Abstract: Methods, systems, and computer-readable mediums for configuring a lithography tool to manufacture a semiconductor device. The method includes selecting a first variable, selecting a second variable, selecting at least one response variable that is a function of the first variable and second variable, determining a measurement uncertainty for each response variable, determining, based on a measurement of the response variable, and the measurement uncertainty for the response variable, a plurality of probabilities representing a plurality of indications of whether a plurality of points associated with a lithography process meet a specification requirement for each response variable, wherein the plurality of probabilities represent a process window, and configuring, based on the process window, a lithography tool to manufacture a semiconductor device.
Abstract: A system includes a video device for capturing, at a viewing time, a first video image corresponding to a foundation scene at a setting, the foundation scene viewed at the viewing time from a vantage position. A memory stores a library of image data including media generated at a time prior to the viewing time. A vantage position monitor tracks the vantage position and generating vantage position of a human viewer. A digital video data controller selects from the image data in the library, at the viewing time and based on the vantage position data, a plurality of second images corresponding to a modifying scene at the setting, the modifying scene further corresponding to the vantage position. A combiner combines the first video image and the plurality of second images to create a composite image for display.
Inventors:
Alex Bergner, Alex Ding, Ben McGinley, Brad Richards, Christopher Bell, Dan Alberti, Dan Safarik, Eric Konkel, Eric Stafford, Erick Castelo Bayardi, James Miller, Johann Voges, Jon Plesetz, Kevin Brandt, Lynn Behrens, Mark Gales, Matt Anchor, Michael W. Bednarz, Michael DeCaluwe, Michael Hannah, Mike Arndt, Nicholas LeRoy, Sam Reitinger, Steve Osgood, Tim Karcher, Roger Thounlasenh