Abstract: An even number of magnets (5) are incorporated in a housing (3) while sandwiched by pole pieces (6). A rotating shaft (2) has a boundary which is provided in a hollow portion (3a) of the housing (3) and nearer to an airtight chamber (1) than a pole piece (6) nearest to the airtight chamber (1), and an area of the rotating shaft (2) which is nearer to the airtight chamber (1) than the boundary is formed of a non-magnetic material. In the housing (3), an area located near the airtight chamber (1) from a site which is in contact with a pole piece (6) nearest to the airtight chamber (1) is formed of a magnetic material.

Abstract: An X-ray fluorescence analyzing system includes: a cassette (3) in which a substrate (1) is housed; a vapor phase decomposing device (20) for dissolving and then drying a measurement object (2) on a sample substrate surface (11a) to be held thereon; at least one measurement substrate (12); a sample recovering device (30) for dripping and drying a recovery liquid (4), which has recovered the measurement object (2) from the sample substrate (11), onto a predetermined dripping position on a measurement substrate surface (12a) to hold the recovery liquid (4) thereon; an X-ray fluorescence spectrometer (40); a conveying device (50) for conveying the substrate (1); and a control device (60) for controlling the devices (20, 30, 40, 50). The recovery liquids (4) of the measurement objects (2) from a plurality of the sample substrates (11) are dripped and dried on the single measurement substrate surface (12a) to be measured.

Abstract: Provided are a CT-image processing apparatus and a method which can remove noise caused by one of a heartbeat and a breathing beat and extract only an accurate periodic motion by the other one. A CT-image processing apparatus 5 that processes projection data in which an animal is captured as a subject at each time by an X-ray CT apparatus includes a breathing beat threshold specification unit 36a to specify a lower limit of a breathing beat frequency from a feature amount waveform within a ROI for breathing beat synchronization in a series of projection data, a heartbeat threshold specification unit 37a to specify a lower limit of a heartbeat frequency from a feature amount waveform within a ROI for heartbeat synchronization in the series of projection data, a breathing beat extraction unit 36b to extract a breathing beat waveform using a band-pass filter defined by the lower limit of the breathing beat frequency and the lower limit of the heartbeat frequency.

Abstract: An optical axis adjustment method for an X-ray analyzer. In a 2?-adjustment step, a 0° position of the rotation of a receiving-side arm and a 0° position of the angle of diffraction 2? are aligned. In a Zs-axis adjustment step, the position of an incident-side slit along a direction orthogonal to the centerline of the X-rays incident upon a sample from an X-ray source is adjusted. In a ?-adjustment step, the centerline of X-rays incident upon the sample from the X-ray source and the surface of the sample are adjusted so as to be parallel. In the 2?-adjustment step, the Zs-axis adjustment step, and the ?-adjustment step, the capability for X-ray intensity positional resolution upon a straight line possessed by a one-dimensional X-ray detector is used to perform 2?-adjustment, Zs-axis adjustment, and ?-adjustment.

Abstract: In order to realize a compact and lightweight X-ray diffraction apparatus not requiring a goniometer, an apparatus for X-ray diffraction includes a first X-ray irradiating unit and a second X-ray irradiating unit that irradiate shaped X-rays on a same region of the surface of the sample from respective directions; an X-ray detecting unit that detects a first diffracted X-ray emanated from the region of the sample where the X-ray is irradiated by the first X-ray irradiating unit and a second diffracted X-ray emanated from the region of the sample where the X-ray is irradiated from the second X-ray irradiating unit; and an X-ray diffraction signal processing unit that processes a signal acquired by detecting the first diffracted X-ray and the second diffracted X-ray emanated from the same region of the sample with the X-ray detecting unit.

Abstract: A thermal analysis step, a molecule ionization step and a molecular structure analysis step are executed in parallel to a temperature increasing step. In the molecule ionization step, component molecules contained in gas evolved from a sample S due to temperature increase are ionized, and in the molecular structure analysis step, any selected ion out of molecular ions obtained in the molecule ionization step is dissociated to generate fragment ions corresponding to the structural factors of the molecule, and the structure of the molecule is analyzed on the basis of the fragment ions.

