Patents Assigned to LSI Logic Corporation
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Patent number: 6643332Abstract: A method and apparatus for multi-level encrypted encoding and decoding of digital signals, which includes utilizing only one type of encoder and one type of decoder. This can be either the same encoder and decoder used in throughout the process, or multiple, identical encoders and decoders. This allows the system to compensate for atmospheric degradation with higher bandwidth efficiency and a simplified receiver structure. The invention further identifies a 2j symbol generation technique that maps in disjoint regions of X-dimensional space, which allows different data bits to be eliminated from the decoding scheme and maximizes the number of independent data substreams that can be maintained.Type: GrantFiled: July 9, 1999Date of Patent: November 4, 2003Assignee: LSI Logic CorporationInventors: Robert Morelos-Zaragoza, Shu Lin, Marc Fossorier
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Publication number: 20030203620Abstract: A dual-damascene process for forming an integrated circuit structure is described. The process includes forming a trench in a dielectric substrate, and forming a via mask layer over the dielectric substrate and the trench. An aperture is formed in the via mask layer overlying the trench, thereby exposing a portion of the underlying dielectric substrate. The exposed portion of the dielectric substrate is subjected to an ion beam to damage the exposed dielectric material. The damaged portion of the dielectric substrate is then removed, such as by etching, thereby forming a via cavity below the trench in the dielectric substrate. Generally, the damaged portion of the dielectric substrate etches at a faster rate than do adjacent non-damaged regions. With a faster etch, there is practically no outward spreading of the via cavity as the etch proceeds downward through the dielectric substrate, thereby forming a via cavity wall that is very nearly vertical.Type: ApplicationFiled: March 27, 2003Publication date: October 30, 2003Applicant: LSI Logic CorporationInventor: Charles E. May
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Publication number: 20030203622Abstract: A method of forming a metallization interconnection system within a via. A first liner layer of titanium is deposited to a first thickness in the following manner. A substrate containing the via is placed within an ion metal plasma deposition chamber that contains a titanium target. The ion metal plasma deposition chamber is evacuated to a first base pressure. A first flow of argon is introduced to the ion metal plasma deposition chamber at a first deposition pressure. The substrate is biased to a first voltage. A plasma within the ion metal plasma deposition chamber is energized at a first power for a first length of time. A second liner layer of TixNy is deposited to a second thickness on top of the first liner layer of titanium in the following manner. A first flow of nitrogen and a second flow of argon are introduced to the ion metal plasma deposition chamber at a second deposition pressure. The substrate is biased to a second voltage.Type: ApplicationFiled: March 27, 2003Publication date: October 30, 2003Applicant: LSI Logic CorporationInventors: Prabhakar P. Tripathi, Zhihai Wang, Weidan Li
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Patent number: 6640333Abstract: The present invention is directed to platform architecture. A system for providing distributed dynamic functionality in an electronic environment may include a plurality of platforms. The platforms are suitable for providing a logic function, and include embedded programmable logic, memory and a reconfigurable core. The logic, memory and reconfigurable core are communicatively coupled via a fabric interconnect. A map is also included which expresses logic functions of the plurality of platforms.Type: GrantFiled: January 10, 2002Date of Patent: October 28, 2003Assignee: LSI Logic CorporationInventor: Christopher L. Hamlin
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Patent number: 6639321Abstract: A flip chip ball grid array package includes a thin die having a die thickness reduced from a wafer thickness to reduce mismatch of a coefficient of thermal expansion between the thin die and a substrate; a plurality of thin film layers formed on the thin die wherein each of the plurality of thin film layers has a coefficient of thermal expansion that is greater than that of the thin die and is less than that of the substrate; and a plurality of wafer bumps formed on the thin die for making electrical contact between the thin die and the substrate.Type: GrantFiled: October 6, 2000Date of Patent: October 28, 2003Assignee: LSI Logic CorporationInventors: Kumar Nagarajan, Zafer Kutlu, Shirish Shah
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Patent number: 6639312Abstract: Dummy wafers that are used in IC manufacturing and methods for manufacturing the same are described. The dummy wafers are made with an increased resistance to breaking during CVD manufacturing process. The dummy wafers are made by placing a protective film over the wafer surface(s) exposed during the CVD process. By increasing the resistance to breaking, the protective film extends the useful life of the dummy wafers.Type: GrantFiled: November 7, 2001Date of Patent: October 28, 2003Assignees: Matrix Semiconductor, Inc, LSI Logic CorporationInventors: Scott Brad Herner, James M. Cleeves
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Patent number: 6638776Abstract: A method of standardizing a fabrication process for an integrated circuit. The fabrication process includes a preceding thermal energy sensitive process and at least one set of selectable succeeding thermal energy delivery processes. An integrated circuit structure is formed using the preceding thermal energy sensitive process. The preceding thermal energy sensitive process is characterized based at least in part upon the greatest amount of thermal energy delivered to the integrated circuit by one of the set of selectable succeeding thermal energy delivery processes. Then as subsequent processes are selected and accomplished, if they do not deliver the greatest amount of thermal energy as anticipated by the preceding thermal energy sensitive process, an additional amount of thermal energy is added, so as to preferably equal the anticipated greatest amount of thermal energy. In this manner, the characterization of the preceding thermal energy sensitive process attains its desired parameters.Type: GrantFiled: February 15, 2002Date of Patent: October 28, 2003Assignee: LSI Logic CorporationInventor: Charles E. May
