Abstract: The invention relates to a microscope comprising at least one first and second light sources, a first light-guiding fiber connected to the first light source and a second light-guiding fiber connected to the second light source, wherein the light emitted by corresponding light source is injectable into the connected light-guiding fiber. The inventive microscope also comprises an objective lens disposed in the illumination beam path and is characterized in that a fiber multiplexer connected to the first and second light-guiding fibers, receiving the light from the light source and selectively allowing the light from the first or second light source to pass is disposed in the illumination beam path.

Abstract: A scanning microscope comprises a beam deflector with at least one movable deflector to adjust the deflection of a light beam. The scanning microscope is characterized in that the movable deflector is positioned in a largely soundproof housing with one entrance window and/or one exit window.

Abstract: A microscope with a first and a second illumination light beam for illuminating a sample, wherein the first and/or the second illumination light beam evanescently illuminates the sample. For the purpose of CARS testing, the first illumination light beam can be a pump light beam, and the second illumination light beam can be a Stokes light beam. To increase resolution, the first illumination light beam can be an excitation light beam, and the second illumination light beam can be a stimulation light beam.

Abstract: A scanning microscope includes at least one light source, an acousto-optical element, a beam deflection device and a beam guiding device. The at least one light source generates an illuminating light beam. The acousto-optical element spatially splits a sub-light beam from the illuminating light beam and adjusts an optical power of the illuminating light beam. The beam deflection device scans the illuminating light beam over or through a sample. The beam guiding device directs the sub-light beam onto the sample.

Abstract: The present invention concerns a microscope 1. The microscope 1 encompasses a microscope stand 2, an objective 4 having an optical axis 5, a microscope stage 6 serving to receive a specimen 7, and a focusing device 20 serving to focus the specimen 7. With the focusing device 20, the objective or the microscope stage 6 is positionable relative to the microscope stand 2 in the direction of the optical axis 5 of the objective 4. The focusing device 20 comprises at least one operating element 8 with which an operator controls the positioning of the objective 4 or of the microscope stage 6. For adaptation of the spatial arrangement of the operating element 8 to the needs of an operator, the microscope 1 according to the present invention is characterized in that the spatial arrangement of the operating element 8 relative to the microscope stand 2 is modifiable.

Abstract: A slider for positioning multiple optical elements is disclosed. Also disclosed is a microscope that contains the slider (25) according to the present invention. The slider (25) encompasses a slider carrier (35) that is guided on a first shaft (31) and a second shaft (32). The second shaft (32) is equipped with multiple detent positions (34) so as thereby to position the slider (25) exactly in the optical axis (20) of the microscope (1). The slider carrier (35) is guided on the second shaft (32) by a first roller (36) and a second roller (38). The second roller (38) is arranged below the center axis of the second shaft (32).

Abstract: The present invention concerns a method for setting the system parameters of a scanning microscope, preferably a confocal scanning microscope, acquisition of an image of the specimen performed with the scanning microscope being controlled by a control computer. After an image of the specimen is acquired at least one image quality feature is inputted by a user and is converted by the control computer into at least one system parameter of the scanning microscope.

Abstract: A device for selectively detecting specific wavelength components of a light beam includes a spectral spreading element for spectrally spreading the light beam, and a detector array arranged downstream of the element. The detector array includes light-insensitive regions and light-sensitive regions. The element and the detector array are matched to each other so that selectable wavelength components of the light beam hit the light-insensitive regions and remaining wavelength components of the light beam hit the light-sensitive regions.

Abstract: A method and an arrangement for automatic three-dimensional recording of structures of interest in a sample (15) are disclosed. The arrangement possesses a microscope having at least one microscope objective (13). The images of a sample (15) are acquired using a detector unit (19). A computer system (23) controls acquisition of the images and the microscope functions. The computer system (23) possesses a means (25) for automatically recording the entire marked specimen region in three dimensions.

Abstract: A method for user training for a scanning microscope makes possible rapid setting of a scanning microscope with little specimen impact. It is possible to acquire an entire spectrum of a specimen. This specimen can be retrieved from the memory of the computer system for training purposes. The user can then make changes in the setting capabilities displayed to him on the user interface and assess the result thereof, also on the user interface. This can be done without time pressure until the user is satisfied with the result displayed on the user interface.

