Abstract: A quantitative analysis condition setting unit (13) included in a sequential X-ray fluorescence spectrometer according to the present invention: performs qualitative analyses of a plurality of standard samples (14); sets, on the basis of the qualitative analysis results, a peak measurement angle of each measurement line for analytical samples (1) in quantitative analysis conditions; and obtains a single virtual profile by synthesizing peak profiles of the plurality of standard samples (14) subjected to the qualitative analyses and sets, on the basis of the virtual profile and a preset half value width of the peak profile, background measurement angles of each measurement line for the analytical samples (1) in the quantitative analysis conditions.

Abstract: An X-ray fluorescence analyzing system includes: a cassette (3) in which a substrate (1) is housed; a vapor phase decomposing device (20) for dissolving and then drying a measurement object (2) on a sample substrate surface (11a) to be held thereon; at least one measurement substrate (12); a sample recovering device (30) for dripping and drying a recovery liquid (4), which has recovered the measurement object (2) from the sample substrate (11), onto a predetermined dripping position on a measurement substrate surface (12a) to hold the recovery liquid (4) thereon; an X-ray fluorescence spectrometer (40); a conveying device (50) for conveying the substrate (1); and a control device (60) for controlling the devices (20, 30, 40, 50). The recovery liquids (4) of the measurement objects (2) from a plurality of the sample substrates (11) are dripped and dried on the single measurement substrate surface (12a) to be measured.

Abstract: A scanning-type X-ray fluorescence spectrometer according to the present invention includes a quantitative analysis condition setting unit (13) configured to determine whether or not to add, as an analytical element, a new detected element other than preset sample constituting elements, from an absorption-enhancement effect degree of fluorescent X-rays on an analytical value of an analytical element and an overlapping effect degree by an interfering line on an analytical line of the analytical element, on the basis of qualitative analysis results and semi-quantitative analysis results of standard samples (14).

Abstract: There are provided a radiation detector capable of detecting radiation without occurrence of dead time while maintaining an exposure state in which radiation enters continuously, and an X-ray analysis apparatus and a radiation detection method using the radiation detector. A radiation detector 100 that detects radiation in synchronization with an external apparatus 200, includes: a sensor 110 that generates pulses when radiation particles are detected; a plurality of counters 140a, 140b provided so as to be able to count the pulses; and a control circuit 160 configured to switch a counter to count the pulses among the plurality of counters 140a, 140b, when receiving a synchronization signal from the external apparatus 200.

Abstract: To make a user easily obtain an objective and stable analysis result of bone mineral density. An analyzer 100 of bone mineral density using CT image data of a phantom having a known bone mineral density includes: a known data storage part 105 that stores known data of bone mineral density for a phantom; a histogram production part 102 that produces a histogram of region number relative to a CT value for three-dimensional CT image data of the phantom; a correspondence determination part 106 that determines correspondence between a CT value and a bone mineral density by correlating CT values showing respective peaks of the produced histogram with the known data of the phantom; and an analysis part 109 that decides a bone mineral density for three-dimensional CT image data of a subject using the determined correspondence.

Abstract: There are provided an image processing apparatus, an image processing method and an image processing program which can easily and accurately specify and analyze an abnormal part of a subject. An image processing apparatus 100 used to specify the abnormal part of the subject includes a calculation unit 130 calculating position adjustment data between contour data of a specific subject extracted from an X-ray radiographic image and contour data of a photographic image obtained by photographing the specific subject, a sectional image generation unit 140 generating a sectional image of a three-dimensional X-ray CT image correlated with the X-ray radiographic image on a plane parallel with a light receiving face of a two-dimensional biolight image correlated with the photographic image, and a display processing unit 150 displaying the three-dimensional X-ray CT image and the two-dimensional biolight image in superposition on the sectional image, using the calculated position adjustment data.

Abstract: Provided are a CT-image processing apparatus and a method which can remove noise caused by one of a heartbeat and a breathing beat and extract only an accurate periodic motion by the other one. A CT-image processing apparatus 5 that processes projection data in which an animal is captured as a subject at each time by an X-ray CT apparatus includes a breathing beat threshold specification unit 36a to specify a lower limit of a breathing beat frequency from a feature amount waveform within a ROI for breathing beat synchronization in a series of projection data, a heartbeat threshold specification unit 37a to specify a lower limit of a heartbeat frequency from a feature amount waveform within a ROI for heartbeat synchronization in the series of projection data, a breathing beat extraction unit 36b to extract a breathing beat waveform using a band-pass filter defined by the lower limit of the breathing beat frequency and the lower limit of the heartbeat frequency.