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Patent number: 6640321Abstract: A method is presented for self-test and self-repair of a semiconductor memory device. Prior to the self-repair stage, both redundant and regular memory portions are comprehensively tested, preferably using a checkerboard bit pattern. Faulty rows identified in each memory portion during testing are recorded. Known-bad rows in regular memory are then replaced by known-good redundant rows in the self-repair stage, and the resulting repaired memory is retested for verification. Compared to existing methods, the new method is believed to provide improved test coverage, making it both more effective in identifying non-repairable memory devices and less prone to fail repairable ones.Type: GrantFiled: April 14, 2000Date of Patent: October 28, 2003Assignee: LSI Logic CorporationInventors: Johnnie A. Huang, Ghasi R. Agrawal
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Publication number: 20030200391Abstract: Accordingly, the present invention is directed to a method of managing data in a storage system. A method of performing a write to data storage system, including a first storage device and a second storage device, may include writing a first set of header information to a first storage device and a second storage device. The first set of header information includes a first sequence number and a second sequence number, in which the first set of header information includes a first sequence number incremented to indicate a change from the second sequence number. Data is written to the first storage device and the second storage device. Then, a second set of header information is written to a first storage device and a second storage device. The second set of header information includes a first sequence number and a second sequence number, in which the second set of header information includes a second sequence number incremented to correspond to the first sequence number.Type: ApplicationFiled: May 19, 2003Publication date: October 23, 2003Applicant: LSI Logic CorporationInventors: Stanley E. Krehbiel, William P. Delaney, Donald R. Humlicek, Gregory A. Yarnell, Joseph G. Moore
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Patent number: 6637016Abstract: A method for selectively placing cells of an application-specific integrated circuit on a substrate surface, including the steps of defining a grid covering a substrate surface, assigning cells to the grid to provide old x and y coordinates of the cells relative to the grid, grouping the cells by function to provide functional regions within the grid, determining a density map of the surface of the substrate in all the functional regions within the grid, determining free space of the grid on the surface of the substrate relative to the density map, and assigning new cells to the free space of the grid on the substrate surface to provide an application specific integrated circuit. Use of the method provides improved layout of an integrated circuit with minimal cell congestion or overlapping.Type: GrantFiled: April 25, 2001Date of Patent: October 21, 2003Assignee: LSI Logic CorporationInventors: Elyar E. Gasanov, Andrej A. Zolotykh, Ivan Pavisic, Aiguo Lu
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Patent number: 6635116Abstract: An apparatus for reducing residual oxygen content from a processing chamber of an atmospheric reactor after the processing chamber of the atmospheric reactor has been exposed to an oxygen environment. The processing chamber of the atmospheric reactor has an inert gas purge, including an inert gas source, for reducing a residual oxygen level within the processing chamber of the atmospheric reactor at a rate of reduction. A venturi vacuum system is enabled by the inert gas source. The venturi vacuum system draws a vacuum on the processing chamber of the atmospheric reactor and supplements the inert gas purge, thereby accelerating the rate at which the residual oxygen level is reduced within the processing chamber of the atmospheric reactor. In this manner, the vacuum created by the venturi vacuum system increases the efficiency of the inert gas purge by reducing by some moderate degree the pressure within the processing chamber of the atmospheric reactor.Type: GrantFiled: August 29, 2000Date of Patent: October 21, 2003Assignee: LSI Logic CorporationInventors: Mark I. Mayeda, Steven E. Reder, Richard Gimmi, Matthew R. Trattles
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Patent number: 6637011Abstract: The present invention is a method for searching an identity base for identities that can be applied to a given formula. The method includes transforming the formulas from an identity base into a standard form, creating a set of code words for said identity base, constructing a lexicographical tree of a code word set of said identity base, and outputting a list of formula numbers from said identity base.Type: GrantFiled: October 2, 2000Date of Patent: October 21, 2003Assignee: LSI Logic CorporationInventors: Andrej A. Zolotykh, Elyar E. Gasanov, Alexander S. Podkolzin, Valery B. Kudryavtsev
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Patent number: 6636979Abstract: A phase error measurement circuit for measuring phase error between two clocks on an integrated circuit is provided. The measurement circuit includes first and second clock signal inputs, a phase lead detector, a phase lag detector and a phase error measurement output. The phase lead detector includes a phase lead latch having a data input, which is coupled to the first clock signal input, a latch control input, which is coupled to the second clock signal input and a data output. The phase lag detector includes a phase lag latch having a data input, which is coupled to the second clock signal input, a latch control input, which is coupled to the first clock signal input and a data output. The phase error measurement output is formed by the data outputs of the phase lead latch and the phase lag latch.Type: GrantFiled: April 13, 2000Date of Patent: October 21, 2003Assignee: LSI Logic CorporationInventors: Dayanand K. Reddy, Joel J. Christiansen, Ian MacPherson Flanagan
