Patents Assigned to Mitutoyo Corporation
  • Patent number: 11187521
    Abstract: A calibration configuration for a chromatic range sensor (CRS) optical probe of a coordinate measurement machine (CMM) includes a calibration object. The calibration object includes at least a first nominally cylindrical calibration surface having a central axis that extends along a Z direction that is intended to be aligned approximately parallel to a rotation axis of the CRS optical probe. The first nominally cylindrical calibration surface is arranged at a known first radius R1 from the central axis that extends along the Z direction. A first set of angular reference features is formed on or in the first nominally cylindrical calibration surface. The angular reference features are configured to be sensed by the radial distance sensing beam and are located at known angles or known angular spacings around the central axis from one another on or in the first nominally cylindrical calibration surface.
    Type: Grant
    Filed: April 28, 2020
    Date of Patent: November 30, 2021
    Assignee: MITUTOYO CORPORATION
    Inventor: Joseph Daniel Tobiason
  • Patent number: 11189086
    Abstract: Provided are an offline teaching device and a measurement control device. The offline teaching device detects a shape of a measured object by a three-dimensional sensor unit, generates measurement procedure information in which measurement items are respectively associated with measurement points sequentially specified to the detected shape, and causes a measurement procedure information storage unit to store the measurement procedure information associated.
    Type: Grant
    Filed: June 12, 2019
    Date of Patent: November 30, 2021
    Assignee: MITUTOYO CORPORATION
    Inventors: Shinsaku Abe, Hideyuki Kusanagi
  • Patent number: 11181395
    Abstract: An electronic position encoder includes a scale and detector. The detector includes a field generating coil (FGC) having elongated portions (EPs) bounding a generated field area (GFA) aligned with sensing windings, to provide position signals responsive to the scale interacting with the generated field. Sensing elements and EPs are fabricated in “front” layers of the detector. A transverse conductor portion (TCP) fabricated in a “rear” layer connects the EP of the FGC via feedthroughs. A shield region in a layer between the front and rear layers intercepts at least a majority of a projection of the TCP toward the front layers to eliminate undesirable signal effects. The FGC feedthroughs generate GFC feedthrough stray fields. Feedthrough pairs that connect sensing winding signals to rear layers of the detector are specially configured to mitigate undesirable signal effects that may otherwise result from their coupling to the GFC feedthrough stray fields.
    Type: Grant
    Filed: July 23, 2020
    Date of Patent: November 23, 2021
    Assignee: Mitutoyo Corporation
    Inventor: Ted Staton Cook
  • Publication number: 20210356591
    Abstract: A measurement apparatus includes a laser apparatus, a branching part that splits a laser beam into reference light and measurement light, a condensing part that condenses the measurement light onto an object to be measured, a control part that adjust a focal position where the condensing part condenses the measurement light, and a distance calculation part that calculates distance to the object to be measured on the basis of an optical path difference between the reference light and the measurement light, wherein the condensing part includes a first lens and a correspondence calculation part that calculates a correspondence between a focal position of the condensing part and a position of the first lens on the basis of a position of the first lens and a distance to the object to be measured.
    Type: Application
    Filed: May 17, 2021
    Publication date: November 18, 2021
    Applicant: Mitutoyo Corporation
    Inventors: Ryusuke KATO, Tomotaka TAKAHASHI
  • Patent number: 11175131
    Abstract: A set of respective self-configuring probe interface circuit boards (SC-MPIC's) are disclosed for use with a measurement system comprising host electronics and respective interchangeable measurement probes. Member SC-MPICs each comprises: a local circuit (LS) for probe identification, signal processing and inter-board signal control; and higher-direction and lower-direction connectors “pointing” toward and away from the measurement probe, respectively. Member SC-MPICs establish a processing hierarchy by generating lower board present signals on their higher-direction connector, higher board present signals on their lower-direction connector, and determining whether they are the highest and/or lowest SC-MPIC based on receiving those signals from adjacent SC-MPICs. They can independently perform probe identification matching operations using probe identification data from compatible and incompatible probes, and the highest SC-MPIC does this first.