Abstract: A doubly bent X-ray spectroscopic device (1) according to the present invention includes: a glass plate (3) which is deformed into a shape having a doubly bent surface by being sandwiched between a doubly curved convex surface (21a) of a convex forming die (21) and a doubly curved concave surface (22a), of a concave forming die (22), that matches the doubly curved convex surface (21a), and being heated to a temperature of 400° C. to 600° C.; and a reflection coating (5) configured to reflect X-rays, which is formed on a concave surface (3a) of the deformed glass plate (3 ).

Abstract: Provided are a processing method, a processing apparatus and a processing program which can perform pole figure measurement continuously without overlapping of an angle ? in a pole figure with the small number of times of ? scan, thereby enabling the efficient measurement. The processing method for determining conditions of pole figure measurement by X-ray diffraction, includes the steps of: receiving input of a diffraction angle 2?; and determining an angle ? formed by an incident X-ray and an x-axis, and a tilt angle ? of a sample in each ? scan for a rotation angle ? within a sample plane so as to make a range of an angle ? continuous from ?=90° to ?=0° without overlapping, the angle ? being formed by the sample plane and a scattering vector, the range of the angle ? are detectable at a time on a two-dimensional detection plane in the pole figure measurement at the input angle 2?, in which determining the angle ? and the angle ? is repeated.

Abstract: There are provided a radiation detector capable of detecting radiation without occurrence of dead time while maintaining an exposure state in which radiation enters continuously, and an X-ray analysis apparatus and a radiation detection method using the radiation detector. A radiation detector 100 that detects radiation in synchronization with an external apparatus 200, includes: a sensor 110 that generates pulses when radiation particles are detected; a plurality of counters 140a, 140b provided so as to be able to count the pulses; and a control circuit 160 configured to switch a counter to count the pulses among the plurality of counters 140a, 140b, when receiving a synchronization signal from the external apparatus 200.

Abstract: An X-ray diffractometer for obtaining X-ray diffraction angles of diffracted X-rays by detecting with an X-ray detector diffracted X-rays diffracted at a sample when X-rays are emitted at the sample at each angle of the angles about a center point of goniometer circles, the X-ray diffractometer having a pinhole member provided with a pinhole, the pinhole allowing X-rays diffracted from the sample to pass so that the diffracted X-rays pass through the center point of the goniometer circle, and other diffracted X-rays are shielded by the pinhole member.

Abstract: A crystalline phase contained in a sample is identified, from X-ray diffraction data of the sample which contain data of a plurality of ring-shaped diffraction patterns, using a database in which are registered data related to peak positions and peak intensity ratios of X-ray diffraction patterns for a plurality of crystalline phases. Peak positions and peak intensities for a plurality of the diffraction patterns are detected from the X-ray diffraction data (step 102), and the circumferential angle versus intensity data of the diffraction patterns is created (step 103). The diffraction patterns are grouped into a plurality of clusters on the basis of the circumferential angle versus intensity data (step 105). Crystalline phase candidates contained in the sample are searched from the database on the basis of sets of ratios of peak positions and peak intensities of the diffraction patterns grouped into the same cluster (step 106).

Abstract: A measurement line evaluation unit (23): calculates, for all of specified measurement lines, estimated measured intensities by theoretical calculation on the basis of a composition and/or a thickness specified for a thin film; changes, by a predetermined amount, only an estimated measured intensity of one measurement line, and obtains quantitative values of the composition and/or the thickness of the thin film after change of the estimated measured intensity, for each changed measurement line, by a fundamental parameter method; and estimates a quantitative error and/or determines possibility of analysis, on the basis of the obtained quantitative values and the specified composition and/or the specified thickness.

