Patents Assigned to Micronics
  • Patent number: 11899054
    Abstract: A connecting device for inspection includes a probe head configured to hold electric contacts and optical contacts such that tip ends of the respective contacts are exposed on a lower surface of the probe head while proximal ends of the electric contacts are exposed on an upper surface of the probe head and the optical contacts are fixed to the probe head, and a transformer including connecting wires provided therein such that tip ends on one side of the connecting wires electrically connected to the proximal ends of the electric contacts exposed on the upper surface of the probe head are arranged in a lower surface of the transformer while the optical contacts slidably penetrate the transformer. A positional relationship between the tip end of the respective electric contacts and the tip end of the respective optical contacts on the lower surface of the probe head corresponds to a positional relationship between an electrical signal terminal and an optical signal terminal of a semiconductor device.
    Type: Grant
    Filed: April 3, 2020
    Date of Patent: February 13, 2024
    Assignee: Kabushiki Kaisha Nihon Micronics
    Inventor: Minoru Sato
  • Patent number: 11874511
    Abstract: [Problem] To allow to condense and guide the light emitted by a light emitting element having a large light emission surface to an optical connector, in inspection of a semiconductor integrated circuit. [Solution] The present disclosure provides a connecting apparatus used at the time of inspection of a semiconductor integrated circuit, and the connecting apparatus includes an electric connector electrically connecting to an electrode terminal of the semiconductor integrated circuit, an optical connector optically connecting to an optical terminal of the semiconductor integrated circuit, a connector support substrate configured to support the electric connector and the optical connector so that an end part of the electric connector and an end part of the optical connector respectively connect to the semiconductor integrated circuit, and a light condensing substrate configured to condense light emitted by an optical terminal of the semiconductor integrated circuit to the optical connector.
    Type: Grant
    Filed: January 25, 2022
    Date of Patent: January 16, 2024
    Assignee: KABUSHIKI KAISHA NIHON MICRONICS
    Inventors: Hiroshi Kamiya, Yuki Komai, Hisao Narita
  • Patent number: 11860190
    Abstract: It is possible to make the free length of a contactor uniform even when the contactor is joined to a position that deviates from a joint position in a high-frequency conducting path and make contact with an electrode with stability, which improves measurement quality. A probe unit according to the present disclosure includes: a coaxial connector that is attached to a main body and gives and receives an electrical signal to and from a tester via a coaxial cable; a high-frequency conducting path that is connected to the coaxial connector and transmits an electrical signal; a plurality of contactors, each having a tip portion that makes electrical contact with an electrode of an object to be inspected and giving and receiving an electrical signal to and from the high-frequency conducting path; and a pedestal that is interposed between the contactor and the high-frequency conducting path, and the pedestal is provided in each contactor such that a free length of the contactor is a predetermined length.
    Type: Grant
    Filed: April 27, 2022
    Date of Patent: January 2, 2024
    Assignee: KABUSHIKI KAISHA NIHON MICRONICS
    Inventors: Satoshi Narita, Shou Harako, Jukiya Fukushi
  • Patent number: 11834350
    Abstract: A water treatment system includes a primary evaporator and a secondary evaporator that is also a primary condenser. The primary evaporator relies on imparting rotational motion to the fluid to atomize it. The secondary evaporator may be a tube and shell heat exchanger. Embodiments include heat exchangers for using waste heat of various components. In an embodiment, concentrated effluent is recirculated and combined with influent to improve efficiency of the system to achieve zero liquid discharge and aid in continuous cleaning of the system.
    Type: Grant
    Filed: April 10, 2020
    Date of Patent: December 5, 2023
    Assignee: MICRONIC TECHNOLOGIES, INC.