Abstract: The X-ray diffraction apparatus irradiates a sample with an X-ray and performs frame photographing in each X-ray diffraction angle, and includes a control section (141) controlling the frame photographing by scanning without closing a shutter, a data acquisition section (142) acquiring detection data of each frame which has been detected by a semiconductor pixel detector in the frame photographing, a frame integration section (146) integrating the detection data which has been acquired in each scanning for each frame, and a determination section (147) determining whether the integrated detection data has a sufficient intensity or not, and the control section (141) controls so as to finish measurement when the integrated detection data has a sufficient intensity and so as to perform the scanning again when the integrated detection data does not have a sufficient intensity.

Abstract: A correction information generation method and a correction information generation apparatus enabling easy Flat-Field Correction operation without special accessory equipment are provided. The correction information generation method for performing Flat-Field Correction of X-ray detection sensitivity on a pixel detector, includes the steps of: moving the relative position of a detector 130 with respect to an incident X-ray having a cross-sectional beam shape traversing a detection surface so that the whole of the detection surface is irradiated with the incident X-ray in total time and each of pixels arranged in the moving direction is uniformly irradiated; and generating information for correcting the sensitivity of a pixel based on an intensity value detected for a given energy band of the incident X-ray.

Abstract: Provided is an X-ray topography apparatus capable of separating a desired characteristic X-ray which enters a sample from an X-ray which is radiated from an X-ray source, and increasing an irradiation region of the desired characteristic X-ray. The X-ray topography apparatus includes: the X-ray source for radiating the X-ray from a fine focal point, the X-ray containing a predetermined characteristic X-ray; an optical system including a multilayer mirror with a graded multilayer spacing which corresponds to the predetermined characteristic X-ray, the optical system being configured to cause the X-ray reflected on the multilayer mirror to enter the sample; and an X-ray detector for detecting a diffracted X-ray. The multilayer mirror includes a curved reflective surface having a parabolic cross section, and the fine focal point of the X-ray source is provided onto a focal point of the curved reflective surface.

Abstract: An X-ray apparatus that creates a virtual source having a narrow energy bandwidth and enables a high-resolution X-ray diffraction measurement; a method of using the same; and an X-ray irradiation method are provided. An X-ray apparatus 100 includes a monochromator 105 that focuses a divergent X-ray beam while dispersing it and a selection part 107 that is installed in a condensing position of the condensed X-ray beam for selecting an X-ray beam having a wavelength in a specific range, allowing it to pass through, and creating a virtual source. With this arrangement, it is possible to create a virtual source having a narrow energy bandwidth at a focal point 110 and by means of the virtual source a high-resolution X-ray diffraction measurement is available. By using the X-ray apparatus 100, it is possible to sufficiently separate an X-ray beam having such an extremely narrow energy bandwidth as, for example, K?1 ray from K?2 ray.

Abstract: There is provided an X-ray diffraction apparatus configured to irradiate a sample S on a sample stage with X-rays generated from an X-ray source and detect the X-rays diffracted by a sample using a detector, including a virtual mask setting section and a signal processing section. The detector outputs detection signals according to intensity of the X-rays received by detection elements, for each of the plurality of detection elements forming a detection surface. The virtual mask setting section is capable of setting a virtual mask on the detection surface of the detector, and setting at least an opening dimension of the virtual mask as an opening condition of the virtual mask independently in an X direction and a Y direction. The signal processing section processes the detection signals outputted from the detector according to the opening condition of the virtual mask set in the virtual mask setting section.

Abstract: An X-ray CT apparatus for obtaining an internal image of a test subject by using X-rays. The X-ray CT apparatus has: an X-ray generator; an X-ray detector; a first casing for enclosing the X-ray generator and the X-ray detector; a test-subject table; a first table transporting mechanism for transporting the test-subject table between a first table position and a second table position, the first table position being a position where the main portion of the test-subject table receives X-rays from the X-ray generator, and the second table position being a position where the main portion of the test-subject table is on the outside of the first casing; and a second table transporting mechanism capable of vertically transporting the test-subject table. The first table transporting mechanism and the second table transporting mechanism operate in association with each other.

Abstract: There are provided an image processing apparatus, an image processing method and an image processing program which can easily and accurately specify and analyze an abnormal part of a subject. An image processing apparatus 100 used to specify the abnormal part of the subject includes a calculation unit 130 calculating position adjustment data between contour data of a specific subject extracted from an X-ray radiographic image and contour data of a photographic image obtained by photographing the specific subject, a sectional image generation unit 140 generating a sectional image of a three-dimensional X-ray CT image correlated with the X-ray radiographic image on a plane parallel with a light receiving face of a two-dimensional biolight image correlated with the photographic image, and a display processing unit 150 displaying the three-dimensional X-ray CT image and the two-dimensional biolight image in superposition on the sectional image, using the calculated position adjustment data.

