Abstract: A method includes obtaining a target integrated circuit (IC) layout, accessing a repository, identifying a device within the target IC layout by matching an area of the target IC layout to a source pattern, and replacing at least a portion of the area of the target IC layout with a replacement pattern. The repository stores the source pattern for the device and the replacement pattern corresponding to the source pattern.

Abstract: Pattern matching using anchors during integrated circuit (IC) verification is disclosed. According to one embodiment, a method includes obtaining match time estimates associated with pattern anchors of different anchor types for an IC pattern, generating revised match time estimates based on a target IC layout, and then selecting the pattern anchor associated with the shortest revised match time estimate. Then, target anchors of the same anchor type as the selected pattern anchor are generated for the target IC layout, and the target IC layout is searched for the IC pattern using the selected pattern anchor and the target anchors.

Abstract: Josephson junction (JJ) structures are disclosed. In some embodiments, a JJ structure may include a first superconducting structure and a second superconducting structure disposed on a plane parallel to a silicon wafer surface. A non-superconducting structure may be disposed between the first superconducting structure and the second superconducting structure. A direction of current flow through the non-superconducting structure may be parallel to the silicon wafer surface.

Abstract: A method of generating a mask used in fabrication of a semiconductor device includes, in part, selecting a source candidate, generating a process simulation model that includes a stochastic variance band model in response to the selected source candidate, performing a first optical proximity correction (OPC) on the data associated with the mask in response to the process simulation model, assessing one or more lithographic evaluation metrics in response to the OPC mask data, computing a cost in response to the assessed one or more lithographic evaluation metrics, and determining whether the computed cost satisfies a threshold condition. In response to the determination that the computed cost does not satisfy the threshold condition, a different source candidate may be selected.

Abstract: A circuit hardware emulation module is configured to identify oscillating subgraphs of an emulated graph, or to identify state-holding subgraphs of an emulated graph. The emulation module identifies one or more loops within an emulated circuit; generates an acyclic emulation of at least a portion of the emulated circuit, wherein the acyclic emulation is characterized by one or more loop breakers; generates a loop detector emulation of a hardware-based loop detector circuit based at least in part on a quantity of loop breakers n characterizing the acyclic emulation, wherein the loop detector emulation comprises at least one of an oscillation detector or a state-holding detector; and executes the loop detector emulation for a plurality of input values for the emulated circuit to generate an output indicating at least one of an oscillation status or a state-holding status of the emulated circuit.

Abstract: A method of estimating a toggle count of a circuit, includes, in part, simulating the circuit to generate training data and an associated training toggle count of the internal nodes of the circuit in response to a test bench, training a neural network system to generate an estimate of the training toggle count in accordance with the training data and the associated training toggle count, simulating the circuit to generate simulation data in response to a first set of input values applied to the circuit, and invoking the trained neural network system to estimate a number of toggles of the internal nodes of the circuit from the simulation data. The training data may include, in part, values of input signals applied to the circuit and values of registers disposed in the circuit for a multitude of time stamps. The neural network system may include, in part, at least three layers.

Abstract: A method, a system, and a non-transitory computer readable medium for simulating a circuit are provided. The method includes generating a digital simulation file for the circuit that includes a block, generating a mixed simulation file for the circuit, generating a waveform file by executing the digital simulation file for a first time window of a simulation, determining a plurality of analog values for the block based on the waveform file, and executing, by a processor, the mixed simulation file for a second time window of the simulation with the plurality of analog values annotated to the block at a start of the second time window. The digital simulation file corresponds to the block in a digital view and the mixed simulation file corresponds to the block in an analog view.

Abstract: A word-level design model may be loaded into memory. Next, a masking layer may be created which includes objects in the word-level design model that are not used by an IC design analysis system. The masking layer may then be used to provide a reduced block model view on-the-fly to the IC design analysis system.

Abstract: Disclosed herein are system, computer-readable storage medium, and method embodiments of machine-learning (ML)-based static verification for derived hardware-design elements. A system including at least one processor may be configured to extract a feature set from a hardware description and evaluate a similarity index of a first hardware element with respect to a second hardware element, using an ML process based on the feature set, wherein the first hardware element is described in the hardware description. The at least one processor may be further configured to update one or more parameters corresponding to a static verification of the hardware description while the static verification is being performed, by providing at least one test attribute, corresponding to the second hardware element, applicable to the first hardware element, in response to determining that the similarity index is within a specified range, and additionally output a first result of the static verification.

Abstract: A method, includes, in part, defining a continuous signal, defining a threshold value, calibrating the continuous signal and the threshold value from measurements made on edges of one or more patterns on a mask and corresponding edges of the patterns on a wafer, convolving the continuous signal with a kernel to form a corrected signal, and establishing, by a processor, a probability of forming an edge at a point along the corrected signal in accordance with a difference between the value of the corrected signal at the point and the calibrated threshold value. The kernel is calibrated using the same measurements made on the patterns' edges.

