Abstract: An integrated circuit including at least one isolating trench that delimits an active area made of a monocrystalline semiconductor material, the or each trench comprising an upper portion including an insulating layer that encapsulates a lower portion of the trench, the lower portion being at least partly buried in the active area and the encapsulation layer comprising nitrogen or carbon.
Type:
Application
Filed:
July 31, 2014
Publication date:
November 20, 2014
Applicant:
STMicroelectronics (Crolles 2) SAS
Inventors:
Grégory Bidal, Laurent Favennec, Raul Andres Bianchi
Abstract: A three-dimensional integrated structure is formed from a first integrated circuit with a first cavity filled with a first conductive material and a second integrated circuit with a second cavity filled with a second conductive material, the second cavity facing the first cavity. The filled first cavity forms a first element and the filled second cavity forms a second element, the first and second elements separated from each other by a cavity. The first and second conductive materials have different thermal expansion coefficients. A contact detection circuit is electrically connected to the filled first and second cavities, and is operable to sense electrical contact between the first and second conductive materials in response to a change in temperature.
Abstract: A method for defining parallel lines extending along a first direction in a same level of an integrated circuit, among which at least first and second lines separated by an even number of lines are interconnected, a space having a width at least equal to the minimum space between two lines separated by one line being left free, in a second direction perpendicular to the first direction, on either side of a minimum rectangle containing the first and the second lines.
Abstract: Fabrication of a microelectronic device on a semiconductor on insulator type substrate, the device being provided with a transistor of a given type, the channel structure of which is formed from semiconducting bar(s), a dielectric area different from the insulating layer of the substrate being provided to replace the insulating layer, facing the transistor channel structure, specifically for this given type of transistor.
Type:
Application
Filed:
May 1, 2014
Publication date:
November 6, 2014
Applicants:
COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENE ALT, STMICROELECTRONICS (CROLLES 2) SAS
Abstract: A method for defining an insulator in a semiconductor substrate includes forming a trench in the substrate, forming in the trench an insulating material having its upper surface arranged above the surface of the substrate, and forming a diffusion barrier layer in a portion of the insulating material located above the surface of the semiconductor substrate. Such insulators can be used, for example, to insulate and delineate electronic components or portions of components formed in the substrate.
Abstract: A detector of biological or chemical material, including a MOS transistor having its channel region inserted between upper and lower insulated gates, the upper insulated gate including a detection layer capable of generating a charge at the interface of the upper insulated gate and of its gate insulator, the thickness of the upper gate insulator being smaller than the thickness of the lower gate insulator.
Abstract: A method for manufacturing a hybrid SOI/bulk substrate, including the steps of starting from an SOI wafer comprising a single-crystal semiconductor layer called SOI layer, on an insulating layer, on a single-crystal semiconductor substrate; depositing on the SOI layer at least one masking layer and forming openings crossing the masking layer, the SOI layer, and the insulating layer, to reach the substrate; growing by a repeated alternation of selective epitaxy and partial etching steps a semiconductor material; and etching insulating trenches surrounding said openings filled with semiconductor material, while encroaching inwards over the periphery of the openings.
Type:
Grant
Filed:
December 12, 2013
Date of Patent:
November 4, 2014
Assignees:
STMicroelectronics, Inc., STMicroelectronics SA, STMicroelectronics (Crolles 2) SAS, Commissariat à l'Énergie Atomique et aux Énergies Alternatives
Inventors:
Claire Fenouillet-Beranger, Stephane Denorme, Nicolas Loubet, Qing Liu, Emmanuel Richard, Pierre Perreau
Abstract: At least one MOS transistor is produced by forming a dielectric region above a substrate and forming a gate over the dielectric region. The gate is formed to include a metal gate region. Formation of the metal gate region includes: forming a layer of a first material configured to reduce an absolute value of a threshold voltage of the transistor, and configuring a part of the metal gate region so as also to form a diffusion barrier above the layer of the first material. Then, doped source and drain regions are formed using a dopant activation anneal.
Type:
Application
Filed:
April 17, 2014
Publication date:
October 30, 2014
Applicant:
STMICROELECTRONICS (CROLLES 2) SAS
Inventors:
Sylvain Baudot, Pierre Caubet, Florian Domengie
Abstract: Integrated circuit (1) comprising a substrate (2), an active component (13) above the substrate (2), a cavity (14) surrounding partially the active component (13), a low dielectric region (15) surrounding partially the cavity (14) and a protective barrier (16) arranged around the low dielectric region (15).
Abstract: A device and a method for controlling an SRAM-type device, including: a bistable circuit and two switching circuits respectively connecting two access terminals of the bistable circuit to two complementary bit lines in a first direction, each switching circuit including a first switch and a second switch in series between one of the bit lines and one of the access terminals, the control terminal of the second switch being connected to a word control line in the first direction; and a third switch between the midpoint of the series connection and a terminal of application of a reference potential, a control terminal of the third switch being connected to the other one of the access terminals.
Type:
Grant
Filed:
February 14, 2011
Date of Patent:
October 21, 2014
Assignees:
STMicroelectronics S.A., STMicroelectronics (Crolles 2) SAS
Abstract: A method is for measuring light energy received by a pixel including a transfer transistor, and a photodiode including a charge storage region. The method may include encapsulating the gate of the transfer transistor of the pixel in a semiconductor layer, at least one part of which includes a hydrogenated amorphous semiconductor. The method also may include grounding the charge storage region of the pixel, and determining the drift over time in the magnitude of the drain-source current of the transfer transistor.
