Abstract: The arrangement for examining microscope preparations with a scanning microscope comprises a laser (1) and an optical means (12) which images the light generated by the laser (1) onto a specimen (13) that is to be examined. Provided between the laser (1) and the optical means (12) is an optical component (3, 20) that spectrally spreads, with a single pass, the light generated by the laser (1). The optical component (3, 20) is made of photonic band-gap material. It is particularly advantageous if the photonic band-gap material is configured as a light-guiding fiber (20).
Abstract: An automated microscope includes a stand and a front control panel. The front control panel is disposed on the stand and including a first and a second button. Third and a fourth buttons are associated with the microscope.
Abstract: A microscope system (4) for the observation of dynamic processes comprises a microscope (50) having at least one detector (19), and a computer (34). A buffer memory (54) precedes a comparator (58) that compares image contents of at least two successive image frames (56k and 56k+1). Depending on the result obtained from the comparator (58), the image frames are stored in different segments of a data structure (66) that is provided.
Abstract: A microscope includes a scanning head including a scanning device for a light beam. A scanning tube lens is coupled to the scanning head. The scanning head may be a scanning head of a scanning microscope. The scanning tube lens may be disposed inside the scanning head. The scanning tube lens may be adapted to an optical requirement of the scanning head.
Type:
Application
Filed:
February 21, 2006
Publication date:
October 5, 2006
Applicant:
Leica Microsystems CMS GmbH
Inventors:
Rafael Storz, Holger Birk, Heinrich Ulrich, Peter Euteneuer
Abstract: An objective for total internal reflection microscopy includes a diaphragm disposed near to or in the plane of the objective pupil. The diaphragm includes a middle area impermeable to illumination light and permeable to detection light of a microscope, and includes an edge area permeable to the illumination light. The illumination light has a focus in the plane of the objective pupil.
Abstract: A microscope includes a light source and a detector device. An illumination beam path extends between the light source and a sample. A detection beam path extends between the sample and the detector device. The detector device includes a detector module insertable into the detection beam path and configured to be replaced as a unit.
Abstract: A microscope includes a light source that emits an illuminating light beam for illumination of a specimen, a beam splitter separating measuring light out of the illuminating light beam, and an apparatus for determining the light power level of the illuminating light beam. The apparatus for determining the light power level of the illuminating light beam receives the measuring light and includes an apparatus for simultaneous color-selective detection of the measuring light.
Type:
Grant
Filed:
October 13, 2004
Date of Patent:
September 19, 2006
Assignee:
Leica Microsystems CMS GmbH
Inventors:
Holger Birk, Rafael Storz, Johann Engelhardt, Kyra Moellmann
Abstract: An apparatus for the spectral selection and detection of spectral regions of a light beam includes a selection unit and a detection unit. The selection unit includes a spectral splitting device and a light blocking and reflecting device. The spectral splitting device is for spectrally splitting the light beam. The light blocking and reflecting device is for blocking a first spectral region and reflecting at least part of an unblocked second spectral region. The detection unit includes a number of detectors. At least one of the detectors is disposed in a first beam path of the blocked second spectral region. At least one of the detectors is disposed in a second beam path of the reflected first spectral region. Each of the detectors has a different detection property or uses a respective different detection method.
Abstract: The present invention discloses a light source (10) for the illumination of microscopic specimens. The invention also discloses a scanning microscope system that possesses a light source (10). The light source (10) emits a combined light beam that is emitted by a first laser (4) and a second laser (6). In the combined light beam, the light of the first laser (4) is synchronized with the light of the second laser (6).
Abstract: A laser microdissection unit for cutting a microscopic sample using a laser beam of a laser includes a microscope and a fluorescence device. The microscope includes an illumination beam path directed onto the sample, and an imaging beam path configured to image the sample. The fluorescence device includes an excitation filter, a dichroic beam splitter, and a blocking filter. The dichroic beam splitter and the blocking filter are spectrally transparent to the laser beam, and the laser beam is directable through the dichroic beam splitter and the blocking filter onto the sample.
Abstract: A photomultiplier system includes a detector tube, a power supply unit, and a thermal isolation element. The power supply unit provides an accelerating voltage for operating the detector tube. The detector tube and the power supply unit are disposed on different sides of the thermal isolation element.
Abstract: A method for recognizing dark states during the spectroscopic or microscopic examination of fluorescent specimens (1), in particular using fluorescent proteins, the excitation/illumination volume, thus the intensity distribution of the excitation light, being varied over the course of at least two mutually independent measurements, a determination being made as to whether the observed time constants change and, in the case of unchanged time constants, the existence of a dark state being inferred.
Type:
Application
Filed:
February 21, 2006
Publication date:
August 24, 2006
Applicant:
Leica Microsystems CMS GmbH
Inventors:
Juergen Riedmann, Werner Knebel, Lioba Kuschel
Abstract: A lifting stage includes a carrier frame, an object plate configured to carry an object, a cross-member, and a parallel articulation arrangement configured to articulate the object plate to the carrier frame so that the object plate is capable of being raised or lowered relative to the carrier frame without tilting. The parallel articulation arrangement includes a number of parallel articulations and connects the cross-member to the carrier frame and the cross-member to the object plate.
Abstract: A method for blind deconvolution of microscopic images in which only a single parameter is varied for the estimation of the PSF. The single parameter takes account of the optical properties of the environment of the object (40) between the objective (20) of the microscope (1) and the region above the object. The single parameter represents a functional relationship among the parameters of the individual layers.
Abstract: An optical arrangement for deflecting a light beam includes first and second deflection devices, and a coupling mirror. The first deflection device is rotatable about a first axis using a first rotary drive, and includes two mirrors disposed non-rotatably with respect to each other in an angular position so as to rotate jointly about the first axis. The second deflection device is rotatable about a second axis using a second rotary drive, and includes a third mirror. The coupling mirror deflects the light beam onto the first or second mirror at an angle greater than 45° relative to the surface of the mirror. The first and second axes are perpendicular to each other. The first and a second mirrors rotate jointly about the first axis so that the light beam rotates about a center of rotation located on the second axis.
Abstract: An apparatus for setting a divergence and/or convergence of a light beam includes at least one optical component for influencing the divergence and/or convergence of the light beam. A positioning device is provided for positioning the optical component. The positioning device includes at least one piezoelectric element.
Abstract: The present invention discloses a microscope and a focusing device for a microscope. The focusing device has at least one operating element attached to a first axle of the focusing device for effecting movement of a microscope stage along the optical axis of the microscope. An adjustable stop mechanism is provided which cooperates with the focusing device to limit the movement of the microscope stage in the direction of the optical axis. The adjustable stop mechanism comprises a rod, a spring for biasing the rod and a screw for adjusting and fixing a position of the rod.
Abstract: A detector includes a photosensitive array including at least one photosensitive surface. A focusing device focuses spectrally split light onto the photosensitive array. The focusing device is located in an optical path upstream from the photosensitive array. The focusing device includes a microlens array including at least one microlens.
Abstract: A detector includes a CCD arrangement having at least one CCD, and a focusing device. The focusing device focuses spectrally separated light onto the CCD arrangement. The focusing device is located in an optical path before the CCD arrangement, and includes a microlens arrangement having at least one microlens.
Abstract: With an eye towards achieving a particularly simple structure, a microscope with an objective (1) and/or an objective changer and/or an objective turret as well as adjustment means (3) for positioning a specimen stage is configured and refined in such a way that the objective (1) and/or the objective changer and/or the objective turret is/are coupled to the adjustment means (3) in such a way that the position of the objective (1) and/or the objective changer and/or the objective turret can be adjusted by the adjustment means (3).