Abstract: Embodiments relate to the layout of photonic integrated circuits using fixed coordinate grids. In some embodiments, a method includes receiving a request to place a first photonic component within a layout of a photonic integrated circuit. Positionings of components within the layout are represented in a design database utilizing a grid with fixed coordinates. The method further includes calculating, by a processor, precise coordinates and snapped coordinates for positioning of the first photonic component. The snapped coordinates have a precision consistent with the fixed coordinate grid and the precise coordinates have a higher precision than the snapped coordinates. The method further includes, in a design database, representing the positioning of the first photonic component utilizing both the precise coordinates and the snapped coordinates.

Abstract: A system enhances a system design to incorporate safety measures. The system receives a system design for processing through various stages of design using design tools, for example electronic design automation tools for introducing safety features in a circuit design. The system receives safety requirements for the system design, the safety requirements specifying safety measures for the system design. The system generates from the safety requirements, a safety specification storing a set of commands. The system generates a system design enhanced with safety measures. The enhanced system design it generated for at least a subset of the plurality of tools. A tool processes the generated safety specification to implement safety measures in the system design according to the received safety requirements.

Abstract: A method of using on-chip circuitry to test a memory of a chip is provided. The method including, in a capture stage, receiving, at a first n-bit compression structure including n first stage latches corresponding to each bit of the first n-bit compression structure, a value at each respective first stage latch for each of n memory addresses of the memory, such that each respective first stage latch receives a respective value from a memory address of the memory, n being an integer greater than one, and in the capture stage, passing the values from each respective first stage latch through compression logic of the first n-bit compression structure to output a single compressed address value, providing the single compressed address value to a second stage latch of the first n-bit compression structure.

Abstract: A method includes generating a plurality of intermediate designs for a chip by executing a first sub-step based on a first plurality of inputs, adding at least one intermediate design of the plurality of intermediate designs to a second plurality of inputs, generating a plurality of final designs by executing a second sub-step of the step of the design flow based on the second plurality of inputs, and selecting using a machine learning model a final design from the plurality of final designs. The first sub-step is a sub-step of a step of a design flow and the first plurality of inputs corresponds to input parameters associated with the first sub-step.

Abstract: The present disclosure generally relates to an analog mixed-signal (AMS) design verification system. In particular, the present disclosure relates to a system and method for system verification. One example method includes: obtaining an electronic representation of the circuit design; generating at least a portion of a waveform using the electronic representation of the circuit to obtain a first segment of the waveform associated with the circuit; converting, via the one or more processors, one or more measurement functions to code for performing the one or more computations on the first segment of the waveform; performing one or more computations on the first segment of the waveform using the code; and identifying when a behavior of the circuit violates a design specification based on whether a result of the one or more computations meets a threshold.

Abstract: A system and method for providing timing and placement co-optimization for engineering change order (ECO) cells is described. According to one embodiment, an ECO for a current design of an integrated circuit is accessed. The ECO includes inserting an ECO cell among placed and routed current cells of the current design. A target region in the current design is identified for placement of the ECO cell, but the target region has insufficient open space to place the ECO cell. At least one current cell will have to be moved in order to place the ECO cell in the target region. Timing slacks for current cells in a neighborhood of the target region are determined. Based on the timing slacks of the current cells, at least one of the current cells is moved to a different location to create sufficient open space to place the ECO cell within the target region.

Abstract: This disclosure describes a memory cell array with enhanced read sensing margin. The memory cell array includes a write port and a read port being connected through first and second data storage lines. The memory cell array further includes multiple word lines and bit lines arranged in rows and columns such that the read port is coupled to a read word line, a read bit line, and a virtual ground. The read port includes a first transistor coupled to at least the read bit line and the virtual ground, a second transistor coupled to at least the first data storage line and the first transistor, a third transistor coupled to at least the second data storage line and the read word line, and a fourth transistor coupled at least the first data storage line and the read word line.

Abstract: A system and method for performing operating state analysis of an integrated circuit (IC) design is disclosed. The method includes simulating a switching operation from a first operating state to a second operating state for one or more cells of the IC design using a plurality of vectors corresponding to one or more user-specified constraints. The method include generating a time-based waveform for each cell of the one or more cells changing an operating state from the first operating state to the second operating state, and based on the generated time-based waveform, identifying one or more operating state changes corresponding to the operating state analysis and associated timing window and cell information. The method includes verifying the one or more operating state changes by the each cell of the one or more cells of the IC design meet the one or more user-specified constraints for generating an analysis report.

Abstract: A circuit is provided. The circuit includes a first master stage, a second master stage, a first slave stage, a first slave stage, and a second slave stage. The first master stage includes a data input line. The second master stage includes an inverse data input line. The first slave stage is coupled to an output of the first master stage. The second slave stage is coupled to an output of the second master stage. The first slave stage generates an output signal during a rising edge of a clock cycle. The second slave stage generates an inverted output signal during the rising edge of the clock cycle. The output signal and the inverted output signal are available concurrently.

Abstract: An implementation-quality synthesis process begins with a logical design of an integrated circuit and, through a series of steps, generates a fully synthesized physical design of the integrated circuit. One of the steps is clock synthesis, which generates the clock network for the integrated circuit. In certain embodiments, a method includes the following steps. A reduced clock synthesis process is applied, rather than the implementation-quality clock synthesis process. This generates a clock network for the logical design, which will be referred to as a proxy clock network because it is used as a proxy to estimate power consumption of the fully synthesized clock network. Because the reduced clock synthesis process runs much faster than the implementation-quality clock synthesis process, the front end designer may use these power estimates in the front end design process, including to explore different design variations in the logical design.