    Inventor: Kelly Rock
  • Patent number: 11828773
    Abstract: An electrical connecting device includes an insulating probe including a bottom-side plunger, a top-side plunger, and a barrel, and a probe head including a combined guide plate having a conductive region made of a conductive material and an insulating region made of an insulating material arranged adjacent to each other in a planar view. The bottom-side plunger and the top-side plunger are electrically connected to each other inside the barrel, and the bottom-side plunger and the top-side plunger are electrically insulated from the barrel. The probe head holds the insulating probe in a state in which the barrel penetrates through the conductive region. The barrel of the insulating probe is connected to a ground potential via the conductive region when an inspection object is measured.
    Type: Grant
    Filed: December 20, 2019
    Date of Patent: November 28, 2023
    Assignee: Kabushiki Kaisha Nihon Micronics
    Inventor: Akihiro Shuto
  • Patent number: 11762008
    Abstract: A connecting device for inspection includes a probe head configured to hold electric contacts and optical contacts such that tip ends of the respective contacts are exposed on a lower surface of the probe head, and a transformer including connecting wires arranged therein and optical wires penetrating therethrough. The respective proximal ends of the electric contacts and the optical contacts are exposed on an upper surface of the probe head, and tip ends on one side of the connecting wires electrically connected to the proximal ends of the electric contacts and connecting ends of the optical wires optically connected to the proximal ends of the optical contacts are arranged in a lower surface of the transformer.
    Type: Grant
    Filed: April 3, 2020
    Date of Patent: September 19, 2023
    Assignee: Kabushiki Kaisha Nihon Micronics
    Inventor: Minoru Sato
  • Patent number: 11747365
    Abstract: An object is to enhance the durability of substrates of a probe substrate and/or the probe substrate and a member to be joined.
    Type: Grant
    Filed: October 18, 2019
    Date of Patent: September 5, 2023
    Assignees: KABUSHIKI KAISHA NIHON MICRONICS, TANAKA KIKINZOKU KOGYO K.K.
    Inventors: Toshinori Omori, Kazuya Goto, Yasuaki Osanai, Takashi Akiniwa, Takeki Sugisawa, Takeshi Kondo, Shintaro Abe, Maki Watanabe
  • Patent number: 11709182
    Abstract: An electrical connecting device includes a probe head, and probes for measurement and probes for confirmation held by the probe head. The probe head holds the probes for measurement and the probes for confirmation in a state in which the respective tip ends are exposed therefrom. An exposed length from the probe head to the tip end is shorter for the probes for confirmation than for the probes for measurement.
    Type: Grant
    Filed: March 29, 2021
    Date of Patent: July 25, 2023
    Assignee: Kabushiki Kaisha Nihon Micronics
    Inventor: Shota Hetsugi
  • Patent number: 11679994
    Abstract: An atomizer for use in a water treatment system includes an influent inlet, to receive a flow of fluid containing contaminants a gas flow inlet, to receive a flow of gas to be mixed with the fluid in a mixing zone, an airflow controlling component, including an array of vanes disposed between the gas flow inlet and the mixing zone to impart a rotational component to a direction of flow of the gas. A channel receives the flow of fluid containing contaminants, and conducts the flow of fluid containing contaminants to the mixing zone, wherein radially outwardly flowing fluid containing contaminants is mixed with radially inwardly flowing gas to atomize the fluid containing contaminants, and an outlet.
    Type: Grant
    Filed: April 1, 2021
    Date of Patent: June 20, 2023
    Assignee: MICRONIC TECHNOLOGIES, INC.
    Inventor: Kelly Rock
  • Patent number: 11624679
    Abstract: An optical probe receives an optical signal output from a test subject. The optical probe includes an optical waveguide composed of a core portion and a cladding portion disposed on an outer periphery of the core portion, wherein an incident surface of the optical waveguide, which receives the optical signal, is a convex spherical surface with a constant curvature radius.
