Abstract: Disclosed herein are embodiments including electrical structures that includes a first cell, a first inductor, a first resistor, and a first shunted Josephson junction. The first inductor is connected in series with the first shunted Josephson junction at a first terminal end of the first inductor and a second terminal end of the first inductor is connected to a feed point of the first cell being powered. A first end of the first resistor having connected to ground and a second end being connected to the first shunted Josephson junction at a terminal of the first shunted Josephson junction that is not connected to the first inductor. A source of an electrical current source that is external to the first cell is connected to the first shunted junction and the first resistor at a common point.

Abstract: The independent claims of this patent signify a concise description of embodiments. A method is provided for parallel simulation using synchronization during simulation. The method comprises executing a plurality of threads in parallel, identifying a first event block and a second event block of a circuit design, calculating a minimum delay (minDelay) based on a current simulation time, scheduled times for execution of the first event block and the second event block, and causal delays (CausalDelay) of the first event block and the second event block, and scheduling a next synchronization point based on the minimum delay, the next synchronization point being a next simulation time at which the plurality of threads synchronize to a common clock. This Abstract is not intended to limit the scope of the claims.

Abstract: Refining multi-bit flip flops mapping without explicit de-banking and re-banking is provided by identifying a set of equivalent flops in a layout, that include a first flop having a first logic routing and a first location in the layout and a second flop having a second logic routing and a second location in the layout; and remapping the first logic of the first flop from the first location to the second location and the second logic of the second flop from the second location to the first location.

Abstract: A parallel plate capacitor structure in an integrated circuit has a first plate and a second plate separated by an insulator, such as a dielectric. Both plates are connected to an interconnect structure at a plurality of connection points. The area of the first plate that overlaps with the second plate is identified. This overlap region does not include any connection points on the first plate. For this overlap region, the lumped element model for the first plate includes nodes on the edge of the overlap region (edge nodes), and lumped resistances between the edge nodes and the node connected to the lumped capacitance. In one embodiment, the lumped element model also includes a common node, all of the edge nodes are connected to the common node by lumped resistances, and the common node is connected by a negative resistance to the lumped capacitance.

Abstract: Certain aspects relate to a method for improving a lithography configuration. In the lithography configuration, a source illuminates a mask to expose resist on a wafer. A processor determines a defect-based focus exposure window (FEW). The defect-based FEW is an area of depth of focus and exposure latitude for the lithography configuration with an acceptable level of defects on the wafer. The defect-based FEW is determined based on a predicted probability distribution for occurrence of defects on the wafer. A processor also determines a critical dimension (CD)-based FEW. The CD-based FEW is an area of depth of focus and exposure latitude for the lithography configuration with an acceptable level of CD variation on the wafer. It is determined based on predicted CDs on the wafer. The lithography configuration is modified based on increasing an area of overlap between the defect-based FEW and the CD-based FEW.

Abstract: A pseudo-dual-port memory (PDPM) is disclosed that includes a first memory array bank and a second memory array bank of a plurality of memory array banks. The PDPM also includes parallel pin control logic circuitry configured to perform operations including taking a clock signal, a memory enable signal for a first port, a memory enable signal for a second port, a parallel pin control signal, and address signals for the first and the second memory array banks as inputs and generating a first internal clock and a second internal clock for performing operations corresponding to the first and the second memory array banks at the first port and the second port. A total number of memory array banks may be up to eight memory array banks and each including either a six-transistors (6-T) SRAM bit-cell or an eight-transistors (8-T) SRAM bit-cell in static random access memory architecture.

Abstract: A receiver circuit may include a first stage and a second stage. The first stage may include a first inverter circuit to generate a first signal based on an input signal and a second inverter circuit to generate a second signal based on the input signal. The second stage may determine a logic state of the input signal by combining the first signal generated by the first inverter circuit and the second signal generated by the second inverter circuit.

