Abstract: A lathe includes a spindle rotatable on a spindle axis, a tool post to which a tool is attachable, an X1-axis ball screw extended in an X1-axis direction perpendicular to the spindle axis and capable of moving the tool post in the X1-axis direction, and an X1-axis support bearing provided on an end of the X1-axis ball screw with respect to the X1-axis direction to restrict movement of the X1-axis ball screw in the X1-axis direction. The tool post is provided with an X1-axis ball screw nut engaged with the X1-axis ball screw. The X1-axis ball screw nut is movable in the X1-axis direction according to rotation of the X1-axis ball screw. The direction that the X1-axis ball screw nut approaches the X1-axis support bearing faces the same direction as the direction that the tool cuts into the workpiece.

Abstract: A measurement method of receiving an emission light output from an optical semiconductor element on an incident end surface of an optical probe, shifts a relative position between the optical semiconductor element and the optical probe on a plane surface intersecting with an optical axis of the emission light, measures an incident intensity of the emission light at several positions, and obtains an incident intensity pattern showing a relationship between a change in the relative position and the respective incident intensities.

Abstract: An optical probe includes a first region and a second region connected to have a continuous optical waveguide in which a transmission mode is a single mode. The first region connected to a tip-end surface opposed to an optical device includes a region in which a mode field diameter that is maximum at the tip-end surface is gradually decreased toward a boundary between the first region and the second region. The tip-end surface is a curved surface and has a radius of curvature set so that an advancing direction of an optical signal entering through the tip-end surface approximates in parallel to a central-axis direction of the optical waveguide.

Abstract: An inspection apparatus makes an inspection of electrical characteristics of an object to be inspected using a contactor brought into electrical contact with an electrode of the object to be inspected, the inspection apparatus including: a position adjusting unit including the contactor, a position adjusting section that adjusts a tip position of the contactor, and a load detecting section that detects a value of contact load between the contactor and the electrode; a position deriving section that derives an initial position of the contactor in a specific direction based on a relationship between an amount of contact displacement of the contactor in the specific direction and the value of contact load between the contactor and the electrode; and a movement performing section that moves the tip position of the contactor based on the initial position in the specific direction derived by the position deriving section.

Abstract: An NC lathe including a first spindle, a second spindle capable of holding a cut-off workpiece delivered from the first spindle, a second tool post on which a plurality of tools are attachable to machine the workpiece held by the second spindle, a product receiver provided on the second tool post, a Y2-axis motor capable of moving at least one of the second tool post and the second spindle in a Y2-axis direction, and an X2-axis motor capable of moving at least one of the second tool post and the second spindle in an X2-axis direction. The second tool post has a plurality of tool mounting parts where the tools are attachable. The tool mounting parts are aligned at intervals in the Y2-axis direction. At least one of the tool mounting parts is arranged in a position overlapping the product receiver with respect to the X2-axis direction.

Abstract: Provided is a lathe capable of shortening the spindle. The lathe comprises a spindle, a spindle support which supports the spindle through a bearing on an outer side of the spindle, a collet disposed on a front end of the spindle, an inner ring holder provided on the spindle to hold a front of an inner ring of the bearing, an outer ring holder provided on the spindle support to hold a front of an outer ring of the bearing, a cap screwed into the spindle in front of the inner ring holder, and a cover detachably provided on the spindle support side. The cover has an inner circumferential surface facing an outer circumferential surface of the cap. A first air purging unit is provided between the inner circumferential surface of the cover and the outer circumferential surface of the cap.

Abstract: A connecting device for inspection includes a probe head configured to hold electric contacts and optical contacts such that tip ends of the respective contacts are exposed on a lower surface of the probe head while proximal ends of the electric contacts are exposed on an upper surface of the probe head and the optical contacts are fixed to the probe head, and a transformer including connecting wires provided therein such that tip ends on one side of the connecting wires electrically connected to the proximal ends of the electric contacts exposed on the upper surface of the probe head are arranged in a lower surface of the transformer while the optical contacts slidably penetrate the transformer. A positional relationship between the tip end of the respective electric contacts and the tip end of the respective optical contacts on the lower surface of the probe head corresponds to a positional relationship between an electrical signal terminal and an optical signal terminal of a semiconductor device.

Abstract: [Problem] To allow to condense and guide the light emitted by a light emitting element having a large light emission surface to an optical connector, in inspection of a semiconductor integrated circuit. [Solution] The present disclosure provides a connecting apparatus used at the time of inspection of a semiconductor integrated circuit, and the connecting apparatus includes an electric connector electrically connecting to an electrode terminal of the semiconductor integrated circuit, an optical connector optically connecting to an optical terminal of the semiconductor integrated circuit, a connector support substrate configured to support the electric connector and the optical connector so that an end part of the electric connector and an end part of the optical connector respectively connect to the semiconductor integrated circuit, and a light condensing substrate configured to condense light emitted by an optical terminal of the semiconductor integrated circuit to the optical connector.

Abstract: It is possible to make the free length of a contactor uniform even when the contactor is joined to a position that deviates from a joint position in a high-frequency conducting path and make contact with an electrode with stability, which improves measurement quality. A probe unit according to the present disclosure includes: a coaxial connector that is attached to a main body and gives and receives an electrical signal to and from a tester via a coaxial cable; a high-frequency conducting path that is connected to the coaxial connector and transmits an electrical signal; a plurality of contactors, each having a tip portion that makes electrical contact with an electrode of an object to be inspected and giving and receiving an electrical signal to and from the high-frequency conducting path; and a pedestal that is interposed between the contactor and the high-frequency conducting path, and the pedestal is provided in each contactor such that a free length of the contactor is a predetermined length.