    Type: Grant
    Filed: June 26, 2018
    Date of Patent: November 16, 2021
    Assignee: Mitutoyo Corporation
    Inventor: Scott Ellis Hemmings
  • Patent number: 11175123
    Abstract: A control method of surface characteristic measuring apparatus relatively displaces by a relative displacement mechanism, detects when the distal end of the stylus contacting the measurable surface, calculates an amount of relative displacement in the Z-axis direction between the measuring device and the measured object required for a measuring arm to be leveled after the distal end of the stylus contacts the measurable surface, calculates a displacement amount generated in the distal end of the stylus in an X-axis direction when the measuring device and the measured object are relatively displaced only by in the Z-axis direction; and levels the measuring arm by relatively displacing only by the measuring device and the measured object in the Z-axis direction by the relative displacement mechanism, and relatively displaces only by the measuring device and the measured object in the X-axis direction by the relative displacement mechanism at the same time.
    Type: Grant
    Filed: June 12, 2019
    Date of Patent: November 16, 2021
    Assignee: MITUTOYO CORPORATION
    Inventors: Takayuki Ishioka, Minoru Katayama
  • Patent number: 11170572
    Abstract: An isosurface mesh M is generated by extracting voxels having a certain CT value from volume data obtained by X-ray CT. A gradient vector g of a CT value is calculated at each vertex p of the isosurface mesh M. A plurality of sample points S are generated in positive and negative directions of the calculated gradient vector g. Gradient norms N of CT values at the respective generated sample points S are calculated. The vertex p of the isosurface mesh is moved and corrected to a sample point Sm having the maximum norm Nm calculated.
    Type: Grant
    Filed: November 7, 2019
    Date of Patent: November 9, 2021
    Assignees: THE UNIVERSITY OF TOKYO, MITUTOYO CORPORATION
    Inventors: Yutaka Ohtake, Yukie Nagai, Tomonori Goto, Seiji Sasaki, Masato Kon
  • Patent number: 11169008
    Abstract: An electronic position encoder includes a scale and detector. The detector includes a field generating coil (FGC) having elongated portion configurations (EPCs) bounding a generated field area (GFA) aligned with sensing elements in a sensing area, to provide position signals responsive to the scale interacting with the generated field. Sensing elements and EPCs are fabricated in “front” layers of the detector portion. The EPCs include end gradient arrangements (EGAs) configured to reduce field strength in the generated field area as a function of position along the x-axis direction for positions approaching the end of the GFA. A shielded transverse conductor portion (TCP) fabricated in a “rear” layer connects the EPCs and/or EGAs of the FGC via feedthroughs. A conductive shield region (CSR) configuration in a CSR layer between the front and rear layers intercepts at least a majority of a projection of the TCP toward the front layers.
    Type: Grant
    Filed: April 30, 2020
    Date of Patent: November 9, 2021
    Assignee: Mitutoyo Corporation
    Inventor: Ted Staton Cook
  • Publication number: 20210333079
    Abstract: ID numbers of connected multiple modules are easily automatically set. Each of the multiple modules includes an ID number information holding unit that holds its own ID number information, a first command generation unit that generates a first command for notifying its rear stage of its own ID number information, a first command output unit that outputs the first command from a rear-stage output port, a second command generation unit that generates a second command for notifying its front stage of its own ID number information and ID number information on its rear-stage modules, a second command output unit that outputs the second command from a front-stage output port, and an ID number information update unit that sets, when the first command is received from a front-stage module, new ID number obtained by adding “1” to the ID number of the front-stage module contained in the received first command as its own ID number information in the ID number information holding unit.
    Type: Application
    Filed: April 21, 2021
    Publication date: October 28, 2021
    Applicant: MITUTOYO CORPORATION
    Inventor: Takuma MIZUNAGA
  • Patent number: 11156537
    Abstract: A controller of a hardness tester can determine, in a condition where a driver is not in operation and when a spring displacement detector and an arm displacement detector detect an amount of displacement of respective objects (plate spring and loading arm), that a loading arm and a plate spring are deformed according to changes in environmental temperature. A favorable hardness test can be performed by the hardness tester corresponding to the environmental temperature according to the determination by carrying out an initialization process that resets the displacement amount of respective object to zero, the displacement amount detected by the spring displacement detector and the arm displacement detector respectively.
