Abstract: A scanning device for the point-by-point photoelectric scanning of a photographic film includes a transport arrangement for the transporting of the film along a transport path through a scanning zone, a guide arrangement for the guiding and positioning of the film in the scanning zone, an illuminating arrangement for exposing the film in the scanning zone with measuring light, a photoelectric converter arrangement for converting the measuring light transmitted through the film into corresponding electrical signals, and optical means for guiding the measuring light transmitted through the scanned film onto the photoelectric converter arrangement. The guide arrangement includes a motor-driven, selectively adjustable, moveable platform, positioned in the scanning zone, for the mechanical guiding and positioning of films of at least two different formats.

Abstract: A module for use in automatic test equipment is disclosed. The module is especially useful for measuring noise parameters of high frequency devices. The module includes a noise generator and a plurality of EEPROM's that store reflection coefficients and ENR data for the noise generator. Computerized control circuitry in the automatic test equipment uses the stored data to reduce impedance mismatch and Excess Noise Ratio (ENR) data uncertainties in the measured noise parameters.

Abstract: A fault detection system for performing analog current analysis and diagnosis of power devices on digitally controlled buses. The fault detection system includes a field-installable bus interface having a current sensor on a ground return line. A bus controller connected to the bus interface then applies digital control signals and power to a system assembly via the bus interface such that individual power devices are selectively energized. A real time current profile of the selected power device over a selected period of time is determined. A fault determination network compares the real time current against a set of predetermined criteria and determines whether the selected power device is acceptable. The predetermined criteria beneficially includes information useful for determining degradation of the selected power device so that fault correction before failure is feasible.

Abstract: A precision op amp test circuit employs latching relays, the contacts of which are latched open or closed as necessary to make test measurements. The relays' metal contacts ensure low resistance conductive paths, and because the coil of a latching relay need be energized only briefly to latch the contacts, the heating duty cycle of the coils can be kept low to substantially eliminate the accuracy-degrading thermal E.M.F. generated by the heat from the energized coil of a conventional relay. The test circuit is advantageously used for testing both VOS and IB for high precision, low-VOS op amps.

Abstract: It has been learned that moissanite and other synthetic stones, including synthetic moissanite and synthetic diamond, are distinguishable from natural diamonds based on differing electrical conductivities. The present invention, therefore, provides an apparatus and method for determining a gem type based on its electrical conductivity. In particular, an electronic circuit including the gem under test as part of a circuit path is used to measure its electrical conductivity and, therefore, gem type. The onerous task of determining whether a gem is moissanite or synthetic diamond involves providing a high voltage across a gem surface greater than a breakdown voltage, typically greater than 300 volts, and measuring a minuscule current that flows through the gem. A first and second contact couple the high voltage to the gem under test, where a low impedance detection circuit is used to flag when the contacts are erroneously contacting each other during a measurement.

Abstract: Apparatus and method to identify chafing of a conduit, thereby reducing the failure of any system which would be damaged or whose function would be impaired by abrasion of the conduit. Such a system may carry electrical power, fuel, other fluid, hydraulics, pneumatics, optical, or electromagnetic signals. Wear caused by rubbing against external structures is detected by wrapping the conduit with a sensing element, which may be a conductive wire, waveguide, fiber optic cable, or a tube (wound around the conduit or enclosing it) that holds a fluid under pressure. The sensing element is positioned so that chafing on the conduit electrically contacts, breaks, or punctures the sensing element well before the conduit fails.

Abstract: The apparatus for measuring the intra-muscular fat in carcasses or parts of carcasses or the total content of fat in minced meat has a first pair of electrodes for insertion into a carcass or part of a carcass or into minced meat. An alternating current (AC) generator is connected to these electrodes. Second and third pairs of electrodes are inserted parallel to the first pair. Both the second and third pairs have measurement circuits to measure the voltage and phase between the electrode pairs after insertion. The needle or bar shaped electrodes are tapered and insulated apart from 5-20 mm long free end sections. Electrodes are separated by 10-100 mm with each electrode 10-50 mm from the nearest of the first electrode pair. The portable unit for on-line use has a display output. The AC frequency applied to the first electrode pair may be changed in an exponential series to give different measurements.

