Abstract: There are provided an apparatus and method for performing impedance control (ZQ) calibration without a ZQ pin and an external resistor. The apparatus includes an output driver circuit connected to a signal pin interfacing with an external device; a register control word (RCW) configured to store an output driver impedance parameter related to a pull-up output voltage (VOH) condition of the signal pin; and a ZQ calibration circuit connected to the signal pin and configured to perform calibration using a VOH target level of the signal pin and control a termination resistance of the signal pin.

Abstract: Provided are a method for enhancing a video resolution enhancement, a computer readable storage medium, and an electronic device. The method includes: obtaining multiple image frames as input data, and obtaining initial data by performing feature extraction on the input data using a first three-dimensional convolutional layer; obtaining first feature data by performing down-sampling on the initial data at a preset multiple; obtaining first reference data by performing a convolution operation on the first feature data using a second three-dimensional convolutional layer to merge the first feature data as one frame; and obtaining first output data by performing up-sampling on the first reference data at the preset multiple.

Abstract: A method of reading data from a self-selecting memory includes generating a read pulse that has a polarity opposite to that of a write pulse. The write pulse writes data into a target memory cell in the self-selecting memory. The read pulse is applied to the target memory cell. The read pulse has a first edge that is a starting point of the read pulse and a second edge that is an ending point of the read pulse. A slope of the second edge of the read pulse is adjusted such that an undershoot or overshoot on the second edge of the read pulse increases.

Abstract: An image processing apparatus performs external recognition for driving assistance or automated driving of a vehicle based on a captured image obtained from a photographing apparatus capturing an image requiring distortion correction. The image processing apparatus: moves and sets a partial region to be a target of distortion correction processing according to a rule, and applies the distortion correction processing to the set partial region of the captured image to acquire a partial image corrected in distortion; detects a road mirror around the vehicle; and changes the rule so that a partial region corresponding to a predetermined direction of the vehicle is preferentially set as a target of the distortion correction processing when a road mirror is detected.

Abstract: A substrate processing apparatus using plasma capable of efficiently controlling the selectivity ratio of a silicon layer and an oxide layer is provided. The substrate processing apparatus comprises a first space disposed between an electrode and an ion blocker; a second space disposed between the ion blocker and a shower head; a processing space under the shower head for processing a substrate; a first supply hole for providing a first gas for generating plasma to the first space; a second supply hole for providing a second gas to be mixed with an effluent of the plasma to the second space; and a first coating layer formed on a first surface of the shower head facing the second space, not formed on a second surface of the shower head facing the processing space, and containing nickel.

Abstract: A method for classifying an image of a displaying base plate includes: acquiring an image to be checked; from a first predetermined-type set, determining a type of the image to be checked. The first predetermined-type set includes: a first image type, a second image type and a third image type. An image of the first image type is a no-defect image, an image of the second image type is a blurred image, and an image of the third image type is a defect image. When the type of the image to be checked is the third image type, by using a first convolutional neural network, determining a defect data of the image to be checked, wherein the defect image refers to an image of a displaying base plate having a defect, and the defect data contains a defect type of the displaying base plate in the image to be checked.

Abstract: The present invention provides a substrate treating apparatus. The substrate treating apparatus includes: a cup having a treatment space therein; a support unit configured to support a substrate within the treatment space, and including a rotatable support plate; and a liquid discharge unit configured to discharge a chemical liquid to the substrate supported by the support unit, in which the support unit includes: a plurality of pin members provided to the support plate to support the substrate placed on the support plate; and a discharge member coupled to the pin member to discharge charges to the air according to a rotation of the support plate, and the discharge member is provided as a conductive member.

Abstract: An image evaluation method, including: obtaining a test image including a first lattice pattern formed by image edges; aligning the test image using the image edges to generate an aligned image including a second lattice pattern formed by aligned image edges; generating a compressed image by compressing the aligned image; and generating a quantified result by quantifying a per-pixel difference between the compressed image and the aligned image.

Abstract: A laser machining apparatus includes, a processing chamber, a window disposed in a surface of the processing chamber, a substrate carrier disposed inside the processing chamber and facing the window, a laser irradiator which irradiates a laser onto the substrate carrier through the window, a protector supplier disposed on a side of the processing chamber, a protector retriever disposed on an opposite side of the processing chamber opposite to the side of the processing chamber, and a protector which connects the protector supplier with the protector retriever, where at least a portion of the protector is disposed between the substrate carrier and the window in the processing chamber.

Abstract: An inspection system for inspecting a display device including pixels includes a camera for capturing the display device and providing a sensing image signal and an inspection device for receiving the sensing image signal and outputting a compensation signal for compensating for luminance of a defective pixel. The inspection device includes an image detector outputting a sensing input signal corresponding to the sensing image signal, a defect coordinate detector detecting the defective pixel based on the sensing input signal and outputting defect coordinates indicating a position of the defective pixel, an image analyzer analyzing consistency of the defect coordinates based on the sensing image signal and the sensing input signal and outputting final coordinates, and a defect compensation calculator outputting a compensation signal for adjusting luminance of compensation pixels adjacent to the defective pixel from among the pixels based on the final coordinates.