Abstract: Computer-implemented techniques are disclosed for verifying circuit designs using subgraph caching. A device under test (DUT) is modeled as a graph. The graph is partitioned into one or more subgraphs and problems are generated for each subgraph. Graph and subgraph problem generation is repeated numerous times throughout the verification process. Problems and sub-problems are generated and solved. When a subgraph problem is solved, the problem's variables, values, and information can be stored in a cache. The storage can be based on entropy of variables used in the graph and subgraph problems. The subgraph problem storage cache can be searched for previously stored problems which match another problem in need of a solution. By retrieving subproblem variables, values, and information from the cache, the computational overhead of circuit design verification is reduced as problems are reused. Caching can be accomplished using an information theoretic approach.

Abstract: The driver circuit includes a pull-up network having a first pull-up transistor controlled by a data signal, a second pull-up transistor coupled between the first pull-up transistor and a first power supply voltage, and a third pull-up transistor coupled in parallel with the second pull-up transistor. The third pull-up transistor is configured to turn on for at least one clock cycle responsive to a change in the logic level of the data signal being detected.

Abstract: A method, a system, and a non-transitory computer readable medium are provided. The method includes performing, by one or more computing devices, a lookahead scan of a file of a circuit design to extract information associated with a query in an iterative loop, performing an action to retrieve attribute information from one or more partitions of the circuit design before executing the iterative loop, and querying the iterative loop using the stored attribute information. The action stores the attribute information based on the extracted information.

Abstract: A method for performing glitch power analysis of a circuit, comprising receiving no-timing waveform simulation data for the circuit, the waveform simulation data including a first signal, and identifying a delayed stimulus injection point (DSIP) for the first signal. The method further comprises determining a total delay for the first signal and performing waveform replay simulation including injecting the first signal at the DSIP at a time based on the total delay for the first signal.

Abstract: An example is a method. An electronic representation of a design of an integrated circuit to be manufactured on a semiconductor die is obtained. The design of the integrated circuit includes layers. The electronic representation includes initial polygons. Polygon topological skeletons of the initial polygons of the target layer are generated. A space topological skeleton in a space between the polygon topological skeletons is generated. A connected network comprising network edges is generated. Each network edge is connected between a respective polygon topological skeleton and the space topological skeleton. A transformation of the polygon topological skeletons is performed, by one or more processors, based on the network edges, a spacing specification for a spacing between polygons, and respective specified widths associated with the initial polygons by perturbing the polygon topological skeletons.

Abstract: A system to generate a design of an integrated circuit, the system comprising a memory and a processor, the processor to define a plurality of voltage area regions (VARs), based on an availability of one or more of a primary power source and one or more secondary power sources. The processor further to constrain placement and/or routing of an element in the design of the integrated circuit within a voltage area region of the plurality of voltage area regions defined by secondary power/ground (PG) constraints based on power requirements of the element.

Abstract: A method, apparatus, and/or computer program product can perform an analog defect simulation on an electronic device. The method, apparatus, and/or computer program product can generate a defect catalog which identifies a defect class relating to a defect and a modeling parameter that is associated with the defect class. The method, apparatus, and/or computer program product can receive a weight formula that identifies a weight for the defect class in relation to the modeling parameter. The method, apparatus, and/or computer program product can call a defect weight function to return the weight from the defect weight formula. The method, apparatus, and/or computer program product can perform the analog defect simulation on the electronic device. The method, apparatus, and/or computer program product can determine a simulation statistic relating to the analog defect simulation utilizing the weight.

Abstract: A system is disclosed that includes a memory and a processor configured to perform operations stored in the memory. The processor performs the operations to select a master clock for a plurality of clocks in a design logic circuit. The processor further performs the operations to align a clock edge of a clock of the plurality of clocks with a corresponding nearest clock transition of the master clock. The aligned clock edge of the clock limits a number of emulation cycles for the design logic to a fixed number of emulation cycles required for the master clock The processor further performs the operation to determine a clock period for measuring power required for the design logic circuit and estimate, at the aligned clock edge, the power required for the design logic circuit corresponding to the determined clock period, which corresponds to a clock selected from the plurality of clocks and the master clock.

Abstract: A method for performing phase aware dynamic scheduling of a plurality of double data rate (DDR) commands includes determining a ratio of a frequency of DDR controller clock to a frequency of a DDR clock. The method includes determining a number of clock cycles of the DDR clock required for each DDR command of the plurality of DDR commands. The method includes, based on the ratio of the frequency of the DDR controller clock to the frequency of the DDR clock and the number of clock cycles of the DDR clock required for each DDR command, determining a sequence of the plurality of DDR commands according to a priority corresponding to the each DDR command, and transmitting the plurality of DDR commands to DDR devices over one or more clock cycles of the DDR controller clock according to the determined sequence of the plurality of DDR commands.

Abstract: A method of generating images from Register Transfer Level (RTL) code for clone detection or code verification is provided. The method includes obtaining a first RTL code, extracting first RTL constructs from the first RTL code, generating a first array from the extracted first RTL constructs, generating a first RTL image representation (RIR) image from the generated first array, wherein color in the first RIR image corresponds to values included in the first array, comparing the generated first RIR image to other RIR images to find a portion of an RIR image that matches at least a portion of the generated first RIR image, and determining that the portion of the first RTL code is validated as a result of finding the portion of the RIR image that matches the portion of the generated first RIR images.