Abstract: For detecting a coil short-circuit in an electric motor such as a switched reluctance motor, an apparatus includes a first phase coil, a second phase coil, and a third phase coil. Through each of the coils, a current, whose amount is sensed by a current sensor, flows in such manner that the amount ranges from zero to a reference current amount in a reference set-up time duration. If the detected amount of current by the current sensor becomes the reference current amount in a time duration which is shorter than the reference set-up time duration and the resultant condition continues for an another reference time duration, it is regarded that a short-circuit occurs in the phase coil corresponding to the current sensor and the apparatus stops the electric motor.

Abstract: Apparatus and method for testing operation of devices on a vehicular trailer without the necessity of a truck being connected thereto. A digital signal which is different for each device to be tested is encoded and wirelessly transmitted. Upon receipt of the signal, a power source is connected to the respective device to be tested. In order to reliably apply the signal in a multiplexed system in the trailer, the signal is mixed with a pseudorandom digital sequence to provide a direct sequence spread spectrum for the signal.

Abstract: An interconnect for testing semiconductor components includes a thinned substrate, and first contacts on the substrate for electrically engaging second contacts on the components. The interconnect can be configured for use with a testing apparatus for testing discrete components such as dice or chip scale packages, or alternately for use with a testing apparatus for testing wafer sized components, such as wafers, panels and boards. The thinned substrate has a thickness that is substantially less than a thickness of the components being tested. The thinned substrate can flex upon application of a biasing force by the testing apparatus, permitting the first contacts to move in the z-direction to accommodate variations in the planarity of the second contacts. For fabricating the interconnect, the first contacts are formed on the substrate, and then covered with a protective mask.

Abstract: A method and a testing system for measuring contact resistance of a pin on an integrated circuit. An RC circuit is coupled to the integrated circuit, and a response signal of a testing signal input to the integrated circuit is monitored. The response signal has a time dependent voltage V′. Another time dependent voltage V1 for the testing signal through the RC circuit and a voltage drop across an internal circuit of the integrated circuit is illustrated. Comparing V′ with V1, whether the contact resistance of the pin being tested is allowable can be determined according to the ratings or specification of the integrated circuit.

Abstract: A fixture to hold an electronic substrate having probe areas on a top surface. The top surface of the electronic substrate is left open to provide a maximum area to couple interconnect wires for a device under test. In addition, a bottom surface of the substrate is left open to provide a maximum area to couple with a probe card in one embodiment, or a test head in another embodiment. This open bottom and open top minimize the mechanical interference with electrical connections. The substrate is planarized to a frame by one or more clamps that are attached to the frame. The clamps provide adjustment of the pressure down on the substrate in a Z-axis direction which is normal to the top surface of the substrate for providing a good connection with a planar card. In addition, the clamps provide adjustment in the an X-Y plane parallel to the frame and rotational correction about the Z-axis.

Abstract: A compliant contactor interfaces a semiconductor device under test with a tester. The compliant contactor accepts a variety of different sized semiconductor devices along with a variety of different pinouts of the semiconductor devices. The compliant contactor includes an upper alignment block and a lower alignment block which receives the contact pins of the tester. The upper alignment block may move within a predefined distance with respect to the lower alignment block to account for any tester movement, thermal expansion or contraction, or other factors. In an alternative embodiment, the compliant contactor may move in three directions with respect to the test board. In this embodiment, a contact pad provides electrical connection between a daughter card and the test board. The contact pad may be a compressible elastomeric connector.