    Type: Grant
    Filed: September 30, 2019
    Date of Patent: October 26, 2021
    Assignee: MITUTOYO CORPORATION
    Inventors: Masaru Kawazoe, Naoki Izumi
  • Patent number: 11150200
    Abstract: A workpiece inspection and defect detection system includes a light source, a lens that inputs image light arising from a surface of a workpiece, and a camera that receives imaging light transmitted along an imaging optical path. The system utilizes images of workpieces acquired with the camera as training images to train a defect detection portion to detect defect images that include workpieces with defects, and determines a performance of the defect detection portion as trained with the training images. Based on the performance of the defect detection portion, an indication is provided as to whether additional defect images should be provided for training. After training is complete, the camera is utilized to acquire new images of workpieces which are analyzed to determine defect images that include workpieces with defects, and for which additional operations may be performed (e.g., metrology operations for measuring dimensions of the defects, etc.
    Type: Grant
    Filed: June 15, 2020
    Date of Patent: October 19, 2021
    Assignee: Mitutoyo Corporation
    Inventors: William Todd Watson, Shannon Roy Campbell, Robert Kamil Bryll
  • Patent number: 11150072
    Abstract: There is provided a displacement measuring device that minimize unnecessary power consumption and improves power efficiency. A displacement measuring device includes a main scale and a detection head that is provided in such a manner as to be relatively displaceable to the main scale and outputs a periodic signal having a phase to be changed according to relative displacement to the main scale. The detection head outputs, as the periodic signal, a coarse scale signal having a coarse period and a fine scale signal having a fine period. A coarse phase detector calculates, from two pieces of phase information acquired from the coarse scale signal, the average phase of the coarse scale signal. A fine phase detector calculates, from four pieces of phase information acquired from the fine scale signal, the average phase of the fine scale signal.
    Type: Grant
    Filed: October 5, 2020
    Date of Patent: October 19, 2021
    Assignee: MITUTOYO CORPORATION
    Inventors: Masaki Matsushita, Satoshi Adachi
  • Patent number: 11150435
    Abstract: The present invention includes a plurality of lenses that are disposed such that optical axes are aligned in an axial direction, a first lens frame that holds a first lens of the plurality of lenses, and a second lens frame that holds a second lens of the plurality of lenses. The first lens frame comes into contact with the second lens frame and is disposed on one side of the second lens frame in the axial direction. The second lens frame includes a penetration hole penetrating the second lens frame from the other side in the axial direction to the one side in the axial direction. Air is suctioned and discharged via the penetration hole such that the first lens frame and the second lens frame are temporarily fixed through vacuum adsorption.
    Type: Grant
    Filed: October 7, 2019
    Date of Patent: October 19, 2021
    Assignee: MITUTOYO CORPORATION
    Inventor: Kazuki Kitagawa
  • Publication number: 20210318114
    Abstract: An optical displacement sensor includes: a splitting unit that splits the light radiated from the light source into a first light ray and a second light ray; a reflection unit including a first reflection part and a second reflection part provided at a predetermined angle with respect to the first reflection part; and a fold-back reflection unit that folds-back and reflects the light that has gone through the reflection unit to the reflection unit. The optical displacement sensor is characterized in that the reflection unit reflects the first light ray and the second light ray that are split by the splitting unit and have gone through the diffraction unit from the first reflection part to the second reflection part, and reflects the first light ray and the second light ray that are reflected by the fold-back reflection unit from the second reflection part to the first reflection part.
    Type: Application
    Filed: April 7, 2021
    Publication date: October 14, 2021
    Applicant: MITUTOYO CORPORATION
    Inventor: Akihide KIMURA
  • Patent number: 11137269
    Abstract: A reference voltage generator circuit generates a reference voltage corresponding to a power supply voltage. A current/voltage converter circuit converts a photocurrent output by a photoreceiver into voltage, and outputs a voltage obtained by adding the converted voltage and the reference voltage. A sample and hold circuit holds a voltage of a capacitor in response to a sample and hold signal, the capacitor having the voltage input at one end and the reference voltage input at another end. An amplifier circuit outputs an output signal where a voltage held by the sample and hold circuit is amplified with the reference voltage as a reference.