Abstract: A microscope objective includes an optical fiber. The optical fiber can deliver light for total internal reflection microscopy. The optical fiber can couple illumination light directly into the microscope objective through the optical fiber.

Abstract: Disclosed is an image acquisition unit (1) for microscopic applications, including at least one microscope objective (7) which is mounted on a housing. The housing (9) is formed by a plurality of individual separate modules, said plurality of modules including at least an electronic module (2), a camera module (4), an illumination module (6), a focusing module (8), and a filter module (10).

Abstract: A scanning microscope (1) and a scanning method are disclosed. The scanning microscope (1) has, arranged in the illuminating light beam path (3), an outcoupling element (60) that couples out at least a fraction of the illuminating light beam (3) and directs it to a detector (61) that detects the pulse frequency of the light source that generates the illuminating light beam; and the pulse frequency serves as a basic clock frequency for the scanner.

Abstract: An ergonomic microscope (1) and a microscope carrier (2) are disclosed. The microscope encompasses a stand (3) which possesses a stand base (3a) that defines an external contour (3b). The microscope (1) is placed onto the microscope carrier (2). The microscope carrier (2) comprises a body (4) and a left and a right hand rest (6). The left and the right hand rest (6) are attached to the body (4) so as to pivot freely and independently of one another. A height adjustment of the microscope carrier (2) results in a pivoting of the hand rests (6) in such a way that their front edges (6a) rest on the bench surface (50) regardless of the height adjustment.

Abstract: A microscope system includes at least one lens that defines an illumination field and at least one light source that emits an illuminating light beam for illuminating a specimen through the lens. At least one detector is provided for, pixel-by-pixel, detecting a detection light beam coming from the specimen. An electronic circuit is connected downstream from the detector, the electronic circuit including a memory unit for storing a wavelength-dependent brightness distribution of an illumination field of the at least one lens. The electronic circuit employs, pixel-by-pixel, the stored wavelength-dependent brightness distribution so as to form a homogeneously illuminated image field. An actuatable element is provided for controlling, pixel-by-pixel, an intensity of the illuminating light beam as a function of the stored wavelength-dependent brightness distribution so as to homogeneously illuminate the illumination field.

Abstract: An apparatus and a method for detection with a scanning microscope (1) are disclosed. The scanning microscope (1) encompasses a scanning device (7) that guides an illuminating light beam (3) through a scanning optical system (12) and a microscope optical system (13) and over or through a specimen (15). A digital circuit (30), which periodically interrogates the detected signals within a pixel (Px,y) and calculates an average therefrom, is placed after the detector unit (19).

Abstract: A laser microdissection method includes capturing an electronic image of an image detail of a specimen. The image detail is processed using image analysis so as to automatically ascertain an object to be cut out. A nominal cutting line around the object to be cut out is automatically defined. Subsequently, the object is cut out in response to a relative motion between a laser beam and the specimen.

Abstract: A detection device includes a spectral splitting device located in a detection beam path for spectrally splitting detection light into individual spectral components. A deflection device is located downstream of the spectral splitting device for deflecting the individual spectral components in different deflection directions onto detectors assigned to the individual spectral components. At least one optical element is located in the detection beam path downstream of the spectral splitting device and upstream of the deflection device such that at least one of the individual spectral components incident on the deflection device is collimated.

Abstract: A scanning microscope (1), having a light source (5) for generating an illumination light beam (7), having at least one objective (19) that focuses the illumination light beam onto and/or into a sample (21), having a beam deflection apparatus (11) that guides the focus of the illumination light beam over and/or through the sample, and having a detection device (29) that receives detected light emanating from the sample, is disclosed. The scanning microscope is characterized in that a means for generating a manipulation illumination pattern (37) is provided; and that imaging means image the manipulation illumination pattern onto and/or into the sample.

Abstract: A scanning microscope includes an excitation light beam, a stimulation light beam, an objective, an optical component and an optical system. The excitation light beam optically excites a first area of a specimen. The stimulation light beam triggers a stimulated emission or an additional excitation in a second area of the specimen, the second area at least partially overlapping with the first area of the specimen. The objective focuses the excitation light beam and the stimulation light beam. The optical component influences a shape of the focus of the excitation light beam and/or of the stimulation light beam. The optical system images the optical component into the pupil of the objective and adjusts a size of an image of the optical component.