Abstract: The method of this invention provides a means for altering commonly available inductive voltage detector instruments into dual sensitivity test instruments. By shielding the sensor probe with a metallic material, the probe is made to be unresponsive to energized conductors in near proximity when the shield is grounded by finger contact. A single probe window is provided so that when grounded, the instrument will respond to an energized conductor in only the probe window area allowing testing of single conductors in wire bundles. When ungrounded by the electrician's finger, the instrument reverts to normal sensitivity. Provision is made for safety by isolating the metallic shield from contact with energized conductors. The method may be employed by means of a demountable accessory or incorporated into the test instrument during manufacture.

Abstract: A unified test system for testing the performance of a printed circuit board assembly, and a test method using the same. A masking board and a printed circuit board assembly are loaded onto a pin board from which test process connection pins having different height project. The test process connection pins, a power input connector and a signal interface connector are connected with the printed circuit board assembly and pins installed on the printed circuit board assembly. Thereafter, in-circuit-test signals are generated to test the printed circuit board assembly. Only function-circuit-test connection pins among the test process connection pins are connected with the printed circuit board assembly, and functions between the printed circuit board assembly and a head disk assembly are tested. Finally, results of the in-circuit-test process and the function-circuit-test process are displayed.

Abstract: An exposure apparatus includes an illumination system including an optical element and an inside movable portion, and a driving mechanism for driving the movable portion. The driving mechanism includes at least one of a non-contact type bearing and a non-contact type motor. The illumination system can be placed in a predetermined gas ambience, while the movable portion can be placed in the same gas ambience.

Abstract: Apparatus for sensing and characterizing particles suspended in a liquid medium includes a particle-sensing structure having a continuous wall defining a hydrodynamically smooth conduit through which the liquid suspension of particles is caused to pass simultaneously with an electrical current. Particles passing through the conduit are sensed and characterized by monitoring changes in the electrical current through the conduit. According to the invention, the continuous, conduit-defining wall is made entirely of a material having an electrical resistivity less than or equal to that of the liquid medium. Thus, the apparatus of the invention is similar to the conventional Coulter aperture (conduit) except that the aperture is formed from an electrically conductive material instead of a dielectric material.

Abstract: A power-current measuring circuit 200 is structured such that two types of power supply circuits are selectively turned on in accordance with the number of chips which are formed on a wafer 60 and which must be measured. A power-current measuring circuit and a power-current detection device corresponding to the output are provided so that resolution accuracy required to perform measurement of the power current is maintained. A current-measuring-circuit selection circuit 56 enables outputs of the two types of the current measuring circuits to selectively be input to one conversion circuit. Therefore, a necessity for connecting the conversion circuit and its peripheral circuits to each of the current measuring circuit can be eliminated. As a result, the size of the circuit can be reduced.

Abstract: A test fixture including a fixture body and a self-centering or floating connector body positioned adjacent to a first side of the fixture body. The connector body is made of a polymeric material. Spaced apart sleeves extending through the fixture body. A first end of each one of the sleeves includes a threaded portion engaged with a corresponding threaded portion in the connector body. Each one of the sleeves defines a respective longitudinal axis. A head is attached to a second end of each one of the sleeves. Each head includes a tapered portion engaging a tapered seat provided on a second side of the fixture body. An alignment pin extends axially through each one of the sleeves along the respective longitudinal axis. Each pin includes a shaft, a flange attached to the shaft and an end protruding from the connector body. A first spring member is axially carried by each pin. Each first spring is compressed between the flange of the respective pin and the fixture body.

Abstract: To perform a reliable and calibrated measurement of partial discharges, a first calibratable sensor and a second sensor are arranged in a metal enclosure. The first calibrated sensor picks up signal components in the HF (High Frequency) range, and the second non-calibrated sensor picks up signal components in the UHF (Ultra-High Frequency) range. An HF signal component picked up by the first sensor is transmitted to a partial discharge analyzer. The opening time of the gate device is determined by a UHF signal component picked up by the second sensor.