Abstract: A water treatment system includes a primary evaporator and a secondary evaporator that is also a primary condenser. The primary evaporator relies on imparting rotational motion to the fluid to atomize it. The secondary evaporator may be a tube and shell heat exchanger. Embodiments include heat exchangers for using waste heat of various components. In an embodiment, concentrated effluent is recirculated and combined with influent to improve efficiency of the system to achieve zero liquid discharge and aid in continuous cleaning of the system.

Abstract: An electrical connecting device includes an insulating probe including a bottom-side plunger, a top-side plunger, and a barrel, and a probe head including a combined guide plate having a conductive region made of a conductive material and an insulating region made of an insulating material arranged adjacent to each other in a planar view. The bottom-side plunger and the top-side plunger are electrically connected to each other inside the barrel, and the bottom-side plunger and the top-side plunger are electrically insulated from the barrel. The probe head holds the insulating probe in a state in which the barrel penetrates through the conductive region. The barrel of the insulating probe is connected to a ground potential via the conductive region when an inspection object is measured.

Abstract: A connecting device for inspection includes a probe head configured to hold electric contacts and optical contacts such that tip ends of the respective contacts are exposed on a lower surface of the probe head, and a transformer including connecting wires arranged therein and optical wires penetrating therethrough. The respective proximal ends of the electric contacts and the optical contacts are exposed on an upper surface of the probe head, and tip ends on one side of the connecting wires electrically connected to the proximal ends of the electric contacts and connecting ends of the optical wires optically connected to the proximal ends of the optical contacts are arranged in a lower surface of the transformer.

Abstract: An object is to enhance the durability of substrates of a probe substrate and/or the probe substrate and a member to be joined.

Abstract: An electrical connecting device includes a probe head, and probes for measurement and probes for confirmation held by the probe head. The probe head holds the probes for measurement and the probes for confirmation in a state in which the respective tip ends are exposed therefrom. An exposed length from the probe head to the tip end is shorter for the probes for confirmation than for the probes for measurement.

Abstract: An atomizer for use in a water treatment system includes an influent inlet, to receive a flow of fluid containing contaminants a gas flow inlet, to receive a flow of gas to be mixed with the fluid in a mixing zone, an airflow controlling component, including an array of vanes disposed between the gas flow inlet and the mixing zone to impart a rotational component to a direction of flow of the gas. A channel receives the flow of fluid containing contaminants, and conducts the flow of fluid containing contaminants to the mixing zone, wherein radially outwardly flowing fluid containing contaminants is mixed with radially inwardly flowing gas to atomize the fluid containing contaminants, and an outlet.

Abstract: An optical probe receives an optical signal output from a test subject. The optical probe includes an optical waveguide composed of a core portion and a cladding portion disposed on an outer periphery of the core portion, wherein an incident surface of the optical waveguide, which receives the optical signal, is a convex spherical surface with a constant curvature radius.

Abstract: The printer (10) of the present disclosure is a printer connectable to a network (30) and an information processing terminal (20), including a control section (15) configured to: when obtaining data in accordance with the network class from the information processing terminal (20), extract a first frame based on a first communication standard used for communications between the printer (10) and the network (30), from the data; when determining that destination information included in the first frame specifies the printer (10), extract and interpret print information included in the first frame; and when determining that the destination information included in the first frame does not specify the printer (10), forward the first frame to the network (30).

Abstract: A connecting device for inspection includes optical probes, and a probe head including a plurality of guide plates. The probe head includes a first guide plate, and a second guide plate arranged movably with respect to the first guide plate in a radial direction of the penetration holes in a state in which the optical probes are inserted to the respective penetration holes. The probe head holds the optical probes by inner wall surfaces of the penetration holes of the first guide plate and inner wall surfaces of the penetration holes of the second guide plate in a state in which the positions of the central axes of the penetration holes of the first guide plate are shifted in the radial direction from the positions of the central axes of the penetration holes of the second guide plate.

Abstract: Provided is a machine tool capable of facilitating switching moving ranges of the moving unit. A moving-side cover provided on the moving unit covers part of a position of the driving apparatus in the moving direction. A supporting-side cover is provided in a position on a side of the first moving range of an end of the moving-side cover on a side of the second moving range in the moving direction to continuously cover the part of the position of the driving apparatus in the moving direction in cooperation with the moving-side cover in the first use state. The supporting-side cover forms a clearance in the moving direction with respect to the moving-side cover in the second use state. A slide cover is mounted on one of supporting-side cover and the moving-side cover slidably in the moving direction to close the clearance when slidably drawn out in the moving direction.

Abstract: The present disclosure is an inspection apparatus that makes an inspection of electrical characteristics of an object to be inspected. using a contactor brought into electrical contact with an electrode of the object to be inspected, the inspection apparatus including: a position adjusting unit including the contactor, a position adjusting section that adjusts a tip position of the contactor, and a load. detecting section that detects a value of contact load between the contactor and the electrode; a position deriving section that derives an initial position of the contactor in a specific direction based on a relationship between an amount of contact displacement of the contactor in the specific direction and the value of contact load between the contactor and the electrode; and a movement performing section that moves the tip position of the contactor based on the initial position in the specific direction derived by the position deriving section.