Abstract: The independent claims of this patent signify a concise description of embodiments. New techniques for the partitioning of big element blocks in a circuit are disclosed. The techniques partition both pre-layout and post-layout circuits. If a post-layout circuit has different simulation results from a pre-layout circuit, the techniques determine where and how “cross-talk” of the RC networks due to RC extraction is changing the circuit physics behavior from the original design of the circuit. A flow of the local circuit simulation of the pre-layout netlist and the post-layout netlist of the same design is presented. A flow of reference or relative or differential circuit simulation of a known design and a new design of the same kind is described. This Abstract is not intended to limit the scope of the claims.

Abstract: A save and restore (SR) register system is disclosed. Some embodiments include a first memory state element (MSE), a second MSE, and a control circuit. The first MSE is configured to: clock in a first data value during a normal mode and hold the first data value during a first testing mode; and clock in a first test sequence during a second testing mode. The second MSE is configured to: clock in the first data value during the normal mode; and clock in a second test sequence during the first testing mode. The control circuit configured to: restore the second MSE to the first data value based on an output port of the first MSE after the second MSE clocks in the second test sequence; and restore the first MSE based on an output port of the second MSE after the first MSE clocks in the first test sequence.

Abstract: An existing design of an integrated circuit includes existing cells that have already been placed and routed. An engineering change order (ECO) specifies additional new cells (ECO cells) to be inserted into the existing design. The ECO cells are also associated with target locations for their placement among the existing cells, but these target locations may violate design rules. The feasibility of “legalizing” the placement of the ECO cells within the existing design is assessed as follows. The ECO cells are clustered into clusters based on their target locations. Clusters are assessed by determining an ECO placement impact (EPI) index for individual clusters. The EPI index is a measure of the feasibility for legalizing the placement of the ECO cells in that cluster.

Abstract: A memory array including a plurality of memory cells and a plurality of drivers is disclosed. The plurality of memory cells may be arranged in a plurality of rows and a plurality of columns. Memory cells corresponding to a row of the plurality of rows may be logically grouped into a plurality of memory array segments. The plurality of drivers may be coupled to corresponding first ends of corresponding memory array segments of the plurality of memory array segments. Second ends of the corresponding memory array segments may be coupled to second ends of corresponding adjacent memory array segments of the plurality of memory array segments. The second ends of the corresponding memory array segments and the second ends of corresponding adjacent memory array segments may be coupled to corresponding wordlines of a plurality of wordlines.

Abstract: Hardware description language (HDL) code for an integrated circuit (IC) design may be parsed to obtain an IC design parse tree. A transformation pattern may include a first pattern and a second pattern. The transformation pattern may be parsed to obtain a transformation pattern parse tree. The IC design parse tree and the transformation pattern parse tree may be used to identify a portion of the HDL code that matches the first pattern. The identified portion of the HDL code may be transformed based on the second pattern to obtain a transformed portion of the HDL code. The portion of the HDL code may be replaced by the transformed portion of the HDL code.

Abstract: A hybrid emulation system includes a hardware emulation system, a simulation system, and a co-simulation interface. The hardware emulation system emulates a first portion of a design under test (DUT) during a hybrid emulation. The emulation runs in a first time domain local to the hardware emulation system. The simulation system simulates a second portion of the DUT during the hybrid emulation. The simulation runs in a second time domain local to the simulation system. The first time domain and the second time domain are unsynchronized. The co-simulation interface is coupled to the simulation system and the hardware emulation system. The co-simulation interface communicates transactions and events between the hardware emulation system and the simulation system. For each transaction, the co-simulation interface captures a transaction time in the first time domain, and for each event, the co-simulation interface captures an event time in the first time domain.