Abstract: The current disclosure describes techniques for managing vertical alignment or overlay in semiconductor manufacturing using machine learning. Alignments of interconnection features in a fan-out WLP process are evaluated and managed through the disclosed techniques. Big data and neural networks system are used to correlate the overlay error source factors with overlay metrology categories. The overlay error source factors include tool related overlay source factors, wafer or die related overlay source factors and processing context related overlay error source factors.

Abstract: An information processing device according to the present disclosure including: a mesh division unit (102) that divides at least part of first and second images captured at different times of a target area for detecting chips generated from a workpiece, into a plurality of mesh regions, the images each being an inside image of a machine tool; and an information processing unit (103) that performs processing to associate (a) information on a first chip corresponding to a specific mesh region among the plurality of the mesh regions corresponding to the first image, (b) information on a second chip corresponding to the specific mesh region among the plurality of the mesh regions corresponding to the second image, (c) a first time related to the first image, and (d) a second time related to the second image.

Abstract: Disclosed is a physical unclonable function generator circuit and method. In one embodiment, a physical unclonable function (PUF) generator comprising: a plurality of PUF cells, wherein each of the plurality of PUF cells comprises a first MOS transistor and a second MOS transistor, wherein terminal S of the first MOS transistor is connected to terminal D of the second MOS transistor at a dynamic node, terminal D of the first MOS transistor is coupled to a first bus and terminal G of the first NMOS transistor is coupled to a second bus, and terminals S and G of the second NMOS transistor are coupled to ground; a plurality of dynamic flip-flop (DFF) circuits wherein each of the plurality of DFF circuits is coupled to each of the plurality of PUF cells respectively; a population count circuit coupled to the plurality of DFF circuits; and an evaluation logic circuit having an input coupled to the population count circuit and an output coupled to the plurality of DFF circuits.

Abstract: The present disclosure provides a detection method. The detection method includes inputting an image to be detected into a detection model being pre-constructed and detecting the image to be detected. The detection model includes a defect classification identification sub-model configured to identify a classification of a defect in the image to be detected, and the defect classification identification sub-model comprises a plurality of base models and a secondary model. The present disclosure further provides an electronic device and a non-transitory computer-readable storage medium.

Abstract: The present invention relates to a substrate edge etching apparatus including: a substrate support assembly having a horizontally rotatable chuck base, chuck pins disposed on top of the chuck base, a purge gas inlet hole extending from an underside center of the chuck base to an interior of the chuck base, and a purge gas outlet hole extending radially from the purge gas inlet hole and then extending upwardly to penetrate top of the chuck base; a spin motor having a hollow tube-shaped driving shaft adapted to rotate the substrate support assembly; and a purge gas supply assembly connected to the driving shaft through a magnetic bearing in a state of not rotating, extending vertically from the underside center of the chuck base in a state of being spaced apart from an underside of the chuck base.

Abstract: An image processing method includes acquiring an image frame; tracking a face region of a user based on first prior information obtained from at least one previous frame of the image frame; based on a determination that tracking of the face region based on the first prior information has failed, setting a scan region in the image frame based on second prior information obtained from the at least one previous frame; and detecting the face region in the image frame based on the scan region.

Abstract: A semiconductor device includes a substrate having one or more inner surfaces defining trenches that define an active pattern of the substrate, the trenches including a first trench and a second trench which have different widths, a device isolation layer on the substrate such that the device isolation layer at least partially fills the trenches, and a word line intersecting the active pattern. The device isolation layer includes a first isolation pattern covering a portion of the second trench, a second isolation pattern on the first isolation pattern and covering a remaining portion of the second trench, and a filling pattern filling the first trench under the word line. A top surface of the second isolation pattern is located at a higher level than a top surface of the filling pattern.

Abstract: A photographing method and an electronic device are provided. The photographing method includes: receiving a first input that is performed on a target position in a first preview picture collected by a first camera, and determining a movement speed of a target object according to a plurality of second preview pictures collected by a second camera. The photographing method further includes determining, according to the movement speed, a target time at which the target object moves into a target region. The target region is a region corresponding to the target position. The photographing method also includes controlling the first camera to perform photographing at the target time. A position of the target object in each of the second preview pictures is different, and there is an overlapping picture between the first preview picture and each of the second preview pictures.

Abstract: A semiconductor device includes a substrate, a first fin, and a second fin. The first and second fins are spaced apart from each other in a first direction on the substrate and extend in a second direction intersecting the first direction. The semiconductor device further includes a first shallow trench formed between the first and second fins, and a field insulating film which fills at least a part of the first shallow trench. The field insulating film includes a first portion, a second portion adjacent to the first portion, and a third portion adjacent to the second portion and adjacent to a side wall of the first shallow trench. The first portion includes a central portion of an upper surface of the field insulating film in the first direction. The upper surface of the field insulating film is in a shape of a brace recessed toward the substrate.

Abstract: An image signal processor includes a statistic data generating unit for receiving an image signal from an external device, an image processing unit for receiving the image signal, and a direct memory access (DMA) module connected to the statistic data generating unit and the image processing unit. The statistic data generating unit performs first image pre-processing on the image signal and generates first statistic data based on the image signal subjected to the first image pre-processing. The DMA module stores the first statistic data therein and provides the stored first statistic data to the image processing unit. The image processing unit performs second image pre-processing on the image signal and performs image processing on the image signal based on the first statistic data.