Patents Assigned to Micronics
  • Patent number: 11548072
    Abstract: Provided is a machine tool capable of facilitating switching moving ranges of the moving unit. A moving-side cover provided on the moving unit covers part of a position of the driving apparatus in the moving direction. A supporting-side cover is provided in a position on a side of the first moving range of an end of the moving-side cover on a side of the second moving range in the moving direction to continuously cover the part of the position of the driving apparatus in the moving direction in cooperation with the moving-side cover in the first use state. The supporting-side cover forms a clearance in the moving direction with respect to the moving-side cover in the second use state. A slide cover is mounted on one of supporting-side cover and the moving-side cover slidably in the moving direction to close the clearance when slidably drawn out in the moving direction.
    Type: Grant
    Filed: October 5, 2020
    Date of Patent: January 10, 2023
    Assignee: STAR MICRONICS CO., LTD.
    Inventor: Masatoshi Deno
  • Publication number: 20230003764
    Abstract: The present disclosure is an inspection apparatus that makes an inspection of electrical characteristics of an object to be inspected. using a contactor brought into electrical contact with an electrode of the object to be inspected, the inspection apparatus including: a position adjusting unit including the contactor, a position adjusting section that adjusts a tip position of the contactor, and a load. detecting section that detects a value of contact load between the contactor and the electrode; a position deriving section that derives an initial position of the contactor in a specific direction based on a relationship between an amount of contact displacement of the contactor in the specific direction and the value of contact load between the contactor and the electrode; and a movement performing section that moves the tip position of the contactor based on the initial position in the specific direction derived by the position deriving section.
    Type: Application
    Filed: May 25, 2022
    Publication date: January 5, 2023
    Applicant: KABUSHIKI KAISHA NIHON MICRONICS
    Inventors: SATOSHI NARITA, JUN SHIRATO
  • Patent number: 11547016
    Abstract: A technology downsizing a control panel unit is provided. The control panel unit for a machine tool comprises a casing, a duct, and a fan. The casing has an openable door. A control device is arranged in an internal space, which is closed when the door is closed. The duct has a groove and a ventilation opening. The groove is closed at a closed end and open to the internal space at an open end. The ventilation opening connects the groove with the internal space in a position nearer the closed end than the open end. The duct is fixed to an inner wall of the casing in such manner as the groove faces the inner wall. The fan is mounted on the ventilation opening. The air in the internal space is taken into the groove enclosed by the inner wall and the duct by the operation of the fan.
    Type: Grant
    Filed: November 19, 2019
    Date of Patent: January 3, 2023
    Assignee: STAR MICRONICS CO., LTD.
    Inventors: Kazushige Tajima, Katsuhiro Shinomiya
  • Publication number: 20220390489
    Abstract: It is possible to make the free length of a contactor uniform even when the contactor is joined to a position that deviates from a joint position in a high-frequency conducting path and make contact with an electrode with stability, which improves measurement quality. A probe unit according to the present disclosure includes: a coaxial connector that is attached to a main body and gives and receives an electrical signal to and from a tester via a coaxial cable; a high-frequency conducting path that is connected to the coaxial connector and transmits an electrical signal; a plurality of contactors, each having a tip portion that makes electrical contact with an electrode of an object to be inspected and giving and receiving an electrical signal to and from the high-frequency conducting path; and a pedestal that is interposed between the contactor and the high-frequency conducting path, and the pedestal is provided in each contactor such that a free length of the contactor is a predetermined length.
    Type: Application
    Filed: April 27, 2022
    Publication date: December 8, 2022
    Applicant: KABUSHIKI KAISHA NIHON MICRONICS
    Inventors: SATOSHI NARITA, SHOU HARAKO, JUKIYA FUKUSHI
  • Patent number: 11502472
    Abstract: To provide a method of manufacturing an electrical contactor including a volute spring structure extending in upward and downward directions formed integrally using a single material, having mechanical simplicity and excellent functionality, and functioning as an electric circuit achieving connection without loss.
    Type: Grant
    Filed: April 13, 2021
    Date of Patent: November 15, 2022
    Assignee: KABUSHIKI KAISHA NIHON MICRONICS
    Inventor: Tomoaki Kuga
  • Patent number: 11491555
    Abstract: Provided is a lathe capable of elongating the life of a shifter mechanism. A lathe comprises a spindle, a chucking unit, a power transmitting unit, a shifter, a claw, and a driving unit. The shape of an outer circumference of the shifter in a contact range and a first end of the claw in longitudinal section along the spindle axis is such shape as the acceleration “a” of the first end in the diameter direction with respect to the moving distance of the shifter moving in the direction of the spindle axis (Z-axis direction) at a constant speed is continuous both in a positive range and in a negative range where the contact range is a range of the outer circumference of the shifter in contact with the first end of the claw.
    Type: Grant
    Filed: May 29, 2020
    Date of Patent: November 8, 2022
    Assignee: STAR MICRONICS CO., LTD.
