Abstract: An approach for debugging a circuit implementation of a software specification includes translating a high-level language debugging command into a hardware debugging command that specifies the value(s) of a condition in the circuit implementation, and a storage element(s) at which the value(s) of the condition is stored. The hardware debugging command is transmitted to a debug controller circuit that generates a single clock pulse to the circuit implementation. The debug controller circuit reads a value(s) from the storage element(s) specified by the hardware debugging command and determines whether or not the value(s) satisfies the condition. The debug controller circuit generates another single clock pulse in response to the value(s) read from the storage element(s) not satisfying the condition. Generation of pulses of the clock signal is suspended and data indicative of a breakpoint is output in response to the value(s) read from the storage element(s) satisfying the condition.

Abstract: Core processing and parameterization may include detecting, using a processor, a super parameter within a core, and, responsive to the detecting, automatically creating, using the processor, a data structure within a memory element having a hierarchy and having a parameter of the core. The data structure may be set as a value of the super parameter of the core.

Abstract: Approaches for debugging include receiving by a hardware debug server, a high-level language (HLL) debugging command for setting a breakpoint in an HLL software specification. The hardware debug server translates the HLL debugging command into a hardware debugging command that specifies a condition of a hardware finite state machine that is representation of the software specification. The hardware debugging command is input to a simulator. The simulator adds a conditional breakpoint on the finite state machine in response to the hardware debugging command and executes a simulation of the finite state machine representation. Execution of the simulation is suspended in response to the detecting the condition in the finite state machine.

Abstract: A characterization system includes a signal detector. The signal detector includes a first conversion unit configured to receive, from a first device, a first device output signal including N possible discrete pulse amplitudes and generate a plurality of detected signals based on a plurality of threshold amplitudes respectively. The signal detector further includes a second conversion unit configured to generate a first conversion output signal and a second conversion output signal based on logic values included in the plurality of detected signals and provide first and second conversion output signals to an analysis unit for generating one or more measurements of the first device. The first and second conversion output signals include M1 and M2 possible discrete pulse amplitudes respectively. M1 and M2 are integers less than N.

Abstract: A programmable logic design is generated for a programmable logic device (PLD) containing configurable logic blocks (CLBs) each having a plurality of multiplexers and look-up-table (LUT) circuits. A first subset of multiplexers are identified from the plurality of multiplexers based upon an analysis of design definitions for input signals of the plurality of multiplexers. The first subset of multiplexers are transformed into LUT logic. Configuration data is generated that is designed to be loaded into the PLD to configure the CLBs. The configuration data includes the LUT logic.

Abstract: A disclosed delay circuit includes a plurality of Schmitt triggers that are serially coupled. A first Schmitt trigger of the plurality of Schmitt triggers is configured to receive an input signal. An output control circuit is coupled to receive output signals of two or more Schmitt triggers of the plurality of Schmitt triggers, the output control circuit configured to select a signal from one of the one or more Schmitt triggers as an output signal. The output signal is a delayed version of the input signal.

Abstract: The disclosure describes approaches for generating a clock tree for a circuit design. Initial clock trees are generated and elements are assigned to locations on an integrated circuit (IC). Each of the initial clock trees includes a clock root, a spine including the clock root, and branches connected to and extending from the spine. Each clock load is coupled to one of the branches. The clock tree further includes programmable delay circuits having initial delay values that are balanced. If the circuit design does not satisfy timing constraints, at least one clock root is moved from a respective first location to a respective second location.

Abstract: A register circuit includes a first pulse-latch circuit configured to store data from a first input node. A multiplexer circuit is configured to select between an output of the first pulse-latch circuit and a second input node. A second pulse-latch circuit is configured to store data provided by the multiplexer circuit. A control circuit is configured to switch, in response to a configuration signal, the register circuit between a flip-flop mode and a dual-latch mode.

Abstract: Disclosed circuitry includes input-output pads, receive flip-flops, and transmit flip-flops coupled to the input-output pads. Data path control circuitry is coupled to data path control flip-flops, the receive flip-flops and the transmit flip-flops. The data path control circuitry is configured to selectably couple the receive flip-flops and the transmit flip-flops to the input-output pads in response to states of the data path control flip-flops. Clock control circuitry is coupled to clock control flip-flops, the receive flip-flops and the transmit flip-flops. The clock control circuitry is configured to selectably apply one of multiple clock signals to the receive flip-flops and the transmit flip-flops in response to states of the clock control flip-flops. A first scan chain is coupled to the clock control flip-flops and the data path control flip-flops. A second scan chain is coupled to the receive flip-flops and the transmit flip-flops.

Abstract: Apparatuses and method relating to DFE include a decision feedback equalizer with first and second integrating summers configured to receive an input differential signal. A bias current circuit is configured to alternate biasing of the first and second integrating summers. The first and second integrating summers alternately integrate, during clock signal phases of a clock signal and its complement, for transconductance of the input differential signal to a first output differential signal and a second output differential signal, respectively. The first and second integrating summers alternately drive, during other clock signal phases of the clock signal and its complement, residual voltages of the first output differential signal and the second output differential signal, respectively, to a same voltage level. A first clock signal and a second clock signal are out of phase with respect to one another for interleaving the first output differential signal and the second output differential signal.