Abstract: An on-chip memory diagnostic (OCMD) circuit may instruct a set of built-in self-test (BIST) engines to execute BIST on memories associated with the set of BIST engines. Next, results of executing BIST on the memories may be received from the set of BIST engines. A set of memory failures may then be identified in the memories based on the results. Next, one or more BIST engines in the set of BIST engines may be instructed to collect diagnostic data for each memory failure. A set of diagnostic data may then be received for the set of memory failures. Next, the set of diagnostic data may be stored in an on-chip data container. The set of diagnostic data may then be provided via a communication channel.

Abstract: A voltage controlled oscillator (VCO) circuitry includes a varactor array. The varactor array includes a first varactor unit including a first varactor, a second varactor, and first switch circuitry. The first varactor is connected to a first node and a second node, and the second varactor is connected to the second node and a third node. The second node receives a voltage control signal. The first switch circuitry is electrically coupled to the first node and the third node, and selectively electrically couples a first voltage signal to the first node and the third node based on a first control signal.

Abstract: Some aspects of this disclosure are directed to implementing formal gated clock conversion for field programmable gate array (FPGA) synthesis. For example, some aspects of this disclosure relate to a method, including receiving network representation of a circuit design, determining a gated clock function corresponding to a target component of the network representation, and constructing an edge function based at least in part on the gated clock function. The method further includes performing a minimization of the edge function, and in response to a determination that the minimization of the edge function comprises a first term and a second term, providing a clock enable signal to the target component based on the first term, and providing a clock signal to the target component based on the second term.

Abstract: A request may be received to use a software on a first project. A first set of values may be extracted for a set of features of the first project. A classifier may be used to classify the first project based on the first set of values. It may be determined whether to grant the request to use the software on the first project based on an output of the classifier.

Abstract: A method of forming a multitude of vertical NAND memory cells, includes, in part, forming a multitude of insulating materials on a silicon substrate, forming a trench in the insulating materials to expose a surface of the silicon substrate, depositing a layer of polysilicon along the sidewalls of the trench, filling the trench with oxide, forming a metal layer above the trench, and forming a mono-crystalline channel for the NAND memory cells by applying a voltage between the silicon substrate and the metal layer to cause the polysilicon sidewalls to melt. The melted polysilicon sidewalls is enable to recrystallize into the mono-crystalline channel.

Abstract: Techniques and systems for determining an output waveform at an output of a complementary metal-oxide-semiconductor (CMOS) logic gate are described. Some embodiments can identify at least one set of inputs of the CMOS logic gate that, when switched together, causes multiple transistors coupled in parallel to simultaneously turn-on and drive the output of the CMOS logic gate. Next, the embodiments can determine a set of current source models that are coupled in parallel to model the CMOS logic gate when the set of inputs of the CMOS logic gate are switched together. The embodiments can then simulate the set of current source models together to determine the output waveform at the output of the CMOS logic gate when the set of inputs of the CMOS logic gate are switched together.

Abstract: Circuitry and processes are disclosed that use conventional electronic circuits (comprising, for example, phase locked loops, pulse width modulators, phase modulators, digital logic gates, etc.) to enable quantum algorithms. Such circuitry and processes achieve the requirement for non-quantum devices to enable quantum algorithms: the tensor product entanglement of signals representing quantum states. Such circuitry and processes are readily usable by current Electronic Design Automation tools, to design, verify and emulate applications such as fast, very large number factoring for use in decryption. Also, the independent Claims concisely signify embodiments of the claimed inventions.

Abstract: A system and method for providing formal property verification across circuit design versions is described. In one embodiment, the system receives a first version and a second version of a circuit design. The received first version has a first set of constraints, a first set of next-state functions representing the first version of the circuit design, and a first property that has been verified as true for the first version of the circuit design. The received second version has a second set of constraints, a second set of next-state functions representing the second version of the circuit design, and a second property for the second version of the circuit design. The described embodiments further construct a composite circuit design based on the first set of constraints, the first set of next-state functions, and the first property and further based on the second set of constraints, the second set of next-state functions, and the second property.

Abstract: A method of implementing an automated technology for conducting functional safety (FuSa) diagnostic coverage is provided. The method can include receiving functional safety information that includes failure modes defining wrong values of a signal indicating a factor manifesting an error, receiving an identification of internal safety protected signals and a diagnostic coverage for the FuSa block, performing back tracing of possible paths for an output port of a FuSa block for each failure mode of each safety protected signal, determining an area for each possible path, and determining, based on a diagnostic coverage and area calculated for each of the paths, a diagnostic coverage for each failure mode of the FuSa block.

Abstract: A machine learning model predicts the hardness of unsolved properties. For example, the machine learning model may predict the relative hardness of pairs of properties—i.e., which property in the pair is harder to solve. These hardness predictions may then be used to formulate a priority order for a formal verification process to attempt to solve the unsolved properties. As the formal verification process progresses, it generates results. For example, certain properties may be solved. These results are used to update a training set, which is used to further train the machine learning model. The machine learning model is trained at runtime with incremental fine-tuning as the formal verification process progresses.