Type:
Grant
Filed:
February 22, 2012
Date of Patent:
October 21, 2014
Assignees:
STMicroelectronics SA, STMicroelectronics (Crolles 2) SAS
Abstract: A method for forming an integrated circuit including the steps of: forming electronic components on a first surface of a substrate; forming a stack of interconnection levels on the first surface, each interconnection level including conductive tracks separated by an insulating material; forming at least one hole from a second surface of the substrate, opposite to the first surface, the hole stopping on one of the conductive tracks; depositing, on the walls and the bottom of the hole, a conductive layer and filling the remaining space with a filling material; and forming, in an interconnection level or at the surface of the interconnection stack, and opposite to said at least one hole, at least one region of a material having a modulus of elasticity greater than 50 GPa and an elongation at break greater than 20%, insulated from the conductive tracks.
Abstract: Transmission/reception device for signals having a wavelength of the microwaves, millimeter or terahertz type, comprising an antenna array. The antenna array comprises a first group of first omni-directional antennas and a second group of second directional antennas disposed around the first group of antennas.
Type:
Grant
Filed:
September 23, 2011
Date of Patent:
October 14, 2014
Assignees:
STMicroelectronics SA, STMicroelectronics (Crolles 2) SAS
Inventors:
Andreia Cathelin, Mathieu Egot, Romain Pilard, Daniel Gloria
Abstract: An integrated circuit may include an element placed in an insulating region adjacent to a copper metallization level and including a barrier layer in contact with a metallization level. The element may be electrically connected to and spaced away from a copper line of the metallization level by way of an electrical link passing through the barrier layer and including an electrically conductive material different from copper in direct contact with the copper line.
Abstract: A pixel circuit of an image sensor includes a sense node for storing a charge transferred from one or more photodiodes, a source follower transistor having its gate coupled to the sense node and its source node coupled to an output line of the pixel circuit via a read transistor, wherein a body contact of the source follower transistor is connected to the output line.
Type:
Grant
Filed:
September 24, 2010
Date of Patent:
October 7, 2014
Assignees:
STMicroelectronics SA, STMicroelectronics (Crolles 2) SAS
Abstract: An integrated capacitive-type humidity sensor formed in a semiconductor chip integrating a sensing capacitor and a reference capacitor. Each of the sensing and reference capacitors have at least a first electrode and at least a second electrode, the first and second electrodes of each of the sensing and reference capacitors being arranged at distance and mutually insulated. A hygroscopic layer extends on the sensing and reference capacitors and a conductive shielding region extends on the reference capacitor but not on the sensing capacitor.
Abstract: Electrical energy is generated in a device that includes an integrated circuit which produces thermal flux when operated. A substrate supports the integrated circuit. A structure is formed in the substrate, that structure having a semiconductor p-n junction thermally coupled to the integrated circuit. Responsive to the thermal flux produced by the integrated circuit, the structure generates electrical energy. The generated electrical energy may be stored for use by the integrated circuit.
Abstract: A structure for storing a native binary code in an integrated circuit, including an array of planar MIM capacitors above an insulating layer formed above a copper metallization network, wherein at least one metallization portion is present under each MIM capacitor. The size of the portion(s) is selected so that from 25 to 75% of the MIM capacitors have a breakdown voltage smaller by at least 10% than that of the other MIM capacitors.
Abstract: Support comprising a reception zone in which the external envelope matches the shape of a plate (P2) designed to be placed on a droplet deposited at least in the reception zone in order to achieve capillary self-assembly of the plate and the support, and at least one pair of tracks (T11, T12) that extend on the support from the reception zone and that have a lyophilic type affinity with the droplet such that an overflow of the droplet beyond the reception zone is guided in the tracks, characterised in that the at least one pair of tracks comprises a first track (T11) and a second track (T12) that do not have the same lyophilic type degree of affinity with the droplet.
Type:
Application
Filed:
March 21, 2014
Publication date:
September 25, 2014
Applicants:
STMICROELECTRONICS (CROLLES 2) SAS, COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENE ALT
Inventors:
Jean Berthier, Lea Di Cioccio, Sebastien Mermoz
Abstract: A main blind hole is formed in a front face of a wafer having a rear face. A through capacitor is formed in the main blind hole including a conductive outer electrode, a dielectric intermediate layer, and a filling conductive material forming an inner electrode. Cylindrical portions of the outer electrode, the dielectric intermediate layer and the inner electrode have front ends situated in a plane of the front face of the wafer. A secondary rear hole is formed in the rear face of the wafer to reveal a bottom of the outer electrode. A rear electrical connection is made to contact the bottom of the outer electrode through the secondary rear hole. A through hole via filled with a conductive material is provided adjacent the through capacitor. An electrical connection is made on the rear face between the rear electrical connection and the through hole via.
Type:
Grant
Filed:
November 17, 2011
Date of Patent:
September 23, 2014
Assignees:
STMicroelectronics SA, STMicroelectronics (Crolles 2) SAS
Inventors:
Sylvain Joblot, Alexy Farcy, Jean-Francois Carpentier, Pierre Bar