    Type: Grant
    Filed: September 30, 2020
    Date of Patent: April 11, 2023
    Assignee: Kabushiki Kaisha Nihon Micronics
    Inventors: Michitaka Okuta, Yuki Saito, Toshinaga Takeya, Shou Harako, Jukiya Fukushi, Minoru Sato, Hisao Narita
  • Patent number: 11604617
    Abstract: The printer (10) of the present disclosure is a printer connectable to a network (30) and an information processing terminal (20), including a control section (15) configured to: when obtaining data in accordance with the network class from the information processing terminal (20), extract a first frame based on a first communication standard used for communications between the printer (10) and the network (30), from the data; when determining that destination information included in the first frame specifies the printer (10), extract and interpret print information included in the first frame; and when determining that the destination information included in the first frame does not specify the printer (10), forward the first frame to the network (30).
    Type: Grant
    Filed: March 15, 2022
    Date of Patent: March 14, 2023
    Assignees: STAR MICRONICS CO., LTD., KCodes Corporation
    Inventors: Daisuke Tokita, Tangen Chiu
  • Patent number: 11592402
    Abstract: A connecting device for inspection includes optical probes, and a probe head including a plurality of guide plates. The probe head includes a first guide plate, and a second guide plate arranged movably with respect to the first guide plate in a radial direction of the penetration holes in a state in which the optical probes are inserted to the respective penetration holes. The probe head holds the optical probes by inner wall surfaces of the penetration holes of the first guide plate and inner wall surfaces of the penetration holes of the second guide plate in a state in which the positions of the central axes of the penetration holes of the first guide plate are shifted in the radial direction from the positions of the central axes of the penetration holes of the second guide plate.
    Type: Grant
    Filed: August 2, 2021
    Date of Patent: February 28, 2023
    Assignee: Kabushiki Kaisha Nihon Micronics
    Inventor: Minoru Sato
  • Patent number: 11548072
    Abstract: Provided is a machine tool capable of facilitating switching moving ranges of the moving unit. A moving-side cover provided on the moving unit covers part of a position of the driving apparatus in the moving direction. A supporting-side cover is provided in a position on a side of the first moving range of an end of the moving-side cover on a side of the second moving range in the moving direction to continuously cover the part of the position of the driving apparatus in the moving direction in cooperation with the moving-side cover in the first use state. The supporting-side cover forms a clearance in the moving direction with respect to the moving-side cover in the second use state. A slide cover is mounted on one of supporting-side cover and the moving-side cover slidably in the moving direction to close the clearance when slidably drawn out in the moving direction.
    Type: Grant
    Filed: October 5, 2020
    Date of Patent: January 10, 2023
    Assignee: STAR MICRONICS CO., LTD.
    Inventor: Masatoshi Deno
  • Publication number: 20230003764
    Abstract: The present disclosure is an inspection apparatus that makes an inspection of electrical characteristics of an object to be inspected. using a contactor brought into electrical contact with an electrode of the object to be inspected, the inspection apparatus including: a position adjusting unit including the contactor, a position adjusting section that adjusts a tip position of the contactor, and a load. detecting section that detects a value of contact load between the contactor and the electrode; a position deriving section that derives an initial position of the contactor in a specific direction based on a relationship between an amount of contact displacement of the contactor in the specific direction and the value of contact load between the contactor and the electrode; and a movement performing section that moves the tip position of the contactor based on the initial position in the specific direction derived by the position deriving section.
    Type: Application
    Filed: May 25, 2022
    Publication date: January 5, 2023
    Applicant: KABUSHIKI KAISHA NIHON MICRONICS
    Inventors: SATOSHI NARITA, JUN SHIRATO
  • Patent number: 11547016
    Abstract: A technology downsizing a control panel unit is provided. The control panel unit for a machine tool comprises a casing, a duct, and a fan. The casing has an openable door. A control device is arranged in an internal space, which is closed when the door is closed. The duct has a groove and a ventilation opening. The groove is closed at a closed end and open to the internal space at an open end. The ventilation opening connects the groove with the internal space in a position nearer the closed end than the open end. The duct is fixed to an inner wall of the casing in such manner as the groove faces the inner wall. The fan is mounted on the ventilation opening. The air in the internal space is taken into the groove enclosed by the inner wall and the duct by the operation of the fan.