    Type: Grant
    Filed: November 6, 2017
    Date of Patent: October 5, 2021
    Assignee: MITUTOYO CORPORATION
    Inventors: Osamu Kawatoko, Tomohiro Tahara, Hirokazu Kobayashi
  • Patent number: 11132549
    Abstract: The measurement result display apparatus of the present invention includes: a storage unit for storing shape information and a predetermined measurement result with respect to an object to be measured; a three-dimensional sensor for detecting shape information of an object existing in a three-dimensional space; a display unit configured so that the object detected by the three-dimensional sensor can be visually recognized and configured to be capable of displaying predetermined information; and a display control unit for displaying the predetermined measurement result of a target object on the display unit so as to be visually recognized together with the object, using the object to be measured whose shape information is detected by the three-dimensional sensor as the target object.
    Type: Grant
    Filed: March 10, 2020
    Date of Patent: September 28, 2021
    Assignee: MITUTOYO CORPORATION
    Inventors: Shinsaku Abe, Hideyuki Kusanagi
  • Patent number: 11131535
    Abstract: There is provided a rotary stand capable of reducing the load on a feeder and deformation of a placement plane. A rotary stand includes a feeder that adjusts an inclination of a placement plane. The feeder includes a first contact portion that interlocks with a feeding mechanism to move and a second contact portion pressurized by a spring. The first contact portion and the second contact portion disposed to face each other in the movement direction to sandwich a held part interlocking with the placement plane.
    Type: Grant
    Filed: March 13, 2020
    Date of Patent: September 28, 2021
    Assignee: MITUTOYO CORPORATION
    Inventor: Junsuke Yasuno
  • Publication number: 20210293523
    Abstract: A laser interference device includes a measurement laser that outputs a laser beam, a beam splitter that divides the laser beam into a measurement laser beam and a frequency monitor laser beam, a reference laser that outputs a reference laser beam, a frequency detector that detects a beat frequency resulting from interference between the reference laser beam and the frequency monitor laser beam, a wavelength calculator that calculates a wavelength of the frequency monitor laser beam (a wavelength measurement value) on the basis of the beat frequency, a light detector that detects an interference light of the measurement light and the reference light of the measurement laser beam and outputs a light detection signal, and a displacement calculator that calculates a displacement of the measurement mirror by performing an arithmetic process based on the wavelength measurement value and the light detection signal.
    Type: Application
    Filed: March 10, 2021
    Publication date: September 23, 2021
    Applicant: MITUTOYO CORPORATION
    Inventor: Yuichiro YOKOYAMA
  • Patent number: 11125967
    Abstract: A system and method are provided for utilizing a focus state calibration object for determining calibration data for a variable focal length (VFL) lens system which includes a VFL lens (e.g., a tunable acoustic gradient lens). The calibration object includes a planar tilted pattern surface on which a set of focus state reference regions (FSRRs) are distributed (e.g., a tilted grating). The FSRRs have known geometric relationships relative to the planar tilted pattern surface and have known region relationships relative to one another. A plurality of camera images is acquired at different phase timings of the periodic modulation, and calibration data is determined based at least in part on analyzing the plurality of camera images. The determined calibration data indicates respective phase timings of the periodic modulation that correspond to respective effective focus positions of the VFL lens system.
    Type: Grant
    Filed: December 26, 2018
    Date of Patent: September 21, 2021
    Assignee: Mitutoyo Corporation
    Inventors: Paul Gerard Gladnick, Dawn Keehnel, Vahan Senekerimyan
  • Patent number: 11119382
    Abstract: A variable focal length lens system includes a tunable acoustic gradient (TAG) lens; a TAG lens controller; a light source; a camera; and processor(s) configured to: (a) drive a periodic modulation of the TAG lens optical power, using a first amplitude driving signal that provides a first amplitude of the periodic modulation at a resonant frequency of the TAG lens, the first amplitude corresponding to a first focal Z range extending between peak focus distances Z1max+ and Z1max?, wherein the first amplitude driving signal is selected based on a first target focus distance Ztarget?1 and calibration data which relates different amplitude driving signals to different target focus distances Ztarget?i; and (b) operate the light source and camera to expose an image using at least one exposure increment wherein the focus distance during the exposure increment moves over a first exposure Z range that includes target focus distance Ztarget?1.
    Type: Grant
    Filed: December 20, 2019
    Date of Patent: September 14, 2021
    Assignee: Mitutoyo Corporation
    Inventor: Paul Gerard Gladnick