Abstract: A structure includes a substrate having an upper surface provided with recesses and coated with a continuous barrier layer topped with a continuous copper layer filling at least the recesses. The structure is planarized by: a) chemical-mechanical polishing of the copper, such a polishing being selective with respect to the barrier layer so that copper remains in the recesses and is set back with respect to the upper surface of the substrate; b) depositing on the exposed surface of the structure a material covering at least the copper at the level of the recesses; and c) chemical-mechanical planarizing of the structure to expose the substrate with the copper remaining buried under the material. Two such structures are then direct bonded to each other with opposite areas of material having a same topology.
Type:
Application
Filed:
May 7, 2015
Publication date:
November 26, 2015
Applicants:
STMicroelectronics (Crolles 2) SAS, Commissariat A L'Energie Atomique et aux Energies Alternatives
Abstract: An integrated circuit on a semiconductor substrate has logic gates comprising FDSOI-type transistors made on said substrate, including at least one first transistor comprising a gate with a first work function, and including a transistor comprising a second work function, a memory including memory cells, each memory cell comprising FDSOI type transistors, including at least one third nMOS transistor with a gate presenting a third work function, the third transistor comprising a buried insulating layer and a ground plane at least one fourth pMOS transistor with a gate presenting said third work function, the fourth transistor comprising a buried insulating layer and a ground plane, the ground planes of the third and fourth transistors being made in a same well separating these ground planes from said substrate.
Type:
Grant
Filed:
September 7, 2012
Date of Patent:
November 17, 2015
Assignees:
Commissariat à l'énergie atomique et aux énergies alternatives, STMicroelectronics (Crolles 2) SAS
Inventors:
Olivier Thomas, Jerome Mazurier, Nicolas Planes, Olivier Weber
Abstract: A method for manufacturing a suspended membrane in a single-crystal semiconductor substrate, including the steps of: forming in the substrate an insulating ring delimiting an active area, removing material from the active area, successively forming in the active area a first and a second layers, the second layer being a single-crystal semiconductor layer, etching a portion of the internal periphery of said ring down to a depth greater than the thickness of the second layer, removing the first layer so that the second layer formed a suspended membrane anchored in the insulating ring.
Abstract: A substrate includes an active region oriented along a crystallographic face (100) and limited by an insulating region. A MOS transistor includes a channel oriented longitudinally along a crystallographic direction of the <110> type. A basic pattern made of metal and formed in the shape of a T is electrically inactive and situated over an area of the insulating region adjacent a transverse end of the channel. A horizontal branch of the T-shaped basic pattern is oriented substantially parallel to the longitudinal direction of the channel.
Type:
Application
Filed:
March 6, 2015
Publication date:
October 29, 2015
Applicants:
STMicroelectronics (Crolles 2) SAS, STMicroelectronics SA
Inventors:
Vincent Fiori, Sebastien Gallois-Garreignot, Denis Rideau, Clement Tavernier
Abstract: An integrated imaging device supports front face illumination with one or more photosensitive regions formed in a substrate. A lower dielectric region is provided over the substrate, the lower dielectric region having an upper face. A metal optical filter having a metal pattern is provided on the upper face (or extending into the lower dielectric region from the upper face). An upper dielectric region is provided on top of the lower dielectric region and metal optical filter. The lower dielectric region is at least part of a pre-metal dielectric layer, and the upper dielectric region is at least part of a metallization layer.
Type:
Grant
Filed:
December 3, 2014
Date of Patent:
October 27, 2015
Assignees:
STMicroelectronics (Crolles 2) SAS, STMicroelectronics SA, Commissariat a l'Energie Atomique et aux Energies Alternatives
Inventors:
Romain Girard Desprolet, Sandrine Lhostis, Salim Boutami, Michel Marty
Abstract: An electrical generator is composed of a bi-layer membrane enabling the conversion of a thermal energy into electrical energy. The bi-layer membrane is deformable and includes at least two layers having different thermal expansion coefficients. The membrane moves between positions in a reversible fashion in response to heat dissipation and as a function of two flexing temperatures. A magnetic structure associated with the membrane functions to set the flexing temperatures as a function of ambient temperature.