Abstract: Disclosed herein are system, method, and computer-readable storage device embodiments for implementing automated root-cause analysis for static verification. An embodiment includes a system with memory and processor(s) configured to receive a report comprising violations and debug fields, and accept a selection of a seed debug field from among the plurality of debug fields. Clone violations may be generated by calculating an overlay of a given violation of the violations and a seed debug field, yielding possible values for a subset of debug fields. A clone violation may be created for a combination of the at least two second debug fields, populating a projection matrix, which may be used to map violations and clone violations to corresponding numerical values in the projection matrix and determine a violation cluster based on the mapping having corresponding numerical values and score(s) satisfying a threshold, via ML. Clustering may further be used to generate visualizations.

Abstract: An integrated circuit (IC) design comprising a scan chain may be received, where stimulus values may be scanned-in and response values may be scanned-out through a scan path in the scan chain, where the scan path may include a first scan cell and a second scan cell such that the first scan cell is downstream with respect to the second scan cell. The scan chain may be modified to enable observation of a 0 and a 1 value in the first scan cell in presence of a defect in the second scan cell, or observation of a 0 and a 1 value in the second scan cell in presence of a defect in the first scan cell.

Abstract: A system receives a circuit description and measures of intrinsic delay, intrinsic delay variation, transition time and transition time variation for each stage and determines stage delay variation of each stage. The system receives a circuit description and derate factors and determines an intrinsic delay standard deviation and a correlation coefficient. The system determines a stage delay variation of each stage based on the determined factors. The system receives parameters describing an asymmetric distribution of delay values and generates a normal distribution of delay values. The system receives measures of nominal transition time at an output and input of a wire, and transition time variation at the input of the wire and determines a transition time variation at the output of the wire. The system receives measures of an Elmore delay and a nominal delay of the wire and determines a delay variation at the output of the wire.

Abstract: Hardware simulation systems and methods for reducing signal dumping time and size of by fast dynamical partial aliasing of signals having similar waveform are provided. One example system is configured to receive, in real-time, a first signal from a producer entity; determine a first signal signature associated with the first signal; determine, in real-time, a second signal signature associated with the second signal; upon determining that the first signal signature matches the second signal signature, designate the first signal as a master signal and designate the second signal as a slave signal; and stop dumping the second signal to a storage space.

Abstract: Integrated circuit devices which include a thermoelectric generator which recycles heat generated by operation of an integrated circuit, into electrical energy that is then used to help support the power requirements of that integrated circuit. Roughly described, the device includes an integrated circuit die having an integrated circuit thereon, the integrated circuit having power supply terminals for connection to a primary power source, and a thermoelectric generator structure disposed in sufficient thermal communication with the integrated circuit die so as to derive, from heat generated by the die, a voltage difference across first and second terminals of the thermoelectric generator structure. A powering structure is arranged to help power the integrated circuit, from the voltage difference across the first and second terminals of the thermoelectric generator. The thermoelectric generator can include IC packaging material that is made from thermoelectric semiconductor materials.

Abstract: Some aspects of this disclosure are directed to implementing formal gated clock conversion for field programmable gate array (FPGA) synthesis. For example, some aspects of this disclosure relate to a method, including receiving network representation of a circuit design, determining a gated clock function corresponding to a target component of the network representation, and constructing an edge function based at least in part on the gated clock function. The method further includes performing a minimization of the edge function, and in response to a determination that the minimization of the edge function comprises a first term and a second term, providing a clock enable signal to the target component based on the first term, and providing a clock signal to the target component based on the second term.

Abstract: Disclosed herein are method, system, and computer-readable storage-medium embodiments of adaptive scheduling with dynamic partition-load balancing for fast partition compilation. An embodiment includes detecting, by at least one processor, an available hardware-resource amount available to be used by an electronic design automation (EDA) process via a plurality of computing elements, with respect to a design specification, and analyzing the design specification, to generate an estimate of a hardware-resource amount to be used by the EDA process. In some further embodiments the at least one processor may compare the estimate with the available hardware-resource amount, and adjust at least one of a memory allocation for the EDA process or a specified number of computing elements of the plurality of computing elements, for parallel use by the EDA process. Moreover, the at least one processor may calculate a weighted load average for the plurality of computing elements, according to some additional embodiments.