Abstract: An electrical circuit testing assembly that includes a mechanical reference that is relatively stationary as compared to a circuit under test. A probe support assembly is coupled to the mechanical reference and includes probes for contacting interconnect pads on the circuit under test. Optionally, the probe support structure is attached to the mechanical reference via a column that is thermally resistive. Also optionally, a testing circuitry support structure (e.g., a printed circuit board) is not rigidly attached to the mechanical reference or to the probe support structure, thereby permitting the testing circuitry support structure to float with respect to the probe support structure.

Abstract: A switching circuit that transitions using a switch transistor. During the initial stages of a high-low transition, a control loop provides supplemental pre-charge to the gate of the switch transistor to reduce high-low switching delays. Once the current flowing through the switch transistor rises to a level causing the output voltage to change at specified speed threshold, a loop opening mechanism opens the loop. Further opening of the switch transistor in the high-low transition is taken care of by a relatively constant current source. At that point, no or negligible feedback current is used to charge the gate of the switch transistor. Low-high transitions may be performed in a similar complementary manner.

Abstract: A differential level shifter employs a variable current mirror to maintain a reference voltage at one output while the other output follows a differential input. Resistor networks allow postproduction trimming of load resistors and the current mirror, resulting in a precise and accurate output of the differential signal. An active cascode circuit enhances current mirror balance and high frequency operation.

Abstract: The management of unit element selections in a system that includes multiple unit elements. The system includes an element selection component that is configured so that each of the multiple elements is used the same number of times over a certain number of selection cycles. This preserves the first order noise shaping of the mismatch noise thereby keeping a high signal to noise ratio. In addition, the selection of the unit elements is not done in a periodic fashion. This allows the system to avoid tones within the signal band.

Abstract: The management of unit element selections in a system that includes multiple unit elements. The system includes an element selection component that is configured so that each of the multiple elements is used the same number of times over a certain number of selection cycles. This preserves the first order noise shaping of the mismatch noise thereby keeping a high signal to noise ratio. In addition, the selection of the unit elements is not done in a periodic fashion. This allows the system to avoid tones within the signal band.

Abstract: An RF envelope detection circuit that operations at low currents, high sensitivity, and high dynamic range. The circuit receives an AC signal at its input terminal and applies a signal on its output terminal that is a function of the envelope magnitude of the AC signal. To do so, a current source provides a current with an AC signal being superimposed thereon. A rectification circuit rectifies the AC component of this current. A voltage amplifier then amplifies the voltage for providing on the output terminal of the detection circuit. A current sink draws a current from the output terminal that has approximately the same magnitude as the current provided by the current source. A capacitor is coupled to the output terminal of the rectifier so as to store excess charge provided by the rectifier that is in excess of the magnitude of the current provided by the current source.

Abstract: Calibration of a sensor circuit that includes a sensor, a temperature measurement circuit and a signal processing path. The sensor senses a physical parameter to be measured and generates an electrical sensor output signal representing the physical parameter. The temperature measurement circuit outputs a measured temperature. The signal processing path is coupled to the sensor so as to receive the electrical sensor output signal and use the measured temperature to compensate for temperature variations in the electrical sensor output signal. During calibration, the output voltage of the signal processing path is measured at multiple temperatures, and at multiple values of the physical parameter being measured at each temperature while the signal processing path is disconnected from using the measured temperature of the temperature measurement circuit.

Abstract: An integrated high side switch with multi-fault protection. When a fault condition is detected, the switch is turned off. The switch includes a pair of transistors that are connected such that the source of the first transistor is connected with the source of the second transistor. The drain of the first transistor is thus connected to the supply voltage. A first current mirror generates a current sense output. A second current mirror generates an internal current to detect an over current fault condition. The transistors in the current mirrors are connected like the switch transistors. A high voltage operational amplifier and a transistor are used as feedback to insure that the voltage at the output of the current mirrors matches the voltage at the output of the switch. This ensures that the current mirrors generate scaled versions of the current flowing through the switch.