Abstract: An X-ray thin film inspection device according to the present invention has an X-ray irradiation unit 40 mounted in a first rotation arm 32, an X-ray detector 50 mounted in a second rotation arm 33, a fluorescence x-ray detector 60 for detecting fluorescent X-ray occurring from an inspection target due to irradiation of X-ray, a temperature measuring unit 110 for measuring the temperature corresponding to the temperature of the X-ray thin film inspection device, and a temperature correcting system (central processing unit 100) for correcting an inspection position on the basis of the temperature measured by the temperature measuring unit 110.

Abstract: An X-ray detection signal processing device (10) and the like according to the present invention includes: a comparator (17) configured to output a High signal when a level of a signal from a continuous reset type preamplifier (13) having an CR circuit (13a) does not exceed a predetermined upper limit value, and output a Low signal when the level of the signal from the preamplifier (13) exceeds the predetermined upper limit value; and a control section (18) configured to delay shift of the signal of the comparator (17) from Low to High by a predetermined time, to perform output to a clock oscillator (15), stop oscillation by outputting a Low signal to the clock oscillator (15), and thus stop high-speed AD conversion by a high-speed AD converter (14) and maintain an output value.

Abstract: A grazing incidence X-ray fluorescence spectrometer (1) of the present invention includes: a bent spectroscopic device (4) to monochromate X-rays (3) from an X-ray source (2) and generate an X-ray beam (5) focused on a fixed position (15) on a surface of a sample (S); a slit member (6) disposed between the bent spectroscopic device (4) and the sample (S) and having a linear opening (61); a slit member moving unit (7) to move the slit member (6) in a direction that intersects the X-ray beam (5) passing through the linear opening (61); a glancing angle setting unit (8) to move the slit member (6) by using the slit member moving unit (7), and set a glancing angle (?) of the X-ray beam (5) to a desired angle; and a detector (10) to measure an intensity of fluorescent X-rays (9) from the sample (S) irradiated with the X-ray beam (5).

Abstract: The X-ray analyzing apparatus according to the present invention includes, in combination: a first correcting unit (13A, 13B) to output a first gain to cause a pulse height of a target peak which is estimated on the basis of a sum of counting rates obtained in preliminary measurement, to match a predetermined expected pulse height; and a second correcting unit (14A, 14B) to output, in real time through feedback control, a second gain to be added to the first gain in order to cause the pulse height of the target peak detected within a predetermined energy range, to match the expected pulse height, and further includes a feedback control stopping unit (16A, 16B) to appropriately determine presence/absence of an interfering line with respect to the target peak, and to set, when determining that the interfering line exists, the gain to a fixed value including only the first gain.

Abstract: An even number of magnets (5) are incorporated in a housing (3) while sandwiched by pole pieces (6). A rotating shaft (2) has a boundary which is provided in a hollow portion (3a) of the housing (3) and nearer to an airtight chamber (1) than a pole piece (6) nearest to the airtight chamber (1), and an area of the rotating shaft (2) which is nearer to the airtight chamber (1) than the boundary is formed of a non-magnetic material. In the housing (3), an area located near the airtight chamber (1) from a site which is in contact with a pole piece (6) nearest to the airtight chamber (1) is formed of a magnetic material.

Abstract: An X-ray fluorescence spectrometer includes: an X-ray source (3) to irradiate, with primary X-rays (6), a sample (1) that is multiple nanoparticles placed on a substrate (10); an irradiation angle adjustment unit (5) to adjust an irradiation angle at which a surface (10a) of the substrate is irradiated; a detection unit (8) to measure an intensity of fluorescent X-rays (7) from the sample (1); a peak position calculation unit (11) to generate a sample profile representing change of the intensity of the fluorescent X-rays (7) against change of the irradiation angle, and to calculate a peak irradiation angle position; a particle diameter calibration curve generation unit (21) to generate a calibration curve; and a particle diameter calculation unit (22) to calculate a particle diameter of nanoparticles of an unknown sample (1) by applying the peak irradiation angle position of the unknown sample (1) to the calibration curve.

Abstract: An X-ray generator including a cathode, an anode provided with two X-ray generation zones, a casing in which the cathode and anode are accommodated, two air cylinders for causing the anode to move, two linear guides for guiding the movement of the anode, and a bellows serving as a seal member. The air cylinders and the linear guides are provided at different positions on a surface orthogonal to a center axis of the bellows. The air cylinders and the linear guides are provided uniformly in relation to the center axis.