Type:
Application
Filed:
April 14, 2015
Publication date:
October 22, 2015
Applicant:
STMICROELECTRONICS (CROLLES 2) SAS
Inventors:
Onoriu Puscasu, Stephane Monfray, Thomas Skotnicki, Christophe Maitre
Abstract: A method for producing at least one through-silicon via inside a substrate may include forming a cavity in the substrate from a first side of the substrate until an electrically conductive portion is emerged onto. The method may also include forming an electrically conductive layer at a bottom and on walls of the cavity, and at least partly on a first side outside the cavity. The process may further include at least partially filling the cavity with at least one phase-change material. Another aspect is directed to a three-dimensional integrated structure.
Type:
Grant
Filed:
May 27, 2014
Date of Patent:
October 20, 2015
Assignees:
STMICROELECTRONICS SA, STMICROELECTRONICS (CROLLES 2) SAS
Inventors:
Pierre Bar, Simon Gousseau, Yann Beilliard
Abstract: The disclosure relates to a method of fabricating an interconnection structure of an integrated circuit, comprising the steps of: forming a first conductive element within a first dielectric layer; depositing a first etch stop layer above the first conductive element and the first dielectric layer; forming an opening in the first etch stop layer above the first conductive element, to form a first connection area; depositing a second dielectric layer above the etch stop layer and above the first conductive element in the connection area; etching the second dielectric layer to form at least one hole which is at least partially aligned with the connection area; and filling the hole with a conductive material to form a second conductive element in electrical contact with the first conductive element.
Abstract: An integrated circuit chip includes a substrate die and integrated circuits and a layer incorporating a front electrical interconnect network formed on a front face of the substrate die. A local electrical connection via made of an electrically conductive material is formed in a hole of the substrate die. The via is linked to a connection portion of the electrical interconnect network. An electrical connection pillar made of an electrically conductive material is formed on a rear part of the electrical connection via. A local external protection layer at least partly covers the electrical connection via and the electrical connection pillar.
Abstract: A device includes a chip assembled on an interposer. An electrically-insulating layer coats an upper surface of the interposer around the chip. First metal lines run on the upper surface of the interposer and are arranged between conductive elements of connection to the chip. An end of each first metal line is arranged to extend beyond a projection of the chip on the interposer. A thermally-conductive via connects the end of the first metal line to a heat sink supported at an upper surface of the device.
Type:
Application
Filed:
March 17, 2015
Publication date:
September 24, 2015
Applicants:
STMICROELECTRONICS SA, STMICROELECTRONICS (CROLLES 2) SAS
Inventors:
Pierre Bar, Alisee Taluy, Olga Kokshagina
Abstract: A MOS transistor including, above a gate insulator, a conductive gate stack having a height, a length, and a width, this stack having a lower portion close to the gate insulator and an upper portion, wherein the stack has a first length in its lower portion, and a second length shorter than the first length in its upper portion.
Type:
Grant
Filed:
January 31, 2014
Date of Patent:
August 25, 2015
Assignees:
STMicroelectronics SA, STMicroelectronics (Crolles 2) SAS, Commissariat a l'Energie Atomique et aux Energies Alternatives
Inventors:
Heimanu Niebojewski, Yves Morand, Cyrille Le Royer
Abstract: An integrated circuit including at least one isolating trench that delimits an active area made of a monocrystalline semiconductor material, the or each trench comprising an upper portion including an insulating layer that encapsulates a lower portion of the trench, the lower portion being at least partly buried in the active area and the encapsulation layer comprising nitrogen or carbon.
Type:
Grant
Filed:
July 31, 2014
Date of Patent:
August 25, 2015
Assignee:
STMicroelectronics (Crolles 2) SAS
Inventors:
Grégory Bidal, Laurent Favennec, Raul Andres Bianchi
Abstract: The invention concerns a method comprising: forming a plurality of parallel lines (502, 504, 506) of a sacrificial material over a layer of conductive material (510) of an integrated circuit, said parallel lines being separated by trenches, at least one of said lines being interrupted along its length by an opening (516) dividing it into first and second line portions (504A, 504B) separated by a space (S); forming spacers (522, 524, 526, 528, 530) in said trenches on lateral sides of said line portions and filling at least a bottom part of said opening between the line portions; removing the sacrificial material by etching; and forming interconnection lines (302, 304A, 304B, 306A, 306B, 308, 310) of said conductive material based on a pattern defined by said spacers.