    Type: Grant
    Filed: November 19, 2019
    Date of Patent: January 3, 2023
    Assignee: STAR MICRONICS CO., LTD.
    Inventors: Kazushige Tajima, Katsuhiro Shinomiya
  • Publication number: 20220390489
    Abstract: It is possible to make the free length of a contactor uniform even when the contactor is joined to a position that deviates from a joint position in a high-frequency conducting path and make contact with an electrode with stability, which improves measurement quality. A probe unit according to the present disclosure includes: a coaxial connector that is attached to a main body and gives and receives an electrical signal to and from a tester via a coaxial cable; a high-frequency conducting path that is connected to the coaxial connector and transmits an electrical signal; a plurality of contactors, each having a tip portion that makes electrical contact with an electrode of an object to be inspected and giving and receiving an electrical signal to and from the high-frequency conducting path; and a pedestal that is interposed between the contactor and the high-frequency conducting path, and the pedestal is provided in each contactor such that a free length of the contactor is a predetermined length.
    Type: Application
    Filed: April 27, 2022
    Publication date: December 8, 2022
    Applicant: KABUSHIKI KAISHA NIHON MICRONICS
    Inventors: SATOSHI NARITA, SHOU HARAKO, JUKIYA FUKUSHI
  • Patent number: 11502472
    Abstract: To provide a method of manufacturing an electrical contactor including a volute spring structure extending in upward and downward directions formed integrally using a single material, having mechanical simplicity and excellent functionality, and functioning as an electric circuit achieving connection without loss.
    Type: Grant
    Filed: April 13, 2021
    Date of Patent: November 15, 2022
    Assignee: KABUSHIKI KAISHA NIHON MICRONICS
    Inventor: Tomoaki Kuga
  • Patent number: 11491555
    Abstract: Provided is a lathe capable of elongating the life of a shifter mechanism. A lathe comprises a spindle, a chucking unit, a power transmitting unit, a shifter, a claw, and a driving unit. The shape of an outer circumference of the shifter in a contact range and a first end of the claw in longitudinal section along the spindle axis is such shape as the acceleration “a” of the first end in the diameter direction with respect to the moving distance of the shifter moving in the direction of the spindle axis (Z-axis direction) at a constant speed is continuous both in a positive range and in a negative range where the contact range is a range of the outer circumference of the shifter in contact with the first end of the claw.
    Type: Grant
    Filed: May 29, 2020
    Date of Patent: November 8, 2022
    Assignee: STAR MICRONICS CO., LTD.
    Inventor: Norio Kaku
  • Patent number: 11482805
    Abstract: Provided is an electrical contactor that is formed from a small number of components that can improve the conductivity in the electrical contactor, while improving the slidability of an elastic member and the electrical contact stability with a contact target.
    Type: Grant
    Filed: September 22, 2020
    Date of Patent: October 25, 2022
    Assignee: KABUSHIKI KAISHA NIHON MICRONICS
    Inventor: Tomoaki Kuga
  • Patent number: 11435392
    Abstract: An inspection method includes a step S20 of electrically connecting electrical signal terminals of a semiconductor device to electric connectors, and optically connecting optical signal terminals of the semiconductor device to optical connectors, a step S30 of measuring a test light output signal output from a monitoring element provided in an inspection object in response to a test input signal having been input to the monitoring element while adjusting conditions of a position and an inclination of the inspection object, and extracting conditions in which an optical intensity of the test light output signal is a predetermined determination value or greater as inspection conditions, and a step S40 of inspecting the semiconductor device under the inspection conditions.
    Type: Grant
    Filed: August 27, 2019
    Date of Patent: September 6, 2022
    Assignee: Kabushiki Kaisha Nihon Micronics
    Inventors: Osamu Arai, Hiroshi Kamiya