherein a barrier is provided for spatially separating the charge carriers of the first and the second region substantially at the antinode of the standing wave pattern of said cavity. The recombination of the charge carriers at the barrier create radiation, the emission wavelength of the radiation being determined by the cavity.
    Type: Grant
    Filed: April 30, 1998
    Date of Patent: February 20, 2001
    Assignee: Interuniversitair Microelektronica Centrum (IMEC)
    Inventors: Chris Van Hoof, Hans De Neve, Gustaaf Borghs
  • Patent number: 6157035
    Abstract: A novel radiation detector, a detection principle and an associated structure are provided for semiconductor substrate detectors in general and for CMOS based circuits in particular. For an optical detector, photons absorbed in the neutral zone of the substrate generate electron hole pairs that migrate by diffusion. A shadow mask gives a spatial modulation to the incident, and consequently, to the absorbed light in the semiconductor substrate. By measuring the magnitude of the spatial frequency component in the minority carrier distribution with a spatial frequency corresponding to that of the shadow mask, a fast detector is conceived. A shadow mask with higher spatial modulation frequency delivers a faster turn-off. The combination of a plurality of these detectors with an image fiber forms a basic system for constructing high-speed parallel optical interconnects between chips.
    Type: Grant
    Filed: April 30, 1998
    Date of Patent: December 5, 2000
    Assignee: IMEC
    Inventors: Maarten Kuijk, Paul Heremans, Daniel Coppee, Roger Vounckx