Abstract: A circuit for implementing a scan chain in programmable resources of an integrated circuit is described. The circuit comprises a programmable element configured to receive an input signal and generate an output signal based upon the input signal; a selection circuit configured to receive the output signal generated by the programmable element at a first input and to receive a scan chain input signal at a second input, wherein the selection circuit generates a selected output signal in response to a selection circuit control signal; and a register configured to receive the selected output signal of the selection circuit.

Abstract: A transmitter includes: a driver circuit having a pull-up circuit, and a pull-down circuit, coupled to an output pad; a digitally controlled impedance (DCI) calibration circuit having a first reference driver, a second reference driver, and a reference resistor, the DCI calibration circuit configured to: generate a value for a first code by calibrating a first impedance in the first reference driver against the reference resistor; generate a value for a second code by calibrating a second impedance in the second reference driver against the first impedance; and adjust the value of the first code to match the first impedance with the second impedance; and a pre-driver circuit configured to supply the first code and the second code to the driver circuit for adjusting output impedance of the pull-up circuit and the pull-down circuit.

Abstract: Disclosed approaches for probing signals in a plurality of clock domains include inputting unsynchronized trigger signals from the plurality of clock domains to a plurality of instances of a multi-synchronizer circuit, respectively. Each instance of the multi-synchronizer circuit includes a plurality of synchronizer circuits. One or more of the plurality of synchronizer circuits synchronizes the respective unsynchronized trigger signal with one clock signal from the plurality of clock domains. Output of one of the one or more synchronizer circuits in each instance of the multi-synchronizer circuit is selected as a respective synchronized trigger signal. A trigger equation is evaluated based on a state of each respective synchronized trigger signal. A final trigger signal is generated based the evaluating of the trigger equation, a trigger marker is stored in a memory in response to a state of the final trigger signal, and states of probed signals are stored in the memory.

Abstract: Systems and methods therefor relating generally to electro-absorption modulation are disclosed. In a system thereof, a waveguide is for propagating an optical signal. A segmented electro-absorption modulator (“SEAM”) includes: a segmented anode having at least two anode segments spaced apart from one another alongside a first side of the waveguide; and a segmented cathode having at least two cathode segments spaced apart from one another alongside a second side of the waveguide corresponding to the at least two anode segments.

Abstract: An interface layout for a vertical interface of a first semiconductor component is disclosed. A first one or more conductors configured to carry power signals extends vertically from the first semiconductor component. A second one or more conductors configured to carry data signals extends vertically from the first semiconductor component. A third one or more conductors configured to carry ground signals extending vertically from the first semiconductor component. The first one or more conductors are further configured to shield and separate the second one or more conductors. A fourth one or more conductors extends horizontally from the first one or more conductors adjacent to and terminating proximal to the third one or more conductors. A fifth one or more conductors extending horizontally from the third one or more conductors adjacent to and terminating proximal to the first one or more conductors and the fourth one or more conductors.

Abstract: An integrated circuit includes a reference voltage circuit. The reference voltage circuit includes a bipolar junction transistor (BJT) configured to receive a first current during a first phase of a clock cycle to generate a first base-emitter junction voltage, and receive a second current during a second phase of the clock cycle to generate a second base-emitter junction voltage. The reference voltage circuit includes a switched capacitor circuit configured to provide a reference voltage associated with the first base-emitter junction voltage and the second base-emitter junction voltage.

Abstract: Embodiments herein describe techniques for executing VMs on hosts that include an accelerator. The hosts can use the accelerators to perform specialized tasks such as floating-point arithmetic, encryption, image processing, etc. Moreover, VMs can be migrated between hosts. To do so, the state of the processor is saved on the current host thereby saving the state of the VM. For example, by saving the processor state, once the data corresponding to the VM is loaded into a destination host, the processor can be initialized to the saved state in order to resume the VM. In addition to saving the processor state, the embodiments herein save the state of the accelerator on a FPGA. That is, unlike previous systems where tasks executed by the accelerator are discarded when migrating the VM, the state of the accelerator can be saved and used to initialize an FPGA accelerator in the destination host.

Abstract: A circuit for reducing power consumed by routing clock signals in an integrated circuit is described. The circuit comprises a clock routing network comprising a clock row coupled to receive an input clock signal having a first clock frequency and a plurality of clock branches coupled to the clock row; and a plurality of circuit blocks coupled to the plurality of clock branches, each circuit block having a clock conversion circuit and a register; wherein the clock conversion circuit is programmable to generate clock pulses of an internal clock signal, coupled to the register, having a second frequency that is greater than the first frequency. A method of reducing power consumed by routing clock signals in an integrated circuit is also disclosed.

Abstract: A circuit for implementing a multifunction output generator is described. The circuit comprises an amplifier circuit having a first input and a second input; a voltage generator coupled at a first node to a first input of the amplifier circuit; a controllable current source configured to provide a variable current to the first node; and a switching circuit enabling the operation of the amplifier circuit in a first mode for sensing a temperature and a second mode for providing a reference voltage. A method of implementing a multifunction output generator is described.

Abstract: In an example, a semiconductor assembly includes an integrated circuit (IC) die. The IC die includes a first region that includes a programmable fabric; a second region that includes input/output (IO) circuits; and a third region that includes a die seal disposed between the programmable fabric and the IO circuits.