Patents Assigned to SEMI
  • Test system for semiconductor memory cell
    Patent number: 4004222
    Abstract: This invention accelerates the leakage current from certain nodes of memory cells in static semiconductor memory to an extent whereby defective memory cells, which would not be detected without a considerable waiting period elapsing, are readily quickly detected.
    Type: Grant
    Filed: November 20, 1974
    Date of Patent: January 18, 1977
    Assignee: SEMI
    Inventor: Richard E. Gebhard