    Inventor: Norio Kaku
  • Patent number: 11482805
    Abstract: Provided is an electrical contactor that is formed from a small number of components that can improve the conductivity in the electrical contactor, while improving the slidability of an elastic member and the electrical contact stability with a contact target.
    Type: Grant
    Filed: September 22, 2020
    Date of Patent: October 25, 2022
    Assignee: KABUSHIKI KAISHA NIHON MICRONICS
    Inventor: Tomoaki Kuga
  • Patent number: 11435392
    Abstract: An inspection method includes a step S20 of electrically connecting electrical signal terminals of a semiconductor device to electric connectors, and optically connecting optical signal terminals of the semiconductor device to optical connectors, a step S30 of measuring a test light output signal output from a monitoring element provided in an inspection object in response to a test input signal having been input to the monitoring element while adjusting conditions of a position and an inclination of the inspection object, and extracting conditions in which an optical intensity of the test light output signal is a predetermined determination value or greater as inspection conditions, and a step S40 of inspecting the semiconductor device under the inspection conditions.
    Type: Grant
    Filed: August 27, 2019
    Date of Patent: September 6, 2022
    Assignee: Kabushiki Kaisha Nihon Micronics
    Inventors: Osamu Arai, Hiroshi Kamiya
  • Patent number: 11428727
    Abstract: An object of the present invention is to provide a prober that is able to carry out accurate inspection of semiconductor device in wafer state by reducing the effect of the external noises and the leakage of current and further by eliminating the stray capacitance of the chuck stage against the prober housing.
    Type: Grant
    Filed: March 25, 2019
    Date of Patent: August 30, 2022
    Assignee: KABUSHIKI KAISHA NIHON MICRONICS
    Inventors: Katsuo Yasuta, Mamoru Aruga
  • Publication number: 20220260792
    Abstract: [Problem] To allow to condense and guide the light emitted by a light emitting element having a large light emission surface to an optical connector, in inspection of a semiconductor integrated circuit. [Solution] The present disclosure provides a connecting apparatus used at the time of inspection of a semiconductor integrated circuit, and the connecting apparatus includes an electric connector electrically connecting to an electrode terminal of the semiconductor integrated circuit, an optical connector optically connecting to an optical terminal of the semiconductor integrated circuit, a connector support substrate configured to support the electric connector and the optical connector so that an end part of the electric connector and an end part of the optical connector respectively connect to the semiconductor integrated circuit, and a light condensing substrate configured to condense light emitted by an optical terminal of the semiconductor integrated circuit to the optical connector.
    Type: Application
    Filed: January 25, 2022
    Publication date: August 18, 2022
    Applicant: KABUSHIKI KAISHA NIHON MICRONICS
    Inventors: HIROSHI KAMIYA, YUKI KOMAI, HISAO NARITA
  • Patent number: 11378591
    Abstract: An electrical connection device includes: a wiring board in which lands are arranged on a main surface; and probes. Each of the probes has a distal end portion that contacts an object to be measured and a proximal end portion that contacts the land. A material of a surface film of the proximal end portion, which contacts the land, is a metal material different in composition from a material of the land that contacts the surface film.
    Type: Grant
    Filed: November 5, 2020
    Date of Patent: July 5, 2022
    Assignee: Kabushiki Kaisha Nihon Micronics
    Inventors: Kenichi Tsuruta, Takayuki Hayashizaki, Koichiro Tokumaru, Miyuki Tomooka
  • Patent number: 11376667
    Abstract: A machine tool improving measurement accuracy of a machined workpiece diameter. A machine tool comprises a displacement sensor mounted on at least one of a guide bush and a spindle supporting unit. The machine tool further comprises a calculating unit which calculates a diameter of the machined workpiece based on a measurement value of the machined workpiece by the displacement sensor. The spindle is movable back and forth in an axial direction. The spindle is retracted after machining to bring a machined portion of the workpiece to a predetermined measurement position in the axial direction to allow the displacement sensor to measure the machined portion.
    Type: Grant
    Filed: December 21, 2018
    Date of Patent: July 5, 2022
    Assignee: Star Micronics Co., Ltd.
    Inventor: Norio Kaku
  • Publication number: 20220206724
    Abstract: The printer (10) of the present disclosure is a printer connectable to a network (30) and an information processing terminal (20), including a control section (15) configured to: when obtaining data in accordance with the network class from the information processing terminal (20), extract a first frame based on a first communication standard used for communications between the printer (10) and the network (30), from the data; when determining that destination information included in the first frame specifies the printer (10), extract and interpret print information included in the first frame; and when determining that the destination information included in the first frame does not specify the printer (10), forward the first frame to the network (30).
    Type: Application
    Filed: March 15, 2022
    Publication date: June 30, 2022
    Applicants: STAR MICRONICS CO., LTD., KCodes Corporation
    Inventors: Daisuke TOKITA, Tangen CHIU
  • Patent number: 11372022
    Abstract: An electrical contactor includes: an installing portion; a base end portion extending continuously toward the installing portion; a plurality of arm portions extending from the base end portion in a longitudinal direction; a coupling portion coupled to the tip of each of the arm portions; a pedestal portion provided continuously toward the coupling portion; and a contact portion provided at a lower end of the pedestal portion, wherein each of the plurality of arm portions elastically supports the contact portion in contact with a first contact target, and a curved portion is provided on the coupling portion side or the base end portion side of a closest-to-contact-portion arm portion that is the closest to the contact portion among the plurality of arm portions.