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Patent number: 6636552Abstract: Provided is a method and an apparatus for pseudo-random noise (PN) code sequence hopping, in which an output PN code sequence is generated by generating and combining several intermediate PN code sequences, each of the intermediate PN code sequences being generated by a corresponding PN code sequence generator. A base state is stored for each of the plural intermediate PN code sequences, and the number of states to advance the output PN code sequence is identified, the number being greater than one. A transformation function is obtained for each of the plural intermediate PN code sequences, based on the number of states to advance the output PN code sequence, and then the base state for each intermediate PN code sequence is advanced by the number of states to advance the output PN code sequence, by utilizing the transformation function for such intermediate PN code sequence, to obtain a new state for such intermediate PN code sequence.Type: GrantFiled: November 16, 1999Date of Patent: October 21, 2003Assignee: LSI Logic CorporationInventor: Brian C. Banister
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Patent number: 6633944Abstract: A bus bridge generally comprising a first interface, a second interface, a plurality of registers and a controller. The first interface may be connectable to a first bus having a first data width. The second interface may be connectable to a second bus having a second data width narrower than the first data width. The plurality of registers may be configured to buffer (i) data, (ii) an address, and (iii) a plurality of control signals between the first bus and the second bus. The controller configured to control the registers.Type: GrantFiled: October 31, 2001Date of Patent: October 14, 2003Assignee: LSI Logic CorporationInventors: Jeffrey J. Holm, Steven M. Emerson, Matthew D. Kirkwood
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Patent number: 6634003Abstract: A system for disabling defective memory elements includes a memory array, an address decoder and a decoder element. The memory array has multiple memory elements for storing data. The address decoder receives a requested memory address and produces multiple element-select signals. Each element-select signal is associated with one of the memory elements and indicates whether access to the associated memory element is requested by the host. The decoder element receives one of the element-select signals and provides an output signal to the associated memory element. If the associated memory element is functional, the output signal enables or disables the associated memory element in accordance with the associated element-select signal. If, on the other hand, the associated memory element is defective, the output signal disables the associated memory element regardless of the associated element-select signal.Type: GrantFiled: February 10, 2000Date of Patent: October 14, 2003Assignee: LSI Logic CorporationInventor: Tuan Phan
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Patent number: 6633832Abstract: An improved PCI-X verification method and apparatus provides iterative testing of all desired conditions or protocol combinations in a PCI-X system. One or more commands may be tested in combination with one or more functional behavior parameters throughout a desired range of variable parameter values. In one aspect, an apparatus and method for testing a PCI-X device for compliance under the PCI-X Addendum to the PCI Local Bus Specification in completer operation are provided. In another aspect, an apparatus and method for testing a PCI-X-device for compliance under the PCI-X addendum to the PCI Local Bus Specification in requester operation are provided.Type: GrantFiled: February 28, 2001Date of Patent: October 14, 2003Assignee: LSI Logic CorporationInventor: Adam Browen
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Patent number: 6633245Abstract: A method and system for correcting quantization loss of a signal during analog to digital to analog signal conversion, wherein the quantization loss is a function of (sin x)/x, is disclosed. The system and method of the present invention includes utilizing a continuous function polynomial to represent a (sin x)/x function, and applying an inverse function of the continuous function polynomial to the signal to provide a correction for the quantization loss.Type: GrantFiled: December 12, 2002Date of Patent: October 14, 2003Assignee: LSI Logic CorporationInventor: Mirko Vojnovic
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Patent number: 6633969Abstract: An apparatus and method for translating variable-length instructions to fixed-length instructions. The apparatus includes instruction decompression logic and caching logic. The instruction decompression logic receives a first portion of an instruction data block, an output signal produced by the caching logic, and a control signal during a time period. The instruction decompression logic produces a fixed-length instruction during the time period dependent upon the first portion of the instruction data block, the output signal produced by the caching logic, and the control signal. The caching logic includes a storage unit. During the time period, the caching logic receives a second portion of the instruction data block and the control signal. The caching logic stores the second portion of the instruction data block within the storage unit during the time period dependent upon the control signal.Type: GrantFiled: August 11, 2000Date of Patent: October 14, 2003Assignee: LSI Logic CorporationInventor: Shuaibin Lin
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Patent number: 6633989Abstract: A circuit for synchronizing an internal time signal to an external time signal includes a first timer, a second timer, and a comparator. The first timer repetitively increments and outputs a first time signal. The second timer repetitively outputs a second time signal. The comparator drives an active comparator signal if the first time signal is greater than the second time signal, or otherwise an inactive signal. The first timer saves the second time signal as the first time signal in response to a control signal derived from the inactive comparator signal and repetitively increments and outputs the first time signal. Alternatively, the first timer freezes, i.e., preventing the repetitive incrementing, of the first time signal in response to a control signal derived from the active comparator signal. The second timer repetitively increments and outputs the second time signal in response to a control signal derived from the active comparator signal.Type: GrantFiled: November 30, 1999Date of Patent: October 14, 2003Assignee: LSI Logic CorporationInventor: Jack B. Hollins