Abstract: A method for manufacturing an image sensor, including the steps of: forming elementary structures of an image sensor on the first surface of a semiconductor substrate; installing a layer on the first surface; defining trenches in the layer, the trenches forming a pattern in the layer; and installing, on a hollow curved substrate, the obtained device on the free surface side of the layer, the pattern being selected according to the shape of the support surface.
Abstract: A method for manufacturing an image sensor, including the successive steps of: forming columns of a semiconductor material; forming one or several pixels at a first end of each of the columns; and deforming the structure so that the second ends of each of the columns come closer to each other or draw away from each other to form a surface in the shape of a polyhedral cap.
Abstract: A photosite is formed in a semiconductor substrate and includes a photodiode confined in a direction orthogonal to the surface of the substrate. The photodiode includes a semiconductor zone for storing charge that is formed in an upper semiconductor region having a first conductivity type and includes a main well of a second conductivity type opposite the first conductivity type and laterally pinned in a first direction parallel to the surface of the substrate. The photodiode further includes an additional semiconductor zone including an additional well having the second conductivity type that is buried under and makes contact with the main well.
Type:
Grant
Filed:
June 21, 2012
Date of Patent:
August 4, 2015
Assignees:
STMicroelectronics SA, STMicroelectronics (Crolles 2) SAS
Abstract: The invention relates to an integrated circuit comprising a semi-conducting substrate and first and second cells. Each cell comprises first and second transistors of nMOS and pMOS type including first and second gate stacks including a gate metal. There are first and second ground planes under the first and second transistors and an oxide layer extending between the transistors and the ground planes. The gate metals of the nMOS and of a pMOS exhibit a first work function and the gate metal of the other pMOS exhibiting a second work function greater than the first work function. The difference between the work functions is between 55 and 85 meV and the first work function Wf1 satisfies the relation Wfmg?0.04?0.005*Xge<Wf1<Wfmg?0.03?0.005*Xge.
Type:
Grant
Filed:
June 19, 2014
Date of Patent:
August 4, 2015
Assignees:
Commissariat à l'énergie atomique et aux énergies alternatives, STMicroelectronics (Crolles 2) SAS
Inventors:
Olivier Weber, Nicolas Planes, Rossella Ranica
Abstract: A stack of a first and second semiconductor structures is formed. Each semiconductor structure includes: a semiconductor bulk, an overlying insulating layer with metal interconnection levels, and a first surface including a conductive area. The first surfaces of semiconductor structures face each other. A first interconnection pillar extends from the first surface of the first semiconductor structure. A housing opens into the first surface of the second semiconductor structure. The housing is configured to receive the first interconnection pillar. A second interconnection pillar protrudes from a second surface of the second semiconductor structure which is opposite the first surface. The second interconnection pillar is in electric contact with the first interconnection pillar.
Abstract: An integrated circuit chip includes a substrate die and integrated circuits and a layer incorporating a front electrical interconnect network formed on a front face of the substrate die. A local electrical connection via made of an electrically conductive material is formed in a hole of the substrate die. The via is linked to a connection portion of the electrical interconnect network. An electrical connection pillar made of an electrically conductive material is formed on a rear part of the electrical connection via. A local external protection layer at least partly covers the electrical connection via and the electrical connection pillar.
Abstract: A structure comprising at least one DTI-type insulating trench in a substrate, the trench being at the periphery of at least one active area of the substrate forming a pixel, the insulating trench including a cavity filled with a dielectric material, the internal walls of the cavity being covered with a layer made of a boron-doped material.
Type:
Grant
Filed:
January 30, 2014
Date of Patent:
July 21, 2015
Assignee:
STMicroelectronics (Crolles 2) SAS
Inventors:
Laurent Favennec, Arnaud Tournier, François Roy