    Type: Grant
    Filed: July 28, 2020
    Date of Patent: June 28, 2022
    Assignee: KABUSHIKI KAISHA NIHON MICRONICS
    Inventors: Yasutaka Kishi, Masahiro Wakazawa
  • Patent number: 11358225
    Abstract: Provided is a lathe capable of facilitating replacement of a ball screw. A machine tool comprises a base, a moving unit, a ball screw, a cap, and a supporting unit provided on the base to support the cap. The cap has a body and a flange expanded larger than the body on the outer side thereof with respect to the axis direction. The supporting unit comprises a recess part which receives the body. The recess part is provided with an opening allowing the threaded shaft to pass in a direction perpendicular to the axis direction in the state that the supporting unit is provided on the base. The supporting unit further comprises a positioning part on which an inner surface of the flange abuts in the axis direction in the state that the body is received in the recess part.
    Type: Grant
    Filed: September 25, 2020
    Date of Patent: June 14, 2022
    Assignee: STAR MICRONICS CO., LTD.
    Inventors: Masatoshi Deno, Shin Ito
  • Patent number: 11340289
    Abstract: An electrical contactor capable of coping with an electrical test under a high temperature environment and realizing reliable positioning is provided.
    Type: Grant
    Filed: February 7, 2020
    Date of Patent: May 24, 2022
    Assignee: KABUSHIKI KAISHA NIHON MICRONICS
    Inventor: Eichi Osato
  • Publication number: 20220155347
    Abstract: [Problem] In order to improve conductivity, the number of components is decreased, and a sliding property of an elastic member can be improved. Elastic force can be controlled in accordance with a characteristic of a contact object, and electrical contact stability with the contact object can be improved. [Solution] An electrical contactor of the present disclosure is formed by winding a plate member having conductivity. The electrical contactor includes a first contact part that is formed by winding a first tip part of the plate member, a first elastic part that is formed by winding an upper arm part having a tapered shape, a second contact part that is formed by winding a second tip part, a second elastic part that is formed by winding a lower arm part having a tapered shape, and a cylindrical part that is formed by winding a main body part that is a plate member.
    Type: Application
    Filed: September 6, 2019
    Publication date: May 19, 2022
    Applicant: KABUSHI KAISHA NIHON MICRONICS
    Inventor: TOMOAKI KUGA
  • Publication number: 20220099702
    Abstract: An object is to enhance the durability of substrates of a probe substrate and/or the probe substrate and a member to be joined.
    Type: Application
    Filed: October 18, 2019
    Publication date: March 31, 2022
    Applicants: KABUSHIKI KAISHA NIHON MICRONICS, TANAKA KIKINZOKU KOGYO K.K.
    Inventors: TOSHINORI OMORI, KAZUYA GOTO, YASUAKI OSANAI, TAKASHI AKINIWA, TAKEKI SUGISAWA, TAKESHI KONDO, SHINTARO ABE, MAKI WATANABE
  • Patent number: 11284517
    Abstract: The technology disclosed relates to accommodating embedded substrates during direct writing onto a printed circuit board and to other patterning problems that benefit from an extended depth of focus. In particular, it relates to multi-focus direct writing of a workpiece by the continuous or step-wise movement of the workpiece during the sequence of exposures having different focus planes. In one implementation, a multi-arm rotating direct writer is configured for interleaved writing focused on two or more focal planes that generally correspond to two or more surface heights of a radiation sensitive layer that overlays the uneven workpiece. Alternating arms can produce interleaved writing to the two or more focal planes.
    Type: Grant
    Filed: December 3, 2018
    Date of Patent: March 22, 2022
    Assignee: MICRONIC MYDATA AB
    Inventors: Per Askebjer, Mats Rosling
  • Publication number: 20220074971
    Abstract: An electrical connecting device includes an insulating probe (10) including a bottom-side plunger (11), a top-side plunger (12), and a barrel (13), and a probe head (30) including a combined guide plate (30A) having a conductive region (301) made of a conductive material and an insulating region (302) made of an insulating material arranged adjacent to each other in a planar view. The bottom-side plunger (11) and the top-side plunger (12) are electrically connected to each other inside the barrel (13), and the bottom-side plunger (11) and the top-side plunger (12) are electrically insulated from the barrel (13). The probe head (30) holds the insulating probe (10) in a state in which the barrel (13) penetrates through the conductive region (301). The barrel (13) of the insulating probe (10) is connected to a ground potential via the conductive region (301) when an inspection object (4) is measured.
    Type: Application
    Filed: December 20, 2019
    Publication date: March 10, 2022
    Applicant: Kabushiki Kaisha Nihon Micronics
    Inventor: Akihiro SHUTO