Abstract: An X-ray imaging apparatus and an X-ray imaging method that can stitch transmission images detected by a two-dimensional detector at different positions of the sample are provided. An X-ray imaging apparatus and an X-ray imaging method include: an X-ray generating unit configured to irradiate a sample with a substantially parallel X-ray; a two-dimensional detector including a detection region; a stage where a support base is mounted is configured to move the support base in a plane along a plane of the detection region; and an imaging control unit configured to generate stitched transmission image data based on a plurality of transmission images of the sample detected by the two-dimensional detector. The imaging control unit is configured to stitch the transmission images at a plurality of mutually different positions in the sample to generate the stitched transmission image data.

Abstract: An X-ray analysis apparatus having a function for enabling a plurality of measurement methods to be implemented, the X-ray analysis apparatus having: a measurement system capable of implementing a plurality of measurement methods; measurement software for implementing, in a selective manner, each of the measurement methods; a material evaluation table for storing information relating to a material that may be measured, and a name of an evaluation performed on the material; an input device for inputting the information relating to the material; a wizard program for performing computation for selecting the name of an evaluation on the basis of the information relating to the material inputted using the input device; and a wizard program for selecting a corresponding measurement method on the basis of the selected name of the evaluation.

Abstract: Small-sized X-ray CT apparatus obtaining a cross-section or 3D image of a sample, using X-rays. Included: an X-ray generating apparatus irradiating X-rays on the sample; an X-ray detecting device detecting X-rays passing through the sample; and a device processing a detection signal from the X-ray detecting device, to re-structure the cross-section or 3D image of the sample; an X-ray shielding member having an opening portion for introducing the sample therein on one end surface and being treated with an X-ray protection process on an entire periphery thereof; and a means rotationally driving the X-ray shielding member, wherein the X-ray generating apparatus and the X-ray detecting device are treated with the X-ray protection process, respectively, and are fixed on a wall surface of the X-ray shielding member at positions opposing to each other, putting an rotation axis thereof therebetween, and thereby constructed with the X-ray shielding member in one body.

Abstract: The X-ray generating apparatus 100 applies an electron beam e1 onto a target 150 to generate X-rays x1, and includes a permanent magnet lens 120 configured to focus the electron beam e1, a correction coil 130 provided on a side of the electron beam e1 with respect to the permanent magnet lens 120 and configured to correct a focus position formed by the permanent magnet lens 120 in a traveling direction of the electron beam e1, and a target 150 onto which the focused electron beam is applied. Accordingly, the apparatus configuration can be extremely compact and lightweight in comparison with general apparatuses. Furthermore, by the correction coil 130, the intensity of the magnetic field can be finely adjusted and the focus position in the traveling direction of the electron beam e1 can be finely adjusted.

Abstract: An X-ray stress measuring apparatus, for measuring stress on a sample, comprises: a pair of X-ray generating means (10, 11, 10?, 11?) for irradiating X-ray beams, determining an angle defined between the X-ray beams, mutually, at an arbitrary fixed angle, on a plane inclining by an angle desired with respect to a surface of the sample to be measured stress thereon; an X-ray sensor portion (29) for detecting plural numbers of Debye rings (C, C?), which are generated by incident X-ray beams from said pair of X-ray generating means; and a battery (410) for supplying necessary electricity to each of parts of the apparatus, wherein said X-ray sensor portion is made up with only one (1) piece of a 2-dimensional X-ray detector (20) or a 1-dimensional X-ray detector (20?), and is disposed in a position where the plural numbers of Debye rings generated by the incident X-ray beams from the at least one pair of X-ray generating means are adjacent to each other, or intersect with each other, thereby detecting the plural

Abstract: An X-ray analyzing apparatus is such that a diffraction pattern, in which the intensity of secondary X-rays (4) is associated with the angle of rotation of a sample (S), is stored; while the pattern is scanned by a line of the secondary X-rays (4) intensity in a direction of highness and lowness, points on the pattern having not higher intensity than the line are taken as candidate points; respective angles of rotation of the candidate points, when the maximum value of the difference in angle of rotation between the neighboring candidate points attains a predetermined angle, are stored; depending on coordinates of a point of measurement, the angle of rotation proximate to the coordinates is read out from the stored angles; and the sample (S) is set to the read out angle and the point of measurement is arranged within the field of view (V) of a detector (7).